JPH02291640A - Withstand voltage treatment of cathode-ray tube - Google Patents

Withstand voltage treatment of cathode-ray tube

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Publication number
JPH02291640A
JPH02291640A JP11160889A JP11160889A JPH02291640A JP H02291640 A JPH02291640 A JP H02291640A JP 11160889 A JP11160889 A JP 11160889A JP 11160889 A JP11160889 A JP 11160889A JP H02291640 A JPH02291640 A JP H02291640A
Authority
JP
Japan
Prior art keywords
voltage
high voltage
pulsed high
treatment
withstand voltage
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP11160889A
Other languages
Japanese (ja)
Inventor
Norihisa Takiura
瀧浦 徳久
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp filed Critical Toshiba Corp
Priority to JP11160889A priority Critical patent/JPH02291640A/en
Publication of JPH02291640A publication Critical patent/JPH02291640A/en
Pending legal-status Critical Current

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  • Manufacture Of Electron Tubes, Discharge Lamp Vessels, Lead-In Wires, And The Like (AREA)

Abstract

PURPOSE:To remove foreign matters and projects within a short time and obtain a desired withstand voltage by carrying out a prescribed withstand voltage treatment before or during application of pulsed high voltage. CONSTITUTION:Pulsed high voltage and d.c. voltage slightly higher than those applied prior are repeatedly applied by switching a high voltage power source 14 and a direct current power source 25 by a control apparatus. By this method, foreign matters which do not stand sufficiently by prior d.c. voltage application are brought to stand and eliminated or lessened by next pulsed high voltage, and projects which are lessened by prior pulsed high voltage are further lessened. As a result, a prescribed withstand voltage treatment is carried out at a relatively low high voltage and the treatment period is shortened.

Description

【発明の詳細な説明】 [発明の目的] (産業上の利用分野) この発明は、陰極線管の耐電圧処理方法に関する。[Detailed description of the invention] [Purpose of the invention] (Industrial application field) The present invention relates to a voltage resistance treatment method for cathode ray tubes.

(従来の技術) たとえばカラー受像管などの陰極線管は、蛍光体スクリ
ーン上に高輝度、高解像度の画像を表示するために、電
子銃の一部電極に陽極端子を介して高電圧を印加し、カ
ソードから放出される電子ビームを集束加速する構造に
形成されている。
(Prior art) For example, in a cathode ray tube such as a color picture tube, a high voltage is applied to some electrodes of an electron gun via an anode terminal in order to display a high-brightness, high-resolution image on a phosphor screen. , is formed in a structure that focuses and accelerates the electron beam emitted from the cathode.

このように電子銃の電極に高電圧を印加して電子ビーム
を集束加速する陰極線管においては、動作時に、その高
電圧印加電極やその近傍の電極表面に付着するごみなど
の異物や電極自体のパリなどの突起を発生源とする放電
が発生し、画面品位をいちじるしく損なう。そのために
このような陰極線管については、従来より排気後、高電
圧印加電極にテスラコイルやインダクンヨンコイルなど
の高電圧発生源からピーク電圧をもつパルス状高電圧を
印加して、上記異物や突起を除去する耐電圧処理がおこ
なわれている。
In a cathode ray tube that focuses and accelerates the electron beam by applying a high voltage to the electrode of the electron gun, during operation, foreign matter such as dust that adheres to the high voltage application electrode or the electrode surface in the vicinity, or the electrode itself. Electric discharge occurs from protrusions such as bumps, which seriously impairs the quality of the screen. For this reason, in conventional cathode ray tubes, after evacuation, a pulsed high voltage with a peak voltage is applied to the high voltage application electrode from a high voltage source such as a Tesla coil or an Indakun Yong coil to remove the foreign objects and protrusions. A withstand voltage treatment is being performed to remove it.

