JPH03221843A - Analyzer by light - Google Patents

Analyzer by light

Info

Publication number
JPH03221843A
JPH03221843A JP1674190A JP1674190A JPH03221843A JP H03221843 A JPH03221843 A JP H03221843A JP 1674190 A JP1674190 A JP 1674190A JP 1674190 A JP1674190 A JP 1674190A JP H03221843 A JPH03221843 A JP H03221843A
Authority
JP
Japan
Prior art keywords
light
filter
wavelength
measurement
detector
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1674190A
Other languages
Japanese (ja)
Inventor
Masao Nakayama
雅夫 中山
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hamamatsu Photonics KK
Original Assignee
Hamamatsu Photonics KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hamamatsu Photonics KK filed Critical Hamamatsu Photonics KK
Priority to JP1674190A priority Critical patent/JPH03221843A/en
Publication of JPH03221843A publication Critical patent/JPH03221843A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To simplify a signal processing system by forming a filter for reference as a wide band-pass filter which allows the selective transmission of light in a continuous range from a short wavelength to a long wavelength. CONSTITUTION:The analyzer 10 is constituted of an IR radiation light source 12, A filter set 14 mounted with a filter 14A for measurement and the filter 14B for reference, a sample cell 16, a detector 18, an output signal amplifier 20 thereof and the signal processing system 22 therefrom. The filter 14B for reference is formed as the wide band-pass filter which allows the selective transmission of the light in the continuous range from the light of the wavelength shorter than the wavelength of measuring light to the light of the wavelength longer than the same and, therefore, even if the spectral sensitivity is fluctuated by the temp. fall of the detector 18, there is no measurement error by this fluctuation and the exact analysis is executed.

Description

【発明の詳細な説明】[Detailed description of the invention]

[産業上の利用分野1 この発明は被測定物、例えばガスの、測定光の吸収を利
用してその成分濃度を分析したり、タバコの葉の表面に
おける測定光の吸収を利用して、該タバコの葉の水分を
分析したりする光による分析計に関する。 [従来の技術1 従来この種の光による分析計、例えばガス分析計におい
ては、光放射源からの光を、測定用フィルターを通して
、特定波長の測定光として被測定ガスを透過させ、該ガ
スにおける測定光の吸収を利用して、ガス中の成分濃度
、例えば自動車の排気ガス中のC○、目C,CO2、燃
焼排気ガス中のC○、Se2 、N 02 、燃料漏洩
ガス中の0口4.03H8の分析等に利用されている。 ここで、被測定ガス中を透過した光は、例えばPb S
eセルからなる検出器によって検出されるようにされて
いる。 上記のような、光放射源あるいは検出器は、ドリフトが
生じ易いために、吸収波長光である測定光はかに、吸収
の少ない波長光を参照光として、被測定ガス中を透過さ
せ、該参照光及び測定光の、検出器における受光量のく
信号量〉の比から、目的成分の濃度を求めるようにして
いる。 ところで、前記検出器を構成するpb seセルの分光
感度は、第4図における実線Aであるもの゛が、素子温
度が下がると、破線Bで示されるように、大きく変化す
る。 従って、参照光を1種類だけとすると測定誤差が大きく
なる。 これに対して従来は、第4図に示されるように、測定波
長りに接近し、且つこの両側の波長の、2種類の参照光
E、Fを用いるようにしている。
[Industrial Application Field 1] This invention analyzes the component concentration of an object to be measured, such as a gas, by utilizing the absorption of the measurement light, or the absorption of the measurement light on the surface of a tobacco leaf. This invention relates to an optical analyzer for analyzing the moisture content of tobacco leaves. [Prior art 1] Conventionally, in this type of light analyzer, for example, a gas analyzer, light from a light radiation source is passed through a measurement filter as measurement light of a specific wavelength through a gas to be measured. Utilizing the absorption of measurement light, the concentration of components in gases, such as C○, C, CO2 in automobile exhaust gas, C○, Se2, N 02 in combustion exhaust gas, zero in fuel leakage gas, etc. It is used for analysis of 4.03H8. Here, the light transmitted through the gas to be measured is, for example, PbS
It is adapted to be detected by a detector consisting of an e-cell. Since the above-mentioned optical radiation source or detector is prone to drift, the measurement light, which is absorption wavelength light, is transmitted through the gas to be measured using light with a wavelength that is less absorbed as reference light. The concentration of the target component is determined from the ratio of the amount of light received by the detector to the signal amount of the reference light and measurement light. Incidentally, the spectral sensitivity of the PBSE cell constituting the detector, indicated by the solid line A in FIG. 4, changes significantly as indicated by the broken line B as the element temperature decreases. Therefore, if only one type of reference light is used, measurement errors will increase. In contrast, conventionally, as shown in FIG. 4, two types of reference light beams E and F, which are close to the measurement wavelength and have wavelengths on both sides thereof, are used.

