JP6439067B2 - Patent evaluation device - Google Patents

Description

  The present invention relates to a patent evaluation apparatus.

  Various methods for calculating the economic value of intellectual property such as patents are known, but there are many difficulties in actual application. For example, for the method of calculating the discounted present value from the cash flow that the patent to be evaluated will generate in the future (DCF method), the patent to be evaluated also contributes to the cash flow in calculating the future cash flow. It is pointed out that the calculation of the degree also requires subjective judgment and the objectivity is not sufficient.

  In the patent No. 434413, which the present applicant has a patent right, an evaluation value using objective data such as the presence / absence of a predetermined action for the patent to be evaluated, the number of predetermined actions, and the period of time since the predetermined action was performed. Is calculated. However, with these three types of data, there was a limit in making a more appropriate patent evaluation.

  Further, in the technology of Japanese Patent No. 4344413, a high evaluation is given to a patent on which an unusual act such as a patent invalidation trial has been performed. Certainly, patents that survive patent invalidation trials are likely to be important patents that are of interest to other companies. However, in the technique of Japanese Patent No. 4344413, the rareness of the predetermined action may have an excessive influence on the evaluation value.

Japanese Patent No. 4344813

In one aspect of the present invention, an object of the present invention is to provide a patent evaluation apparatus capable of performing more appropriate patent evaluation by reflecting data on survival rate in patent evaluation .

A patent evaluation device according to one aspect of the present invention includes:
Patent data on a plurality of patent applications or a plurality of patents are stored, information on the technical fields of each of the plurality of patent applications or the plurality of patents, and each of the plurality of patent applications or the plurality of patents Information indicating that the first and second predetermined actions have been taken or not, and the respective patent applications or patents expired from among the plurality of patent applications or the plurality of patents. A patent evaluation device that is accessible to a storage device that stores patent attribute information including information,
Patent data on a plurality of patent applications or a plurality of patents belonging to the designated technical field, and the first and second predetermined items relating to each of the plurality of patent applications or the plurality of patents belonging to the designated technical field Information indicating that the act was performed or not performed, and the date of expiration of each of the plurality of patent applications belonging to the specified technical field or of the patent applications or patents that have expired among the plurality of patents Means for obtaining information from the storage device based on the information in the designated technical field;
Of a plurality of patent applications or a plurality of patents belonging to the specified technical field, a first patent including a patent application or a patent having information indicating that the first predetermined action has been performed as the patent attribute information For the group, means for calculating a first survival rate at the time when the first predetermined number of years have passed since the application;
Of a plurality of patent applications or a plurality of patents belonging to the specified technical field, a second patent including a patent application or a patent having information indicating that the second predetermined action has been performed as the patent attribute information For the group, means for calculating a second survival rate when a second predetermined number of years have passed since the application;
A third application including a patent application or a patent that does not have, as the patent attribute information, information indicating that the first predetermined action has been performed among a plurality of patent applications or a plurality of patents belonging to the designated technical field. For the patent group, a means for calculating a third survival rate at the time when the first predetermined number of years has elapsed from the application;
A fourth application including a patent application or a patent that does not have, as the patent attribute information, information indicating that the second predetermined action has been performed among a plurality of patent applications or a plurality of patents belonging to the specified technical field; For the patent group, means for calculating a fourth survival rate at the time when the second predetermined number of years has passed since the application;
Patents belonging to the first patent group when a value obtained by subtracting the third survival rate from the first survival rate is higher than a value obtained by subtracting the fourth survival rate from the second survival rate Calculate the respective evaluation values of the plurality of patent applications or the plurality of patents belonging to the designated technical field so that the application or patent is evaluated higher than the patent application or patent belonging to the second patent group. An evaluation value calculating means;
Have

Patent evaluation apparatus according to another aspect of the present invention,
Information indicating the number of times a predetermined act relating to each of the plurality of patent applications or the plurality of patents is stored, and the plurality of patent applications. Or a patent evaluation device that is accessible to a storage device that stores patent attribute information including the information indicating the expiration date of each of the extinguished patent applications or patents of the plurality of patents,
Patent data on the plurality of patent applications or patents, information indicating the number of times the predetermined action has been performed on each of the plurality of patent applications or patents, and the plurality of patent applications or patents Information indicating the expiration date of each of the extinguished patent applications or patents from the storage device,
From among the plurality of patent applications or a plurality of patents, a first patent group including a patent application or a patent including information indicating that the predetermined action has been performed a first number of times as the patent attribute information. Means for calculating a first survival rate when a predetermined number of years have passed;
A second application including a patent application or a patent having, as the patent attribute information, information indicating that the predetermined action is performed a second number of times greater than the first number of the plurality of patent applications or a plurality of patents; Means for calculating a second survival rate at the time when the predetermined number of years have elapsed from the filing of the patent group;
When the second survival rate is higher than the first survival rate, the patent application or patent belonging to the second patent group is more highly evaluated than the patent application or patent belonging to the first patent group. An evaluation value calculating means for calculating an evaluation value of each of the plurality of patent applications or the plurality of patents;
To have a.

It is a functional block diagram of the patent evaluation apparatus concerning the embodiment of the present invention. It is a hardware block diagram of the information processing apparatus 1 shown by FIG. It is a flowchart which shows the schematic process of the patent evaluation apparatus which concerns on the said embodiment. The example of the patent attribute information stored in the memory | storage device 2 shown by FIG. 1 is shown. An example of a basic claim number term calculated in S021 of the initial setting phase A1 and stored in the storage device 2 is shown. The example of the adjustment constant memorize | stored in the memory | storage device 2 is shown. An example of the survival rate effect calculated in S051 of the initial setting phase A1 and stored in the storage device 2 will be shown. An example of the rarity calculated in S052 of the initial setting phase A1 and stored in the storage device 2 is shown. An example of a peak year calculated in S046 of the initial setting phase A1 and stored in the storage device 2 is shown. An example of the survival rate calculated in S049 of the initial setting phase A1 and stored in the storage device 2 is shown. FIG. 4 is a flowchart showing a subroutine of a score raw score calculation process (S3) shown in FIG. It is a flowchart which shows the subroutine of the calculation process (S31) of the application elapsed days term shown by FIG. It is a flowchart which shows the subroutine of the calculation process (S32) of the claim term shown by FIG. It is a flowchart which shows the subroutine of the calculation process (S021) of the claim number term shown by FIG. 12 is a flowchart showing a subroutine of event basic term calculation processing (S34) shown in FIG. It is a flowchart which shows the subroutine of the calculation process (S051) of the survival rate effect shown by FIG. It is a flowchart which shows the subroutine of the calculation process (S052) of unusualness shown by FIG. 16 is a flowchart showing a subroutine of event speed calculation processing (S346) shown in FIG. It is a flowchart which shows the subroutine of the calculation process (S046) of the event occurrence year and peak year which are shown by FIG. It is a flowchart which shows the subroutine of the calculation process (S349) of the frequency | count effect shown by FIG. It is a flowchart which shows the subroutine of the calculation process (S049) of the survival rate shown by FIG. It is a flowchart which shows the subroutine of the score calculation process (S6) shown by FIG.

