JP3530231B2 - Replacement processing method in information storage device - Google Patents

Description

Detailed Description of the Invention

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a storage medium replacement processing method in an information storage device such as a magneto-optical disk device or a hard disk device.

[0002]

2. Description of the Related Art A magneto-optical disk having a plurality of groups each having a user area composed of a plurality of sectors to which data is written by a user and a replacement area composed of a plurality of replacement sectors for replacement processing of defective sectors in the user area, There is an information storage device such as a magneto-optical disk or a hard disk device that writes data to a storage medium such as a hard disk and reads the data stored in the storage medium. In such an information storage device, when a defective sector in which data cannot be written occurs in the user area of the storage medium, a replacement process of writing data in a spare sector in the spare area is performed.

In the conventional replacement processing method for a defective sector, a free replacement sector is searched from the beginning of the replacement area corresponding to the user area provided behind the user area to which the defective sector belongs, and the empty replacement sector is searched. Data was written in (for example, Japanese Patent Laid-Open No. 2-3566).
(See Japanese Patent Publication No. 3).

FIG. 29 is a flow chart showing the conventional replacement process. In step (“S” in the figure) 61,
When a defective sector is generated in the user area, the process proceeds to step 62 and the rear area is sequentially backward from the replacement area of the group to which the defective sector belongs, that is, the first replacement sector of the replacement area corresponding to the user area in which the defective sector has occurred. The vacant replacement sector is searched, and if there is a vacant replacement sector in step 63, the process proceeds to step 66 to perform the replacement process on the vacant replacement sector.

However, if it is determined in step 63 that there are no spare replacement sectors, the process proceeds to step 64, in which the spare sectors are sequentially searched backward from the first spare sector in the spare area of the rear group. If there is no vacant replacement sector in step 65, the process returns to step 64 again to search for a replacement region in a group further behind, and if there is a vacant replacement region, the process proceeds to step 66 and becomes vacant. The replacement process is performed on the replacement sector, and this process ends.

[0006]

However, in the replacement processing method in the above-described information storage device, when a defective sector occurs near the beginning of the user area, the replacement area slightly distant from the defective sector is vacant. Since the replacement sector is searched for and the replacement process is performed on the vacant replacement sector, there is a problem that the seek time for accessing the replacement sector becomes long.

If all the replacement sectors in the replacement area corresponding to the user area to which the defective sector belongs have been used, the replacement processing is performed on the replacement area of the group immediately preceding the group of the user area and the replacement area. By doing so, a vacant replacement sector is searched from the beginning of the replacement area, and replacement processing is performed on the vacant replacement sector, so the replacement sector is used from a replacement sector distant from the defective sector. There has been a problem that the seek time for accessing the replacement sector becomes long when accessing a group of consecutive logical addresses including the logical address corresponding to the replacement sector.

Further, all the replacement sectors in the replacement area corresponding to the user area in which the defective sector has occurred have been used,
Furthermore, if all the replacement sectors of the replacement areas of the groups immediately before and after the group of the user area and the replacement area have also been used, it is not possible to determine which replacement area should be used next. In some cases, the replacement sector in the replacement area distant from the sector is used, and in such a case, there is a problem that the seek time for accessing the replacement sector becomes long.

Further, defective sectors are concentrated in the first half of a certain user area, and all the replacement sectors of the replacement area of the group immediately before that user area are used, and all the replacement areas of the immediately preceding group are replaced. When a sector has already been used, when a defective sector occurs in the user area of the group immediately before the user area where the defective sector occurs, the second spare area is used regardless of before or after the user area. Therefore, there is a problem that the seek time for accessing the replacement sector becomes long.

Furthermore, when searching for a free replacement sector in the replacement area, if a free replacement sector is always searched from the beginning of the replacement area, a replacement sector close to the defective sector may be empty depending on the position where the defective sector occurs. However, there is a problem that the replacement process may be performed on the replacement area at a farther distant position, and the seek time for accessing the replacement sector becomes longer.

The present invention has been made in view of the above points, and it is an object of the present invention to shorten the time for accessing a replacement sector of a defective sector.

[0012]

[0013]

[0014]

[0015]

The present invention has the above objects.
Multiple sectors to which users write data to achieve
The user area consisting of
Replacement area consisting of multiple replacement sectors for replacement processing
For a storage medium provided with a plurality of groups having
Writing means for writing data into the storage medium.
Reading means for reading the stored data, and the user area
A defective section in which data cannot be written by the writing means.
When an error occurs, the free replacement section in the above replacement area
Equipped with alternation processing means for performing alternation processing to write data to the data
A replacement processing method definitive the example was the information storage device, the second half of the spare area of the immediately preceding respective spare area number replacement sector is divided into regions first half and the second half area so that each becomes 1/2, the generated defective sector farther from the replacement sector which is vacant area and the area of the first half area sac Chi the near towards the replacement area immediately after
When the replacement processing is performed in the order of the vacant replacement sectors in the area, and there is no vacant replacement sector in any of the areas, the first half area of the immediately preceding replacement area and the second half area of the immediately following replacement area are covered. order of replacement sector which is vacant farther area from the replacement sector that are vacant area towards the near Chi
The replacement process is performed on the
When there was no Kuta, the second half of the replacement area further ahead
The empty space in the closer area of the front area and the rear area of the rear area
Available replacement sector in an area farther from the replacement sector
The replacement process is performed in the order of
When there is no replacement sector in use,
The first half of the spare area and the second half of the rear spare area, which are near
In the area farther from the spare sector in the other area
Provided is a replacement processing method for performing replacement processing in the order of vacant replacement sectors .

[0016]

[0017] In each replacement processing method described above, in front of the spare area of the generated defective sectors looking for replacement sector vacant sequentially forward from the end of the replacement sector of the replacement area, behind the spare area It is advisable to search for spare sectors sequentially vacant from the first spare sector in the spare area toward the rear.

[0018]

[0019]

[0020]

[0021]

[0022]

[0023]

[0024]

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENT An embodiment of the present invention will be specifically described below with reference to the drawings. FIG. 2 shows an embodiment of the present invention and a reference technique.
FIG. 3 is a block diagram showing the configuration of an information storage device that becomes This information storage device 1 allows a user to write data on a storage medium 2 such as a magneto-optical disk for storing various data and a recording surface of the storage medium 2, or to read data stored on the recording surface. Read / write control unit 3
And a CPU 4 which is a microcomputer that controls the entire information storage device 1 and performs a replacement process and the like according to the present invention.

Further, a program ROM storing various programs for the CPU 4 to perform various processes.
5, a RAM 6 which is a storage area used when the CPU 4 performs various processes, and an interface (I / F) 7 for exchanging data with a host device such as a personal computer.