すなわち、高電圧発生源からピーク電圧をもつパルス状
の高電圧を印加すると、電極表面から突出している突起
については、電極間に繰返し発生する放電のエネルギに
より漸次小さくなり、陰極線管動作時に放゛rヒを発生
しないようにすることができる。一方、電極表面に付着
している異物については、耐電圧処理により電極表面か
ら突出しているものについては同様に除去できるか、第
3図に示すように、太さにくらべて長さが長く電極表面
(1)上に横たわって表面からあまり突出しておらず、
耐電圧上ほとんど問題とならなかった異物(2)があり
、これが耐電圧処理後陰極線管に加わるの振動などによ
り破線で示すように起立して、陰極線管動作時の耐電圧
を劣化することがある。
In other words, when a pulse-like high voltage with a peak voltage is applied from a high voltage source, the protrusions protruding from the electrode surface gradually become smaller due to the energy of the discharge that repeatedly occurs between the electrodes, and the radiation emitted during the operation of the cathode ray tube. It is possible to prevent r-hi from occurring. On the other hand, regarding foreign matter adhering to the electrode surface, whether it is possible to remove it in the same way if it protrudes from the electrode surface by withstand voltage treatment, or if the length of the electrode is longer than the thickness, as shown in Figure 3, lying on the surface (1) and not protruding much from the surface;
There is a foreign substance (2) that hardly caused any problems with the withstand voltage, and after the withstand voltage treatment, due to vibrations applied to the cathode ray tube, these particles stand up as shown by the broken line and can deteriorate the withstand voltage during operation of the cathode ray tube. be.

このような異物(2)を除去するためには、その電極表
面(1)上に横たわる異物(2)との間に放電が発生す
るように印加電圧を高く、さらには処理時間を長くすれ
ばよいが、印加電圧を高くしたり処理時間を長くすると
、その高い放電エネルギや放電による加熱のために、電
子銃の11人されているガラスネックにクラックや剥離
が発生するという問題がある。
In order to remove such foreign matter (2), it is necessary to increase the applied voltage so that a discharge occurs between the foreign matter (2) lying on the electrode surface (1), and to lengthen the treatment time. However, if the applied voltage is increased or the processing time is increased, there is a problem in that the glass neck of the electron gun will crack or peel due to the high discharge energy and heating caused by the discharge.

(発明が解決しようとする課題) 上記のように陰極線管の耐電圧処理方法は、電子銃の所
要の7κ極にピーク電圧をもつパルス状高電圧を印加し
ておこなわれ、電極表面から突出しているパリなどの突
起については、電極間に繰返し発生する放電のエネルギ
により漸次小さくして、陰極線管動作時に放電を発生し
ないようにすることができる。また、電極表面に付着す
るごみについても一般的には同様に除去できるが、特に
太さにくらべて長さが長く、耐電圧処理時に電極表面上
に横たわって表面からほとんど突出していない異物につ
いては除去されず、耐電圧処理後に加わる振動などによ
り起立して、陰極線管動作時の耐電圧を劣化するという
問題がある。
(Problems to be Solved by the Invention) As described above, the voltage resistance treatment method for cathode ray tubes is performed by applying a pulsed high voltage with a peak voltage to the required 7κ poles of an electron gun, and The projections, such as the bumps, can be gradually reduced in size by the energy of the discharge that repeatedly occurs between the electrodes, so that no discharge occurs during operation of the cathode ray tube. In addition, although dust adhering to the electrode surface can generally be removed in the same way, foreign matter that is long compared to its thickness and lies on the electrode surface during voltage withstanding treatment and hardly protrudes from the surface can be removed. There is a problem in that the particles are not removed and stand up due to vibrations applied after voltage resistance treatment, deteriorating the voltage resistance during operation of the cathode ray tube.

このような異物を除去するために、耐電圧処理時の印加
電圧を高く、さらには処理時間を長くすると、その高い
放電エネルギや放電による加熱のために、電子銃の封入
されているガラスネックにクラックや剥離が発生すると
いう問題がおこる。
In order to remove such foreign substances, if the voltage applied during voltage withstanding treatment is increased and the treatment time is lengthened, the glass neck in which the electron gun is enclosed will be damaged due to the high discharge energy and heating caused by the discharge. Problems arise in that cracks and peeling occur.

