JP3881973B2 - Method for forming silicon nitride film - Google Patents

Method for forming silicon nitride film Download PDF

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JP3881973B2
JP3881973B2 JP2003306306A JP2003306306A JP3881973B2 JP 3881973 B2 JP3881973 B2 JP 3881973B2 JP 2003306306 A JP2003306306 A JP 2003306306A JP 2003306306 A JP2003306306 A JP 2003306306A JP 3881973 B2 JP3881973 B2 JP 3881973B2
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正 嶋津
年彦 西森
俊雄 井田
憲二郎 上満
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Mitsubishi Heavy Industries Ltd
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Description

本発明は、窒化シリコン膜の成膜方法に関し、低温の処理温度であっても良好な膜質で且つ低ストレスな窒化シリコン膜が成膜できるように工夫したものである。   The present invention relates to a method for forming a silicon nitride film, which is devised so that a silicon nitride film having good film quality and low stress can be formed even at a low processing temperature.

現在、半導体の製造では、プラズマＣＶＤ（Chemical Vapor Deposition）装置を用いた成膜が知られている。誘導結合プラズマ（inductively coupled plasma；ＩＣＰ）型のプラズマＣＶＤ装置は、膜の材料となる原料ガスを容器内の成膜室の中に導入し、高周波アンテナにＲＦ電流（高周波電流）を流して、成膜室内に高周波の電磁波を入射してプラズマ状態にし、プラズマ中の活性粒子（励起原子または励起分子）によって基板表面の化学的な反応を促進して成膜を行う装置である。   At present, in semiconductor manufacturing, film formation using a plasma CVD (Chemical Vapor Deposition) apparatus is known. An inductively coupled plasma (ICP) type plasma CVD apparatus introduces a raw material gas as a film material into a film forming chamber in a container, and causes an RF current (high frequency current) to flow through a high frequency antenna. In this apparatus, a high frequency electromagnetic wave is incident into a film forming chamber to form a plasma state, and a chemical reaction on the substrate surface is promoted by active particles (excited atoms or excited molecules) in the plasma to form a film.

半導体素子（例えばＤＲＡＭ）では、素子保護用膜として窒化シリコン（ＳｉＮ）を用いることがあり、この窒化シリコン（ＳｉＮ）は、ＩＣＰ型のプラズマＣＶＤ装置により成膜される。   In a semiconductor element (for example, DRAM), silicon nitride (SiN) may be used as an element protection film, and this silicon nitride (SiN) is formed by an ICP type plasma CVD apparatus.

窒化シリコンＳｉＮを成膜するには、従来では、ＩＣＰ型のプラズマＣＶＤ装置内に、原料ガスとしてアンモニア（ＮＨ3）とシラン（ＳｉＨ4）を成膜室内に供給しつつ、基板温度を３５０°Ｃ以上にして、ＲＦパワーを６Ｗ／ｓｃｃｍ以上としていた。
特開平９−４１１４７号公報 In order to form a silicon nitride SiN film, conventionally, ammonia (NH 3 ) and silane (SiH 4 ) are supplied as source gases into the film formation chamber in an ICP type plasma CVD apparatus, and the substrate temperature is set to 350 °. The RF power was set to 6 W / sccm or more.
Japanese Patent Laid-Open No. 9-41147

半導体素子の保護用膜として窒化シリコン（ＳｉＮ）を成膜するために、原料ガスとしてアンモニア（ＮＨ3）を用いた場合には、原料であるアンモニア（ＮＨ3）中に水素が含まれているため、成膜された保護用膜の膜中の水素含有率が多くなってしまい、保護用膜としての品質が低下していた。 When ammonia (NH 3 ) is used as a source gas for forming silicon nitride (SiN) as a protective film for a semiconductor element, hydrogen is contained in the source ammonia (NH 3 ). For this reason, the hydrogen content in the formed protective film is increased, and the quality as the protective film is lowered.

また最近では、集積度の高いＤＲＡＭや、ＭＲＡＭや、ＦｅＲＡＭなどが開発されてきたが、これら高集積度ＤＲＡＭやＭＲＡＭやＦｅＲＡＭは熱に弱いため、処理温度が３００°Ｃ以下になるように要求されるようになってきている。このため、保護用膜を成膜するのに、低温（３００°Ｃ以下）で処理する必要がでてきたが、従来の手法では、かかる低温では良質な膜質を得ることができなかった。   Recently, highly integrated DRAM, MRAM, FeRAM, and the like have been developed, but these highly integrated DRAM, MRAM, and FeRAM are vulnerable to heat, so that the processing temperature is required to be 300 ° C. or lower. It has come to be. For this reason, in order to form a protective film, it has been necessary to perform the treatment at a low temperature (300 ° C. or lower), but the conventional method cannot obtain a good film quality at such a low temperature.

本発明は、上記従来技術に鑑み、膜質が良好で、しかも、低温での処理で膜成形ができる窒化シリコン膜の成膜方法を提供することを目的とする。   An object of the present invention is to provide a method for forming a silicon nitride film which has good film quality and can be formed by low-temperature processing in view of the above prior art.

上記課題を解決する本発明の構成は、誘導結合プラズマ型のプラズマＣＶＤ装置を用いて、成膜室内の基板上に窒化シリコン膜を成膜する成膜方法であって、
前記成膜室に供給する原料ガスとしてシランガスと窒素ガスを用い、
シランガスの供給流量に対して、窒素ガスの供給流量を10倍以上とし、ガスの総供給量に対する高周波パワーを３Ｗ／ｓｃｃｍ以上とし、基板温度を５０°Ｃ〜３００°Ｃとし、
更に、前記成膜室のうちで入射される電磁波が強い空間領域に前記窒素ガスを供給し、前記成膜室内に設置した基板の近傍の空間領域に前記シランガスを供給することを特徴とする。 The structure of the present invention that solves the above problem is a film forming method for forming a silicon nitride film on a substrate in a film forming chamber using an inductively coupled plasma type plasma CVD apparatus,
Silane gas and nitrogen gas are used as source gases to be supplied to the film formation chamber,
The supply flow rate of nitrogen gas is 10 times or more than the supply flow rate of silane gas, the high frequency power for the total supply amount of gas is 3 W / sccm or more, the substrate temperature is 50 ° C. to 300 ° C. ,
Further, the nitrogen gas is supplied to a space region where the incident electromagnetic wave is strong in the film formation chamber, and the silane gas is supplied to a space region in the vicinity of the substrate installed in the film formation chamber .

また本発明の構成は、誘導結合プラズマ型のプラズマＣＶＤ装置を用いて、成膜室内の基板上に窒化シリコン膜を成膜する成膜方法であって、
前記成膜室に供給する原料ガスとしてシランガスと窒素ガスを用い、
シランガスの供給流量に対して、窒素ガスの供給流量を10倍以上とし、ガスの総供給量に対する高周波パワーを３Ｗ／ｓｃｃｍ以上とし、基板温度を５０°Ｃ〜３００°Ｃとし、
更に、前記成膜室のうちで入射される電磁波が強い空間領域に前記窒素ガスを供給し、前記成膜室内に設置した基板の近傍の空間領域に前記シランガスを供給し、
更に、成膜圧力を１０ｍＴｏｒｒ〜５０ｍＴｏｒｒとしたことを特徴とする。 According to another aspect of the present invention , there is provided a film forming method for forming a silicon nitride film on a substrate in a film forming chamber using an inductively coupled plasma type plasma CVD apparatus,
Silane gas and nitrogen gas are used as source gases to be supplied to the film formation chamber,
The supply flow rate of nitrogen gas is 10 times or more than the supply flow rate of silane gas, the high frequency power for the total supply amount of gas is 3 W / sccm or more, the substrate temperature is 50 ° C. to 300 ° C.,
Furthermore, the nitrogen gas is supplied to a space region where the incident electromagnetic wave is strong in the film formation chamber, and the silane gas is supplied to a space region in the vicinity of the substrate installed in the film formation chamber,
Further, the film forming pressure is set to 10 mTorr to 50 mTorr.

また本発明の構成は、上記成膜方法において、励起ガスとしての不活性ガスを、シランガスと窒素ガスの総供給流量の２０％以下の流量で、前記成膜室内に供給することを特徴とする。   Further, the structure of the present invention is characterized in that, in the film forming method, an inert gas as an excitation gas is supplied into the film forming chamber at a flow rate of 20% or less of a total supply flow rate of silane gas and nitrogen gas. .

本発明によれば、低温な処理温度であっても、良好な膜質で低ストレスな窒化シリコン膜を、迅速に（成膜速度を速くして）成膜することができる。   According to the present invention, a silicon nitride film having good film quality and low stress can be formed quickly (by increasing the film forming speed) even at a low processing temperature.

本発明の窒化シリコン膜の成膜方法では、ＩＣＰ型のプラズマＣＶＤ装置を用いて、シラン（ＳｉＨ4）ガスと窒素（Ｎ2）ガスを原料ガスとして、次のような成膜条件で窒化シリコン（ＳｉＮ）を成膜する。 In the silicon nitride film forming method of the present invention, silicon nitride is used under the following film forming conditions by using an ICP type plasma CVD apparatus, using silane (SiH 4 ) gas and nitrogen (N 2 ) gas as source gases. (SiN) is deposited.

