JP4414771B2 - 共焦点顕微分光装置 - Google Patents
共焦点顕微分光装置 Download PDFInfo
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- JP4414771B2 JP4414771B2 JP2004002886A JP2004002886A JP4414771B2 JP 4414771 B2 JP4414771 B2 JP 4414771B2 JP 2004002886 A JP2004002886 A JP 2004002886A JP 2004002886 A JP2004002886 A JP 2004002886A JP 4414771 B2 JP4414771 B2 JP 4414771B2
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- 239000003153 chemical reaction reagent Substances 0.000 claims description 51
- 239000004065 semiconductor Substances 0.000 claims description 47
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
- G01J3/44—Raman spectrometry; Scattering spectrometry ; Fluorescence spectrometry
- G01J3/4406—Fluorescence spectrometry
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/10—Arrangements of light sources specially adapted for spectrometry or colorimetry
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/0004—Microscopes specially adapted for specific applications
- G02B21/002—Scanning microscopes
- G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
- G02B21/0032—Optical details of illumination, e.g. light-sources, pinholes, beam splitters, slits, fibers
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/0256—Compact construction
Description
請求項9記載の発明は、請求項1から4及び6から8のいずれかに記載の発明において、前記半導体プロセスにより同一チップ上に形成された複数の半導体単色光源の波長差が、1nm以上であることを特徴としている。
図1は、本発明の第1の実施の形態にかかるレーザ走査型共焦点顕微鏡に適用される共焦点顕微分光装置の概略構成を示している。
次に、本発明の第2の実施の形態を説明する。
2a〜2d…LD光源、2e…チップ、3…カプラ
4…基板、5a〜5d…LD駆動部
6…制御部、7…光ファイバ、7a…光入射端、7b…光出射端
8…顕微鏡本体、9…ダイクロイックミラー
10…レーザ走査光学系、11…対物レンズ
12…ステージ、13、131…共焦点検出部
14…バリアフィルタ、15…共焦点レンズ
16…共焦点ピンホール、17…光検出器
18…励起プロファイル、19…蛍光プロファイル
21…レーザ光源部、22.23…励起光源
24…レーザ光合成部、24a…ミラー
24b…ダイクロイックミラー、25…励起プロファイル
26…蛍光プロファイル、27…励起プロファイル
28…蛍光プロファイル
Claims (9)
- 半導体プロセスにより同一チップ上に形成され、一つの蛍光試薬の励起プロファイルの波長領域内で波長の異なる単色光を発生させる複数の半導体単色光源を有した励起光源と、
前記複数の半導体単色光源から前記一つの蛍光試薬の励起プロファイルの領域内での異なる波長の単色光を一つずつ順に切り換えて前記一つの蛍光試薬を含む標本に照射させる半導体光源制御手段と、
前記単色光を前記標本上で走査する走査手段と、
前記単色光の照射により前記一つの蛍光試薬が発生する蛍光プロファイルの領域の蛍光を検出する共焦点検出手段と、
を具備し、
前記標本に照射した単色光ごとに前記一つの蛍光試薬が発生する蛍光の強度を測定することにより蛍光の分光検出を行うことを特徴とした共焦点顕微分光装置。 - 半導体プロセスにより同一チップ上に形成され、第1の蛍光試薬の励起プロファイルの波長領域内で波長の異なる単色光を発生させる複数の半導体単色光源を有した第1の励起光源と、
半導体プロセスにより同一チップ上に形成され、前記第1の蛍光試薬とは異なる第2の蛍光試薬の励起プロファイルの波長領域内で波長の異なる単色光を発生させる複数の半導体単色光源を有した第2の励起光源と、
前記第1の蛍光試薬と前記第2の蛍光試薬を含む標本に、前記第1の励起光源から前記第1の蛍光試薬の励起プロファイルの領域内での異なる波長の単色光を一つずつ順に切り換えて照射させると共に、前記第2の励起光源から前記第2の蛍光試薬の励起プロファイルの領域内での異なる波長の単色光を一つずつ順に切り換えて照射させる半導体光源制御手段と、
前記第1の励起光源及び第2の励起光源からそれぞれ発生する単色光を前記標本上で走査する走査手段と、
前記第1の励起光源からの単色光の照射により前記第1の蛍光試薬が発生する第1の蛍光プロファイルの領域の蛍光を検出する第1の共焦点検出手段と、
前記第2の励起光源からの単色光の照射により前記第2の蛍光試薬が発生する第2の蛍光プロファイルの領域の蛍光を検出する第2の共焦点検出手段と、
を具備し、
前記標本に照射した単色光ごとに前記第1の蛍光試薬及び第2の蛍光試薬がそれぞれ発生する蛍光の強度を前記第1の共焦点検出手段及び第2の共焦点検出手段でそれぞれ測定することにより蛍光の分光検出を行うことを特徴とする共焦点顕微分光装置。 - 前記励起光源は、前記半導体単色光源を同一チップ上にアレイ状に配置し、前記半導体光源から発せられる光を結合するカプラとともに、同一基板上に配置されることを特徴とする請求項1または2記載の共焦点顕微分光装置。