  Hereinafter, embodiments of the present invention will be described in detail with reference to the drawings. Each embodiment described below shows an example of the present invention and does not limit the contents of the present invention. In addition, all of the configurations and operations described in the embodiments are not necessarily essential as the configurations and operations of the present invention. In addition, the same referential mark is attached | subjected to the same component and the overlapping description is abbreviate | omitted.

<1. Schematic configuration of patent evaluation apparatus>
FIG. 1 is a functional block diagram of a patent evaluation apparatus according to an embodiment of the present invention.
The patent evaluation device includes an information processing device 1 that evaluates patent applications or patents, a storage device 2 that stores various information such as patent applications or patents to be evaluated, and an input device 3 that receives various requests from analysts. And an output device 4 that outputs a patent evaluation result executed by the information processing device 1.

  In the following, the information processing device 1 and the storage device 2 are exemplified by a case where they are connected by a network such as a LAN (Local Area Network). Further, the information processing device 1 and the input device 3 are locally connected, and the information processing device 1 and the output device 4 are locally connected.

  The information processing apparatus 1 includes a control unit 100, a data acquisition unit 105, an initial setting unit 110, an evaluation value calculation unit 120, and an output unit 130.

  The control unit 100 controls the overall operation of the information processing apparatus 1. In addition, the control unit 100 receives various requests from the analyst via the input device 3. For example, the control unit 100 accepts a request for specifying a patent application to be evaluated or a technical field (target technical field) of a patent input by an analyst.

  The data acquisition unit 105 accesses the storage device 2, stores various data in the storage device 2, and reads data stored in the storage device 2. For example, the data acquisition unit 105 receives information on the target technical field requested by the analyst via the control unit 100. Then, the data acquisition unit 105 accesses the storage device 2 and reads the patent data 200 regarding the patent application or patent belonging to the target technical field from the patent applications or patents stored in the storage device 2. The data acquisition unit 105 reads the patent attribute information 205 corresponding to the read patent application or patent.

  The initial setting unit 110 performs initial setting of the patent evaluation apparatus as a process before the patent evaluation process. Specifically, the initial setting unit 110 mainly generates parameter information 206 from the patent attribute information 205.

  The evaluation value calculation unit 120 calculates the score raw score of each patent application or patent using the patent attribute information 205 of the patent application or patent belonging to the target technical field. Further, the score in the target technical field is calculated from the score raw points of each patent application or patent.

  The output unit 130 outputs the calculated score to the output device 4. For example, when the output device 4 is a display, the output unit 130 generates image data indicating a patent application or a patent score, and outputs the generated image data to the output device 4. Further, when the output device 4 is a printer, the output unit 130 generates print data indicating a patent application or a patent score, and outputs the generated print data to the output device 4.

  The storage device 2 is a unit that stores patent data 200 such as a patent application or patent publication, patent attribute information 205 about these patent applications or patents, and parameter information 206 used for various calculations. For example, it is composed of a DVD-ROM drive, a DVD-ROM, an HDD, and the like.

  The input device 3 is a unit that accepts instructions for selecting various functions of the patent evaluation device, an instruction in the target technical field, and the like, and includes a hard switch such as a scroll key and a scale change key, and a joystick. The output device 4 is a unit for receiving and outputting data from the information processing device 1. The output device 4 is composed of, for example, a liquid crystal display or a printer.

<2. Hardware configuration of information processing apparatus>
FIG. 2 is a hardware configuration diagram of the information processing apparatus 1 shown in FIG.
The information processing apparatus 1 includes a CPU (Central Processing Unit) 10, a main storage device 11 such as a RAM (Random Access Memory), an auxiliary storage device 12 such as an HDD, and peripheral devices (here, the input device 3 and the output device). 4) A network interface for controlling transmission / reception of data performed between the I / O interface 13 for controlling transmission / reception of data to / from the device and a device (here, the storage device 2) connected to the network. 14 and.

  Here, the auxiliary storage device 12 is a program for realizing the functions of the units (the control unit 100, the data acquisition unit 105, the initial setting unit 110, the evaluation value calculation unit 120, and the output unit 130) illustrated in FIG. Assume that (patent evaluation program) is stored. These functions are realized by the CPU 10 loading the patent evaluation program stored in the auxiliary storage device 12 into the main storage device 11 and executing it.

<3. Outline of processing>
FIG. 3 is a flowchart showing a schematic process of the patent evaluation apparatus according to the embodiment.
The general flow performed by the patent evaluation apparatus is classified into an initial setting phase A1 for initial setting of the patent evaluation apparatus and a patent evaluation phase A2 for actually performing patent evaluation.

In the initial setting phase A1, the initial setting unit 110 calculates the basic claim number term (S021), calculates the survival rate effect (S051), calculates the rarity (S052), the event A process for calculating the occurrence year and the peak year (S046) and a process for calculating the survival rates P _{n to} P _{n + 4} (S049) are performed. These calculation results are mainly stored in the storage device 2 as parameter information 206. Details of these processes will be described later.

  In the patent evaluation phase A2, several processes including the process (S6) of calculating the score of each patent application or patent are performed.

  First, in S <b> 1, the data acquisition unit 105 acquires a patent classification (for example, a CPC code) input by the analyst using the input device 3, and based on this designated patent classification, the patent application in the target technical field is stored from the storage device 2. Or extract a patent. The data acquisition unit 105 sets the total number of patent applications or patents in the extracted target technical field as I. In the following description, it is assumed that each extracted patent application or patent has a sequence number i, where i is an integer from 1 to I.

Next, in S2, the evaluation value calculation unit 120 sets the value of i to 1.
Next, in S3, the evaluation value calculation unit 120 calculates a score raw score of the patent application or patent i. The score raw score calculation process will be described later.