【発明が解決しようとする課題】[Problem to be solved by the invention]

しかしながら、上記のように、2種類の参照光を用いる
場合は、2つの参照用フィルターと1つの測定用フィル
ターが必要になり、コストが高くなると共に取扱いに不
便であるという問題点がある。 又、3種類の信号を比較しなければならないので、信号
処理系が複雑となるという問題点もある。 この発明は上記従来の問題点に鑑みてなされたものであ
って、2枚のフィルターを用い、信号処理が単純である
光による分析計を提供することを目的とする。
However, as described above, when two types of reference light beams are used, two reference filters and one measurement filter are required, resulting in high costs and inconvenience in handling. Furthermore, since three types of signals must be compared, there is also the problem that the signal processing system becomes complicated. The present invention has been made in view of the above-mentioned conventional problems, and an object of the present invention is to provide an optical analyzer that uses two filters and has simple signal processing.

【課題を解決するための手段] この発明は、光放射源と、この光放射源の光から特定波長光を測定光として選択する測定用フィルターと、前記光放射源の光から、前記測定光の波長に近く、且つ、該波長よりも短い波長の短波長参照光及び長い波長の長波長参照光を選択する参照用フィルターと、を有してなり、前記測定光及び参照光を被測定物に照射し、該被測定物の透過光又は反射光中の前記測定光と参照光の比から前記被測定物の成分を分析する光による分析計において、前記参照用フィルターを、前記短波長参照光から長波長参照光までの連続的範囲の光を選択して透過させるワイドバンドパスフィルターとすることにより上記目的を達成するものである。 【作用】[Means to solve problems] The present invention includes a light radiation source, a measurement filter that selects light of a specific wavelength as measurement light from the light of the light radiation source, and a measurement filter that selects a specific wavelength light from the light of the light radiation source that is close to the wavelength of the measurement light and has the same wavelength. a reference filter that selects a short-wavelength reference light with a shorter wavelength and a long-wavelength reference light with a longer wavelength; In a light analyzer that analyzes the components of the object to be measured based on the ratio of the measurement light and reference light in transmitted light or reflected light, the reference filter is connected to a continuous light source from the short wavelength reference light to the long wavelength reference light. The above object is achieved by providing a wide bandpass filter that selectively transmits light in a targeted range. [Effect]

この発明において、参照用フィルターは、測定光の波長
を間にしてこれより短い波長光から長い波長光に至る連
続的範囲の光を選択して透過させるワイドバンドパスフ
ィルターとされているので、例えばPb Seセルから
なる検出器の温度低下によりその分光感度が変動しても
、該変動による測定誤差がなく、正確に分析することが
できる。
In this invention, the reference filter is a wide bandpass filter that selectively transmits light in a continuous range from shorter wavelength light to longer wavelength light with the wavelength of measurement light in between, so for example, Even if the spectral sensitivity of a detector made of a PbSe cell fluctuates due to a decrease in temperature, there is no measurement error due to the fluctuation, and accurate analysis can be performed.

