JPH01210259A - Polishing machine - Google Patents
Polishing machineInfo
- Publication number
- JPH01210259A JPH01210259A JP63031854A JP3185488A JPH01210259A JP H01210259 A JPH01210259 A JP H01210259A JP 63031854 A JP63031854 A JP 63031854A JP 3185488 A JP3185488 A JP 3185488A JP H01210259 A JPH01210259 A JP H01210259A
- Authority
- JP
- Japan
- Prior art keywords
- groove
- polishing
- plate
- workpiece
- face
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000005498 polishing Methods 0.000 title claims abstract description 51
- 239000007788 liquid Substances 0.000 claims abstract description 9
- 238000003754 machining Methods 0.000 claims description 14
- 229910003460 diamond Inorganic materials 0.000 claims description 10
- 239000010432 diamond Substances 0.000 claims description 10
- 239000012530 fluid Substances 0.000 abstract description 9
- 230000003746 surface roughness Effects 0.000 description 6
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 4
- 239000000853 adhesive Substances 0.000 description 4
- 230000001070 adhesive effect Effects 0.000 description 4
- 230000006378 damage Effects 0.000 description 3
- 238000010586 diagram Methods 0.000 description 3
- 230000000694 effects Effects 0.000 description 3
- 238000005516 engineering process Methods 0.000 description 3
- 239000000463 material Substances 0.000 description 3
- 238000000034 method Methods 0.000 description 3
- 239000002245 particle Substances 0.000 description 3
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 2
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 description 2
- 229910045601 alloy Inorganic materials 0.000 description 2
- 239000000956 alloy Substances 0.000 description 2
- 229910052802 copper Inorganic materials 0.000 description 2
- 239000010949 copper Substances 0.000 description 2
- 230000006866 deterioration Effects 0.000 description 2
- 229910052759 nickel Inorganic materials 0.000 description 2
- 239000005304 optical glass Substances 0.000 description 2
- 239000000843 powder Substances 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 239000011882 ultra-fine particle Substances 0.000 description 2
- 235000012431 wafers Nutrition 0.000 description 2
- 229910000859 α-Fe Inorganic materials 0.000 description 2
- 239000003795 chemical substances by application Substances 0.000 description 1
- 239000011362 coarse particle Substances 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 238000005461 lubrication Methods 0.000 description 1
- 230000001737 promoting effect Effects 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/11—Lapping tools
- B24B37/20—Lapping pads for working plane surfaces
- B24B37/26—Lapping pads for working plane surfaces characterised by the shape of the lapping pad surface, e.g. grooved
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24D—TOOLS FOR GRINDING, BUFFING OR SHARPENING
- B24D2203/00—Tool surfaces formed with a pattern
Landscapes
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
- Manufacture Of Macromolecular Shaped Articles (AREA)
Abstract
Description
【発明の詳細な説明】
〔発明の目的〕
(産業上の利用分野)
本発明は、例えばフェライト、半導体ウェーハ、光学ガ
ラス等の脆性材料のポリシングに好適する研磨装置に関
する。DETAILED DESCRIPTION OF THE INVENTION [Object of the Invention] (Industrial Application Field) The present invention relates to a polishing apparatus suitable for polishing brittle materials such as ferrite, semiconductor wafers, and optical glass.
