JP2022007302A - Surface inspection device, mobile terminal and program - Google Patents

Abstract

To provide a surface inspection device capable of more easily inspecting a surface of a body to be inspected.SOLUTION: A surface inspection device having portability includes a display unit that displays an inspection image, an imaging unit that captures an image of a surface of a body to be inspected on which the inspection image is projected to acquire a plurality of captured images, and a calculation unit that generates a processed image obtained by clarifying a defect on the surface of the body to be inspected on the basis of the plurality of captured images.SELECTED DRAWING: Figure 2

Description

The present disclosure relates to surface inspection devices, mobile terminals, and programs.

The development of technology for detecting defects such as scratches and paint peeling existing on the body to be inspected, for example, the body of an automobile, is underway. For example, Patent Document 1 describes a lighting device that displays an inspection image, a camera that obtains a plurality of captured images by photographing the object to be inspected illuminated by the lighting device a plurality of times, and the plurality of captured images. Further, an image inspection apparatus including an inspection means for inspecting the presence or absence of defects in an inspected object is disclosed.

Japanese Unexamined Patent Publication No. 2017-227474

The image inspection apparatus disclosed in Patent Document 1 is presumed to be mainly used as a stationary type, and is presumed to be poor in portability or portability. If the image inspection device can be easily carried, it is considered that the surface of the inspected object can be inspected more easily.

The present disclosure has been made in view of the above problems, and an object thereof is mainly to provide a surface inspection apparatus capable of inspecting the surface of an inspected object more easily.

The surface inspection device according to an embodiment of the present disclosure for achieving the above object is a portable surface inspection device, which has a display unit for displaying an inspection image and a subject to be inspected on which the inspection image is projected. A photographing unit that acquires a plurality of captured images by photographing the surface of the body, and a calculation unit that generates a processed image that clarifies defects existing on the surface of the object to be inspected based on the plurality of captured images. And.

Since the surface inspection device having the above configuration has portability, the surface of the object to be inspected can be inspected more easily.

It is a front view which shows the appearance of the surface inspection apparatus by 1st Embodiment. It is a block diagram which shows the structure of the surface inspection apparatus by 1st Embodiment. It is a flowchart which shows the flow of the inspection process executed by the computer of the surface inspection apparatus by 1st Embodiment. In the first embodiment, it is a schematic diagram which shows how the display part of the surface inspection apparatus displays an inspection image. In the first embodiment, it is a schematic diagram which shows a mode that the photographing part of a surface inspection apparatus photographes the surface of an object to be inspected. In the first embodiment, it is a conceptual diagram at the time of generating a difference image. In the first embodiment, it is a conceptual diagram at the time of generating the first processed image. In the first embodiment, it is a conceptual diagram at the time of generating the second processed image. In the first embodiment, it is a conceptual diagram at the time of generating a binary image. In the first embodiment, it is a schematic diagram which shows how the display part of the surface inspection apparatus displays a binary image. It is a schematic diagram which shows the appearance that the attachment is attached to the surface inspection apparatus in the 1st modification of 1st Embodiment. It is a schematic diagram which shows the structure of the photographing part by the 2nd modification of 1st Embodiment. It is a block diagram which shows the arithmetic part by the 3rd modification of 1st Embodiment. It is a block diagram which shows the structure of the surface inspection apparatus by 2nd Embodiment.

(First Embodiment)
Hereinafter, the structure and configuration of the surface inspection apparatus 1 according to the first embodiment will be described with reference to the drawings. As the surface inspection device 1, for example, a commercially available smartphone is used.

First, the appearance structure of the surface inspection device 1 will be described with reference to the front view of the surface inspection device 1 shown in FIG.

The surface inspection device 1 mainly includes a display unit 12 for displaying a predetermined image, a photographing unit 13 capable of photographing a subject, and a housing 11 for accommodating the display unit 12 and the photographing unit 13. On the side surface of the housing 11, there are operation buttons 141 such as a power button 141p that controls the operation of the surface inspection device 1 or ON / OFF of the display by the display unit 12, and a shutter button 141s that controls the shooting of the subject by the shooting unit 13. It is provided. The surface inspection device 1 is a general smartphone and includes a microphone 142 and a speaker 143 for talking.

Next, the hardware configuration and the functional configuration of the surface inspection device 1 will be described with reference to the block diagram of the surface inspection device 1 shown in FIG.