Next, in S4, the evaluation value calculation unit 120 determines whether i is equal to or greater than I. If i has not reached I (S4; NO), the evaluation value calculation unit 120 updates the value of i by adding 1 to the current value of i in S5, and returns the process to S3 described above. Thereby, score raw points are calculated for another patent application or patent. When i reaches I (S4; YES), in S6, the evaluation value calculation unit 120 extracts I patent applications or patents whose score raw score is higher than 0 and extracts the extracted I ⁺ For each patent application or patent, a score is calculated from the score raw score. The score calculation process will be described later.

  The score of each patent application or patent is calculated by the process outlined above. The calculated score is output by the output unit 130. Details will be described below.

<4. Example of patent attribute information>
FIG. 4 shows an example of the patent attribute information 205 stored in the storage device 2 shown in FIG. The storage device 2 has a number of patent applications or registered patents, for example, about 4 million patent applications in Japan in the past 10 years, filing date 21, examination request date 22, claim number 23, patent classification, 24, patent attribute information such as an expiration date 25, an information provision 26, and a cited (other company) 27 are stored. In the drawings of the present application and the following description, patent applications or patents are collectively referred to simply as a patent application.

  The filing date 21 is the filing date of the patent application. The examination request date 22 is the date on which an examination request is made for the patent application, and is NULL for patent applications that have not yet been requested for examination. The data of the number of claims 23 includes data of the number of claims in the open gazette and data of the number of claims in the registered gazette. The number of claims 23 may further include data on the number of claims after the objection decision. The number of claims in the registered gazette and the number of claims after the opposition decision is NULL for a patent application that has not yet been registered.

  The patent classification 24 specifies a technical field by a predetermined classification system such as IPC (international patent classification) or CPC (joint patent classification). The annihilation date 25 indicates the date of annihilation when the validity of the patent application or the validity of the patent ceases, such as the rejection of the patent application or the expiration of the patent right. If it has not disappeared (is alive), it is NULL.

  The information provision 26 is one of events (predetermined actions regarding each patent application). The item of information provision 26 includes information on the number of occurrences of information provision, information on the date of occurrence of the first information provision, and information on the year of occurrence of the first information provision. The generation year of the first information provision is calculated based on the date of the first information provision in S046 of the initial setting phase A1. The calculation method will be described later with reference to FIG.

  Cited (other company) 27 is also one of the events (predetermined actions related to each patent application). Cited (other company) indicates that it was cited in a notice of reasons for refusal of another company's patent application. The item of Citation (other company) 27 includes information on the number of times cited (other company), information on the date of occurrence of the first citation (other company), and information on the year of the first citation (other company). included. The year of occurrence of the first citation (other company) is calculated based on the date of occurrence of the first citation (other company) in S046 of the initial setting phase A1. The calculation method will be described later with reference to FIG.

  Here, the information provision 26 and the cited citation (other company) 27 are shown as event types, but it is desirable that there are more event types. Events include citations (in-house), maintenance pension payments, oppositions, extension of life, and other actions. Cited (in-house) indicates that it was cited in a notice of reasons for refusal of another patent application of the company. For oppositions and lifetime extensions, there is no need for data on the number of occurrences. Instead of the number of occurrences, there may be data indicating whether or not the occurrence has occurred. Oppositions and lifetime extensions are examples of “existence” events. Information provision 26, cited (other company) 27, cited (in-house), and maintenance pension payments are examples of “number-of-times” events.

According to the present embodiment, relative evaluation in the target technical field can be objectively performed by calculating an evaluation value based on numerical information that can be obtained by anyone regarding a patent application or a patent and is uniquely determined.
As described above, the present invention capable of appropriately evaluating the value of a patent application or a patent based on numerical information objectively determined based on the patent attribute information allows a huge number of patent applications or patents to be quickly obtained. Suitable for evaluation. Therefore, for example, it is easy to find “shining stones” from a large number of patent applications or patents, or to grasp the general position in the target technical field as a pre-stage for detailed evaluation of a patent application or patent. it can.

FIG. 5 shows an example of the basic claim number term calculated in S021 of the initial setting phase A1 and stored in the storage device 2. The calculation method will be described later with reference to FIG.
FIG. 6 shows an example of adjustment constants stored in the storage device 2. This adjustment constant is predetermined for each event.
FIG. 7 shows an example of the survival rate effect calculated in S051 of the initial setting phase A1 and stored in the storage device 2. The calculation method will be described later with reference to FIG.
FIG. 8 shows an example of the rarity calculated in S052 of the initial setting phase A1 and stored in the storage device 2. The calculation method will be described later with reference to FIG.
FIG. 9 shows an example of the peak year calculated in S046 of the initial setting phase A1 and stored in the storage device 2. The calculation method will be described later with reference to FIG.
FIG. 10 shows an example of the survival rate calculated in S049 of the initial setting phase A1 and stored in the storage device 2. The calculation method will be described later with reference to FIG.

<5. Calculation of score raw score (S3)>
FIG. 11 is a flowchart showing a subroutine of the score raw score calculation process (S3) shown in FIG. As a premise of FIG. 11, one patent application i is specified in S2 or S5 of FIG. The score raw score is calculated using a plurality of events j for each of the patent application i. In the following description, j is an integer from 1 to J, and score raw points are calculated using J events.

First, in S30, the evaluation value calculation unit 120 determines whether or not the patent application i is alive. This determination can be made based on the presence / absence of recording on the extinction date 25 shown in FIG.
When the patent application i is not alive (S30; NO), the evaluation value calculation unit 120 sets the score raw score of the patent application i to 0 (S39), and ends the process of this flowchart.

When the patent application i is alive (S30; YES), the evaluation value calculation unit 120 calculates the application elapsed days of the patent application i in S31. Details of this processing will be described later with reference to FIG.
Next, in S32, the evaluation value calculation unit 120 calculates the claim number term of the patent application i. Details of this processing will be described later with reference to FIG.

Next, in S33, the evaluation value calculation unit 120 sets the value of j to 1.
Next, in S34, the evaluation value calculation unit 120 calculates the event basic term of the event j for the patent application i. The event basic term calculation process will be described later with reference to FIG.

