JP4042917B1 - Capacitor power supply abnormality determination method and abnormality determination apparatus - Google Patents

Abstract

An object of the present invention is to easily estimate or measure the degree of deterioration of a capacitor power source to determine abnormality of the capacitor and to predict the life.
The degradation rate and the square root of the degradation time are defined as the degradation time, where the rate of deterioration of the capacitance or internal resistance of the capacitor with respect to the initial value is the degradation level, and the time required for degradation to a predetermined degradation level is defined as the degradation time. Is stored in the reference data storage means 3, the voltage and temperature of the capacitor are measured, the deterioration coefficient is obtained from the reference data storage means 3, and the estimated deterioration degree of the active capacitor is obtained by the estimated deterioration degree calculation means 4. And charging / discharging the capacitor with a constant current, measuring the voltage immediately before and after charging / discharging and during charging / discharging, and determining the actual deterioration degree of the capacitance or internal resistance of the capacitor by the actual deterioration degree calculating means 5, When the difference between the estimated deterioration level and the actual deterioration level is obtained and the difference exceeds the reference value, abnormality of the capacitor is determined by the abnormality determination means 7.
[Selection] Figure 1

Description

  The present invention relates to an abnormality determination method and an abnormality determination device for a capacitor power source that is charged by a charging power source or a regenerative electric power of a load, discharged from the charged capacitor according to a power feeding request of the load, and used by repeated charging and discharging.

  A capacitor power source composed of a plurality of electric double layer capacitors is charged by a charging power source or a regenerative electric power of a load, and is discharged by a power supply request of the load. The capacitor has a characteristic deterioration of the capacitance C and the internal resistance r with repeated use of charging and discharging, and the life is reached when the degree of deterioration of the capacitance C or the internal resistance r reaches a predetermined design value. In order to take measures such as replacing a capacitor before the system that receives power from the capacitor power supply suddenly stops due to the deterioration and life of the capacitor, the degree of deterioration in a normal use environment is estimated or measured. Therefore, it is necessary to determine the abnormality of the capacitor and predict the lifetime.

For capacitors that use capacitors, a method is proposed to derive an equivalent circuit model of the capacitor by inputting frequency characteristics, forming an equivalent circuit model, synthesizing its evaluation function, and determining circuit constants that minimize the evaluation function. (For example, refer to Patent Document 1). Also, for power storage devices such as primary batteries, secondary batteries, and capacitors, voltage characteristics are measured while charging / discharging, and characteristic impedance spectra for a predetermined frequency region are measured to identify a nonlinear equivalent circuit model. A method for quantifying the factor has been proposed (see, for example, Patent Document 2).
JP 2002-259482 A Japanese Patent No. 3190313

  However, although the above-mentioned conventional technology can simulate a capacitor power supply, it is possible to determine the abnormality of the capacitor by estimating or measuring the degree of deterioration of the capacitor power supply used in a normal load circuit. It is impossible to determine the abnormality of the capacitor power supply while predicting the life or performing the estimation or prediction.

  The voltage of the secondary battery does not fluctuate very much due to charging / discharging, while the voltage of the capacitor power supply greatly fluctuates up and down according to charging / discharging, so how much capacitance is required to secure the desired amount of power. It is difficult to see if a capacitor power supply is required. Capacitor power supplies have a higher output density than secondary batteries and are expected to be applied to applications that charge and discharge large amounts of power in a short time. However, the degree of deterioration varies depending on the operating voltage and operating conditions. . Therefore, when the service life is set according to a standard design, there is a problem that sufficient performance is still left even when the service life is expired depending on the operating voltage and use state, resulting in waste and difficulty in designing. In other words, when the expiration of the life is determined according to the design, the capacitor power supply that remains usable is discarded wastefully.

  The present invention solves the above-described problem, and makes it possible to easily estimate or measure the degree of deterioration of a capacitor power source to determine abnormality of the capacitor and to predict the lifetime.

