JPH0326973A - Method for inspecting integrated circuit inspecting apparatus - Google Patents
Method for inspecting integrated circuit inspecting apparatusInfo
- Publication number
- JPH0326973A JPH0326973A JP1160850A JP16085089A JPH0326973A JP H0326973 A JPH0326973 A JP H0326973A JP 1160850 A JP1160850 A JP 1160850A JP 16085089 A JP16085089 A JP 16085089A JP H0326973 A JPH0326973 A JP H0326973A
- Authority
- JP
- Japan
- Prior art keywords
- connection cable
- integrated circuit
- resistance value
- short
- quality
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000000034 method Methods 0.000 title claims abstract 3
- 238000012360 testing method Methods 0.000 claims abstract description 29
- 230000007547 defect Effects 0.000 claims description 2
- 238000007689 inspection Methods 0.000 abstract 1
- 238000010586 diagram Methods 0.000 description 5
- 230000002159 abnormal effect Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 239000000523 sample Substances 0.000 description 1
- 238000010998 test method Methods 0.000 description 1
Landscapes
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Abstract
Description
【発明の詳細な説明】
（産業上の利用分野）
本発明は集積回路検査装置の検査方法に関するものであ
る。DETAILED DESCRIPTION OF THE INVENTION (Field of Industrial Application) The present invention relates to a testing method for an integrated circuit testing device.
（従来の技術）
集積回路の電気試験には一般的に自動検査器が用いられ
、第２図はその概略図である．同図において集積回路１
１のリード端子１２〜２５は各リード端子ごとに接続ケ
ーブル２６で自動検査器２７に接続されている。この接
続ケーブルのりート端子一本でも断線や短絡があると、
正確な集積回路の電気試験が行えない．
接続ケーブルの断線や短絡のチェックには一般的なマル
チテスタ（以下テスタと略す）でｌリードずつ導通試験
を手作業で行っていた。(Prior Art) An automatic tester is generally used for electrical testing of integrated circuits, and Figure 2 is a schematic diagram of it. In the figure, integrated circuit 1
The lead terminals 12 to 25 of No. 1 are connected to an automatic tester 27 by a connection cable 26 for each lead terminal. If there is a disconnection or short circuit in even one of the connection cable's route terminals,
Accurate electrical testing of integrated circuits cannot be performed. To check for disconnections and short circuits in the connecting cables, continuity tests were manually performed on each lead using a general multi-tester (hereinafter referred to as the tester).
（発明が解決しようとする課Ｍ）
集積回路も高集積化が進むと、この集積回路のリード端
子も数多くなる．したがって自動検査器との接続ケーブ
ルの数も非常に多くなり，この接続ケーブルの断線や短
絡のチェックもテスタを使った手作業では長い時間を費
やすこととなり、容易に実施できない欠点があった。(Problem M that the invention seeks to solve) As integrated circuits become more highly integrated, the number of lead terminals on these integrated circuits also increases. Therefore, the number of connection cables to the automatic tester becomes extremely large, and checking for disconnections and short circuits in these connection cables requires a long time to be carried out manually using a tester, which has the disadvantage that it cannot be carried out easily.
本発明の目的は、従来の欠点を解消し、非常に数の多い
集積回路のリード端子と自動検査器間の接続ケーブルの
チェックを短時間に行える集積回路検査装置の検査方法
を提供することである．（課題を解決するための手段）
本発明の集積回路検査装置の検査方法は、集積回路の電
気試験を行う自動検杏器と被試験集積回路との間を結ぶ
接続ケーブルの断線や短絡による不良チェックをする場
合において，被試験集積回路の代わりに抵抗器を接続し
、その抵抗値を測定することにより接続ケーブルの良否
を判断するものである。An object of the present invention is to provide a testing method for an integrated circuit testing device that eliminates the drawbacks of the conventional technology and allows for checking connection cables between a very large number of integrated circuit lead terminals and an automatic tester in a short period of time. be. (Means for Solving the Problems) A testing method for an integrated circuit testing device according to the present invention provides a test method for detecting defects caused by disconnections or short circuits in a connecting cable that connects an automatic tester that conducts an electrical test of an integrated circuit and an integrated circuit under test. When checking, a resistor is connected in place of the integrated circuit under test, and the quality of the connecting cable is determined by measuring the resistance value.
（作 用）
上記構或により、自動検査器が高速に抵抗値の測定を行
うだけで接続ケーブルのチェックを短時間で実施するこ
とができる。(Function) With the above structure, the connection cable can be checked in a short time simply by the automatic tester measuring the resistance value at high speed.
