JP2022057965A - Spectacle frame shape measurement device and control program of spectacle frame shape measurement device - Google Patents

Abstract

To provide a spectacle frame shape measurement device which can excellently measure a three-dimensional shape of a groove of a rim and a cross-sectional shape of the rim groove, and a control program of the spectacle frame shape measurement device.SOLUTION: A spectacle frame shape measurement device for measuring a shape of a rim of a spectacle frame comprises: frame holding means which holds a rim holding member that holds the rim of the spectacle frame; a probe unit which holds a probe that is inserted into a groove of the rim; an optical measurement unit which optically measures a shape of the groove of the rim; a support unit which integrally supports the probe unit and the optical measurement unit; change means which changes a physical relation between the rim and the support unit; and control means which controls the change means so as to avoid interference of an interference object including at least any of the probe unit, the optical measurement unit and the support unit with respect to an interfered object including at least any of the rim held by the frame holding means and the rim holding member at the measurement of the rim.SELECTED DRAWING: Figure 17

Description

The present disclosure relates to a spectacle frame shape measuring device and a control program of the spectacle frame shape measuring device for obtaining the shape of the rim of the spectacle frame.

It is equipped with a stylus unit with a stylus that is inserted by pressing against the groove of the rim of the spectacle frame, and measures the shape of the entire circumference of the groove of the rim by obtaining the position of the stylus that is moved along the groove of the rim. A spectacle frame shape measuring device is known (see, for example, Patent Document 1).

In addition, it is equipped with an optical measuring unit that irradiates the groove of the rim of the eyeglass frame with the measured luminous flux and receives the reflected light flux reflected by the groove, and obtains the cross-sectional shape of the groove of the rim based on the received reflected light. Measuring unit An optical frame shape measuring device is known (see, for example, Patent Document 2).

Japanese Unexamined Patent Publication No. 2011-1228999 International Publication No. 2019/026416

By the way, by configuring the stylus unit and the optical unit to move integrally, it is conceivable to efficiently obtain a three-dimensional shape relating to the entire circumference of the groove of the rim and a cross-sectional shape of the groove of the rim.

However, by adding the optical measuring unit to the stylus unit, the size near the stylus becomes large, and when measuring the entire circumference of the rim, the optical measuring unit holds the rim. It was found that there was a problem that it interfered with the measured part and could not be measured well.

It is a technical subject of the present disclosure to provide a spectacle frame shape measuring device and a control program of the spectacle frame shape measuring device capable of satisfactorily measuring the three-dimensional shape of the rim groove and the cross-sectional shape of the rim groove.

In order to solve the above problems, the present invention is characterized by having the following configurations.
(1) A spectacle frame shape measuring device for measuring the shape of the rim of a spectacle frame, a frame holding means having a rim holding member for holding the rim of the spectacle frame, and a measuring element inserted into the groove of the rim. A stylus unit having a Interfered object including at least one of the rim of the spectacle frame held by the frame holding means and the rim holding member at the time of measuring the rim and the changing means for changing the relative positional relationship with the support unit. It is characterized in that the object is provided with a control means for controlling the changing means so as to avoid interference of an interfering object including at least one of the stylus unit, the optical measuring unit and the support unit. Eyeglass frame shape measuring device.
(2) To optically measure the shape of the frame holding means having a rim holding member for holding the spectacle frame, the stylus unit having a stylus inserted into the groove of the rim, and the groove of the rim. A spectacle frame including an optical measuring unit, a support unit that integrally supports the stylus and the optical measuring unit, and a changing means for changing the relative positional relationship between the rim and the support unit. A control program for the shape measuring device, which is a control step for controlling the changing means, and is an object to be interfered with including at least one of the rim of the spectacle frame held by the frame holding means and the rim holding member. On the other hand, a control step for controlling the changing means so as to avoid interference of an interfering object including at least one of the stylus unit, the optical measuring unit and the supporting unit, and a control unit of the spectacle frame shape measuring device. A control program for a spectacle frame shape measuring device, which is characterized by being executed by a device.

It is an external view of a measuring device. It is a top view of the frame holding unit. It is a figure explaining the clamp mechanism. It is a top perspective view of the lens shape acquisition unit. It is a bottom perspective view of the lens shape acquisition unit. It is a top perspective view of the Z direction moving unit and the Y direction moving unit. It is a perspective view explaining the schematic structure of a holding unit. It is a figure explaining the mechanism that a holding unit holds a support unit. It is a schematic block diagram of a stylus unit and an optical measuring unit. It is a schematic diagram which shows the positional relationship between the light projection optical system and the light receiving optical system of an optical measurement unit. It is a figure which shows the control system of the spectacle frame shape measuring apparatus. It is a flowchart of the program executed by the control part in the spectacle frame shape measuring apparatus. It is a figure which shows the operation of the holding unit at the start of measurement. It is a schematic diagram which shows the positional relationship of a clamp pin, a rim, a stylus, and an optical measuring unit in the case of measuring the shape of a low curve frame. It is a schematic diagram which shows the positional relationship between a clamp pin, a rim, a stylus, and an optical measurement unit when the optical measurement unit and the clamp pin interfere with each other. It is a figure which shows the interference part of an optical measurement unit. It is a figure explaining the case where the optical measurement unit is moved in the Y direction, and interference avoidance is made. It is a figure explaining the case where the optical measurement unit is moved in the Z direction, and interference avoidance is made. It is a figure explaining the case where the interference avoidance is made to the unmeasured part of a rim. It is a figure explaining an example that interference avoidance is performed by using the measured measurement result of a rim. It is a figure which showed the result of having differentiated the measurement result in the Z direction among the measurement results of the rim by a stylus in a graph. It is a figure explaining the avoidance operation at the measurement point where the interference occurred. It is a figure explaining the case where the optical measurement unit is moved in the X direction, and interference avoidance is made. It is a schematic diagram which shows the positional relationship between the optical measuring unit and the stylus when the optical measuring unit is arranged on the left and right sides of the stylus. It is a figure explaining the avoidance operation with an object to be interfered with when the optical measuring unit is arranged on the left and right sides of a stylus.

Hereinafter, embodiments in the present disclosure will be described with reference to the drawings. 1 to 11 are diagrams for explaining the configuration of the spectacle frame shape measuring device (for example, the spectacle frame shape measuring device 1) according to the present embodiment. In the present embodiment, the measurement plane at the time of measuring the rim of the spectacle frame, which is the spectacle frame, is the XY direction, and the vertical direction perpendicular to the XY direction is the Z direction. For example, the measurement plane (XY plane) is also treated as a radial plane. The XY direction is also treated as the radial direction for obtaining the radial information of the rim. For example, the measurement plane is a rim holding member (for example, clamp pins 130a, 130b, 131a, 131b) that holds the rim of the spectacle frame, and is above the left and right rims (in the present embodiment, the upper and lower sides of the spectacle frame and the rim). Is to hold the rim holding members (for example, clamp pins 130a and 130b) arranged at two places to hold the vertical direction when wearing eyeglasses, and to hold the lower side of the left and right rims, respectively. It is a plane defined by rim holding members (for example, clamp pins 131a and 131b) arranged at two locations. Further, on the measurement plane, the vertical direction (the depth direction of the spectacle frame shape measuring device), which is the vertical direction of the spectacle frame when the spectacle frame is held by the rim holding member, is the Y direction, and the left-right direction of the spectacle frame is X. Explained as a direction.

In the present embodiment, for example, the measurement plane is in the horizontal direction, the rim portion of the spectacle frame F is downward, and the temple portion of the spectacle frame F is upward with respect to the spectacle frame shape measuring device shown in FIG. It is arranged in the state of. That is, when the spectacle frame F is arranged in the spectacle frame shape measuring device, the left and right rims FL and FR of the spectacle frame F are in the downward direction, and the left and right temples FTL and FTR of the spectacle frame F are in the upward direction. Of course, the arrangement direction of the spectacle frame with respect to the spectacle frame shape measuring device is not limited to this. For example, the rim portion of the spectacle frame F may be arranged upward and the temple portion of the spectacle frame F may be arranged downward. Further, for example, the measurement plane may be in the vertical direction, and when the spectacle frame F is arranged in the spectacle frame shape measuring device, the upper ends of the left and right rims FL and FR of the spectacle frame F are relative to the spectacle frame shape measuring device. The lower ends of the left and right rims FL and FR of the spectacle frame F may be arranged so as to be upward with respect to the spectacle frame shape measuring device, or the upper and lower ends of the left and right rims FL and FR may be arranged downward. The arrangement of may be reversed. Furthermore, the measurement plane is not limited to the horizontal direction or the vertical direction, and may be an oblique direction.

[overview]
For example, the spectacle frame shape measuring device includes a frame holding means (for example, a frame holding unit 10) configured to hold the spectacle frame in a measurement state. For example, the frame holding means is a means for holding the spectacle frame with the left-right direction of the spectacle frame as the X direction, the vertical direction of the rim of the spectacle frame as the Y direction, and the front-back direction of the rim of the spectacle frame as the Z direction. For example, the frame holding means has a rim holding member for holding the spectacle frame in the measurement state. For example, the rim holding members are arranged at two places to hold the upper side of the left and right rims, respectively, and are arranged at two places to hold the lower side of the left and right rims, respectively. For example, two rim holding members arranged at each position are arranged to sandwich the rim of the spectacle frame from the thickness direction (Z direction). For example, the two rim holding members arranged at each position are configured to be openable and closable in the Z direction. For example, the frame holding means includes rim holding member opening / closing means (for example, a clamp mechanism 300) for opening / closing two rim holding members in the Z direction. The rim holding member may be a member having a V-shaped groove. In this case, the rim holding member is configured to hold the rim by receiving the thickness direction of the rim with a V-shaped groove.

For example, the spectacle frame shape measuring device includes a stylus unit (for example, a stylus unit 60). For example, the stylus unit comprises a stylus (eg, stylus 61) that is inserted into the groove of the rim. For example, the stylus unit comprises a stylus shaft (eg, stylus shaft 62) on which the stylus is located. In the present embodiment, when the stylus axis is positioned in the Z direction, the direction of the tip of the stylus (for example, the measuring axis L3) is arranged so as to extend substantially parallel to the measuring plane with respect to the stylus axis. However, it is not limited to this. For example, the direction of the tip of the stylus is arranged so that the high curve frame faces upward at a constant angle (for example, 5 to 15 degrees) with respect to the measurement plane so that the high curve frame can easily follow the shape of the rim. May be good.

For example, the spectacle frame shape measuring device includes an optical measuring unit (for example, an optical measuring unit 30). For example, the optical measuring unit optically measures the rim shape of the groove of the rim of the spectacle frame in a non-contact manner. For example, the optical measuring unit includes a floodlight optical system (for example, a floodlight optical system 30a) and a light receiving optical system (for example, a light receiving optical system 30b). For example, the projection optical system has a light source (for example, a light source 31) and irradiates a measured luminous flux from the light source toward the groove of the rim of the spectacle frame. For example, the projection optical system is configured to project slit light into the groove of the rim. For example, the groove of the rim is illuminated in a light-cut form by slit light. For example, the light receiving optical system has a detector (for example, a detector 37) that receives light. For example, the light receiving optical system is irradiated toward the groove of the rim of the spectacle frame by the light projecting optical system, and the reflected luminous flux of the measured luminous flux reflected by the groove of the rim of the spectacle frame is received by the detector.

For example, the spectacle frame shape measuring device includes a support unit (for example, a support unit 70) that integrally supports the stylus unit and the optical measuring unit. For example, it has a support unit, a support member (for example, a stylus shaft 62) that supports the stylus unit and the optical measuring unit. For example, the support unit is configured to support the stylus unit and the optical measuring unit by using a part of the stylus shaft to which the stylus is attached as a support member. For example, the optical measuring unit is attached to the stylus shaft.

For example, the optical measuring unit includes a housing (for example, a cover 30c) in which a floodlight optical system and a light receiving optical system are housed. For example, the housing of the optical measuring unit is provided on the support unit so that the entire housing is located on one side in the left-right direction with respect to the stylus axis with the tip of the stylus facing toward you. There is. The optical measuring unit may be configured to be arranged on both the left and right sides with respect to the stylus axis.

Further, for example, when the stylus is inserted into the groove of the rim held by the rim holding member at the start of measurement, the casing of the optical measuring unit is prevented from interfering with the rim holding member in the Z direction. The upper end of the body (for example, the cover 30c) is configured to be located below the position of the lower end of the rim holding member (for example, below when the Z direction is the vertical direction). This makes it easier to avoid interference between the rim holding member and the rim holding member in the vicinity of the rim holding member at the time of measurement. Further, for example, the lower end of the housing of the optical measuring unit may be located above the upper end of the rim holding member. This also facilitates avoiding interference of the optical measuring unit with the rim holding member.

For example, the spectacle frame shape measuring device includes a holding unit (for example, a holding unit 25) that holds the support unit. For example, the holding unit is configured to movably hold the support unit in the direction in which the tip of the stylus faces (for example, the direction of the measuring axis L3). For example, the holding unit includes a measuring pressure applying means (for example, a spring 76) that applies a measuring pressure that presses the tip of the stylus against the groove of the rim. For example, the holding unit is configured, for example, to hold the support unit in a freely movable position in the Z direction.

For example, the spectacle frame shape measuring device includes changing means (for example, moving unit 210, rotating unit 260) for changing the relative positional relationship between the rim and the support unit. For example, the changing means includes a rotating means (for example, a rotating unit 260) that rotates the support unit about a rotation axis extending in the Z direction in order to change the XY direction in which the tip of the stylus faces. For example, the rotating means is provided in the holding unit. By the rotating means, on the measurement plane of XY, the XY direction toward which the tip of the stylus of the stylus unit faces (for example, the direction of the measurement axis L3) and the measurement optical axis of the optical measurement unit (projection optical axis L1, light receiving). The XY direction of L2) can be changed with the optical axis.

Further, for example, the changing means includes XY direction changing means for changing the position of the support unit in the XY direction. The XY direction changing means is for changing the X direction changing means (for example, the X direction moving unit 240) for changing the position of the holding unit provided with the support unit in the X direction, and the Y direction position of the holding unit. The Y-direction changing means (for example, the Y-direction moving unit 230) is provided. As a result, the tracking mechanism of the stylus that follows the groove of the rim in the XY direction is miniaturized, and the weight thereof can be reduced, so that the shape of the rim can be accurately measured by the stylus. Further, for example, the changing means includes a Z direction changing means (for example, a Z direction moving unit 220) for changing the position of the holding unit provided with the support unit in the Z direction. As a result, the tracking mechanism of the stylus that follows the Z direction along the groove of the rim is miniaturized, and the weight thereof can be reduced, so that the shape of the rim can be accurately measured by the stylus.

For example, the spectacle frame shape measuring device includes interference information acquisition means (for example, a control unit 50). The interference information acquisition means is an object to be interfered with by the optical measuring unit, and information on the object to be interfered with at least one of the rim of the spectacle frame and the rim holding member placed in the measurement state by the frame holding means. Is configured to get. For example, the interference information acquired by the interference information acquisition means includes placement information of the rim holding member when the rim of the spectacle frame is placed in the measurement state. For example, the interference information acquisition means acquires arrangement information of the rim holding member in at least one direction in the X, Y, and Z directions.