Next, in S36, the evaluation value calculation unit 120 determines whether j is J or more. When j does not reach J (S36; NO), the evaluation value calculation unit 120 updates the value of j by adding 1 to the current value of j in S37, and returns the process to S34 described above. Thereby, an event basic term is calculated for another event. When j reaches J (S36; YES), the evaluation value calculation unit 120 calculates the score raw score of the patent application i in S38, and ends the process of this flowchart. The score raw score is calculated by the following formula.
Score score = number of days of application history + number of claims + Σj basic event term

The application elapsed days term, the claims number term and the event basic term are respectively calculated by S31, S32 and S34 described above. The “Σj event basic term” is a value obtained by summing event basic terms related to J events j.
When the process of the flowchart is completed, the process proceeds to S4 in FIG.

<6. Calculation of Application Elapsed Days (S31)>
FIG. 12 is a flowchart showing a subroutine of calculation processing (S31) of the application elapsed days term shown in FIG. As a premise of FIG. 12, one patent application i is specified in S2 or S5 of FIG. The application elapsed days term is calculated for each of the patent applications i using the patent attribute information such as the application date 21.

First, in S <b> 311, the evaluation value calculation unit 120 calculates the application elapsed days of the patent application i by the following formula.
Application Elapsed Days = Current Date−The current date of the filing date of the patent application i may be the current date held by the information processing apparatus 1. The filing date of the patent application i may be the filing date 21 shown in FIG.

  Next, in S312, the evaluation value calculation unit 120 determines whether an examination request has been made for the patent application i. Whether or not an examination request has been made is determined by whether or not the data on the examination request date 22 in FIG. 4 is recorded.

If an examination request has been made (S312; YES), the evaluation value calculation unit 120 calculates the examination request elapsed days of the patent application i by the following formula in S313.
Examination request elapsed days = current date—The current date of examination request date of the patent application i may be the current date held by the information processing apparatus 1. The examination request date of the patent application i may be the examination request date 22 shown in FIG.

Next, in S314, the evaluation value calculation unit 120 calculates the application elapsed days term for the patent application i by the following formula, and ends the processing of this flowchart.
Application Elapsed Days = A exp (-B x Application Elapsed Days)
+ C exp (-D x number of days required for examination)
A, B, C, and D are positive constants set in advance. The application elapsed days and the examination request elapsed days are values calculated in the above-described S311 and S313, respectively. exp (X) is the value of the Napier number to the X power.

When the examination request has not been made (S312; NO), the evaluation value calculation unit 120 calculates the application elapsed days term for the patent application i by the following formula in S315, and ends the processing of this flowchart.
Application Elapsed Days = A exp (-B x Application Elapsed Days)

When the process of the flowchart is completed, the process proceeds to S32 of FIG.
The application elapsed days term calculated as described above attenuates in accordance with the elapsed days after application. And when an examination is requested, it rises once.

<7. Calculation of Claim Number (S32)>
FIG. 13 is a flowchart showing a subroutine of the claim term calculation process (S32) shown in FIG. As a premise of FIG. 13, one patent application i is specified in S2 or S5 of FIG. The number of claims is calculated using patent attribute information such as the number of claims 23 for each of the patent applications i.

  First, in S321, the evaluation value calculation unit 120 reads from the storage device 2 a basic claim number term corresponding to the technical field of the patent application i and the maximum number of claims. The technical field of the patent application i is extracted from the patent classification 24 shown in FIG. Here, the technical field of the patent application i is specified in units of sections (A to H) of CPC. The maximum number of claims of the patent application i is extracted from the number of claims 23 shown in FIG. Of the number of claims of the public gazette shown in FIG. 4 and the number of claims of the registered gazette, the larger one is the maximum number of claims. The basic claim number term is calculated in advance by a process described later with reference to FIG. 14, and is stored in the storage device 2 as shown in FIG.

Next, in S322, the evaluation value calculation unit 120 calculates a claim reduction rate by the following formula for the patent application i.
Claim reduction rate = minimum number of claims / maximum number of claims The minimum number of claims is extracted from the number of claims 23 shown in FIG. Of the number of claims of the public gazette shown in FIG. 4 and the number of claims of the registered gazette, the smaller one is the minimum number of claims. Alternatively, if the number of claims after the opposition decision is smaller, it may be the minimum number of claims.

Next, in S323, the evaluation value calculation unit 120 determines whether the claim reduction rate calculated in S322 is smaller than 0.5. When the claim reduction rate is smaller than 0.5 (S323; YES), the evaluation value calculation unit 120 calculates the claim number term by the following formula in S324 and ends the processing of this flowchart.
Number of claims = number of basic claims−0.04
The basic claim number term is a value read in S321 described above.

When the claim reduction rate is not smaller than 0.5 (S323; NO), the evaluation value calculation unit 120 advances the process to S325. In S325, the evaluation value calculation unit 120 determines whether the claim reduction rate calculated in S322 is smaller than 1. When the claim reduction rate is smaller than 1 (S325; YES), the evaluation value calculation unit 120 calculates the claim term by the following formula in S326, and ends the process of this flowchart.
Number of claims = number of basic claims−0.02
The basic claim number term is a value read in S321 described above.

When the claim reduction rate is not smaller than 1 (S325; NO), the evaluation value calculation unit 120 advances the process to S327. In S327, the evaluation value calculation unit 120 adopts the basic claim number term as the claim number term, and ends the processing of this flowchart.
When the process of this flowchart is completed, the process proceeds to S33 of FIG.

<7-1. Calculation of the number of basic claims (S021)>
FIG. 14 is a flowchart showing a subroutine of the claim term calculation process (S021) shown in FIG. The number of basic claims is calculated for each technical field and for each class of maximum number of claims using the survival rate when a predetermined judgment year has passed since the application.

  First, in S0211, the initial setting unit 110 extracts patent applications of a predetermined application year. And the survival rate until the judgment year of the extracted patent application is calculated as the first survival rate. The patent application of a predetermined application year is, for example, a patent application filed for 3 years from 14 to 16 years ago. The survival rate until the determination year is, for example, the ratio of patent applications that are alive in the 15th year (when 14 years have passed) from the filing of patent applications in a predetermined application year. The reason for this limitation is to ensure that data that can calculate the survival rate in the 15th year is secured, but not to be dragged by a tendency of an old age. Whether or not the subject is alive in the determination year is determined by the presence or absence of the record of the extinction date 25 shown in FIG. 4 or the difference between the extinction date 25 and the filing date 21 when there is a record of the extinction date 25. Can do.