Therefore, the read / write controller 3
Serves as a writing unit that writes data to the storage medium 2 and a reading unit that reads the stored data. Further, the CPU 4 is a replacement processing unit that, when a defective sector in which data cannot be written occurs in the user area of the storage medium 2, performs replacement processing for writing data in an empty replacement sector in the replacement area closest to the defective sector. Perform a function.

Next, the replacement process in this information storage device will be described. FIG. 1 is a flowchart showing a replacement process in the information storage device 1. This process
When a defective sector occurs in the user area of the storage medium in step 1 (indicated by "S" in the figure), the process proceeds to step 2 and the replacement sector in the replacement region closest to the defective sector is searched for, and the process proceeds to step 3. In step 3, it is judged whether or not the spare sector searched in step 2 is free. If it is not free, the process returns to step 2, and if it is free, the process proceeds to step 4 to perform the spare processing on the free spare sector. Then, the process is finished.

In other words, in this processing, when a defective sector occurs in the user area, a vacant replacement sector is searched from among the respective replacement sectors in the replacement area closest to the defective sector, and data is written in the vacant replacement sector. Alternate processing to write

Next, the above replacement process will be described in more detail. FIG. 3 is an explanatory diagram showing an example of the format of the recording surface of the storage medium 1. As shown in FIG. 3A, the recording surface of the storage medium has a user area A to N composed of a plurality of sectors in which a user writes data, and a plurality of replacement processes for defective sectors in each of the user areas A to N. Groups A to N having spare areas a to n made up of spare sectors for use.

Further, as shown in FIG. 3B, the replacement area a of the user area A has ten replacement sectors sa0 to sas.
It consists of a9. The user area B has 40 sectors b0 to b
The replacement area b is composed of 10 replacement sectors sb0.
~ Sb9. User area C has 40 sectors c0
~ C39, the replacement area c is composed of 10 replacement sectors s.
It consists of c0 to sc9. The user area D is composed of 40 sectors d0 to d39, and the spare area d is composed of 10 spare sectors sd0 to sd9.

Next, a case where the replacement process shown in FIG. 1 is applied to the replacement area shown in FIG. 3 will be described with reference to FIGS. 4 to 7. In FIGS. 4 to 7B, only the sector symbols related to the description are omitted and others are omitted. As shown in FIG. 4B, for example, the user area C
When a defect occurs in the sector c10, the spare processing is performed by searching for a free spare sector in the spare area b closest to the sector c10, as shown in FIG. 5B. For example, replacement processing is performed by searching for replacement sectors that are sequentially open backward from the replacement sector sb0.

As shown in FIG. 6B, when a defect occurs in the sector c28 of the user area C, as shown in FIG. 7B, the replacement area c closest to the sector c28 is detected. The vacant replacement sector is searched for and replacement processing is performed. For example, the spare sector is sequentially searched backward from the spare sector sc0, and spare processing is performed.

In this way, in the replacement processing of this information storage device, when a defective sector occurs in the user area, the replacement processing is performed in the free replacement area closest to the defective sector. The seek time when accessing the sector can be shortened. This information
The replacement processing method in the storage device is
Processing is performed on an available replacement sector in the replacement area closest to
Replacement, the defective sector and its replacement processing are performed.
The access distance to the sector can be minimized,
It is possible to shorten the seek time to access the replacement sector.
Wear. Especially, since the number of sectors in the user area is large,
When the distance between the Kuta and the last sector is large
More effective.

Next, another reference technique of the present invention will be described. In the information storage device of this reference technology, the CPU function is different from that of the above-described reference technology, and when a defective sector in which data cannot be written occurs in the user area of the storage medium 1, for the replacement area closest to the defective sector, In the spare area in front of the defective sector, search for spare sectors sequentially vacant from the last spare sector in the spare area toward the front,
In the rear replacement area, search for replacement sectors sequentially vacant from the first replacement sector in the replacement area toward the rear,
It fulfills the function of a replacement processing means for carrying out a replacement process for writing data in the vacant replacement sector.

Next, the replacement process will be described with reference to the flowchart of FIG. In this process, when a defective sector is generated in step (indicated by "S" in the figure) 11, the process proceeds to step 12 and, for the replacement area closest to the defective sector, if the replacement area is in front of the defective sector, From the last replacement sector in the replacement area, the replacement sectors are sequentially searched forward, and if the replacement area is the rear replacement area, the replacement sectors are searched sequentially from the first replacement sector in the replacement area backward, and the process proceeds to step 13.

In step 13, it is judged whether or not the retrieved replacement sector is vacant. If it is not vacant, the process returns to step 12, and if it is vacant, the process proceeds to step 14 and the vacant replacement sector is replaced. Then, this process is finished.

In other words, in this processing, when a defective sector occurs, in the replacement area in front of the defective sector with respect to the replacement area closest to the defective sector, sequentially from the last replacement sector in the replacement area to the front. Search for a vacant replacement sector, and in the rear replacement area, search for replacement sectors that are sequentially vacant from the first replacement sector in the replacement area toward the rear, and perform replacement processing to write data to the vacant replacement sector. .

Next, the replacement process will be described in more detail with reference to FIGS. For example, in FIG.
As shown in FIG. 5, when a defect occurs in the sector c10 of the user area C, as shown in FIG. 5B, the last replacement sector sb of the replacement area b closest to this sector c10.
The spare sector is sequentially searched for from 9 to the front, and spare processing is performed.

As shown in FIG. 6B, when a defect occurs in the sector c28 of the user area C, as shown in FIG. 7B, the replacement area closest to this sector c28. Replacement processing is performed by searching for replacement sectors that are sequentially vacant from the first replacement sector sc0 of c toward the rear.

In this way, in the replacement processing of this information storage device, when a defective sector occurs in the user area, the vacant replacement sector is closer to the defective sector than the replacement area closest to the defective sector. Since the replacement sectors are sequentially searched, the vacant replacement sector closest to the defective sector can be found first and the replacement process can be performed. This information note
The replacement processing method in the storage device is
Perform replacement processing on the free replacement sector in the closest replacement area.
Therefore, the defective sector and the replacement sector
The shortest access distance to Kuta
The seek time to access the sector can be shortened
It Especially, since the number of sectors in the user area is large,
This is especially useful when the distance between the
It is effective. Then, the intersection in front of the defective sector
In the spare area, start from the last spare sector in the spare area
Search for vacant replacement sectors sequentially, and replace them in the rear
In the area, the area from the first replacement sector of the replacement area is
If you try to find spare sectors that are vacant,
Replaces with the closest replacement sector even within the replacement area
Process and replace defective sectors and their replacement
The shortest access distance to the replacement sector
The seek time to access the replacement sector can be shortened.
can do.