For this purpose, the present invention is a capacitor power supply abnormality determination method in which a capacitor is charged by a regenerative power of a charging power supply or a load, discharged from the charged capacitor according to a power feeding request of the load, and used by repeated charging and discharging, the ratio of the square root of the previous SL deterioration degree of degradation time and the time required for the electrostatic capacitance or internal resistance of the capacitor is deteriorated to a predetermined degree of deterioration and deterioration degree the rate of degradation with respect to the initial value as the deterioration time as deterioration coefficient has the deterioration coefficient given by the voltage and temperature of the capacitor as a parameter to the reference data, by measuring the voltage and temperature of the capacitor during operation, deterioration coefficient corresponding to the voltage and temperature as the measuring said acquired from the reference data by integrating seeking estimate the degree of deterioration of the capacitor in service every time, by measuring the current and voltage by the charging or discharging of the capacitor and, Determine the actual deterioration degree of the capacitance of the capacitor from the amount of stored electricity and the change in voltage calculated based on the measured current and voltage, or charge or discharge the capacitor with a constant current for a predetermined time. The voltage and current immediately before and after and during charging or discharging are measured, the actual deterioration degree of the capacitance or internal resistance of the capacitor is obtained based on the measured voltage and current, and the integrated estimated deterioration degree and the actual deterioration degree are obtained. A difference from the degree of deterioration is obtained, and when the difference exceeds a reference value, abnormality of the capacitor is determined.

Further, the capacitor power supply abnormality determination device is provided by charging a capacitor with a regenerative power of a charging power supply or a load, discharging the charged capacitor in response to a power feeding request of the load, and being used by repeated charging and discharging. as a ratio degradation coefficient between the square root of the previous SL deterioration degree of degradation time and the deterioration time period required to degrade and the percentage degradation of the capacity or the internal resistance is deteriorated with respect to the initial value to a predetermined degree of deterioration the reference data storing means for storing the deterioration coefficient given by the voltage and temperature of the capacitor and the parameters as degradation estimation reference data, by measuring the voltage and temperature of capacitor running, voltage and temperature as the measuring an estimated deterioration degree calculating means for estimating the degree of deterioration of the capacitor during operation is obtained from the reference data storing means degradation coefficient values are accumulated evaluated at every time in accordance with the Capacitor or internal resistance of the capacitor based on the measured voltage and current by measuring the voltage immediately before and immediately after the charging or discharging and during the charging or discharging by charging or discharging the capacitor with a constant current for a certain time. An actual deterioration degree calculating means for obtaining an actual deterioration degree of the battery, an abnormality determining means for obtaining a difference between the accumulated estimated deterioration degree and the actual deterioration degree and determining an abnormality of the capacitor when the difference exceeds a reference value; It is provided with.

  Further, the estimated deterioration degree calculating means obtains a predicted life by a deterioration time from the estimated deterioration degree and the deterioration time to a predetermined deterioration degree as a life by obtaining an average deterioration coefficient in the deterioration time, The average deterioration coefficient is obtained by a deterioration time specifying a certain time from the time when the estimated deterioration degree is obtained, and the estimated deterioration degree calculating means is set in the reference data for deterioration estimation. It is characterized in that a deterioration coefficient with respect to no intermediate voltage and temperature is obtained by interpolation calculation based on previous and subsequent data.

  According to the present invention, the voltage and temperature during operation are measured, and the estimated deterioration degree of the capacitor is obtained from the measurement data, and the actual deterioration degree of the capacitance or internal resistance is directly obtained from the measurement data of the charge / discharge amount by the deterioration inspection. And determine the anomaly by comparing the estimated degradation level with the actual degradation level, so when the actual degradation level is remarkably worsening or when degradation is accelerating due to some unexpected factor The abnormality can be easily determined. Furthermore, since the estimated life based on the estimated deterioration degree is obtained, the deterioration degree according to the operating voltage and temperature can be estimated and the life can be predicted, and the reliability of the capacitor power supply can be improved and the utilization efficiency can be improved.

  Hereinafter, embodiments of the present invention will be described with reference to the drawings. FIG. 1 is a diagram illustrating an embodiment of a capacitor power supply abnormality determination device according to the present invention, and FIG. 2 is a diagram illustrating a configuration example of a capacitor power supply system including the capacitor power supply abnormality determination device according to the present embodiment. In FIG. 1, 1 is measurement data for deterioration estimation, 2 is measurement data for deterioration inspection, 3 is reference data for deterioration estimation, 4 is an estimated deterioration degree calculation processing unit, 5 is a deterioration degree calculation processing unit, and 6 is a life prediction process. , 7 is an abnormality determination processing unit, 8 is a predicted life output unit, 9 is an abnormality determination output unit, 10 is an abnormality determination device, 11 is a charge / discharge converter, 12 is a current sensor, 13 is a voltmeter, and 14 is a thermometer. , 15 indicate capacitor banks.

