JP5937821B2 - Surveying instrument - Google Patents

Description

  The present invention relates to a surveying instrument in which an observation optical system has a zoom function.

  The collimating telescope used in surveying instruments such as a total station has a high magnification of about 30 times, and there is a problem that it is difficult to collimate the measurement point with the collimating telescope from the beginning. Therefore, conventionally, the measurement point is collimated first by visual observation or by using an sight, and then the measurement point is collimated by a collimating telescope. However, since the magnification greatly differs between the visual and sighting device and the collimating telescope, even if the measuring point is collimated with the visual and sighting device, it is not easy to capture the measuring point in the visual field of the collimating telescope.

  In addition, it is possible to change the magnification by observing the measurement point with the telescope by providing the zoom function in the telescope, but the zoom mechanism has poor optical axis stability due to its structure and maintains the collimation position. It was difficult to use and was not used in surveying instruments, especially total stations.

JP 2003-130644 A

  In view of such circumstances, the present invention provides a surveying instrument capable of providing a zoom function in an observation optical system.

  The present invention relates to an observation optical system having an image sensor that outputs a digital image signal and a zoom optical system, and a reference pattern projection optical that makes a reference pattern incident on the observation optical system in an infinite state and forms an image on the image sensor. System, the observation optical system, and the reference pattern projection optical system as a whole, a rotation mechanism that can rotate in two horizontal and vertical directions, and a horizontal angle that detects the horizontal and vertical angles of the two rotations of the rotation mechanism. An angle detector, a vertical angle detector, and a calculation control unit, the calculation control unit detecting the horizontal angle detector, the vertical angle detector, the reference pattern on the image sensor, and the observation The present invention relates to a surveying instrument that measures a horizontal angle and a vertical angle of a collimation point based on a difference from a collimation point of an optical system.

  The present invention also relates to a surveying instrument that further includes a lightwave distance meter having a distance measuring optical axis parallel to the optical axis of the observation optical system, and measures the distance of the measurement point of the measurement object.

  The present invention further includes a fine adjustment mechanism that is provided on the distance measuring optical axis and finely adjusts the deflection of the distance measuring optical axis so as to match the distance measuring point with the measuring point of the observation optical system. This relates to a surveying instrument configured in the same manner.

  The present invention also relates to a surveying instrument that calculates a zoom magnification by measuring a line interval of the grid projected on the image sensor, wherein the reference pattern is a grid composed of orthogonal lines.

  According to the invention, the reference pattern is a grid composed of orthogonal lines, and the distortion of the image is calculated by measuring the grid projected on the image sensor, and the measurement result is corrected based on the calculation result. It relates to surveying instruments.

  According to the present invention, the observation optical system relates to a surveying instrument which is a commercially available digital camera.

  According to the present invention, an observation optical system having an image sensor that outputs a digital image signal and a zoom optical system, and a reference pattern that is incident on the observation optical system at an infinite state and forms an image on the image sensor The projection optical system, the observation optical system, and the reference pattern projection optical system are integrated to rotate in two horizontal and vertical directions, and the horizontal and vertical angles of rotation in the two directions of the rotation mechanism are detected. A horizontal angle detector, a vertical angle detector, and a calculation control unit. The calculation control unit includes a detection result of the horizontal angle detector, the vertical angle detector, and a reference pattern on the image sensor. Since the horizontal angle and vertical angle of the collimation point are measured based on the difference from the collimation point of the observation optical system, the magnification is changed by the zoom optical system, collimation is facilitated, and the observation optical system The optical axis is blurred Even if you can run the exact angle measurement that includes a shake amount.

  In addition, according to the present invention, the optical distance meter having a distance measuring optical axis parallel to the optical axis of the observation optical system is further provided to measure the distance of the measurement point of the measurement object. A total station can be configured.

  According to the present invention, there is further provided a fine adjustment mechanism that is provided on the distance measuring optical axis and finely adjusts the deflection of the distance measuring optical axis, and includes a distance measuring point and a measuring point of the observation optical system. Since it is configured to match, distance measurement can be performed with high accuracy.

  According to the present invention, the reference pattern is a grid composed of orthogonal lines, and the zoom magnification is calculated by measuring the line spacing of the grid projected on the image sensor. Accurate measurement can be performed.