Next, still another reference technique of the present invention will be described. In the information storage device of this reference technology , the CPU
The function of is different from the above-mentioned reference technology, and when all the replacement sectors of the replacement area of the group to which the defective sector generated in the user area of the storage medium 1 belongs are already used, When the spare sector in the spare area is subjected to the spare processing, and all spare sectors in the spare area of the group immediately before and after the group to which the defective sector belongs are also in use, the sector further ahead of the defective sector. Alternatively, it fulfills the function of a replacement processing means for carrying out a replacement process on an empty replacement sector in the replacement area of the group closest to the rear group.

Next, the replacement process will be described with reference to the flowchart of FIG. In this processing, when a defective sector occurs in the user area of the storage medium 1 in step (indicated by "S" in the figure) 21, the process proceeds to step 22 and a spare sector in the spare area of the group to which the defective sector belongs is vacant. Is searched and it is determined in step 23 whether or not there is a free replacement sector. If there is a free replacement sector, the process proceeds to step 28.

If it is determined in step 23 that there is no free replacement sector, the process proceeds to step 24, in which the replacement area of the group closer to the defective sector in the groups immediately before and immediately after the group to which the defective sector belongs is vacant. The spare sector is searched for, the process proceeds to step 25, it is judged whether or not there is a spare sector that is vacant, and if there is a spare sector that is vacant, the process proceeds to step 28.

If it is determined in step 25 that there is no spare sector in the spare area of the groups immediately before and immediately after, the process proceeds to step 26 and the group closest to the defective sector is replaced with the group closest to the defective sector. The spare sector in the area is searched for, and the process proceeds to step 27, where it is judged whether or not there is a spare spare sector. If there is a spare spare sector, the process proceeds to step 28, but it is free. If there is no replacement sector, the process returns to step 26 to search for a free replacement sector in another group. Then, in step 28, the spare sector is subjected to the spare processing, and this processing is finished.

In other words, in this process, when a defective sector occurs, first, the spare area of the group to which the defective sector belongs, that is, the spare area in the spare area corresponding to the user area in which the defective sector has occurred, is vacant. If there is a spare sector that has been found and is free, the spare sector is replaced.

However, if all the replacement sectors in the replacement area have been used and there is no spare replacement sector,
Next, an empty spare sector in the spare area of the group immediately before and immediately after the group to which the defective sector belongs is searched for, and if there is a spare sector, the spare sector is replaced.

Furthermore, if all the replacement sectors in each replacement area of the groups immediately before and immediately after that have been used and there is no spare replacement sector, the group before or after the defective sector is selected. A vacant replacement sector in the replacement area of the closest group is searched for, and if there is a vacant replacement sector, replacement processing is performed on the replacement sector.

Next, the replacement process will be further described in detail with reference to FIGS. 4 to 7 and FIGS. 10 to 15. Also in FIG. 10 to FIG. 15B, only the sector symbols related to the description are shown and the others are omitted.

For example, as shown in FIG. 4B, when a defect occurs in the sector c10 of the user area C, as shown in FIG.
As shown in (b) of 0, a vacant replacement sector in the replacement area c of the group C to which the sector c10 belongs is searched for and replacement processing is performed. For example, replacement processing is performed by searching for replacement sectors that are sequentially vacant from the first replacement sector sc0 toward the rear.

Further, each replacement sector sc of the replacement area c
When all of 0 to sc9 have been used, as shown in FIG. 5B, the group C to which the sector c10 belongs
The spare area in the spare area b of the group B immediately before is searched for and the spare processing is performed. For example, replacement processing is performed by searching for replacement sectors sequentially vacant from the first replacement sector sb0 toward the rear.

Further, each replacement sector s in the replacement area b
When all of b0 to sb9 are also used, as shown in FIG.
(B), the spare processing is performed by searching for a free spare sector in the spare area a of the group A closest to the group c to which the sector c10 in which the defect has occurred next. For example, replacement processing is performed by searching for replacement sectors that are sequentially vacant from the first replacement sector sa0 toward the rear.

When there is no free replacement sector in the replacement area a, as shown in FIG.
Next, the spare processing is performed by searching for a free spare sector in the spare area d of the group D closest to the group c to which the defective sector c10 belongs. For example, replacement processing is performed by searching for replacement sectors that are sequentially vacant from the first replacement sector sd0 toward the rear.

Thus, when all the spare areas of the spare area of the group to which the defective sector belongs and the spare area of the spare area of the immediately preceding group have been used, the spare area of the group closest to the front or rear group is free. Since a replacement sector that is present is searched for, the replacement process can be performed on the empty replacement sector in the closest replacement area from the defective sector.

Alternatively, as shown in FIG. 6B,
When a defect occurs in the sector c28 of the user area C, as shown in FIG. 7B, an empty spare sector in the spare area c of the group C to which the sector c28 belongs is searched for and the spare processing is performed. For example, replacement processing is performed by searching for replacement sectors that are sequentially vacant from the first replacement sector sc0 toward the rear.

All replacement sectors sc in the replacement area c
When 0 to sc9 have been used, as shown in (b) of FIG. 13, the group C to which the sector c28 belongs
The spare area in the spare area b of the group B immediately before is searched for and the spare processing is performed. For example, replacement processing is performed by searching for replacement sectors sequentially vacant from the first replacement sector sb0 toward the rear.

Further, each replacement sector s in the replacement area b
When all of b0 to sb9 are also used,
(B), the spare processing is performed by searching for a free spare sector in the spare area d of the group D closest to the group c to which the sector c28 in which the defect has occurred next. For example, replacement processing is performed by searching for replacement sectors that are sequentially vacant from the first replacement sector sd0 toward the rear.

When there is no free replacement sector in the replacement area d, as shown in FIG.
Next, the spare processing is performed by searching for a free spare sector in the spare area a of the group A closest to the group c to which the defective sector c28 belongs. For example, replacement processing is performed by searching for replacement sectors that are sequentially vacant from the first replacement sector sa0 toward the rear.

In this way, when the replacement area c of the group to which the defective sector belongs and the replacement sector of the replacement area of the group immediately after that are all used, the closest replacement is made from the front or rear group. Since an empty spare sector in the spare area of the group is searched, the spare processing can be performed to the spare spare area in the spare area closest to the defective sector. Exchange in this information storage device
The replacement processing method is based on the group to which the defective sector
When all the replacement sectors in the replacement area have been used,
Open the spare area of the other group closest to the defective sector
If the replacement process is performed on existing replacement sectors, the defective
All spare sectors in the spare area of the group to which Kuta belongs are free.
Even if not, perform defective sector and its replacement processing
The shortest access distance to the replacement sector.
The seek time to access the replacement sector.
You can

Next, still another reference technique of the present invention will be described. In the information storage device of this reference technology , C
The PU function is different from that of the above-described reference technology, and when all the replacement sectors of the replacement area of the group to which the defective sector generated in the user area of the storage medium 1 has been used, another group closest to the defective sector is used. When the spare sector in the spare area of is replaced, the spare sector in the spare area of the group immediately before and after the group to which the defective sector belongs has also been used. The replacement process is performed on the vacant replacement sector in the replacement region of the group closest to the front or rear group.At that time, in the replacement region in front of the defective sector that occurred, the replacement sector is sequentially processed from the last replacement sector to the front. It functions as a replacement processing unit that searches for a replacement sector, and sequentially searches for replacement sectors in the rear replacement area from the first replacement sector toward the rear.