  Next, in S0212, the initial setting unit 110 extracts a patent application in a predetermined technical field from the patent applications of the predetermined application year described above. Further, the initial setting unit 110 classifies the extracted patent applications in a predetermined technical field into the number-of-item classes for each maximum number of claims. The predetermined technical field is, for example, a technical field specified in units of sections (A to H) of CPC. The term class refers to a patent application belonging to the above-mentioned predetermined technical field, a patent application having a maximum number of claims of 1 to 4, a patent application of 5 to 9, and a patent of 10 to 14. It is classified into an application, a patent application that is 15-19, a patent application that is 20-49, and a patent application that is 50 or more.

  Next, in S0213, the initial setting unit 110 calculates the survival rate up to the determination year of the patent application belonging to each term class as the second survival rate. Similarly to the above, the survival rate until the determination year is the ratio of patent applications that are alive in the 15th year (when 14 years have passed) from among the patent applications belonging to the number of terms class.

Next, in S0214, the initial setting unit 110 calculates a basic claim number term by the following formula for each term number class, and ends the processing of this flowchart.
The basic claim number term = second survival rate−first survival rate calculated basic claim number term is stored in the storage device 2 as parameter information shown in FIG.

  The number-of-claims term is calculated by executing the processing shown in FIG. 13 using the basic number-of-claims term calculated as described above. By using the basic claim number term, the influence of the number of claims on the survival rate can be digitized and reflected in the score. Furthermore, numerical correction based on the claim reduction rate can be performed by the processing shown in FIG.

<8. Calculation of event basic term (S34)>
FIG. 15 is a flowchart showing a subroutine of event basic term calculation processing (S34) shown in FIG. As a premise of FIG. 15, one patent application i is specified in S2 or S5 of FIG. Further, as an assumption of FIG. 15, one event j is specified in S33 or S37 of FIG. The event basic term is calculated for each of the patent applications i and for each of the events j using information such as the year of occurrence and the number of occurrences shown in FIG.

  First, in S341, the evaluation value calculation unit 120 determines whether or not the event j exists in the patent application i. This determination is performed based on whether or not the information on the number of occurrences of the event shown in FIG. 4 or the information on the first occurrence date is input, or whether or not the data on the occurrence is input.

  When the event j does not exist in the patent application i (S341; NO), the evaluation value calculation unit 120 sets the event basic term of the event j of the patent application i to 0 in S342 and ends the processing of this flowchart. .

  When the event j exists in the patent application i (S341; YES), the evaluation value calculation unit 120 reads the adjustment constant of the event j in S343. As shown in FIG. 6, the adjustment constant is stored in advance in the storage device 2 for each event.

  Next, in S344, the evaluation value calculation unit 120 determines whether or not the event j is an event speed calculation target. The event speed is calculated for two types of information provision 26 and cited (other company) 27. For other events, the event speed is not calculated.

If the event j is not the event speed calculation target (S344; NO), the evaluation value calculation unit sets the event speed to 1 in S345 and advances the process to S347.
When the event j is an event speed calculation target (S344; YES), the evaluation value calculation unit 120 calculates the event speed of the event j for the patent application i in S346. Details of this processing will be described later with reference to FIG. After calculating the event speed, the evaluation value calculation unit 120 advances the processing to S347.

  In S347, the evaluation value calculation unit 120 determines whether or not the event j is a calculation target of the number of times effect. The number effect is calculated when the number of occurrences is defined for the event j. The presence / absence type event for which the number of occurrences is not defined is not subject to calculation of the frequency effect.

When the event j is not a target of the number effect (S347; NO), the evaluation value calculation unit sets the number effect to 1 in S348 and advances the process to S351.
When the event j is a target of the number effect (S347; YES), the evaluation value calculation unit 120 calculates the number effect of the event j for the patent application i in S349. Details of this processing will be described later with reference to FIG. After calculating the number-of-times effect, the evaluation value calculation unit 120 advances the process to S351.

  In S <b> 351, the evaluation value calculation unit 120 reads from the storage device 2 the survival rate effect of the event j corresponding to the patent classification of the patent application i. The survival rate effect of the event j is calculated in advance by a process described later with reference to FIG. 16, and is stored in the storage device 2 as shown in FIG.

  Next, in S <b> 352, the evaluation value calculation unit 120 reads from the storage device 2 the unusualness of the event j corresponding to the patent classification of the patent application i and the filing year t. The rarity of the event j is calculated in advance by a process described later with reference to FIG. 17 and stored in the storage device 2 as shown in FIG.

Next, in S353, the evaluation value calculation unit 120 calculates the event basic term of the event j for the patent application i by the following formula, and ends the processing of this flowchart.
Event basic term = adjustment constant x (event speed x frequency effect x survival rate effect x rarity) ^1.25
The adjustment constant, the event speed, the frequency effect, the survival rate effect, and the rarity are read or calculated in the above-described S343, S346, S349, S351, and S352, respectively.
When the process of the flowchart is completed, the process proceeds to S36 of FIG.

<8-1. Calculation of survival rate effect (S051)>
FIG. 16 is a flowchart showing a subroutine of the survival rate effect calculation process (S051) shown in FIG. The survival rate effect is calculated for each technical field and for each type of event j by using the survival rate at the time when a predetermined number of judgment years have passed since the application.

  First, in S0511, the initial setting unit 110 selects a target technical field for calculating the survival rate effect. The target technical field is desirably the same as the target technical field extracted in S1 of FIG. 3 in order to calculate the score of the patent application i. However, depending on the type of event, there may be a small number of patent applications in which an event occurs. For example, when the number of patent applications in which an event occurs is less than 1000, the survival rate effect may be calculated in a wider range (for example, units of sections A to H of CPC).

  Next, in S0512, the initial setting unit 110 counts the number of applications Ntotal in the target technical field among the patent applications for which the determination year X or more after the application has passed, and the number Nex of applications in which the event j has occurred in Ntotal. To do. The determination year X is determined in advance for each type of event j. How to determine the determination year X will be described later.

Next, in S0513, the initial setting unit 110 calculates the number of applications Nno in which the event j has not occurred among Ntotal by the following formula.
Nno = Ntotal-Nex
The number of applications Nno in which event j has not occurred may be counted instead of being calculated. In that case, one of Ntotal or Nex may be calculated instead of counting.

In step S0514, the initial setting unit 110 counts the number Nexlive of Nex until the post-application determination year X elapses.
Next, in S0515, the initial setting unit 110 counts the number Nnolive of Nno until the post-application determination year X elapses.
The count of the number of survivors until the judgment year X after the application has passed is the presence or absence of the record of the extinction date 25 shown in FIG. This can be done based on the difference from day 21.