（１）シラン（ＳｉＨ4）ガスの供給流量に対して、窒素（Ｎ2）ガスの供給流量を10倍以上とし、ガスの総供給量に対する高周波パワー（ＲＦパワー：成膜室に入射する電磁波のエネルギー）を３Ｗ／ｓｃｃｍ以上とし、基板温度を５０°Ｃ〜３００°Ｃとする。これにより、図１に例示する良好な膜質の窒化シリコン（ＳｉＮ）膜を成膜することができる。同図は、成膜温度が２００℃、シランガス流量に対する窒素ガス流量の比（Ｎ2／ＳｉＨ4）が２０倍にてＳｉ−Ｈ結合が検知されていないＦＴＩＲ（赤外分光）特性図である。 (1) The supply flow rate of nitrogen (N 2 ) gas is at least 10 times the supply flow rate of silane (SiH 4 ) gas, and the high frequency power (RF power: electromagnetic waves incident on the film formation chamber) with respect to the total supply amount of gas Energy) is 3 W / sccm or more, and the substrate temperature is 50 ° C. to 300 ° C. Thereby, a silicon nitride (SiN) film having a good film quality illustrated in FIG. 1 can be formed. This figure is an FTIR (infrared spectroscopy) characteristic diagram in which the film forming temperature is 200 ° C., the ratio of the nitrogen gas flow rate to the silane gas flow rate (N 2 / SiH 4 ) is 20 times, and no Si—H bond is detected. .

（２）上記（１）の成膜条件に加えて、成膜圧力を１０ｍＴｏｒｒ〜５０ｍＴｏｒｒとする。これにより、後述するように、低ストレスな窒化シリコン（ＳｉＮ）膜を成膜することができる。 (2) In addition to the film forming conditions of (1) above, the film forming pressure is set to 10 mTorr to 50 mTorr. As a result, a low-stress silicon nitride (SiN) film can be formed as will be described later.

（３）上記（１）の成膜条件に加えて、または上記（１），（２）の成膜条件に加えて、ＣＶＤ装置の成膜室のうちで入射される電磁波が強い空間領域に窒素（Ｎ2）ガスを供給し、ＣＶＤ装置の成膜室に設置した基板の近傍の空間領域にシラン（ＳｉＨ4）ガスを供給する。これにより、後述するように、分解しにくい窒素（Ｎ2）ガスを効率良く分解することによりＳｉ−Ｎ反応を促進し、膜質の改善を達成することができる。 (3) In addition to the film forming conditions of (1) above or in addition to the film forming conditions of (1) and (2) above, in a space region where an incident electromagnetic wave is strong in the film forming chamber of the CVD apparatus. Nitrogen (N 2 ) gas is supplied, and silane (SiH 4 ) gas is supplied to a space region in the vicinity of the substrate installed in the film formation chamber of the CVD apparatus. Thereby, as will be described later, it is possible to promote the Si—N reaction by efficiently decomposing nitrogen (N 2 ) gas, which is difficult to decompose, and to improve the film quality.

（４）上記（１）の成膜条件に加えて、または上記（１），（２）の成膜条件に加えて、または上記（１），（２），（３）の成膜条件に加えて、励起ガスとしてアルゴン（Ａｒ）やヘリウム（Ｈｅ）などの不活性ガスを、シラン（ＳｉＨ4）ガスと窒素（Ｎ2）ガスの総供給流量の２０％以下の流量で供給する。これにより、後述するように、原料ガスの分解をアシストして、成膜速度を向上させることができる。 (4) In addition to the film forming conditions of (1) above, or in addition to the film forming conditions of (1) and (2) above, or to the film forming conditions of (1), (2) and (3) above. In addition, an inert gas such as argon (Ar) or helium (He) is supplied as an excitation gas at a flow rate of 20% or less of the total supply flow rate of silane (SiH 4 ) gas and nitrogen (N 2 ) gas. Thereby, as will be described later, the decomposition of the source gas can be assisted to improve the film formation rate.

ここで、本発明方法を実施するプラズマＣＶＤ装置を、図２を参照して説明する。   Here, a plasma CVD apparatus for carrying out the method of the present invention will be described with reference to FIG.

図２に示すように、基部１には円筒状のアルミニウム製の容器２が設けられ、容器２内に成膜室３が形成されている。容器２の上部には、電磁波を透過させる円形の天井板４が設けられ、容器２の中心における成膜室３にはウエハ支持台５が備えられている。ウエハ支持台５は半導体の基板６を静電的に吸着保持する円盤状の載置部７を有し、載置部７は支持軸８に支持されている。   As shown in FIG. 2, the base 1 is provided with a cylindrical aluminum container 2, and a film forming chamber 3 is formed in the container 2. A circular ceiling plate 4 that transmits electromagnetic waves is provided in the upper part of the container 2, and a wafer support 5 is provided in the film formation chamber 3 in the center of the container 2. The wafer support 5 includes a disk-shaped mounting portion 7 that electrostatically attracts and holds a semiconductor substrate 6, and the mounting portion 7 is supported by a support shaft 8.

載置部７には、バイアス電源９および静電電源１０が接続され、載置部７に低周波を発生させると共に静電気力を発生させる。ウエハ支持台５は全体が昇降自在もしくは支持軸８が伸縮自在とすることで、上下方向の高さが最適な高さに調整できるようになっている。   A bias power source 9 and an electrostatic power source 10 are connected to the mounting unit 7 to generate a low frequency and an electrostatic force in the mounting unit 7. The entire height of the wafer support 5 can be raised or lowered or the support shaft 8 can be expanded and contracted, so that the vertical height can be adjusted to an optimum height.

天井板４の上には、例えば、円形リング状の高周波アンテナ１１が配置され、高周波アンテナ１１には整合器１２を介して高周波電源１３が接続されている。高周波アンテナ１１に高周波電力を供給することにより電磁波が容器２の成膜室３に入射する。容器２内に入射された電磁波は、成膜質３内のガスをイオン化してプラズマを発生させる。   For example, a circular ring-shaped high-frequency antenna 11 is disposed on the ceiling plate 4, and a high-frequency power source 13 is connected to the high-frequency antenna 11 via a matching unit 12. By supplying high frequency power to the high frequency antenna 11, electromagnetic waves are incident on the film forming chamber 3 of the container 2. The electromagnetic wave incident on the container 2 ionizes the gas in the film quality 3 to generate plasma.

容器２には、シラン（ＳｉＨ4）ガスを成膜室３内に供給するガス供給ノズル１４と、窒素（Ｎ2）ガスを成膜室３内に供給するガス供給ノズル１５と、不活性ガス（アルゴンＡｒやヘリウムＨｅ）を成膜室３内に供給するためのガス供給ノズル１６が設けられている。 The container 2 includes a gas supply nozzle 14 for supplying silane (SiH 4 ) gas into the film formation chamber 3, a gas supply nozzle 15 for supplying nitrogen (N 2 ) gas into the film formation chamber 3, and an inert gas. A gas supply nozzle 16 for supplying (Argon Ar or Helium He) into the film forming chamber 3 is provided.

本例では、ガス供給ノズル１４〜１５の、高さ方向に関する配置位置は、ガス供給ノズル１５が最上段にあり、ガス供給ノズル１６が中段にあり、ガス供給ノズル１４が最下段にある。
これにより、ガス供給ノズル１５を介して供給される窒素（Ｎ2）ガスが、成膜室３のうちで高周波アンテナ１１から入射される電磁波が強い空間領域、即ち、プラズマがより強く発生する空間領域に供給される。
また、ガス供給ノズル１４を介して供給されるシラン（ＳｉＨ4）ガスが、成膜室３のうちで基板６近傍の空間領域に供給される。 In this example, the gas supply nozzles 14 to 15 are arranged in the height direction such that the gas supply nozzle 15 is at the top, the gas supply nozzle 16 is at the middle, and the gas supply nozzle 14 is at the bottom.
Thereby, the nitrogen (N 2 ) gas supplied through the gas supply nozzle 15 is a space region where the electromagnetic wave incident from the high frequency antenna 11 is strong in the film forming chamber 3, that is, a space where plasma is generated more strongly. Supplied to the area.
Further, silane (SiH 4 ) gas supplied via the gas supply nozzle 14 is supplied to a space region in the vicinity of the substrate 6 in the film forming chamber 3.

また基部１には容器２内を排気するための真空排気系（図示省略）に接続される排気口１７が設けられている。また、図示は省略したが、容器２には基板６の搬入、搬出口が設けられ、図示しない搬送室との間で基板６が搬入・搬出される。   The base 1 is provided with an exhaust port 17 connected to a vacuum exhaust system (not shown) for exhausting the inside of the container 2. Although not shown, the container 2 is provided with a carry-in / carry-out port for the substrate 6, and the substrate 6 is carried into and out of the transfer chamber (not shown).