Next, the replacement process will be described with reference to the flowchart of FIG. In this process, when a defective sector is generated in the user area of the storage medium 1 at step (indicated by "S" in the figure) 31, the process proceeds to step 32 and the first replacement sector in the replacement area of the group to which the defective sector belongs is started. When the spare sectors are vacant, a search is made sequentially for spare spare sectors toward the rear, and the process proceeds to step 33 to determine whether there is a spare spare sector.
Go to step 38.

If it is determined in step 33 that there is no spare replacement sector, the process proceeds to step 34, in which the replacement area of the group closest to the defective sector in the groups immediately before and immediately after the group to which the defective sector belongs is selected. Immediately after, the spare area of the group searches forward from the first spare sector, and the spare area of the group immediately before searches for spare sectors that are sequentially open backward from the last spare sector.
In step 35, it is judged whether or not there is a spare spare sector, and if there is a spare spare sector, the routine proceeds to step 38.

If it is determined in step 35 that there is no spare replacement sector, the process proceeds to step 36, where the first replacement sector in the replacement area of the group closest to the defective sector in front of the defective sector is moved forward. Toward the back, or sequentially from the last replacement sector toward the rear, the spare sectors are searched sequentially, and the process proceeds to step 37 to determine whether or not there is a free replacement sector. For example, the process returns to step 36, and a search for a vacant replacement sector is similarly performed for other groups. On the other hand, if there is a free replacement sector, the process proceeds to step 38. Then, in step 38, the spare processing is performed on the spare sectors that are vacant, and this processing ends.

In this processing, when a defective sector is generated, first, the nearest free spare sector is searched from among the respective spare sectors in the spare area of the group to which the defective sector belongs, and if there is a free spare sector. The replacement processing is performed on the replacement sector.

However, if all the replacement sectors in the replacement area have been used and there is no spare replacement sector, then the nearest replacement in the group immediately before or after the group to which the defective sector belongs is next. The nearest vacant replacement sector is searched from each sector in the area, and if there is a vacant replacement sector, the replacement process is performed on the replacement sector.

Further, when all the replacement sectors in each replacement area of the group immediately before or immediately after that have been used and there is no spare replacement sector, the closest one from the groups further ahead or behind the defective sector. The closest available spare sector is searched from among the respective spare sectors in the spare area of the group, and if there is a spare spare sector, the spare sector is replaced.

Next, the replacement process will be described in more detail with reference to FIGS. 4 to 7 and FIGS. 10 to 15. Also in FIG. 10 to FIG. 15B, only the sector symbols related to the description are shown and the others are omitted.

For example, as shown in FIG. 4B, when a defect occurs in the sector c10 of the user area C,
As shown in (b) of 0, replacement processing is performed by searching for replacement sectors sequentially vacant from the first replacement sector sc0 in the replacement area c of the group C to which the sector c10 belongs.

Further, each replacement sector sc of the replacement area c
When all 0 to sc9 have been used, as shown in (b) of FIG. 5, from the last replacement sector sb9 of the replacement area b of the group B immediately before the group C to which the sector c10 belongs, to the front. Replacement processing is performed by sequentially searching for vacant replacement sectors.

Further, each replacement sector s in the replacement area b
When all of b0 to sb9 are also used, as shown in FIG.
(B), the replacement process is performed by searching for replacement sectors that are sequentially vacant from the last replacement sector sa9 in the replacement area a of the group A closest to the next group c to which the sector c10 belongs. Give.

Furthermore, when there is no free replacement sector in the replacement area a, as shown in FIG. 12B, the group c to which the sector c10 belongs next.
The replacement processing is performed by searching for replacement sectors sequentially vacant from the first replacement sector sd0 in the replacement area d of the group D closest to

In this way, when all the replacement sectors of the replacement area of the group to which the defective sector belongs and the replacement area of the group immediately before that have been used, the group closest to the group further ahead or behind is replaced. The vacant replacement sector in the replacement area is searched, and the vacant replacement sector is searched in order from the replacement sector closest to the defective sector. Replacement processing can be performed on sectors.

Alternatively, as shown in FIG. 6B,
When a defect occurs in the sector c28 of the user area C, as shown in (b) of FIG. 7, the spare area c0 of the group C to which the sector c28 belongs is vacant from the first replacement sector sc0 toward the rear. Search for a replacement sector and perform replacement processing.

Further, each replacement sector sc of the replacement area c
When all of 0 to sc9 have been used, as shown in (b) of FIG. 13, from the last replacement sector sb9 of the replacement area b of the group B immediately before the group C to which the sector c28 belongs, to the front. Replacement processing is performed by sequentially searching for vacant replacement sectors.

Further, each replacement sector s in the replacement area b
When all of b0 to sb9 are also used,
(B), the replacement process is performed by searching for replacement sectors sequentially vacant backward from the first replacement sector sd0 in the replacement region d of the group D closest to the group c to which the sector c28 belongs. Give.

When there is no free replacement sector in the replacement area d, as shown in FIG. 15B, the replacement area of the group A closest to the group c to which the sector c10 belongs next. The last replacement sector sa9 of a
From here, the spare sector is sequentially searched for free spare sectors.

In this way, when all the replacement sectors of the replacement area of the group to which the defective sector belongs and the replacement area of the group immediately after that have been used, the group closest to the group further ahead or behind is replaced. The vacant replacement sector is searched for, and the vacant replacement sector is searched in order starting from the replacement sector closest to the defective sector, so the defective sector is replaced by the closest vacant replacement sector. It can be processed. This information storage device
The replacement processing method in the
All replacement sectors in the replacement area of the group
If there is, replace the other group closest to the defective sector
Perform replacement processing on the spare sector in the free area.
If so, all replacement of the replacement area of the group to which the defective sector belongs
Defective sector and its replacement, even when the sector is not empty
Shortest access distance to the replacement sector that has processed
Seek time to access the replacement sector
Can be shortened. In addition, the defective sector that occurred
Area of the group immediately before and after the group to which
When all the replacement sectors of have been used,
On the other hand, the group closest to the front or rear
Replacement in a free replacement sector in the replacement area of another group
If this is done, the group to which the defective sector belongs
All replacement sectors in the replacement area of the group immediately before and immediately after are empty.
The defective sector and its replacement process.
The shortest access distance to the replacement sector
Yes, shorten the seek time to access the replacement sector
be able to. Then, the intersection in front of the defective sector
In the spare area, start from the last spare sector in the spare area
Search for vacant replacement sectors sequentially, and replace them in the rear
In the area, the area from the first replacement sector of the replacement area is
If you try to find spare sectors that are vacant,
Replaces with the closest replacement sector even within the replacement area
Process and replace defective sectors and their replacement
The shortest access distance to the replacement sector
The seek time to access the replacement sector can be shortened.
can do.

