JP3635479B2 - Test execution control method and apparatus for switching equipment - Google Patents

Description

[0001]
BACKGROUND OF THE INVENTION
The present invention has the same functions or specifications specs as viewed from the outside, but the physical configuration of the internal device is different and the type or model is different, for example, the difference between the existing exchange and the next exchange or the selected parts of the manufacturer The present invention relates to a test execution control method for an exchange apparatus and its apparatus for simultaneously maintaining or developing different types of exchanges caused by, for example.
[0002]
[Prior art]
FIG. 10 is an explanatory diagram of a conventional exchange test. In the figure, 10A and 10B are different types of switch A under test, B under test B, 101A and 101B are terminal devices, 102A and 102B are switch switches, 103A and 103B are line devices, 104A is a central processing processor (CPU), Reference numerals 105B, 106B, and 107B denote processors (LNP, MCP, and CSP) for function distribution processing, 108A denotes console A that controls the central processing processor (CPU), and 108B denotes each processor (LNP, MCP, and CSP) for function distribution processing. The consoles B, 109A, 109B to be controlled are maintenance terminal devices (TYPE).
[0003]
In the figure, 110A and 110B are terminal test control devices that control pseudo terminal operations such as the generation of test calls or pseudo calls to the terminal devices 101A and 101B, and 111A and 111B are tests for the line devices 103A and 103B. 112A is a console A test control device that controls the operation of the console A during the test, 112B is a console B test control device that controls the operation of the console B during the test, 113A and 113B are maintenance terminal device (TYPE) test control devices that control the operation of the maintenance terminal device (TYPE) during testing, and 114A is provided with a test scenario 115A corresponding to the exchange A to be tested, and the test control devices 110A to 113A. , 114B is an automatic test control device that controls the test according to the test scenario 115A. Comprising a test scenario 115B, the an automatic test controller for controlling each test controller 110B~113B according to the test scenario 115B.
[0004]
Even if the switch under test A (10A) and the switch under test B (10B) have the same function or specification spec seen from the outside, if the type or type of the device such as the processor is different, the system startup or program The loading procedure and the like are different, and the console and its interface for controlling the processor are different for each switch under test.
[0005]
Therefore, in the test of the switch under test A (10A) and the switch under test B (10B), the test control device of the part that does not depend on the difference between the devices under test switch, for example, the terminal test control devices 110A and 110B and the line test The control devices 111A, 111B, etc. can be common to each exchange A to be tested A (10A) and exchange B to be tested B (10B), but the test control of the part depending on the difference in the equipment of the exchange to be tested Devices such as the console A test control device 112A, the console B test control device 112B, etc. must be prepared for each exchange A (10A) and exchange B (10B).
[0006]
Therefore, the test scenario 115A and the test scenario 115B, which are procedures corresponding to each test item in the automatic test control device 114A and the automatic test control device 114B, are individually determined for each switch under test having different types or types of devices such as processors. Each switch was created separately and tested according to different test scenarios 115A and 115B.
[0007]
[Problems to be solved by the invention]
As mentioned above, when testing the switching equipment of different models with different physical configurations of the internal equipment, even with the same test items and tests with the same content, it was created with different test procedures for each switching equipment model. Multiple sets of test scenarios had to be prepared.
[0008]
In addition, since the test scenario is different for each exchange device of different models, and the result of the test based on the test scenario is also different for each exchange device, the test scenario and test results performed on one exchange device. Log information could not be used for the test scenario and test result log information of the other exchange equipment.
[0009]
The present invention uses a common test scenario for switching equipment of different models, generates a testing scenario for each model from the common testing scenario, and also logs information on testing scenarios and test results between different switching equipment. The purpose is to reduce the burden of creating test scenarios and confirming and correcting them by making them possible to compare and collate with each other.
[0010]
[Means for Solving the Problems]
The test execution control method for an exchange apparatus according to the present invention includes: (1) a test scenario that is an execution procedure for each test item of an exchange apparatus; a logical test scenario and a model that do not depend on differences in physical configurations of different exchange apparatuses; The logical test scenario is converted into a physical test scenario corresponding to the switch under test apparatus that differs for each model, and the physical test scenario depends on the physical test scenario. This includes a process of controlling the test operation of the exchange apparatus of different models and executing the test of the exchange apparatus of different models according to a logical test scenario that does not depend on a difference in physical configuration of the exchange apparatus.