上述したＩＣＰ型のプラズマＣＶＤ装置では、ウエハ支持台５の載置部７に基板６が載せられ、静電的に吸着される。そしてガス供給ノズル１４〜１６を介して、成膜室３内にシラン（ＳｉＨ4）ガスと、窒素（Ｎ2）ガスと、不活性ガス（アルゴンＡｒやヘリウムＨｅ）が供給される。また、高周波電源１３から高周波アンテナ１１に電力を供給して高周波の電磁波を発生させると共にバイアス電源９から載置部７に低周波電力を供給する。
このとき成膜条件を上述した（１）〜（４）とする。 In the above-described ICP type plasma CVD apparatus, the substrate 6 is mounted on the mounting portion 7 of the wafer support 5 and is electrostatically attracted. Silane (SiH 4 ) gas, nitrogen (N 2 ) gas, and inert gas (argon Ar or helium He) are supplied into the film forming chamber 3 through the gas supply nozzles 14 to 16. Further, power is supplied from the high frequency power supply 13 to the high frequency antenna 11 to generate high frequency electromagnetic waves, and low frequency power is supplied from the bias power supply 9 to the mounting portion 7.
At this time, the film forming conditions are the above-described (1) to (4).

これにより、成膜室３内の原料ガスが放電して一部がプラズマ状態となる。このプラズマは、原料ガス中の他の中性分子に衝突して更に中性分子を電離、あるいは励起する。こうして生じた活性な粒子は、基板６の表面に吸着して効率良く化学反応を起こし、堆積して、基板６上に、良好な膜質で低ストレスな窒化シリコン（ＳｉＮ）膜を成膜することができる。   As a result, the raw material gas in the film forming chamber 3 is discharged and a part thereof is in a plasma state. This plasma collides with other neutral molecules in the source gas and further ionizes or excites the neutral molecules. The active particles thus generated are adsorbed on the surface of the substrate 6 to cause a chemical reaction and deposit efficiently, and a silicon nitride (SiN) film having a good film quality and low stress is formed on the substrate 6. Can do.

実施例１では、シラン（ＳｉＨ4）ガスの供給流量に対して、窒素（Ｎ2）ガスの供給流量を10倍以上とし、ガスの総供給量に対する高周波パワー（ＲＦパワー：成膜室に入射する電磁波のエネルギー）を３Ｗ／ｓｃｃｍ以上とし、基板温度を５０°Ｃ〜３００°Ｃとした。 In Example 1, the supply flow rate of nitrogen (N 2 ) gas is 10 times or more than the supply flow rate of silane (SiH 4 ) gas, and high frequency power (RF power: incident on the film formation chamber) with respect to the total supply amount of gas. The energy of the electromagnetic wave to be generated) was 3 W / sccm or more, and the substrate temperature was 50 ° C. to 300 ° C.

このようにすることにより、良好な膜質の窒化シリコン（ＳｉＮ）膜を成膜することができた。第一に水素を含むアンモニア（ＮＨ3）ガスを使用せず、窒素（Ｎ2）ガスを用いることにより水素量を減らしている。次に、Ｓｉ3Ｎ4反応に必要なＳｉＨ4流量に対するＮ2流量は、通常１：１で十分であるが、Ｎ2流量をＳｉＨ4流量の１０倍とすることによりＳｉ−Ｈ結合を抑制することができており、この多量のＳｉＨ4＋Ｎ2反応で必要な窒素（Ｎ2）ガスの分解を促進するために十分なＲＦパワー（３Ｗ／ｓｃｃｍ以上）を印加することによりＳｉＮ反応を促進した結果、３００°Ｃ以下の温度領域でも良好な膜質を得ることができたのである。 By doing so, it was possible to form a silicon nitride (SiN) film having a good film quality. First, the amount of hydrogen is reduced by using nitrogen (N 2 ) gas without using ammonia (NH 3 ) gas containing hydrogen. Next, the N 2 flow rate relative to the SiH 4 flow rate required for the Si 3 N 4 reaction is usually 1: 1, but the Si—H bond is suppressed by making the N 2 flow rate 10 times the SiH 4 flow rate. The SiN reaction is promoted by applying sufficient RF power (3 W / sccm or more) to promote the decomposition of nitrogen (N 2 ) gas necessary for this large amount of SiH 4 + N 2 reaction. As a result, good film quality could be obtained even in a temperature range of 300 ° C. or lower.

窒化シリコン（ＳｉＮ）膜の膜質は、屈折率により判定することができ、屈折率が２．１に近いほど良好な膜質である。
図３は成膜温度（基板温度）を２００°Ｃとしたときにおける、各ＲＦパワーでの、屈折率と、シランガス流量に対する窒素ガス流量の比（Ｎ2／ＳｉＨ4）との関係を示す特性図である。また図４は成膜温度（基板温度）を３５０°Ｃとしたときにおける、各ＲＦパワーでの、屈折率と、シランガス流量に対する窒素ガス流量の比（Ｎ2／ＳｉＨ4）との関係を示す特性である。
図４から分かるように、基板温度が３５０°Ｃ程度の高温で成膜をすると、流量やＲＦパワーに依存することなく、良好な膜質の窒化シリコン（ＳｉＮ）膜の成膜ができる。
一方、図３から分かるように、基板温度が２００°のような低温条件では、シランガス流量に対する窒素ガス流量の比（Ｎ2／ＳｉＨ4）が１０以上で、ＲＦパワーを３Ｗ／ｓｃｃｍ以上とすることにより、良好な膜質の窒化シリコン（ＳｉＮ）膜の成膜ができることが判明した。 The film quality of the silicon nitride (SiN) film can be determined by the refractive index. The closer the refractive index is to 2.1, the better the film quality.
FIG. 3 shows the relationship between the refractive index and the ratio of the nitrogen gas flow rate to the silane gas flow rate (N 2 / SiH 4 ) at each RF power when the film forming temperature (substrate temperature) is 200 ° C. FIG. FIG. 4 shows the relationship between the refractive index and the ratio of the nitrogen gas flow rate to the silane gas flow rate (N 2 / SiH 4 ) at each RF power when the film forming temperature (substrate temperature) is 350 ° C. It is a characteristic.
As can be seen from FIG. 4, when the film is formed at a high substrate temperature of about 350 ° C., a silicon nitride (SiN) film having a good film quality can be formed without depending on the flow rate or RF power.
On the other hand, as can be seen from FIG. 3, under a low temperature condition such as a substrate temperature of 200 °, the ratio of the nitrogen gas flow rate to the silane gas flow rate (N 2 / SiH 4 ) is 10 or more and the RF power is 3 W / sccm or more. Thus, it was found that a silicon nitride (SiN) film having a good film quality can be formed.

実施例２では、実施例１の成膜条件に加えて、成膜圧力を１０ｍＴｏｒｒ〜５０ｍＴｏｒｒとした。これにより、低ストレスな窒化シリコン（ＳｉＮ）膜を成膜することができた。窒化シリコン膜のストレス許容値は、２５０Ｍｐａである。   In Example 2, in addition to the film forming conditions of Example 1, the film forming pressure was set to 10 mTorr to 50 mTorr. As a result, a low-stress silicon nitride (SiN) film could be formed. The allowable stress value of the silicon nitride film is 250 Mpa.

図５はＳｉＮ膜のストレスと成膜圧力との関係を示す。図５から分かるように、成膜圧力を１０ｍＴｏｒｒ〜５０ｍＴｏｒｒとすれば、ストレスが２５０Ｍｐａ以下になることが判明した。この結果、良好な膜質を維持しつつ、さらに低ストレスな窒化シリコン（ＳｉＮ）膜を成膜することができた。   FIG. 5 shows the relationship between the stress of the SiN film and the deposition pressure. As can be seen from FIG. 5, when the film forming pressure is 10 mTorr to 50 mTorr, the stress is found to be 250 Mpa or less. As a result, it was possible to form a silicon nitride (SiN) film with lower stress while maintaining good film quality.

実施例３では、実施例１，２に示す成膜条件で、図２に示すＣＶＤ装置を用いることにより、シラン（ＳｉＨ4）ガスに対してガス供給量が10倍以上となっている窒素（Ｎ2）ガスを、成膜室３のうちで高周波アンテナ１１から入射される電磁波が強い空間領域、即ち、プラズマがより強く発生する空間領域に供給する。このため多量で且つ分解しにくい
窒素（Ｎ2）ガスを効率良く分解することができる。
また、シラン（ＳｉＨ4）ガスが基板６近傍の空間領域に供給されるため、基板６の近傍にてＳｉ−Ｎ反応が行われる。
この両方の効果が相乗して、Ｓｉ−Ｎ反応が促進し、膜質の改善を達成することができる。 In Example 3, by using the CVD apparatus shown in FIG. 2 under the film forming conditions shown in Examples 1 and 2, nitrogen (SiH 4 ) gas supply amount of 10 times or more with respect to silane (SiH 4 ) gas ( N 2 ) gas is supplied to a space region in the film forming chamber 3 where the electromagnetic wave incident from the high frequency antenna 11 is strong, that is, a space region where plasma is generated more strongly. Therefore, a large amount of nitrogen (N 2 ) gas that is difficult to decompose can be decomposed efficiently.
Further, since silane (SiH 4 ) gas is supplied to the space region near the substrate 6, the Si—N reaction is performed in the vicinity of the substrate 6.
Both effects synergistically promote the Si-N reaction and achieve an improvement in film quality.