In the capacitor power supply abnormality determination device according to the present embodiment shown in FIG. 1, the deterioration degree (deterioration rate) of the capacitor power supply that deteriorates from time to time due to repeated use of charge and discharge based on data obtained by measuring operating voltage V and temperature T. Estimate D _E. On the other hand, obtaining a more real deterioration degree D _R of the capacitor power supply based on the data measured capacitance C, and the internal resistance r by deterioration check mode under certain conditions. Then, an abnormality determination of the capacitor power supply by determining by comparing the estimated deterioration degree D _E and the actual deterioration degree D _R. Further, a life prediction from the estimated deterioration degree D _E to a predetermined deterioration degree as a life is performed.

  In FIG. 1, measurement data 1 for estimation of deterioration is obtained by measuring the operating voltage V and temperature T in consideration of the degree of progress of capacitor deterioration depending on the operating voltage V and temperature T. It is a storage unit that stores data for deterioration estimation. The measurement data 2 for deterioration inspection is data for inspecting the actual deterioration degree with the capacitance C and the internal resistance r, and the voltage V and current I associated with charging / discharging of the capacitor power supply are measured and the measurement data is inspected for deterioration. This is a storage unit that stores data for use. The degradation estimation reference data 3 is a storage unit that stores data for obtaining the degradation coefficient α using the voltage V and the temperature T as parameters.

The degree of deterioration D is a ratio indicating how much the capacitance C deteriorates with time from the initial value (100%) by using the capacitor. When the deterioration time t required for deterioration to the deterioration degree D is assumed, the deterioration degree D is proportional to the square root of the deterioration time t. The ratio of the degradation degree D and the square root of the degradation time t shows a constant value depending on temperature and voltage, and this is regarded as the degradation coefficient α.
[Equation 1]
α = D / √t
Is represented by Therefore, as the deterioration coefficient α increases, the degree of deterioration D at the same deterioration time t increases, and the life of the capacitor decreases.

The speed of the chemical reaction in the capacitor greatly varies depending on the temperatures T _a and T _r (> T _a ), and the degradation time t required for degradation to the same degradation degree D increases as the temperature decreases in proportion to the temperature difference. Become. Further, the deterioration time t required for deterioration to the same deterioration degree D also becomes longer with respect to the voltage V as the voltage is lower. That is, if the temperature or voltage is lowered, the deterioration time t becomes longer and the life is extended.

The estimated deterioration degree calculation processing unit 4 estimates the deterioration degree D _E from the capacitor voltage V, temperature T, and operation time t measured during operation and stored in the deterioration estimation measurement data 1. Here, the deterioration coefficient α corresponding to the voltage V and the temperature T is acquired from the deterioration estimation reference data 3, and the per-time basis is obtained by multiplying the square root of the operating time t developed from the relational expression [Equation 1]. The degree of deterioration is obtained and integrated, and the degree of deterioration _DE so far is estimated. The deterioration degree calculation processing unit 5 calculates the actual capacitance based on the charge / discharge amount and the voltage fluctuation amount associated with the charge / discharge based on the voltage V and current I measured in the deterioration inspection mode and stored in the measurement data 2 for deterioration inspection. C, the actual deterioration degree D _R from the initial value is obtained by obtaining the internal resistance r.

The lifetime prediction processing unit 6 deteriorates from the deterioration degree D _E estimated by the estimated deterioration degree calculation processing unit 4 to a predetermined deterioration degree D _L , for example, a deterioration degree of 20%, that is, a value of 80% from the initial value of deterioration. The deterioration time t _L required for deterioration until the lifetime is predicted as the lifetime. In this life prediction, the average deterioration coefficient α is obtained from the estimated deterioration degree D _E and the corresponding deterioration time t, and the deterioration time t _L required for deterioration to the predetermined deterioration degree D _L is calculated using the average deterioration coefficient α. Life is assumed. Alternatively, as will be described later, the average deterioration coefficient is obtained from a certain deterioration time and the degree of deterioration in the meantime, that is, the average deterioration coefficient is obtained at the deterioration time specified from the time when the estimated deterioration degree is obtained. Using the average degradation coefficient, the degradation time required for degradation to a predetermined degradation level is defined as the lifetime. The predicted life output unit 8 outputs this predicted life.