  According to the invention, the reference pattern is a grid composed of orthogonal lines, and the distortion of the image is calculated by measuring the grid projected on the image sensor, and the measurement result is calculated based on the calculation result. Because it corrects, accurate measurement can be performed.

  Further, according to the present invention, since the observation optical system is a commercially available digital camera, it exhibits an excellent effect that a surveying instrument can be configured inexpensively and simply.

1 is a schematic configuration diagram of a surveying instrument according to a first embodiment of the present invention. It is a figure which shows an example of the reference line used for a 1st Example. (A)-(C) are explanatory drawings which show the change of the image at the time of zooming with the observation optical system of a 1st Example, and the state of the measurement point in an image. It is explanatory drawing which shows the state in which the reference pattern at the time of zooming was distorted. It is the schematic which shows the optical system of a 2nd Example. It is a front view of the 3rd example. It is the same front side view. (A) is sectional drawing of the vertical angle detector used for a 3rd Example, (B) is explanatory drawing when a rotating shaft inclines. It is explanatory drawing which shows an example of the angle detection pattern used for the said vertical angle detector. It is a front view of the 4th example. It is a schematic block diagram which shows the light wave distance meter and the reference | standard pattern projection optical system in a 4th Example.

  Embodiments of the present invention will be described below with reference to the drawings.

  FIG. 1 shows the basic configuration of a surveying instrument according to the first embodiment of the present invention. In FIG. 1, reference numeral 1 denotes an observation optical system, and 2 denotes an optical distance meter (EDM: Electro-Optical Distance Measurement).

  The observation optical system 1 has an observation optical axis 3, the lightwave distance meter 2 has a distance measurement optical axis 4, and the observation optical system 1 and the lightwave distance meter 2 are the observation optical axis 3 and the The distance measuring optical axis 4 is parallel and is installed at a known interval. The observation optical system 1 and the light wave rangefinder 2 are mechanically integrated to form a measuring unit 10, and the measuring unit 10 is supported by a rotating mechanism 5 so as to be rotatable in two directions, a horizontal direction and a vertical direction. Has been.

  The observation optical system 1 has an objective lens 6, a zoom optical system 7, and an image sensor 8 on the observation optical axis 3, and the image sensor 8 is provided at a focal position of the zoom optical system 7.

  The image sensor 8 is a CCD, CMOS sensor, or the like, which is composed of an assembly of a large number of pixels. Each pixel emits a light reception signal and the position of the image sensor 8 can be specified based on the emitted signal. It has become.

  The output signal from the image sensor 8 is a set of output signals from the pixels, and is output to the arithmetic control unit 9 as a digital image signal.

  An optical path dividing optical member such as a half mirror 12 is disposed on the object side with respect to the objective lens 6 on the observation optical axis 3. The observation optical axis 3 is transmitted through the half mirror 12, a condenser lens 13 is disposed on the reflection optical axis 3 a of the half mirror 12, and a reference pattern 14 is disposed at the focal position of the condenser lens 13. ing.

  The reference pattern 14 has a configuration (figure) that can detect a reference position, magnification, and image distortion. For example, the reference pattern 14 is a lattice formed of vertical and horizontal lines orthogonal to each other as shown in FIG. Reference numeral 14 is provided with a thick reference line 17 orthogonal to the center, and the reference pattern 14 is set at the center, with the grid cell set smaller than the surrounding cell by a predetermined magnification (in the figure, one side is ½ times). A fine pattern 14a is provided.

  If the position of the reflected light axis 3a is not mechanically changed with respect to the rotation axis (horizontal rotation axis and vertical rotation axis) (not shown) of the rotation mechanism 5 (fixed to a known relationship), the image The position of the reference pattern 14 on the sensor 8 reflects the mechanical position and orientation of the surveying instrument. Here, the half mirror 12, the condenser lens 13, and the reference pattern 14 constitute a reference pattern projection optical system 18 that projects the reference pattern 14 onto the observation optical system 1 at infinity.

  The rotation mechanism 5 includes a horizontal angle detector 15 and a vertical angle detector 16 for each of a horizontal rotation axis and a vertical rotation axis, and the horizontal angle detector 15 and the vertical angle detector 16 are respectively connected to the measurement unit. Ten horizontal rotation angles and vertical rotation angles are detected.