実施例４では、実施例１，２，３に示す成膜条件に加えて、励起ガスとしてアルゴン（Ａｒ）やヘリウム（Ｈｅ）などの不活性ガスを、シラン（ＳｉＨ4）ガスと窒素（Ｎ 2 ）ガスの総供給流量の２０％以下の流量で供給した。不活性ガスはプラズマ化しやすいので、原料ガスであるシラン（ＳｉＨ4）ガス及び窒素（Ｎ 2 ）ガスの分解をアシストして、成膜速度を向上させることができるのである。 In Example 4, in addition to the film forming conditions shown in Examples 1, 2, and 3, an inert gas such as argon (Ar) or helium (He) is used as an excitation gas, and silane (SiH 4 ) gas and nitrogen (N 2 ) The gas was supplied at a flow rate of 20% or less of the total gas supply flow rate. Since the inert gas is easily plasmatized, the deposition rate can be improved by assisting the decomposition of the silane (SiH 4 ) gas and the nitrogen (N 2 ) gas, which are raw material gases.

本発明は、高集積度ＤＲＡＭやＭＲＡＭやＦｅＲＡＭ半導体素子に、保護用膜として窒化シリコン（ＳｉＮ）を成膜するのに利用することができる。しかも、良好な膜質で成膜速度を上げることができる。   The present invention can be used to form silicon nitride (SiN) as a protective film on a highly integrated DRAM, MRAM, or FeRAM semiconductor element. In addition, the film formation rate can be increased with good film quality.

成膜温度が２００℃、シランガス流量に対する窒素ガス流量の比（Ｎ2／ＳｉＨ4）が２０倍にてＳｉ−Ｈ結合が検知されていないＦＴＩＲ（赤外分光）特性図である。It is a FTIR (infrared spectroscopy) characteristic diagram in which the film forming temperature is 200 ° C., the ratio of the nitrogen gas flow rate to the silane gas flow rate (N 2 / SiH 4 ) is 20 times, and no Si—H bond is detected. ＩＣＰ型のＣＶＤ装置を示す構成図である。It is a block diagram which shows an ICP type CVD apparatus. 成膜温度が２００°Ｃのときの、屈折率と、シランガス流量に対する窒素ガス流量の比（Ｎ2／ＳｉＨ4）との関係を示す特性図である。FIG. 6 is a characteristic diagram showing the relationship between the refractive index and the ratio of the nitrogen gas flow rate to the silane gas flow rate (N 2 / SiH 4 ) when the film forming temperature is 200 ° C. 成膜温度が３５０°Ｃのときの、屈折率と、シランガス流量に対する窒素ガス流量の比（Ｎ2／ＳｉＨ4）との関係を示す特性図である。It is a characteristic view showing the relationship between the refractive index and the ratio of the nitrogen gas flow rate to the silane gas flow rate (N 2 / SiH 4 ) when the film forming temperature is 350 ° C. ＳｉＮ膜のストレスと成膜圧力との関係を示す特性図である。It is a characteristic view which shows the relationship between the stress of SiN film, and the film-forming pressure.

符号の説明Explanation of symbols

１ 基部
２ 容器
３ 成膜室
４ 天井板
５ ウエハ支持台
６ 基板
７ 載置部
８ 支持軸
９ バイアス電源
１０ 静電電源
１１ 高周波アンテナ
１２ 整合器
１３ 高周波電源
１４ ガス供給ノズル
１５ ガス供給ノズル
１６ ガス供給ノズル
１７ 排気口 DESCRIPTION OF SYMBOLS 1 Base part 2 Container 3 Deposition chamber 4 Ceiling board 5 Wafer support stand 6 Substrate 7 Placement part 8 Support shaft 9 Bias power supply 10 Electrostatic power supply 11 High frequency antenna 12 Matching device 13 High frequency power supply 14 Gas supply nozzle 15 Gas supply nozzle 16 Gas Supply nozzle 17 Exhaust port

Claims (3)