For example, the interference information acquisition means acquires the arrangement information of the rim holding member in the Y direction based on the position in the Y direction in which the rim holding member is moved so as to hold the rim of the spectacle frame by the frame holding means. For example, the arrangement information of the rim holding member in the X direction is stored as a design value in the storage means. For example, the interfered information acquisition means acquires by calling the arrangement information of the rim holding member in the X direction from the storage means. For example, the interference information acquisition means obtains the arrangement information of the rim holding member in the Z direction by obtaining the position of the rim holding member (the rim holding member on the front side of the rim) in the Z direction when the rim is held at the time of measurement. The interference information acquisition means may store the arrangement information of the rim holding member in the Z direction in the storage means as a design value. In this case, the interfered information acquisition means acquires by calling the arrangement information of the rim holding member in the Z direction from the storage means.

For example, the spectacle frame shape measuring device includes a control means (for example, a control unit 50) for controlling the changing means. For example, the control means controls the modification means to measure the unmeasured portion of the rim based on the measured result of the shape of the rim. At the time of this measurement, for example, the control means controls the changing means so as to avoid the interference of the interfered object with respect to the interfered object based on the interfered information acquired by the interfered information acquisition means. For example, the interfering material includes at least one of a stylus unit, an optical measuring unit and a support unit. For example, an interfering object that interferes with an object to be interfered with during measurement is typically an optical measuring unit, but depending on the shape of the stylus unit, this may be an interfering object. Further, depending on the shape of the support unit, this may become an interference substance. For example, when the control means causes the unmeasured portion of the rim to be measured, an interfering object (for example, an interfering object in at least one direction in the X direction, the Y direction, and the Z direction with respect to the rim holding member is based on the arrangement information of the rim holding member. The changing means is controlled so that the interference portion (for example, the interference region IR) of the optical measuring unit) is separated. The interference portion of the interfering object (for example, the optical measuring unit) may be specified in advance in the housing of the interfering object (for example, the optical measuring unit) and stored in the storage means. For example, the interference site can be specified in advance by simulating the positional relationship of the housing of an interfering object (for example, an optical measuring unit) at the time of measurement with respect to the shape of the rim of various spectacle frames that can be measured. can. For example, the interference site may be one interference point (for example, interference point IRP) defined on the interference object. For example, the interference point is a point defined on an interfering object (for example, an optical measuring unit), and if the interference of this interference point is avoided with respect to the object to be interfered with, the interference of the entire interference part is avoided. It is defined as a point to do. For example, the interference point can be specified in advance by simulating the positional relationship of the housing of the interference object (for example, the optical measurement unit). In this case, while the interference portion has a certain area, it is sufficient to calculate the arrangement position of one interference point, so that the calculation speed becomes high and smooth measurement can be performed. For example, the control means avoids (for example, avoiding) the interference portion of the interfering object (for example, the optical measuring unit) so as to be separated from the tip of the rim holding member extending toward the inside of the rim by a certain distance or more in the Y direction. To control the means of change. For example, the control means controls the rotation means at this time. For example, the control means positions the stylus to measure the unmeasured portion of the rim based on the measured result when measuring the unmeasured portion of the rim, and interferes with the tip of the rim holding member. The XY changing means and the rotating means are controlled so that the interference portion of the object (for example, the optical measuring unit) is separated in the Y direction by a certain distance or more. As a result, in the Y direction, interference with the rim holding member (for example, the optical measuring unit) is avoided, and the interference with the rim located in the vicinity of the rim holding member (for example, the optical measuring unit) is avoided. Interference is avoided.

For example, the control means sets a determination line (for example, an interference determination line ILCY) substantially parallel to the Y direction so as to be separated from the tip of the rim holding member by a certain distance or more in the Y direction based on the arrangement information of the rim holding member. Set. Then, for example, the control means is changed so that the interference portion of the interfering object (for example, the optical measuring unit) does not approach the side where the rim holding member is located from the determination line when measuring the unmeasured portion of the rim. Control the means. As a result, in the Y direction, interference with the rim holding member (for example, the optical measuring unit) is avoided, and the interference with the rim located in the vicinity of the rim holding member (for example, the optical measuring unit) is avoided. Interference is avoided.

When the stylus is positioned at the unmeasured portion of the rim based on the measured result, the control means so that the tip of the stylus faces a predetermined angle with respect to the rim (for example, in the XY direction). Assuming that the unmeasured rim portion is in the extension direction of the measured rim (so that it faces the normal direction with respect to the extension direction), the first state including the XY position state of the support unit and the rotation state by the rotating means is obtained. After that, in this first state, the deviation amount (for example, ΔE) in the Y direction in which the interference portion of the interference object (for example, the optical measurement unit) exceeds the determination line is obtained, and the interference substance (for example, for example) is obtained based on the obtained deviation amount. , The changing means is controlled so that the interference portion of the optical measuring unit) is moved in the Y direction.

For example, the optical measuring unit has a configuration in which the stylus is inserted into the groove of the rim held by the rim holding member at the start of measurement and is supported by the support unit at a position that does not interfere with the rim holding member in the Z direction. be. When the interfering object is an optical measuring unit, for example, when the control means measures an unmeasured portion of the rim, the interference portion of the optical measuring unit is the rim based on the arrangement information of the rim holding member. When the holding member is located at a distance of a certain distance or more in the Z direction, the interference avoidance operation in the Y direction is not performed. As a result, the position of the optical measuring unit for avoiding interference in the XY direction is not changed, so that the shape of the rim can be measured more accurately.

For example, the interfered information acquired by the interfered information acquisition means includes the measured information of the rim. In this case, for example, the control means interferes with an interfering object (for example, an optical measuring unit) in at least one of the X, Y, and Z directions with respect to the measured rim based on the measured information of the rim. The changing means is controlled so that the distance between the site and the object to be interfered with becomes a certain distance or more.

For example, the optical measuring unit has a configuration in which the stylus is biased to one side in the left-right direction with respect to the stylus when the stylus is viewed from the tip direction thereof. When the interfering object is an optical measuring unit, for example, the control means controls the stylus to measure the unmeasured portion of the rim ahead of the optical measuring unit at the time of measuring the rim, and the control means. Is based on the measured information of the rim, and the distance between the interference site of the optical measuring unit and the object to be interfered with is equal to or more than a certain distance in at least one of the X, Y, and Z directions with respect to the measured rim. The change means is controlled so as to be.

For example, the rim interfered portion in the measured information of the rim can be obtained based on the rim cross-sectional information measured by the optical measuring unit. For example, the rim's interference site in the measured information of the rim can be further obtained based on the rim cross-sectional information measured by the optical measuring unit and the measurement result of the three-dimensional shape of the rim by the stylus unit. can. Further, for example, even if the rim cross-sectional information obtained by the measurement of the optical measuring unit is not used, the rim information inside the rim with respect to the rim groove is previously set as the interference site in the XY direction of the rim in the measured information of the rim. By being acquired, it can be obtained based on this information and the measurement result of the shape of the rim by the stylus unit. For example, in the measured information of the rim, the interference site in the Z direction of the rim has the rim thickness information for the rim groove acquired in advance, so that this information and the measurement result of the shape of the rim by the stylus unit can be obtained. Can be obtained based on.

Further, for example, the optical measuring unit is supported by the support unit at a position that does not interfere with the rim holding member in the Z direction with the stylus inserted in the groove of the rim held by the rim holding member at the start of measurement. It is a composition. When the interfering object is an optical measuring unit, for example, when the control means measures an unmeasured portion of the rim, the interference portion of the optical measuring unit is determined based on the arrangement information of the rim holding member. When the rim holding member is located at a distance of a certain distance or more in the Z direction, the interference avoidance operation in the X direction and the Y direction is not performed.

For example, the optical measuring unit has a configuration in which the stylus is biased to one side in the left-right direction with respect to the stylus when the stylus is viewed from the tip direction thereof. In this case, for example, the control means controls the changing means so that the stylus precedes the optical measuring unit to measure the unmeasured portion of the rim when measuring the rim. Then, for example, the control means changes the measuring means based on the measured information of the rim so that the interference portion of the optical measuring unit is avoided in at least one of the X direction and the Y direction with respect to the measured rim. Control. As a result, even if the optical measuring unit cannot perform the interference avoiding operation in the Z direction, the measurement can be performed while avoiding the interference with the rim.

For example, the spectacle frame shape measuring device may include a selection means for selecting whether or not the spectacle frame is a high curve frame. In this case, for example, the control means controls the changing means so as to avoid interference of the interfering object (eg, the optical measuring unit) with the object to be interfered with when the high curve frame is selected. On the other hand, if the high curve frame is not selected (ie, if the spectacle frame is not a high curve frame), the control means does not perform an interference avoidance action to avoid interference with the object to be interfered with. .. For example, when the interfering object is an optical measuring unit, the optical measuring unit does not interfere with the rim holding member in the Z direction with the stylus inserted in the groove of the rim held by the rim holding member at the start of measurement. In the configuration supported by the support unit at the position, when the eyeglass frame is not a high curve frame, the optical measuring unit is in a state of avoiding interference with the rim holding member and the rim in the Z direction, so that the X direction and the X direction and the rim are supported. The rim can be measured as usual without performing the interference avoidance operation in the Y direction. As a result, unnecessary interference avoidance operation can be avoided and the shape of the rim can be measured more accurately.

For example, the spectacle frame shape measuring device includes interference generation detecting means for detecting whether or not interference between an interfering object and an object to be interfered with occurs during the measurement of the rim based on the measurement result of the rim. For example, the interference generation detecting means detects the presence or absence of interference generation based on the detection result in the Z direction among the measurement results of the rim.

For example, the spectacle frame shape measuring device includes a remeasurement executing means that remeasures the shape of the rim when it is detected by the interference generation detecting means that interference has occurred. For example, the remeasurement executing means may have the control unit automatically execute the remeasurement based on the detection result of the interference occurrence detecting means. Alternatively, the fact that interference between the interfering object and the object to be interfered with has occurred during the measurement is displayed on the display means (for example, monitor 3), and the remeasurement execution signal is input by the operator operating the remeasurement execution switch. It may be configured to be.

For example, the spectacle frame shape measuring device includes a measuring point specifying means for specifying a measuring point where interference between an interfering object and an object to be interfered with occurs based on a detection result of the interference generation detecting means. For example, when the specified measurement point is remeasured, the control means controls the changing means to perform an interference avoidance operation different from the interference avoidance operation before the remeasurement of the interfering object. For example, the spectacle frame shape measuring device includes control information of the means for changing the arrangement position of the interference portion of the interfering object at the specified interference generation measurement point (furthermore, positional relationship information of the optical measuring unit with respect to the stylus. It is provided with a calculation means obtained based on (may be). In this case, for example, the control means remeasures by the remeasurement execution means, and when the measurement point of the specified interference occurrence is remeasured, the control means interferes with the arrangement position of the interference part determined by the calculation means. By controlling the changing means so that is located at a certain distance or more, the interference avoiding operation of the interfering object is performed. This makes it possible to measure the shape of the rim more accurately and satisfactorily.

For example, in the remeasurement by the remeasurement executing means, when the interfering object and the object to be interfered (rim or rim holding member) slightly interfere with each other and the stylus is not completely removed from the rim groove. It may be done. For example, the remeasurement in this case may be performed after the measurement of the entire circumference of the rim is completed, or after the measurement is interrupted when the occurrence of interference is detected by the interference generation detecting means in the middle of the measurement. It may be done. Further, for example, the remeasurement by the remeasurement executing means may be performed when the stylus falls off from the rim groove due to the occurrence of interference. For example, whether or not the stylus has fallen off from the rim groove is detected based on the measurement result of the rim because the measurement result of the rim shows an abnormal value.

For example, when the control means remeasures the specified measurement point of the occurrence of interference, the control means has a radial direction and a vertical direction (X direction) perpendicular to the radial direction with respect to the arrangement position of the interference portion determined by the calculation means. , Y direction and Z direction), the interference avoidance operation is performed.

Further, for example, the control means is an interference point included in the interference site when measuring a specified measurement point of interference generation, and is an interference point defined on an interfering object (for example, an optical measuring unit). The interference avoidance operation may be performed so that the interference point is separated in the inner direction of the rim in at least one of the X direction and the Y direction with respect to the arrangement position of. In this case, while the interference site has a certain area, the calculation speed is high because it is sufficient to calculate the arrangement position of one interference point defined on the interference object (for example, the optical measurement unit). Therefore, smooth measurement can be performed.

Further, for example, in executing the remeasurement, when the control means remeasures the measurement point after the specified interference occurrence measurement point, the optical measurement unit is operated to avoid interference at the interference occurrence measurement point. The changing means is controlled so as to gradually change the posture state of the optical measuring unit to the posture state at the time of the original measurement. For example, for an attitude state in which an interfering object (for example, an optical measuring unit) is operated to avoid interference at a measurement point where interference occurs, an interfering object at the time of the original measurement at a measurement point after the measurement point where interference occurs. When the posture state of (for example, an optical measuring unit) is suddenly returned, the orientation of the stylus with respect to the rim (the orientation of the measuring axis L3) suddenly changes, and the measurement accuracy may deteriorate. Therefore, by gradually changing the orientation of the stylus at an angle (for example, 0.5 degrees) that reduces the influence of the measurement accuracy, the rim can be measured satisfactorily without deteriorating the measurement accuracy. become.

In addition, the control that gradually changes the posture state of the optical measurement unit at the time of the original measurement is to set the number of measurement points at the post-measurement points to a fixed value (for example, 50 points, 1 point is 0.36 of the radial angle). The degree) may be set, and the angle at which the optical measuring unit returns to the posture state at the time of the original measurement may be gradually changed by the angle divided by the number of measurement points.

Further, when the control means remeasures the measurement point before the specified interference generation measurement point, the control means operates to avoid the interference at the interference generation measurement point from the attitude state of the interference object at the time of the original measurement. The changing means may be controlled so as to change the posture state in a stepwise manner. This makes it possible to perform good measurement of the rim without deteriorating the measurement accuracy.

The present disclosure is not limited to the apparatus described in the present embodiment. For example, a control program (software) that performs the functions of the above-described embodiment is supplied to the system or device via a network or various storage media. Then, a control unit (for example, a CPU or the like) of the system or the device can read and execute the program.

For example, the control program of the spectacle frame shape measuring device is, for example, the control program of the spectacle frame shape measuring device is a control step for controlling the changing means, and is a rim of the spectacle frame held by the frame holding means and the rim. It is provided with a control step for controlling the changing means so as to avoid interference of the interfering object including at least one of the holding members with respect to the interfering object including at least one of the stylus unit, the optical measuring unit and the support unit. .. By having the control unit of the spectacle frame shape measuring device perform these steps, the shape of the rim can be measured satisfactorily.

Further, the control program may include an interference information acquisition step of acquiring interference information of at least one of the rim of the spectacle frame and the rim holding member held by the frame holding means. In this case, the control step includes a step of controlling the changing means so as to avoid the interference of the interfering object with the interfering object based on the interfering information acquired by the interfering information acquisition step.