【実施例】【Example】

以下本発明の実施例を図面を参照して説明する。 この実施例は、本発明をガス分析計に適用したものであ
り、このガス分析計10は、赤外光を放射する光放射源
12と、フィルタセット14と、試料セル16と、Pb
 Seセルからなる検出器18と、検出器18の出力信
号を増幅する増幅器20と、増幅器20からの信号を処
理する信号処理系22とから構成されている。 前記フィルタセット14には、測定用フィルター14A
と、参照用フィルター14Bとが取付けられている。 前記測定用フイルータ14Aは、試料セル16中に収容
される被測定ガス中の目的測定成分によって吸収される
波長光を、光放射源12から選択するようにされている
。 例えば、目的成分が口20の場合は、1.4.1.9、
又は2.7μm、口Cの場合は、3,4μIII、CO
2の場合は4.3μm1C○の場合は4.7μmの波長
光が選択されるフィルターが選ばれる。 又、前記参照用フィルター14Bは、前記測定用フィル
ター14Aによって選択された測定光の波長を中心とし
て、一定幅でその範囲の波長光を連続的に透過させるワ
イドバンドパスフィルターとされている。 例えば、測定目的成分がCO2であって、測定用フィル
ター14Aによって選択される波長が4゜3μmとした
場合、第2図に示されるように、該測定用フィルター1
4Aによる選択光の波長と透過率との関係を示す波形1
4aの、半値全幅が60nmのとき、4.3μmを中心
として、60nl′Ilの約20@程度の波長範囲で、
光を選択するようにされている。 この場合の参照用フィルター14Bの具体例としては、
例えば波長3.3〜4.5Pで、平均透過率5%のもの
がある。上記のように、参照用フィルター14Bの透過
波長領域を、測定フィルタ14Aの透過波長を含んでそ
の前後に広くとると、被測定ガスや水分、炭酸ガス等の
空気中に含まれるガスの影響を小さくできると共に、他
種類の参照用フィルターを使用したのと同じ効果を得ら
れることにより、検出器の温度変化による分光感度特性
の変化に対応して、測定精度を向上させることができる
。 なお上記実施例は、被測定物質が、ガスであって、測定
光、参照光がガスを透過するものであるが、本発明はこ
れに限定されるものでなく、測定光及び参照光を、被測
定物に照射させ、その反射光から被測定物の成分を分析
するような場合にも適用されるものである。例えば第3
図に示されるように、タバコの菓24に照射して、その
反射光から該タバコの葉24の表面における吸収率を測
定し、タバコの葉24の水分率を分析する水分計28の
ような場合にも適用されるものである。 第3図の符号26A、26Bはミラーを示す。
Embodiments of the present invention will be described below with reference to the drawings. In this embodiment, the present invention is applied to a gas analyzer, and this gas analyzer 10 includes a light radiation source 12 that emits infrared light, a filter set 14, a sample cell 16, and a Pb
It is composed of a detector 18 made of a Se cell, an amplifier 20 that amplifies the output signal of the detector 18, and a signal processing system 22 that processes the signal from the amplifier 20. The filter set 14 includes a measurement filter 14A.
and a reference filter 14B are attached. The measurement filter 14A is configured to select, from the light radiation source 12, light having a wavelength that is absorbed by the target component to be measured in the gas to be measured contained in the sample cell 16. For example, if the target component is mouth 20, 1.4.1.9,
Or 2.7μm, 3,4μIII for mouth C, CO
In the case of 2, a filter is selected that selects light with a wavelength of 4.3 μm, and in the case of 1C○, a wavelength of 4.7 μm. Further, the reference filter 14B is a wide bandpass filter that continuously transmits wavelength light within a constant width range centered around the wavelength of the measurement light selected by the measurement filter 14A. For example, if the component to be measured is CO2 and the wavelength selected by the measurement filter 14A is 4°3 μm, as shown in FIG.
Waveform 1 showing the relationship between wavelength and transmittance of selected light according to 4A
When the full width at half maximum of 4a is 60 nm, in the wavelength range of about 20 @ of 60 nl'Il centered on 4.3 μm,
The light has been chosen. As a specific example of the reference filter 14B in this case,
For example, there is one with a wavelength of 3.3 to 4.5P and an average transmittance of 5%. As mentioned above, if the transmission wavelength range of the reference filter 14B is widened before and after the transmission wavelength of the measurement filter 14A, the influence of gases contained in the air such as the gas to be measured, moisture, and carbon dioxide can be reduced. Since it can be made small and the same effect as using other types of reference filters can be obtained, measurement accuracy can be improved in response to changes in spectral sensitivity characteristics due to changes in detector temperature. In the above embodiment, the substance to be measured is a gas, and the measurement light and the reference light are transmitted through the gas, but the present invention is not limited to this, and the measurement light and the reference light are transmitted through the gas. It can also be applied to cases in which an object to be measured is irradiated with light and components of the object to be measured are analyzed from the reflected light. For example, the third
As shown in the figure, there is a moisture meter 28 that irradiates the tobacco confectionery 24 and measures the absorption rate on the surface of the tobacco leaf 24 from the reflected light to analyze the moisture content of the tobacco leaf 24. This also applies to cases where: Reference numerals 26A and 26B in FIG. 3 indicate mirrors.