[0011]
(2) A test of a plurality of exchange devices of different models is executed according to the same logic test scenario, and the test results are mutually obtained from the logic test log information collected by the execution of the tests of a plurality of exchange devices of different models. This includes a process of comparing and collating, extracting and displaying logic test log information with different test results.
[0012]
And (3) including a process of configuring the logic scenario from a logic test scenario group for each test item and a logic macro scenario group used for general purposes.
[0013]
(4) It includes a process of relaying the physical test scenario and executing and controlling a test of a plurality of remote switching equipments at a remote location using one logical test scenario.
[0014]
(5) A test execution control device for an exchange apparatus according to the present invention includes a logic test scenario that is an execution procedure for each test item of an exchange apparatus and does not depend on a difference in physical configuration of different exchange apparatuses, and the logic Logic test scenario execution control unit that reads test scenarios and passes the read logic test scenario to the logic / physical test scenario conversion unit, and logic for converting the logic test scenario into a physical test scenario corresponding to the switch under test equipment different for each model A physical test scenario conversion unit, a physical test scenario execution control unit that controls the test operation of the exchange device of different models according to the physical test scenario, and a device under test instruction based on the physical test scenario are relayed to the exchange device under test And an adapter unit.
[0015]
(6) A logical test log collection unit that collects log information in the logical test scenario execution control unit and a log in the physical test scenario execution control unit when testing a plurality of exchange apparatuses of different models according to the same logical test scenario. A physical test log collection unit that collects information, and a test result evaluation unit that extracts and displays logical test log information with different test results by comparing and collating test results with each other from the logical test log information. It is.
[0016]
(7) The logic scenario is composed of a logic test scenario group for each test item and a logic macro scenario group for general use.
[0017]
(8) The adapter unit relays the physical test scenario to a plurality of switching equipment under test at remote locations.
[0018]
DETAILED DESCRIPTION OF THE INVENTION
FIG. 1 is an explanatory view of a main part of an embodiment of the present invention. 11 is a logical test scenario, 12 is the name of the switch under test, 13 is a logical / physical test scenario conversion unit, 14A is a physical test scenario of the switch under test A, 14B is a physical test scenario of the switch under test B, and 15A is a test Exchange devices A and 15B are the exchange device B under test.
[0019]
In order to absorb differences in hardware devices such as processors for the switch under test equipment A (15A) and switch under test equipment B (15B) of different models, the test scenario is a logical test that does not depend on the difference in the switch equipment. The scenario 11 and the physical test scenarios 14A and 14B depending on the difference between the exchange devices are separated into two layers.
[0020]
The logical test scenario 11 is subjected to a physical test corresponding to the physical configuration of the physical test scenario 14A or the switching device B corresponding to the physical configuration of each switching device under test, for example, the switching device A, by the logical / physical test scenario conversion unit 13. It is converted into scenario 14B.
The logical / physical test scenario conversion unit 13 can execute the test of the exchange apparatus using the common logical test scenario for the exchanges under test of different models.
[0021]
The logical / physical test scenario conversion unit 13 receives the logical test scenario 11 and the switching equipment name 12 to be tested, and a physical test scenario that is a test control apparatus command group corresponding to the switching equipment A based on them. A physical test scenario 14B, which is a test control device command group corresponding to 14A or the exchange apparatus under test B, is generated.
[0022]
Next, the test execution control unit of the exchange apparatus according to the embodiment of the present invention will be described with reference to FIG. A portion 2 surrounded by an alternate long and short dash line in FIG. 2 is a test execution control unit of the exchange apparatus. The test execution control unit 2 of the exchange apparatus includes a logical test scenario execution control unit 4, a logical / physical test scenario conversion unit 5, a physical test scenario execution control unit 6, an adapter unit 7, and a test result evaluation unit 8. Composed.
[0023]
In FIG. 2, the logic test scenario execution control unit 4 reads the logic test scenario 11 composed of the logic test scenario group 11-1 and the logic macro scenario group 11-2, executes the instructions of the scenario, Based on the above, the logical test scenario 11 is converted into a logical device instruction command 4-1 and passed to the logical / physical test scenario conversion unit 5. Also, necessary log information is collected as the logic test log 4-2 during execution of the logic test scenario instructions.
[0024]
The logical / physical test scenario conversion unit 5 searches the logical / physical scenario conversion table 50 from the logical device instruction command 4-1 to generate a physical test scenario 5-1 corresponding to the switching device under test. The physical test scenario 5-1 is transferred to the physical test scenario execution control unit 6.