Further, for example, the control program of the spectacle frame shape measuring device includes a control step for controlling the changing means so as to measure the unmeasured portion of the rim based on the measured result of the shape of the rim. For example, the control program of the spectacle frame shape measuring device determines whether or not interference between the interfered object and the interfered object of at least one of the rim and the rim holding member occurs during the measurement of the rim based on the measurement result of the rim. It is provided with an interference occurrence detection step for detecting. For example, the control program of the spectacle frame shape measuring device includes a remeasurement execution step of executing a remeasurement of the shape of the rim when the occurrence of interference is detected by the interference generation detection step. For example, the control program of the spectacle frame shape measuring device includes a measurement point specifying step that identifies a measurement point where interference with the rim has occurred based on the detection result of the interference generation detection step. For example, in the control step, the remeasurement is executed by the remeasurement execution step, and when the specified measurement point is remeasured, by controlling the changing means, what is the interference avoidance operation before the remeasurement of the interfering object? It is a step to perform different interference avoidance operations.

For example, the control program of the spectacle frame shape measuring device may include a calculation step for obtaining the arrangement position of the interference portion of the interfering object at the specified interference generation measurement point based on the control information of the changing means. In this case, the control step is a step in which the interference avoidance operation of the optical measurement unit is performed by controlling the changing means so that the interference portion is separated from the arrangement position of the interference portion obtained by the calculation step. be. By performing these steps by the control unit of the spectacle frame shape measuring device, the shape of the rim can be satisfactorily measured in the remeasurement when interference occurs.

[Example]
One of the exemplary embodiments of the present disclosure will be described with reference to the drawings.

FIG. 1 is a schematic external view of the spectacle frame shape measuring device.
For example, the spectacle frame shape measuring device 1 includes a monitor 3, a switch unit 4, a frame holding unit 10, a lens shape acquisition unit 20, and the like. The monitor 3 displays various information (for example, the cross-sectional shape of the rim groove FA of the rim Ri, the shape of the rim of the spectacle frame F, etc.). The monitor 3 is a touch panel, and the monitor 3 may also serve as a function of the switch unit 4. The switch unit 4 is used to make various settings (for example, start measurement, etc.). The signal corresponding to the operation instruction input from the monitor 3 and the switch unit 4 is output to the control unit 50 described later. The spectacle frame shape measuring device 1 may be incorporated in the lens processing device in the same manner as in Japanese Patent Application Laid-Open No. 2000-314617. For example, the lens shape acquisition unit 20 irradiates a measured light flux toward a groove of a rim Ri (for example, left rim RIL, right rim RIR) of the spectacle frame F held by the frame holding unit 10, and transmits the reflected light flux. It includes an optical measuring unit that acquires the cross-sectional shape of the rim groove FA of the spectacle frame F by receiving light. Further, for example, the lens shape acquisition unit 20 inserts a stylus into a groove of a rim (for example, left rim RIL, right rim RIR) of the spectacle frame F held by the frame holding unit 10 to move the stylus. It includes a stylus unit 60 that measures the shape of the rim Ri by detecting it. For example, the ball shape acquisition unit 20 is arranged below the frame holding unit 10.

<Frame holding unit>
FIG. 2 is a top view of the frame holding unit 10 holding the spectacle frame F. The frame holding unit 10 holds the spectacle frame F in a desired state. For example, the frame holding unit 10 includes a holding portion base 101, a front slider 102, a rear slider 103, an opening / closing movement mechanism 110, and the like.

For example, a front slider 102 for holding the spectacle frame F (rim Ri) and a rear slider 103 are mounted on the holding portion base 101. For example, the front slider 102 and the rear slider 103 are slidably arranged so as to face each other on two rails 111 extending in the Y direction about the center line CL, and the center line CL of both is always provided by the spring 113. It is being pulled in the direction toward.

For example, the front slider 102 is provided with clamp pins 130a and 130b, which are examples of rim holding members for clamping the rim Ri of the spectacle frame F from the thickness direction (Z direction), at two locations, respectively. For example, the rear slider 103 is provided with clamp pins 131a and 131b, which are examples of rim holding members for clamping the rim Ri of the spectacle frame F from the thickness direction (Z direction), at two locations, respectively. Further, for example, when measuring a template, the front slider 102 and the rear slider 103 are opened, and a well-known template holding jig is arranged and used at a predetermined mounting position 140. As the configuration of the frame holding unit 10, for example, a well-known one described in Japanese Patent Application Laid-Open No. 2000-314617 can be used.

For example, in the spectacle frame F, the lower side of the rim when wearing spectacles is located on the front slider 102 side, and the upper side of the rim Ri is located on the rear slider 103 side. For example, the spectacle frame F is held in a predetermined measurement state by the clamp pins located on the lower side and the upper side of the left and right rims Ri, respectively.

The open / closed state of the front slider 102 and the rear slider 103 in the Y direction may be detected by the detector 120 (for example, an encoder). In this case, the detection information of the detector 120 is used to acquire the arrangement information of the clamp pins (130a, 131a, etc.) in the Y direction at the time of measurement.

FIG. 3 is a diagram illustrating a clamp mechanism 300 of the clamp pins 130a and 130b for holding the rim Ri. The clamp mechanism 300 is arranged on the front slider 102 and the rear slider 103, respectively, corresponding to the clamp pins 130a, 130b, 131a, 131b arranged at the four locations. FIG. 3A is a schematic configuration diagram of a clamping mechanism 300 arranged on the left side of the front slider 102 in order to clamp the lower side of the left rim RIL. FIG. 3B is a diagram illustrating the positional relationship between the clamp pins 130 and 131, the front slider 102, the rear slider 103, and the rim Ri to be measured. FIG. 3 (c) is a view of the rim Ri held by the clamp pins 130 (130a, 130b) in FIG. 3 (b) observed from the direction of arrow A3.

The clamp pin 130a is attached to the tip of the first arm 301 via the support shaft 132a. The clamp pin 130b is attached to the tip of the second arm 302 via the support shaft 132b. The first arm 301 is rotatably held by the shaft 304. The second arm 302 is rotatably held by the shaft 306. A compression spring 303 is attached between the first arm 301 and the second arm 302. The compression spring 303 urges the distance between the two clamp pins 130a and 130b to always open. Further, a gear 309 centered on the shaft 304 is formed at the center of the first arm 301. Similarly, a gear 311 centered on the shaft 306 is formed at the center of the second arm 302, and the gear 309 is meshed with the gear 311. One end of the spring 318 is attached to the rear end of the first arm 301. A wire 315 is fixed to the other end of the spring 318. The wire 315 is wound by the motor 322 via the pulley 317. By driving the motor 322, the clamp pin 130a attached to the first arm 301 and the clamp pin 130b attached to the second arm 302 are opened and closed in conjunction with each other.

Further, a U-shaped rim receiver 313 to which the rim Ri abuts is arranged between the clamp pin 130a and the clamp pin 130b. The rim receiver 313 is fixed to the lower support shaft 132b. A groove 314 is formed in the rim receiver 313, and the support shaft 132a of the clamp pin 130b passes through the groove 314. With this configuration, the rim Ri is brought into contact with the rim receiver 313, the position of the rim Ri in the Y direction is restricted, and the two clamp pins 130a and 130b are closed, so that the rim Ri is moved by the clamp pins 130a and 130b. Be retained.

The length SSBL at which the support shafts 132a and 132b project from the facing surfaces 102a and 103a of the sliders 102 and 103 in the Y direction is located below the clamp pin 130b when the optical measuring unit 30 described later is measured. The optical measuring unit 30 is arranged so as not to interfere with the sliders 102 and 103 even when it approaches the sliders 102 and 103. Further, the length HBL from the rim receiver 313 to the tip position 133 of the clamp pins 130a and 130b and the width HBA (XY position) of the clamp pins 130a and 130b in the X direction are described later as interference information. It is stored in advance in 52. Further, when the clamp pin 130b holds the measurable rim Ri, the position 130min in the Z direction of the lowermost end where the clamp pin 130b is located is also stored in advance in the memory 52 as interference information. Regarding the rim receiver 313, when the optical measurement unit 30 interferes during measurement, the width of the rim receiver 313 in the X direction and the position of the lowermost end in the Z direction are the memory 52 as the interference information of the object to be interfered. It may be stored in advance in.

In this embodiment, the clamp pins 130a, 130b, 131a, 131b have been described as an example of the configuration of the rim holding member for holding the rim Ri, but the present invention is not limited to this, and a well-known mechanism is used. May be done. For example, the rim holding member may have a V-shaped groove. In this case, the rim Ri is received by the V-shaped groove, and the Z-direction position and the Y-direction position of the rim Ri are restricted.

<Spherical shape acquisition unit>
4 to 6 are views for explaining the lens shape acquisition unit 20. FIG. 4 is a top perspective view of the lens shape acquisition unit 20. FIG. 5 is a bottom perspective view of the lens shape acquisition unit 20. FIG. 6 is a top perspective view of the Z-direction moving unit 220 and the Y-direction moving unit 230, which will be described later (a perspective view with the base portion 211 and the X-direction moving unit 240 removed).

For example, the ball shape acquisition unit 20 is arranged below the frame holding unit 10. For example, the ball shape acquisition unit 20 includes a base portion 211, a holding unit 25, a moving unit 210, and the like.

The base portion 211 is a rectangular frame extending in the X direction and the Y direction, and is provided at the lower part of the frame holding unit 10. The holding unit 25 holds the stylus unit 60 and the optical measuring unit 30, which will be described later. Further, the holding unit 25 includes a rotating unit 260. The rotation unit 260 rotates the rotation base 261 around the rotation axis L0 so that the stylus 61 provided in the stylus unit 60 described later faces the XY direction and the opening provided in the optical measuring unit 30. The XY direction to which the portion 38 faces is changed. The moving unit 210 moves the holding unit 25 in the X direction, the Y direction, and the Z direction, thereby moving the holding unit 25 relative to the rim Ri of the spectacle frame F.

<Moving unit>
For example, the moving unit 210 includes a base portion 211, a Z-direction moving unit 220, a Y-direction moving unit 230, an X-direction moving unit 240, and the like. For example, the base portion 211 is a rectangular frame extending in the X direction and the Y direction, and is arranged below the frame holding unit 10. For example, the Z-direction moving unit 220 moves the holding unit 25 in the Z-direction. For example, the Y-direction moving unit 230 holds the holding unit 25 and the Z-direction moving unit 220, and moves them in the Y direction. For example, the X-direction moving unit 240 holds the holding unit 25, the Z-direction moving unit 220, and the Y-direction moving unit 230, and moves them in the X direction.

For example, the X-direction moving unit 240 is roughly configured as follows. For example, the X-direction moving unit 240 includes a guide rail 241 extending in the X-direction below the base portion 211. For example, the Y base 230a of the Y direction moving unit 230 is attached to the guide rail 241 so as to be movable in the X direction. For example, a motor 245 is attached to the base portion 211. For example, a feed screw 242 extending in the X direction is attached to the rotation shaft of the motor 245. For example, the nut portion 246 fixed to the Y base 230a is screwed into the feed screw 242. As a result, when the motor 245 is rotated, the Y base 230a is moved in the X direction.

For example, the Y-direction moving unit 230 is roughly configured as follows. For example, a guide rail (not shown) extending in the Y direction is attached to the Y base 230a. For example, the Z base 220a is attached to the guide rail so as to be movable in the Y direction. For example, a motor 235 for moving in the Y direction and a rotatable feed screw 232 extending in the Y direction are attached to the Y base 230a. For example, the rotation of the motor 235 is transmitted to the feed screw 232 via a rotation transmission mechanism such as a gear. For example, a nut 227 attached to the Z base 220a is screwed into the lead screw 232. As a result, when the motor 235 is rotated, the Z base 220a is moved in the Y direction.

For example, the X-direction moving unit 240 and the Y-direction moving unit 230 constitute an XY-direction moving unit. For example, the moving position of the holding unit 25 in the XY direction is detected by the control unit 50, which will be described later, by detecting the number of pulses in which the motor 245 and the motor 235 are driven. For example, the moving position of the holding unit 25 in the XY direction may be detected by using a sensor such as an encoder attached to the motors 245 and 235.

For example, the Z-direction moving unit 220 is roughly configured as follows. For example, the Z base 220a is formed with a guide rail 221 extending in the Z direction, and the moving base 250a to which the holding unit 25 is attached is movably held in the Z direction along the guide rail 221. For example, a pulse motor 225 for moving in the Z direction is attached to the Z base 220a, and a feed screw (not shown) extending in the Z direction is rotatably attached to the Z base 220a. For example, it is screwed into a nut attached to the base 250a of the holding unit 25. For example, the rotation of the motor 225 is transmitted to the feed screw 222 via a rotation transmission mechanism such as a gear, and the rotation of the feed screw 222 causes the holding unit 25 to move in the Z direction.

For example, the moving position of the holding unit 25 in the Z direction is detected by the control unit 50, which will be described later, by detecting the number of pulses in which the motor 225 is driven. For example, the moving position of the holding unit 25 in the Z direction may be detected by using a sensor such as an encoder attached to the motor 225.

The moving mechanisms in the X direction, the Y direction, and the Z direction as described above are not limited to this embodiment, and well-known mechanisms can be adopted. For example, instead of moving the holding unit 25 linearly, the holding unit 25 may be moved with respect to the center of the rotation base 261 by arc activation (see, for example, Japanese Patent Application Laid-Open No. 2006-350264).

<Holding unit, support unit>
Next, the configuration of the holding unit 25 will be described with reference to FIGS. 7 to 10. FIG. 7 is a perspective view illustrating a schematic configuration of the holding unit 25. The holding unit 25 includes a support unit 70.

The support unit 70 includes a stylus unit 60 and an optical measuring unit 30. The stylus unit 60 includes a stylus 61 inserted into the groove of the rim and a stylus shaft 71 in which the stylus 61 is arranged at an upper portion. The optical measurement unit 30 includes a cover 30c which is a housing in which a projection optical system and a light receiving optical system are housed. The support unit 70 is configured to integrally support the stylus unit 60 and the optical measuring unit 30. In this embodiment, a part of the lower part of the stylus shaft 62 also serves as a support unit 70, and the optical measuring unit 30 is attached to the stylus shaft 62. The support unit 70 may be configured to integrally support the stylus unit 60 and the optical measuring unit 30, for example, the optical measuring unit 30 is not attached to the stylus shaft 62 but is supported. The member may integrally support the stylus shaft 62 and the optical measuring unit 30.

Further, as shown in FIG. 8, the optical measuring unit 30 is in a position where the stylus 61 is inserted into the groove of the rim held by the clamp pin 130 at the start of measurement and does not interfere with the clamp pin 130 in the Z direction. In addition, it is a configuration supported by the support unit 70. That is, when the stylus shaft 62 is positioned substantially parallel to the Z direction, the distance ZA (distance in the Z direction) of the upper surface 30cA of the cover 30c with respect to the tip 61a of the stylus 61 is held by the clamp pin 130 at the start of measurement. With the stylus 61 inserted in the groove of the rim, the distance is set so that it does not interfere with the clamp pin 130b.