[0077] Next, a description will be given of the actual施例of the present invention. In the information storage device of this embodiment, the CPU function is different from that of the above-described reference technology, and each replacement area of the storage medium 2 is divided into a first half area and a second half area so that the number of replacement sectors is halved. have vacant farther region from the vacant replacement sector of the region towards the near Chi sac first half region of the second half area and the replacement area immediately after the replacement area immediately before the defective sector
That performs sequentially in alternate processing of the replacement sector, that when there is no replacement sector vacant in any of the regions, of the immediately preceding replacement area half region and the second half region caries Chi near have towards the spare area immediately after Far from the spare sector in the area
The replacement process is performed in the order of the spare sectors in the area
And there were no free replacement sectors in any of them
The rear half of the front spare area and the rear spare area
Spare sector in the area nearer to the front area of
Replacement in the order of the free replacement sector in the area farther from
A spare section that has been processed and is vacant in any of its areas.
When there is no data, the first half area of the preceding replacement area
Of the second half of the replacement area and the rear area
Available replacement sector in an area farther from the replacement sector
It performs the function of a replacement processing means for performing replacement processing in the order of the Kuta .

Furthermore, when there is no vacant replacement sector in either the replacement area immediately before or immediately after the defective sector that has occurred, the nearest half of the replacement area in the front and the first half of the replacement area in the rear is the closest. When the spare processing is performed on the spare area in the other area, and there is no spare sector in any of the areas, the closest one of the front half area of the front spare area and the rear half area of the rear spare area is the closest. It also functions as a replacement processing means for performing replacement processing on a spare sector in the other area.

Next, the replacement process will be described with reference to the flowchart of FIG. In this process, when a defective sector occurs in the user area in step (indicated by "S" in the figure) 41, the process proceeds to step 42, in which the latter half of the replacement area immediately before the defective sector and the first half of the replacement area immediately after the defective sector The closest available spare sector is searched for, and the process proceeds to step 43 to determine whether or not the spare sector is free. If there is a free spare sector, the process proceeds to step 50.

If it is determined in step 43 that there is no free replacement sector, the process proceeds to step 44, in which the nearest area of the first half area of the replacement area immediately before the defective sector and the second half area of the replacement area immediately after the defective sector is free. The spare sector is searched for, and the process proceeds to step 45 to determine whether or not the spare sector is empty. If there is a spare sector available, the process proceeds to step 50.

If it is determined in step 45 that there is no free replacement sector, the process proceeds to step 46, in which the latter half of the replacement area immediately before the replacement area immediately before the defective sector and the area further rearward of the replacement area immediately after the defective sector. If the spare sector in the closest one of the first half areas of the spare area is searched for, the process proceeds to step 47, where it is determined whether or not the spare sector is empty. Go to step 50.

If it is determined in step 47 that there is no free replacement sector, the process proceeds to step 48 and the closest one of the front half region of the front spare region and the rear half region of the rear spare region is free. The replacement sector is searched, the process proceeds to step 49, it is judged whether or not the replacement sector is free, and if there is no free replacement sector, the process returns to step 46 and the search process is similarly performed for the front and rear regions. If there is a free replacement sector, step 50
Go to. Then, in step 50, the spare processing is performed on the spare sector that is vacant, and this processing ends.

FIG. 18 is an explanatory diagram showing an example of the format of the recording surface of the storage medium 1 at the time of this replacement processing.
The format of this recording surface is almost the same as the format shown in FIG. 3, but is divided into the first half area and the second half area so that the replacement sectors of each replacement area are halved during the replacement processing. That is, as shown in (b) of the figure, for example, in the replacement area a, the replacement sector s in the first half is used.
It is divided into a0 to sa4 and replacement sectors sa5 to sa9 in the latter half.

Next, the replacement process will be further described in detail with reference to FIGS. 19 to 27. In FIG. 19 to FIG. 27B, only the sector symbols related to the description are shown and the others are omitted.

For example, as shown in FIG. 19B, when a defect occurs in the sector c10 of the user area C,
As shown in (b) of 0, the vacant replacement sector of the second half area of the replacement area b, which is the closest of the second half area of the replacement area b immediately before the sector c10 and the first half area of the replacement area c immediately after it, Search for and perform replacement processing. For example, replacement processing is performed by searching for replacement sectors sequentially vacant from the first replacement sector sb5 toward the rear.

When all the replacement sectors sb5 to sb9 in the second half area of the replacement area b have been used, as shown in FIG. 21B, the first half area of the replacement area c immediately after the sector c10. The vacant replacement sector is searched for and replacement processing is performed. For example, replacement processing is performed by searching for replacement sectors that are sequentially vacant from the first replacement sector sc0 toward the rear.

Further, when all the replacement sectors sc0 to sc4 in the first half area of the replacement area c have also been used, as shown in FIG. 22B, the first half area of the replacement area b immediately before the sector c10. The vacant replacement sector is searched for and replacement processing is performed. For example, for example, replacement processing is performed by searching for replacement sectors sequentially vacant rearward from the first replacement sector sb0.

When all the replacement sectors sb0 to sb4 in the first half area of the replacement area c are also used, as shown in FIG. 23B, the second half area of the replacement area c immediately after the sector c10. The vacant replacement sector is searched for and replacement processing is performed. For example, for example, replacement processing is performed by searching for replacement sectors sequentially vacant from the first replacement sector sc5 toward the rear.

Further, the replacement area b immediately before the sector c10
When there is no vacant replacement sector in any of the replacement areas c immediately after the above, as shown in (b) of FIG. 24, as shown in (b) of FIG. The nearest replacement area a in the first half area
The spare processing is performed by searching for a vacant replacement sector in the latter half area of. For example, replacement processing is performed by searching for replacement sectors that are sequentially vacant from the first replacement sector sa5 toward the rear.

