JPH01304733A - Semiconductor wafer washer - Google Patents
Semiconductor wafer washerInfo
- Publication number
- JPH01304733A JPH01304733A JP13618588A JP13618588A JPH01304733A JP H01304733 A JPH01304733 A JP H01304733A JP 13618588 A JP13618588 A JP 13618588A JP 13618588 A JP13618588 A JP 13618588A JP H01304733 A JPH01304733 A JP H01304733A
- Authority
- JP
- Japan
- Prior art keywords
- wafers
- cage
- wafer
- driving means
- grooves
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000004065 semiconductor Substances 0.000 title claims abstract description 31
- 235000012431 wafers Nutrition 0.000 claims abstract description 64
- 238000004140 cleaning Methods 0.000 claims description 40
- 239000007788 liquid Substances 0.000 claims description 33
- 238000005406 washing Methods 0.000 abstract 1
- 230000000694 effects Effects 0.000 description 6
- 238000010586 diagram Methods 0.000 description 2
- 239000000126 substance Substances 0.000 description 2
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 2
- 239000003795 chemical substances by application Substances 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 230000000717 retained effect Effects 0.000 description 1
- 238000004904 shortening Methods 0.000 description 1
- 238000003860 storage Methods 0.000 description 1
Landscapes
- Cleaning By Liquid Or Steam (AREA)
Abstract
Description
【発明の詳細な説明】
〔産業上の利用分野〕
この発明は、半導体装置の製造工程における半導体ウェ
ハの洗浄装置に関するものである。DETAILED DESCRIPTION OF THE INVENTION [Industrial Application Field] The present invention relates to a semiconductor wafer cleaning apparatus used in a semiconductor device manufacturing process.
従来のこの種の装置としては、第3図に示すものがあっ
た。この図において、1は被洗浄物である半導体ウェハ
(以下、単にウェハという)、2はこのウェハ1を収容
するかごで、両側に溝が切ってあり、この溝でウェハ1
が保持されている。A conventional device of this type is shown in FIG. In this figure, 1 is a semiconductor wafer (hereinafter simply referred to as a wafer) that is an object to be cleaned, and 2 is a basket for storing the wafer 1. Grooves are cut on both sides of the basket, and the wafers can be cleaned by the grooves.
is retained.
3は液槽、4はこの液槽3内に、例えば水等の洗浄液を
供給するための供給弁、5は前記液槽3の底部に設けら
れた底板で、供給された洗浄液をウェハ1の表面を流れ
るように乱れを生じさせるための多数の穴が所定の配置
で形成されている。3 is a liquid tank, 4 is a supply valve for supplying a cleaning liquid such as water into the liquid tank 3, and 5 is a bottom plate provided at the bottom of the liquid tank 3, which allows the supplied cleaning liquid to be transferred to the wafer 1. A number of holes are formed in a predetermined arrangement to create turbulence in the flow on the surface.
また、第4図は洗浄効果を向上させるために液槽3の底
部に超音波振動子10を設けた他の従来装置を示すもの
である。Further, FIG. 4 shows another conventional device in which an ultrasonic vibrator 10 is provided at the bottom of the liquid tank 3 in order to improve the cleaning effect.
次に動作について説明する。Next, the operation will be explained.
液槽3へは、供給弁4を開けることにより水等の洗浄液
を供給するが、この洗浄液は底部5に制御されつつ常時
供給され、オーバフローしている。A cleaning liquid such as water is supplied to the liquid tank 3 by opening the supply valve 4, but this cleaning liquid is constantly supplied under control from the bottom 5 and overflows.
そこへかご2に入れたウェハ1を入れることにより、底
板5で制御された洗浄液の流れがウェハ1の表面に作用
し、ウェハ1の表面が洗浄される。By placing the wafer 1 in the basket 2 there, the flow of cleaning liquid controlled by the bottom plate 5 acts on the surface of the wafer 1, and the surface of the wafer 1 is cleaned.