この発明は、上記問題点を解決するためになされたもの
であり、耐電圧処理時の印加電圧を高くすることなくか
つ短時間に異物や突起を除去して、容易に所要の耐電圧
特性をもつ陰極線管とすることができる耐電圧処理方法
を得ることを目的とする。
This invention was made to solve the above-mentioned problems, and removes foreign objects and protrusions in a short time without increasing the applied voltage during withstand voltage treatment, thereby easily achieving the required withstand voltage characteristics. The purpose of the present invention is to obtain a voltage-resistant processing method that allows cathode ray tubes to be made with high voltage.

[発明の構成] (課題を解決するための手段) 高電圧印化電極を含む複数個の電極からなる陰極線管の
電子銃にピーク電圧をもつパルス状高電圧を印加して耐
電圧処理をおこなう陰極線管の耐電圧処理方法において
、−L記パルス状高電圧の印加前または印加途中に、」
二記電極間に放電を発生しない程度に」二記パルス状高
電圧よりも低い直流電圧を連続的または断続的に印加す
るか、または交流電圧を印加して耐電圧処理をおこなう
ようにした。
[Structure of the Invention] (Means for Solving the Problems) A withstand voltage treatment is performed by applying a pulsed high voltage having a peak voltage to an electron gun of a cathode ray tube consisting of a plurality of electrodes including a high voltage application electrode. In the withstand voltage treatment method for cathode ray tubes, - before or during the application of the pulsed high voltage,
A DC voltage lower than the second pulsed high voltage was applied continuously or intermittently, or an AC voltage was applied to carry out voltage resistance treatment to the extent that no discharge occurred between the two electrodes.

(作 用) 上記のようにピーク電圧をもつパルス状高電圧の印加前
または印加途中に、電極間に放電を発生しない程度に低
い直流または交流電圧を印加すると、その印加電極間に
形成される直流または交流電界により、パルス状高電圧
では起立させることのできない異物を起立させることが
でき、その後印加されるパルス状高電圧により、その起
立した異物を除去することができ、直流または交流電圧
とパルス状高電圧との併用により、短時間に耐電圧特性
良好な陰極線管とすることができる。
(Function) If a DC or AC voltage that is low enough not to generate a discharge between the electrodes is applied before or during the application of a pulsed high voltage with a peak voltage as described above, a voltage is formed between the applied electrodes. A direct current or alternating current electric field can erect foreign matter that cannot be erected with a pulsed high voltage, and then the pulsed high voltage applied can remove the erected foreign matter. By using it in combination with a pulsed high voltage, a cathode ray tube with good withstand voltage characteristics can be produced in a short time.

(実施例) 以下、図面を参照してこの発明を実施例に括づいて説明
する。
(Examples) Hereinafter, the present invention will be explained based on examples with reference to the drawings.

第1図に示すように、陰極線管(10)のコーン部(1
1)に設けられた陽極端子(12)に抵抗(13)を介
してピーク電圧をもつパルス状高電圧を発生する高電圧
電源(14)を接続する。ネック(15)内に封入され
ている電子銃(16)の高電圧印加電極(l7)は、こ
の陽極端子(l2)に内部導電膜(l8)、この内部導
電膜(l8)に圧接するバルブスベーサ<19)を介し
て接続されている。一方、上記高電圧印加電極(17)
以外の複数個のグリッド(電極) (20)、カソード
(2l)、このカソード(21)を加熱するヒータ(2
2)が接続されているネック(l5)端部の罠数本のベ
ースビンにソケット(23)を接続する。このソケッ1
・(23)は、上記各ベースピンを差込む複数個のべ一
スピン受金具を有し、その各ベースピン受金具が抵抗(
24)を介して接地されている。さらに、上記陽極端子
(12)に上記高電圧電源(14)より低い電圧を発生
する直流電源(25)を接続する。これら高電圧電源(
14)および直流電源(25)からの電圧の印加、その
電圧値および印加時間は、図示しない制御装置により任
意に制御されるようになっている。
As shown in FIG. 1, the cone portion (1
A high-voltage power source (14) that generates a pulsed high voltage having a peak voltage is connected to the anode terminal (12) provided in 1) via a resistor (13). The high voltage application electrode (l7) of the electron gun (16) enclosed in the neck (15) is connected to this anode terminal (l2) by an internal conductive film (l8) and a bulb baser which is in pressure contact with this internal conductive film (l8). <19). On the other hand, the high voltage application electrode (17)
A plurality of grids (electrodes) (20) other than the above, a cathode (2l), and a heater (2
2) Connect the socket (23) to the base bin of several traps at the end of the neck (l5) to which it is connected. This socket 1
・(23) has a plurality of base pin holders into which the above-mentioned base pins are inserted, and each base pin holder has a resistance (
24). Furthermore, a DC power source (25) that generates a voltage lower than the high voltage power source (14) is connected to the anode terminal (12). These high voltage power supplies (
14) and the DC power source (25), the voltage value, and the application time are arbitrarily controlled by a control device (not shown).