(従来の技術)
近時、フロートポリジングにより、フェライト、半導体
ウェーハ、光学ガラス等の被加工物の平面を加工変質層
を発生させず、かつ、材料的な特性を損うことなく高能
率に超精密加工することが行われている。このフロート
ポリジングは、被加工物とポリシングプレートが、数1
OAの微細粉末粒子を含んだ加工液中で回転することに
より、被加工物はポリシングプレートより浮上し、被加
工物とポリシングプレートのすきまを通過する加工液の
流れに随伴する微細粉末粒子の被加工物への衝突により
、超精密加工を行うものである(津和秀夫、難波義治、
和田tt児:超精密平面研磨盤の開発、昭和56年年度
様学会秋季大会学術講演論文集(1981)、第307
頁参照)。(Prior technology) Recently, float polishing has been used to process the flat surfaces of workpieces such as ferrite, semiconductor wafers, and optical glass with high efficiency without producing a degraded layer or impairing the material properties. Ultra-precision processing is being carried out. In this float polishing, the workpiece and polishing plate are
By rotating in the machining fluid containing fine OA powder particles, the workpiece floats above the polishing plate and is covered with fine powder particles that accompany the flow of machining fluid that passes through the gap between the workpiece and the polishing plate. Ultra-precision machining is performed by colliding with the workpiece (Hideo Tsuwa, Yoshiharu Namba,
T. Wada: Development of an ultra-precision surface polishing machine, Proceedings of the 1981 Academic Conference Autumn Conference (1981), No. 307
(see page).
ところで、上記ボリシングプレートは、錫製であって、
このプレートの被加工物対向面は、溝幅1朋、深さ0.
5〜1tnm、ピッチ2 mmで複数本の溝を切削によ
り形成したのち、例えば直径460mmのプレートの場
合、平面度が1μIn程度になるようにダイヤモンド切
削したものである。このポリシングプレートのダイヤモ
ンド切削された面は、第6図・ に示すように、ダイヤ
モンドバイトの先端形状が転写され、断面形状は鋸歯状
部^・・・を有している。By the way, the above-mentioned boring plate is made of tin,
The surface of this plate facing the workpiece has a groove width of 1 mm and a depth of 0 mm.
After cutting a plurality of grooves with a thickness of 5 to 1 tnm and a pitch of 2 mm, for example, in the case of a plate with a diameter of 460 mm, diamond cutting is performed so that the flatness is about 1 μIn. As shown in FIG. 6, the diamond-cut surface of this polishing plate has the shape of the tip of the diamond cutting tool transferred thereto, and has a serrated section in cross-section.
この場合、鋸歯状部四・・・には、切シ残し部(B)・
・・が付随している。しかして、上記鋸歯状部の一部で
ある切シ残し部(B)・・・には、しばしばパリが生じ
ている。その結果、切シ残し部(13)・・・に付着し
ているパリが遊離して、加工液とともに被加工物とポリ
シングプレートのすきまを通過する際に、被加工物表面
を擦過し、表面粗さ、平面度等の加工精度低下を惹起す
る原因となっていた。In this case, the serrated portion 4... has a cut remaining portion (B).
... is attached. However, the uncut portion (B), which is a part of the serrated portion, often has burrs. As a result, the particles adhering to the uncut portion (13) are liberated, and when they pass through the gap between the workpiece and the polishing plate together with the machining fluid, they scrape the surface of the workpiece, causing the surface This was a cause of deterioration in processing accuracy such as roughness and flatness.
(発明が解決しようとする課題)
本発明は、上記事情を参酌して々されたもので、高精度
かつ高能率のフロートポリジングが可能な研磨装置を提
供することを目的とする。(Problems to be Solved by the Invention) The present invention has been made in consideration of the above circumstances, and an object of the present invention is to provide a polishing device capable of highly accurate and highly efficient float polishing.
(課題を解決するだめの手段と作用)
フロートポリジング用の研磨装置において、加工液を滞
留させる第1溝とともに、この第1溝より浅い第2溝を
ダイヤモンドの刃先形状の転写により形成し、切り残し
パリの発生による加工精度の劣化を防止するようにした
ものである。(Means and effects for solving the problem) In a polishing device for float polishing, a first groove for retaining machining fluid and a second groove shallower than the first groove are formed by transferring the shape of a diamond cutting edge, This is to prevent deterioration of processing accuracy due to the occurrence of uncut edges.
