JP3759360B2 - Waveform measuring device - Google Patents

Description

[0001]
BACKGROUND OF THE INVENTION
The present invention relates to a waveform measuring apparatus, and more particularly to improvement of a trigger function.
[0002]
[Prior art]
The waveform measuring device converts various phenomena such as machinery, chemistry, biology, and geology into electrical signals by sensors suitable for each, and loads them into the memory as measurement data, and the state of change of those measurement data over time Is visualized as a waveform on a display screen or recording paper, and is widely used in various fields.
[0003]
By the way, the capacity of the memory for storing the measurement data of such a waveform measuring apparatus is finite, and it is impossible to capture all the measurement data. Therefore, a plurality of measurement data capture conditions are set as trigger conditions according to each measurement purpose, and when those trigger conditions are satisfied, a predetermined number of measurement data is captured in the memory on the basis of the time point. ing.
[0004]
However, the priorities of multiple trigger conditions in the conventional waveform measuring device are not given special considerations. Execute. Until the acquisition of the measurement data is completed, the establishment of other trigger conditions is completely ignored.
[0005]
FIG. 3 is a flowchart showing an outline of such conventional measurement data fetching processing. Data is acquired by starting the measurement operation (ST1). It is determined whether or not the acquired data satisfies the trigger condition (ST2). If the trigger condition is satisfied, a data storage process for fetching the data into the memory is performed (ST3). If not satisfied, the process returns to ST1 to acquire the next data. After the data storage processing, it is determined whether or not a predetermined number of preset data has been stored (ST4), and the processing after ST3 is repeated until the predetermined number of data is fetched. finish.
[0006]
FIG. 4 is an explanatory view of taking in measurement data in a conventional waveform measuring apparatus. In FIG. 4, the trigger is established when the measurement data of Ch1 is higher than level 1 and the trigger is established when the measurement data of Ch2 is lower than level 2, and the trigger is established. Ten measurement data are acquired from the time when the trigger is established.
[0007]
That is, the trigger is established when the Ch1 measurement data becomes higher than the level 1, and the acquisition of the ten Ch1 measurement data is started. Here, when attention is paid to the measurement data of Ch2, it is lower than level 2 immediately before the ninth measurement data of Ch1, but since a predetermined number of acquisition of measurement data of Ch1 has not been completed, Ch2 The establishment of the trigger condition is ignored.
[0008]
As a result, for example, even if the Ch2 trigger condition is more important than the Ch1 trigger condition, the Ch2 measurement data cannot be captured.
[0009]
[Problems to be solved by the invention]
The present invention focuses on the problems of such a conventional waveform measuring apparatus, and its purpose is to perform waveform measurement that can reliably capture measurement data of an event that satisfies a trigger condition having a high degree of importance into a memory. To provide an apparatus.
[0010]
[Means for Solving the Problems]
In order to achieve such an object, according to a first aspect of the present invention, a waveform measuring apparatus configured to set a priority to a trigger condition and take waveform data into a memory based on the priority. In
When there is no free space for capturing measurement data of an event for which a trigger condition having a high priority is satisfied, the memory is overwritten and captured.
[0015]
The measurement data of the event for which the trigger condition with the highest priority at that time is satisfied is always taken into the memory.
[0018]
DETAILED DESCRIPTION OF THE INVENTION
Hereinafter, embodiments of the present invention will be described with reference to the drawings.
FIG. 1 is an explanatory view of measurement data fetching by the waveform measuring apparatus according to the present invention, and shows a measurement example of two channels similar to FIG. The difference between FIG. 1 and FIG. 4 is that the priority order of the trigger condition of Ch2 is set higher than that of Ch1, and the acquisition of measurement data into the memory is controlled based on the priority order.
[0019]
In FIG. 1, when the measurement data of Ch1 becomes higher than level 1, the trigger is established, and the acquisition of 10 measurement data of Ch1 is started.
On the other hand, when attention is paid to the measurement data of Ch2, the trigger condition of Ch2 is satisfied because the level becomes lower than level 2 immediately before the ninth measurement data of Ch1.
Here, since the priority order of the trigger condition of Ch2 is set higher than that of Ch1, the acquisition process of the measurement data of Ch1 having the lower priority being executed is immediately interrupted, and the measurement data of Ch1 already stored in the memory. Is discarded and initialized. Then, based on the establishment of the Ch2 trigger condition, the Ch2 measurement data is fetched, and ten pieces of data are fetched.
[0020]
Thereby, in the waveform measuring apparatus configured to capture the measurement data of Ch1 and Ch2 into the common memory, the measurement data of Ch2 having a high trigger condition priority is reliably captured.
[0021]
FIG. 2 is a flowchart showing the procedure of the process of FIG. Similarly to FIG. 3, data is acquired by starting the measurement operation (ST1). It is determined whether or not the acquired data satisfies the trigger condition (ST2). If the trigger condition is satisfied, a data storage process for fetching the data into the memory is performed (ST3). If not satisfied, the process returns to ST1 to acquire the next data. After the data storage processing, it is determined whether or not a predetermined number of data set in advance has been stored (ST4), and the processing ends when the predetermined number of data is captured. The processing from ST3 is repeated until a predetermined number of data is fetched. In this repetition process, it is determined whether or not the priority order of the trigger condition is higher than that currently stored for each acquired data (ST5). If it is not higher, the process after ST3 is repeated. If the priority order of the trigger condition of the acquired data is high, the already stored data is discarded to initialize the data storage process (ST6), and the processes after ST3 are executed.
[0022]
It should be noted that, when capturing measurement data of an event for which a trigger condition having a high priority is satisfied, it may be possible to overwrite the already stored measurement data when there is no free space in the memory.
[0023]
Thereby, the measurement data of the event for which the trigger condition with the highest priority at that time is always satisfied is taken into the memory.
[0024]
In addition, the present invention is not limited to the case where the measurement data of a plurality of channels is taken into a common memory, but a plurality of trigger conditions are set with priority for the measurement data of a single channel, and the capacity is limited. This is also effective when the measurement data of the event for which the trigger condition with the highest priority is established at that time is always taken into the memory.
[0025]
In addition, the trigger condition in the present invention may be set as a signal level, set as a waveform pattern, or may be a combination of these, and may be appropriately used depending on the measurement application. Good.
[0026]
【The invention's effect】
As described above, according to the present invention, it is possible to realize a waveform measuring apparatus that can reliably capture measurement data of an event satisfying a trigger condition having a high importance level into a memory.
[Brief description of the drawings]
BRIEF DESCRIPTION OF DRAWINGS FIG. 1 is an explanatory diagram of a measurement data capturing state of a waveform measuring apparatus according to the present invention.
FIG. 2 is a flowchart showing a processing procedure of FIG. 1;
FIG. 3 is an explanatory diagram of a measurement data capturing state of a conventional waveform measuring apparatus.
4 is a flowchart showing a processing procedure of FIG. 3;
[Explanation of symbols]
Data Measurement data Level Trigger level

Claims (1)

In the waveform measuring apparatus configured to set the priority order to the trigger condition and to load the waveform data into the memory based on the priority order,
A waveform measuring apparatus, wherein when there is no free space for capturing measurement data of an event for which a trigger condition having a high priority is satisfied in the memory, the waveform measurement apparatus is overwritten and captured.

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