【発明の効果】【Effect of the invention】

本発明は上記のように構成したので、参照用フィルター
を1個とすることができ、従って、製品コストを低減さ
せることができると共に、取扱いを簡単にし、更に信号
処理系を簡略化することができるという優れた効果を有
する。
Since the present invention is constructed as described above, the number of reference filters can be reduced to one, thereby reducing product costs, simplifying handling, and simplifying the signal processing system. It has the excellent effect of being able to

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明をガス分析計に適用した実施例を示づ一
ブロック図、第2図は同実施例における測定用、参照用
フィルターの透過率と検出器の分光感度の関係を示す線
図、第3図は本発明を水分計に適用した場合の実施例を
示す光学系統図、第4図は従来のガス分析計における測
定用フィルター及び参照用フィルターの透過率と検出器
の分光感度との関係を示す線図である。 10・・・ガス分析計、 12・・・光放射源、 14・・・フィルタセット、 14A・・・測定用フィルター 14B・・・参照用フィルター 16・・・試料セル、 18・・・検出器、 24・・・タバコの葉、 28・・・水分計。
Figure 1 is a block diagram showing an embodiment in which the present invention is applied to a gas analyzer, and Figure 2 is a line showing the relationship between the transmittance of the measurement and reference filters and the spectral sensitivity of the detector in the same embodiment. Figure 3 is an optical system diagram showing an example in which the present invention is applied to a moisture analyzer, and Figure 4 shows the transmittance of the measurement filter and reference filter and the spectral sensitivity of the detector in a conventional gas analyzer. FIG. DESCRIPTION OF SYMBOLS 10... Gas analyzer, 12... Light radiation source, 14... Filter set, 14A... Measurement filter 14B... Reference filter 16... Sample cell, 18... Detector , 24... Tobacco leaf, 28... Moisture meter.

Claims (1)

【特許請求の範囲】[Claims] (1)光放射源と、この光放射源の光から特定波長光を
測定光として選択する測定用フィルターと、前記光放射
源の光から、前記測定光の波長に近く、且つ、該波長よ
りも短い波長の短波長参照光及び長い波長の長波長参照
光を選択する参照用フィルターと、を有してなり、前記
測定光及び参照光を被測定物に照射し、該被測定物の透
過光又は反射光中の前記測定光と参照光の比から前記被
測定物の成分を分析する光による分析計において、前記
参照用フィルターを、前記短波長参照光から長波長参照
光までの連続的範囲の光を選択して透過させるワイドバ
ンドパスフィルターとしたことを特徴とする光による分
析計。
(1) a light radiation source; a measurement filter that selects light of a specific wavelength as measurement light from the light of the light radiation source; a reference filter that selects a short wavelength reference light with a short wavelength and a long wavelength reference light with a long wavelength; In a light-based analyzer that analyzes the components of the object to be measured from the ratio of the measurement light and reference light in the light or reflected light, the reference filter is continuously connected to the light from the short wavelength reference light to the long wavelength reference light. An optical analyzer characterized by a wide bandpass filter that selectively transmits a range of light.
JP1674190A 1990-01-26 1990-01-26 Analyzer by light Pending JPH03221843A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1674190A JPH03221843A (en) 1990-01-26 1990-01-26 Analyzer by light