従来の洗浄装置は以上のように構成されているため、ウ
ェハ1の表面に流れをつける目的で洗浄液を底板5の加
減で乱さなければならず、洗浄液の入れ替わり、つまり
洗浄液の乱れの効率が悪くなっていた。また、ウェハ1
がかと2に支持されたままでかと2から離れた状態とな
らないため、かご2とウェハ1との接続部の洗浄液がそ
の部分に残留しやすい上、超音波等を掛は洗浄効果を上
げたい時にも、定在波によりウェハ1の面内の洗浄効率
に差ができるなどの問題点があった。Since the conventional cleaning apparatus is configured as described above, the cleaning liquid must be disturbed by adjusting the bottom plate 5 in order to create a flow on the surface of the wafer 1, and the exchange of the cleaning liquid, that is, the disturbance of the cleaning liquid, is inefficient. It had become. Also, wafer 1
Because the basket remains supported by the heel 2 and does not separate from the heel 2, the cleaning liquid at the connection between the basket 2 and the wafer 1 tends to remain in that area, and when applying ultrasonic waves, etc., it is difficult to remove the cleaning solution. However, there were also problems such as differences in cleaning efficiency within the surface of the wafer 1 due to standing waves.
この発明は、上記のような問題点を解消するためになさ
れたもので、かごの対向溝内に支持されるクエへの支持
位置を洗浄液中で移動させて洗浄液をウェハとかごの接
触面にも速く到達させるとともに、超音波の定在波をウ
ェハに均一に当てることのできる半導体ウェハの洗浄装
置を得ることを目的とする。This invention was made to solve the above-mentioned problems, and it moves the support position of the wafers supported in the opposing grooves of the cage in the cleaning solution, thereby directing the cleaning solution to the contact surface between the wafer and the cage. It is an object of the present invention to provide a semiconductor wafer cleaning device that can uniformly apply standing waves of ultrasonic waves to the wafer while also allowing the ultrasonic standing waves to reach the wafer quickly.
この発明に係る半導体ウェハの洗浄装置は、液槽内の洗
浄液中に収容されたかごに、複数の半導体ウェハが所定
ピッチで並置され、下方より洗浄液が底板を介して供給
され、半導体クエへを洗浄する洗浄装置において、洗浄
液中の半導体ウェハの下部に、各半導体ウェハの下端に
当接して回転し、各半導体ウェハを回転させながら上方
へ移動せしめる回転駆動体を回転軸に非対称に設けたも
のである。In the semiconductor wafer cleaning apparatus according to the present invention, a plurality of semiconductor wafers are arranged side by side at a predetermined pitch in a basket housed in a cleaning liquid in a liquid tank, and the cleaning liquid is supplied from below through a bottom plate to the semiconductor wafer. A cleaning device that cleans semiconductor wafers in a cleaning solution, in which a rotational drive body is installed asymmetrically around the rotation axis, rotating while contacting the lower end of each semiconductor wafer, and moving each semiconductor wafer upward while rotating. It is.
この発明においては、回転駆動体が回転することにより
半導体ウェハがかご内でランダムに浮遊して揺らぎ、半
導体ウェハが最上位まで移動した後は、回転駆動体とは
接触せずに落下し半導体ウェハが洗浄される。In this invention, as the rotary drive body rotates, the semiconductor wafer randomly floats and sways in the cage, and after the semiconductor wafer moves to the top, it falls without contacting the rotary drive body, and the semiconductor wafer is washed.
以下、この発明の一実施例を図面について説明する。 An embodiment of the present invention will be described below with reference to the drawings.