Further, when all the replacement sectors sa5 to sa9 in the latter half area of the replacement area a have been used, as shown in FIG.
The vacant replacement sector in the first half area is searched for and replacement processing is performed. For example, replacement processing is performed by searching for replacement sectors that are sequentially vacant from the first replacement sector sd0 toward the rear.

Further, when there is no vacant replacement sector in either the second half area of the replacement area a or the first half area of the replacement area d, as shown in FIG. The spare processing is performed by searching for a free spare sector in the first half area of the spare area a, which is the closest one of the latter half areas of the spare area d. For example, replacement processing is performed by searching for replacement sectors that are sequentially vacant from the first replacement sector sa0 toward the rear.

Then, when all the replacement sectors sa0 to sa4 in the first half area of the replacement area a are all used, as shown in FIG. 27B, the second half area of the replacement area d is vacant. The replacement sector is searched for and replacement processing is performed. For example, replacement processing is performed by searching for replacement sectors that are sequentially vacant from the first replacement sector sd5 toward the rear.

Alternatively, when a defect occurs in the sector c28 of the user area C, first, the replacement area c, which is the closest of the latter half area of the replacement area b immediately before the sector c28 and the first half area of the replacement area c immediately after the sector c28, is the closest. The spare processing is performed by searching for a free spare sector in the first half area. For example, replacement processing is performed by searching for replacement sectors that are sequentially vacant from the first replacement sector sc0 toward the rear.

When all the replacement sectors sc0 to sc4 in the first half area of the replacement area c are all used, the spare processing is performed by searching for an empty replacement sector in the second half area of the replacement area b immediately before the sector c28. Give. For example, replacement processing is performed by searching for replacement sectors sequentially vacant from the first replacement sector sc5 toward the rear.

Further, when all the replacement sectors sb5 to sb9 in the latter half area of the replacement area b are all used, the empty replacement sector in the latter half area of the replacement area c immediately after the sector c28 is searched for replacement processing. Give. For example, for example, replacement processing is performed by searching for replacement sectors sequentially vacant from the first replacement sector sc5 toward the rear.

When all the replacement sectors sc5 to sc9 in the latter half area of the replacement area c have also been used, the spare processing is performed by searching for an empty replacement sector in the first half area of the replacement area b immediately before the sector c28. Give. For example, for example, replacement processing is performed by searching for replacement sectors sequentially vacant rearward from the first replacement sector sb0.

Further, the replacement area c immediately after the sector c28
When there is no vacant replacement sector in either of the replacement area b and the immediately preceding replacement area b, the replacement area which is the closest of the first half area of the replacement area d further behind the sector c28 and the latter half area of the front replacement area a. The spare processing is performed by searching for a free spare sector in the first half area of d. For example, replacement processing is performed by searching for replacement sectors that are sequentially vacant from the first replacement sector sd0 toward the rear.

Further, when all the replacement sectors sd0 to sd4 in the first half area of the replacement area d are all used, the empty replacement sector in the second half area of the front replacement area a is searched and the replacement processing is performed. For example, replacement processing is performed by searching for replacement sectors that are sequentially vacant from the first replacement sector sa5 toward the rear.

Further, when there is no vacant replacement sector in either the first half area of the replacement area d or the second half area of the replacement area a, the closest one of the second half area of the replacement area d and the first half area of the replacement area a. The spare area is searched for an empty spare sector in the latter half area of the spare area d. For example, replacement processing is performed by searching for replacement sectors that are sequentially vacant from the first replacement sector sd5 toward the rear.

Then, when all the replacement sectors sd5 to sd9 in the second half area of the replacement area d are all used, the empty replacement sector in the first half area of the replacement area a is searched for and the replacement processing is performed. For example, the first replacement sector s
Replacement processing is performed by sequentially searching for replacement sectors that are vacant from a0 to the rear.

In this way, the spare processing can be performed on the spare spare area in the spare area closest to the defective sector, and the spare area around the spare area is used exclusively by the specific user area, and the other spare area is used. It is possible to prevent as much as possible from being able to use only the replacement area away from each other.
The replacement processing method in this information storage device is
The first half area so that the number of replacement sectors is halved
And the latter half of the area, and replaces the defective sector just before
Most of the second half of the area and the first half of the replacement area immediately after
Perform replacement processing on vacant replacement sectors in the nearer area.
And there are no free replacement sectors in any of those areas.
When it happens, the first half area of the previous replacement area and the replacement area immediately after
The vacant intersection of the nearest one of the latter half of the area
If the replacement process is applied to the replacement sector, each user area
The same as the distance between the defective sector generated in
Each defective sector and its replacement
The access distance to the replacement sector
Can be shortened and the access to the replacement sector
You can shorten the time. In addition, the defect that occurred
There is free space in both the replacement area immediately before and after the sector.
When there is no replacement sector,
Nearest one of the latter half area and the first half area of the rear replacement area
The spare sector in the area of
When there is no free replacement sector in any area
Includes the first half of the front replacement area and the rear of the rear replacement area.
A free replacement sector in the closest half area
If the replacement process is applied to the
When all the replacement sectors in the replacement area immediately after are not empty
Also, the defective sector generated in each user area and its replacement sector
The distance to the
Access to the Kuta and its replacement sector
The distance can be made the shortest, and the replacement sector
The seek time to access can be shortened.

Next, another embodiment of the present invention will be described. In the information storage device of this embodiment, the function of the CPU is slightly different from that of the above-described embodiment, and each replacement area of the storage medium 2 is divided into a first half area and a second half area so that the number of replacement sectors is halved. The spare processing is performed on the vacant replacement sector of the closest area of the latter half area of the replacement area immediately before the defective sector and the first half area of the replacement area immediately after the defective sector,
If there is no vacant replacement sector in any of the areas, the replacement processing is performed on the vacant replacement sector of the closest one of the first half area of the immediately preceding replacement area and the second half area of the immediately following replacement area. Performs the function of processing means.

Further, when there is no vacant replacement sector in both the replacement area immediately before and immediately after the defective sector that has occurred, the closest replacement area is the closest to the rear half area of the front replacement area and the rear half area of the rear replacement area. When the spare processing is performed on the spare area in the other area, and there is no spare sector in any of the areas, the closest one of the front half area of the front spare area and the rear half area of the rear spare area is the closest. It also functions as a replacement processing means for performing replacement processing on a spare sector in the other area.

When searching for the vacant replacement sector, replacement sectors in front of the defective sector are searched sequentially for replacement sectors from the last replacement sector to the front, and replacement sectors in the rear are searched for the first replacement sector. It functions as a replacement processing unit that sequentially searches for replacement sectors toward the rear.