誘導結合プラズマ型のプラズマＣＶＤ装置を用いて、成膜室内の基板上に窒化シリコン膜を成膜する成膜方法であって、
前記成膜室に供給する原料ガスとしてシランガスと窒素ガスを用い、
シランガスの供給流量に対して、窒素ガスの供給流量を10倍以上とし、ガスの総供給量に対する高周波パワーを３Ｗ／ｓｃｃｍ以上とし、基板温度を５０°Ｃ〜３００°Ｃとし、
更に、前記成膜室のうちで入射される電磁波が強い空間領域に前記窒素ガスを供給し、前記成膜室内に設置した基板の近傍の空間領域に前記シランガスを供給することを特徴とする窒化シリコン膜の成膜方法。 A film forming method for forming a silicon nitride film on a substrate in a film forming chamber using an inductively coupled plasma type plasma CVD apparatus,
Silane gas and nitrogen gas are used as source gases to be supplied to the film formation chamber,
The supply flow rate of nitrogen gas is 10 times or more than the supply flow rate of silane gas, the high frequency power for the total supply amount of gas is 3 W / sccm or more, the substrate temperature is 50 ° C. to 300 ° C. ,
Further, the nitrogen gas is supplied to a space region where the incident electromagnetic wave is strong in the film formation chamber, and the silane gas is supplied to a space region in the vicinity of the substrate installed in the film formation chamber. A method for forming a silicon film. 誘導結合プラズマ型のプラズマＣＶＤ装置を用いて、成膜室内の基板上に窒化シリコン膜を成膜する成膜方法であって、
前記成膜室に供給する原料ガスとしてシランガスと窒素ガスを用い、
シランガスの供給流量に対して、窒素ガスの供給流量を10倍以上とし、ガスの総供給量に対する高周波パワーを３Ｗ／ｓｃｃｍ以上とし、基板温度を５０°Ｃ〜３００°Ｃとし、
更に、前記成膜室のうちで入射される電磁波が強い空間領域に前記窒素ガスを供給し、前記成膜室内に設置した基板の近傍の空間領域に前記シランガスを供給し、
更に、成膜圧力を１０ｍＴｏｒｒ〜５０ｍＴｏｒｒとしたことを特徴とする窒化シリコン膜の成膜方法。 A film forming method for forming a silicon nitride film on a substrate in a film forming chamber using an inductively coupled plasma type plasma CVD apparatus,
Silane gas and nitrogen gas are used as source gases to be supplied to the film formation chamber,
The supply flow rate of nitrogen gas is 10 times or more than the supply flow rate of silane gas, the high frequency power for the total supply amount of gas is 3 W / sccm or more, the substrate temperature is 50 ° C. to 300 ° C.,
Furthermore, the nitrogen gas is supplied to a space region where the incident electromagnetic wave is strong in the film formation chamber, and the silane gas is supplied to a space region in the vicinity of the substrate installed in the film formation chamber,
Further, the silicon nitride film forming method is characterized in that the film forming pressure is set to 10 mTorr to 50 mTorr. 請求項１または請求項２において、
励起ガスとしての不活性ガスを、シランガスと窒素ガスの総供給流量の２０％以下の流量で、前記成膜室内に供給することを特徴とする窒化シリコン膜の成膜方法。 Oite to claim 1 or claim 2,
A method for forming a silicon nitride film, wherein an inert gas as an excitation gas is supplied into the film formation chamber at a flow rate of 20% or less of a total supply flow rate of silane gas and nitrogen gas.
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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5007438B2 (en) * 2005-03-30 2012-08-22 地方独立行政法人山口県産業技術センター SiNxOyCz film and manufacturing method thereof
JP5084426B2 (en) 2007-09-27 2012-11-28 富士フイルム株式会社 Method for forming silicon nitride film
JP5069531B2 (en) 2007-09-28 2012-11-07 富士フイルム株式会社 Method for forming silicon nitride film
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KR101542840B1 (en) 2008-09-09 2015-08-07 삼성디스플레이 주식회사 Thin film transistor substrate and method of fabricating thereof
US10378106B2 (en) 2008-11-14 2019-08-13 Asm Ip Holding B.V. Method of forming insulation film by modified PEALD
US9394608B2 (en) 2009-04-06 2016-07-19 Asm America, Inc. Semiconductor processing reactor and components thereof
US8802201B2 (en) 2009-08-14 2014-08-12 Asm America, Inc. Systems and methods for thin-film deposition of metal oxides using excited nitrogen-oxygen species
KR101732187B1 (en) * 2009-09-03 2017-05-02 에이에스엠 저펜 가부시기가이샤 METHOD OF FORMING CONFORMAL DIELECTRIC FILM HAVING Si-N BONDS BY PECVD
US9312155B2 (en) 2011-06-06 2016-04-12 Asm Japan K.K. High-throughput semiconductor-processing apparatus equipped with multiple dual-chamber modules
US10854498B2 (en) 2011-07-15 2020-12-01 Asm Ip Holding B.V. Wafer-supporting device and method for producing same
US20130023129A1 (en) 2011-07-20 2013-01-24 Asm America, Inc. Pressure transmitter for a semiconductor processing environment
US9017481B1 (en) 2011-10-28 2015-04-28 Asm America, Inc. Process feed management for semiconductor substrate processing
US8586487B2 (en) * 2012-01-18 2013-11-19 Applied Materials, Inc. Low temperature plasma enhanced chemical vapor deposition of conformal silicon carbon nitride and silicon nitride films
US9659799B2 (en) 2012-08-28 2017-05-23 Asm Ip Holding B.V. Systems and methods for dynamic semiconductor process scheduling
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US10529542B2 (en) 2015-03-11 2020-01-07 Asm Ip Holdings B.V. Cross-flow reactor and method
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US10458018B2 (en) 2015-06-26 2019-10-29 Asm Ip Holding B.V. Structures including metal carbide material, devices including the structures, and methods of forming same
US10600673B2 (en) 2015-07-07 2020-03-24 Asm Ip Holding B.V. Magnetic susceptor to baseplate seal
US9960072B2 (en) 2015-09-29 2018-05-01 Asm Ip Holding B.V. Variable adjustment for precise matching of multiple chamber cavity housings
US10211308B2 (en) 2015-10-21 2019-02-19 Asm Ip Holding B.V. NbMC layers
US11139308B2 (en) 2015-12-29 2021-10-05 Asm Ip Holding B.V. Atomic layer deposition of III-V compounds to form V-NAND devices
US10529554B2 (en) 2016-02-19 2020-01-07 Asm Ip Holding B.V. Method for forming silicon nitride film selectively on sidewalls or flat surfaces of trenches
US10468251B2 (en) 2016-02-19 2019-11-05 Asm Ip Holding B.V. Method for forming spacers using silicon nitride film for spacer-defined multiple patterning
US10865475B2 (en) 2016-04-21 2020-12-15 Asm Ip Holding B.V. Deposition of metal borides and silicides
US10190213B2 (en) 2016-04-21 2019-01-29 Asm Ip Holding B.V. Deposition of metal borides
US10032628B2 (en) 2016-05-02 2018-07-24 Asm Ip Holding B.V. Source/drain performance through conformal solid state doping
US10367080B2 (en) 2016-05-02 2019-07-30 Asm Ip Holding B.V. Method of forming a germanium oxynitride film
US11453943B2 (en) 2016-05-25 2022-09-27 Asm Ip Holding B.V. Method for forming carbon-containing silicon/metal oxide or nitride film by ALD using silicon precursor and hydrocarbon precursor
US10388509B2 (en) 2016-06-28 2019-08-20 Asm Ip Holding B.V. Formation of epitaxial layers via dislocation filtering
US9859151B1 (en) 2016-07-08 2018-01-02 Asm Ip Holding B.V. Selective film deposition method to form air gaps
US10612137B2 (en) 2016-07-08 2020-04-07 Asm Ip Holdings B.V. Organic reactants for atomic layer deposition
US10714385B2 (en) 2016-07-19 2020-07-14 Asm Ip Holding B.V. Selective deposition of tungsten
US9812320B1 (en) 2016-07-28 2017-11-07 Asm Ip Holding B.V. Method and apparatus for filling a gap
KR102532607B1 (en) 2016-07-28 2023-05-15 에이에스엠 아이피 홀딩 비.브이. Substrate processing apparatus and method of operating the same
US10395919B2 (en) 2016-07-28 2019-08-27 Asm Ip Holding B.V. Method and apparatus for filling a gap
US9887082B1 (en) 2016-07-28 2018-02-06 Asm Ip Holding B.V. Method and apparatus for filling a gap
US10410943B2 (en) 2016-10-13 2019-09-10 Asm Ip Holding B.V. Method for passivating a surface of a semiconductor and related systems
US10643826B2 (en) 2016-10-26 2020-05-05 Asm Ip Holdings B.V. Methods for thermally calibrating reaction chambers
US11532757B2 (en) 2016-10-27 2022-12-20 Asm Ip Holding B.V. Deposition of charge trapping layers
US10435790B2 (en) 2016-11-01 2019-10-08 Asm Ip Holding B.V. Method of subatmospheric plasma-enhanced ALD using capacitively coupled electrodes with narrow gap
US10714350B2 (en) 2016-11-01 2020-07-14 ASM IP Holdings, B.V. Methods for forming a transition metal niobium nitride film on a substrate by atomic layer deposition and related semiconductor device structures
US10229833B2 (en) 2016-11-01 2019-03-12 Asm Ip Holding B.V. Methods for forming a transition metal nitride film on a substrate by atomic layer deposition and related semiconductor device structures
US10134757B2 (en) 2016-11-07 2018-11-20 Asm Ip Holding B.V. Method of processing a substrate and a device manufactured by using the method
KR102546317B1 (en) 2016-11-15 2023-06-21 에이에스엠 아이피 홀딩 비.브이. Gas supply unit and substrate processing apparatus including the same
US10340135B2 (en) 2016-11-28 2019-07-02 Asm Ip Holding B.V. Method of topologically restricted plasma-enhanced cyclic deposition of silicon or metal nitride
KR20180068582A (en) 2016-12-14 2018-06-22 에이에스엠 아이피 홀딩 비.브이. Substrate processing apparatus
US11581186B2 (en) 2016-12-15 2023-02-14 Asm Ip Holding B.V. Sequential infiltration synthesis apparatus
US11447861B2 (en) 2016-12-15 2022-09-20 Asm Ip Holding B.V. Sequential infiltration synthesis apparatus and a method of forming a patterned structure
KR20180070971A (en) 2016-12-19 2018-06-27 에이에스엠 아이피 홀딩 비.브이. Substrate processing apparatus
US10269558B2 (en) 2016-12-22 2019-04-23 Asm Ip Holding B.V. Method of forming a structure on a substrate