第1図はこの発明の一実施例を示す半導体ウェハの洗浄
装置の構成断面図である。この図において、第3図、第
4図と同一符号は同じものを示し、6は前記ウェハ1を
上下に浮遊回転せしめるまが玉形をしたつまり、外形を
曲面状に形成し、非対称に軸支された回転駆動体で、第
2図に拡大して示すように、この回転駆動体6には、か
ご2に並置されるウェハ1の間に位置するピッチで揺ら
ぎを発生する波形状の溝7が形成されて、回転軸8に非
対称に直結されている。9は前記回転軸8を駆動する駆
動モータである。なお、第1図の実施例における底板5
は乱流を作る必要がないのでこの底板5に形成する穴は
均等なピッチであけて良い。FIG. 1 is a sectional view of a semiconductor wafer cleaning apparatus showing an embodiment of the present invention. In this figure, the same reference numerals as in FIGS. 3 and 4 indicate the same parts, and 6 is a ball-shaped wafer that allows the wafer 1 to float and rotate up and down. As shown in an enlarged view in FIG. 2, this rotary drive body 6 has wave-shaped grooves that generate fluctuations at a pitch located between the wafers 1 juxtaposed in the cage 2. 7 is formed and is directly connected to the rotating shaft 8 in an asymmetrical manner. Reference numeral 9 denotes a drive motor that drives the rotating shaft 8. Note that the bottom plate 5 in the embodiment shown in FIG.
Since there is no need to create turbulent flow, the holes formed in the bottom plate 5 may be made at an even pitch.
次に動作について説明する。Next, the operation will be explained.
液槽3は常時層流を保ちつつオーバフローし、洗浄液の
滞留を防いでいる。この液槽3に沈められたかと2に並
置されたウェハ1は、回転駆動体6の曲面に接触し、こ
の回転駆動体6の回転に従って回転する。回転駆動体6
は非対称に軸受されているから、ウェハ1はかご2の溝
中を回転に合わせ滑りながら上方へ移動し、最高位まで
移動したウェハ1はその位置からかと2の溝に案内され
て落下する。この時、回転駆動体6に形成された溝7の
揺らぎに合わせウェハ1は前後にも揺らぎ、かご2から
離れた状態になる。したがって、ウェハ1の表面は均一
に洗浄させる。The liquid tank 3 always maintains a laminar flow and overflows to prevent the cleaning liquid from stagnation. The wafer 1 juxtaposed on the heel 2 submerged in the liquid tank 3 comes into contact with the curved surface of the rotary drive body 6 and rotates as the rotary drive body 6 rotates. Rotation drive body 6
Since the wafer 1 is asymmetrically supported, the wafer 1 slides upward in the groove of the cage 2 as it rotates, and the wafer 1 that has moved to the highest position is guided by the groove of the heel 2 and falls from that position. At this time, the wafer 1 swings back and forth in accordance with the fluctuation of the groove 7 formed in the rotary drive body 6, and becomes separated from the cage 2. Therefore, the surface of the wafer 1 is uniformly cleaned.
また、超音波振動子10により超音波をかける際は、ウ
ェハ1の回転により定在状の影響を防ぐことにもなる。Further, when applying ultrasonic waves using the ultrasonic transducer 10, the rotation of the wafer 1 also prevents the influence of a stationary state.
この際、回転駆動体6の長軸を液面の174以上にする
と3倍以上の定在波の影響を完全に防ぐことができるが
、ウェハ1が液面より出ないように液槽3を深くする必
要がある。At this time, if the long axis of the rotary drive body 6 is set at 174 degrees above the liquid level, the influence of standing waves three times or more can be completely prevented. It needs to be deep.
なお、上記実施例では洗浄装置について説明したが、液
槽3が薬品の貯溜槽であってもよく、液中の薬液処理に
使用しても同様の効果がある。Although the cleaning device has been described in the above embodiment, the liquid tank 3 may be a storage tank for chemicals, and the same effect can be obtained even if it is used for processing a chemical in liquid.
また、回転駆動体6に形成された溝7は必ずしも必要で
はなく、これがない場合でも洗浄効果は大きく変ること
はない。Further, the groove 7 formed in the rotary drive body 6 is not necessarily necessary, and the cleaning effect will not change significantly even if it is not provided.