The surface inspection device 1 includes a display unit 12, a photographing unit 13, an operation button 141, a microphone 142, and a speaker 143, as well as a CPU (Central Processing Unit) 15, a RAM (Random Access Memory) 16, and a ROM (Read Only Memory). 17 and a communication unit 18 are provided. These hardware units are mounted on the printed wiring board or electrically connected to the printed wiring board via a connector provided on the printed wiring board and housed in the housing 11. Will be done.

The CPU (calculation unit) 15 performs various arithmetic processing and controls the overall operation of the surface inspection device 1 in an integrated manner. The CPU 15 reads a control program stored in the ROM 17 and loads it into the RAM 16 to perform operations related to various functions, control of various hardware units, and the like. According to the control program, the CPU 15 displays, for example, a desired image on the display unit 12, and the photographing unit 13 photographs the subject. Further, the CPU 15 performs processing related to processing and compositing the image taken by the photographing unit 13, the image stored in the ROM 17, and the like.

The RAM 16 temporarily stores, for example, an application program, numerical information set in a hardware unit, and the like. As the RAM 16, for example, a volatile memory such as a SRAM (Static RAM) or a DRAM (Dynamic RAM) is used.

The ROM 17 stores, for example, an image taken by the photographing unit 13, a program 171 related to a surface inspection of a subject, and the like for a long period of time. For the ROM 17, for example, a non-volatile memory such as a mask ROM or an EEPROM (Electrically Erasable Programmable ROM) is used.

The communication unit 18 includes a communication module 181 that wirelessly communicates with a mobile phone base station via an antenna 182. The communication module 181 includes a high frequency circuit, a baseband circuit, and the like.

The communication module 181 modulates the communication signal from the CPU 15, and transmits the modulated high frequency signal to the mobile phone base station via the antenna 182. The communication signal is, for example, an audio signal detected by the microphone 142.

Further, the communication module 181 demodulates the high frequency signal received via the antenna 182, and transfers the demodulated communication signal to the CPU 15. The communication signal is converted into an audio signal by, for example, the CPU 15, and is output from the speaker 143.

The communication unit 18 can download the control program executed by the CPU 15 from a predetermined server via the base station. The control program includes a program 171 that describes the inspection process described later.

The display unit 12 includes a display element 121 that displays a predetermined image. As the display element 121, for example, an LCD (Liquid Crystal Display) element, an organic EL (Electro-Luminescence) element, or the like is used. Alternatively, a touch panel device in which a touch sensor is superposed on an LCD element, an organic EL element, or the like may be used.

The display unit 12 displays the image represented by the image signal on the display element 121 based on the image signal output from the CPU 15. Alternatively, the image represented by the image data stored in the ROM 17 is displayed on the display element 121 based on the control signal from the CPU 15.

The photographing unit 13 includes, for example, an image pickup element (photoelectric conversion element) 131 that converts an optical signal into an electric signal, an optical system 132 that forms an optical image of a subject on the image pickup element 131, and the like. A CCD (Charge Coupled Device) or CMOS (Complementary Metal Oxide Semiconductor) image sensor is used as the image sensor 131. The optical system 132 includes an optical lens such as a convex lens and a concave lens, and constitutes, for example, an ultra-wide-angle lens having a focal length of 24 mm or less.

The photographing unit 13 stores the image data acquired by the image pickup device 131 in the ROM 17 based on the control signal from the CPU 15. The CPU 15 transmits the control signal to the photographing unit 13 at the timing when the shutter button 141s is operated by the user. The photographing unit 13 may analyze the state of focus, blurring, etc. with respect to the subject and autonomously store the image data acquired by the image sensor 131 in the ROM 17.

The surface inspection device 1 further includes a storage battery 19 that supplies electric power to each hardware unit. As the storage battery 19, for example, a lithium ion battery is used.

Subsequently, the functional configuration of the CPU (calculation unit) 15 will be described. In the present embodiment, the CPU 15 mainly functions as a means for processing and synthesizing a plurality of captured images acquired by the photographing unit 13. Specifically, the difference image generation means 151 that generates a difference image by synthesizing a plurality of captured images acquired by the photographing unit 13, and the first processed image and the second processed image by processing the difference image. It functions as a first processed image generation means 152 and a second processed image generation means 153 to be generated, and a binary image generation means 154 that generates a binary image based on the first processed image and the second processed image. .. The CPU 15, which functions as these image generation means 151 to 154, executes the inspection processing steps S131 to S134, which will be described later, to generate various processed images.

