JP2504378Y2 - Microscope observation device - Google Patents

Description

[Detailed description of the device]

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a microscope observing apparatus used for observing a transparent object to be observed, for example, when connecting an optical component and an optical fiber, and particularly to optical communication or optical information processing. Microscope observation used for optical component alignment device for optical axis alignment when connecting between optical IC and optical fiber, or connecting between laser diode or photodiode and optical fiber used for Regarding the device.

[0002]

2. Description of the Related Art Optical I used for optical communication or optical information processing
In the conventional optical component aligning device for aligning the optical axis when connecting C and the optical fiber, or connecting between the laser diode or the photodiode and the optical fiber,
A microscope observation device is adopted. However, since the optical fiber, the optical IC, the laser diode, and the photodiode are transparent and unsuitable for observation by the microscope observing apparatus, various measures have been taken for observation. For example, a lighting device is adopted, and the installation position and illuminance are variously adjusted to obtain optimum observation conditions for observation,
In addition, a reflector is used for observation.

[0003]

In the conventional example as described above, the optical fiber, the optical IC, the laser diode,
Since the photodiode is transparent and unsuitable for observation by a microscope observation device, an illumination device must be used for that observation, and the installation position of the illumination device and the illuminance must be adjusted variously. It is very troublesome to find the optimum viewing condition and it is difficult to find a suitable background color when observing with a reflecting mirror. The effect was not sufficient.

The present invention is intended to provide a microscope observing apparatus for a transparent object to be observed, in which such drawbacks and problems are eliminated and eliminated.

[0005]

In a microscope observing device for illuminating a transparent object to be observed such as an optical fiber or an optical IC and observing a monitor image through a microscope, a CCD and a monitor device, for all wavelengths of light. A reflective plate of which the reflective surface of the substrate having a high reflectance is formed as a diffuse reflective surface, and this reflective plate is placed below the transparent object to be observed so that the diffuse reflective surface becomes the background of the transparent object to be observed. By providing the face up, observation of the transparent object to be observed becomes easy.

[0006]

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENT An embodiment of the present invention will be described with reference to FIG. In FIG. 1, an optical fiber 1'with a carrier 2'bonded thereon is placed on the light incident side stage 14, and a waveguide 5 is formed on an optical IC fixing base 4. The IC 6 is mounted, and the optical fiber 1 to which the carrier 2 is bonded is mounted on the light-receiving side stage 3 similarly to the stage 14.
Here, the optical path alignment between the optical fiber 1'and the waveguide 5 and the optical path alignment between the optical fiber 1 and the waveguide 5 are performed. At this time, the microscope observation of the present invention is performed. The device is used. The microscope observation device is a microscope 16, CCD 15, Motani 19, illumination device 1.
7 and a reflector 18 described in detail below.

Here, the optical path alignment will be briefly described. As described above, since the optical fiber, the optical IC, the laser diode, and the photodiode are transparent, they are difficult to see from the microscope, and alignment of the optical path is a very difficult task. Therefore, the X, Y, Z stages 7, 8, 9 in the light-receiving side stage 14 and the light-receiving side stage 3 are used.
Before adjusting the adjustment dials 10, 11 and 12 of each stage for precise alignment by optical power, coarse alignment is performed to such an extent that the optical power can barely be detected.
A microscope observation device is used in these adjustments.

This invention uses the reflector 18 shown in FIGS. 2A and 2B in the microscope observing device used for the above-mentioned alignment. A substrate having a high reflectance for all wavelengths of light, such as aluminum, is used, and its reflecting surface is made into a diffuse reflecting surface state. 2A shows a substrate in which an aluminum vapor deposition film 31 is vapor-deposited on the bottom surface of a glass substrate 30, and the top surface, that is, the reflection surface is subjected to sandy surface treatment 32 to make it a diffuse reflection surface. . In FIG. 2B, the upper surface of the aluminum substrate 33 is directly subjected to a satin finish to make it a diffuse reflection surface.

Next, the entire microscope observation apparatus of the present invention will be described. First, how to install the reflection plate 18 will be explained. The diffuse reflection surface 32 or 33 is located below the optical IC 6 and the optical fibers 1 and 1'which are transparent objects to be observed, and the focus is seen from the microscope 16. The reflection plate 18 is installed so as to come to the shifted position. That is, in FIG. 1, the reflector 18 is attached to the side surface of the fixed base 4 for the optical IC, which is below the transparent object to be observed, so that the diffuse reflection surface 32 or 33 becomes the background of the object to be observed. To be Reference numeral 17 denotes an illuminating device. Light emitted from the illuminating device 17 passes through the microscope 16, the CCD 15 and the monitor 19 and is formed on the monitor surface as a diffuse reflection surface 32 or 3 serving as a background.
3 is a uniform white color.

[0010]

The microscope observing device of the present invention is constructed as described above, and since the reflecting plate 18 is made of a material having a high reflectance over the entire wavelength of light, it does not absorb light. There is no need to increase the light intensity of the light source, and there is no color shift to the optical device. A mirror can be considered as a means for achieving a high reflectance, but since the reflecting surface is a diametrically opposite surface, the light is reflected only in a certain direction to reflect the light source, and a white image cannot be obtained. Then, by making the surface of such a high-reflectance reflecting plate to have a satin or sandy surface, the light can be uniformly reflected over the entire surface and uniform white light can be obtained. Further, the reflecting surface can be made white by shifting it without focusing on the reflecting surface itself. In the microscope observing device of the present invention, when such a reflecting plate 18 is installed as described in the above-mentioned embodiment, when observing a transparent object to be observed such as an optical fiber, an optical IC, a laser diode and a photodiode, these Can be seen on the monitor surface as an image with clear lightness and darkness as shown in FIG. 3A on a white background due to the diffusely reflecting surface of the reflector 18. As a result, observation, rough alignment, fine alignment, and ultimately alignment are easy, and the precision of these can be improved.

[Brief description of drawings]

FIG. 1 is a diagram for explaining an embodiment of the present invention.

FIG. 2A is a view showing a reflector used in the present invention, and B is a view showing another example of the reflector used in the present invention.

3A is a view showing a transparent object to be observed by the microscope observing apparatus of the present invention, and FIG. 3B is a view showing a transparent object being observed by a microscope observing apparatus using a conventional reflector. , C are views showing a transparent observed object observed by a microscope observing device without using a reflection plate.

[Explanation of symbols]

 1 optical fiber 2 carrier 3 light receiving side stage 4 fixed base for optical IC 5 waveguide 6 optical IC 7 X stage 8 Y stage 9 Z stage 10 X stage adjustment dial 11 Y stage adjustment dial 12 Z stage adjustment dial 13 optical path 14 light input Side stage 15 CCD 16 Microscope 17 Illuminator 18 Reflector 19 Monitor 20 Light source 21 Light receiving detector 30 Glass substrate 31 Aluminum vapor deposition film 32 Diffuse reflective surface treated with sand 33 Diffuse reflective surface treated with satin 34 Aluminum plate

Claims (1)

(57) [Scope of utility model registration request] 1. In a microscope observing device for illuminating a transparent object to be observed such as an optical fiber or an optical IC and observing a monitor image through a microscope, a CCD and a monitor device, a high reflectance for all wavelengths of light. A reflecting plate having a reflecting surface of a substrate having a diffuse reflecting surface, the reflecting plate being below the transparent object to be observed, with the diffuse reflecting surface being the background of the transparent object to be observed. A microscope observation device characterized in that it is provided.