(発明の効果)
以上説明したように、この発明は液槽内の洗浄液中に収
容されたかごに、複数の半導体ウェハが所定ピッチで並
置され、下方より洗浄液が底板を介して供給され、半導
体クエへを洗浄する洗浄装置において、洗浄液中の半導
体ウェハの下部に、各半導体ウェハの下端に当接して回
転し、各半導体ウェハを回転させながら上方へわ動せし
める回転駆動体を回転軸に非対称に設けたもので、かご
に形成された溝によって支持されているウェハが移動す
ることにより、洗浄液が容易に廻り込み、ウェハ全体が
均一に、かつ効率よく洗浄される。(Effects of the Invention) As explained above, in the present invention, a plurality of semiconductor wafers are placed side by side at a predetermined pitch in a basket contained in a cleaning liquid in a liquid tank, and the cleaning liquid is supplied from below through the bottom plate. In a cleaning device that cleans semiconductor wafers, a rotary drive body is installed at the bottom of the semiconductor wafer in the cleaning solution, which rotates in contact with the lower end of each semiconductor wafer and moves each semiconductor wafer upward while rotating. When the wafers supported by the grooves formed in the cage move, the cleaning liquid easily circulates around the cage, and the entire wafer is cleaned uniformly and efficiently.
したがって、洗浄液の使用量を減らすことができ、かつ
洗浄時間を短縮したりできる等の効果が得られる。Therefore, effects such as being able to reduce the amount of cleaning liquid used and shortening the cleaning time can be obtained.
第1図はこの発明の一実施例を示す半導体ウェハの洗浄
装置の構成略図、第2図は、第1図の回転駆動体の詳細
をする拡大斜視図、第3図、第4図は従来の半導体ウェ
ハの洗浄装置を示す構成略図である。
図において、1は半導体ウェハ、2はかご、3は液槽、
4は供給弁、5は底板、6は回転駆動体である。
なお、各図中の同一符号は同一または相当部分を示す。
代理人 大 岩 増 雄 (外2名)第1図
第2図
第3図
第4図FIG. 1 is a schematic diagram of the configuration of a semiconductor wafer cleaning apparatus showing an embodiment of the present invention, FIG. 2 is an enlarged perspective view showing details of the rotary drive body of FIG. 1, and FIGS. 3 and 4 are conventional 1 is a schematic diagram showing the configuration of a semiconductor wafer cleaning apparatus of FIG. In the figure, 1 is a semiconductor wafer, 2 is a basket, 3 is a liquid tank,
4 is a supply valve, 5 is a bottom plate, and 6 is a rotary drive body. Note that the same reference numerals in each figure indicate the same or corresponding parts. Agent Masuo Oiwa (2 others) Figure 1 Figure 2 Figure 3 Figure 4
Claims (1)
ウェハが所定ピッチで並置され、下方より洗浄液が底板
を介して供給され、前記半導体ウェハを洗浄する洗浄装
置において、前記洗浄液中の半導体ウェハの下部に、前
記各半導体ウェハの下端に当接して回転し、前記各半導
体ウェハを回転させながら上方へ移動せしめる回転駆動
体を回転軸に非対称に設けたことを特徴とする半導体ウ
ェハの洗浄装置。In a cleaning apparatus that cleans the semiconductor wafers, a plurality of semiconductor wafers are placed side by side at a predetermined pitch in a basket housed in a cleaning liquid in a liquid tank, and the cleaning liquid is supplied from below through a bottom plate, and the semiconductor wafers in the cleaning liquid are Cleaning of a semiconductor wafer, characterized in that a rotational drive body is provided at a lower part of the wafer asymmetrically about a rotating shaft, the rotational drive body rotating in contact with the lower end of each of the semiconductor wafers and moving each of the semiconductor wafers upward while rotating. Device.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP13618588A JPH01304733A (en) | 1988-06-01 | 1988-06-01 | Semiconductor wafer washer |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP13618588A JPH01304733A (en) | 1988-06-01 | 1988-06-01 | Semiconductor wafer washer |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH01304733A true JPH01304733A (en) | 1989-12-08 |