[0025]
The physical test scenario execution control unit 6 executes the instruction of the physical test scenario 5-1, and passes the device under test instruction 6-1 corresponding to the corresponding device under test to the adapter unit 7. Further, the physical test scenario execution control unit 6 collects log information necessary as the physical test scenario 5-1 is executed as the physical test log 6-2.
[0026]
The adapter unit 7 relays the device-under-test instruction 6-1 to the remote switch-to-be-tested device 8, and the switch-under-tester device 8 tests the switching device according to the relayed device-under-test instruction 6-1. Make it work.
[0027]
Further, the test result evaluation unit 8 compares and collates the test results of the different types of switching equipment with the logical test log 4-2 and the physical test log 6-2, and displays the evaluation result as the test result report 8-1. Output.
[0028]
The above is the function of the test execution control unit of the exchange apparatus according to the embodiment of the present invention. The configuration of each unit will be described in detail below.
[0029]
FIG. 3 is an explanatory diagram of a logic test scenario according to the embodiment of this invention. The logic test scenario 11 includes a logic test scenario group 11-1 configured by a procedure for each test item and a logic macro scenario group 11-2 configured by a procedure commonly used for each test item. The illustrated logical test scenario group 11-1 is a test for confirming billing data when the caller of the own station calls the callee of the own station and the caller first hangs up the handset first after the call. It is an example of a scenario.
[0030]
In this test scenario, first, as a pre-test preparation, an instruction to switch over is made, and charging data on the caller side (number: 777-1000) and charging data on the callee side (number: 777-1001) are stored in the maintenance terminal device ( TYPE), and then a pseudo call is made from the local caller (number: 777-1000) to the local callee (number: 777-1001), and after the call, the caller on-hooks the handset first. In order to confirm the charging data for the pseudo call, the charging data on the caller side (number: 777-1000) and the charging data on the callee side (number: 777-1001) are stored in the maintenance terminal. It is constituted by a test procedure of dumping to a device (TYPE).
[0031]
Further, a general-purpose test procedure such as an exchange idling instruction is described in the logic macro scenario group 11-2 and is also used in common for other test item procedures. The logic test scenario group 11-1 and the logic macro scenario group 11-2 are transferred to the logic test scenario execution control unit 4.
[0032]
FIG. 4 is an explanatory diagram of the logic test scenario execution control unit according to the embodiment of this invention. The logic test scenario execution control unit 4 includes a logic scenario reading unit 41, a logic scenario executing unit 42, a logic macro scenario reading unit 43, a logic macro scenario executing unit 44, and a logic test scenario log collecting unit 45. A logical device instruction command 4-1 is generated based on the scenario 11 and the switch apparatus name 12 to be tested, and a logical test log 4-2 is collected.
[0033]
The logic scenario reading unit 41 reads the logic test scenario group 11-1 and passes the logic test scenario group 11-1 to the logic scenario execution unit 42. The logic scenario execution unit 42 interprets the logic test scenario group 11-1, executes each scenario, and generates a logic device instruction command 4-1 in cooperation with a logic macro scenario execution unit 44 described later. The data is passed to the logic / physical test scenario conversion unit described later. The logical device instruction command 4-1 includes a logical device name and a logical instruction parameter.
[0034]
The functions of the logical scenario execution unit 42 include control instruction, operation instruction, character string processing instruction, variable, macro instruction, processing of general program description instruction such as exception processing instruction, and comment instruction for describing a comment on the scenario. Processing, print command processing for intentionally registering necessary information in the logical test scenario log collection unit 45, logical test item declaration command processing for declaring a logical test item name for each scenario, and logical device name It has a function of collecting necessary log information for each instruction of the logical test scenario group 11-1 and processing of a logical apparatus instruction instruction for making a processing request to each apparatus. (Specifically, it is executed by a logic test scenario log collection unit 45 described later.)
[0035]
When the logical scenario execution unit 42 recognizes a macro instruction, the logical macro scenario reading unit 43 reads the logical macro scenario group 11-2 and passes control to the logical macro scenario execution unit.
[0036]
The logic macro scenario execution unit 44 interprets the logic macro scenario group 11-2 passed from the logic macro scenario reading unit 43, and executes each scenario.