Next, the replacement process will be described with reference to the flowchart of FIG. In this process, when a defective sector is generated in the user area in step (indicated by "S" in the figure) 51, the process proceeds to step 52 and the latter half of the replacement area immediately before the defective sector and the first half area of the replacement area immediately after the defective sector are processed. If it is the latter half of the immediately preceding replacement area for the closest area of them, from the last replacement sector to the front,
If it is the first half area of the immediately following replacement area, the first replacement sector is searched backward for empty replacement sectors, and the process proceeds to step 53 to determine whether or not there are free replacement sectors, and to find a free replacement sector. If there is, go to step 60.

If it is determined in step 53 that there is no free replacement sector, the process proceeds to step 54, and the nearest area of the first half area of the replacement area immediately before the defective sector and the second half area of the replacement area immediately after is replaced. Then, if it is the first half area of the previous replacement area, from the last replacement sector to the front,
If it is the latter half of the replacement area immediately after, it searches forward for replacement sectors that are sequentially vacant from the last replacement sector, proceeds to step 55, determines whether or not there are replacement sectors, and determines whether replacement sectors are free. If there is, go to step 60.

If it is determined in step 55 that there are no spare replacement sectors, the process proceeds to step 56, in which the latter half of the spare area immediately before the spare area immediately before the defective sector and the rear area of the spare area immediately after the defective sector are located. For the closest one of the first half areas of the replacement area, if it is the second half area of the front replacement area, go forward from the last replacement sector, and if it is the first half area of the rear replacement area, start from the first replacement sector The vacant replacement sectors are sequentially searched backward, and the process proceeds to step 57 to determine whether or not the replacement sector is vacant. If there is a vacant replacement sector, the process proceeds to step 60.

If it is determined in step 57 that there is no free replacement sector, the process proceeds to step 58, in which the nearest area of the front half area of the front replacement area and the rear half area of the rear replacement area is If it is the front half area of the front spare area, the spare sector is searched forward from the last spare sector, and if it is the rear half of the rear spare area, the spare sector is searched sequentially from the last spare sector to the front, and a step 59 is searched.
If it is determined that the spare sector is empty, and there is no spare sector available, the process returns to step 56 and the search process is further performed for the front and rear areas. If there is, go to step 60. Then, in step 60, a spare process is performed on the spare sector that is vacant, and this process ends.

Next, the replacement process will be described in detail with reference to FIGS. 19 to 27. For example, FIG. 19B
As shown in FIG. 20, when a defect occurs in the sector c10 of the user area C, as shown in (b) of FIG. 20, the second half of the replacement area b immediately before the sector c10 and the first half of the replacement area c immediately after the sector c10. From the last replacement sector sb9 in the latter half of the replacement area b, which is the closest one of the areas, the replacement processing is performed by searching for replacement sectors that are sequentially vacant toward the front.

When all the replacement sectors sb5 to sb9 in the second half area of the replacement area b have been used, as shown in FIG. 21B, the first half of the replacement area c immediately after the sector c10. From the first replacement sector sc0 in the area, the replacement processing is performed by searching for replacement sectors sequentially vacant toward the rear.

Further, when all the replacement sectors sc0 to sc4 in the first half area of the replacement area c are also used, as shown in FIG. 22B, the first half of the replacement area b immediately before the sector c10. The spare sector is sequentially searched from the spare sector sb4 in the area toward the front, and spare processing is performed.

When all the replacement sectors sb0 to sb4 in the first half area of the replacement area c have also been used, as shown in FIG. 23B, the latter half of the replacement area c immediately after the sector c10. From the replacement sector sc5 in the area, the replacement processing is performed by searching for replacement sectors that are sequentially vacant toward the rear.

Further, the replacement area b immediately before the sector c10
When there is no vacant replacement sector in any of the replacement areas c immediately after the above, as shown in (b) of FIG. 24, the latter half area of the replacement area a further ahead of the sector c10 and the replacement area d behind it. From the last replacement sector sa9 of the second half area of the replacement area a, which is the closest one of the first half areas of the above, the replacement processing is performed by sequentially searching for replacement sectors that are vacant toward the front.

When all the replacement sectors sa5 to sa9 in the latter half area of the replacement area a are all used, as shown in (b) of FIG. 25, the first half area of the rear replacement area d From the first replacement sector sd0, a replacement process is performed by sequentially searching for replacement sectors that are vacant toward the rear.

Further, when there is no vacant replacement sector in both the second half area of the replacement area a and the first half area of the replacement area d, as shown in FIG. 26 (b), the replacement area a
Of the first half area and the second half area of the replacement area d, the replacement processing is performed by searching for replacement sectors sequentially vacant from the replacement sector sa4 in the first half area of the replacement area a, which is the closest one.

Then, when all the replacement sectors sa0 to sa4 in the first half area of the replacement area a are all used, as shown in FIG. 27B, the replacement sectors in the second half area of the replacement area d. From sd5, vacant replacement sectors are sequentially searched backward and replacement processing is performed.

Alternatively, when a defect occurs in the sector c28 of the user area C, first, the replacement area c which is the closest to the latter half area of the replacement area b immediately before the sector c28 and the first half area of the replacement area c immediately after the sector c28. From the first replacement sector sc0 in the first half area of the above, the replacement processing is performed by searching for replacement sectors sequentially vacant backward.

Further, when all the replacement sectors sc0 to sc4 in the first half area of the replacement area c have been used, the last replacement sector sb9 in the second half area of the replacement area b immediately before the sector c28 is sequentially opened forward. The replacement sector is searched for the existing replacement sector. Further, when all the replacement sectors sb5 to sb9 in the latter half area of the replacement area b have also been used, the replacement sectors sc5 in the latter half area of the replacement area c immediately after the sector c28 are sequentially vacant rearward. Search for a sector and perform replacement processing.

Further, when all the replacement sectors sc5 to sc9 in the latter half area of the replacement area c are all used, the replacement area sb4 in the first half area of the replacement area b immediately before the sector c28 is sequentially emptied forward. The replacement sector is searched for the existing replacement sector.

Further, the replacement area c immediately after the sector c28
When there is no vacant replacement sector in either of the replacement area b and the immediately preceding replacement area b, the replacement area which is the closest of the first half area of the replacement area d further behind the sector c28 and the latter half area of the front replacement area a. From the first replacement sector sd0 in the first half area of d, the replacement processing is performed by searching for replacement sectors sequentially vacant to the rear.

When all the replacement sectors sd0 to sd4 in the first half area of the replacement area d have been used, the last replacement sector s in the second half area of the front replacement area a.
A spare sector is sequentially searched from a9 toward the rear to perform a spare process.

Further, when there is no available spare sector in either the first half area of the replacement area d or the second half area of the replacement area a, the closest one of the second half area of the replacement area d and the first half area of the replacement area a. The spare area is sequentially searched from the spare sector sd5 in the second half of the spare area d toward the rear, and the spare processing is performed.