  The light wave distance meter 2 emits distance measuring light onto the distance measuring optical axis 4, receives reflected light from the object to be measured, and reaches the point (measurement point) irradiated with distance measuring light based on the light reception result. Measure distance. The distance measuring light may be either visible light or invisible light, but if it is visible light, the measurement point being measured can be confirmed visually or on an image.

  The arithmetic control unit 9 displays an image captured by the image sensor 8 on the display unit 11. The arithmetic control unit 9 processes the image signal from the image sensor 8 and extracts the reference pattern 14. One method for extracting the reference pattern 14 is to acquire an image without the reference pattern 14, then acquire an image with the reference pattern 14, and take the difference between the two images to obtain the reference pattern 14. Can be extracted.

  The arithmetic control unit 9 is configured to detect the horizontal angle of the measurement point based on the detection signal from the horizontal angle detector 15 and the vertical angle detector 16 and the image signal from the half mirror 12 and the image sensor 8. Calculate the vertical angle.

  The operation of the surveying instrument having the above configuration will be described.

  Since the reference pattern 14 is located at the focal point of the condenser lens 13, the light from the reference pattern 14 passes through the condenser lens 13 to become parallel light and is imaged on the image sensor 8. The In a state where the observation optical axis 3 and the reflection optical axis 3a completely coincide with each other, the center of the reference pattern 14 coincides with the center of the image sensor 8. The reference pattern 14 is projected according to the magnification of the zoom optical system 7, and the position (coordinates) of the point on the reference pattern 14 is specified at a position corresponding to the magnification of the zoom optical system 7.

  When the observation optical axis 3 is inclined with respect to the reflected optical axis 3a, the reference pattern 14 is projected on the image sensor 8 while being displaced by the inclination angle of the observation optical axis 3. Further, since the reflected light axis 3a is fixed in a known relationship with respect to the rotation axes (horizontal rotation axis and vertical rotation axis) of the rotation mechanism 5, the displacement of the reference pattern 14 on the image sensor 8 is increased. , The inclination of the observation optical axis 3 can be detected.

  Further, referring to FIGS. 3A to 3C, the change of the image when zoomed with the observation optical system 1, the state of the measurement point in the image, the horizontal angle with the observation optical system 1, A case where the vertical angle is measured will be described.

  In the state where the zoom magnification is set to a low magnification (for example, 2 times) in the observation optical system 1, the observation optical axis 3 is directed to the measurement point of the measurement object, and a wide-angle image including the measurement object is displayed on the display unit 11. It is displayed (see FIG. 3A).

  An image captured by the image sensor 8 is displayed on the display unit 11 and the reference pattern 14 is superimposed on the image. In order to make the reference pattern 14 easy to discriminate, the color may be different from the background and may be blinked. The center of the reference pattern 14 (the point where the reference line 17 intersects) indicates the measurement point.

  The rotation mechanism 5 adjusts the direction of the measurement unit 10, that is, the direction of the observation optical axis 3 so that the center of the reference pattern 14 is aligned with the measurement point, that is, the measurement point is the center of the image. The direction of the observation optical axis 3 is measured by the horizontal angle detector 15 and the vertical angle detector 16.

  By increasing the zoom magnification stepwise or continuously by the zoom optical system 7, the object to be measured can be easily observed (see FIGS. 3B and 3C). In addition to the reference pattern line, a measurement index 19 for designating a measurement point is displayed on the image. The measurement index 19 can be displayed at a desired position on the screen by an external operation.

  By increasing the zoom magnification by the zoom optical system 7, the reference pattern to be copied on the observation image is enlarged together with the observation image. At this time, even if the observation optical axis 3 is shaken, the observation image and the reference pattern are integrally shaken, and therefore, the relationship between the observation image and the reference pattern on the observation image is not affected. Therefore, by measuring the measurement index 19 on the image based on the reference pattern, the horizontal and vertical directions are corrected, and measurement errors due to blurring can be eliminated.