Further, the optical measuring unit 30 is configured to be biased to one side in the left-right direction with respect to the stylus 61 when viewed from the tip 61a direction of the stylus 61 (see FIGS. 7 and 9). In this embodiment, the optical measuring unit 30 is biased to the left side with respect to the stylus 61.

The holding unit 25 movably holds the support unit 70 in the direction in which the tip 61a of the stylus 61 faces (the direction of the measurement axis L3 in FIG. 9), and the position of the support unit 70 in the Z direction can be freely moved. It is configured to hold. Further, the holding unit 25 is of the measuring optical axis of the optical measuring unit 30 (the light emitting axis is L1 and the light receiving optical axis is L2) of the measuring element unit (the tip 61a of the measuring element 61 is facing the XY direction). A rotating unit 260 for changing the XY direction is provided.

Hereinafter, the configuration of each unit included in the holding unit 25 will be described.

<Rotating unit>
The rotation unit 260 includes a rotation base 261. As shown in FIG. 7, the support unit 70 is arranged on the rotation base 261. The rotation base 261 is rotatably held around a rotation axis LO extending in the Z direction. For example, a large diameter gear 262 is formed on the outer periphery of the lower portion of the rotation base 261. For example, the rotary unit 260 has a mounting plate 252. For example, a motor 265 is attached to the attachment plate 252. For example, a pinion gear 266 is fixed to the rotation shaft of the motor 265, and the rotation of the pinion gear 266 is transmitted to the large diameter gear 262 via a gear 263 rotatably provided on the mounting plate 252. Therefore, the rotation of the motor 265 causes the rotation base 261 to rotate about the axis of the rotation axis LO. For example, the rotation of the motor 265 is detected by the encoder 265a integrally attached to the motor 265, and the rotation angle of the rotation base 261 is detected from the output of the encoder 265a. The origin position of the rotation of the rotation base 261 is detected by an origin position sensor (not shown).

<Holding mechanism of support unit by holding unit>
FIG. 8 is a diagram illustrating a mechanism in which the holding unit 25 movably holds the support unit 70 in the direction in which the tip 61a of the stylus 61 faces, and a mechanism in which the support unit 70 is movably held in the Z direction. Is.

For example, the holding unit 25 includes a shaft 74 that is fixed under the rotation base 261 and extends in the Z direction. The shaft 74 is provided with a cylindrical member 73 that can move in the Z direction. The Z moving support base 72 is fixed to the tubular member 73. The lower portion of the stylus shaft 62 that also serves as the support unit 70 is held by the Z moving support base 72 so as to be tiltable in the direction of the tip 61a of the stylus 61 about the shaft S2. That is, the support unit 70 is movably held by the holding unit 25 in the direction of the tip 61a of the stylus 61, and the support unit 70 is movably held by the holding unit 25 in the Z direction. The moving position of the support unit 70 in the Z direction with respect to the holding unit 25 (rotating unit 260) is detected by the encoder 287 which is an example of the detector.

A spring 75 for balancing the load of the support unit 70 is arranged between the rotary base 261 and the tubular member 73. The urging force of the spring 75 may be such that the measured pressure is applied slightly upward. As a result, when measuring the rim Ri, the measuring element 61 is always in a state where the measured pressure in the upward direction is applied.

In FIG. 8, the rotation angle detection plate 79 is attached to the stylus shaft 62 below the shaft S2 via the attachment member 78. The amount of rotation of the rotation angle detection plate 7 rotated about the axis S2 is detected by the encoder 288, which is an example of the detector. That is, the amount of inclination of the stylus shaft 62 is detected by the encoder 288.

Further, a spring 76, which is an example of the measuring pressure applying means for applying the measured pressure toward the tip of the stylus 61, is arranged between the mounting member 78 and the tubular member 73. A urging force is always applied by the spring 76 so that the stylus shaft 62 is tilted toward the tip of the stylus 61. In the initial state at the time of measurement of the rim Ri, the mounting member 78 abuts on the limiting member 78a, so that the tilt of the stylus shaft 62 is in the state shown in FIG. 8 (the tilt of the stylus shaft 62 with respect to the Z direction becomes zero). Limited to. In the initial state at the time of measurement, the stylus shaft 62 may be slightly tilted in the direction opposite to the tip direction of the stylus 61 (for example, tilted by 2 to 5 degrees with respect to the Z direction).

<Measurement unit>
FIG. 9 is a schematic view of the support unit 70 of FIG. 7 when viewed from above. For example, the stylus unit 60 is used to acquire the shape of the rim Ri of the spectacle frame F (for example, the spherical shape of the rim Ri). The stylus unit 60 includes a stylus 61 and a stylus shaft 62. For example, the stylus 61 is attached to the stylus shaft 62. In this embodiment, the direction from the stylus shaft 62 to the tip 61a of the stylus 61 is defined as the measuring shaft L3.

<Optical measurement unit>
The optical measurement unit 30 will be described with reference to FIGS. 7 to 10. Note that FIG. 10 is a schematic diagram showing the positional relationship between the floodlight optical system 30a and the light receiving optical system 30b, which are optical systems provided in the optical measurement unit 30.

For example, the optical measurement unit 30 is composed of a light projecting optical system 30a, a light receiving optical system 30b, and a cover 30c. For example, the projection optical system 30a and the light receiving optical system 30b are used to acquire the shape of the rim Ri of the spectacle frame F and the cross-sectional shape of the rim groove FA of the spectacle frame F. For example, the cover 30c is provided with an opening 38. For example, the opening 38 may be provided with a transparent panel that covers the opening 38. The projection optical system 30a irradiates the measured luminous flux from the light source toward the rim groove FA of the spectacle frame F. The measured luminous flux from the projection optical system 30a is emitted from the inside of the holding unit 25 to the outside through the opening 38, and is irradiated toward the rim groove FA. For example, the light receiving optical system 30b receives the reflected luminous flux of the measured luminous flux reflected by the rim groove FA of the spectacle frame F by the detector 37. The reflected luminous flux of the measured luminous flux reflected by the rim groove FA of the spectacle frame F is incident from the outside to the inside of the holding unit 25 through the opening 38, and is guided toward the light receiving optical system 30b.

<Light projection optical system>
For example, the floodlight optical system 30a includes a light source 31, a lens 32, a slit plate 33, and a lens 34. For example, the light projection axis of the light projection optical system 30a is L1. For example, the measured luminous flux emitted from the light source 31 is condensed by the lens 32 and illuminates the slit plate 33. For example, the measured luminous flux that illuminates the slit plate 33 becomes a measured luminous flux that is restricted in the shape of a fine slit by the slit plate 33, and is irradiated to the rim groove FA of the spectacle frame F via the lens 34. That is, the slit light is applied to the rim groove FA of the spectacle frame F. As a result, the rim groove FA of the spectacle frame F is illuminated in a form of being lightly cut by the slit light.

<Receiving optical system>
For example, the light receiving optical system 30b includes a lens 36 and a detector 37 (for example, a light receiving element). For example, the light receiving optical axis of the light receiving optical system 30b is L2. For example, the lens 36 detects the reflected light flux of the rim groove FA (for example, the scattered light of the rim groove FA, the specular reflected light of the rim groove FA, etc.) acquired by the reflection of the spectacle frame F at the rim groove FA. Lead to 37. For example, the detector 37 has a light receiving surface arranged at a position substantially conjugate with the rim groove FA of the spectacle frame F.

<Arrangement of floodlight optical system and light receiving optical system>
In this embodiment, the floodlight optical system 30a and the light receiving optical system 30b are arranged based on the principle of Scheimpflug. For example, a cut surface in which the rim groove FA of the spectacle frame F is optically cut by the slit light by the projection optical system 30a, and a lens system including the rim groove FA of the spectacle frame F (the rim groove FA and the lens 36 of the spectacle frame F). , The light receiving surface of the detector 37 and the light receiving surface of the detector 37 are arranged in a shine proof relationship.

<Measurement position relationship between optical measurement unit and stylus unit>
Next, the relationship between the measurement position by the optical measurement unit 30 and the measurement position by the stylus unit 60 will be described with reference to FIG.

For example, as shown in FIG. 9, in this embodiment, the first measurement position T measured by the optical measurement unit 30 and the second measurement position S measured by the stylus unit 60 have different measurement positions. An optical measuring unit 30 and a stylus unit 60 are arranged so as to measure. Further, in this embodiment, the stylus unit 60 and the optical measuring unit 30 are arranged so that the first measuring position T and the second measuring position S measure the adjacent measuring positions. In this embodiment, the measurement positions of the first measurement position T and the second measurement position S are deviated by the amount of deviation ΔD.

For example, in this embodiment, the light projection axis L1 of the light projection optical system 30a and the image pickup optical axis L2 of the light receiving optical system 30b are tilted in the Z direction by an inclination angle α with respect to the measurement axis L3 of the stylus 61. And are arranged.

Further, for example, in the present embodiment, in order to enable measurement at a position where the first measurement position T and the second measurement position S are closer to each other, the optical axis L1 of the projection optical system 30a in the optical measurement unit 30 is measured. It is arranged so as to be inclined by an inclination angle β on the radial plane (on the XY plane) with respect to the measurement axis L3 from the child 61 toward the measurement position of the rim groove FA of the eyeglass frame F.

Furthermore, for example, in the present embodiment, the image pickup optical axis L2 of the light receiving optical system 30b in the optical measurement unit 30 is projected so that the cut surface opticalally cut by the slit light of the light projecting optical system 30a can be detected. The optical system 30a is arranged to be tilted with respect to the optical axis L1 on the radial plane (on the XY plane) by the tilt angle γ. That is, in this embodiment, the image pickup optical axis L2 of the light receiving optical system 30b is tilted downward by the inclination angle α in the Z direction with respect to the XY plane, and is inclined downward by the inclination angle α with respect to the optical axis L1 of the projection optical system 30a. , Are arranged tilted by the tilt angle γ on the XY plane.

For example, since the stylus unit 60 and the optical measuring unit 30 are integrally supported by the support unit 70, when the stylus unit 60 is moved, the optical measuring unit is matched with the movement of the stylus unit 60. 30 is moved.

<Control unit>
FIG. 11 is a diagram showing a control system of the spectacle frame shape measuring device 1. For example, a monitor 3, a switch unit 4, a light source 31, a detector 37, an encoder 265a, each motor, a non-volatile memory 52 (hereinafter, memory 52), and the like are electrically connected to the control unit 50.

For example, the control unit 50 includes a CPU (processor), RAM, ROM, and the like. For example, the control unit 50 controls each member in the spectacle frame shape measuring device 1. Further, for example, the control unit 50 functions as a calculation unit that performs various calculation processes such as calculation of the cross-sectional shape of the rim groove FA based on the output signal from each sensor. Further, the control unit 50 has a function of an interference information acquisition means. For example, RAM temporarily stores various types of information. For example, the ROM stores various programs, initial values, and the like for controlling the operation of the spectacle frame shape measuring device 1. The control unit 50 may be composed of a plurality of control units (that is, a plurality of processors).

For example, the memory 52 is a non-transient storage medium capable of retaining the storage contents even when the power supply is cut off. For example, as the memory 52, a hard disk drive, a flash ROM, a USB memory, or the like can be used.

<Operation of the device>
Next, an example of the operation of the apparatus in the present disclosure will be described with reference to the flowchart of FIG. The flowchart of FIG. 12 is an example of a program executed by the control unit 50 in the spectacle frame shape measuring device 1. In this embodiment, the rim Ri is measured from the right rim RIR, and then the left rim RIL is measured. Of course, the left rim RIL is measured first, and then the right rim RIR is measured. May be.

First, the operator causes the frame holding unit 10 to hold the spectacle frame F. For example, the operator causes the spectacle holding unit 10 to hold the spectacle frame F so that the left and right rims RIR and RIL of the spectacle frame F are in the downward direction and the left and right temples FTL and FTR of the spectacle frame F are in the upward direction. afterwards. The operator operates the switch unit 4 and inputs the measurement start trigger signal to the control unit 50.

For example, a sensor (not shown) may detect that the spectacle frame F is held by the frame holding unit 10 and start the measurement.

FIG. 13A is a diagram showing a state in which the tip 61a of the stylus 61 provided in the holding unit 25 is located at the initial position SR1.

The initial position SR1 is a predetermined position where the holding unit 25 is arranged before the start of measurement. For example, the position of the initial position SR1 in the X direction is the center position of the clamp pins 130a and 130b in the X direction. For example, the position of the initial position SR1 in the Y direction is the same as the position of the center line CL with respect to the front slider 102 and the rear slider 103 in the Y direction. For example, the position in the Z direction of the initial position SR1 is a position where the stylus 61 is below the lowermost end 130 min of the movable range in the Z direction of the clamp pin 130b. For example, the movable range of the Z direction moving unit 220. It is the lower end. In this embodiment, the positions of the clamp pins 130a and 130b in the X direction and the positions of the center line CL in the Y direction are preset positions and may be held in the memory 52. For example, in the initial position SR1, the tip 61a of the stylus 61 faces the measurement start point FS side, and the stylus shaft 62 is arranged so as to be positioned perpendicular to the rotation base 261 in the Z direction. The initial position SR1 is a reference position OR for obtaining radial diameter information in the XY direction of the right rim RIR. Further, the reference position in the Z direction is an intermediate position between the clamp pin 130a and the clamp pin 130b (clamp pin 131a and the clamp pin 131b). The initial position SR1 may be a position different from the above depending on the positional relationship between the stylus 61 and the optical unit 30.

For example, when the trigger signal for starting measurement is output, the control unit 50 controls the drive of the moving unit 210 and the rotating unit 260, and the tip 61a of the stylus 61 is sandwiched between the clamp pins 130a and 130b. The holding unit 25 is moved in the Y direction from the initial position SR1 so as to be inserted into the groove portion of Ri. By moving the holding unit 25 from the initial position SR1, the portion of the rim groove FA into which the tip 61a of the stylus 61 is inserted (and the position of the tip 61a of the stylus 61) is set as the measurement start point FS.

FIG. 13B is a diagram showing a state in which the holding unit 25 is moved so that the tip 61a of the stylus 61 is located at the measurement start point FS. For example, the position of the measurement start point FS is, for example, a point included in the portion sandwiched by the clamp pins 130a and 130b.

An example of a method of moving the holding unit 25 from the initial position SR so that the tip 61a of the stylus 61 is located at the measurement start point FS will be described.

At the measurement start point FS, the control unit 50 rotates the rotation base 261 of the rotation unit 260 so that the measurement axis L3 of the stylus 61 has a predetermined angle δ with respect to the X direction. The predetermined angle δ is, for example, an angle appropriate for at least one of the stylus unit 60 and the optical measuring unit 30 to accurately measure the shape of the rim Ri, for example, in the XY direction with respect to the X direction. It is in the normal direction. Further, the control unit 50 moves the Z-direction moving unit 220 so that the tip 61a of the stylus 61 is at a predetermined height of the measurement start point FS (the position of the midpoint of the clamp pin 130a and the clamp pin 130b in the Z direction). To move. Next, the control unit 50 drives the X-direction moving unit 240 and the Y-direction moving unit 230, and inserts the tip 61a of the stylus 61 into the rim groove FA. The tip 61a of the stylus 61 comes into contact with the rim groove FA, and the holding unit 25 is further moved to the rim Ri side from that state, so that the stylus shaft 62 in the vertical state is tilted about the axis S2. Be done. Since the inclination of the stylus shaft 62 is detected from the output change of the encoder 288, the control unit 50 detects that the tip 61a of the stylus 61 is in contact with the rim groove FA. At the measurement start point FS, the holding unit 25 is moved toward the rim groove FA until the stylus shaft 82 is tilted by a predetermined angle (for example, 5 degrees).

