JPH03153029A - Chemical-liquid treatment tank for semiconductor wafer and automatic cleaning treatment apparatus - Google Patents
Chemical-liquid treatment tank for semiconductor wafer and automatic cleaning treatment apparatusInfo
- Publication number
- JPH03153029A JPH03153029A JP29265489A JP29265489A JPH03153029A JP H03153029 A JPH03153029 A JP H03153029A JP 29265489 A JP29265489 A JP 29265489A JP 29265489 A JP29265489 A JP 29265489A JP H03153029 A JPH03153029 A JP H03153029A
- Authority
- JP
- Japan
- Prior art keywords
- wafer
- cassette
- chemical
- guide groove
- treatment tank
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000004140 cleaning Methods 0.000 title claims abstract description 8
- 239000007788 liquid Substances 0.000 title claims abstract description 7
- 239000004065 semiconductor Substances 0.000 title claims abstract description 7
- 239000000126 substance Substances 0.000 claims abstract description 17
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 claims abstract description 4
- 235000012431 wafers Nutrition 0.000 claims description 46
- 238000012545 processing Methods 0.000 claims description 11
- 238000012993 chemical processing Methods 0.000 claims description 3
- 238000000034 method Methods 0.000 abstract 1
- 238000007796 conventional method Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000005530 etching Methods 0.000 description 2
- 238000010586 diagram Methods 0.000 description 1
- 230000005611 electricity Effects 0.000 description 1
- 230000003068 static effect Effects 0.000 description 1
- 238000005406 washing Methods 0.000 description 1
Landscapes
- Cleaning Or Drying Semiconductors (AREA)
Abstract
Description
【発明の詳細な説明】
【産業上の利用分野】
本発明は、半導体ウェーハーの薬液によるウェット処理
、洗浄における、薬液処理槽、水洗処理槽に関する。
[従来の技術]
従来、第2図(a)、(b)に示すように、処理槽1内
のスノコ2は、水平の状態で組込まれており、ウェーハ
ー4を収納するウェーハー収納容器3(以下カセットと
よぶ)をスノコ2上に水平に置き、指定時間による薬液
処理を行なう方法がとられていた。
[発明が解決しようとする課題]
しかし、従来の方法においては、カセット3内の第3図
に示すウェーハー案内溝7は、ウェーハ4をカセット3
への押入、取り出しを容易にするため、ウェーハー4の
厚さの約3倍の子箱(ガタ)があり、この子箱は、ウェ
ーハー4がウェーハー案内溝7の中で傾くことが可能で
ある。カセット3とウェーハー4は静電気により帯電し
ており、ウェーハー4は、ウェーハー案内溝7に引きよ
せられてしまう、又、カセット3は、何回も使用するた
め、ウェーハー案内溝7の下部のウェーハー保持部に摩
耗や衝撃キズなどでウェーハー4をウェーハー案内溝7
の側面へ接触させてしまうという状態がおきる。などが
あり、ウェーハー4の傾きは一定しない、この状態で薬
液処理槽lヘカセット3を浸漬し処理すると、ウェーハ
ー4の表面がウェーハー案内溝7に接触したものは、レ
ジスト残り、エツチング残りがおきてしまい1歩留り低
下の原因となっていた。
そこで本発明は、従来のこのような課題を解決するため
、薬液処理槽l内のスノコ2を傾斜させ、かつ、ウェー
ハー押上げ突起6とカセットガイド5を設けることによ
り、処理残りのおきない薬液処理槽を提供することを目
的とする。
[課題を解決するための手段1
上記問題点を解決するために、本発明の薬液処理槽は、
半導体ウェーハーの薬液又は、純水処理において、処理
槽内のスノコを傾けたことを特徴とする。前記スノコに
ウェーハー押上げ突起及びウェーハー収納容器の位置決
めガイドを設けたことを特徴とする。
[実施例1
以下に、本発明の実施例を図面にもとづいて説明する。
第1図(a)、(b)は、薬液処理槽の構造。
機能を示したものである。薬液処理槽l内のスノコ2は
、ウェーハー4の表面側が、第3図に示すカセット案内
?jI7において裏面側へ倒れるように3°〜5°傾け
られている。又、スノコ2においてカセット3の中央に
、ウェーハー4の押上げ突起6がとりつけられている。
ウェーハー押上げ突起6について第4図により詳しく説
明すると、ウェーハー4が、カセット案内溝7に対し、
中央にくるように、ウェーハー押上げ突起6に案内V溝
が切ってあり、これによりウェーハー案内溝7への接触
を最小限にすることができる。
又、カセット3は、カセットガイド5により、定位置へ
位置決めできる。カセットガイド5は、第4図に示すよ
うに、カセット3に対し、定位置へ安定してセットでき
るようテーパーがついている。
これらの簡単な、構造、構成により、カセット3内のウ
ェーハー4は、静電気によりウェーハーがウェーハー案
内溝7の側面へ引き寄せられているものや、又、ウェー
ハー案内溝7は、何回も使用されるため、変形やキズな
どが入り、スノコ2の傾きだけでは、裏面側へ倒れない
ウェーハー4も、ウェーハー押上げ突起6により、ウェ
ーハー表面とウェーハー案内溝7との面接触部がな(な
る、又、これらによりウェーハー4はすべて裏面側へ倒