Next, the inspection process executed by the CPU 15 will be described with reference to the flowchart shown in FIG. The program 171 that describes this inspection process is stored in the ROM 17, and is executed, for example, by a start operation by the user.

In the first display processing step S110, the CPU 15 causes the display unit 12 to display the inspection image _Pα . The image data representing the inspection image _Pα is stored in, for example, ROM 17.

FIG. 4 shows how the inspection image _Pα is displayed on the display unit 12. In the inspection image P _α , for example, a striped pattern in which the bright region W and the dark region B extending in the first direction X are periodically arranged in the second direction Y has a constant speed in the second direction Y. It is a video that moves (scrolls) with.

The bright region W is a region where the brightness is relatively high, and here, it is a region where white is displayed. Further, the dark region B is an region where the brightness is relatively low, and here, it is a region where black is displayed.

Returning to FIG. 3, the description of the inspection process by the CPU 15 will be continued. When the shutter button 141s is operated by the user, the process proceeds to step S120.

In the photographing process step S120, the CPU 15 causes the photographing unit 13 to photograph the surface of the object K to be inspected on which the inspection image _Pα is projected. As a result, a plurality of captured images P _β ¹ to P _β ^N (arbitrary integer larger than N: 1) that capture the surface of the object K to be inspected are acquired. The captured images P _β ¹ to P _β ^N are, for example, monochrome photographs.

FIG. 5 shows a state in which the surface of the inspected body K is photographed by the photographing unit 13. When the surface inspection device 1 is brought close to the inspected object K with the inspection image P _{α displayed on the display unit 12, the inspection image P α displayed} on the display unit 12 is projected on the surface of the inspected object K. ..

The inspection image P _α is a moving image in which the striped pattern moves in one direction. Therefore, when the surface of the inspected body K on which the inspection image _Pα is projected is photographed a plurality of times at different time points, the area W _K and the dark area B on which the bright region W is projected are projected on the surface of the inspected body K. It is possible to obtain a plurality of captured images P _β ¹ to P _β ^N in which the positions of the regions _BK are different.

Returning to FIG. 3, the description of the inspection process by the CPU 15 will be continued.

In the image generation processing step S130, the CPU 15 generates a processed image in which the defect Kd existing on the surface of the inspected body K is clarified based on the plurality of captured images P _β ¹ to P _β ^N. The image generation processing step S130 is, for example, a step S131 (FIG. 6) of generating a difference image P _γ based on a plurality of captured images P _β ¹ to P _β ^N , and a first processed image P based on the difference image P _γ . Binary image P _ε based on steps S132 (FIG. 7) and S133 (FIG. 8) for generating _δ ¹ and the second processed image P _δ ² and the first processed image P _δ ¹ and the second processed image P _δ ² . Includes step S134 (FIG. 9) to generate.

FIG. 6 shows how the difference image P _γ is generated based on a plurality of captured images P _β ¹ to P _β ^N in the difference image generation step S131. Here, the plurality of captured images P _β ¹ to P _β ^N and the difference image P _γ are composed of a plurality of pixels arranged in a matrix of n × m (arbitrary integer larger than n, m: 1). It shall be. It should be noted that the pixels located in the i-th row and j-th column (an arbitrary integer of i: 1 or more and n or less, and an arbitrary integer of j: 1 or more and m or less) are represented as [i, j]. Further, a value representing the brightness (brightness) of each pixel is referred to as a luminance value.

The brightness value of the pixel located at [i, j] of the difference image P _γ is the pixel located at [i, j] of the plurality of captured images P _β ¹ to P _β ^N (the brightness value is set in the difference image P _γ ). It is set based on the brightness value obtained by subtracting the brightness value of the darkest pixel from the brightness value of the brightest pixel among the pixels at the same position as the pixel to be tried. Specifically, for example, the brightness value of the pixel located in [1, 1] of the difference image P _γ is the pixel located in [1, 1] of the plurality of captured images P _β ¹ to P _β ^N. Brightness obtained by subtracting the brightness value of the darkest pixel (for example, the pixel of [1,1] in the captured image P _β ^N ) from the brightness value of the brightest pixel (for example, the pixel of [1, 1] in the captured image P _β ¹ ). Set based on the value. The same processing is performed from the pixel of [1,1] to the pixel of [n, m] of the difference image P _γ to set the luminance value of all the pixels of the difference image P _γ .