  In general, in an optical system, as shown in FIG. 4, an image is distorted due to lens distortion, and correction is required for measurement. In this case, by measuring the vertical and horizontal lines of the lattice constituting the reference pattern 14 with the image sensor 8, the state of distortion of the vertical and horizontal lines can be measured, and the measurement value is corrected based on the measurement result. Can do. Alternatively, measurement is performed with a distorted line as a reference. In either case, distortion according to the magnification can be measured by the reference pattern 14, and high-precision measurement that is not affected by lens distortion is possible.

  Distance measurement of the measurement point is performed by the light wave distance meter 2. Further, by making the ranging light visible, the ranging position can be confirmed on the image. The distance measuring optical axis 4 and the observation optical axis 3 are parallel and are separated by a known distance, and the measurement point is not measured accurately. The deviation from the position is slight, and the distance measurement result measured by the lightwave distance meter 2 can be practically used as the distance measured by the measurement point.

  Thus, a total station having a zoom function and facilitating collimation of the measurement points can be realized. In the first embodiment, the light wave distance meter 2 may be a commercially available handy type or may be a surveying instrument that measures the angle by omitting the light wave distance meter 2. Good.

  Next, when creating a panoramic image for measurement using the observation optical system 1, the reference pattern 14 can be used.

  When creating a panoramic image for measurement, a captured image centered on the rotation center of shooting is required, but the captured image acquired by the camera is an image centered on the lens principal point and is not an image of the rotation center. For this reason, the relationship with the rotation center was obtained, and it was necessary to reconstruct the image separately from the relationship between the lens principal point and the rotation center. As described above, when the zoom function is used, the principal point of the lens changes, and the relationship between the lens principal point and the rotation center cannot be specified. In the observation optical system 1 using the zoom function, a panoramic image can be obtained. Creation was not possible.

  In this embodiment, the reference pattern is an image centered on the center of rotation regardless of the zoom function, and the image centered on the reference pattern is an image centered on the center of rotation, making it easy to create a measurement panoramic image. .

  FIG. 5 shows a basic configuration of the surveying instrument according to the second embodiment.

  In the second embodiment, the ranging accuracy is further improved. In the second embodiment, the same parts as in the first embodiment are omitted, and only the optical system is shown.

  In the second embodiment, a fine adjustment mechanism 21 for the distance measuring optical axis 4 is provided. An example of the fine adjustment mechanism 21 includes a pair of wedge prisms that finely adjust the deflection of the distance measuring optical axis 4 by relatively rotating the prisms.

  A half mirror 22 is installed on the distance measuring optical axis 4 that has passed through the fine adjustment mechanism 21, a corner prism 23 is disposed opposite the half mirror 22, and further opposed to the corner prism 23. A mirror 24 is provided for allowing the light 23 to enter the observation optical system 1. Note that visible light is preferably used as the distance measuring light.

  A part of the distance measuring light emitted from the light wave distance meter 2 is divided by the half mirror 22, and a part of the divided distance measuring light is incident on the corner prism 23 as monitor light 25, and the corner prism 23 The monitor light 25 reflected in parallel with the incident light by the light beam and reflected by the corner prism 23 is further reflected by the mirror 24 in parallel with the distance measuring optical axis 4 and enters the observation optical system 1. The monitor light 25 incident on the observation optical system 1 is received by the image sensor 8.

  The half mirror 22, the corner prism 23, and the mirror 24 constitute a distance measuring optical axis monitor optical system 26.

  The direction of the distance measuring optical axis 4 can be finely adjusted by the fine adjustment mechanism 21, and the position measured by the light wave distance meter 2 can be matched with the position measured by the observation optical system 1. Therefore, it is possible to match the measurement point that is measuring the angle with the measurement point that is measuring the distance, and the measurement accuracy can be further improved.

  The distance measuring optical axis monitor optical system 26 reflects the state of the distance measuring optical axis 4 adjusted by the fine adjustment mechanism 21 so that the monitor light 25 is incident on the observation optical system 1. When the sensor 8 receives the monitor light 25, the irradiation position (measurement point) of the distance measuring light can be obtained on the image.

  6 and 7 show a third embodiment. In the third embodiment, a transit is constructed using a commercially available digital camera as an observation optical system having a zoom optical system.