The functions of the logic macro scenario execution unit 44 include processing of general program description instructions such as control instructions, arithmetic instructions, character string processing instructions, variables, exception processing instructions, and processing of comment instructions for describing comments on the scenario. , Processing of a print command for intentionally registering necessary information in the logical test scenario log collection unit, processing of a logical test item declaration command for declaring a logical test item name for each scenario, and a logical device name for each device It has a function of collecting necessary log information for each logic test scenario command and processing of a logic device instruction command for making a processing request. (Specifically, it is executed by a logic test scenario log collection unit 45 described later.)
[0037]
The logic test scenario log collection unit 45 collects log information when the logic test scenario group 11-1 or the logic macro scenario group 11-2 is executed by the logic scenario execution unit 42 and the logic macro scenario execution unit 44. The collection unit is performed for each switch-to-be-tested device name 12 and for each logical test item declaration command in the logical test scenario group 11-1. The commands for which log information is collected are a comment command, a logical test item declaration command, a logical device command, and a print command. In FIG. 4, 4-2 is an example of the collected logic test log.
[0038]
FIG. 5 is an explanatory diagram of a logical / physical test scenario conversion unit and a logical / physical scenario conversion table according to the embodiment of this invention. The logical / physical test scenario conversion unit 5 is based on the logical device instruction command 4-1 generated by the logical test scenario execution control unit 4, the logical / physical scenario conversion table 50, and the switch under test apparatus name 12. The physical test scenario 5-1 is calculated, and the logical test scenario 11 is converted into the physical test scenario 5-1.
[0039]
The specific calculation method of the physical test scenario is to search the switch-under-test table 50-1 in the logical / physical scenario conversion table 50 with the switch-under-tester device name 12, and to examine the logical-device-under-test table 50- corresponding to the switch under test. 2 is extracted. The logical device test table 50-2 is searched by the logical device name of the logical device instruction instruction 4-1 delivered from the logical test scenario execution control unit 4, and a logical physical test scenario 50-3 corresponding to the logical device under test is obtained. It is extracted, and it is determined whether the extracted logical physical test scenario 50-3 corresponding to the logical device under test is a non-direct transmission type or a direct transmission type.
[0040]
If the extracted logical-physical test scenario 50-3 corresponding to the logical device under test is the non-direct transmission type, the logical instruction table 50-4 is searched by the logical instruction of the logical apparatus instruction instruction 4-1, and the logical apparatus and the logical instruction are changed. The corresponding physical test scenario 50-5 is extracted. This physical test scenario is composed of test scenarios corresponding to a plurality of physical devices. The physical test scenario 50-5 extracted from the scenario conversion table 50 is sent to the logical / physical scenario conversion unit 5, and is passed from the logical / physical scenario conversion unit 5 to the physical test scenario execution control unit 6 as the physical test scenario 5-1. It is.
[0041]
When the logical physical test scenario 50-3 corresponding to the logical device under test extracted by searching the logical device table under test 50-2 is of the direct transmission type, the logical physical test scenario 50-3 includes only the logical device name as physical. The physical test scenario 50-6 converted into the device name is extracted. The physical test scenario 50-6 is sent to the logical / physical scenario conversion unit 5 in the same manner as the physical test scenario 50-5, and the logical / physical scenario conversion unit 5 converts the physical test scenario 50-6 into the physical test scenario 5. It is passed to the physical test scenario execution control unit 6 as -11.
[0042]
The direct transmission type physical test scenario 50-6 is a test scenario that does not depend on the difference between apparatuses, and is a test scenario in which the instructions of the logical test scenario and the physical test scenario match. The test scenario of the maintenance terminal device (TYPE) corresponds to the physical test scenario of the direct transmission type.
[0043]
FIG. 6 is an explanatory diagram of the physical test scenario execution control unit according to the embodiment of this invention. Based on the physical test scenario 5-1, the physical test scenario execution control unit 6 passes the device under test instruction 6-1 to the dedicated adapter unit 7 for each model of the exchange, and also sends the physical test log 6-2. collect. The physical test scenario execution control unit 6 includes a physical scenario reading unit 61, a physical scenario execution unit 62, and a physical scenario log collection unit 63.
The physical scenario reading unit 61 reads the physical test scenario 5-1 and passes the read physical test scenario 5-1 to the physical scenario execution unit 62.
[0044]
The physical scenario execution unit 62 interprets the physical test scenario 5-1 passed from the physical scenario reading unit 61 and executes each scenario. The functions of the physical scenario execution unit 62 include processing of a general program description command such as a control command, an operation command, a character string processing command, a variable, an exception processing command, a comment command for writing a comment on a scenario, Processing of print command for intentionally registering necessary information in physical test scenario log collection unit, processing of physical test item declaration command for declaring logical test item name for each scenario, and device name under test for each device There is a function of collecting the necessary log information for each instruction of the device under test instruction for making a processing request (outputting a processing request to the device under test via the adapter) and the command of the physical test scenario. (Specifically, it is executed by the physical scenario log collection unit 63.)
