JP5012711B2 - Radiation probe and radiation measurement apparatus using the same - Google Patents

Description

  The present invention relates to a radiation probe for measuring radiation and a radiation measuring apparatus using the radiation probe.

  Conventionally, Patent Document 1 proposes a radiation measurement apparatus including a sensor head, an image fiber, a camera, and an image processing apparatus. Among these, the sensor head has a configuration in which a shielding plate having a high transmittance of γ-rays, a multi-collimator that passes a component in a predetermined direction, and a scintillator that emits fluorescence by γ-rays are incorporated in a shielding container. .

  The fluorescent plate is arranged perpendicular to the longitudinal direction of the sensor head. An image fiber is in close contact with the fluorescent plate of the sensor head perpendicularly to the fluorescent plate. A camera is connected to the image fiber, and the camera is connected to an image processing apparatus.

And a sensor head is fixed to a trolley | bogie, and is arrange | positioned in the place away from the tank in which the measuring object was put. When γ rays generated in the tank enter the sensor head, the γ rays pass through the light shielding plate and the multi-collimator and are irradiated onto the fluorescent plate. Thereby, fluorescence is emitted from the fluorescent plate. The fluorescence is captured by a camera via an image fiber and taken into an image processing apparatus. In this way, the radiation distribution radiated from the measurement object in the tank is measured.
JP 2004-85250 A

  However, in the above conventional technique, the fluorescent plate is arranged perpendicular to the longitudinal direction of the sensor head, and the image fiber is connected to the fluorescent plate perpendicularly. For this reason, the sensor head is configured to be elongated in the longitudinal direction of the sensor head. Therefore, if it is not a place where the length of the sensor head in the longitudinal direction can be secured, the sensor head cannot be installed to perform radiation measurement. As described above, the radiation measurement in a place where the length cannot be secured in the direction in which the radiation is emitted from the radiation source is limited.

  In view of the above points, an object of the present invention is to make it possible to perform radiation measurement in a place where a length cannot be secured in a direction in which radiation is emitted from a radiation source.

In order to achieve the above object, the invention according to claim 1 has a scintillator (11) that emits light when irradiated with radiation, one end (12a), and the other end (12b). (12a) is provided with a scintillator (11) and an incident surface (12c) on which light is incident, and the other end (12b) is provided with an exit surface (12d) on which light is emitted. Light guide means (12) for guiding light from the surface (12c) to the exit surface (12d),
The entrance surface (12c) is arranged perpendicular to the exit surface (12d) ,
The light guide means (12) is inclined with respect to the incident surface (12c) and the exit surface (12d), reflects the light incident from the incident surface (12c), and guides it to the other end (12b) side. (12e)
The reflection surface (12e) totally reflects the light incident from the incident surface (12c) in the direction perpendicular to the incident surface (12c) among the light,
The light guide means (12) is a rod-shaped member having a portion extending in a direction perpendicular to the emission surface (12d) between the reflection surface (12e) and the emission surface (12d).
The light guide means (12) is made of acrylic resin,
A plurality of sets of light guide means (12) and scintillators (11) attached to the light guide means (12) are provided, and each of the plurality of sets of scintillators (11) is in the vertical direction of the light guide means (12). It is characterized by being arranged one-dimensionally in the longitudinal direction of the portion extending to.

According to this, the incident surface (12c) provided at one end portion (12a) of the rod-shaped light guide means (12) is changed to the exit surface (12d) provided at the other end portion (12b) of the light guide means (12). After the light incident from the incident surface (12c) is reflected by the reflecting surface (12e), the light is emitted through a portion extending in a direction perpendicular to the emitting surface (12d). 12d). Therefore, light can be incident on the incident surface (12c) from a direction parallel to the exit surface (12d) of the light guide means (12) .
Therefore, it is possible to make light incident on the light guide means (12) by reducing the length in the direction perpendicular to the incident surface (12c). Thereby, the radiation probe can be arranged even in a narrow place where the length cannot be secured in the direction in which the radiation is emitted from the radiation source (52). Thus, even in a narrow place, radiation measurement can be performed without being limited by the size of the place.
In the first aspect of the invention, the light incident from the incident surface (12c) in the direction perpendicular to the incident surface (12c) is totally reflected by the reflecting surface (12e). ) Can be improved by the reflecting surface (12e).
Moreover, in invention of Claim 1, it has two or more sets of the light guide means (12) and the scintillator (11) attached to this light guide means (12), and each of this set of scintillators (11) Can be measured one-dimensionally (one-way) distribution of radiation.
Moreover, in the one-dimensional arrangement of the plurality of sets of scintillators (11), the plurality of scintillators (11) are disposed in the longitudinal direction of the portion extending in the direction perpendicular to the exit surface (12d) of the light guide means (12). Since it is arranged, the entire shape of the radiation probe having a plurality of sets of scintillators (11) has a configuration in which there is no portion protruding in a direction perpendicular to the longitudinal direction of the radiation probe 10, that is, a rod-shaped compact configuration. It is possible.
Furthermore, in invention of Claim 1, the light guide means (12) is comprised with the acrylic resin, This acrylic resin is excellent in workability. For this reason, even if it is necessary to form the light guide means (12) in the form of a bar that is refracted by the reflecting surface (12e), the refractive shape of the light guide means (12) is reduced by an acrylic resin with good workability. Can be easily obtained.