The abnormality determination processing unit 7 determines whether or not the actual deterioration degree D _R obtained by the deterioration degree calculation processing unit 5 corresponding to the deterioration degree D _E estimated by the estimated deterioration degree calculation processing unit 4 indicates an abnormal value. Determine. Originally, the estimated deterioration degree D _E is obtained by using the deterioration coefficient α set with the capacitor voltage V and temperature T as parameters and sequentially estimating and integrating the deterioration degree during the operation of the capacitor. On the other hand, when the actual deterioration degree D _R obtained by the deterioration degree calculation processing unit 5 greatly deviates, it is determined that the capacitor does not indicate the designed expected value, that is, is a capacitor in an abnormal state. Therefore, in this determination, for example, when the difference between the estimated deterioration level D _E and the actual deterioration level D _R becomes larger than a certain value, an abnormality is determined. The abnormality determination output unit 9 outputs the result of the abnormality determination as an alarm, for example.

A capacitor power supply system including a capacitor power supply abnormality determination device according to the present embodiment is configured as shown in FIG. 2, for example. In FIG. 2, the capacitor bank 15 includes a thermometer 14 that detects the temperature T, is charged by the charging power source or the regenerative power of the load through the charging / discharging converter 11, and is discharged according to the power supply request of the load. The current sensor 12 detects the charging / discharging current I of the capacitor bank 15, and the voltmeter 13 detects the voltage V of the capacitor bank 15. The abnormality determination device 10 monitors and controls the charge / discharge converter 11 with the control signal Sg, takes in the respective measurement data from the current sensor 12, the voltmeter 13, and the thermometer 14 and stores them in the storage unit as described above. Then, the estimated deterioration degree D _E , the actual deterioration degree D _R , and the predicted life t _L are obtained, and abnormality determination is performed.

The abnormality determination device 10 is a capacitor power supply abnormality determination device according to the present embodiment having the configuration shown in FIG. 1, and takes in a control signal of the charge / discharge converter 11 and monitors its operation. Further, the charge / discharge converter 11 is controlled in order to charge or discharge (pulse charge or discharge) the capacitor bank 15 at a constant time by the control signal Sg in the deterioration inspection mode. Furthermore, during operation, for example, the measurement data of the voltage V, the charging / discharging current I, and the temperature T of the capacitor bank 15 are taken in periodically according to a certain time interval. In the deterioration inspection mode, the measurement data of the voltage V immediately before and after charging or discharging, the voltage V when the predetermined time has elapsed after starting charging or discharging, and the current I are captured. Then, based on the measurement data, an estimated deterioration degree D _E , an actual deterioration degree D _R , a predicted life t _L , an abnormality determination calculation process are performed, and a result is output.

  Further, various data, deterioration coefficient, and abnormality determination of the abnormality determination device for the capacitor power supply according to the present embodiment will be specifically described. FIG. 3 is a diagram showing a configuration example of measurement data and reference data, FIG. 4 is a diagram for explaining measurement data for determining the voltage, current waveform, and actual degradation degree of pulse discharge by constant current, and FIG. 5 is a degradation coefficient of the capacitor. FIG. 6 is a diagram for explaining an abnormality determination of the capacitor power supply based on the degree of deterioration.

The degradation estimation measurement data 1 necessary for estimating the degradation degree D _E in accordance with the operating conditions and predicting the life t _L is, for example, times t _E011 , t _E012 ,... As shown in FIG. .. And data of voltages V _E011 , V _E012 ,..., Temperatures T _E011 , T _E012,. The time may or may not be a constant interval.

In the deterioration inspection mode, the deterioration inspection measurement data 2 necessary for obtaining the actual deterioration degree D _R by charging or discharging the capacitor bank 15 at a constant time for a predetermined time is, for example, immediately before the start of charging as shown in FIG. At a certain time t _ss01 , a voltage V _ss01 measured at that time, a charging start time _{ds 01} , a predetermined time elapsed after starting charging t _ds02 , a voltage V _ds02 measured at that time, a current I _d0 , a charging end time t _de01 The data of a certain time t _se01 immediately after the end of charging and the voltage V _se01 measured at that time are stored.