  6 and 7, the same components as those shown in FIG. 1 are denoted by the same reference numerals, and the description thereof is omitted.

  A leveling portion 32 is provided at the upper end of the tripod 31, and a rotation base 34 is rotatably provided on the leveling portion 32 via a horizontal rotation shaft 33. The leveling unit 32 has a leveling mechanism (not shown) that levels the axis of the horizontal rotating shaft 33 vertically. A horizontal rotation drive unit (not shown) is accommodated in the rotation base 34, and the rotation base 34 is rotated around the horizontal rotation shaft 33 by the horizontal rotation drive unit. .

  A platform 35 is vertically provided on the rotation base 34. The gantry 35 is provided with a vertical rotation table 37 extending in the horizontal direction, and the vertical rotation table 37 is rotatable via a vertical rotation shaft 36 having a horizontal axis. The gantry 35 accommodates a vertical rotation drive unit (not shown), and the vertical rotation drive unit rotates the vertical rotation table 37 about the vertical rotation shaft 36 in the vertical direction.

  A digital camera 38 is mounted on the vertical turntable 37, and the digital camera 38 has a zoom mechanism. The digital camera 38 has an observation optical axis 3, and the observation optical axis 3 is rotated in the vertical direction by the rotation of the vertical turntable 37. The observation optical axis 3 intersects with the axis of the horizontal rotation axis 33 and is configured to rotate in a vertical plane including the axis of the horizontal rotation axis 33.

  A reference pattern projection optical system 18 is provided for the observation optical axis 3. The reference pattern projection optical system 18 has the reflection optical axis 3a as described above (see FIG. 1), and the reflection optical axis 3a is relative to the axis of the horizontal rotation axis 33 and the axis of the vertical rotation axis 36. The rotation amount of the horizontal rotation shaft 33 matches the horizontal rotation angle of the reflected light axis 3a, and the rotation amount of the vertical rotation shaft 36 is equal to the reflected light axis 3a. It matches the vertical rotation angle.

  A horizontal angle detector 15 and a vertical angle detector 16 are provided for the horizontal rotation shaft 33 and the vertical rotation shaft 36, and the horizontal rotation shaft 33 and the vertical angle detector 16 are provided by the horizontal angle detector 15 and the vertical angle detector 16. The rotation angle of the rotation shaft 36 is detected. A general encoder may be used for the horizontal angle detector 15 and the vertical angle detector 16, but in this embodiment, an angle detector built in the horizontal rotation shaft 33 and the vertical rotation shaft 36 is used. It is done.

  Since the horizontal angle detector 15 and the vertical angle detector 16 have the same structure, the vertical angle detector 16 will be described below with reference to FIG.

  A columnar shaft space 41 is formed concentrically with the axis of the vertical rotation shaft 36 at the end of the vertical rotation shaft 36, and the shaft end has a hollow structure. The shaft end is rotatably supported by the gantry 35 via a bearing 42, and a bearing space 43 is formed on the gantry 35 concentrically with the shaft space 41. The shaft portion space 41 has the same diameter. Main components of the vertical angle detector 16 are accommodated in the shaft space 41 and the bearing space 43.

  A first condenser lens 44 is provided in the shaft space 41, and a second condenser lens 45 is provided in the bearing space 43. The magnifications of the first condenser lens 44 and the second condenser lens 45 are each 1 and have the same focal length.

  The first condenser lens 44 and the second condenser lens 45 have optical axes 46a and 46b, respectively. The optical axis 46a coincides with the axis of the vertical rotation shaft 36, and the optical axis 46b is the bearing. It coincides with the axis of the partial space 43. Therefore, in a state where the vertical rotation shaft 36 is not inclined, the optical axis 46a and the optical axis 46b coincide on the same straight line.

  The first condenser lens 44 and the second condenser lens 45 preferably have the same characteristics so as not to cause image distortion.

  An angle detection pattern 47 is provided at the bottom of the shaft space 41, and the angle detection pattern 47 is located at the focal position of the first condenser lens 44. A shaft image sensor 48 is provided in the bearing space 43, and the shaft image sensor 48 is located at the focal position of the second condenser lens 45.