When all the replacement sectors sd5 to sd0 in the latter half area of the replacement area d have been used, the replacement sectors sa4 in the first half area of the replacement area a are sequentially replaced with the replacement sectors vacant toward the front. Search for and perform replacement processing.

In this way, the spare processing can be performed on the free spare sector closest to the defective sector, and the spare area around the spare area is used exclusively by the specific user area, and the other user areas are separated. It can be prevented as much as possible that only the spare area can be used. This information note
The replacement processing method in the storage device is
The first half area and the second half area so that the number of
The second half of the replacement area immediately before the defective sector
The area that is closest to the area or the first half area of the replacement area immediately after
Perform replacement processing on the spare sector in the area, and
If there are no free replacement sectors in any of these areas
Is the first half of the previous replacement area and the second half of the replacement area immediately after
In the vacant replacement sector in the closest of the areas
If the replacement process is performed, it occurs in each user area.
Equally shorten the distance between the defective sector and its replacement sector
Can perform each defective sector and its replacement process
The shortest access distance to each replacement sector
And seek time to access the replacement sector is short.
You can do it. In addition, the defective sector
A spare section that is vacant in both the front and rear spare areas.
When there is no data,
The sky of the nearest one of the first half areas of the rear replacement area
Replace the existing replacement sector with the replacement sector
When there is no spare sector in the area,
The first half of the replacement area and the second half of the rear replacement area
Change processing to the free replacement sector in the nearest area
If it is performed, replacement immediately before and immediately after the defective sector is performed.
Each user, even when all replacement sectors in the area are not available
The distance between the defective sector generated in the area and its replacement sector
It can be similarly shortened and each defective sector and its intersection
The access distance to each replacement sector that has undergone replacement processing
Can be the shortest and access the replacement sector
The seek time can be shortened. And occurred
In the replacement area in front of the defective sector, the last of the replacement area
Alternating sectors that are sequentially vacant from the alternate sector toward the front
For the first replacement of the replacement area.
Replacement sectors that are sequentially vacant from the replacement sector toward the rear
If you look for the
Replacement processing can be performed on the nearest replacement sector, and
Access to the Kuta and its replacement sector
The shortest distance possible and access to replacement sectors
The seek time to do can be shortened.

The above-described replacement processing can be performed on a storage medium having primary and secondary replacement areas.

[0126]

As described above, according to the replacement processing method in the information storage device of the present invention, the replacement processing is performed on the free replacement sector closest to the defective sector generated on the storage medium. The seek time for accessing the replacement sector can be shortened.

[Brief description of drawings]

FIG. 1 is a flowchart showing a replacement process which is a reference technique of the present invention.

FIG. 2 is a block diagram showing a configuration of an information storage device according to an embodiment of the present invention and a reference technique .

3 is an explanatory diagram showing an example of a format of a recording surface of the storage medium 1 of FIG.

4 is an explanatory diagram when a replacement process, which is a reference technique of the present invention, is applied to a recording surface of the storage medium of FIG.

FIG. 5 is an explanatory view of the same.

FIG. 6 is also an explanatory diagram thereof.

FIG. 7 is an explanatory view of the same.

FIG. 8 is a flowchart showing another replacement process which is a reference technique of the present invention.

FIG. 9 is a flowchart showing still another replacement process which is a reference technique of the present invention.

10 is an explanatory diagram when a replacement process, which is a reference technique of the present invention, is applied to a recording surface of the format of FIG.

FIG. 11 is an explanatory view of the same.

FIG. 12 is also an explanatory diagram thereof.

FIG. 13 is an explanatory diagram of the same.

FIG. 14 is also an explanatory diagram thereof.

FIG. 15 is an explanatory view of the same.

FIG. 16 is a flowchart showing still another replacement process which is a reference technique of the present invention.

FIG. 17 is a flowchart showing a replacement process according to the embodiment of the present invention.

18 is an explanatory diagram showing an example of another format of the recording surface of the storage medium 1 of FIG.

FIG. 19 is an explanatory diagram when the replacement process of the embodiment of the present invention is applied to the recording surface of the format of FIG. 18.

FIG. 20 is an explanatory diagram of the same.

FIG. 21 is also an explanatory diagram thereof.

FIG. 22 is an explanatory diagram of the same.

FIG. 23 is also an explanatory diagram thereof.

FIG. 24 is also an explanatory diagram thereof.

FIG. 25 is also an explanatory diagram thereof.

FIG. 26 is also an explanatory diagram thereof.

FIG. 27 is also an explanatory view of the same.

FIG. 28 is a flowchart showing another replacement process of the present invention.

FIG. 29 is a flowchart showing a conventional replacement process.

[Explanation of symbols]

1: Information storage device 2: Storage medium 3: Read / write control unit 4: CPU 5: Program ROM 6: RAM 7: Interface (I / F) 10: Recording surface of storage medium

Claims (2)

(57) [Claims] 1. A storage medium provided with a plurality of groups each having a user area including a plurality of sectors into which data is written by a user and a replacement area including a plurality of replacement sectors for replacement processing with respect to a defective sector of the user area. Writing means for writing data, reading means for reading data stored in the storage medium, and when a defective sector in which data cannot be written by the writing means occurs in the user area, the replacement area a replacement processing method definitive information storage device and a replacement processing means for performing a replacement process of writing data to alternate sector vacant, the first half of each spare area so that the number of alternate sectors becomes 1/2, respectively It was divided into regions and the latter area, Ryo in the first half area sac Chi the near towards the second half of the area and immediately after the replacement area of the spare area of the previous generation defect sector Far away from the vacant replacement sector of the
When replacement processing is performed in the order of the vacant replacement sector in the other area, and if there is no vacant replacement sector in any of those areas, the first half area of the immediately preceding replacement area and the second half area of the immediately following replacement area of the replacement sector which is vacant farther area from the replacement sector that are vacant area towards the near Chi sac
Replacement processing is performed in order, and there is a free replacement
When there are no sectors, the second half of the replacement area further ahead
The sky in the area that is closer to the front area of the area or the rear replacement area
Free replacement in an area farther from the replacement sector
The replacement process is performed in the order of the sectors, and the
If there is no spare replacement sector,
Of the first half area of the spare area and the second half area of the rear spare area
Area far from the vacant replacement sector in the near area
The replacement processing method is characterized in that the replacement processing is performed in the order of the empty replacement sectors . 2. A replacement processing method according to claim 1 Symbol placement,
In the spare area in front of the defective sector that has occurred, a spare sector that is sequentially vacant from the last spare sector in the spare area is searched forward, and in the rear spare area, from the first spare sector in the spare area to the rear. A replacement processing method, characterized by sequentially searching for available replacement sectors.