[0045]
The physical scenario log collection unit 63 collects log information when a physical test scenario instruction is executed by the physical scenario execution unit 62. The collection unit is performed for each name of the switch under test equipment and for each physical test item declaration command in the physical test scenario 5-1.
The target log collection commands are a comment command, a physical test item declaration command, a device under test command, and a print command.
[0046]
FIG. 7 is an explanatory diagram of the adapter unit and the switch under test according to the embodiment of this invention. The adapter unit 7 includes transmission / reception adapters corresponding to the device under test that differ for each switch model, for example, a line control transmission / reception adapter 71, a terminal control transmission / reception adapter 72, a TYPE control transmission / reception adapter 73, and a CPU control transmission / reception adapter 74. The device-under-test instruction 6-1 configured and sent from the physical scenario execution control unit 6 is sent to the line control transmission / reception adapter 81, the terminal control transmission / reception adapter 82 of the A switch device 8 which is the device under test via the LAN or WAN, The data is sent to the TYPE control transmission / reception adapter 83 and the CPU control transmission / reception adapter 84.
[0047]
Each of the transmission / reception adapters 81 to 84 of the A exchange apparatus 8 which is a device under test converts the apparatus under test instruction 6-1 sent from each of the transmission / reception adapters 71 to 74 of the adapter unit 7 to the line test control of the A exchange apparatus 8. It has a function of relaying to the device 81-1, the terminal test control device 82-1, the TYPE test control device 83-1, and the CPU test control device 84-1.
[0048]
Each of the test control devices 81-1 to 84-1 of the A exchange device 8 interprets the device under test instruction 6-1 sent from each of the transmission / reception adapters 81 to 84, and is a line device 81 which is a device under test exchange. -2, The operation of the A exchange device 8 can be tested by operating the terminal device 82-2, the TYPE device 83-2, and the CPU 84-2.
[0049]
8 and 9 are explanatory diagrams of a test result evaluation unit according to the embodiment of this invention. The test result evaluation unit 9 shown in FIGS. 8 and 9 includes a logic test result comparison unit 91 and a physical test log analysis unit 92. FIG. 8 is an explanatory diagram of the logical test result comparison unit 91, and FIG. 9 is an explanatory diagram of the physical test log analysis unit 92.
[0050]
In FIG. 8, the logic test result comparison unit 91 sets the A switch test log 4-2A and the B switch test log 4-2B of the logic test log 4-2 output from the logic test scenario execution control unit 4 as test items. Whether or not there is a difference between the test results is calculated every time, and the test result evaluation is output as a test result evaluation report 9-1 in a list form.
[0051]
In A switch test log 4-2A and B switch test log 4-2B in FIG. 8, a call is made from the caller of the own station (number: 777-1000) to the callee of the own station (number: 777-1001) and after the call When the caller first performed a test operation of on-hooking the handset, in the A exchange test log 4-2A, caller number: 777-1000, caller charge = 1 as caller charge data dump information of the confirmation items The test result of called party number: 777-1001 and incoming side charge = 0 was obtained, but in the B exchange test log 4-2B, the incoming side charge = 1 and a test result different from the A exchange test log was obtained. Shows the case.
[0052]
The logical test result comparison unit 91 compares the A switch test log 4-2A with the B switch test log 4-2B, and compares the result with the “logic test result of the A switch and the B switch” in the test result evaluation report 8-1. "NG" or "OK" is output to the test result evaluation column in the table.
[0053]
In FIG. 9, the physical test log analysis unit 92 evaluates the test result by using the A switch log 6-2A and the B switch log 6-2B of the physical test log 6-2 collected by the physical test scenario execution control unit 6. Displayed on Report 8-1 for analysis of problem areas.
[0054]
According to the above-mentioned logical test result comparison, if there is a defect in the test scenario, whether there was a defect in 11 in the logical test scenario, whether there was a defect in the physical test scenario for each switching device, Can be easily reduced, and the burden of checking and correcting the test scenario can be reduced.