  Light emitting portions for illuminating the angle detection pattern 47 are provided at appropriate locations in the bearing space 43 and the shaft space 41. In the drawing, as an example, a ring-shaped light emitting portion 49 provided at the bottom of the shaft space 41 and surrounding the angle detection pattern 47 is shown.

  As the shaft image sensor 48, a CCD or CMOS sensor, which is an aggregate of pixels, is used, and the position of each pixel can be specified on the shaft image sensor 48. The light reception signal from the shaft image sensor 48 is input to the signal processing unit 51. The signal processing unit 51 measures the rotation angle and the inclination (tilt angle) of the vertical rotation shaft 36 based on the light reception signal. It is configured.

  FIG. 9 shows an example of the angle detection pattern 47.

  The basic shape of the angle detection pattern 47 is a circle, and the center of the angle detection pattern 47 coincides with the optical axis of the first condenser lens 44, that is, the optical axis 46a.

  The angle detection pattern 47 includes a centering circular pattern 53 at the center and a reference pattern 54 disposed around the circular pattern 53. The circle pattern 53 is a perfect circle drawn with a predetermined line width.

  The reference pattern 54 has a configuration in which line segments 55 extending in the radial direction are arranged on the entire circumference at a predetermined angular pitch, and a ring-shaped track is formed by the line segments 55. Among the line segments 55, line segments 55a at predetermined plural positions are thick. The inner end and the outer end of the line segment 55 are positioned on the circumference concentric with the circular pattern 53, respectively. Further, as shown in the figure, the line segment 55a is not provided at a position where the circumference is equally divided, and the rotation angle of the reference pattern 54 can be detected by detecting the position of the line segment 55a. It is like.

  Hereinafter, the operation of the above-described vertical angle detector 16 will be described.

  The angle detection pattern 47 is projected in a 1: 1 relationship on the shaft image sensor 48 by the action of the first condenser lens 44 and the second condenser lens 45, and the shaft image sensor 48 receives light. A signal corresponding to the angle detection pattern 47 is generated.

  When the vertical rotation shaft 36 rotates, the angle detection pattern 47 rotates integrally with the vertical rotation shaft 36, and the rotated angle detection pattern 47 image is projected on the shaft image sensor 48. Since the shaft image sensor 48 emits a light reception signal for each pixel, for example, when the line segment 55a moves, the position of the pixel receiving the line segment 55a changes. Therefore, the rotation angle of the vertical rotation shaft 36 with respect to the gantry 35 can be detected by detecting the change in the position of the pixel receiving the line segment 55a based on the signal from the shaft image sensor 48. .

  Next, a case where the vertical rotation shaft 36 is inclined with respect to the mount 35 will be described with reference to FIG.

  Due to the action of the first condenser lens 44 and the second condenser lens 45, a light beam incident on the first condenser lens 44 is parallel to the light beam by the second condenser lens 45 and the shaft image sensor. 48 is projected. When the optical axis 46a of the first condenser lens 44 is inclined with respect to the optical axis 46 of the second condenser lens 45, the angle detection pattern 47 image projected on the shaft image sensor 48 is the first image. The image is projected onto the shaft image sensor 48 from the tilted direction by the tilt of the optical axis 46 a of the condenser lens 44. Therefore, the projected image is displaced on the shaft image sensor 48 by an amount corresponding to the inclination.

  Here, when the displacement amount of the pattern image on the shaft image sensor 48 is Δ, the inclination of the optical axis 46a of the first condenser lens 44 is α, and the focal point of the second condenser lens 45 is f. tan α = Δ / f. Further, the center of the circle pattern 53 indicates the center of the angle detection pattern 47, and by detecting the position of each pixel of the shaft image sensor 48 that receives the circle pattern 53, the circle pattern 53 is detected. The center of 53 is determined, and the displacement Δ is determined by determining the deviation between the center of the circular pattern 53 and the center of the shaft image sensor 48. Accordingly, the inclination of the optical axis 46 a of the first condenser lens 44, that is, the inclination angle of the vertical rotation shaft 36 can be detected based on the light reception result of the shaft image sensor 48.

  Since the rotation of the angle detection pattern 47 on the shaft image sensor 48 or the displacement amount of the central position of the angle detection pattern 47 can be detected in units of pixels of the shaft image sensor 48, high-precision measurement is possible. Is possible.