When the defect Kd is present on the surface of the object K to be inspected, the luminance value of the region (pixel group) corresponding to the defect Kd in the difference image _Pγ is usually lower than the luminance value around the defect Kd. As a result, even a defect Kd that is difficult to see with the naked eye can be clearly recognized in the difference image _Pγ .

However, in the difference image P _γ , an image that can be mistaken for a defect may appear depending on the surface shape (undulations) of the object K to be inspected as a design. Further, in the difference image P _γ , it may be difficult to distinguish between a defect and an image caused by signal noise mixed in during photoelectric conversion, signal processing, or the like. Therefore, the following image processing is executed.

FIG. 7 shows how the first processed image P _δ ¹ is generated based on the difference image P _γ in the first processed image generation step S132. Here, it is assumed that the first processed image P _δ ¹ is composed of a plurality of pixels arranged in a matrix of n × m.

The CPU 15 divides the first processed image P _δ ¹ into a group (pixel group) of p (any integer larger than p: 1). For example, a 16 × 16 square matrix pixel group is used as a unit pixel group, and the first processed image P _δ ¹ is divided into p (for example, 100) unit pixel groups so that the pixels do not overlap.

Then, the brightness value of each of the plurality of pixels included in the ^qth (arbitrary integer of q: 1 or more and p or less) pixel group Gq in the first processed image P _δ ¹ divided into p pixel groups is set. , The brightness standardized based on the brightness values of a plurality of pixels included in the pixel group G ^q of the corresponding difference image P _γ (the pixel group at the same position as the brightness value setting pixel group of the first processed image P _δ ¹ ). Set to a value. Specifically, for example, the luminance values of each of the 256 (16 × 16) pixels included in the ^first pixel group G1 including the pixels of [1,1] are set to the pixel group G of the corresponding difference image _Pγ . It is set to the average luminance value of the luminance values of 256 pixels included in ¹ . The same processing is performed from the ^first pixel group G1 to the first pixel group Gp of the first processed image ^P _δ ¹ to set the luminance values of all the pixels of the first processed image P _δ ¹ .

The luminance value of each of the pixels constituting the first processed image P _δ ¹ is set to the luminance value that standardizes the luminance values of the pixels in a relatively wide range of the difference image P _γ . Therefore, in the first processed image P _δ ¹ , an image corresponding to a defect Kd having a small size and an image caused by signal noise are generally unlikely to appear, and the first processed image P _δ ¹ is mainly an object K to be inspected. The image reflects the distribution of brightness caused by the undulations of.

FIG. 8 shows how the second processed image P _δ ² is generated based on the difference image P _γ in the second processed image generation step S133. Here, it is assumed that the second processed image P _δ ² is composed of a plurality of pixels arranged in a matrix of n × m.

The CPU 15 divides the second processed image P _δ ² into a group (pixel group) of u (arbitrary integer larger than u: p). For example, a 4 × 4 square matrix pixel group is used as a unit pixel group, and the second processed image P _δ ² is divided into u (for example, 1600) unit pixel groups so that the pixels do not overlap.

Then, the brightness value of each of the plurality of pixels included in the ^v -th (arbitrary integer of v: 1 or more and u or less) pixel group gv in the second processed image P _δ ² divided into u pixel groups is set. , The brightness standardized based on the brightness values of a plurality of pixels included in the pixel group g ^v of the corresponding difference image P _γ (the pixel group at the same position as the brightness value setting pixel group of the second processed image P _δ ² ). Set to a value. Specifically, for example, the luminance values of each of the 16 (4 × 4) pixels included in the first pixel group g ¹ including the pixels of [1, 1] are set to the pixel group g of the corresponding difference image P _γ . It is set to the average luminance value of the luminance values of the 16 pixels included in ¹ . The same processing is performed from the ^first pixel group g1 of the second processed image P _δ ² to the ^uth pixel group gu to set the luminance values of all the pixels of the second processed image P _δ ² .

The luminance value of each pixel constituting the second processed image P _δ ² is set to a luminance value that standardizes the luminance values of the pixels included in a relatively narrow range of the difference image P _γ . Therefore, in the second processed image P _δ ² , an image corresponding to the defect Kd, which is generally small in size, is also expressed, and the second processed image P _δ ² is caused by the defect Kd in addition to the undulations of the inspected body K. The image reflects the distribution of the brightness. Even in the second processed image P _δ ² , an image caused by signal noise is unlikely to appear.