(実施例) 以下、本発明の一実施例を図面を参照して詳述する。(Example) Hereinafter, one embodiment of the present invention will be described in detail with reference to the drawings.
第1図は、この実施例の研磨装置を示している。FIG. 1 shows the polishing apparatus of this embodiment.
この装置は、軸線(1)のまわυ矢印(2)方向に回転
駆動される下定盤部(3)と、この下定盤部(3)に対
向して昇降自在に配設された上定盤部(4)と、上記下
定盤部(3)を回転駆動する第1回転駆動部(図示せず
。)と、上記上定盤部(4)を回転駆動する第2回転駆
動部(図示せず。)とから構成されている。しかして、
下定盤部(3)は、円盤状の基台(5)と、この基台(
5)の下面に一端部が同軸に連結され他端部が接続され
た連結軸(6)と、基台(5)の上面に同軸に固着され
た円板状の支持板(7)と、この支持板(7)に同軸に
支持・固定された錫製のボリシングプレート(8)と、
基台(5)上部側縁部に同軸に立設され基台(5)とと
もに加工液出)が収納される加工槽(5a)を形成する
円筒状の側壁板(9)とからなっている。上記支持板(
力及びボリシングプレート(8)の中央部には、貫通穴
(It)、(11)が穿孔されている。また、ポリシン
グプレー) (8)の上面であるポリシング面(8a)
には、第2図で示すような渦巻状の第1溝(12・・・
をボリシングプレート(8)に対して同心に刻設する。This device consists of a lower surface plate part (3) that is rotated around an axis (1) in the direction of arrow υ (2), and an upper surface plate that is disposed opposite to this lower surface plate part (3) and is movable up and down. (4), a first rotational drive section (not shown) that rotationally drives the lower surface plate section (3), and a second rotational drive section (not shown) that rotationally drives the upper surface plate section (4). ). However,
The lower surface plate part (3) includes a disc-shaped base (5) and this base (
5) a connecting shaft (6) whose one end is coaxially connected to the lower surface and whose other end is connected; and a disk-shaped support plate (7) coaxially fixed to the upper surface of the base (5); A tin boring plate (8) coaxially supported and fixed to this support plate (7),
The base (5) is made up of a cylindrical side wall plate (9) that is coaxially erected on the upper side edge and forms a processing tank (5a) in which the processing fluid is stored together with the base (5). . The above support plate (
A through hole (It), (11) is drilled in the central part of the force and boring plate (8). Also, the polishing surface (8a) which is the top surface of (8)
has a spiral first groove (12...
are carved concentrically on the bollising plate (8).
これら第1溝(12+・・・は、例えば溝幅lit、深
さ0.5〜1間、ピッチ2m尻で、ダイヤモンド切削さ
れたものであって、加工液(L)を滞留させ、ボリシン
グ中に加工液(L)が不足するのを補う役割をもってい
る。さらに、ボリシング面(8a)の第1溝叫・・・以
外の部分には、これら第1溝(t2・・・と同心の渦巻
状第2溝0■・・・が刻設されている。これら第2溝(
13)・・・は、例えば50〜100μm、深さ10μ
m、ピッチ130μmで、ダイヤモンド切削されたもの
である。ま/ζ、第2溝(13)・・・は、横断面が円
弧状をなしている。一方、上定盤部(4)は、板状の被
加工物(5)が接着され゛る円板状の接着板04)と、
この接着板αaの背部に同軸に連結された支軸a暖と、
この支軸(1ωを上下方向すなわち矢印(t6J方向に
昇降自在に支持する軸受機構(図示せず。)とからなっ
ている。そして、支軸0最は、前記第2回転駆動部によ
りその軸線αηのまわり矢印α槌方向に前記軸受機構を
介して回転駆動されるようになっている。また、接着板
(I養の直径は、ボリシングプレート(8)の半径よシ
も小さく、かつ、支軸σ9は。These first grooves (12+...) are, for example, diamond-cut with a groove width lit, a depth of 0.5 to 1, and a pitch of 2 m. This has the role of compensating for the shortage of machining fluid (L) in the boring surface (8a).Furthermore, in the portions other than the first grooves (t2...) of the boring surface (8a), there are spiral spirals concentric with these first grooves (t2...). Second grooves 0■... are carved in the shape of the second grooves (
13) ... is, for example, 50 to 100 μm and 10 μm deep.