In the invention described in claim 2, in the radiation probe according to claim 1, the light guide means (12) has one end portion is connected to the anti-reflecting surface (12e) and (12a) and the reflective surface (12e) The incident-side reflecting surface (12f ) disposed between the two is provided.

  Thus, by providing the light guide means (12) with a plurality of reflecting surfaces (12e, 12f), the traveling direction of the light traveling in the light guide means (12) can be bent. Therefore, radiation measurement can be performed even in a narrow place where the length cannot be secured in the direction in which the radiation is emitted from the radiation source (52). Moreover, the condensing efficiency of the light guide means (12) can be improved by the plurality of reflecting surfaces (12e, 12f).

The invention according to claim 3 is characterized in that the radiation probe according to claim 1 or 2 further comprises a metal case (13) that covers the light guide means (12) to which the scintillator (11) is attached. To do. Thereby, noise from the outside can be blocked.

According to a fourth aspect of the present invention, in the radiation probe according to any one of the first to third aspects, a reflecting material is provided on a side surface of the light guide means (12). Thereby, the condensing efficiency of a light guide means (12) can be improved.

And like invention of Claim 5 , the radiation probe as described in any one of Claim 1 thru | or 4, and the light inject | emitted from the output surface (12d) of the light guide means (12) of a radiation probe Is converted into electrons and amplified, and the multiplying means (20) for converting the amplified electrons into light corresponding to the amount of the electrons, and the photographing means (30) for photographing the light emitted from the multiplying means (20) ) And image processing means (40) for processing the image photographed by the photographing means (30).

  By using this radiation measuring apparatus, radiation measurement can be performed even in a place where the length cannot be secured in the direction in which the radiation is emitted from the radiation source.

  In addition, the code | symbol in the bracket | parenthesis of each said means shows the correspondence with the specific means as described in embodiment mentioned later.

  Hereinafter, embodiments of the present invention will be described with reference to the drawings. In the following embodiments, the same or equivalent parts are denoted by the same reference numerals in the drawings.

(First embodiment)
Hereinafter, a first embodiment of the present invention will be described with reference to the drawings. The radiation measuring apparatus shown below is used for measuring radiation emitted from a radiation source. It is particularly suitable for radiation measurement in a narrow place.

  FIG. 1 is an overall configuration diagram of a radiation measuring apparatus according to the first embodiment of the present invention. As shown in this figure, the radiation measurement apparatus includes a radiation probe 10, a multiplication unit 20, a CCD camera 30, and an image processing device 40.

  The radiation probe 10 detects radiation emitted from a radiation source. When the radiation probe 10 detects radiation, the radiation probe 10 is configured to acquire the radiation as light corresponding to the radiation energy. The radiation probe 10 is attached to the multiplication unit 20. The configuration of the radiation probe 10 will be described in detail later.

  The multiplication unit 20 is for multiplying the intensity of light detected by the radiation probe 10. Specifically, the multiplication unit 20 applies light emitted from the radiation probe 10 to the photocathode, converts it to electrons, amplifies the light, and applies the amplified electrons to the phosphor screen, thereby depending on the amount of the amplified electrons. Convert to light.

  The CCD camera 30 captures the light amplified by the multiplication unit 20. The CCD camera 30 is attached to the multiplication unit 20 and photographs the light emitted from the multiplication unit 20.