- 前記励起光源がカバーする前記波長領域が、50nm以下であることを特徴とする請求項1または2記載の共焦点顕微分光装置。
- 前記2つ以上の半導体単色光源を持つ波長差が前記50nm以下の波長領域の範囲において1nm以上であることを特徴とする請求項4記載の共焦点顕微分光装置。
- 前記半導体単色光源は、半導体プロセスによって製作された半導体レーザもしくは発光ダイオードであることを特徴とする請求項1または2記載の共焦点顕微分光装置。
- 前記励起光源からの光を前記走査手段と前記共焦点検出手段を備えた顕微鏡本体に伝送する光ファイバを有し、該光ファイバがシングルモードファイバであることを特徴とする請求項1または2記載の共焦点顕微分光装置。
- 前記光ファイバは、偏光面保存型のファイバであることを特徴とした請求項7記載の共焦点顕微分光装置。
- 前記半導体プロセスにより同一チップ上に形成された複数の半導体単色光源の波長差が、1nm以上であることを特徴とする請求項1から4及び6から8のいずれかに記載の共焦点顕微分光装置。
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JP2004002886A JP4414771B2 (ja) | 2004-01-08 | 2004-01-08 | 共焦点顕微分光装置 |
US11/020,456 US7315039B2 (en) | 2004-01-08 | 2004-12-22 | Confocal microspectroscope |
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JP2004002886A JP4414771B2 (ja) | 2004-01-08 | 2004-01-08 | 共焦点顕微分光装置 |
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JP2005195485A JP2005195485A (ja) | 2005-07-21 |
JP2005195485A5 JP2005195485A5 (ja) | 2007-02-22 |
JP4414771B2 true JP4414771B2 (ja) | 2010-02-10 |
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JP3816632B2 (ja) * | 1997-05-14 | 2006-08-30 | オリンパス株式会社 | 走査型顕微鏡 |
US6121603A (en) * | 1997-12-01 | 2000-09-19 | Hang; Zhijiang | Optical confocal device having a common light directing means |
US6355934B1 (en) * | 1999-02-26 | 2002-03-12 | Packard Biochip Technologies | Imaging system for an optical scanner |
US6181474B1 (en) * | 1999-03-22 | 2001-01-30 | Kovex Corporation | Scanning confocal microscope with objective lens position tracking |
JP2001185796A (ja) * | 1999-12-27 | 2001-07-06 | Hitachi Metals Ltd | レーザ装置、その応用装置並びにその使用方法 |
US6423956B1 (en) * | 2000-07-28 | 2002-07-23 | Optical Biopsy Technologies | Fiber-coupled, high-speed, integrated, angled-dual-axis confocal scanning microscopes employing vertical cross-section scanning |
DE10038526B4 (de) | 2000-08-08 | 2004-09-02 | Carl Zeiss Jena Gmbh | Verfahren und Anordnung zur Erfassung des wellenlängenabhängigen Verhaltens einer beleuchteten Probe |
US6858852B2 (en) | 2000-08-08 | 2005-02-22 | Carl Zeiss Jena Gmbh | Method and apparatus for rapid change of fluorescence bands in the detection of dyes in fluorescence microscopy |
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US20050053109A1 (en) * | 2002-06-03 | 2005-03-10 | Josh Hogan | Integrated multiple wavelength system |
DE10225838B4 (de) * | 2002-06-11 | 2021-10-21 | Leica Microsystems Cms Gmbh | Verfahren zur Scanmikroskopie, Scanmikroskop und Vorrichtung zum Codieren eines Beleuchtungslichtstrahles |
US6985224B2 (en) * | 2003-03-14 | 2006-01-10 | The United States Of America As Represented By The Secretary Of The Navy | Light emitting diode (LED) array for excitation emission matrix (EEM) fluorescence spectroscopy |
US7215468B2 (en) * | 2003-07-29 | 2007-05-08 | Olympus Corporation | Confocal microscope |
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