Next, in S0516, the initial setting unit 110 calculates the survival rate with an event using the following formula.
Survival rate with events = Nexlive / Nex
Next, in S0517, the initial setting unit 110 calculates the survival rate without an event using the following equation.
Survival rate without events = Nnolive / Nno

Next, in S0518, the initial setting unit 110 calculates the survival rate effect of the event j by the following formula, and ends the processing of this flowchart.
Survival rate effect = survival rate with event−survival rate without event The calculated survival rate effect is stored in the storage device 2 as parameter information shown in FIG.

  The processing shown in FIG. 15 is executed using the survival rate effect calculated by the above processing. By using this survival rate effect, the influence of the presence or absence of event j on the survival rate can be digitized and reflected in the score.

  The determination year X used in S0514 and S0515 described above is determined in advance as follows before starting the processing of this flowchart. First, it is not limited to the target technical field, and the survival rate effect until x years have passed since the application is calculated for all patent applications for which the determination year X or more after the application has passed. x is an integer from 1 to 20, for example. Then, x with the highest survival rate effect is set as the determination year X in the event j.

  In the above description, in S0512 and S0513, the application number Nex in which the event j has occurred among the application number Ntotal in the target technical field, and the application number Nno in which the event j has not occurred in the application number Ntotal in the target technical field. Although the case where the values are counted or calculated and these values are used as denominators in S0516 and S0517 has been described, other values may be used depending on the type of event. For example, since an event such as an opposition only occurs in registered patents, the number of registrations may be used as the denominator. That is, in S0512 and S0513, the registration number Nex in which the event j has occurred out of the registration number Ntotal in the target technical field and the registration number Nno in which the event j has not occurred in the registration number Ntotal in the target technical field are counted or calculated. May be.

<8-2. Calculation of unusualness (S052)>
FIG. 17 is a flowchart showing a subroutine of the unusualness calculation process (S052) shown in FIG. The rarity is calculated using the occurrence rate of the event for each technical field, for each application year, and for each type of event j.

  First, in S0521, the initial setting unit 110 selects the target technical field a for calculating the rarity. The target technical field a is preferably the same as the target technical field extracted in S1 of FIG. 3 in order to calculate the score of the patent application i.

  Next, in S0522, the initial setting unit 110 classifies patent applications in the target technical field a into year groups for each application year t. The filing year t is an integer from the minimum value tmin to the maximum value tmax. The minimum value tmin is the oldest application year t of the plurality of year groups for which the rarity is calculated, and the maximum value tmax is the newest application year t of the plurality of year groups for which the rarity is calculated. is there. The minimum value tmin and the maximum value tmax are set in advance for each event j.

Next, in S0523, the initial setting unit 110 calculates the occurrence rate Pa (overall ratio) of the event j in the target technical field a by the following formula.
Pa = (number of occurrences of event j in field a + 0.1) / number of applications in field a Here, the occurrence rate Pa of event j is calculated for the entire patent application in the target technical field a, not every filing year t. The

Next, in S0524, the initial setting unit 110 calculates the occurrence rate Pat of the event j in the target technical field a and the filing year t by the following formula.
Pat = (number of occurrences of event j in field a and filing year t + 0.1) / number of applications in field a and filing year t Here, the occurrence rate Pat of event j in the target technical field a is calculated for each filing year t. Is done.

Next, in S0525, the initial setting unit 110 calculates the rarity of the event j in the target technical field a for each application year t by the following equation.
Rareness = 1 + exp (-Pat / Pa)
The value of rarity is a value in the range of 1 to 2.
The calculated rarity value is stored in the storage device 2 as parameter information shown in FIG.

  Using the rarity value calculated as described above, the processing shown in FIG. 15 is executed. This unusualness is not the unusualness of the event j itself, but indicates whether or not the occurrence of the event j in the patent group of the filing year t is unusual compared to the occurrence of the event j in the patent group of other filing years. . The weight of event j itself is evaluated by other variables such as survival rate effects.

<8-3. Calculation of event speed (S346)>
FIG. 18 is a flowchart showing a subroutine of the event speed calculation process (S346) shown in FIG. As a premise of FIG. 18, one patent application i is specified in S2 or S5 of FIG. Furthermore, as an assumption of FIG. 18, one event j is specified in S33 or S37 of FIG. As a premise of FIG. 18, it is determined in S344 of FIG. 15 that the event j is an event speed calculation target. The event speed is calculated using information such as the year of occurrence shown in FIG. 4 and the peak year shown in FIG. 9 for each of the patent applications i and for each event j for which the event speed is calculated. Is done.

  First, in S3461, the evaluation value calculation unit 120 reads the generation year Da of the event j for the patent application i. The generation year Da is stored in the storage device 2 for each patent application and for each event, as shown in FIG.

  Next, in S3462, the evaluation value calculation unit 120 reads the peak year Py of the event j in the filing year y for the patent application i. The peak year Py is stored in the storage device 2 for each application year and for each event, as shown in FIG.

Next, in S3463, the evaluation value calculation unit 120 determines whether the generation year Da of the event j for the patent application i is earlier than the peak year Py.
If the occurrence year Da is not earlier than the peak year Py (S3463; NO), the evaluation value calculation unit 120 ends the processing of this flowchart in step S3464, with the event speed of the event j for the patent application i set to 1. To do.

When the occurrence year Da is earlier than the peak year Py (S3463; YES), the evaluation value calculation unit 120 calculates the event speed of the event j for the patent application i by the following formula in S3465, The process ends.
Event speed = 2 / (1 + exp (−S × (Py−Da)))
S is a positive constant. The value of S is, for example, that the event speed is approximately 1.1 when the occurrence year Da is one year earlier than the peak year Py, and the event speed is approximately 1 when the occurrence year Da is two years earlier than the peak year Py. It is determined to be 2.

When the process of this flowchart is completed, the process proceeds to S347 in FIG.
By using the event speed calculated by the above processing, it is possible to digitize the height of interest in the patent application expressed in the speed at which the event j occurs and reflect it in the score.

<8-4. Calculation of event occurrence year and peak year (S046)>
FIG. 19 is a flowchart showing a subroutine of the event generation year and peak year calculation processing (S046) shown in FIG. The event occurrence year Da is calculated by using the date of occurrence of the event j in the patent application i for each patent application i and for each type of event j for which the event speed is to be calculated. The peak year Py is calculated as the most frequent value of the occurrence year Da for each type of event j, which is the event speed calculation target.