It was diamond cut with a pitch of 130 μm. The cross section of the second groove (13) is arcuate. On the other hand, the upper surface plate part (4) includes a disk-shaped adhesive plate 04) to which the plate-shaped workpiece (5) is bonded;
A support shaft a is coaxially connected to the back of this adhesive plate αa,
It consists of a bearing mechanism (not shown) that supports this support shaft (1ω) so that it can move up and down in the vertical direction, that is, in the direction of the arrow (t6J). It is designed to be rotationally driven around αη in the direction of the arrow α through the bearing mechanism.The diameter of the adhesive plate (I) is also smaller than the radius of the boring plate (8), and The supporting axis σ9 is.
被加工物(1,)の被研磨面(lIの全面が、ボリシン
グプレート(8)に対向する位置に設けられている。と
ころで、上記第2溝α階・・・は、第3図に示すように
、第2溝(13・・・と同一の刃先形状を有するダイヤ
モンドバイト(20を軸線(1)のまわシ矢印伐)方向
に例えば300rpmで回転しているボリシングプレー
ト(8)のボリシング面(8a)に例えば深さ10μm
切込んで、ポリシングプレート(8)の半径方向である
矢印CD方向に所定の送り速度(例えば0.3ii/r
ev、 )で送シをかけることにより創生じたもので、
ダイヤモンドバイト(201の先端形状が忠実に転写さ
れている。ついで、第2溝α針・・が形成されたポリシ
ング面(8a)を、例えば送シ速度0.3朋/rev、
および回転数30Orpmで回転させ、表面粗さ0
.1μmRz以下、平面度1μm程度にまでダイヤモン
ド切削する。したがって、ボリシング面(8a)は、表
面粗さ0.1μmRz以下の平坦部Qυ・・・と、この
平坦部C21)・・・に刻設されている第1及び第2溝
(121・・・、 (13)−、−とからなっている。The entire surface to be polished (lI) of the workpiece (1,) is provided at a position facing the boring plate (8). By the way, the second groove α level... is shown in FIG. As shown, a diamond cutting tool (20) having the same cutting edge shape as the second groove (13... For example, a depth of 10 μm on the bolling surface (8a).
The polishing plate (8) is cut at a predetermined feed rate (for example, 0.3ii/r) in the direction of the arrow CD, which is the radial direction of the polishing plate (8).
It was created by applying a feed with ev, ),
The tip shape of the diamond bit (201) is faithfully transferred. Next, the polishing surface (8a) on which the second groove α needle... is formed is polished at a feed rate of 0.3 h/rev,
and rotated at a rotation speed of 30 Orpm, and the surface roughness was 0.
.. Diamond cutting is performed to a flatness of approximately 1 μm and a Rz of 1 μm or less. Therefore, the boring surface (8a) has a flat portion Qυ with a surface roughness of 0.1 μmRz or less, and the first and second grooves (121) carved in the flat portion C21). , (13)-,-.
つぎに、上記構成の研磨装置の作動について述べる。Next, the operation of the polishing apparatus having the above configuration will be described.