耐電圧処理は、まず高電圧電源(14)から陽極端子(
12)に、第2図に示すように、ピーク電圧をもつ比較
的低いパルス状高電圧(27)を印加する。このパルス
状高7u圧(27)印加により高電圧印加電極(l7)
とこの電極(l7)に隣接する電極との間に放電が発生
する。この放電は、両電極の少なくとも一方の表面の比
較的大きな突起部(異物を含む)におこり、その放電の
エネルギによりその比較的大きな突起は消滅または小さ
くなる。したがって、上記比較的低いパルス状高電圧(
27)を印加し続けると、放電回数か次第に減少する。
For withstand voltage treatment, first connect the high voltage power supply (14) to the anode terminal (
12), a relatively low pulsed high voltage (27) having a peak voltage is applied as shown in FIG. By applying this pulsed high 7u pressure (27), the high voltage application electrode (17)
A discharge occurs between this electrode (l7) and the electrode adjacent to it. This discharge occurs on a relatively large protrusion (including foreign matter) on the surface of at least one of both electrodes, and the relatively large protrusion disappears or becomes smaller due to the energy of the discharge. Therefore, the above relatively low pulsed high voltage (
27), the number of discharges gradually decreases.

つまり、一定時間比較的低い高電圧(27)を印加し続
けると、突起は一定大きさ以下となり、放電回数が減少
する。
That is, if a relatively low high voltage (27) is continued to be applied for a certain period of time, the protrusion becomes smaller than a certain size and the number of discharges decreases.

この段階で、上記高電圧電源(14)からの高電圧(2
7)の印加を停市して、直流電源(25)からそれまで
印加していた高電圧(27)よりも低い直流電圧(28
)を連続的またはたとえば0.2秒程度の周期で断続的
に一定時間印加する。この直流電圧(26)の印加によ
り、第3図に示したように電極表面上に横たわる太さに
くらべて長さの長い異物(2)は、第2図に示すように
、電気力線に沿って起立し、見掛け上大きな突起(異物
(2))となる。
At this stage, the high voltage (2
7) is stopped, and the DC voltage (28) lower than the high voltage (27) that had been applied from the DC power supply (25)
) is applied continuously or intermittently at a period of, for example, about 0.2 seconds for a certain period of time. By applying this DC voltage (26), the foreign object (2), which is longer than the thickness and lying on the electrode surface as shown in FIG. It stands up along the sides and becomes an apparently large protrusion (foreign object (2)).

そこで、この直流雷圧(28)の印加を停止して、高’
,−1i ffE電源(l4)に切換え、前回の比較的
低いパルス状高電圧(27)よりも若干高いピーク電圧
をもつパルス状高電圧(29)を印加する。特にこの例
では、図面に(29a) , (29b)で示したよう
に高低異なる2段階の電圧を印加している。このように
前回の比較的低いパルス状高電圧(27)よりも高いピ
ーク電圧をもつパルス状高電圧(29)を印加すると、
上記直流電圧(28)の印加により起立した異物(2)
を消滅または小さくすると同時に、前回の比較的低いパ
ルス状高電圧(27)により小さくなった突起をさらに
小さくすることができる。
Therefore, we stopped applying this DC lightning pressure (28) and
, -1i Switch to the ffE power supply (l4) and apply a pulsed high voltage (29) having a slightly higher peak voltage than the previous relatively low pulsed high voltage (27). Particularly, in this example, two levels of voltages with different high and low levels are applied as shown in (29a) and (29b) in the drawing. In this way, when applying a pulsed high voltage (29) with a higher peak voltage than the previous relatively low pulsed high voltage (27),
Foreign matter (2) that stood up due to the application of the above DC voltage (28)
At the same time, it is possible to further reduce the size of the protrusion that was reduced due to the previous relatively low pulsed high voltage (27).