First, in S0461, the initial setting unit 110 calculates the occurrence year Da of the event j by the following formula for all patent applications.
Da = INT ((event occurrence date−application date) /365.25) +0.5
The event occurrence date is the first occurrence date when the same event occurs multiple times for one patent application. INT (X) is an integer obtained by rounding down fractions less than 1 in X. The calculated occurrence year Da is stored in the storage device 2 as the patent attribute information shown in FIG.

  Next, in S0462, the initial setting unit 110 classifies all patent applications into year groups for each application year y.

  Next, in S0463, the initial setting unit 110 sets the mode value of the occurrence year Da of the event j in the year group for each application year y as the peak year Py of the event j. The calculated peak year Py is stored in the storage device 2 as parameter information shown in FIG. Further, the process shown in FIG. 18 is executed using the calculated occurrence year Da and peak year Py.

<8-5. Calculation of frequency effect (S349)>
FIG. 20 is a flowchart showing a subroutine of the number-of-times effect calculation process (S349) shown in FIG. As a premise of FIG. 20, one patent application i is specified in S2 or S5 of FIG. Furthermore, as an assumption of FIG. 20, one event j is specified in S33 or S37 of FIG. In addition, as a premise of FIG. 20, it is determined in S347 of FIG. 15 that the event j is a target for calculating the number of times effect. The number effect is calculated using information such as the survival rate shown in FIG. 10 for each patent application i and for each event j for which the number effect is to be calculated.

  First, in S3491, the evaluation value calculation unit 120 compares the number of occurrences k of the event j in the patent application i with the threshold value n in the event j, and determines whether the number of occurrences k is less than the threshold value n. judge. The threshold value n is determined in advance for each type of event j.

If the occurrence count k is less than the threshold value n (S3491; YES), the evaluation value calculation unit 120 sets the count effect to 0 in S3492, and ends the processing of this flowchart.
If the occurrence count k is not less than the threshold value n (S3491; NO), the evaluation value calculation unit 120 determines in S3493 whether the occurrence count k of the event j in the patent application i is equal to n.
When the number of occurrences k is equal to n (S3493; YES), the evaluation value calculation unit 120 sets the number effect to 1 in S3494 and ends the process of this flowchart.

If the occurrence count k is not equal to the threshold value n (S3493; NO), the evaluation value calculation unit 120 reads the survival rate value corresponding to the occurrence count of the event j in S3495. As shown in FIG. 10, the values of the survival rates P _n , P _{n + 1} , P _{n + 2} , P _{n + 3} , and P _{n + 4} are stored in the storage device 2 according to the number of occurrences n, n + 1, n + 2, n + 3, and n + 4 of the event j, respectively. It is remembered.

Next, in S3496, the evaluation value calculation unit 120 determines whether the number of occurrences k of the event j in the patent application i is n + 1.
If the number of occurrences k is n + 1 (S3496; YES), the evaluation value calculation unit 120 calculates the number effect by the following formula in S3497 and ends the processing of this flowchart.
Number effect = P _{n + 1} / P _n

When the number of occurrences k is not n + 1 (S3496; NO), the evaluation value calculation unit 120 determines in S3498 whether the number of occurrences k of the event j in the patent application i is n + 2.
When the number of occurrences k is n + 2 (S3498; YES), the evaluation value calculation unit 120 calculates the number effect by the following formula in S3499 and ends the process of this flowchart.
Number effect = P _{n + 2} / P _n

When the number of occurrences k is not n + 2 (S3498; NO), the evaluation value calculation unit 120 determines in S3500 whether the number of occurrences k of the event j in the patent application i is n + 3.
When the number of occurrences k is n + 3 (S3500; YES), the evaluation value calculation unit 120 calculates the number effect by the following formula in S3501, and ends the process of this flowchart.
Number effect = P _{n + 3} / P _n

When the number of occurrences k is not n + 3 (S3500; NO), it can be seen that the number of occurrences k of the event j in the patent application i is n + 4 or more. In S3502, the evaluation value calculation unit 120 calculates the number effect by the following formula, and ends the processing of this flowchart.
Number effect = P _{n + 4} / P _n

When the process of this flowchart is completed, the process proceeds to S351 in FIG.
By using the number effect calculated by the above processing, the influence of the number of occurrences of the event j on the survival rate can be digitized and reflected in the score.

<8-6. Calculation of survival rate (S049)>
FIG. 21 is a flowchart showing a subroutine of the survival rate calculation process (S049) shown in FIG. The survival rates P _{n to} P _{n + 4} are calculated for each type of event j for which the frequency effect is to be calculated, and for each of the occurrence times _{n to n + 4} of the event j.

First, in S0491, the initial setting unit 110 sets the value of k to n.
Next, in S0492, the initial setting unit 110 calculates the survival rate P _k until the post-application determination year X elapses for the patent application in which the event j has occurred k times. The determination year X may be the same as that described with reference to FIG. The survival rate _Pk until the determination year X after the application passes is the ratio of patent applications that are alive at the time when the determination year X elapses among the patent applications that have passed the determination year X or more after the application.

Next, in S0493, the initial setting unit 110 determines whether or not the value of k has reached n + 4.
If the value of k has not reached n + 4 (S0493; NO), the initial setting unit 110 updates the value of k by adding 1 to the current value of k in S0494, and returns the process to S0492 described above. Thereby, the survival rate P _k is calculated for the next k.

When the value of k reaches n + 4 (S0493; YES), the initial setting unit 110 sets the survival rate _Pk calculated so far to _Pn , _{Pn + 1} , _{Pn + 2} , _{Pn + 3} , Pn in S0495, respectively. _{n + 4} is stored in the storage device 2, and the process of this flowchart is terminated.
The calculated survival rate value is stored in the storage device 2 as the parameter information shown in FIG. Further, the process shown in FIG. 20 is executed using the calculated survival rate value.

<9. Calculation of score (S6)>
FIG. 22 is a flowchart showing a subroutine of the score calculation process (S6) shown in FIG. As a premise of FIG. 22, score raw points are calculated for I patent applications i in the processing from S2 to S5 in FIG. The score is calculated by using the score raw score calculated in S3 of FIG. 3 for each of the patent applications i having a score raw score greater than 0 among the I patent applications i.