（実施例）
本発明の一実施例を第１図に基づいて説明する．第ｌ図
は本発明の集積回路検査装置の検査方法を示す構或図で
ある．同図において、接続ケーブル１の良否判定試験を
行うため集積回路の代わりに抵抗器ユニット２を接続し
、自動検査器３において抵抗値の測定を行い，得られた
測定値から接続ケーブルの良否を判定する．
たとえば．あるリード端子の接続ケーブルが断線してい
た場合、そのリード端子の抵抗値は無限大になり，それ
により接続ケーブルの断線が判断でき杭
抵抗器ユニットは、ＧＮＤ端子を除く全リード端子分の
抵抗器を備えており，ハンドラやプローバに直接装着で
きるようにソケットやブローブカード上に抵抗器を取り
付けたものにするとよい。(Example) An example of the present invention will be explained based on FIG. FIG. 1 is a block diagram showing the testing method of the integrated circuit testing device of the present invention. In the same figure, in order to test the quality of the connection cable 1, a resistor unit 2 is connected instead of the integrated circuit, the resistance value is measured with an automatic tester 3, and the quality of the connection cable is determined from the measured value. judge. for example. If the connecting cable of a certain lead terminal is disconnected, the resistance value of that lead terminal becomes infinite, and from this it can be determined that the connecting cable is disconnected.The pile resistor unit has a resistance value of all lead terminals except the GND terminal. It is best to have a resistor mounted on a socket or probe card so that it can be attached directly to the handler or prober.
さらに、自動検査器で抵抗器ユニットの抵抗値を試験し
，測定値が異常な場合．そのリード端子を示すようなプ
ログラムを組んで運用する。Furthermore, if the resistance value of the resistor unit is tested with an automatic tester and the measured value is abnormal. Create and operate a program that indicates the lead terminal.
（発明の効果）
本発明によれば、簡単な抵抗試験で数多い接続ケーブル
の断線や短絡のチェックを短時間に行うことができ、電
気試験作業の能率化ができ，さらに、多リード端子化さ
れた集積回路の電気試験に対応した自動検査器に用いる
ほどその効果を発揮することができる。(Effects of the Invention) According to the present invention, it is possible to check for disconnections and short circuits in many connection cables in a short time with a simple resistance test, and the efficiency of electrical test work can be improved. The more effective it is, the more it is used in automatic testing equipment for electrical testing of integrated circuits.
第１図は本発明の実施に使用する集積回路検査装れの構
成図、第２図は従来の検査方法を説明するための集積回
路の電気試験の回路接続図である３１，・・・接続ケー
ブル、 ２ ・・・抵抗器ユニッＩ一、
３
自動検査器．
第
図Fig. 1 is a block diagram of integrated circuit testing equipment used to implement the present invention, and Fig. 2 is a circuit connection diagram for electrical testing of integrated circuits to explain the conventional testing method. Cable, 2...Resistor unit I, 3 Automatic tester. Diagram
Claims (1)
との間を結ぶ接続ケーブルの断線や短絡による不良チェ
ックをする場合において、前記被試験集積回路の代わり
に抵抗器を接続し、その抵抗値を測定することにより、
接続ケーブルの良否を判断することを特徴とする集積回
路検査装置の検査方法。When checking for defects due to disconnections or short circuits in the connecting cable between an automatic tester that performs electrical tests on integrated circuits and the integrated circuit under test, connect a resistor in place of the integrated circuit under test and check its resistance. By measuring the value
A method for testing an integrated circuit testing device, characterized by determining whether a connection cable is good or bad.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1160850A JPH0326973A (en) | 1989-06-26 | 1989-06-26 | Method for inspecting integrated circuit inspecting apparatus |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1160850A JPH0326973A (en) | 1989-06-26 | 1989-06-26 | Method for inspecting integrated circuit inspecting apparatus |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH0326973A true JPH0326973A (en) | 1991-02-05 |
Family
ID=15723752
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1160850A Pending JPH0326973A (en) | 1989-06-26 | 1989-06-26 | Method for inspecting integrated circuit inspecting apparatus |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0326973A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US8092668B2 (en) * | 2004-06-18 | 2012-01-10 | Roche Diagnostics Operations, Inc. | System and method for quality assurance of a biosensor test strip |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS58160870A (en) * | 1982-03-18 | 1983-09-24 | Fujitsu Ltd | Testing method for multicore cable |
-
1989
- 1989-06-26 JP JP1160850A patent/JPH0326973A/en active Pending
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS58160870A (en) * | 1982-03-18 | 1983-09-24 | Fujitsu Ltd | Testing method for multicore cable |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US8092668B2 (en) * | 2004-06-18 | 2012-01-10 | Roche Diagnostics Operations, Inc. | System and method for quality assurance of a biosensor test strip |
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