The deterioration estimation reference data 3 referred to in order to estimate the deterioration degree D _E from the deterioration estimation measurement data 1 is, for example, a deterioration coefficient given by using the voltage V and the temperature T as parameters as shown in FIG. It is the data of α. The deterioration coefficient α is a ratio between the deterioration degree D and the square root of the deterioration time t, and is a coefficient that decreases as the voltage V decreases and decreases as the temperature T decreases as described above. Therefore, in the example of the table in FIG. 3C, α ₁₁ is the smallest, α ₄₅ is the largest, and the coefficient tends to increase toward the right and downward in the figure. When the deterioration coefficient α is shown in FIG. 5, the steep deterioration coefficient α indicated by the dotted line is larger than the gentle gradient deterioration coefficient α. The reference data 3 for deterioration estimation is obtained as a look-up table LUT having parameters of the voltage V and the temperature T as shown in FIG. Can be used to select and read a deterioration coefficient α close to. However, when the increments of the voltage V and the temperature T are rough, the deterioration coefficient α may be obtained by performing an interpolating operation on the intermediate voltage V and temperature T from the preceding and succeeding data.

The estimation of the degree of degradation D _E is obtained from the degradation coefficient α and time t by D = α√t, and by integrating this at each time, the degree of degradation D _E at that time is estimated. Therefore, the estimated value at each time can be obtained by connecting and integrating the degree of deterioration for each time as shown in FIG. In FIG. 6, when the measured value is the measured value I indicated by the dotted line with respect to the estimated value of the deterioration degree D _E indicated by the solid line, the capacitor bank 15 is determined to be normal, and in the case of the measured value II, it is determined to be abnormal. Is done. The degree of deterioration for each time may be obtained for each time of the measurement data 1 for deterioration estimation shown in FIG. 3A, but the average voltage and average for a certain time (t _Ei −t _E011 ). You may make it obtain | require the estimated value of deterioration degree with temperature.

Actual deterioration degree D _R, for example time _{Δt d (= t de01 -t ds01} ) of the discharge by a constant current I _d of a predetermined time as shown in FIG. 4 (pulse discharge), pulse discharge voltage of approximately V _SS01, V _seOl The capacitance C and the internal resistance r are _obtained based on the voltage drop width Δv _d (= V _ss01 −V _se01 ), the discharge start time t _ds01 , the predetermined time t _ds02 after the discharge start and the voltage V _ds02 at that time. Can do. At the start of discharge and at the end of discharge, the current and voltage are _rounded as shown in FIG. 4. However, if a predetermined time t _ds02 after the start of discharge and the voltage V _ds02 at that time are used, the current and voltage are not affected by the _round and can be simplified. The internal resistance r can be obtained with high accuracy. The actual deterioration degree D _R is obtained by determining how much the values of the capacitance C and the internal resistance r have deteriorated from the initial values.

For example, the capacitance C is
[Equation 2]
C = I _d × Δt _d / Δv _d
The internal resistance r is
[Equation 3]
r = [{V _ss01 −Δv _d × (t _ds02 −t _ds01 ) / Δt _d } −V _ds02 ] / I _d
It can ask for. From these values, the actual degradation degree D _{RC with} respect to the initial capacitance C ₀ is
[Equation 4]
D _RC = 100 × (C ₀ −C) / C ₀
Similarly, the actual deterioration degree D _{Rr with} respect to the initial internal resistance r ₀ is
[Equation 5]
D _Rr = 100 × (r ₀ −r) / r ₀
It becomes.

Expected life t _L, when 20% of the deterioration degree D _L of the design value as shown in FIG. 6, the degradation required to deteriorated to the deterioration degree D _L of the design value from 1000 hours to measure I is obtained Time t _L is obtained. In FIG. 6, when the deterioration factor (average deterioration factor) is obtained from the deterioration degree at that time, with 1000 hours from the beginning as the deterioration time, for example, between 500 hours and 1000 hours with 500 hours up to 1000 hours as the deterioration time. As described above, the deterioration coefficient (average deterioration coefficient for a specific period) may be obtained from the deterioration degree.

Next, the measurement data for deterioration estimation is read to estimate the deterioration degree D _E , the life prediction process for predicting the life t _L and the measurement data for deterioration inspection are read to obtain the actual deterioration degree D _R, and the estimated deterioration degree An example of an abnormality determination process for determining abnormality by comparison with D _E will be described. FIG. 7 is a diagram for explaining an example of a lifetime prediction process, and FIG. 8 is a diagram for explaining an example of an abnormality determination process.