US10867788B2 (en) 2016-12-28 2020-12-15 Asm Ip Holding B.V. Method of forming a structure on a substrate
US11390950B2 (en) 2017-01-10 2022-07-19 Asm Ip Holding B.V. Reactor system and method to reduce residue buildup during a film deposition process
US10655221B2 (en) 2017-02-09 2020-05-19 Asm Ip Holding B.V. Method for depositing oxide film by thermal ALD and PEALD
US10468261B2 (en) 2017-02-15 2019-11-05 Asm Ip Holding B.V. Methods for forming a metallic film on a substrate by cyclical deposition and related semiconductor device structures
US10529563B2 (en) 2017-03-29 2020-01-07 Asm Ip Holdings B.V. Method for forming doped metal oxide films on a substrate by cyclical deposition and related semiconductor device structures
KR102457289B1 (en) 2017-04-25 2022-10-21 에이에스엠 아이피 홀딩 비.브이. Method for depositing a thin film and manufacturing a semiconductor device
US10892156B2 (en) 2017-05-08 2021-01-12 Asm Ip Holding B.V. Methods for forming a silicon nitride film on a substrate and related semiconductor device structures
US10770286B2 (en) 2017-05-08 2020-09-08 Asm Ip Holdings B.V. Methods for selectively forming a silicon nitride film on a substrate and related semiconductor device structures
US10446393B2 (en) 2017-05-08 2019-10-15 Asm Ip Holding B.V. Methods for forming silicon-containing epitaxial layers and related semiconductor device structures
US10504742B2 (en) 2017-05-31 2019-12-10 Asm Ip Holding B.V. Method of atomic layer etching using hydrogen plasma
US10886123B2 (en) 2017-06-02 2021-01-05 Asm Ip Holding B.V. Methods for forming low temperature semiconductor layers and related semiconductor device structures
US11306395B2 (en) 2017-06-28 2022-04-19 Asm Ip Holding B.V. Methods for depositing a transition metal nitride film on a substrate by atomic layer deposition and related deposition apparatus
US10685834B2 (en) 2017-07-05 2020-06-16 Asm Ip Holdings B.V. Methods for forming a silicon germanium tin layer and related semiconductor device structures
KR20190009245A (en) 2017-07-18 2019-01-28 에이에스엠 아이피 홀딩 비.브이. Methods for forming a semiconductor device structure and related semiconductor device structures
US10541333B2 (en) 2017-07-19 2020-01-21 Asm Ip Holding B.V. Method for depositing a group IV semiconductor and related semiconductor device structures
US11374112B2 (en) 2017-07-19 2022-06-28 Asm Ip Holding B.V. Method for depositing a group IV semiconductor and related semiconductor device structures
US11018002B2 (en) 2017-07-19 2021-05-25 Asm Ip Holding B.V. Method for selectively depositing a Group IV semiconductor and related semiconductor device structures
US10590535B2 (en) 2017-07-26 2020-03-17 Asm Ip Holdings B.V. Chemical treatment, deposition and/or infiltration apparatus and method for using the same
US10605530B2 (en) 2017-07-26 2020-03-31 Asm Ip Holding B.V. Assembly of a liner and a flange for a vertical furnace as well as the liner and the vertical furnace
US10770336B2 (en) 2017-08-08 2020-09-08 Asm Ip Holding B.V. Substrate lift mechanism and reactor including same
US10692741B2 (en) 2017-08-08 2020-06-23 Asm Ip Holdings B.V. Radiation shield
US11139191B2 (en) 2017-08-09 2021-10-05 Asm Ip Holding B.V. Storage apparatus for storing cassettes for substrates and processing apparatus equipped therewith
US10249524B2 (en) 2017-08-09 2019-04-02 Asm Ip Holding B.V. Cassette holder assembly for a substrate cassette and holding member for use in such assembly
US11769682B2 (en) 2017-08-09 2023-09-26 Asm Ip Holding B.V. Storage apparatus for storing cassettes for substrates and processing apparatus equipped therewith
USD900036S1 (en) 2017-08-24 2020-10-27 Asm Ip Holding B.V. Heater electrical connector and adapter
US11830730B2 (en) 2017-08-29 2023-11-28 Asm Ip Holding B.V. Layer forming method and apparatus
KR102491945B1 (en) 2017-08-30 2023-01-26 에이에스엠 아이피 홀딩 비.브이. Substrate processing apparatus
US11295980B2 (en) 2017-08-30 2022-04-05 Asm Ip Holding B.V. Methods for depositing a molybdenum metal film over a dielectric surface of a substrate by a cyclical deposition process and related semiconductor device structures
US11056344B2 (en) 2017-08-30 2021-07-06 Asm Ip Holding B.V. Layer forming method
US10607895B2 (en) 2017-09-18 2020-03-31 Asm Ip Holdings B.V. Method for forming a semiconductor device structure comprising a gate fill metal
KR102630301B1 (en) 2017-09-21 2024-01-29 에이에스엠 아이피 홀딩 비.브이. Method of sequential infiltration synthesis treatment of infiltrateable material and structures and devices formed using same
US10844484B2 (en) 2017-09-22 2020-11-24 Asm Ip Holding B.V. Apparatus for dispensing a vapor phase reactant to a reaction chamber and related methods
US10658205B2 (en) 2017-09-28 2020-05-19 Asm Ip Holdings B.V. Chemical dispensing apparatus and methods for dispensing a chemical to a reaction chamber
US10403504B2 (en) 2017-10-05 2019-09-03 Asm Ip Holding B.V. Method for selectively depositing a metallic film on a substrate
US10319588B2 (en) 2017-10-10 2019-06-11 Asm Ip Holding B.V. Method for depositing a metal chalcogenide on a substrate by cyclical deposition
US10923344B2 (en) 2017-10-30 2021-02-16 Asm Ip Holding B.V. Methods for forming a semiconductor structure and related semiconductor structures
KR102443047B1 (en) 2017-11-16 2022-09-14 에이에스엠 아이피 홀딩 비.브이. Method of processing a substrate and a device manufactured by the same
US10910262B2 (en) 2017-11-16 2021-02-02 Asm Ip Holding B.V. Method of selectively depositing a capping layer structure on a semiconductor device structure
US11022879B2 (en) 2017-11-24 2021-06-01 Asm Ip Holding B.V. Method of forming an enhanced unexposed photoresist layer
KR102597978B1 (en) 2017-11-27 2023-11-06 에이에스엠 아이피 홀딩 비.브이. Storage device for storing wafer cassettes for use with batch furnaces
US11639811B2 (en) 2017-11-27 2023-05-02 Asm Ip Holding B.V. Apparatus including a clean mini environment
US10872771B2 (en) 2018-01-16 2020-12-22 Asm Ip Holding B. V. Method for depositing a material film on a substrate within a reaction chamber by a cyclical deposition process and related device structures
US11482412B2 (en) 2018-01-19 2022-10-25 Asm Ip Holding B.V. Method for depositing a gap-fill layer by plasma-assisted deposition
TW202325889A (en) 2018-01-19 2023-07-01 荷蘭商Ａｓｍ 智慧財產控股公司 Deposition method
USD903477S1 (en) 2018-01-24 2020-12-01 Asm Ip Holdings B.V. Metal clamp
US11018047B2 (en) 2018-01-25 2021-05-25 Asm Ip Holding B.V. Hybrid lift pin
US10535516B2 (en) 2018-02-01 2020-01-14 Asm Ip Holdings B.V. Method for depositing a semiconductor structure on a surface of a substrate and related semiconductor structures
USD880437S1 (en) 2018-02-01 2020-04-07 Asm Ip Holding B.V. Gas supply plate for semiconductor manufacturing apparatus
US11081345B2 (en) 2018-02-06 2021-08-03 Asm Ip Holding B.V. Method of post-deposition treatment for silicon oxide film
WO2019158960A1 (en) 2018-02-14 2019-08-22 Asm Ip Holding B.V. A method for depositing a ruthenium-containing film on a substrate by a cyclical deposition process
US10896820B2 (en) 2018-02-14 2021-01-19 Asm Ip Holding B.V. Method for depositing a ruthenium-containing film on a substrate by a cyclical deposition process
US10731249B2 (en) 2018-02-15 2020-08-04 Asm Ip Holding B.V. Method of forming a transition metal containing film on a substrate by a cyclical deposition process, a method for supplying a transition metal halide compound to a reaction chamber, and related vapor deposition apparatus
KR102636427B1 (en) 2018-02-20 2024-02-13 에이에스엠 아이피 홀딩 비.브이. Substrate processing method and apparatus
US10658181B2 (en) 2018-02-20 2020-05-19 Asm Ip Holding B.V. Method of spacer-defined direct patterning in semiconductor fabrication
US10975470B2 (en) 2018-02-23 2021-04-13 Asm Ip Holding B.V. Apparatus for detecting or monitoring for a chemical precursor in a high temperature environment
US11473195B2 (en) 2018-03-01 2022-10-18 Asm Ip Holding B.V. Semiconductor processing apparatus and a method for processing a substrate
US11629406B2 (en) 2018-03-09 2023-04-18 Asm Ip Holding B.V. Semiconductor processing apparatus comprising one or more pyrometers for measuring a temperature of a substrate during transfer of the substrate
US11114283B2 (en) 2018-03-16 2021-09-07 Asm Ip Holding B.V. Reactor, system including the reactor, and methods of manufacturing and using same
KR102646467B1 (en) 2018-03-27 2024-03-11 에이에스엠 아이피 홀딩 비.브이. Method of forming an electrode on a substrate and a semiconductor device structure including an electrode
US11230766B2 (en) 2018-03-29 2022-01-25 Asm Ip Holding B.V. Substrate processing apparatus and method
US10510536B2 (en) 2018-03-29 2019-12-17 Asm Ip Holding B.V. Method of depositing a co-doped polysilicon film on a surface of a substrate within a reaction chamber
US11088002B2 (en) 2018-03-29 2021-08-10 Asm Ip Holding B.V. Substrate rack and a substrate processing system and method