First, in S60, the evaluation value calculation unit 120 extracts a patent application i having a score raw score larger than 0 among the I patent applications i. Here, the number of extractions is I ⁺ .
Next, in S ^< b ^> 61, the evaluation value calculation unit 120 logarithmizes the score score points of the extracted I ⁺ patent applications i. The logarithm may be a natural logarithm or a common logarithm.
Next, in S62, the evaluation value calculation unit 120 calculates an average value and a standard deviation of log scored points. The average and standard deviation are not the average and standard deviation in I patent applications, but the average and standard deviation in extracted I ⁺ patent applications.
Next, in S63, the evaluation value calculation unit 120 calculates the logarithmized score raw score deviation value as the score of I ⁺ patent applications, and ends the process of this flowchart. This deviation value is calculated using the average value and the standard deviation calculated in S62.
The score is calculated as described above.

DESCRIPTION OF SYMBOLS 1 ... Information processing apparatus, 2 ... Storage device, 3 ... Input device, 4 ... Output device, 11 ... Main storage device, 12 ... Auxiliary storage device, 13 ... I / O interface, 14 ... Network interface, 21 ... Filing date, 22 ... Examination request date, 24 ... Patent classification, 25 ... Disappearance date, 26 ... Information provision, 100 ... Control unit, 105 ... Data acquisition unit, 110 ... Initial setting unit, 120 ... Evaluation value calculation unit, 130 ... Output unit, 200 ... Patent data, 205 ... Patent attribute information, 206 ... Parameter information, A1 ... Initial setting phase, A2 ... Patent evaluation phase

Claims (3)

Patent data on a plurality of patent applications or a plurality of patents are stored, information on the technical fields of each of the plurality of patent applications or the plurality of patents, and each of the plurality of patent applications or the plurality of patents Information indicating that the first and second predetermined actions have been taken or not, and the respective patent applications or patents expired from among the plurality of patent applications or the plurality of patents. A patent evaluation device that is accessible to a storage device that stores patent attribute information including information,
Patent data on a plurality of patent applications or a plurality of patents belonging to the designated technical field, and the first and second predetermined items relating to each of the plurality of patent applications or the plurality of patents belonging to the designated technical field Information indicating that the act was performed or not performed, and the date of expiration of each of the plurality of patent applications belonging to the specified technical field or of the patent applications or patents that have expired among the plurality of patents Means for obtaining information from the storage device based on the information in the designated technical field;
Of a plurality of patent applications or a plurality of patents belonging to the specified technical field, a first patent including a patent application or a patent having information indicating that the first predetermined action has been performed as the patent attribute information For the group, means for calculating a first survival rate at the time when the first predetermined number of years have passed since the application;
Of a plurality of patent applications or a plurality of patents belonging to the specified technical field, a second patent including a patent application or a patent having information indicating that the second predetermined action has been performed as the patent attribute information For the group, means for calculating a second survival rate when a second predetermined number of years have passed since the application;
A third application including a patent application or a patent that does not have, as the patent attribute information, information indicating that the first predetermined action has been performed among a plurality of patent applications or a plurality of patents belonging to the designated technical field. For the patent group, a means for calculating a third survival rate at the time when the first predetermined number of years has elapsed from the application;
A fourth application including a patent application or a patent that does not have, as the patent attribute information, information indicating that the second predetermined action has been performed among a plurality of patent applications or a plurality of patents belonging to the specified technical field; For the patent group, means for calculating a fourth survival rate at the time when the second predetermined number of years has passed since the application;
Patents belonging to the first patent group when a value obtained by subtracting the third survival rate from the first survival rate is higher than a value obtained by subtracting the fourth survival rate from the second survival rate Calculate the respective evaluation values of the plurality of patent applications or the plurality of patents belonging to the designated technical field so that the application or patent is evaluated higher than the patent application or patent belonging to the second patent group. An evaluation value calculating means;
A patent evaluation device. Information indicating the number of times a predetermined act relating to each of the plurality of patent applications or the plurality of patents is stored, and the plurality of patent applications. Or a patent evaluation device that is accessible to a storage device that stores patent attribute information including the information indicating the expiration date of each of the extinguished patent applications or patents of the plurality of patents,
Patent data on the plurality of patent applications or patents, information indicating the number of times the predetermined action has been performed on each of the plurality of patent applications or patents, and the plurality of patent applications or patents Information indicating the expiration date of each of the extinguished patent applications or patents from the storage device,
From among the plurality of patent applications or a plurality of patents, a first patent group including a patent application or a patent including information indicating that the predetermined action has been performed a first number of times as the patent attribute information. Means for calculating a first survival rate when a predetermined number of years have passed;
A second application including a patent application or a patent having, as the patent attribute information, information indicating that the predetermined action is performed a second number of times greater than the first number of the plurality of patent applications or a plurality of patents; Means for calculating a second survival rate at the time when the predetermined number of years have elapsed from the filing of the patent group;
When the second survival rate is higher than the first survival rate, the patent application or patent belonging to the second patent group is more highly evaluated than the patent application or patent belonging to the first patent group. An evaluation value calculating means for calculating an evaluation value of each of the plurality of patent applications or the plurality of patents;
A patent evaluation device. The patent evaluation device according to claim 1,
Access to the storage device storing the patent attribute information further including information indicating the number of times a predetermined action relating to each of the plurality of patent applications or the plurality of patents has been performed;
From among the plurality of patent applications or a plurality of patents, a first patent group including a patent application or a patent including information indicating that the predetermined action has been performed a first number of times as the patent attribute information. Means for calculating a first survival rate when a predetermined number of years have passed;
A second application including a patent application or a patent having, as the patent attribute information, information indicating that the predetermined action is performed a second number of times greater than the first number of the plurality of patent applications or a plurality of patents; Means for calculating a second survival rate at the time when the predetermined number of years have elapsed from the filing of the patent group;
Further comprising
The obtaining means includes patent data on the plurality of patent applications or a plurality of patents, information indicating the number of times the predetermined action has been performed on each of the plurality of patent applications or a plurality of patents, Information indicating the expiration date of each of the patent applications or patents that have expired among the patent applications or a plurality of patents is further acquired from the storage device;
When the second survival rate is higher than the first survival rate, the evaluation value calculating means is a patent application or patent belonging to the second patent group than the patent application or patent belonging to the first patent group. Calculating a plurality of patent applications belonging to the designated technical field or a respective evaluation value of the plurality of patents so that the
Patent evaluation device.

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