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1674190A JPH03221843A (en) 1990-01-26 1990-01-26 Analyzer by light

Publications (1)

Publication Number Publication Date
JPH03221843A true JPH03221843A (en) 1991-09-30

Family

ID=11924694

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1674190A Pending JPH03221843A (en) 1990-01-26 1990-01-26 Analyzer by light

Country Status (1)

Country Link
JP (1) JPH03221843A (en)

Cited By (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0612949U (en) * 1991-12-30 1994-02-18 日新電機株式会社 Gas concentration measuring device
WO1995026497A1 (en) * 1994-03-25 1995-10-05 Nippon Sanso Corporation Infrared spectrochemical gas analysis and apparatus used for the same
JP5975366B1 (en) * 2015-10-23 2016-08-23 パナソニックIpマネジメント株式会社 Plant moisture content evaluation method and plant moisture content assessment device
JP5979567B1 (en) * 2015-04-30 2016-08-24 パナソニックIpマネジメント株式会社 Plant stress detection apparatus and plant stress detection method
JP5979572B1 (en) * 2016-01-29 2016-08-24 パナソニックIpマネジメント株式会社 Water content observation device, water content observation method and cultivation device
JP5979573B1 (en) * 2016-02-29 2016-08-24 パナソニックIpマネジメント株式会社 Water content observation device, water content observation method and cultivation device
JP5982731B1 (en) * 2016-02-26 2016-08-31 パナソニックIpマネジメント株式会社 Water content observation device, water content observation method and cultivation device
JP5984075B1 (en) * 2016-02-26 2016-09-06 パナソニックIpマネジメント株式会社 Water content observation device, water content observation method and cultivation device
JP5984072B1 (en) * 2015-10-23 2016-09-06 パナソニックIpマネジメント株式会社 Plant moisture content evaluation apparatus and plant moisture content assessment method
JP2017083425A (en) * 2016-07-19 2017-05-18 パナソニックIpマネジメント株式会社 Apparatus and method for evaluating water content of plant
WO2017130249A1 (en) * 2016-01-29 2017-08-03 パナソニックIpマネジメント株式会社 Device for observing water content, method for observing water content, and cultivation device
JP2017148034A (en) * 2016-07-19 2017-08-31 パナソニックIpマネジメント株式会社 Water content observation device, water content observation method and cultivation device
US10126234B2 (en) 2015-10-23 2018-11-13 Panasonic Intellectual Property Management Co., Ltd. Water content of a part of plant evaluation method and water content of a part of plant evaluation apparatus
JP2020177026A (en) * 2020-07-16 2020-10-29 パナソニックIpマネジメント株式会社 Water content observation device, water content observation method and cultivation device