  Further, the inclination of the vertical rotation shaft 36 can be detected together with the rotation angle. By correcting the measurement value based on the detected inclination, it is possible to obtain a measurement result in which the influence of the inclination of the vertical rotation shaft 36 is removed. Therefore, even when the rotation of the vertical rotation shaft 36 includes an error, highly accurate angle detection can be performed. Therefore, the parts accuracy and assembly of the vertical rotating shaft 36 need not be made high, and the manufacturing cost of the vertical angle detector 16 can be reduced.

  In the above embodiment, the shaft image sensor 48 may be provided on the vertical rotation shaft 36 side, and the angle detection pattern 47 may be provided on the mount 35 side.

  10 and 11 show a fourth embodiment. In the fourth embodiment, a commercially available digital camera is used as an observation optical system having a zoom optical system to constitute a total station.

  10 and 11, the same components as those shown in FIGS. 1 and 5 to 7 are denoted by the same reference numerals, and the description thereof is omitted.

  In the fourth embodiment, the vertical turntable 37 is provided with the light wave distance meter 2 integrally with the reference pattern projection optical system 18 so that the angle can be measured with a commercially available digital camera, and the light wave distance meter 2 is provided. The distance measurement optical axis 4 is deflected by the fine adjustment mechanism 21 so that the distance measurement point and the angle measurement point coincide with each other.

  Further, the lightwave distance meter 2 may be a commercially available handy type. In this case, a total station can be simply configured by a combination of a commercially available digital camera and a commercially available handy type lightwave distance meter 2.

DESCRIPTION OF SYMBOLS 1 Observation optical system 2 Optical wave distance meter 3 Observation optical axis 4 Distance optical axis 5 Rotating mechanism 6 Objective lens 7 Zoom optical system 8 Image sensor 9 Arithmetic control part 10 Measurement part 14 Reference pattern 15 Horizontal angle detector 16 Vertical angle detector 18 Reference pattern projection optical system 26 Distance measuring optical axis monitor optical system 33 Horizontal rotation axis 36 Vertical rotation axis 38 Reference pattern projection optical system

Claims (6)

An observation optical system having an observation optical axis, an image sensor disposed on the observation optical axis, and a zoom optical system;
An optical path splitting optical member disposed on the object side of the zoom optical system on the observation optical axis; a condensing lens disposed on a reflection optical axis of the optical path splitting optical member; and A reference pattern projection optical system having a reference pattern provided at a focal position ;
A rotation mechanism capable of rotating the observation optical system and the reference pattern projection optical system integrally in two horizontal and vertical directions;
A horizontal angle detector for detecting a horizontal angle and a vertical angle of rotation in two directions of the rotating mechanism; a vertical angle detector;
An arithmetic control unit,
The observation optical system projects an image including a measurement point on the image sensor via the zoom optical system, and acquires an image by the image sensor.
The reference pattern projection optical system is provided such that the position does not change mechanically with respect to the rotation mechanism, and projects the reference pattern onto the image sensor through the zoom optical system in an infinite state.
The arithmetic control unit is configured to detect the horizontal of the collimation point based on the detection result of the horizontal angle detector and the vertical angle detector, and the difference between the reference pattern on the image sensor and the collimation point of the observation optical system. Surveying instrument characterized by measuring angle and vertical angle.   The surveying instrument according to claim 1, further comprising a lightwave distance meter having a distance measuring optical axis parallel to the optical axis of the observation optical system, and measuring a measurement point of a measurement object.   A fine adjustment mechanism that is provided on the distance measuring optical axis and finely adjusts the deflection of the distance measuring optical axis, and is configured to match the distance measurement measurement point with the observation optical system measurement point. 2 surveying instruments.   The surveying instrument according to claim 1, wherein the reference pattern is a grid composed of orthogonal lines, and the zoom magnification is calculated by measuring a line interval of the grid projected onto the image sensor. .   The reference pattern is a grid composed of orthogonal lines, calculates distortion of an image by measuring the grid projected on the image sensor, and corrects the measurement result based on the calculation result. The surveying instrument according to any one of items 4.   The surveying instrument according to claim 1, wherein the observation optical system is a commercially available digital camera.

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