In the life prediction process in which the deterioration degree is estimated and the life is predicted, for example, as shown in FIG. 7, after waiting for the measurement time t _Ei (step S11), the measured value of the voltage V _Ei is read (step S11). S12) _Subsequently , the measured value of the temperature T _Ei is read (step S13). Then, the deterioration coefficient α _Ei corresponding to the read voltage V _Ei and temperature T _Ei is read (step S14), and the deterioration degree ΔD in the unit time Δt from the previous measurement time t _Ei-1 to the current measurement time t _{Ei. Ei} is obtained (step S15) and integrated (step S16). Thereafter, a predicted life t _L is obtained from the accumulated estimated deterioration degree D _E (step S17).

In the abnormality determination process in which the actual deterioration degree D _R is obtained and the abnormality is determined by comparison with the estimated deterioration degree D _E , for example, as shown in FIG. 8, first, the measured value of the voltage V _ss01 is read (step S21). Thereafter, constant current discharge is started (step S22). Then, after a predetermined time elapses (t _ds02 ) (step S23), the measured value of voltage V _{ds02 and} the measured value of current I _{d in} constant current discharge are also read (step S24). Further, after waiting for a predetermined time (step S25), the discharge is stopped (step S26), and immediately after that, the measured value of the voltage V _se01 in the discharge stopped state is read (step S27). Constant current discharge time (Δt _d ), current I _d , voltages V _ss01 and V _se01 before and after the start of discharge, voltage drop width Δv _d , discharge start time t _ds01 , predetermined after the start of discharge the capacitance C based time t _DS02 and the voltage V _DS02 at that time, seeking the internal resistance r (step S28), obtains the deterioration degree D _R (step S29). The obtained actual deterioration degree D _R is compared with the estimated deterioration degree D _E (step S30), and it is determined whether or not the obtained actual deterioration degree D _R is abnormal (step S31). In that case, an abnormality determination result is output (step S32).

In addition, this invention is not limited to the said embodiment, A various deformation | transformation is possible. For example, in the above-described embodiment, it has been described that the actual deterioration degree D _R is obtained from the capacitance C and the internal resistance r by measurement. However, the actual deterioration can be obtained only by measuring either the capacitance C or the internal resistance r. it may be obtained degree D _R. In this case, since the capacitance C can be obtained from the charge / discharge amount and the change width of the voltage, the change width of the voltage at the time of charge / discharge and the voltage therebetween can be obtained without performing constant current charging or discharging for a certain period of time. It suffices if the charge / discharge amount can be integrated and measured by the current. Therefore, the deterioration inspection mode can be executed at any time. However, when the internal resistance r is obtained by performing constant current charge / discharge for a certain time, a deterioration inspection cycle is provided periodically during standby, for example, during standby. It is necessary to execute. In the above embodiment, the estimated life t _L is obtained from the estimated deterioration degree D _E and output. However, the abnormality of the capacitor is determined by comparing the estimated deterioration degree D _E with the actual deterioration degree D _R. It is also possible to simply output the result.

The figure explaining embodiment of the abnormality determination apparatus of the capacitor power supply which concerns on this invention. The figure which shows the capacitor power supply system structural example provided with the abnormality determination apparatus of the capacitor power supply which concerns on this embodiment. The figure which shows the structural example of measurement data and reference data. The figure explaining the measurement data for calculating | requiring the voltage of a pulse discharge by a constant current, a current waveform, and an actual deterioration degree. The figure explaining the degradation coefficient of a capacitor. The figure explaining the abnormality determination of the capacitor power supply by a deterioration degree. The figure explaining the example of a lifetime prediction process. The figure explaining the example of the determination process of abnormality.

Explanation of symbols

  DESCRIPTION OF SYMBOLS 1 ... Degradation estimation measurement data, 2 ... Degradation inspection measurement data, 3 ... Degradation estimation reference data, 4 ... Estimated degradation level calculation processing unit, 5 ... Degradation level calculation processing unit, 6 ... Life prediction processing unit, 7 ... Abnormality determination processing unit, 8 ... Predicted life output unit, 9 ... Abnormality determination output unit, 10 ... Abnormality determination device, 11 ... Charge / discharge converter, 12 ... Current sensor, 13 ... Voltmeter, 14 ... Thermometer, 15 ... Capacitor bank

Claims (6)