The position of the tip 61a of the stylus 61 at this time is measured by the XYZ position information of the holding unit 25 moved by the moving unit 210, the detection information of the encoder 287 that detects the amount of movement of the stylus shaft 62 in the Z direction, and the measurement. It is obtained based on the detection information of the encoder 288 that detects the tilt angle of the child shaft 62 and the detection information of the encoder 265a that detects the rotation angle of the rotation unit 260, and is stored in the memory 52.

The reason why the holding unit 25 is moved to the state where the stylus shaft 62 is tilted is to enable the measurement in the direction away from the rim groove FA in the subsequent measurement of the measurement point. In this embodiment, the stylus 61 is inserted into the rim groove FA and then tilted toward the rim groove FA about the shaft S2, and the measured pressure is applied by the spring 75 and the spring 76. Due to the generation of this measurement pressure, the tip 61a of the stylus 61 can follow the change in the position of the rim groove FA until the stylus shaft 62 becomes vertical.

At the start of measurement of the rim Ri, it is preferable to make it possible to select in advance whether or not the spectacle frame F to be measured is a high curve frame. For example, on the screen of the monitor 3 shown in FIG. 1, a selection switch 3a, which is an example of selection means for selecting whether or not the spectacle frame F to be measured is a high curve frame, is displayed. When the high curve frame is selected by the selection switch 3a, the interference avoidance measurement mode for avoiding the interference of the optical measurement unit 30 with the object to be interfered with is applied. When a frame other than the high curve frame (that is, the low curve frame) is selected by the selection switch 3a, the normal measurement mode is applied. Hereinafter, the measurement operation in the normal measurement mode and the operation in the interference avoidance measurement mode will be described in order.

<Normal measurement mode>
FIG. 14 is a schematic diagram showing the positional relationship between the clamp pins 130 and 131, the rim Ri, the stylus 61, and the optical measuring unit 30 when measuring the shape of the low curve frame. 14 (a) is a view in which the rim Ri of the spectacle frame F is held by the clamp pins (130, 131) in FIG. 2 from above on the paper surface, and FIG. 14 (b) is a view. It is a figure which observed the rim Ri from the direction (front direction) of the arrow A2 in 2.

As shown in FIG. 14A, when the XY plane is observed from above in a state where the tip 61a of the stylus 61 measures the measurement point Fn slightly below the right side of the rim Ri, the optical measurement unit 30 is used. It looks like it is interfering with the clamp pin 130 and the rim Ri. However, as shown in FIG. 14B, since the upper surface 30cA of the optical measuring unit 30 is located below the lower end of the clamp pin 130b in the Z direction, the optical measuring unit 30 and the rim are usually located. No interference with Ri and the clamp pin 130b occurs. Therefore, in the normal measurement mode, no special control for avoiding interference of the clamp pin 130b or the like is performed.

An example of the rim shape data acquisition method in the normal measurement mode will be described. In the normal measurement mode, the control unit 50 acquires the cross-sectional shape of the rim groove FA by the optical measurement unit 30. Further, the control unit 50 acquires the three-dimensional position information of the entire circumference of the rim groove FA by the stylus unit 60.

When the normal measurement mode is started, the control unit 50 turns on the light source 31 of the optical measurement unit 30. When the light source 31 is turned on, the rim groove FA of the spectacle frame F is lightly cut off by the slit light. The reflected light flux from the rim groove FA of the spectacle frame F optically cut by the slit light is directed to the light receiving optical system 30b and is received by the detector 37. The control unit 50 acquires the cross-sectional shape of the rim groove FA of the spectacle frame F based on the reflected luminous flux received by the detector 37. In this embodiment, a cross-sectional image is acquired as the cross-sectional shape.

For example, for measurement by the stylus unit 60, the control unit 50 drives the rotary unit 260 to rotate the stylus shaft 62 and the stylus 61 around the axis of the rotary shaft LO. Further, the control unit 50 drives the moving unit 210 and adjusts the position of the holding unit 25 in the XY direction. The stylus 61 moves in the X direction, the Y direction, and the Z direction following the change of the rim Ri (rim groove FA). In this embodiment, the control unit 50 moves the tip 61a of the stylus 61 along the rim Ri. At this time, the control unit 50 controls the operation of the moving unit 210 and the rotating unit 260 so that the measuring axis L3 has a predetermined angle δ in the XY direction with respect to the extending direction of the rim Ri, and the stylus 61 is set. Move it. The predetermined angle δ is, for example, a predetermined angle. The predetermined angle δ is, for example, an angle appropriate for at least one of the stylus unit 60 and the optical measuring unit 30 to accurately measure the shape of the spectacle frame F, for example, in the XY direction, of the rim Ri. It is the normal direction with respect to the extending direction.

The position of the tip 61a of the encoder 61 (that is, the position information of the rim groove FA) at the time of tracing is the detection information of the position of the holding unit 25 in the XYZ direction (the control unit 50 detects from the drive amount of each motor). , The detection information of the encoder 265a that detects the rotation angle of the rotation unit 260, the detection information of the encoder 287 that detects the movement amount of the support unit 70 in the Z direction, and the encoder 288 that detects the inclination angle of the stylus shaft 62. It is obtained based on the detection information.

By moving the holding unit 25, the control unit 50 moves the optical measuring unit 30 (projection optical system 30a and light receiving optical system 30b) and the stylus unit 60, and measures the contour of the rim Ri of the spectacle frame F. I will do it. As a result, the cross-sectional shape of the rim groove FA of the spectacle frame F and the position information of the rim Ri (the spherical shape and the peripheral length of the rim Ri in this embodiment) are acquired. In this embodiment, the projectile optical system 30a and the light receiving optical system 30b are moved with respect to the rim Ri while maintaining the Scheimpflug relationship. That is, by moving the optical measuring unit 30 so as to have a constant positional relationship with respect to the rim groove FA of the spectacle frame F, the cross-sectional shape of the rim groove FA of the spectacle frame F can be obtained.

For example, the control unit 50 has a radial angle (θn) from the reference position OR (initial position SR1) to the rim groove FA in contact with the tip 61a of the stylus 61 in the XY direction, and the rim groove FA from the reference position OR. The radius length (rn), which is the distance to, is obtained based on the position information of the tip 61a of the stylus 61.

The control unit 50 moves the holding unit 25 from the measurement start point FS so that the radial angle (θn) centered on the reference position OR is 0 to 360 degrees, and measures the shape of the entire circumference of the rim Ri. do. The point on the rim Ri that the tip 61a of the stylus 61 touches at the radius angle (θn) is defined as the measurement point Fn.

When measuring the shape of the rim Ri, the control unit 50 predicts the position of the rim Ri of the unmeasured portion based on the information of the portion of the rim Ri that has already been measured, and controls the movement of the holding unit 25 and controls the movement of the rim Ri. The rotation of the rotation unit 260 may be controlled. An example of a method of predicting the position of the rim Ri of the unmeasured portion based on the position information of the rim Ri already measured will be described.

For example, in the radial angle (θn), when the tip 61a of the stylus 61 is located at the measurement point Fn, the position of the next measurement point Fn + 1 is the measurement point Fn and the measurement point where the measurement has already been performed. It is predicted to exist on a straight line passing through Fn-1. In order to predict the position of the measurement point Fn + 1, a plurality of measurement points that have already been measured may be used.

As a method for predicting the position of the rim Ri in the unmeasured portion based on the position information of the rim Ri that has already been measured, a known method described in Japanese Patent Application Laid-Open No. 2011-122899 can be used. This makes it possible to measure the shape of the rim Ri with high accuracy.

Since the optical measuring unit 30 and the stylus unit 60 are integrally supported by the support unit 70, the optical measuring unit 30 irradiates the rim groove with the measured luminous flux as the stylus unit 60 moves. The position is changed. In this embodiment, the measurement of the rim groove FA by the stylus 61 and the cross-sectional shape measurement of the rim groove by the optical measuring unit 30 are performed in parallel. For example, by moving the stylus 61 along the rim groove FA, a cross-sectional image (cross-sectional shape) of the rim groove FA is acquired in order. That is, the position for acquiring the cross-sectional image of the rim Ri is moved in the circumferential direction of the rim Ri. The position where the cross-sectional image of the rim Ri is acquired is a value deviated by ΔD from the tip of the stylus 61 (see FIG. 9), and is obtained based on the position of the tip 61a of the stylus 61. For example, the acquisition position of the acquired cross-sectional shape information of the groove is stored in the memory 52.

As a method for acquiring a cross-sectional image of the rim Ri by the optical measurement unit 30, for example, the one described in International Publication No. 2019/026416 can be used.

For example, in this embodiment, the radius length (rn) and the radius angle at the radius angle (θn) are set for each radius angle (θn) centered on the reference position OR over the entire circumference of the rim Ri. The position information (xn, yn, zn) (n = 1, 2, 3, ..., N) of the measurement point Fn at (θn) and the cross-sectional shape of the rim groove FA at the radius angle (θn) are To be acquired. For example, in this embodiment, the measurement points on the entire circumference of the rim Ri are 1,000 points, and the radial angle is changed every 0.36 degrees. In this embodiment, the position information of the measurement point Fn is represented by three-dimensional Cartesian coordinates. In the position information of the measurement point Fn, the positions in the X direction and the Y direction are expressed in two-dimensional polar coordinates by the radius angle θn and the radius length rn, and the positions in the Z direction are expressed in Z coordinates (rn, Zn, θn). ) (N = 1, 2, 3, ..., N) may be appropriately converted.

For example, the control unit 50 has a radius length (rn) at the radius angle (θn) and a rim groove at the radius angle (θn) for each radius angle (θn) acquired over the entire circumference of the rim Ri. Memory 52 stores the three-dimensional lens shape data (xn, yn, zn) (n = 1, 2, 3, ..., N) of the FA and the cross-sectional shape of the rim groove FA at the radial angle (θn). To memorize.

For example, when the acquisition of the cross-sectional image of the rim groove FA over the entire circumference of the rim Ri is completed, the control unit 50 receives the cross-sectional image of the entire circumference of the rim Ri stored in the memory 52 and the position of the rim groove FA on the entire circumference of the rim Ri. Information is called and arithmetic processing is performed to acquire the three-dimensional shape of the rim Ri around the entire circumference of the rim Ri. For example, the control unit 50 stores the acquired three-dimensional shape of the entire circumference of the rim Ri in the memory 52. In this embodiment, a configuration in which a three-dimensional cross-sectional image is acquired after the acquisition of the cross-sectional shape on the entire circumference of the rim Ri is completed has been described as an example, but the present invention is not limited to this. At each acquisition position of the cross-sectional image of the rim groove FA, the arithmetic processing may be performed every time the cross-sectional image is acquired.

In this embodiment, the optical axis L1 of the projection optical system 30a and the image pickup optical axis L2 of the light receiving optical system 30b are arranged so as to be inclined downward by an inclination angle α in the Z direction with respect to the XY plane. There is. Further, for example, the optical axis L1 of the projection optical system 30a in the optical measurement unit 30 is on a moving diameter plane (XY) with respect to the measurement axis L3 from the stylus 61 toward the measurement position of the rim groove FA of the eyeglass frame F. (On a plane), it is tilted by the tilt angle β. Furthermore, for example, the projection optical axis L1 of the projection optical system 30a and the image pickup optical axis L2 of the light receiving optical system 30b refer to the measurement axis L3 from the stylus 61 toward the measurement position of the rim groove FA of the spectacle frame F. , It is arranged to be inclined downward by the inclination angle γ in the Z direction. In the case of the above configuration, for example, the control unit 50 corrects the cross-sectional shape of the rim groove FA based on at least one of the inclination angle α, the inclination angle β, and the inclination angle γ. You may do so. As an example, the control unit 50 has a cross-sectional shape of the rim groove FA of the spectacle frame F acquired by a trigonometric function using at least one of the tilt angle α, the tilt angle β, and the tilt angle γ. May be corrected. Furthermore, for example, since the optical measuring unit 30 is held integrally with the stylus shaft 62, the control unit 50 acquires it based on the tilt angle of the stylus shaft 62 acquired by the encoder 288. The cross-sectional shape of the rim groove FA of the spectacle frame F may be corrected.

In this way, by correcting the cross-sectional shape of the rim groove FA based on the tilt angle, it is possible to obtain the cross-sectional shape corrected for the distortion of the cross-sectional shape caused by the influence of the tilt angle, and the cross section of the rim groove FA. The shape can be acquired accurately.

For example, when the tip 61a of the stylus 61 is moved along the rim groove FA, the position of the stylus 61 is adjusted based on the measurement result (for example, a cross-sectional image) acquired by the optical measuring unit 30. You may move it while moving. That is, since the measurement of the cross-sectional shape of the rim groove FA by the optical measurement unit 30 is performed prior to the position n measurement of the rim groove FA by the stylus unit 60, the control unit 50 is performed by the optical measurement unit 30. Based on the acquired cross-sectional shape of the rim groove FA, the movement of the holding unit 25 can be controlled so that the stylus 61 does not fall off from the rim groove FA. In this case, for example, the control unit 50 performs image processing on the cross-sectional image acquired by the optical measuring unit 30, detects the bottom of the rim groove FA, and is a stylus based on the position of the bottom of the detected rim groove FA. The movement of the holding unit 25 may be controlled so that the tip 61a of the 61 is inserted at the position of the bottom of the rim groove.

For example, when the measurement of one rim Ri (right rim RIR) is completed, the control unit 50 controls the drive of the X-direction moving unit 240 and moves the holding unit 25 to the initial position for measurement of the other rim. The other rim is measured in the same manner as the above measurement control. The measurement results of the right rim RIR and the left rim RIL are stored in the memory 52.
By performing the normal measurement mode as described above, the control unit 50 acquires the three-dimensional shape of the rim Ri.

<Interference avoidance measurement mode>
The case where the spectacle frame F to be measured is selected as the high curve frame and the interference avoidance measurement mode is applied will be described. The operation of the shape measurement of the rim Ri by the stylus unit 60 and the cross-sectional shape measurement by the optical measurement unit 30 is basically the same as the above-mentioned normal measurement mode. The operation of avoiding interference of the measurement unit 30 will be mainly described.

When a high curve frame is selected, the control unit 50 considers the possibility that interference between the optical measurement unit 30 and an object to be interfered with (clamp pin 130b, rim Ri, etc.) may occur during the measurement operation. The three-dimensional shape of the rim Ri is acquired in the interference avoidance measurement mode in which the lens shape acquisition unit 20 is made to perform the interference avoidance operation.