れ安定して位置も決まる。カセットガイド5により、第
1図の薬液処理槽を自動洗浄処理装置に用いても、搬送
ロボットのシビアな位置決め精度を必要とせず、安定搬
送にもその効果がある。
〔発明の効果〕
本発明は、以上説明した実施例のごとく、簡単な構造に
より、ウェーハー4の、裏面側が、カセット案内溝7へ
倒れるため、洗浄、パクリ、エツチング等の処理残りが
なくなり、バラツキのない処理が可能となって歩留り向
上が、はかれる効果がある。又、自動洗浄処理装置に用
いても、品質の安定と搬送の安定位置決めが達成できる
効果がある。DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a chemical treatment tank and a water washing treatment tank for wet processing and cleaning of semiconductor wafers with chemicals. [Prior Art] Conventionally, as shown in FIGS. 2(a) and 2(b), the drainboard 2 in the processing tank 1 is installed in a horizontal state, and the wafer storage container 3 ( A conventional method was to place a cassette (hereinafter referred to as a cassette) horizontally on a drainboard 2 and perform chemical treatment for a specified period of time. [Problems to be Solved by the Invention] However, in the conventional method, the wafer guide groove 7 shown in FIG.
In order to make it easier to push in and take out the wafer 4, there is a child box (backlash) approximately three times the thickness of the wafer 4, and this child box allows the wafer 4 to tilt in the wafer guide groove 7. . The cassette 3 and the wafer 4 are electrostatically charged, and the wafer 4 is pulled toward the wafer guide groove 7. Also, since the cassette 3 is used many times, the wafer is held at the bottom of the wafer guide groove 7. The wafer 4 may be damaged due to wear or impact scratches on the wafer guide groove 7.
A situation arises in which the object comes into contact with the side of the object. If the cassette 3 is immersed in the chemical treatment tank l in this state and the wafer 4 is immersed in the cassette 3 for processing, if the surface of the wafer 4 comes into contact with the wafer guide groove 7, there will be residual resist and etching. This resulted in a decrease in yield by one point. Therefore, in order to solve these conventional problems, the present invention tilts the drainboard 2 in the chemical liquid processing tank l and provides a wafer push-up protrusion 6 and a cassette guide 5, so that the chemical liquid does not leave processing residue. The purpose is to provide treatment tanks. [Means for Solving the Problems 1 In order to solve the above problems, the chemical treatment tank of the present invention includes:
In chemical solution or pure water treatment of semiconductor wafers, the drainboard inside the treatment tank is tilted. The drainboard is characterized in that a wafer push-up protrusion and a wafer storage container positioning guide are provided on the drainboard. [Embodiment 1] An embodiment of the present invention will be described below based on the drawings. FIGS. 1(a) and 1(b) show the structure of a chemical treatment tank. It shows the function. In the drainboard 2 in the chemical treatment tank 1, the surface side of the wafer 4 is located in the cassette guide shown in FIG. At jI7, it is tilted by 3° to 5° so as to fall down to the back side. Further, in the drainboard 2, a projection 6 for pushing up the wafer 4 is attached to the center of the cassette 3. To explain the wafer push-up protrusion 6 in more detail in FIG.