Family
ID=15169332
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP13618588A Pending JPH01304733A (en) | 1988-06-01 | 1988-06-01 | Semiconductor wafer washer |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH01304733A (en) |
Cited By (17)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5286657A (en) * | 1990-10-16 | 1994-02-15 | Verteq, Inc. | Single wafer megasonic semiconductor wafer processing system |
US5470394A (en) * | 1991-05-24 | 1995-11-28 | Sapi Equipements S.A. | Method and apparatus for treating and cleaning plates by means of a central reactor |
US5534076A (en) * | 1994-10-03 | 1996-07-09 | Verteg, Inc. | Megasonic cleaning system |
US5626159A (en) * | 1995-04-19 | 1997-05-06 | Memc Electronic Materials, Inc. | Apparatus for cleaning semiconductor wafers |
EP0856874A2 (en) * | 1997-02-04 | 1998-08-05 | Canon Kabushiki Kaisha | Wafer processing apparatus and method, wafer convey robot, semiconductor substrate fabrication method, and semiconductor fabrication apparatus |
EP0860860A2 (en) * | 1997-02-21 | 1998-08-26 | Canon Kabushiki Kaisha | Wafer processing apparatus, wafer processing method, and semiconductor substrate fabrication method |
US5816274A (en) * | 1997-04-10 | 1998-10-06 | Memc Electronic Materials, Inc. | Apparartus for cleaning semiconductor wafers |
US5839460A (en) * | 1997-11-13 | 1998-11-24 | Memc Electronic Materials, Inc. | Apparatus for cleaning semiconductor wafers |
KR19990016634A (en) * | 1997-08-18 | 1999-03-15 | 윤종용 | Semiconductor Chemical Bath System |
US6039059A (en) * | 1996-09-30 | 2000-03-21 | Verteq, Inc. | Wafer cleaning system |
US6148833A (en) * | 1998-11-11 | 2000-11-21 | Applied Materials, Inc. | Continuous cleaning megasonic tank with reduced duty cycle transducers |
US6240938B1 (en) * | 1996-05-29 | 2001-06-05 | Steag Microtech Gmbh | Device for treating substrates in a fluid container |
US6247198B1 (en) * | 1997-12-09 | 2001-06-19 | Tdk Corporation | Cleaning apparatus |
US6337030B1 (en) | 1997-02-04 | 2002-01-08 | Canon Kabushiki Kaisha | Wafer processing apparatus, wafer processing method, and SOI wafer fabrication method |
KR20040000754A (en) * | 2002-06-25 | 2004-01-07 | 동부전자 주식회사 | Apparatus for cleaning a semiconductor wafer |
US6767840B1 (en) | 1997-02-21 | 2004-07-27 | Canon Kabushiki Kaisha | Wafer processing apparatus, wafer processing method, and semiconductor substrate fabrication method |
JP5312662B1 (en) * | 2012-11-02 | 2013-10-09 | 倉敷紡績株式会社 | Wafer rotating apparatus and wafer rotating method |
-
1988
- 1988-06-01 JP JP13618588A patent/JPH01304733A/en active Pending
Cited By (26)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5286657A (en) * | 1990-10-16 | 1994-02-15 | Verteq, Inc. | Single wafer megasonic semiconductor wafer processing system |
US5470394A (en) * | 1991-05-24 | 1995-11-28 | Sapi Equipements S.A. | Method and apparatus for treating and cleaning plates by means of a central reactor |
US5534076A (en) * | 1994-10-03 | 1996-07-09 | Verteg, Inc. | Megasonic cleaning system |
US5626159A (en) * | 1995-04-19 | 1997-05-06 | Memc Electronic Materials, Inc. | Apparatus for cleaning semiconductor wafers |