[0055]
【The invention's effect】
As described above, according to the present invention, the test scenario depends on the logical test scenario that does not depend on the difference in the physical configuration of the different types of switching equipment and the physical test that depends on the difference in the physical configuration of the different types of switching equipment. By separating the scenario from the hierarchy, it is possible to perform tests on different types of switching equipment using logical test scenarios that do not depend on the difference in the physical configuration of the switching equipment. At the same time, since the comparison result of the test scenario and test result log of one model and the test scenario and test result log of the other model can be obtained, it is easy to search for defective parts, and test scenario creation, confirmation and correction The burden of work can be reduced.
[Brief description of the drawings]
FIG. 1 is an explanatory diagram of a main part of an embodiment of the present invention.
FIG. 2 is an explanatory diagram of a test execution control unit of the exchange apparatus according to the embodiment of this invention.
FIG. 3 is an explanatory diagram of a logic test scenario according to the embodiment of this invention.
FIG. 4 is an explanatory diagram of a logic test scenario execution control unit according to the embodiment of this invention.
FIG. 5 is an explanatory diagram of a logical / physical test scenario conversion unit and a logical / physical scenario conversion table according to the embodiment of this invention.
FIG. 6 is an explanatory diagram of a physical test scenario execution control unit according to the embodiment of this invention.
FIG. 7 is an explanatory diagram of an adapter unit and a switch under test according to the embodiment of this invention.
FIG. 8 is an explanatory diagram of a test result evaluation unit according to the embodiment of this invention.
FIG. 9 is an explanatory diagram of a test result evaluation unit according to the embodiment of this invention.
FIG. 10 is an explanatory diagram of a conventional switchboard test.
[Explanation of symbols]
11 Logical Test Scenario 12 Switched Switch Device Name 13 Logical / Physical Test Scenario Conversion Unit 14A Physical Test Scenario 14B of Switch A A Physical Test Scenario 15A of Switch B Tested Switch A Device A
15B Exchange under test equipment B

Claims (8)

The test scenario, which is the execution procedure for each test item of the switching equipment, is a logical test scenario that does not depend on the difference in the physical configuration of the switching equipment of different models and the physical test that depends on the difference of the physical configuration of the switching equipment of different models. Separated into a hierarchy with scenarios,
The logical test scenario is converted into a physical test scenario corresponding to the switch under test apparatus that differs for each model, and the test operation of the switch apparatus of a different model is controlled by the physical test scenario,
A test execution control method for an exchange apparatus, wherein a test of an exchange apparatus of a different model is executed according to a logical test scenario that does not depend on a difference in physical configuration of the exchange apparatus. A test of a plurality of exchange devices of different models is executed according to the same logic test scenario, and test results are compared and collated with each other from the logic test log information collected by the execution of the tests of a plurality of exchange devices of different models. 2. The test execution control method for an exchange apparatus according to claim 1, wherein logic test log information having different test results is extracted and displayed. 3. The test execution control of an exchange apparatus according to claim 1, wherein the logic scenario is composed of a logic test scenario group for each test item and a logic macro scenario group that is used for general purposes. Method. 4. The exchange according to claim 1, wherein the physical test scenario is relayed, and a test of a plurality of exchange-tested devices at remote locations is executed and controlled by one logical test scenario. Apparatus test execution control method. A logical test scenario that is an execution procedure for each test item of an exchange device and does not depend on a difference in physical configuration of exchange devices of different models,
A logical test scenario execution control unit that reads the logical test scenario and passes the read logical test scenario to the logical / physical test scenario conversion unit;
A logical / physical test scenario conversion unit for converting the logical test scenario into a physical test scenario corresponding to the switching equipment under test different for each model;
A physical test scenario execution control unit for controlling a test operation of an exchange apparatus of a different model according to the physical test scenario;
A test execution control device for an exchange apparatus, comprising: an adapter unit that relays a device under test instruction based on the physical test scenario to the exchange apparatus under test. A logical test log collection unit that collects log information in the logical test scenario execution control unit when testing a plurality of exchange devices of different models according to the same logical test scenario;
A physical test log collection unit for collecting log information in the physical test scenario execution control unit;
6. The exchange according to claim 5, further comprising: a test result evaluation unit that compares and collates test results with each other from the logic test log information, extracts and displays logic test log information having different test results. Device test execution control device. 7. The test execution control of an exchange apparatus according to claim 5, wherein the logic scenario is composed of a logic test scenario group for each test item and a logic macro scenario group for general use. apparatus. 8. The test execution control device for an exchange device according to claim 5, wherein the adapter unit relays the physical test scenario to a plurality of exchange devices under test at remote locations.

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