A capacitor power supply is charged by regenerative power of a charging power supply or a load, discharged from the charged capacitor according to a power supply request of the load, and used for repeated charging and discharging, and a method for determining abnormality of a capacitor power supply,
The ratio of the square root of the previous SL deterioration degree of degradation time and the time required for the electrostatic capacitance or internal resistance of the capacitor is deteriorated to a predetermined degree of deterioration and deterioration degree the rate of degradation with respect to the initial value as the deterioration time as deterioration coefficient has the deterioration coefficient given by the voltage and temperature of the capacitor as a parameter to the reference data,
By measuring the voltage and temperature of capacitor running, the deterioration coefficient corresponding to the voltage and temperature as the measured estimate the degree of deterioration of the capacitor during operation is obtained from the reference data integrating asking each time,
Measure the current and voltage due to charging or discharging of the capacitor, determine the actual deterioration degree of the capacitance of the capacitor from the amount of stored electricity and the change width of the voltage calculated based on the measured current and voltage,
A method for determining an abnormality of a capacitor power source, wherein a difference between the accumulated estimated deterioration level and the actual deterioration level is obtained, and a capacitor abnormality is determined when the difference exceeds a reference value. A capacitor power supply is charged by regenerative power of a charging power supply or a load, discharged from the charged capacitor according to a power supply request of the load, and used for repeated charging and discharging, and a method for determining abnormality of a capacitor power supply,
The ratio of the square root of the previous SL deterioration degree of degradation time and the time required for the electrostatic capacitance or internal resistance of the capacitor is deteriorated to a predetermined degree of deterioration and deterioration degree the rate of degradation with respect to the initial value as the deterioration time as deterioration coefficient has the deterioration coefficient given by the voltage and temperature of the capacitor as a parameter to the reference data,
By measuring the voltage and temperature of capacitor running, the deterioration coefficient corresponding to the voltage and temperature as the measured estimate the degree of deterioration of the capacitor during operation is obtained from the reference data integrating asking each time,
The capacitor is charged or discharged with a constant current at a constant time, and the voltage and current immediately before and immediately after the charging or discharging and during the charging or discharging are measured. Based on the measured voltage and current, the capacitance of the capacitor or Find the actual deterioration degree of internal resistance,
A method for determining an abnormality of a capacitor power source, wherein a difference between the accumulated estimated deterioration level and the actual deterioration level is obtained, and a capacitor abnormality is determined when the difference exceeds a reference value. The capacitor is charged with a regenerative power of a charging power supply or a load, discharged from the charged capacitor according to a power supply request of the load, and used for repeated charging and discharging, and a capacitor power supply abnormality determination device,
The ratio of the square root of the previous SL deterioration degree of degradation time and the time required for the electrostatic capacitance or internal resistance of the capacitor is deteriorated to a predetermined degree of deterioration and deterioration degree the rate of degradation with respect to the initial value as the deterioration time as deterioration coefficient, and reference data storing means for storing the voltage and temperature of the capacitor to the deterioration coefficient given as a parameter as degradation estimation reference data,
By measuring the voltage and temperature of capacitor running, integrating seeking estimating the degree of deterioration of the capacitor during operation to obtain the degradation coefficient corresponding to the voltage and temperature as the measurement from the reference data storing means for each time an estimated deterioration degree calculating means for,
Capacitor or internal resistance of the capacitor based on the measured voltage and current by measuring the voltage immediately before and immediately after the charging or discharging and during the charging or discharging by charging or discharging the capacitor with a constant current for a certain time. An actual deterioration degree calculating means for obtaining the actual deterioration degree of
An abnormality determination unit for a capacitor power supply, comprising: an abnormality determination unit that obtains a difference between the accumulated estimated deterioration degree and the actual deterioration degree and determines a capacitor abnormality when the difference exceeds a reference value. apparatus. 4. The estimated deterioration degree calculating means obtains a predicted life based on a deterioration time up to a predetermined deterioration degree as a life by obtaining an average deterioration coefficient in the deterioration time from the estimated deterioration degree and the deterioration time. The capacitor power supply abnormality determination device according to the description. 5. The abnormality determination device for a capacitor power supply according to claim 4, wherein the average deterioration coefficient is obtained by a deterioration time that specifies a predetermined time from the time when the estimated deterioration degree is obtained. 4. The capacitor power supply according to claim 3, wherein the estimated deterioration degree calculating means obtains a deterioration coefficient with respect to an intermediate voltage and temperature not set in the reference data for deterioration estimation by interpolating based on preceding and following data. Abnormality determination device.

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