  The image processing device 40 has a function of capturing an image photographed by the CCD camera 30 and performing image processing. The image processing apparatus 40 performs various processes such as noise processing of captured images, addition / subtraction processing of a large number of images, and image storage. As the image processing apparatus 40, a general personal computer or the like is used. The above is the overall configuration of the radiation measuring apparatus according to the present embodiment.

  Next, the configuration of the radiation probe 10 will be described. FIG. 2 is an enlarged cross-sectional view of the radiation probe 10. As shown in this figure, the radiation probe 10 includes a scintillator 11, an optical waveguide 12, and a metal case 13.

  The scintillator 11 is a radiation-light converter that converts radiation into light. Specifically, the scintillator 11 is a fluorescent plate that emits light by absorbing the radiation energy when irradiated with radiation. This light is radiated in all directions radially about one point in the scintillator 11. In the present embodiment, a 2 mm square plate is used.

  The optical waveguide 12 guides light from one to the other. FIG. 3 is a diagram showing a structure in which the scintillator 11 is attached to one optical waveguide 12. As shown in this figure, the optical waveguide 12 has one end 12a and the other end 12b. In the present embodiment, one optical waveguide 12 has a 2 mm square bar shape.

  In addition, an incident surface 12c through which light is incident is provided at one end 12a of the optical waveguide 12, and an exit surface 12d through which light is emitted is provided at the other end 12b. The incident surface 12 c is one end surface of the rod-shaped optical waveguide 12, and the exit surface 12 d is the other end surface of the rod-shaped optical waveguide 12.

  The entrance surface 12c has an angle with respect to the exit surface 12d. Specifically, as shown in FIG. 3, the incident surface 12c is disposed perpendicular to the exit surface 12d. For this reason, a part between the one end portion 12a and the other end portion 12b of the optical waveguide 12 is bent so that the incident surface 12c and the exit surface 12d are perpendicular to each other.

  The material of the optical waveguide 12 is, for example, acrylic resin. Since the acrylic resin is a material that can be easily bent and processed, the optical waveguide 12 having a shape as shown in FIG. 3 can be easily made. As a method of forming the optical waveguide 12, there are a method of bending a rod-shaped acrylic resin and a method of cutting one block into the shape of the optical waveguide 12. On the other hand, the optical waveguide 12 can be obtained by molding an acrylic resin.

  A reflective material is provided on the side surface of the optical waveguide 12. As the reflecting material, for example, a metal foil or a metal deposition film is employed. As the metal, Al (aluminum) having high reflection efficiency is employed. By performing such a reflective material treatment, leakage of light transmitted through the optical waveguide 12 can be prevented. Further, the light collection efficiency in the optical waveguide 12 by the reflecting material is also improved.

  When light is incident from the incident surface 12c, the light is transmitted through the optical waveguide 12 while being reflected at the boundary between the optical waveguide 12 and the outside, and is emitted from the exit surface 12d to the outside of the optical waveguide 12. The Rukoto. As described above, since a part of the optical waveguide 12 is bent, the optical waveguide 12 is provided with a reflecting surface 12e so that light can be guided from the one end 12a side to the other end 12b side at the bent portion. Yes.

  The reflecting surface 12e is inclined with respect to the incident surface 12c and the exit surface 12d, and plays a role of reflecting the light incident from the incident surface 12c and guiding it to the other end 12b side. Further, the light transmitted from the one end portion 12 a side to the other end portion 12 b side of the optical waveguide 12 is prevented from leaking outside the optical waveguide 12 without being reflected by the bent portion.

  The reflecting surface 12e is inclined with respect to the incident surface 12c at an angle that totally reflects light incident from the incident surface 12c in a direction perpendicular to the incident surface 12c. Specifically, since light incident at 42 ° or more is totally reflected at the interface between the acrylic resin and air, the reflecting surface 12e is inclined at 42 ° or more with respect to the incident surface 12c. In the present embodiment, the reflecting surface 12e is inclined at an angle of 45 ° with respect to the incident surface 12c.

  FIG. 4 is an enlarged view of the vicinity of one end 12 a of the optical waveguide 12. As described above, when the scintillator 11 is irradiated with radiation, light is radiated in all directions radially around one point in the scintillator 11. Of the light irradiated radially, the light incident from the incident surface 12c in the direction perpendicular to the incident surface 12c of the optical waveguide 12 travels in parallel to the longitudinal direction of the one end portion 12a and is reflected by the reflecting surface 12e. The reflected light travels in a direction parallel to the longitudinal direction of the other end 12b.