US6240938B1 (en) * | 1996-05-29 | 2001-06-05 | Steag Microtech Gmbh | Device for treating substrates in a fluid container |
US6039059A (en) * | 1996-09-30 | 2000-03-21 | Verteq, Inc. | Wafer cleaning system |
EP0856874A2 (en) * | 1997-02-04 | 1998-08-05 | Canon Kabushiki Kaisha | Wafer processing apparatus and method, wafer convey robot, semiconductor substrate fabrication method, and semiconductor fabrication apparatus |
CN1104040C (en) * | 1997-02-04 | 2003-03-26 | 佳能株式会社 | Wafer processing apparatus and method, wafer convey robot, semiconductor substrate fabrication method, and semiconductor fabrication apparatus |
US6391067B2 (en) | 1997-02-04 | 2002-05-21 | Canon Kabushiki Kaisha | Wafer processing apparatus and method, wafer convey robot, semiconductor substrate fabrication method, and semiconductor fabrication apparatus |
US6337030B1 (en) | 1997-02-04 | 2002-01-08 | Canon Kabushiki Kaisha | Wafer processing apparatus, wafer processing method, and SOI wafer fabrication method |
EP0856874A3 (en) * | 1997-02-04 | 2001-11-28 | Canon Kabushiki Kaisha | Wafer processing apparatus and method, wafer convey robot, semiconductor substrate fabrication method, and semiconductor fabrication apparatus |
US6199563B1 (en) * | 1997-02-21 | 2001-03-13 | Canon Kabushiki Kaisha | Wafer processing apparatus, wafer processing method, and semiconductor substrate fabrication method |
US6767840B1 (en) | 1997-02-21 | 2004-07-27 | Canon Kabushiki Kaisha | Wafer processing apparatus, wafer processing method, and semiconductor substrate fabrication method |
CN1111900C (en) * | 1997-02-21 | 2003-06-18 | 佳能株式会社 | Chip processing device, wafer processing and preparation method of semiconductor substrate |
EP0860860A2 (en) * | 1997-02-21 | 1998-08-26 | Canon Kabushiki Kaisha | Wafer processing apparatus, wafer processing method, and semiconductor substrate fabrication method |
EP0860860A3 (en) * | 1997-02-21 | 2001-11-28 | Canon Kabushiki Kaisha | Wafer processing apparatus, wafer processing method, and semiconductor substrate fabrication method |
US5816274A (en) * | 1997-04-10 | 1998-10-06 | Memc Electronic Materials, Inc. | Apparartus for cleaning semiconductor wafers |
KR19990016634A (en) * | 1997-08-18 | 1999-03-15 | 윤종용 | Semiconductor Chemical Bath System |
US5839460A (en) * | 1997-11-13 | 1998-11-24 | Memc Electronic Materials, Inc. | Apparatus for cleaning semiconductor wafers |
WO1999026276A1 (en) * | 1997-11-13 | 1999-05-27 | Memc Electronic Materials, Inc. | Apparatus for cleaning semiconductor wafers |
US6254688B1 (en) | 1997-12-09 | 2001-07-03 | Tdk Corporation | Cleaning method |
US6247198B1 (en) * | 1997-12-09 | 2001-06-19 | Tdk Corporation | Cleaning apparatus |
US6148833A (en) * | 1998-11-11 | 2000-11-21 | Applied Materials, Inc. | Continuous cleaning megasonic tank with reduced duty cycle transducers |
US6412499B1 (en) | 1998-11-11 | 2002-07-02 | Applied Materials, Inc. | Continuous cleaning megasonic tank with reduced duty cycle transducers |
KR20040000754A (en) * | 2002-06-25 | 2004-01-07 | 동부전자 주식회사 | Apparatus for cleaning a semiconductor wafer |
JP5312662B1 (en) * | 2012-11-02 | 2013-10-09 | 倉敷紡績株式会社 | Wafer rotating apparatus and wafer rotating method |
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