For example, when the control unit 50 measures the shape of the rim Ri in the interference avoidance measurement mode as in the normal measurement mode, the control unit 50 is based on the information of the rim Ri portion that has already been measured, and the rim Ri of the unmeasured portion. Predict the position. For example, the control unit 50 measures each radius angle (θn) centered on the reference position after the radius angle (θn) based on the information of the already measured portion on the rim Ri. At the radial angle (θn + 1), the position of the measurement point Fn + 1 on the rim Ri with which the tip 61a of the stylus 61 contacts is predicted. The method of predicting the position of the rim Ri of the unmeasured portion based on the position information of the rim Ri already measured is a well-known method described in Japanese Patent Application Laid-Open No. 2011-122899 or the like as in the normal measurement mode. Can be used.

FIG. 15 is a diagram illustrating a typical example in which the optical measuring unit 30 and the clamp pin 130b interfere with each other, and is a schematic view showing the positional relationship between the rim Ri, the clamp pins 130 and 131, and the optical measuring unit 30. Is. FIG. 15A is a view of the measurement plane observed from above the paper surface, and FIG. 15B is a view of the measurement plane observed from the clamp pin 130 side in the direction parallel to the Y axis.

The arrow C1 is the measurement traveling direction (clockwise direction in FIG. 15), that is, the moving direction of the stylus 61 when measuring the rim Ri shape. In this embodiment, the optical measuring unit 30 is installed integrally with the stylus shaft 62 at the lower part of the stylus 61, and the optical measuring unit 30 is integrally moved with the stylus unit 60. .. The optical measuring unit 30 is larger in the XY direction than the stylus unit 60. Therefore, in the case of performing shape measurement on a high curve frame, when the stylus unit 60 and the optical measurement unit 30 are measuring a certain measurement point Fn on the rim Ri, the optical measurement unit 30 However, there is a possibility that it may interfere with the rim Ri, the clamp pin 130b, or the like at a portion different from the measurement point Fn.

In the interference avoidance measurement mode, the shape data of the rim Ri is acquired while avoiding the interference between the optical measurement unit 30 and the rim Ri, the clamp pin 130b, etc., which are the objects to be interfered with.

An example of the interference avoidance control program executed by the control unit 50 in the interference avoidance measurement mode will be described. In the present disclosure, the optical measuring unit 30 is divided into a case where it interferes with the clamp pins 130b and 131b, a case where it interferes with an unmeasured part of the rim Ri, and a case where it interferes with a measured part of the rim Ri. I will explain.

For example, at the measurement point Fn, it is assumed that the measurement axis L3 from the stylus 61 toward the measurement point Fn + 1 on the rim groove FA is inserted into the rim groove FA at a predetermined angle δ (same as the normal measurement mode), and the control unit 50. Finds the position of the interference region IR (see FIG. 16), which will be described later, which is an example of the interference portion.

When the position of the measurement point Fn + 1 at the radial angle (θn + 1) is predicted in the interference avoidance measurement mode, the arrangement of the holding unit 25 at the measurement point Fn + 1 is required based on the predetermined angle δ. The optical measuring unit 30 and the stylus unit 60 are integrally held in the holding unit 25, and the positions of the optical measuring unit 30 in the holding unit 25 are various detectors (encoder 265a, 287, 288, etc.). ). Then, the arrangement of the XY of the holding unit 25 at the measurement point Fn + 1 is detected by the control information of the moving unit 210, so that the arrangement of the optical measurement unit 30 at the measurement point Fn + 1 in the XYZ direction is required.

FIG. 16 is a diagram showing an interference region IR which is an example of an interference portion of the optical measurement unit 30 in the present embodiment. In this embodiment, it is assumed that the interference region IR of the optical measurement unit 30 interferes with the clamp pin (130, 131) and the rim Ri, and the interference avoidance operation is performed. The interference region IR is a predetermined region on the cover 30c of the optical measuring unit 30 that may interfere with the rim Ri. For example, in the example of FIG. 16, the interference region IR is the region of the left half corner of the circular upper surface 30cA on the cover 30c. The coordinate position of the region where the interference region IR is located on the optical measurement unit 30 changes depending on the shape of the optical measurement unit 30. Since the interference region IR is a region on a predetermined optical measurement unit 30, the arrangement of the interference region IR at the measurement point Fn (XYZ position with reference to the reference position OR) is the optical measurement unit 30. It is calculated based on the arrangement of.

In this embodiment, the interference region IR is provided for determining the interference avoidance operation, but the interference region IR may be the interference point IRP on the optical measurement unit 30.
For example, the interference point IRP is a point on the optical measuring unit 30 that is set based on the interference state obtained by measuring a plurality of frames.
For example, the interference point IRP is defined as a point that avoids the interference of the entire interference region IR by avoiding the interference of one interference point IRP with respect to the clamp pins 130b, 131b and the rim Ri.
In the interference avoidance measurement mode, the control unit 50 determines whether to perform interference avoidance control based on the arrangement of the interference region IR at the measurement point Fn + 1.

<When avoiding interference with the clamp pin>
First, a case where the control unit 50 avoids interference with the clamp pin 130b will be described.

When the optical measurement unit 30 and the clamp pin 130b interfere with each other, the position of the optical measurement unit 30 and the position of the clamp pin 130b in the XYZ direction overlap. On the other hand, if at least one of the positions in the X direction, the Y direction, and the Z direction is different with respect to the position of the optical measurement unit 30 and the position of the clamp pin 130b, the optical measurement unit 30 and the clamp pin 130b are Does not interfere.

For example, first, the interference information acquisition means (control unit 50) acquires the interference information (clamp pins 130b, 131b, the shape information of the measured rim Ri, etc.) of the object to be interfered (step S101). .. The control unit 50 is provided with an interference determination line ILC (ILCY, ILCZ) for avoiding interference with the clamp pin 130b in order to determine whether to perform interference avoidance control (see FIG. 15) (step S102). In a typical example, the interference determination line ILC is determined in a predetermined direction away from the clamp pin 130b based on the arrangement position of the XYZ of the clamp pin 130b acquired by the interference information acquisition means (control unit 50). This is a reference line set at a distance m.
The interference determination line ILC is set in the Y direction and the Z direction in this embodiment.

For example, the first interference determination line ILCY in the Y direction is set at a position separated by a determination distance m from the tip position 133 of the clamp pin 130b in the Y direction toward the center line CL. The tip position 133 of the clamp pin 130b in the Y direction includes the detection information of the detector 120 that detects the open / closed state of the sliders 102 and 103 in the Y direction, the length HBL of the clamp pin 130b, and the length SSBL of the support shaft 132b. Obtained based on. When the detector 120 is not used, the tip position 133 of the clamp pin 130b in the Y direction is measured by the Y direction position of the tip 61a of the stylus 61 at the measurement start point FS and the length HBL of the clamp pin 130b. Obtained approximately based on the thinnest distance of the rim Ri when the possible rim Ri is held by the clamp pin 130. Similarly, the second interference determination line ILCY in the Y direction is also set on the clamp pin 131 side. The interference determination line ILCY in the Y direction may be set based on a portion other than the tip position 133 of the clamp pin 130b, such as the root of the clamp pin 130b or the rim receiver 132b.

Further, at the position of the clamp pin 130b in the Y direction, the control unit 50 controls the moving unit 210 and the rotating unit 260 while the rim Ri is held by the frame holding unit 10, and the tip 61a of the stylus 61 is clamped. It may be acquired by abutting on the tip position 133 of 130b. That is, the control unit 50 determines the coordinate position of the tip 61a in the Y direction when the tip 61a of the stylus 61 is brought into contact with the tip position 133, the control data of the moving unit 210, the control data of the rotating unit 260, and the stylus. The tip position 133 of the clamp pin 130b can be obtained by obtaining the data based on the inclination data of the shaft 62, the movement data of the stylus shaft 62 in the Z direction with respect to the rotating unit 260, and the like. Further, the tip position 133 of the clamp pin, which is an example of the rim holding member, may be on the clamp pin 131b side. This is because the clamp pin 130b and the clamp pin 131b are positioned symmetrically with respect to the center line CL in the Y direction. Furthermore, in obtaining the tip position 133 of the clamp pin 130b in the Y direction, the tip 61a of the stylus 61 is not brought into contact with the clamp pin 130b or 131b, but has a known positional relationship with the clamp pin 130b or 131b. The tip 61a of the stylus 61 may be brought into contact with a member (for example, the rim receiver 313, the surface of the slider 102 or 103 in the Y direction, etc.) for acquisition.

For example, the interference determination line ILCZ in the Z direction is set at a position separated from the lowermost end 130 min of the movable range in the Z direction of the clamp pin 130b downward with respect to the Z axis by a determination distance m. The lowermost end 130 min is called from the memory 52 by the control unit 50 and acquired. The determination distance m is a preset distance for avoiding interference between the interference region IR and the clamp pin 130b, and is, for example, 6 mm. Further, the interference determination line ILCZ in the Z direction may be set with reference to the movable center of the clamp pin 130. Of course, the determination distance m may have different values in the Y direction and the Z direction.

For example, the control unit 50 predicts the position of the next measurement point Fn + 1 for each measurement point Fn, and obtains the position of the interference region IR at the measurement point Fn + 1 based on the predicted position information of the measurement point Fn + 1 ( Step S103). It is determined that the position of the interference region IR at the measurement point Fn + 1 exists on the clamp pin (130b, 131b) side of the interference determination line ILCY in the Y direction, and the clamp pin (130b, When it is determined that it exists on the 131b) side (step S104), the control unit 50 determines that interference avoidance control is performed. The control unit 50 moves the tip 61a of the stylus 61 from the measurement point Fn to the measurement point Fn + 1, and at the same time, controls the operations of the moving unit 210 and the rotating unit 260 to perform an avoidance operation.

On the other hand, when the interference region IR is located at a position farther from the clamp pin (130b, 131b) side than at least one of the interference line ILCY in the Y direction and the interference determination line ILCZ in the Z direction, the control unit 50 controls interference avoidance control. Is not performed. (Step S107)
Although the example in which the interference determination lines are provided in the Y direction and the Z direction is shown above, the control unit 50 may provide the interference determination line ILCX in the X direction. For example, the position of the interference determination line ILCX in the X direction is set in a direction away from the clamp pin by the determination distance m from the positions of both ends of the clamp pin 130b in the X direction. The positions of both ends of the clamp pin 130b in the X direction are acquired from the arrangement information of the clamp pin 130b stored in the memory 52. When the interference determination line in the X direction is provided, for example, the control unit 50 predicts that the position of the optical measurement unit 30 is closer to the rim Ri than the interference determination line ILC in the X direction, the Y direction, or the Z direction. If this is the case, it is determined that interference avoidance control is performed.

In this way, by using a plurality of interference determination lines, it is possible to reduce the frequency of performing unnecessary interference avoidance operations, and it is possible to accurately acquire the three-dimensional shape of the rim Ri.

In the example of FIG. 15, the stylus 61 measures the position of the measurement point Fn + 1. In FIG. 15, the interference region IR exists on the rim Ri side of the interference determination line ILCY in the Y direction in the Y direction, and the interference region IR exists on the rim of the interference determination line ILCZ in the Z direction in the Z direction. Since it exists on the side, the control unit 50 determines that the interference avoidance control is performed.

It should be noted that the interference determination line ILC in any one or more of the XYZ directions may be used to determine whether or not the interference avoidance operation is performed. For example, the interference determination line ILC may be configured to use only the interference determination line ILCY in the Y direction.

When the control unit 50 determines that interference avoidance control is performed on the clamp pin 130b, the control unit 50 controls the drive of the moving unit 210 and the rotating unit 260 to avoid interference between the holding unit 25 and the rim Ri. The operation of avoiding the interference will be described with reference to FIG. FIG. 17 is a diagram showing a case where interference is avoided by moving the optical measuring unit 30 in the Y direction. FIG. 17A is a view of the measurement plane observed from above the paper surface, and FIG. 17B is a view of the measurement plane observed from the clamp pin 130 side in the direction parallel to the Y axis.

If at least one of the positions of the optical measuring unit 30 and the clamp pin 130b and the rim Ri is different in the X direction, the Y direction, and the Z direction, interference does not occur. Therefore, the position of the interference region IR is set. , The interference can be avoided by moving in at least one direction of the X direction, the Y direction, and the Z direction.

For example, the control unit 50 moves the interference region IR in the Y direction to avoid interference between the interference region IR and the clamp pin 130b. First, the control unit 50 obtains the Y position (coordinate position) of the interference region IR at the measurement point Fn + 1 when the tip 61a of the stylus 61 is moved from the measurement point Fn to the measurement point Fn + 1 of the unmeasured portion. Next, the control unit 50 obtains an interference amount ΔE which is a distance where the Y position of the obtained interference region IR exceeds the interference determination line ILCY in the Y direction (step S105). Then, the control unit 50 moves the tip 61a of the stylus 61 from the measurement point Fn to the measurement point Fn + 1, and at the same time, rotates the moving unit 210 so that the interference region IR moves in the Y direction by the interference amount ΔE. The operation of the unit 260 is controlled (step S106). Thereby, the interference between the interference region IR and the clamp pin 130b can be avoided. Such interference avoidance control is similarly performed at the measurement points after the measurement point Fn + 1 until the interference amount ΔE is eliminated.

Since the stylus unit 60 is held integrally with the optical measuring unit 30, the angle of the measuring axis L3 in the XY direction at the measuring point Fn + 1 with respect to the rim Ri is the original angle when the avoidance operation is performed. The change angle Δe is inclined with respect to δ. If the interference amount ΔE is eliminated at the measurement point at the transition to the measurement point Fn + 1, the stylus unit 60 and the optical measurement unit 30 are integrally moved so as to have the original angle δ. If the change angle Δe returned to the angle δ is large, the measurement accuracy may be affected. In that case, it may be controlled to gradually return to the original angle δ for each measurement point. For example, the temperature is gradually changed every 0.5 degrees.

Further, for example, the control unit 50 may be configured to avoid interference by moving the interference region IR in the Z direction as interference avoidance control. FIG. 18 is a diagram showing a case where interference is avoided by moving the optical measuring unit 30 in the Z direction. FIG. 18A is a view of the measurement plane observed from above the paper surface, and FIG. 18B is a view of the measurement plane observed from the clamp pin 130 side in the direction parallel to the Y axis.

For example, as in the previous example, the control unit 70 obtains the Z position of the interference region IR at the measurement point Fn + 1, and then the Z position of the obtained interference region IR exceeds the interference determination line ILCZ in the Z direction. Obtain the interference amount ΔG. Further, the control unit 70 has the same concept of the interference determination line ILCZ in the Z direction, and sets the interference determination line ILCX in the X direction with respect to the right end of the clamp pin 130b as shown in FIG. Then, the control unit 70 sets the inclination angle XA of the stylus shaft 62 with respect to the Z direction so that the interference region IR located on the clamp pin 130b side of the interference determination line ILCX is moved by the interference amount ΔG in the Z direction. demand. After that, the control unit 70 moves the holding unit 25 XY so that the inclination of the stylus shaft 62 with respect to the Z direction is the inclination angle XX. This makes it possible to avoid interference of the optical measuring unit 30 with the clamp pin 130b.