Cited By (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0612949U (en) * 1991-12-30 1994-02-18 日新電機株式会社 Gas concentration measuring device
WO1995026497A1 (en) * 1994-03-25 1995-10-05 Nippon Sanso Corporation Infrared spectrochemical gas analysis and apparatus used for the same
WO2016174803A1 (en) * 2015-04-30 2016-11-03 パナソニックIpマネジメント株式会社 Device for detecting plant stress and method for detecting plant stress
JP5979567B1 (en) * 2015-04-30 2016-08-24 パナソニックIpマネジメント株式会社 Plant stress detection apparatus and plant stress detection method
JP5975366B1 (en) * 2015-10-23 2016-08-23 パナソニックIpマネジメント株式会社 Plant moisture content evaluation method and plant moisture content assessment device
JP5984072B1 (en) * 2015-10-23 2016-09-06 パナソニックIpマネジメント株式会社 Plant moisture content evaluation apparatus and plant moisture content assessment method
US10126234B2 (en) 2015-10-23 2018-11-13 Panasonic Intellectual Property Management Co., Ltd. Water content of a part of plant evaluation method and water content of a part of plant evaluation apparatus
JP2017083207A (en) * 2015-10-23 2017-05-18 パナソニックIpマネジメント株式会社 Method and device for evaluating plant water content
US10613024B2 (en) 2015-10-23 2020-04-07 Panasonic Intellectual Property Management Co., Ltd. Water content of a part of object evaluation method and water content of a part of object evaluation apparatus
US10267730B2 (en) 2015-10-23 2019-04-23 Panasonic Intellectual Property Management Co., Ltd. Water content of a part of plant evaluation method and water content of a part of plant evaluation apparatus
JP5979572B1 (en) * 2016-01-29 2016-08-24 パナソニックIpマネジメント株式会社 Water content observation device, water content observation method and cultivation device
WO2017130249A1 (en) * 2016-01-29 2017-08-03 パナソニックIpマネジメント株式会社 Device for observing water content, method for observing water content, and cultivation device
JP5982731B1 (en) * 2016-02-26 2016-08-31 パナソニックIpマネジメント株式会社 Water content observation device, water content observation method and cultivation device
JP5984075B1 (en) * 2016-02-26 2016-09-06 パナソニックIpマネジメント株式会社 Water content observation device, water content observation method and cultivation device
WO2017145980A1 (en) * 2016-02-26 2017-08-31 パナソニックIpマネジメント株式会社 Moisture content observation device, moisture content observation method, and cultivating device
JP5979573B1 (en) * 2016-02-29 2016-08-24 パナソニックIpマネジメント株式会社 Water content observation device, water content observation method and cultivation device
WO2017150213A1 (en) * 2016-02-29 2017-09-08 パナソニックIpマネジメント株式会社 Moisture content observation device, moisture content observation method, and cultivation device
JP2017148034A (en) * 2016-07-19 2017-08-31 パナソニックIpマネジメント株式会社 Water content observation device, water content observation method and cultivation device
JP2017083425A (en) * 2016-07-19 2017-05-18 パナソニックIpマネジメント株式会社 Apparatus and method for evaluating water content of plant
JP2020177026A (en) * 2020-07-16 2020-10-29 パナソニックIpマネジメント株式会社 Water content observation device, water content observation method and cultivation device

Similar Documents

Publication Publication Date Title
US5081998A (en) Optically stabilized infrared energy detector
US4829183A (en) Dual sample cell gas analyzer
US4271124A (en) Non-dispersive infrared gas analyzer for testing gases containing water-vapor
US5095913A (en) Shutterless optically stabilized capnograph
US6313464B1 (en) Infrared, multiple gas analyzer and methods for gas analysis
US5464983A (en) Method and apparatus for determining the concentration of a gas
US4471220A (en) System for monitoring trace gaseous ammonia concentration in flue gases
JPH03221843A (en) Analyzer by light
JPH0219746A (en) Method of measuring lamda coefficient or air/fuel ratio and both and apparatus for implementing the same
JPH02236441A (en) Apparatus and method for identifying multiple gas
US4692622A (en) Infrared analyzer
US5936250A (en) Ultraviolet toxic gas point detector
AU637827B2 (en) Shutterless optically stabilized capnograph
JPH0219718Y2 (en)
JPS58156837A (en) Measuring device for optical gas analysis
JP2004138499A (en) Gas concentration detection sensor
JPH0222687Y2 (en)
JPH07198600A (en) Fourier transform multi-component continuous absorption analyzer
JPH0560687A (en) Infrared analyzer
JPH0210441Y2 (en)
JPH0510874A (en) Light absorbing system gas analysis meter
JPH01229941A (en) Infrared type carbon dioxide analyzer
JP2001235419A (en) Infrared gas analyzer
KR100508912B1 (en) High speed gas concentration measuring apparatus based of electrical chopped emitter and semiconductor detector
RU2044303C1 (en) Gas analyzer