したがって、図面に(27)〜(33)で示すように制
御装置により高電圧電源(l4)と直流電源(25)と
を切換え、かつ前回印加したパルス状高電圧または直流
電圧よりも若干高いパルス状高電圧および「α流電圧を
繰返し印加すると、前回の直流電圧の印加で十分に起立
しなかった異物を起立させて、それをつぎのパルス状高
電圧でさらに消滅または小さくするとともに、前回のパ
ルス状高電圧により小さくなった突起をさらに小さくす
ることができ、その結果、所要の耐電圧処理を比較的低
い高電圧でおこなうことができ、かつ処理時間を短縮す
ることができる。
Therefore, as shown in (27) to (33) in the drawing, the high voltage power supply (l4) and the DC power supply (25) are switched by the control device, and a pulse slightly higher than the previously applied pulsed high voltage or DC voltage is applied. When pulse-like high voltage and α-current voltage are repeatedly applied, foreign matter that was not sufficiently erected by the previous application of DC voltage is erected, and the next pulse-like high voltage further eliminates or reduces the size of the foreign matter. The protrusions that have become smaller due to the pulsed high voltage can be further reduced in size, and as a result, the required withstand voltage treatment can be performed at a relatively low high voltage, and the treatment time can be shortened.

なお、上記実施例では、高電圧印加電極とこの高電圧印
加電極に隣接する電極に、ピーク電圧をもつパルス状高
電圧と直流電圧とを繰返し印加する場合について述べた
が、一般にiJ YX圧処理においては、高電圧印加電
極にパルス状高電圧を印加すると、他の電極にもそれに
附随して高電圧が誘起し、隣接電極との間に放電がおこ
るので、パルス状高電圧は高電圧印加電極に印加するだ
けでょいが、直流電圧の印加は、隣接電極との間に強い
電界が形成され、離れた電極との間の電界は弱くなるた
め、各電極に付着する異物を十分に起立させて除去する
ためには、直流電圧は高電圧印加電極ばかりでなく、こ
の高電圧印加電極から離れた位置にある電極にも印加す
るとよい。
In addition, in the above embodiment, a case was described in which a pulsed high voltage with a peak voltage and a DC voltage are repeatedly applied to a high voltage application electrode and an electrode adjacent to this high voltage application electrode, but in general, iJ YX pressure treatment When a pulsed high voltage is applied to a high voltage application electrode, high voltage is induced in other electrodes as well, and a discharge occurs between the adjacent electrodes. Although it is enough to just apply a DC voltage to the electrodes, a strong electric field is formed between adjacent electrodes and a weaker electric field between distant electrodes, so it is necessary to thoroughly remove foreign substances that adhere to each electrode. In order to stand up and remove, it is preferable to apply a DC voltage not only to the high voltage application electrode but also to an electrode located at a distance from the high voltage application electrode.

なおまた、−L記実施例では、異物を起立させるために
直流電圧を印加したが、この直流電圧のかわりに商用正
弦波交流電圧などの交流電圧を印加しても、同様に異物
を起立させることができる。
Furthermore, in the embodiment described in -L, a DC voltage was applied to make the foreign matter stand up, but even if an AC voltage such as a commercial sine wave AC voltage is applied instead of this DC voltage, the foreign matter will be made to stand up in the same way. be able to.