まず、例えば公称径70AのSin、などの超微粒子を
含有する純水からなる加工槽(5a)内に、加工液(ト
)をポリシングプレート(8)を完全に覆うように供給
する。ついで、上定盤部(4)を下降させ、接着板α荀
に接着されている被加工物(5)を加工液(L)中に浸
漬させたのち、ボリシングプレート(8)に近接させる
。被加工物(5)は、表面粗さ0,1μmRz以下、平
面度数μmに加工しておく。つづいて、支軸aωを矢印
α槌方向に60〜20Orpmで回転させ、かつ、基台
(5)を60〜20Orpmで矢印(2)方向に回転さ
せる。すると、ポリシングプレート(8)と被加工物面
との間には、加工液(ト)による動圧流体潤滑作用によ
りボリジングプレート(8)が浮上がるため間隔が数μ
mのすきま(2〃が生じ、このすきまに加工液膜(2功
が生じる。したがって、ボリシングプレート(8)は、
被加工物(1)に直接接触しないので、ボリシングプレ
ート(8)ノ摩耗はきわめて少ない。さらに、すきま部
位の動圧流体軸受状態の平滑化作用のため被研磨面(1
1は、ポリシングプレート(8)の平面度を集積したも
のが転写されることによりボリジング面よシも平面度が
向上する。とくに、ボリシング面(8a)に刻設さ゛
れている第2溝H・・・は、動圧流体軸受作用を助長す
る役割をもっている。そして、この第2溝α3)・・・
は、平坦部(ハ)・・・と交互に設けられているので、
ボリシング中にパリなどが欠落して、被研磨面(1!J
を損傷することがない。ガぜならば、加工液膜04中に
おける加工機構は、公称径70Aの超微粒子であるSi
n、の被加工物(1)への衝突により、被研磨面(11
の塑性変形や破壊を生じさせることなく、被研磨面(1
!jを構成する表面原子を除去するようにしたものであ
る。したがって、仮に、8i0.よシ粗大なパリなどの
脱落体が、被研磨面09に衝突すると、被加工物(5)
の塑性変形や破壊を生じ、相対的に大きな傷を生じてし
まう。ところが、この実施例では、問題となる脱落体の
発生を防止できる。したがって、2次的に発生した損傷
を除去することができることが相俟って、極めて高い研
磨精度を高能率で得ることができる。ちなみに、第4図
は、第2溝Q3)・・・を設けない従来技術と本実施例
と示すものであるが、表面粗さが著しく改善されること
がわかる。すなわち、従来技術の表面粗さは3.5AR
MS。First, a machining liquid (g) is supplied into a machining tank (5a) made of pure water containing ultrafine particles such as Sin having a nominal diameter of 70A so as to completely cover the polishing plate (8). Next, the upper surface plate part (4) is lowered, and the workpiece (5) bonded to the adhesive plate α is immersed in the processing liquid (L), and then brought close to the boring plate (8). . The workpiece (5) has been processed to have a surface roughness of 0.1 μmRz or less and a flatness of μm. Subsequently, the support shaft aω is rotated in the direction of arrow α at 60 to 20 Orpm, and the base (5) is rotated in the direction of arrow (2) at 60 to 20 Orpm. Then, the distance between the polishing plate (8) and the surface of the workpiece is several microns because the boriding plate (8) floats due to the dynamic pressure fluid lubrication effect of the machining fluid (g).
A gap (2〃) of m is created, and a film of machining liquid (2) is created in this gap. Therefore, the boring plate (8)
Since it does not come into direct contact with the workpiece (1), the wear of the borer plate (8) is extremely low. Furthermore, the surface to be polished (1
1, by transferring the integrated flatness of the polishing plate (8), the flatness of the boriding surface is also improved. In particular, it is engraved on the boring surface (8a).
The second grooves H... have a role of promoting the hydrodynamic bearing action. And this second groove α3)...
are provided alternately with flat parts (c)...