FIG. 9 shows how the binary image P _ε is generated based on the first processed image P _δ ¹ and the second processed image P _δ ² in the binary image generation step S134. Here, it is assumed that the binary image P _ε is composed of a plurality of pixels arranged in a matrix of n × m.

The luminance value of the pixels constituting the binary image P _ε depends on the ratio of the luminance value of the pixel constituting the first processed image P _δ ¹ to the luminance value of the pixel constituting the second processed image P _δ ² . It is set to either the maximum brightness value (white) or the minimum brightness value (black). That is, the luminance value of the pixel located at [i, j] of the binary image P _ε is the second processed image with respect to the luminance value B _ij ¹ of the pixel located at [i, j] of the first processed image P _δ ¹ . When the ratio of the luminance value B _ij ² (B _ij ² / B _ij ¹ ) of the pixel located at [i, j] of P _δ ² is less than the threshold value, it is set to black, and when it is equal to or more than the threshold value. Is set to white. Specifically, for example, the luminance value of the pixel located at [1, 1] of the binary image P _ε is the luminance value B ₁₁ ¹ of the pixel located at [1, 1] of the first processed image P _δ ¹ . When the ratio ( ^B ₁₁₂ / B ₁₁ ¹ ) of the luminance value B ₁₁₂ of the pixel located at [1, ¹ ] of the second processed image P _δ ² is less than the threshold value, it is set to black and the threshold value is set. If it is the above, it is set to white. The same processing is performed from the pixel of [1,1] to the pixel of [n, m] of the binary image P _ε to set the luminance value of all the pixels of the binary image P _ε .

The first processed image P _δ ¹ is an image that mainly reflects the distribution of brightness caused by the undulations of the inspected body K. The second processed image P _δ ² is an image that mainly reflects the distribution of brightness caused by the undulations of the inspected body K and the defect Kd. Therefore, by dividing the luminance value B ² of the pixels constituting the second processed image P _δ ² from the luminance value B ¹ of the pixels constituting the first processed image P _δ ¹ (B ² / B ¹ ). , The influence of the undulations of the object K to be inspected is reduced, and an image in which the defect Kd is more clarified (emphasized) can be obtained.

Returning to FIG. 3, the description of the inspection process by the CPU 15 will be continued.

In the second display processing step S140, the CPU 15 causes the display unit 12 to display, for example, a binary image P _ε . At this time, the captured images P _β ¹ to P _β ^N , the difference image P _γ , and the like may be displayed together.

FIG. 10 shows how the binary image P _ε (defect image Pd copied therein) is displayed on the display unit 12. The defect Kd, which is difficult to see with the naked eye, can be clearly recognized in the binary image P _ε .

As described above, since the surface inspection device 1 according to the present embodiment has portability, it is possible to confirm the defect Kd that may exist on the surface of the object K to be inspected more easily than the stationary inspection device. can. Further, since a general smartphone can be used as the surface inspection device 1, anyone can easily inspect the defect Kd that may exist on the surface of the object K to be inspected.

(First modification)
In the first embodiment, when the surface of the object to be inspected K is photographed, it is preferable to suppress blurring (vibration) of the imaging unit 13 as much as possible to acquire clearer captured images P _β ¹ to P _β ^N. .. Hereinafter, as a first modification, a surface inspection device equipped with an attachment for suppressing blurring will be described.

FIG. 11 shows a state in which the surface of the inspected body K is photographed by the photographing unit 13. In this modification, the attachment 111 for fixing the relative position to the inspected body K is attached to the housing 11. The attachment 111 can be attached to the housing 11 without blocking the display unit 12 and the photographing unit 13. The attachment 111 is formed of, for example, a resin, and can be manufactured in a desired shape by a general resin molding method.

By attaching such an attachment 111 to the surface inspection device 1 and bringing the attachment 111 into contact with the inspected body K, the surface thereof can be stably photographed. As a result, it is possible to obtain clear captured images P _β ¹ to P _β ^N in which blurring is suppressed.

(Second modification)
Not limited to the attachment 111 according to the first modification, a clear photographed image P _β ¹ to P _β ^N may be acquired by a so-called optical image stabilization process. Hereinafter, as a second modification, a surface inspection device in which the photographing unit 13 is provided with a blur correction mechanism will be described.

FIG. 12 shows the configuration of the photographing unit 13 provided with the image stabilization mechanism. In this modification, the photographing unit 13 includes an inertial sensor 133 including an acceleration sensor, a gyro sensor, and the like, and a moving mechanism 134 for moving the image pickup element 131 or the optical system 132, in addition to the image pickup element 131 and the optical system 132. To prepare for.