  In addition, the upper limit of the angle of the reflective surface 12e is less than 90 ° that allows total reflection at the interface between the acrylic resin and air. By providing the reflecting surface 12e at the above angle, it is possible to efficiently reflect the light incident from the incident surface 12c and guide it to the other end 12b side.

  On the other hand, as shown in FIG. 4, among the light emitted radially by the scintillator 11, the light traveling in a direction different from the direction perpendicular to the incident surface 12 c is reflected at the interface between the optical waveguide 12 and air. However, it proceeds in the optical waveguide 12.

  The scintillator 11 is attached to the incident surface 12c of the optical waveguide 12 by an adhesive or the like, and one optical waveguide 12 and the scintillator 11 attached to the optical waveguide 12 constitute one set. In the present embodiment, as shown in FIG. 2, five sets of the optical waveguide 12 and the scintillator 11 are provided.

  Further, as shown in FIG. 2, each set of scintillators 11 is arranged one-dimensionally, and five sets of the optical waveguide 12 and the scintillator 11 are integrated. In the present embodiment, each optical waveguide 12 is bent perpendicularly to the direction in which the optical waveguides 12 are arranged one-dimensionally, and therefore the distance from the one end portion 12a to the bent portion is the respective optical waveguide 12. Is different. For this reason, the image processing apparatus 40 also performs correction according to the length of the optical path of each optical waveguide 12 when performing image processing.

  As shown in FIG. 2, each integrated optical waveguide 12 is covered with a bottomed cylindrical metal case 13. That is, each optical waveguide 12 to which the scintillator 11 is attached is in a state of being housed in the metal case 13 except for the respective exit surface 12d.

  The metal case 13 serves to protect the scintillator 11 and the optical waveguide 12 from the outside. Moreover, since the light emitted by the scintillator 11 is weak light, it is easily affected by external noise. However, noise from the outside can be blocked by covering the optical waveguide 12 with the metal case 13. As the material of the metal case 13, SUS, Al or the like is adopted.

  As shown in FIG. 2, a connection portion 13 a is provided in the opening of the metal case 13. An attachment member (not shown) provided with a screw portion is attached to the connection portion 13a, and the metal case 13 is screwed to the multiplication unit 20 via the attachment member.

  The size of the metal case 13 is a size that accommodates five 2-mm square optical waveguides 12 arranged one-dimensionally, for example, 11 to 12 mm × 3 mm × 90 to 150 mm. The above is the configuration of the radiation probe 10.

  Next, a method of measuring radiation with the radiation measuring apparatus provided with the radiation probe 10 will be described with reference to FIG. In FIG. 5, only the radiation probe 10 of the radiation measuring apparatus is illustrated. Further, the metal case 13 and the optical waveguide 12 of the radiation probe 10 are omitted.

  As shown in FIG. 5, there is a housing 50 provided with a hole 51 connected to the outside of the housing 50. The hole 51 forms a linear space in the housing 50.

In addition, a radiation source 52 serving as an object to be measured is disposed on the side of the hole 51 in the housing 50. The radiation source 52 emits radiation such as ⁵⁶ Co or ⁶⁵ Zn.

  Whether radiation is emitted from such a radiation source 52 is measured. Specifically, the radiation measuring apparatus shown in FIG. 1 is prepared, and the radiation probe 10 is inserted into the hole 51 of the housing 50.

  Then, the scintillator 11 of the radiation probe 10 and the radiation source 52 are opposed to each other. At this time, it is best to bring the metal case 13 into contact with the radiation source 52. The scintillator 11 is moved as close as possible to the radiation source 52 for the moving radiation source 52 or the one that is difficult to approach depending on the structure in the housing 50.

  If radiation is emitted from the radiation source 52, the radiation passes through the metal case 13 and enters the scintillator 11. Thereby, the scintillator 11 absorbs radiation energy and emits light. This light is irradiated into the optical waveguide 12 from the incident surface 12 c of the optical waveguide 12, is transmitted through the optical waveguide 12, is emitted from the exit surface 12 d, and enters the multiplication unit 20.

  Thereafter, light is converted into electrons and amplified by the multiplication unit 20, and the amplified electrons are converted into light again. This light is photographed by the CCD camera 30, and the photographed image is taken into the image processing device 40.