[発明の構成] (課題を解決するための手段) 高電圧印加電極を含む複数個の電極からなる陰極線管の
電子銃にピーク電圧をもつパルス状高電圧を印加して耐
電圧処理をおこなうに際し、ピーク電圧をもつパルス状
高電圧を印加する前または途中に、上記電極間に放電を
発生しない程度にそのパルス状高電圧よりも低い直流電
圧を連続的または断続的に印加するかまたは交Kid圧
を印加すると、その直流または交流電圧によりパルス状
高電圧では除去されなかった異物を起立させ、その後に
印加するパルス状高電圧により、その起立した異物を除
去することができ、比較的低い高電圧で陰極線管の耐電
圧特性を良好にすることができ、かつ短時間に耐電圧処
理することができる。
[Structure of the Invention] (Means for Solving the Problems) When performing voltage withstanding treatment by applying a pulsed high voltage having a peak voltage to an electron gun of a cathode ray tube consisting of a plurality of electrodes including a high voltage application electrode. , Before or during the application of the pulsed high voltage having the peak voltage, continuously or intermittently apply a DC voltage lower than the pulsed high voltage to the extent that no discharge occurs between the electrodes, or alternating current voltage. When voltage is applied, the DC or AC voltage causes foreign particles that were not removed by the pulsed high voltage to stand up, and the pulsed high voltage that is subsequently applied can remove the standing foreign particles. The withstand voltage characteristics of the cathode ray tube can be improved by applying voltage, and the withstand voltage can be treated in a short time.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図はこの発明の一実施例である耐電圧処理方法の説
明図、第2図はそのパルス状高電圧および直流電圧の印
加方法を示す図、第3図は直流電圧の印加により起立す
る異物の説明図、第4図は電極上に横たわる異物の説明
図である。 12・・・陽極端子 l6・・・電子銃 l7・・・高電圧印加電極 27・・・ピーク電圧をもつパルス状高電圧28・・・
直流電圧 29・・・ピーク電圧をもつパルス状高電圧30・・・
直流電圧 3l・・・ピーク電圧をもつパルス状高電圧32・・・
直流電圧 第 図 印カロ岨110 第 2図
Fig. 1 is an explanatory diagram of a withstand voltage processing method which is an embodiment of the present invention, Fig. 2 is a diagram showing a method of applying pulsed high voltage and DC voltage, and Fig. 3 is a diagram showing a method of applying a high voltage in the form of a pulse and a DC voltage. FIG. 4 is an explanatory diagram of foreign matter lying on the electrode. 12... Anode terminal l6... Electron gun l7... High voltage application electrode 27... Pulse high voltage with peak voltage 28...
DC voltage 29... Pulse high voltage with peak voltage 30...
DC voltage 3l... Pulse high voltage 32 with peak voltage...
DC Voltage Chart Mark 110 Figure 2

Claims (1)

【特許請求の範囲】[Claims] 高電圧印加電極を含む複数個の電極からなる陰極線管の
電子銃にピーク電圧をもつパルス状高電圧を印加して耐
電圧処理をおこなうに際し、上記パルス状高電圧の印加
前または印加途中に、上記電極間に放電を発生しない程
度に上記パルス状高電圧よりも低い直流電圧を連続的ま
たは断続的に印加するかまたは交流電圧を印加すること
を特徴とする陰極線管の耐電圧処理方法。
When applying a pulsed high voltage with a peak voltage to the electron gun of a cathode ray tube consisting of multiple electrodes including a high voltage application electrode to perform withstand voltage processing, before or during the application of the pulsed high voltage, A method for treating a cathode ray tube with withstand voltage, characterized in that a DC voltage lower than the pulsed high voltage is applied continuously or intermittently, or an AC voltage is applied to an extent that no discharge occurs between the electrodes.
JP11160889A 1989-04-28 1989-04-28 Withstand voltage treatment of cathode-ray tube Pending JPH02291640A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP11160889A JPH02291640A (en) 1989-04-28 1989-04-28 Withstand voltage treatment of cathode-ray tube

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11160889A JPH02291640A (en) 1989-04-28 1989-04-28 Withstand voltage treatment of cathode-ray tube

Publications (1)

Publication Number Publication Date
JPH02291640A true JPH02291640A (en) 1990-12-03

Family

ID=14565655

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11160889A Pending JPH02291640A (en) 1989-04-28 1989-04-28 Withstand voltage treatment of cathode-ray tube

Country Status (1)

Country Link
JP (1) JPH02291640A (en)

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