KR102501472B1 (en) 2018-03-30 2023-02-20 에이에스엠 아이피 홀딩 비.브이. Substrate processing method
TWI811348B (en) 2018-05-08 2023-08-11 荷蘭商Ａｓｍ 智慧財產控股公司 Methods for depositing an oxide film on a substrate by a cyclical deposition process and related device structures
TWI816783B (en) 2018-05-11 2023-10-01 荷蘭商Ａｓｍ 智慧財產控股公司 Methods for forming a doped metal carbide film on a substrate and related semiconductor device structures
KR102596988B1 (en) 2018-05-28 2023-10-31 에이에스엠 아이피 홀딩 비.브이. Method of processing a substrate and a device manufactured by the same
US11270899B2 (en) 2018-06-04 2022-03-08 Asm Ip Holding B.V. Wafer handling chamber with moisture reduction
US11718913B2 (en) 2018-06-04 2023-08-08 Asm Ip Holding B.V. Gas distribution system and reactor system including same
US11286562B2 (en) 2018-06-08 2022-03-29 Asm Ip Holding B.V. Gas-phase chemical reactor and method of using same
US10797133B2 (en) 2018-06-21 2020-10-06 Asm Ip Holding B.V. Method for depositing a phosphorus doped silicon arsenide film and related semiconductor device structures
KR102568797B1 (en) 2018-06-21 2023-08-21 에이에스엠 아이피 홀딩 비.브이. Substrate processing system
CN112292477A (en) 2018-06-27 2021-01-29 Asm Ip私人控股有限公司 Cyclic deposition methods for forming metal-containing materials and films and structures containing metal-containing materials
JP2021529254A (en) 2018-06-27 2021-10-28 エーエスエム・アイピー・ホールディング・ベー・フェー Periodic deposition methods for forming metal-containing materials and films and structures containing metal-containing materials
KR20200002519A (en) 2018-06-29 2020-01-08 에이에스엠 아이피 홀딩 비.브이. Method for depositing a thin film and manufacturing a semiconductor device
US10612136B2 (en) 2018-06-29 2020-04-07 ASM IP Holding, B.V. Temperature-controlled flange and reactor system including same
US10388513B1 (en) 2018-07-03 2019-08-20 Asm Ip Holding B.V. Method for depositing silicon-free carbon-containing film as gap-fill layer by pulse plasma-assisted deposition
US10755922B2 (en) 2018-07-03 2020-08-25 Asm Ip Holding B.V. Method for depositing silicon-free carbon-containing film as gap-fill layer by pulse plasma-assisted deposition
US10767789B2 (en) 2018-07-16 2020-09-08 Asm Ip Holding B.V. Diaphragm valves, valve components, and methods for forming valve components
US10483099B1 (en) 2018-07-26 2019-11-19 Asm Ip Holding B.V. Method for forming thermally stable organosilicon polymer film
US11053591B2 (en) 2018-08-06 2021-07-06 Asm Ip Holding B.V. Multi-port gas injection system and reactor system including same
US10883175B2 (en) 2018-08-09 2021-01-05 Asm Ip Holding B.V. Vertical furnace for processing substrates and a liner for use therein
US10829852B2 (en) 2018-08-16 2020-11-10 Asm Ip Holding B.V. Gas distribution device for a wafer processing apparatus
US11430674B2 (en) 2018-08-22 2022-08-30 Asm Ip Holding B.V. Sensor array, apparatus for dispensing a vapor phase reactant to a reaction chamber and related methods
US11024523B2 (en) 2018-09-11 2021-06-01 Asm Ip Holding B.V. Substrate processing apparatus and method
KR20200030162A (en) 2018-09-11 2020-03-20 에이에스엠 아이피 홀딩 비.브이. Method for deposition of a thin film
US11049751B2 (en) 2018-09-14 2021-06-29 Asm Ip Holding B.V. Cassette supply system to store and handle cassettes and processing apparatus equipped therewith
CN110970344A (en) 2018-10-01 2020-04-07 Asm Ip控股有限公司 Substrate holding apparatus, system including the same, and method of using the same
US11232963B2 (en) 2018-10-03 2022-01-25 Asm Ip Holding B.V. Substrate processing apparatus and method
KR102592699B1 (en) 2018-10-08 2023-10-23 에이에스엠 아이피 홀딩 비.브이. Substrate support unit and apparatuses for depositing thin film and processing the substrate including the same
US10847365B2 (en) 2018-10-11 2020-11-24 Asm Ip Holding B.V. Method of forming conformal silicon carbide film by cyclic CVD
US10811256B2 (en) 2018-10-16 2020-10-20 Asm Ip Holding B.V. Method for etching a carbon-containing feature
KR102546322B1 (en) 2018-10-19 2023-06-21 에이에스엠 아이피 홀딩 비.브이. Substrate processing apparatus and substrate processing method
KR102605121B1 (en) 2018-10-19 2023-11-23 에이에스엠 아이피 홀딩 비.브이. Substrate processing apparatus and substrate processing method
USD948463S1 (en) 2018-10-24 2022-04-12 Asm Ip Holding B.V. Susceptor for semiconductor substrate supporting apparatus
US10381219B1 (en) 2018-10-25 2019-08-13 Asm Ip Holding B.V. Methods for forming a silicon nitride film
US11087997B2 (en) 2018-10-31 2021-08-10 Asm Ip Holding B.V. Substrate processing apparatus for processing substrates
KR20200051105A (en) 2018-11-02 2020-05-13 에이에스엠 아이피 홀딩 비.브이. Substrate support unit and substrate processing apparatus including the same
US11572620B2 (en) 2018-11-06 2023-02-07 Asm Ip Holding B.V. Methods for selectively depositing an amorphous silicon film on a substrate
US11031242B2 (en) 2018-11-07 2021-06-08 Asm Ip Holding B.V. Methods for depositing a boron doped silicon germanium film
US10847366B2 (en) 2018-11-16 2020-11-24 Asm Ip Holding B.V. Methods for depositing a transition metal chalcogenide film on a substrate by a cyclical deposition process
US10818758B2 (en) 2018-11-16 2020-10-27 Asm Ip Holding B.V. Methods for forming a metal silicate film on a substrate in a reaction chamber and related semiconductor device structures
US10559458B1 (en) 2018-11-26 2020-02-11 Asm Ip Holding B.V. Method of forming oxynitride film
US11217444B2 (en) 2018-11-30 2022-01-04 Asm Ip Holding B.V. Method for forming an ultraviolet radiation responsive metal oxide-containing film
KR102636428B1 (en) 2018-12-04 2024-02-13 에이에스엠 아이피 홀딩 비.브이. A method for cleaning a substrate processing apparatus
US11158513B2 (en) 2018-12-13 2021-10-26 Asm Ip Holding B.V. Methods for forming a rhenium-containing film on a substrate by a cyclical deposition process and related semiconductor device structures
JP2020096183A (en) 2018-12-14 2020-06-18 エーエスエム・アイピー・ホールディング・ベー・フェー Method of forming device structure using selective deposition of gallium nitride, and system for the same
TWI819180B (en) 2019-01-17 2023-10-21 荷蘭商Ａｓｍ 智慧財產控股公司 Methods of forming a transition metal containing film on a substrate by a cyclical deposition process
KR20200091543A (en) 2019-01-22 2020-07-31 에이에스엠 아이피 홀딩 비.브이. Semiconductor processing device
CN111524788B (en) 2019-02-01 2023-11-24 Asm Ip私人控股有限公司 Method for topologically selective film formation of silicon oxide
JP2020136677A (en) 2019-02-20 2020-08-31 エーエスエム・アイピー・ホールディング・ベー・フェー Periodic accumulation method for filing concave part formed inside front surface of base material, and device
KR102638425B1 (en) 2019-02-20 2024-02-21 에이에스엠 아이피 홀딩 비.브이. Method and apparatus for filling a recess formed within a substrate surface
US11482533B2 (en) 2019-02-20 2022-10-25 Asm Ip Holding B.V. Apparatus and methods for plug fill deposition in 3-D NAND applications
KR102626263B1 (en) 2019-02-20 2024-01-16 에이에스엠 아이피 홀딩 비.브이. Cyclical deposition method including treatment step and apparatus for same
JP2020133004A (en) 2019-02-22 2020-08-31 エーエスエム・アイピー・ホールディング・ベー・フェー Base material processing apparatus and method for processing base material
US11742198B2 (en) 2019-03-08 2023-08-29 Asm Ip Holding B.V. Structure including SiOCN layer and method of forming same
KR20200108242A (en) 2019-03-08 2020-09-17 에이에스엠 아이피 홀딩 비.브이. Method for Selective Deposition of Silicon Nitride Layer and Structure Including Selectively-Deposited Silicon Nitride Layer
KR20200108243A (en) 2019-03-08 2020-09-17 에이에스엠 아이피 홀딩 비.브이. Structure Including SiOC Layer and Method of Forming Same
JP2020167398A (en) 2019-03-28 2020-10-08 エーエスエム・アイピー・ホールディング・ベー・フェー Door opener and substrate processing apparatus provided therewith
KR20200116855A (en) 2019-04-01 2020-10-13 에이에스엠 아이피 홀딩 비.브이. Method of manufacturing semiconductor device
US11447864B2 (en) 2019-04-19 2022-09-20 Asm Ip Holding B.V. Layer forming method and apparatus
KR20200125453A (en) 2019-04-24 2020-11-04 에이에스엠 아이피 홀딩 비.브이. Gas-phase reactor system and method of using same
KR20200130121A (en) 2019-05-07 2020-11-18 에이에스엠 아이피 홀딩 비.브이. Chemical source vessel with dip tube
KR20200130118A (en) 2019-05-07 2020-11-18 에이에스엠 아이피 홀딩 비.브이. Method for Reforming Amorphous Carbon Polymer Film
KR20200130652A (en) 2019-05-10 2020-11-19 에이에스엠 아이피 홀딩 비.브이. Method of depositing material onto a surface and structure formed according to the method
JP2020188255A (en) 2019-05-16 2020-11-19 エーエスエム アイピー ホールディング ビー．ブイ． Wafer boat handling device, vertical batch furnace, and method
USD975665S1 (en) 2019-05-17 2023-01-17 Asm Ip Holding B.V. Susceptor shaft
USD947913S1 (en) 2019-05-17 2022-04-05 Asm Ip Holding B.V. Susceptor shaft
USD935572S1 (en) 2019-05-24 2021-11-09 Asm Ip Holding B.V. Gas channel plate
USD922229S1 (en) 2019-06-05 2021-06-15 Asm Ip Holding B.V. Device for controlling a temperature of a gas supply unit
KR20200141002A (en) 2019-06-06 2020-12-17 에이에스엠 아이피 홀딩 비.브이. Method of using a gas-phase reactor system including analyzing exhausted gas