  The image processing apparatus 40 performs imaging by performing noise processing and the like in consideration of interference based on the distance between the radiation source 52 and the scintillator 11. Thereby, if radiation is emitted from the radiation source 52, an image displaying the distribution is obtained, and if no radiation is emitted, an image displaying nothing is obtained. In this way, radiation measurement is completed.

  As described above, even when the radiation probe 10 can be disposed only in the hole 51 of the housing 50, radiation measurement can be performed. That is, the hole 51 is a narrow place where the length in the longitudinal direction can be secured, but the length cannot be secured in the direction in which the radiation is emitted from the radiation source 52. However, as shown in the present embodiment, by using the radiation probe 10 in which the scintillator 11 is arranged in parallel to the longitudinal direction of the hole 51, it is not possible to secure a length in the direction in which radiation is emitted from the radiation source 52. Even at a place, the radiation probe 10 can capture radiation.

  As described above, the present embodiment is characterized in that the incident surface 12 c is provided perpendicular to the exit surface 12 d in the optical waveguide 12. This makes it possible to guide light into the optical waveguide 12 by reducing the length in the direction perpendicular to the incident surface 12c. Therefore, the radiation probe 10 can be arranged and radiation measurement can be performed even in a narrow place where the length cannot be secured in the direction in which the radiation is emitted from the radiation source 52.

  In the present embodiment, the incident surface 12 c is disposed perpendicular to the exit surface 12 d, and each scintillator 11 is disposed one-dimensionally in the longitudinal direction of the radiation probe 10. For this reason, it is possible to configure the radiation probe 10 as a whole without a portion protruding in a direction perpendicular to the longitudinal direction of the radiation probe 10, that is, in a rod shape. Therefore, the radiation probe 10 can be inserted into a narrow space such as the hole 51. Thus, even in a narrow place, radiation measurement can be performed without being limited by the size of the place where the radiation probe 10 is arranged.

  As for the correspondence between the description of the present embodiment and the description of the claims, the multiplication unit 20 corresponds to the multiplication means of the claims, and the CCD camera 30 corresponds to the imaging means of the claims. Equivalent to. The image processing device 40 corresponds to the image processing means in the claims, and the optical waveguide 12 corresponds to the light guide means in the claims.

(Second Embodiment)
In the present embodiment, only different parts from the first embodiment will be described. In the first embodiment, the incident surface 12c of the optical waveguide 12 is arranged perpendicular to the exit surface 12d and a part of the optical waveguide 12 is bent. However, in the present embodiment, the optical waveguide 12 is It is characterized by being linear. Of course, the incident surface 12c has an angle with respect to the exit surface 12d.

  FIG. 6A is an enlarged cross-sectional view of the radiation probe 10 according to the present embodiment. As shown in this figure, the incident surface 12c of each optical waveguide 12 is inclined with respect to the exit surface 12d, but each optical waveguide 12 has an exit surface of the other end portion 12b from the incident surface 12c of the one end portion 12a. Up to 12d is configured linearly. The scintillator 11 is attached to the incident surface 12c.

  The incident surface 12c is inclined at an angle of, for example, 20 ° to 30 ° with respect to the exit surface 12d. Moreover, since each incident surface 12c is inclined with respect to the direction in which each optical waveguide 12 was arranged in one dimension, each optical waveguide 12 becomes long in order. As in the first embodiment, each optical waveguide 12 to which the scintillator 11 is attached is housed in a metal case 13.

  FIG. 6B is a diagram illustrating a state in which radiation measurement is performed using the radiation probe 10 illustrated in FIG. As shown in FIG. 6B, a linear hole 51 is provided in the housing 50. The radiation source 52 is disposed in the housing 50 near the bottom of the hole 51. The bottom surface of the hole 51 is inclined at, for example, 20 to 30 ° with respect to the longitudinal direction of the hole 51.

  In such a situation, when the radiation probe 10 shown in FIG. 6A is inserted into the hole 52, the scintillator 11 is disposed to face the radiation source 52. Thereby, radiation measurement is performed by the radiation probe 10.

  As described above, even if the optical waveguide 12 is linear, the incident surface 12c is inclined with respect to the exit surface 12d. For this reason, it is possible to arrange the scintillator 11 so as to face the radiation source 52 even when a location cannot be secured in a direction perpendicular to the incident surface 12c.

(Third embodiment)
In the present embodiment, only parts different from the first and second embodiments will be described. In the first and second embodiments, the scintillator 11 is arranged one-dimensionally. However, the present embodiment is characterized in that it is arranged two-dimensionally.