During the boring process, the surface to be polished (1!J
without damaging it. If it is a gas, the machining mechanism in the machining liquid film 04 is Si, which is ultrafine particles with a nominal diameter of 70A.
n, collides with the workpiece (1), causing the surface to be polished (11
The surface to be polished (1
! The surface atoms constituting j are removed. Therefore, if 8i0. When a coarse particle or other fallen object collides with the surface to be polished 09, the workpiece (5)
plastic deformation and destruction, resulting in relatively large scratches. However, in this embodiment, it is possible to prevent the occurrence of falling bodies, which is a problem. Therefore, in combination with the ability to remove secondary damage, extremely high polishing precision can be obtained with high efficiency. Incidentally, FIG. 4 shows the prior art and this embodiment in which the second grooves Q3) are not provided, and it can be seen that the surface roughness is significantly improved. In other words, the surface roughness of the conventional technology is 3.5AR.
M.S.
18.5 A Rmaxであるのに対して、本実施例の
表面粗さは2.3ARMS 、 13.4A Rmax
程度まで向上した。とくに、データのバラツキが小さく
なっているのは、パリの発生による突発的な損傷がない
ためであると考えられる。18.5 A Rmax, whereas the surface roughness of this example is 2.3 ARMS and 13.4 A Rmax.
improved to a certain extent. In particular, it is thought that the reason for the small variation in data is that there is no sudden damage caused by the outbreak of Paris.
なお上記実施例においては、第2溝(I3)・・・の形
状は、渦巻状であるが、多重同心円、格子状等、形状は
任意に選択してよい。また、第1溝a渇・・・も多重同
心円、格子状等であってもよい。さらに、ボリシングプ
レート(8)の材質についても、銅又は銅基合金、ニッ
ケル又はニッケル基合金であってもよい。さらに、他の
実施例として、第5図に示すように、切シ残し部が生じ
ないように第2溝a3・・・を隣接させてダイヤモンド
切削によ多形成してもよい。この場合、前実施例におけ
る平坦部(ハ)・・・は存在しないが、切シ残し部分が
ないので、これに起因するパリの発生はなく、この場合
も、研磨精度が向上する。In the above embodiment, the shape of the second grooves (I3) is spiral, but the shape may be arbitrarily selected, such as multiple concentric circles or a lattice shape. Further, the first groove a may also be in the form of multiple concentric circles, a lattice shape, or the like. Furthermore, the material of the borising plate (8) may also be copper or a copper-based alloy, nickel or a nickel-based alloy. Furthermore, as another example, as shown in FIG. 5, multiple second grooves a3 may be formed by diamond cutting so as to be adjacent to each other so that no uncut portions are left. In this case, although the flat portion (c) of the previous embodiment does not exist, there is no uncut portion, so there is no occurrence of burr caused by this, and the polishing accuracy is improved in this case as well.
本発明の研磨装置は、第1溝の他に、第1の溝が設けら
れた平坦面に微小な第2溝を設けたので、極めて高い研
磨精度を高能率で得ることができる。In the polishing apparatus of the present invention, in addition to the first groove, a minute second groove is provided on the flat surface on which the first groove is provided, so that extremely high polishing precision can be obtained with high efficiency.