KR20200143254A (en) 2019-06-11 2020-12-23 에이에스엠 아이피 홀딩 비.브이. Method of forming an electronic structure using an reforming gas, system for performing the method, and structure formed using the method
USD944946S1 (en) 2019-06-14 2022-03-01 Asm Ip Holding B.V. Shower plate
USD931978S1 (en) 2019-06-27 2021-09-28 Asm Ip Holding B.V. Showerhead vacuum transport
KR20210005515A (en) 2019-07-03 2021-01-14 에이에스엠 아이피 홀딩 비.브이. Temperature control assembly for substrate processing apparatus and method of using same
JP2021015791A (en) 2019-07-09 2021-02-12 エーエスエム アイピー ホールディング ビー．ブイ． Plasma device and substrate processing method using coaxial waveguide
CN112216646A (en) 2019-07-10 2021-01-12 Asm Ip私人控股有限公司 Substrate supporting assembly and substrate processing device comprising same
KR20210010307A (en) 2019-07-16 2021-01-27 에이에스엠 아이피 홀딩 비.브이. Substrate processing apparatus
KR20210010820A (en) 2019-07-17 2021-01-28 에이에스엠 아이피 홀딩 비.브이. Methods of forming silicon germanium structures
KR20210010816A (en) 2019-07-17 2021-01-28 에이에스엠 아이피 홀딩 비.브이. Radical assist ignition plasma system and method
US11643724B2 (en) 2019-07-18 2023-05-09 Asm Ip Holding B.V. Method of forming structures using a neutral beam
CN112242296A (en) 2019-07-19 2021-01-19 Asm Ip私人控股有限公司 Method of forming topologically controlled amorphous carbon polymer films
TW202113936A (en) 2019-07-29 2021-04-01 荷蘭商Ａｓｍ Ｉｐ私人控股有限公司 Methods for selective deposition utilizing n-type dopants and/or alternative dopants to achieve high dopant incorporation
CN112309900A (en) 2019-07-30 2021-02-02 Asm Ip私人控股有限公司 Substrate processing apparatus
CN112309899A (en) 2019-07-30 2021-02-02 Asm Ip私人控股有限公司 Substrate processing apparatus
US11227782B2 (en) 2019-07-31 2022-01-18 Asm Ip Holding B.V. Vertical batch furnace assembly
US11587814B2 (en) 2019-07-31 2023-02-21 Asm Ip Holding B.V. Vertical batch furnace assembly
US11587815B2 (en) 2019-07-31 2023-02-21 Asm Ip Holding B.V. Vertical batch furnace assembly
CN112323048B (en) 2019-08-05 2024-02-09 Asm Ip私人控股有限公司 Liquid level sensor for chemical source container
USD965524S1 (en) 2019-08-19 2022-10-04 Asm Ip Holding B.V. Susceptor support
USD965044S1 (en) 2019-08-19 2022-09-27 Asm Ip Holding B.V. Susceptor shaft
JP2021031769A (en) 2019-08-21 2021-03-01 エーエスエム アイピー ホールディング ビー．ブイ． Production apparatus of mixed gas of film deposition raw material and film deposition apparatus
KR20210024423A (en) 2019-08-22 2021-03-05 에이에스엠 아이피 홀딩 비.브이. Method for forming a structure with a hole
USD979506S1 (en) 2019-08-22 2023-02-28 Asm Ip Holding B.V. Insulator
USD940837S1 (en) 2019-08-22 2022-01-11 Asm Ip Holding B.V. Electrode
USD930782S1 (en) 2019-08-22 2021-09-14 Asm Ip Holding B.V. Gas distributor
USD949319S1 (en) 2019-08-22 2022-04-19 Asm Ip Holding B.V. Exhaust duct
KR20210024420A (en) 2019-08-23 2021-03-05 에이에스엠 아이피 홀딩 비.브이. Method for depositing silicon oxide film having improved quality by peald using bis(diethylamino)silane
US11286558B2 (en) 2019-08-23 2022-03-29 Asm Ip Holding B.V. Methods for depositing a molybdenum nitride film on a surface of a substrate by a cyclical deposition process and related semiconductor device structures including a molybdenum nitride film
KR20210029090A (en) 2019-09-04 2021-03-15 에이에스엠 아이피 홀딩 비.브이. Methods for selective deposition using a sacrificial capping layer
KR20210029663A (en) 2019-09-05 2021-03-16 에이에스엠 아이피 홀딩 비.브이. Substrate processing apparatus
US11562901B2 (en) 2019-09-25 2023-01-24 Asm Ip Holding B.V. Substrate processing method
CN112593212B (en) 2019-10-02 2023-12-22 Asm Ip私人控股有限公司 Method for forming topologically selective silicon oxide film by cyclic plasma enhanced deposition process
TW202129060A (en) 2019-10-08 2021-08-01 荷蘭商Ａｓｍ Ｉｐ控股公司 Substrate processing device, and substrate processing method
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KR20210045930A (en) 2019-10-16 2021-04-27 에이에스엠 아이피 홀딩 비.브이. Method of Topology-Selective Film Formation of Silicon Oxide
US11637014B2 (en) 2019-10-17 2023-04-25 Asm Ip Holding B.V. Methods for selective deposition of doped semiconductor material
KR20210047808A (en) 2019-10-21 2021-04-30 에이에스엠 아이피 홀딩 비.브이. Apparatus and methods for selectively etching films
US11646205B2 (en) 2019-10-29 2023-05-09 Asm Ip Holding B.V. Methods of selectively forming n-type doped material on a surface, systems for selectively forming n-type doped material, and structures formed using same
KR20210054983A (en) 2019-11-05 2021-05-14 에이에스엠 아이피 홀딩 비.브이. Structures with doped semiconductor layers and methods and systems for forming same
US11501968B2 (en) 2019-11-15 2022-11-15 Asm Ip Holding B.V. Method for providing a semiconductor device with silicon filled gaps
KR20210062561A (en) 2019-11-20 2021-05-31 에이에스엠 아이피 홀딩 비.브이. Method of depositing carbon-containing material on a surface of a substrate, structure formed using the method, and system for forming the structure
US11450529B2 (en) 2019-11-26 2022-09-20 Asm Ip Holding B.V. Methods for selectively forming a target film on a substrate comprising a first dielectric surface and a second metallic surface
CN112951697A (en) 2019-11-26 2021-06-11 Asm Ip私人控股有限公司 Substrate processing apparatus
CN112885693A (en) 2019-11-29 2021-06-01 Asm Ip私人控股有限公司 Substrate processing apparatus
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JP2021090042A (en) 2019-12-02 2021-06-10 エーエスエム アイピー ホールディング ビー．ブイ． Substrate processing apparatus and substrate processing method
KR20210070898A (en) 2019-12-04 2021-06-15 에이에스엠 아이피 홀딩 비.브이. Substrate processing apparatus
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US11527403B2 (en) 2019-12-19 2022-12-13 Asm Ip Holding B.V. Methods for filling a gap feature on a substrate surface and related semiconductor structures
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KR20210095050A (en) 2020-01-20 2021-07-30 에이에스엠 아이피 홀딩 비.브이. Method of forming thin film and method of modifying surface of thin film
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US11776846B2 (en) 2020-02-07 2023-10-03 Asm Ip Holding B.V. Methods for depositing gap filling fluids and related systems and devices
US11781243B2 (en) 2020-02-17 2023-10-10 Asm Ip Holding B.V. Method for depositing low temperature phosphorous-doped silicon
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US11876356B2 (en) 2020-03-11 2024-01-16 Asm Ip Holding B.V. Lockout tagout assembly and system and method of using same
KR20210116240A (en) 2020-03-11 2021-09-27 에이에스엠 아이피 홀딩 비.브이. Substrate handling device with adjustable joints
CN113394086A (en) 2020-03-12 2021-09-14 Asm Ip私人控股有限公司 Method for producing a layer structure having a target topological profile
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US11821078B2 (en) 2020-04-15 2023-11-21 Asm Ip Holding B.V. Method for forming precoat film and method for forming silicon-containing film
CN113555279A (en) 2020-04-24 2021-10-26 Asm Ip私人控股有限公司 Method of forming vanadium nitride-containing layers and structures including the same
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KR20210132600A (en) 2020-04-24 2021-11-04 에이에스엠 아이피 홀딩 비.브이. Methods and systems for depositing a layer comprising vanadium, nitrogen, and a further element
KR20210134226A (en) 2020-04-29 2021-11-09 에이에스엠 아이피 홀딩 비.브이. Solid source precursor vessel
KR20210134869A (en) 2020-05-01 2021-11-11 에이에스엠 아이피 홀딩 비.브이. Fast FOUP swapping with a FOUP handler
KR20210141379A (en) 2020-05-13 2021-11-23 에이에스엠 아이피 홀딩 비.브이. Laser alignment fixture for a reactor system
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KR20210145078A (en) 2020-05-21 2021-12-01 에이에스엠 아이피 홀딩 비.브이. Structures including multiple carbon layers and methods of forming and using same
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USD990534S1 (en) 2020-09-11 2023-06-27 Asm Ip Holding B.V. Weighted lift pin
USD1012873S1 (en) 2020-09-24 2024-01-30 Asm Ip Holding B.V. Electrode for semiconductor processing apparatus
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KR20220076343A (en) 2020-11-30 2022-06-08 에이에스엠 아이피 홀딩 비.브이. an injector configured for arrangement within a reaction chamber of a substrate processing apparatus
US11946137B2 (en) 2020-12-16 2024-04-02 Asm Ip Holding B.V. Runout and wobble measurement fixtures
TW202231903A (en) 2020-12-22 2022-08-16 荷蘭商Ａｓｍ Ｉｐ私人控股有限公司 Transition metal deposition method, transition metal layer, and deposition assembly for depositing transition metal on substrate
CN114752921B (en) * 2021-01-08 2023-08-18 江苏鲁汶仪器股份有限公司 Film coating method in flip chip
USD981973S1 (en) 2021-05-11 2023-03-28 Asm Ip Holding B.V. Reactor wall for substrate processing apparatus
USD980814S1 (en) 2021-05-11 2023-03-14 Asm Ip Holding B.V. Gas distributor for substrate processing apparatus
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USD990441S1 (en) 2021-09-07 2023-06-27 Asm Ip Holding B.V. Gas flow control plate

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