  FIG. 7 is a perspective view of the radiation probe 10 according to the present embodiment. In FIG. 7, only the outline of the metal case 13 is drawn.

  As shown in this figure, the radiation probe 10 is provided with a plurality of sets of an optical waveguide 12 and a scintillator 11 attached to the optical waveguide 12. Each set of scintillators 11 is two-dimensionally arranged.

  In the present embodiment, the two-dimensional structure shown in FIG. 7 is configured by arranging a plurality of the one-dimensional arrangements shown in FIG. 2 in the direction perpendicular to the paper surface. As a result, 25 scintillators 11 are two-dimensionally arranged. As described above, the two-dimensional distribution of radiation can be measured by arranging the scintillators 11 two-dimensionally. Further, it is possible to improve the resolution when measuring the radiation distribution.

(Other embodiments)
In each of the embodiments described above, the radiation probe 10 is configured to include a plurality of optical waveguides 12, but the radiation probe 10 may be configured by a single optical waveguide 12 and the scintillator 11. In this case, the incident surface 12c of the optical waveguide 12 may be inclined with respect to the exit surface 12d.

  Further, not only five optical waveguides 12 may be arranged in one dimension, but two or six or more may be arranged. Similarly, when the optical waveguides 12 are arranged two-dimensionally, the arrangement is not limited to 5 × 5 but may be 3 × 3, 7 × 7, 3 × 5.

  In each of the above-described embodiments, a 2 mm square rod is shown as the optical waveguide 12, but the size of the optical waveguide 12 is not limited to this, and a 1 mm square or 2.5 mm square may be used. Further, the cross section of the optical waveguide 12 is not limited to a square, but may be a rectangular one. For example, the optical waveguide 12 may have a cross section of 1 mm × 2 mm.

  The optical waveguide 12 shown in each of the above embodiments has a rod shape, but may be a tubular shape such as an optical fiber.

  In each of the above embodiments, the radiation probe 10 is fixed to the multiplication unit 20 by attaching an attachment member (not shown) to the connection portion 13a of the metal case 13, but the metal case 13 is attached to the multiplication unit 20 by other means. May be. For example, the connection part 13 a of the metal case 13 may be directly attached to the multiplication unit 20.

  In each said embodiment, although the optical waveguide 12 was comprised with the acrylic resin, it can also comprise with quartz glass. Since quartz glass is resistant to temperature, even if the radiation probe 10 is arranged in the high-temperature housing 50, radiation measurement can be prevented.

  The form of the bent portion of the optical waveguide 12 for guiding the light incident from the incident surface 12c to the exit surface 12d is not limited to that shown in FIG. 3, but may be another form. This will be described with reference to FIGS. 8 to 11 are enlarged views of one optical waveguide 12 on one end portion 12a side.

  As shown in FIG. 8A, the incident surface 12c may be disposed on the side surface of the optical waveguide 12, and the reflecting surface 12e may be connected to the incident surface 12c. As shown in FIG. 8B, a part of the optical waveguide 12 is bent vertically, but the reflection surface 12e may be connected to the incident surface 12c. Of course, it is preferable that the angle of the reflecting surface 12e is an angle at which light is totally reflected. In particular, when the reflecting surface 12e is inclined at 45 ° with respect to the incident surface 12c, as shown in FIG. 8A, light incident on the optical waveguide 12 perpendicular to the incident surface 12c is reflected on the reflecting surface. The light is reflected at a right angle by 12e and directly led to the exit surface 12d.

  Further, as shown in FIG. 9, the light guide 12 may be provided with a reflection surface 12 e and an incident-side reflection surface 12 f at a bent portion. The incident-side reflection surface 12f is connected to the reflection surface 12e and is disposed between the one end portion 12a and the reflection surface 12e. The reflecting surface 12e is inclined at 45 ° with respect to the incident surface 12c. The angle of the reflecting surface 12e is an example, and is not limited to 45 °, and may be any angle that allows total reflection of light as described above.

  As described above, by providing the optical waveguide 12 with the plurality of reflecting surfaces 12e and 12f, the light collection efficiency of the optical waveguide 12 can be improved.