It should be noted that when the interference determination line ILCX in the X direction is set, although it is somewhat disadvantageous, only the interference determination line ILCX may be used. That is, in FIG. 18, the control unit 70 obtains the tilt angle XA of the stylus shaft 62 so that the interference region IR does not approach the clamp pin 130b from the interference determination line ILCX, and the stylus shaft 62 becomes the tilt angle XA. The holding unit 25 is moved XY as described above. This makes it possible to avoid interference of the optical measuring unit 30 with the clamp pin 130b.

Although the above description has been made for avoiding interference with the clamp pin 130b, the same can be performed for the clamp pin 131b.

<When avoiding interference with the unmeasured part of the rim>
FIG. 19 is a diagram illustrating a case where interference avoidance of the optical measurement unit 30 is performed with respect to an unmeasured portion of the rim Ri. In FIGS. 19A and 19D, the upper half is a view of the measurement plane observed from above the paper surface, and the lower half is a view of the measurement plane observed from the clamp pin 130 side in the direction parallel to the Y axis. Is. In FIGS. 19 (b) and 19 (c), the upper half is a view of the measurement plane observed from above the paper surface, and the lower half is a view of the measurement plane observed from the clamp pin 131 side in the direction parallel to the Y axis. Is.

Even when avoiding interference with an unmeasured portion of the rim, interference in the Z direction with the first and second interference determination lines ILCY in the Y direction shown in FIG. 17 in order to determine whether to perform interference avoidance control. The determination line ILCZ is used. The measurement direction in which the stylus 61 advances is clockwise, and is an example in which the optical measuring unit 30 measures in advance of the stylus 61.

For example, as shown in FIGS. 19A and 19B, when the stylus 61 is measuring the measurement points FP1 and FP2 on the left side (nasal side) of the clamp pin 130b, the optical type is used in the XY direction. Although the measurement unit 30 interferes with the rim Ri, interference does not occur because the optical measurement unit 30 (interference region IR) is located below the interference determination line ILCZ in the Z direction, and the interference avoidance control is performed. Not done.

Further, as shown in FIG. 19C, when the stylus 61 is measuring the measurement point FP3 on the right side (ear side) of the clamp pin 131b, the optical measurement unit 30 (interference region IR) in the Z direction. Is located above the interference determination line ILCZ. Therefore, the avoidance control operation is performed so as not to approach the clamp pin 131b side from the second interference determination line ILCY in the Y direction. However, since the position of the rim Ri in the Z direction becomes higher toward the ear side (the ear side of the wearer in the wearing state), the optical measurement unit 30 is usually a rim even if interference avoidance control is not performed. It does not interfere with Ri.

On the other hand, as shown in FIG. 19 (d), when the stylus 61 measures the measurement point FP4 of the rim Ri extending substantially parallel to the Y direction on the right side (ear side) of the clamp pins 130b and 131b, Z In the direction, the optical measurement unit 30 (interference region IR) is located above the interference determination line ILCZ. Therefore, as in FIG. 17 of the previous example, the avoidance control operation is performed so that the optical measurement unit 30 does not approach the clamp pin 130b side from the interference determination line ILCY of 1 in the Y direction. In this case, as in FIG. 18, by moving the holding unit 25 XY so that the control unit 70 tilts the stylus shaft 62 so as to have the tilt angle XX, interference is avoided in at least one of the Z direction and the X direction. You may let it. This avoids interference with unmeasured parts of the rim.

In the above description, the interference determination line ILCY in the Y direction and the interference determination line ILCZ in the Z direction for avoiding interference with the clamp pins (130b, 131b) are shared, but apart from these, the rim is not yet used. An interference determination line may be set to avoid interference with the measurement portion. For example, since the position information of the end face of the rim Ri in the Y direction is known based on the measurement result of the cross-sectional shape of the rim groove at a certain measurement point from the measurement start point FS, the interference determination line in the Y direction is set based on this. .. Further, since the position information of the lower end surface of the rim Ri in the Z direction is known based on the measurement result of the cross-sectional shape of the rim groove, the interference determination line in the Y direction is set based on this. In this case, since the interference determination line can be set at a position closer to the rim Ri side than the interference determination line for avoiding interference with the clamp pins (130b, 131b), the amount of interference avoidance can be reduced and more accurately. Can be measured.

In the above, the control unit 50 sets the first interference determination line ILCY in the Y direction and the interference determination line ILCZ in the Z direction with reference to the position of the clamp pin 130b, and interferers (for example, optical measurement) from these lines. An example of moving an interfering object (interference portion) so that the unit 30) is at least a certain distance has been described, but the operation of avoiding interference is not limited to this. For example, avoidance for avoiding interference with the interfered object based on the position information of the interfered object (rim holding member, measured result of the rim) acquired by the interfered information acquisition means (control unit 50). It is also possible to set an area and control the changing means (moving unit 210, rotating unit 260) so that the interfering object (interference portion) moves to the avoiding area.

<When avoiding interference with the measured part of the rim>
Next, an example of avoiding interference with the rim Ri by using the measured measurement result of the rim Ri will be described with reference to FIG. 20. When the measured result of the rim Ri is used for interference avoidance, the stylus 61 precedes the optical measuring unit 30. In the example of FIG. 20, the measurement traveling direction C2 is counterclockwise.

For example, when the control unit 50 moves the tip 61a of the stylus 61 from the measurement point Fn to the measurement point Fn + 1, it performs interference avoidance control based on the position information of the measured portion of the rim Ri, and performs interference avoidance control of the holding unit 25. Interference is avoided by controlling the XY movement and the rotational movement of the rotating unit 260. For example, when the control unit 50 moves the stylus 61 so as to measure the measurement point Fn + 1, which is the next unmeasured point, from the measurement point Fn based on the measured measurement result, the interference region IR at the measurement point Fn + 1. The XYZ position (coordinate position) of (the cover 30c of the optical measurement unit 30 may be used) is obtained. Next, the control unit 50 determines whether or not interference has occurred by comparing the obtained XYZ position of the interference region IR with the XYZ position (coordinate position) of the measured region MA of the rim Ri. do. When the control unit 50 determines that interference has occurred, the control unit 50 performs interference avoidance control. For example, when avoiding in the Y direction, the control unit 50 obtains the interference amount ΔI in the Y direction of the interference region IR. Then, the operations of the moving unit 210 and the rotating unit 260 are controlled so that the interference region IR is moved in the Y direction inside the rim Ri by the amount obtained by adding the margin amount ΔIA to the interference amount ΔI.

The XYZ position of the measured region MA of the rim Ri is the XY position inside the rim Ri and the Z direction of the rim Ri based on the measurement result by the stylus 61 and the cross-sectional shape of the rim groove by the optical measuring unit 30. It may be obtained as the lower Z position. This makes it possible to avoid interference with the measured region MA. Such interference avoidance control is similarly performed at the measurement points after the measurement point Fn + 1 until the interference amount ΔI is eliminated.

Although the example of avoiding the interference in the Y direction has been described above, the control of avoiding the interference in the X direction or the Z direction may be used with the same idea. When avoiding in the Z direction, it can be avoided by inclining the stylus shaft 62 as shown in FIG.

It is convenient that the avoidance control using the measured measurement result of the rim Ri is applied when the height distance ZA between the stylus 61 and the optical measuring unit 30 in the Z direction is not large. For example, when the heights of the stylus 61 and the optical measuring unit 30 in the Z direction are substantially the same, interference cannot be avoided in the Z direction. Therefore, interference can be avoided by using the measured measurement result of the rim Ri and moving the optical measurement unit 30 in the Y direction.

<Detection of interference occurrence>
By the above control, the measurement is performed while avoiding the interference between the object to be interfered with and the optical measuring unit 30, but the interference may not always be avoided depending on the shape of the rim Ri. Hereinafter, for example, an example will be described in which the stylus 61 does not fall off from the rim groove FA and the measurement is completed while the interference target portion and the optical measuring unit 30 slightly interfere with each other.

For example, when the measurement of the three-dimensional shape data for the entire circumference of the rim Ri is completed, the control unit 50 then determines the optical measurement unit 30 (interference region IR) and the object to be interfered with (clamp) based on the measurement result of the rim Ri. It is determined (detected) whether or not the pins 130b, 131b, the rim Ri, etc.) interfere with each other during the measurement operation.

A method of detecting whether the optical measurement unit 30 and the object to be interfered with interfere with each other during the measurement operation will be described. FIG. 21 is a graph showing the result of differentiating the measurement result in the Z direction among the measurement results of the rim Ri by the stylus 61. When the measurement is completed without the occurrence of interference, the differential value of the measurement result in the Z direction of the rim usually changes slowly. However, if interference occurs during the measurement, the differential value of the measurement result in the Z direction changes abruptly. FIG. 21 is an example in which interference occurs at the measurement point Fn, then the interference disappears, normal measurement results are obtained, and the measurement is continued. When the stylus 61 falls off from the rim groove, the measured value of the radial length including the measured value in the Z direction also suddenly changes and becomes an abnormal value. Therefore, it is easy to detect whether or not the stylus 61 has fallen off from the rim groove. In this case, the measurement is stopped.

It should be noted that the detection of whether or not the optical measuring unit and the object to be interfered with interfere with each other during the measurement of the rim uses the output signal of the encoder 287 that detects the amount of movement of the stylus shaft 62 in the Z direction. May be good.

In FIG. 21, for example, when the differential value of the measurement result in the Z direction exceeds a predetermined threshold value Lim, the control unit 50 specifies the measurement point Fn at that time as a measurement point where interference with the object to be interfered occurs. do. In FIG. 21, when the differential value exceeds the threshold value Lim on the plus side after the measurement point Fn, the occurrence of interference disappears, and the stylus 61 follows the center of the rim groove again for normal measurement. It shows the measured point returned.

The interference determination method using the measurement result in the Z direction or the detection information of the encoder 287 is an example of the determination means, and is not limited to this method. For example, the position information of the rim groove FA is acquired by analyzing the cross-sectional image acquired by the optical measurement unit 30. Interference determination may be performed based on the transition of the position of the rim groove FA.

<Remeasurement by detecting the occurrence of interference>
When the control unit 50 determines that the optical measurement unit 30 and the object to be interfered with interfere with each other, the control unit 50 performs remeasurement while performing interference avoidance control. The operation of remeasurement will be described below. At the time of remeasurement, interference was detected during the previous measurement, and at the specified measurement point Fn, the control unit 50 avoids interference between the optical measurement unit 30 and the object to be interfered with by performing interference avoidance control. do.

An example of interference avoidance control in remeasurement will be described. FIG. 22 is a diagram illustrating an avoidance operation at a measurement point where interference has occurred. FIG. 22A is a schematic view showing the positional relationship between the rim Ri and the optical measuring unit 30 when interference occurs. In FIG. 22A, the measurement point Fn is a measurement point for interference generation. The upper half of FIG. 22A is a view of the measurement plane observed from above the paper surface, and the lower half of FIG. 22A is a view of the measurement plane observed from the clamp pin 130 side in the direction parallel to the Y axis. It is a figure.

For example, the control unit 50 determines the arrangement position (coordinate position of XYZ) of the interference region IR (interference portion) on the optical measurement unit 30 at the time of measuring the occurrence of interference with respect to the measurement point Fn in which the occurrence of interference is specified. It is obtained (calculated) based on the control data at the time of measuring the occurrence of interference and the arrangement data of the optical measuring unit 30 with respect to the support unit 70. For example, the control data at the time of measuring the occurrence of interference includes the XYZ position data of the holding unit 25, the rotation control data of the rotation unit 260, the inclination data of the stylus shaft 62, and the movement of the stylus shaft 62 in the Z direction with respect to the rotation unit 260. Data, etc. Further, the arrangement data of the interference region IR on the optical measurement unit 30 with respect to the support unit 70 is design value data and is stored in the memory 52. The arrangement position of the interference region IR at the measurement point Fn is stored in the memory 52. At this time, the arrangement position data of the interference region IR stored in the memory 52 may be only the Y coordinate data, for example, when avoiding interference in the Y direction. Further, the memory 52 may store the control data at the time of measurement of the occurrence of interference, and may obtain the arrangement position data of the interference region IR from the stored control data at the time of remeasurement.

Then, when the measurement point Fn is measured at the time of remeasurement, the control unit 50 controls the rotation of the moving unit 210 and the rotation unit 260 so that the interference region IR is separated from the determined position of the interference region IR. I do.

Since the calculation amount is large to calculate the entire arrangement position of the interference region IR, simply, one point included in the interference region IR is set as the interference point IRa, and the arrangement position of the interference point IRa is also calculated. You may. This is because in the remeasurement, it is sufficient to move the slightly interfering portion away from the rim Ri, so that it is not always necessary to specify the entire arrangement position of the interference region IR. For example, the interference point IRa is defined as the point where the interference region IR is closest to the rim shape of the measurement result of the rim Ri at the time of interference occurrence. Alternatively, the interference point IRa may be a predetermined portion (for example, the interference point IRa is a point where interference is specified to occur depending on the shape of the cover 30c of the optical measurement unit 30). In the following, an example of controlling the one interference point IRa so as to be separated from the rim Ri will be described.

Even in the remeasurement, the interference between the rim Ri, which is the object to be interfered with, and the optical measurement unit 30 may be avoided in at least one of the X, Y, and Z directions. FIG. 22B is a diagram illustrating an example of avoiding interference in the Y direction. The upper half of FIG. 22B is a view of the measurement plane observed from above the paper surface, and the lower half of FIG. 22B is a view of the measurement plane observed from the clamp pin 130 side in the direction parallel to the Y axis. It is a figure.

For example, the control unit 50 has an avoidance distance ΔJ (for example, in the direction toward the center line CL side) away from the rim Ri from the calculated Y position of the interference point IRa at the measurement point Fn where the occurrence of the interference is specified. An interference avoidance line IELY substantially parallel to the X direction is provided at a position separated by 1 mm). Then, when the measurement point Fn is measured by the remeasurement, the control unit 50 sets the Y position of the interference point IRa to be located on the interference avoidance line IELY (may be moved away from the interference avoidance line IELY to the inside of the rim). , Controls the rotation of the moving unit 210 and the rotating unit 260. This avoids interference between the rim Ri and the optical measurement unit 30 at the measurement point Fn. When there are a plurality of specified interference generation measurement points Fn (including the case where the interference generation measurement points Fn exist continuously and the case where they exist at distant positions), the control unit 50 controls the plurality of points. The same interference avoidance operation is performed at the measurement point Fn of.

Further, there is a possibility that the measurement point of interference occurrence is slightly deviated from the measurement point Fn specified at the time of interference occurrence at the time of remeasurement. Therefore, for example, the avoidance operation at the measurement point Fn may be performed including the measurement points before and after considering the deviation of the occurrence of interference.

For example, in the execution of remeasurement, at the post-measurement point after the avoidance operation at the measurement point Fn is completed, the posture state of the optical measurement unit 30 at the time of the original measurement (at the time of measurement when the occurrence of interference is detected). (A state in which the measurement axis L3 of the stylus 61 has an angle δ in the normal direction with respect to the rim Ri). However, if the posture state of the optical measuring unit at the time of the original measurement is suddenly returned, the orientation of the stylus 61 with respect to the rim Ri (the orientation of the measuring axis L3) may suddenly change, and the measurement accuracy may deteriorate. In order to avoid this, for example, when the control unit 50 remeasures the measurement point after the measurement point Fn where the interference occurs, the control unit 50 makes the optical measurement unit 30 perform the interference avoidance operation at the measurement point Fn where the interference occurs. The rotation of the moving unit 210 and the rotating unit 260 may be controlled so as to gradually change the posture state of the optical measuring unit 30 at the time of the original measurement with respect to the state. The correction angle of the stylus 61 that is gradually changed for each measurement point is 0.5 degrees. For example, when the measurement points on the entire circumference are 1,000 points, the radius angle of one measurement point is 0.36 degrees.