第1図は本発明の一実施例の研磨装置の構成図、第2図
は同じく第1図の要部拡大断面図、第3図は同じく溝形
成方法の説明図、第4図は従来技術との比較を示すグラ
フ、第5図は本発明の他の実施例の研磨装置の要部説明
図、第6図は従来技術W:被加工物。
(L):加 工 液。
(8):ボリシンググレート(研磨板)。
(国:第 1 溝。
(13) :第 2 溝。
C3B) :ボリシング面(研磨面)。
代理人 弁理士 則 近 憲 佑
同 松山光之
第5図
第6図FIG. 1 is a block diagram of a polishing apparatus according to an embodiment of the present invention, FIG. 2 is an enlarged sectional view of the main part of FIG. 1, FIG. 3 is an explanatory diagram of the groove forming method, and FIG. 4 is a conventional technique. FIG. 5 is an explanatory diagram of the main parts of a polishing apparatus according to another embodiment of the present invention, and FIG. 6 is a graph showing a comparison with conventional technology W: workpiece. (L): Processing liquid. (8): Borising grate (polishing plate). (Country: 1st groove. (13) : 2nd groove. C3B) : Boring surface (polished surface). Agent Patent Attorney Noriyuki Chika Yudo Mitsuyuki Matsuyama Figure 5 Figure 6
Claims (2)
が滞留する第1溝が形成された研磨板と、被加工物を昇
降自在に保持して上記研磨面に当接させる保持手段と、
上記保持手段に保持された被加工物を上記研磨面に沿っ
て相対的に摺動させる駆動手段とを有し、上記被加工物
を上記研磨面上に介在する加工液中にて浮上した状態で
研磨する研磨装置において、上記研磨面の上記第1溝が
形成されていない部位には上記第1溝より浅い第2溝が
設けられていることを特徴とする研磨装置。(1) A polishing plate that has a flat polished surface and a first groove in which the machining liquid stays, and a holder that holds the workpiece so that it can be moved up and down and comes into contact with the polishing surface. means and
and a drive means for relatively sliding the workpiece held by the holding means along the polishing surface, the workpiece being floated in the machining liquid interposed above the polishing surface. 1. A polishing device for polishing, characterized in that a second groove shallower than the first groove is provided in a portion of the polishing surface where the first groove is not formed.
ダイヤモンド工具の刃先形状が転写されてなるものであ
ることを特徴とする特許請求の範囲第1項記載の研磨装
置。(2) The polishing device according to claim 1, wherein the second groove is formed by transferring the shape of the cutting edge of the diamond tool by cutting with a diamond tool.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP63031854A JPH01210259A (en) | 1988-02-16 | 1988-02-16 | Polishing machine |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP63031854A JPH01210259A (en) | 1988-02-16 | 1988-02-16 | Polishing machine |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH01210259A true JPH01210259A (en) | 1989-08-23 |
Family
ID=12342637
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP63031854A Pending JPH01210259A (en) | 1988-02-16 | 1988-02-16 | Polishing machine |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH01210259A (en) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0701499A1 (en) * | 1994-04-08 | 1996-03-20 | Rodel, Inc. | Improved polishing pads and methods for their use |
US6439989B1 (en) | 1992-08-19 | 2002-08-27 | Rodel Holdings Inc. | Polymeric polishing pad having continuously regenerated work surface |
WO2008114805A1 (en) * | 2007-03-14 | 2008-09-25 | Jsr Corporation | Chemical-mechanical polishing pad, and chemical-mechanical polishing method |
CN114286737A (en) * | 2019-06-19 | 2022-04-05 | 株式会社可乐丽 | Polishing pad, method for producing polishing pad, and polishing method |
-
1988
- 1988-02-16 JP JP63031854A patent/JPH01210259A/en active Pending
Cited By (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6439989B1 (en) | 1992-08-19 | 2002-08-27 | Rodel Holdings Inc. | Polymeric polishing pad having continuously regenerated work surface |
EP0701499A1 (en) * | 1994-04-08 | 1996-03-20 | Rodel, Inc. | Improved polishing pads and methods for their use |
EP0701499A4 (en) * | 1994-04-08 | 1997-08-20 | Rodel Inc | Improved polishing pads and methods for their use |
WO2008114805A1 (en) * | 2007-03-14 | 2008-09-25 | Jsr Corporation | Chemical-mechanical polishing pad, and chemical-mechanical polishing method |
JP2008258574A (en) * | 2007-03-14 | 2008-10-23 | Jsr Corp | Chemical-mechanical polishing pad, and chemical-mechanical polishing method |
JPWO2008114805A1 (en) * | 2007-03-14 | 2010-07-08 | Jsr株式会社 | Chemical mechanical polishing pad and chemical mechanical polishing method |
CN114286737A (en) * | 2019-06-19 | 2022-04-05 | 株式会社可乐丽 | Polishing pad, method for producing polishing pad, and polishing method |
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