  On the other hand, as shown in FIG. 10, a right-angle portion 12 h that connects the one end portion 12 a and the other end portion 12 b of the optical waveguide 12 at a right angle is provided between the one end portion 12 a and the other end portion 12 b of the optical waveguide 12. It may be done. According to this, both the angle formed by the one end portion 12a and the right angle portion 12h and the angle formed by the other end portion 12b and the right angle portion 12h are 45 °. By providing such a right-angled portion 12h, the incident surface 12c can be easily tilted with respect to the exit surface 12d. Further, the light incident in the optical waveguide 12 perpendicular to the incident surface 12c can be totally reflected by the right angle portion 12h and guided to the other end portion 12b side.

  Then, as shown in FIG. 11, between the one end portion 12a and the other end portion 12b of the optical waveguide 12, the light traveling in the direction perpendicular to the incident surface 12c is bent at an angle at which it is totally reflected. A bent portion 12i may be provided. In this case, a shape in which one portion of the optical waveguide 12 is bent as shown in FIG. 11A or a shape in which a plurality of locations as shown in FIG. The light is reflected by the bent portion 12i, whereby the light collection efficiency of the light guided to the exit surface 12d can be improved.

1 is an overall configuration diagram of a radiation measurement apparatus according to a first embodiment of the present invention. It is an expanded sectional view of a radiation probe. It is the figure which showed what the scintillator was attached to one optical waveguide. It is an enlarged view near one end of the optical waveguide. It is the figure which showed a mode that a radiation was measured. (A) is an expanded sectional view of the radiation probe which concerns on 2nd Embodiment, (b) is the figure which showed a mode that a radiation measurement was performed using the radiation probe shown by (a). It is a perspective view of the radiation probe which concerns on 3rd Embodiment. It is a figure for demonstrating an example of an optical waveguide in other embodiment. It is a figure for demonstrating an example of an optical waveguide in other embodiment. It is a figure for demonstrating an example of an optical waveguide in other embodiment. It is a figure for demonstrating an example of an optical waveguide in other embodiment.

Explanation of symbols

DESCRIPTION OF SYMBOLS 10 Radiation probe 11 Scintillator 12 Optical waveguide 12a One end part 12b Other end part 12c Incident surface 12d Ejection surface 12e Reflective surface 12f Incident side reflective surface 12h Right angle part 12i Bending part 13 Metal case 20 Multiplication unit 30 CCD camera 40 Image processing apparatus

Claims (5)

A scintillator (11) that emits light when irradiated with radiation;
One end (12a) and the other end (12b), the one end (12a) is provided with an incident surface (12c) on which the scintillator (11) is attached and the light is incident; The other end (12b) is provided with an exit surface (12d) through which the light is emitted, and light guide means (12) for guiding the light from the incident surface (12c) to the exit surface (12d). ,
The entrance surface (12c) is disposed perpendicular to the exit surface (12d) ,
The light guiding means (12) is inclined with respect to the incident surface (12c) and the exit surface (12d), reflects the light incident from the incident surface (12c), and reflects the other end (12b). ) Side is provided with a reflecting surface (12e),
The reflecting surface (12e) totally reflects light incident from the incident surface (12c) in a direction perpendicular to the incident surface (12c) of the light,
The light guide means (12) is a rod-shaped member having a portion extending in a direction perpendicular to the emission surface (12d) between the reflection surface (12e) and the emission surface (12d).
The light guide means (12) is made of acrylic resin,
A plurality of sets of the light guide means (12) and the scintillators (11) attached to the light guide means (12) are provided, and each of the scintillators (11) of the plurality of sets is provided with the light guide means (12). The radiation probe is arranged one-dimensionally in the longitudinal direction of the portion extending in the vertical direction . Said light guide means (12) comprises a pre-Symbol reflecting surface the one end is connected to (12e) (12a) and arranged incident side reflecting surface between said reflective surface (12e) (12f) The radiation probe according to claim 1 , wherein: The radiation probe according to claim 1 or 2 , further comprising a metal case (13) that covers the light guide means (12) to which the scintillator (11) is attached. The radiation probe according to any one of claims 1 to 3 , wherein a reflecting material is provided on a side surface of the light guide means (12). A radiation probe according to any one of claims 1 to 4 ,
Multiplier means for converting and amplifying the light emitted from the exit surface (12d) of the light guide means (12) of the radiation probe and converting the amplified electrons into light corresponding to the amount of the electrons. (20) and
Photographing means (30) for photographing light emitted from the multiplication means (20);
A radiation measurement apparatus comprising: an image processing means (40) for processing an image photographed by the photographing means (30).

Images