For the control of gradually changing the posture state of the optical measurement unit 30 at the time of the original measurement, the number of measurement points at the post-measurement points is set to a constant value (for example, 50 points), and the optics at the time of the original measurement. The angle at which the formula measuring unit 30 returns to the posture state may be gradually changed by the angle divided by the number of measurement points.

Further, at the front measurement point before the specified interference generation measurement point Fn, the posture state of the optical measurement unit at the time of the original measurement suddenly changes to the posture state of the avoidance operation, as in the case of the rear measurement point. Then, the orientation of the stylus 61 with respect to the rim Ri suddenly changes, and the measurement accuracy may deteriorate. Therefore, even at the previous measurement point, the control unit 50 gradually changes from the posture state of the optical measurement unit 30 at the time of the original measurement to the posture state in which the optical measurement unit 30 is operated to avoid interference at the measurement point Fn where interference occurs. The drive of the moving unit 210 and the rotating unit 260 may be controlled so as to be changed.

In order to simplify the control program at the time of remeasurement, the measurement at the previous measurement point may be controlled as follows. For example, the control unit 50 changes the angle of the measurement axis L3 with respect to the rim Ri by rotating the rotation unit 260. At this time, the control unit 50 controls the operations of the moving unit 210 and the rotating unit 260 so that the position of the tip 61a of the stylus 61 does not change from the measurement point. At this time, due to the relationship between the rotation speed of the rotation unit 260 and the movement speed of the movement unit 210, the change in the angle of the measurement axis L3 with respect to the rim Ri for each measurement point is limited to the limit angle ΔBA (for example, 10 degrees). .. That is, the control unit 50 sets the Y position of the interference point IRa toward the interference avoidance line IELY from the measurement point before the number of measurement points with a margin (for example, the measurement point 50 points before the measurement point Fn). The control of the rotating unit 260 and the moving unit 210 is started. At this time, the control unit 50 controls the change in the angle of the measurement axis L3 with respect to the rim Ri with the limit angle ΔBA at one measurement point as the upper limit. For example, if the Y position of the interference point IRa reaches the interference avoidance line IELY at the measurement point at the third point after starting the angle change in the direction of the tip 61a of the stylus 61, the control unit at the subsequent measurement point. 50 controls the drive of the moving unit 210 and the rotating unit 260 so that the Y position of the interference point IRa becomes the interference avoidance line IELY. This enables smooth measurement.

Although the example of avoiding the interference in the Y direction has been described above, the interference may be avoided in the X direction. FIG. 23 is a diagram illustrating an example of avoiding interference in the X direction. The upper half of FIG. 23 is a view of the measurement plane observed from above the paper surface, and the lower half of FIG. 23 is a view of the measurement plane observed from the clamp pin 130 side in the direction parallel to the Y axis.

For example, the control unit 50 is located at the measurement point Fn where the occurrence of interference is specified, at a position separated by an avoidance distance ΔK (for example, 1 mm) from the calculated X position of the interference point IRa in the X direction away from the rim Ri. Is provided with an interference avoidance line ILEX substantially parallel to the Y direction. Then, when the measurement point Fn is measured by the remeasurement, the control unit 50 sets the X position of the interference point IRa to be located on the interference avoidance line IELX (may be moved away from the interference avoidance line IELX to the inside of the rim). , Controls the rotation of the moving unit 210 and the rotating unit 260. This avoids interference between the rim Ri and the optical measurement unit 30 at the measurement point Fn.

At the measurement point after the measurement point Fn, the control to gradually return the posture state of the optical measurement unit 30 at the time of the original measurement may be performed as in the avoidance control in the Y direction. Further, even at the measurement point before the measurement point Fn, the optical measurement unit is set at the measurement point Fn where interference occurs from the posture state 30 of the optical measurement unit at the time of the original measurement, as in the avoidance control in the Y direction. 30 may be controlled so as to gradually change to the posture state in which the interference avoidance operation is performed.

Further, the avoidance control in the Y direction and the avoidance control in the X direction may be combined and used. In this case, if the optical measuring unit 30 is controlled with less movement to avoid it, the decrease in measurement accuracy can be reduced.

Further, depending on the position of the specified interference generation measurement point Fn, interference may be avoided in the Z direction. For example, as shown in FIG. 18, the control unit 50 controls the moving unit 210 to incline the stylus shaft 62, and the Z position of the interference point IRa is positioned below the Z position when interference occurs. This makes it possible to perform measurements without interference.

Further, although the example of executing the remeasurement after the measurement of the rim Ri is completed is described above, the measurement is stopped and the remeasurement is executed when the interference is detected during the measurement of the rim Ri. You may.

<Example of transformation of optical measurement unit>
The above description has been described with the configuration in which the optical measuring unit 30 is arranged so as to be biased to one side in the left-right direction with respect to the stylus 61 when the stylus 61 is viewed from the tip direction thereof, but the present invention is not limited to this. For example, as shown in FIG. 24, the optical measuring unit 30 may be configured to be arranged on both the left and right sides of the stylus 61 when the stylus 61 is viewed from the tip direction thereof.

FIG. 24 is a diagram showing a part of the optical measuring unit 30 and the stylus unit 60 supported by the support unit 70 in this transformation example. The cover 30Dc of the optical measuring unit 30 is configured to be substantially evenly arranged on both the left and right sides of the stylus shaft 62 when viewed from the tip end direction of the stylus 61. The appearance of the optical measurement unit 30 of this transformation example is basically different from that of the optical measurement unit 30 of the previous example shown in FIGS. 7, 8 and the like, except that the cover 30Dc is arranged in the left-right direction. Is the same. In this optical measurement unit 30, the interference region with respect to the object to be interfered with exists in the left semicircular region IR1 and the right semicircular region IR2 on the upper surface of the cover 30Dc in FIG. 24 (a). ..

FIG. 25 is a diagram illustrating an avoidance operation with an object to be interfered with in the spectacle frame shape measuring device 1 having the optical measuring unit 30 shown in FIG. 24. In FIG. 25, the measurement direction in which the stylus 61 advances is the arrow C1 direction (clockwise). The upper half of FIGS. 25 (a) and 25 (b) is a view of the measurement plane observed from above the paper surface, and the lower half of FIGS. 25 (a) and 25 (b) shows the measurement plane from the clamp pin 130 side. It is a figure observed in the direction parallel to the Y axis. The upper half of FIGS. 25 (c) and 25 (d) is a view of the measurement plane observed from above the paper surface, and the lower half of FIGS. 25 (c) and 25 (d) shows the measurement plane from the clamp pin 131 side. It is a figure observed in the direction parallel to the Y axis. Also in this example, the interference determination line ILCZ in the Z direction and the interference determination line ILCY in the Y direction are set. When the optical measurement unit 30 is located below the interference determination line ILCZ in the Z direction, the control unit 50 does not perform the interference avoidance operation because the interference between the object to be interfered and the optical measurement unit 30 does not occur. Perform normal measurement operation. When the optical measurement unit 30 is located below the interference determination line ILCZ in the Z direction, the control unit 50 performs an interference avoidance operation as follows.

For example, the control unit 50 performs the interference avoidance operation of the region IR1 of the optical measurement unit 30 located on the side preceding the stylus 61 based on the interference determination line ILCY in the Y direction. The control unit 50 performs the interference avoidance operation of the region IR2 of the optical measurement unit 30 located behind the stylus 61 based on the arrangement information of the rim holding member and the measured result of the rim Ri.

FIG. 25A is an example in which the region IR1 on the side preceding the stylus 61 approaches the clamp pin 130b side from the interference determination line ILCY in the Y direction. In this case, the control unit 50 controls the operations of the moving unit 210 and the rotating unit 260 so that the region IR1 is not located on the clamp pin 130b side of the interference determination line ILCY in the Y direction as shown in FIG. 25 (b). ..

FIG. 25C is an example in which the region IR2 located behind the stylus 61 approaches the clamp pin 131 and the measured rim Ri. In this case, as shown in FIG. 25D, the control unit 50 moves the unit 210 and the region IR2 away from the clamp pin 131 and the rim Ri based on the arrangement information of the clamp pin 131 and the measured result of the rim Ri. Controls the operation of the rotating unit 260.

By such interference avoidance control, even in the case where the optical measuring unit 30 is located on the left and right sides of the stylus 61 (left and right when viewed from the tip direction of the stylus 6), the measurement avoiding interference. Can be done well.

Although the typical examples of the present disclosure have been described above, the present disclosure is not limited to the examples shown here, and various modifications can be made within the scope of making the technical idea of the present disclosure the same.

1 Eyeglass frame shape measuring device 25 Holding unit 30 Optical measuring unit 50 Control unit 60 Measuring instrument unit 61 Measuring instrument 70 Supporting unit 130 Clamp pin 210 Moving unit 260 Rotating unit 300 Clamping mechanism

Claims (12)

It is a spectacle frame shape measuring device that measures the shape of the rim of the spectacle frame.
A frame holding means having a rim holding member for holding the rim of the spectacle frame,
A stylus unit having a stylus inserted into the groove of the rim,
An optical measuring unit for optically measuring the shape of the groove of the rim, and
A support unit that integrally supports the stylus unit and the optical measuring unit,
A changing means for changing the relative positional relationship between the rim and the support unit, and
The stylus unit, the optical measuring unit, and the support for an object to be interfered with, including at least one of the rim of the spectacle frame held by the frame holding means and the rim holding member at the time of measuring the rim. A control means that controls the modification means to avoid interference of an interfering object including at least one of the units.
A spectacle frame shape measuring device characterized by being provided with. In the spectacle frame shape measuring device of claim 1,
The interference information acquisition means for acquiring the interference information including the position information of the object to be interfered with is provided.
The spectacle frame is characterized in that the control means controls the changing means so as to avoid interference of the interfering object with the interfering object based on the interfering information acquired by the interfering information acquiring means. Shape measuring device. In the spectacle frame shape measuring device according to claim 1 or 2.
The rim holding member has a configuration extending toward the inside of the rim in the radial plane at the time of measurement.
The interference information includes arrangement information of the rim holding member in a state where the rim of the spectacle frame is held.
Based on the arrangement information of the rim holding member, the control means makes the distance of the interfering object constant or more in at least one direction in the radial direction and the vertical direction perpendicular to the radial direction with respect to the rim holding member. As described above, the spectacle frame shape measuring device is characterized by controlling the changing means. In the spectacle frame shape measuring device of claim 3,
The spectacle frame shape is characterized in that the control means controls the changing means so that the interfering object has a certain distance or more in the radial direction with respect to the rim holding member extending toward the inside of the rim. measuring device. In the spectacle frame shape measuring device of claim 3 or 4,
The changing means includes a rotating means for rotating the support unit about an axis extending in a vertical direction perpendicular to the radial direction.
The control means is characterized in that the rotating means is controlled so that the distance between the rim holding member and the interfering object becomes a certain distance or more in the radial direction when the unmeasured portion of the rim is measured. Eyeglass frame shape measuring device. In the spectacle frame shape measuring device according to any one of claims 1 to 5.
Based on the measurement result of the rim, an interference generation detecting means for detecting whether or not interference between the interfering object and the interfered object has occurred during the measurement of the rim, and an interference generation detecting means.
A remeasurement executing means that remeasures the shape of the rim when it is detected that interference has occurred by the interference generation detecting means, and a remeasurement executing means.
A measurement point specifying means for specifying a measurement point at which interference between the interfered object and the interfering object has occurred based on the detection result of the interference generation detecting means.
Equipped with
When the specified measurement point is remeasured, the control means controls the changing means to perform an interference avoidance operation different from the interference avoidance operation before the remeasurement of the interfering object. Eyeglass frame shape measuring device. In the spectacle frame shape measuring device of claim 6,
It is provided with a calculation means for obtaining the arrangement position of the interference portion of the interfering object at the specified measurement point based on the control information of the changing means.
When the specified measurement point is remeasured, the control means at least one in a radial direction and a direction perpendicular to the radial direction with respect to the arrangement position of the interference portion determined by the calculation means. A spectacle frame shape measuring device characterized by performing the interference avoidance operation in a direction. In the spectacle frame shape measuring device of claim 7,
The control means is an interference point included in the interference site when measuring the specified measurement point, and the interference point is the interference point with respect to the arrangement position of the interference point defined on the interference object. A spectacle frame shape measuring device characterized in that the interference avoidance operation is performed so that the distance is a certain distance or more in the inner direction of the rim in the radial direction. In the spectacle frame shape measuring device according to any one of claims 6 to 8.
When the control means re-measures the measurement point after the specified interference generation measurement point, the control means originally performs with respect to the posture state in which the interference object is made to avoid interference at the interference generation measurement point. A spectacle frame shape measuring device, characterized in that the changing means is controlled so as to stepwise change the posture state of a front interfering object at the time of measurement. In the spectacle frame shape measuring device according to any one of claims 6 to 9.
When the control means remeasures the measurement point before the measurement point of the specified interference occurrence, the control means transfers the interference object at the measurement point of the interference generation from the posture state of the interference object at the time of the original measurement. An eyeglass frame shape measuring device, characterized in that the changing means is controlled so as to gradually change the posture state in which interference avoidance operation is performed. To optically measure the shape of a frame holding means having a rim holding member for holding a spectacle frame in a measurement state, a stylus unit having a stylus inserted into the groove of the rim, and a groove of the rim. Optical measuring unit, a support unit that integrally supports the stylus unit and the optical measuring unit, and a changing means for changing the relative positional relationship between the rim and the support unit. It is a control program for the frame shape measuring device.
A control step for controlling the changing means, the stylus unit, the optical type, with respect to an object to be interfered with, including at least one of the rim of the spectacle frame held by the frame holding means and the rim holding member. A control step that controls the modification means to avoid interference of interfering objects including at least one of the measuring unit and the supporting unit.
Is executed by the control unit of the spectacle frame shape measuring device, which is a control program of the spectacle frame shape measuring device. In the control program of the spectacle frame shape measuring device of claim 11,
Based on the measurement result of the rim, the interference generation detection step of detecting whether or not the interference between the object to be interfered and the interference occurred during the measurement of the rim, and the interference generation detection step.
A remeasurement execution step of executing a remeasurement of the shape of the rim when the occurrence of interference is detected by the interference occurrence detection step, and a remeasurement execution step.
A measurement point specifying step for specifying a measurement point at which interference between the interfered object and the interfering object has occurred based on the detection result of the interference generation detecting step.
Equipped with
The control step is characterized in that when the specified measurement point is remeasured, an interference avoidance operation different from the interference avoidance operation before the remeasurement of the interfering object is performed by controlling the changing means. A control program for the spectacle frame shape measuring device.

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