A guide V groove is cut in the wafer push-up protrusion 6 so as to be located in the center, so that contact with the wafer guide groove 7 can be minimized. Further, the cassette 3 can be positioned at a fixed position by a cassette guide 5. As shown in FIG. 4, the cassette guide 5 is tapered so that the cassette 3 can be stably set in a fixed position. With these simple structures and configurations, the wafers 4 in the cassette 3 can be drawn to the sides of the wafer guide groove 7 by static electricity, and the wafer guide groove 7 can be used many times. Therefore, even if the wafer 4 is deformed or scratched and cannot be tipped over to the back side simply by tilting the drainboard 2, the surface contact between the wafer surface and the wafer guide groove 7 may be lost due to the wafer push-up protrusion 6. As a result, the wafers 4 all fall to the back side and their positions are determined stably.The cassette guide 5 makes it possible to use the chemical processing tank shown in Fig. 1 in an automatic cleaning processing device without requiring severe positioning accuracy of the transfer robot. [Effects of the Invention] The present invention has a simple structure as in the embodiments described above, and the back side of the wafer 4 falls into the cassette guide groove 7, so that cleaning and This has the effect of eliminating processing residues such as copying and etching, making it possible to perform processing without variation, and improving yield.Also, when used in automatic cleaning processing equipment, stable quality and stable positioning of conveyance can be achieved. effective.
第1図(a)、(b)は、本発明の薬液処理槽の正面図
(a)及び右側面図(b)、第2図(a)、(b)は、
従来の薬液処理槽の正面図(a)、及び右側面図(b)
、第3図は、カセット及びウェーハー収納の平面図、第
4図は、カセットガイド及びウェーハー押上げ部詳細図
。
薬液処理槽
スノコ
ウェーハー収納容器(カセット)
ウェーハー
カセットカイト
ウェーハー押上げ突起
ウェーハー案内溝
第2図(a)
逼21晃(b)
X3図FIGS. 1(a) and (b) are a front view (a) and a right side view (b) of a chemical treatment tank of the present invention, and FIGS. 2(a) and (b) are
Front view (a) and right side view (b) of a conventional chemical treatment tank
, FIG. 3 is a plan view of the cassette and wafer storage, and FIG. 4 is a detailed view of the cassette guide and wafer push-up section. Chemical treatment tank Slatted wafer storage container (cassette) Wafer cassette Kite wafer push-up protrusion Wafer guide groove Figure 2 (a) Akira 逼21 (b) X3 diagram
Claims (3)
、ウェット洗浄において、処理槽内のスノコを傾けたこ
とを特徴とする半導体ウェーハー薬液処理槽。(1) A semiconductor wafer chemical liquid processing tank characterized in that a drain board in the processing tank is tilted during wet cleaning for treating semiconductor wafers with a chemical liquid or pure water.
ー押上げ突起及びウェーハー収納容器の位置決めガイド
を設けたことを特徴とする半導体ウェーハー薬液処理槽
。(2) A semiconductor wafer chemical processing tank, characterized in that the drainboard in the chemical processing tank according to claim 1 is provided with a wafer push-up protrusion and a positioning guide for a wafer storage container.
特徴とする自動洗浄処理装置。(3) An automatic cleaning treatment device comprising the chemical treatment tank according to claim 1 or 2.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP29265489A JPH03153029A (en) | 1989-11-10 | 1989-11-10 | Chemical-liquid treatment tank for semiconductor wafer and automatic cleaning treatment apparatus |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP29265489A JPH03153029A (en) | 1989-11-10 | 1989-11-10 | Chemical-liquid treatment tank for semiconductor wafer and automatic cleaning treatment apparatus |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH03153029A true JPH03153029A (en) | 1991-07-01 |
Family
ID=17784579
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP29265489A Pending JPH03153029A (en) | 1989-11-10 | 1989-11-10 | Chemical-liquid treatment tank for semiconductor wafer and automatic cleaning treatment apparatus |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH03153029A (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5379785A (en) * | 1991-10-09 | 1995-01-10 | Mitsubishi Denki Kabushiki Kaisha | Cleaning apparatus |
US5839460A (en) * | 1997-11-13 | 1998-11-24 | Memc Electronic Materials, Inc. | Apparatus for cleaning semiconductor wafers |
KR20030009763A (en) * | 2001-07-24 | 2003-02-05 | 삼성전자주식회사 | Custody apparatus of wafer |
-
1989
- 1989-11-10 JP JP29265489A patent/JPH03153029A/en active Pending
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5379785A (en) * | 1991-10-09 | 1995-01-10 | Mitsubishi Denki Kabushiki Kaisha | Cleaning apparatus |
US5839460A (en) * | 1997-11-13 | 1998-11-24 | Memc Electronic Materials, Inc. | Apparatus for cleaning semiconductor wafers |
KR20030009763A (en) * | 2001-07-24 | 2003-02-05 | 삼성전자주식회사 | Custody apparatus of wafer |
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