The inertia sensor 133 detects blurring of the photographing unit 13 or the surface inspection device 1 itself at the time of photographing, and transmits information about the blurring to the CPU 15. The CPU 15 controls the moving mechanism 134 based on the information, and adjusts the position of the image pickup device 131 or the optical system 132 so as to cancel the blur.

By such a blur correction process, clear captured images P _β ¹ to P _β ^N may be obtained.

(Third modification example)
As in the first modification or the second modification, it is preferable that the blurring of the photographing unit 13 at the time of photographing is suppressed as much as possible. However, even if unclear captured images P _β ¹ to P _β ^N are obtained due to blurring of the photographing unit 13, the captured images P _β ¹ to P _β ^N are subjected to so-called electronic image stabilization processing to be clear. Images may be obtained. Hereinafter, as a third modification, a surface inspection apparatus having a means for performing electronic image stabilization processing on the captured images P _β ¹ to P _β ^N will be described.

FIG. 13 shows a functional block diagram of the CPU 15. The CPU 15 further functions as a blur correction image generation means 155 in addition to the image generation means 151 to 154 described above.

The CPU 15 as the image stabilization image generation means 155 performs image stabilization processing on the plurality of captured images P _β ¹ to P _β ^N acquired by the photographing unit 13 to generate a plurality of image stabilization images. A known superposition method, image restoration method, or the like can be adopted for the blur correction process. In this modification, the difference image generation means 151 generates the difference image P _γ based on a plurality of image stabilization images.

By such a blur correction process, a clear image of the object K to be inspected K may be obtained.

(Second embodiment)
In the first embodiment, the inspection image and the processed image (binary image or difference image) are displayed on the common display element 121. However, the inspection image and the processed image may be displayed on separate display devices. In the second embodiment, an example in which the inspection image is displayed on the display element 121 and the processed image is displayed on the external monitor will be described.

FIG. 14 shows the hardware configuration of the surface inspection device 1a according to the second embodiment. In the present embodiment, the display unit 12 includes a display element 121 for displaying the inspection image _Pα , and an external monitor 122 for displaying the processed image (for example, a binary image).

For the external monitor 122, for example, an LCD monitor is used. The external monitor 122 displays, for example, an image represented by the image signal based on the image signal output from the CPU 15. The external monitor 122 may receive an image signal from the CPU 15 via, for example, an HDMI (registered trademark) cable, or may be used for short-range wireless communication such as Bluetooth (registered trademark) or Wi-Fi (registered trademark). Based on the standard, the image signal may be received from the CPU 15 by wireless communication.

(Other variants)
In the embodiments and modifications described above, a smartphone is assumed as the surface inspection devices 1, 1a. However, the surface inspection devices 1 and 1a are not limited to smartphones, and may be any device as long as it is a mobile terminal having a display function, a shooting function, and a function of processing and synthesizing an image. For example, mobile terminals such as notebook computers, tablet terminals, and wearable terminals can be used as devices that can replace smartphones. Further, a microcomputer including at least a CPU, RAM and ROM, a display element having a screen size of about 5 to 10 inches, and an image pickup element having a number of shooting pixels of, for example, 1 million pixels or more are assembled to have portability. You may make your own surface inspection apparatus 1,1a.

In addition, the surface inspection device 1, 1a having portability means a surface inspection device having any of the following configurations. That is, as the first configuration, it is assumed that each hardware unit is housed in a single housing 11. Further, as the second configuration, it is assumed that each hardware unit is driven by the storage battery 19. Further, as a third configuration, it is assumed that a means for wirelessly communicating with an external device, specifically, a wireless communication means based on a short-range wireless communication standard, a communication unit 18, and the like are provided. Finally, as a fourth configuration, it is assumed that the weight is easily carried by the user, for example, the weight is 3 kg or less.

Further, the inspection process for clarifying the defect Kd existing on the surface of the object K to be inspected is not limited to the inspection process according to the first embodiment. Any kind of processing and compositing may be used as long as the image processing can clearly recognize the defect Kd that is difficult to see with the naked eye.

Further, such image processing may be performed by an external arithmetic unit instead of the CPU 15. For example, the captured image P _β acquired by the photographing unit 13 may be transferred to a predetermined server, and the image processed by the server may be displayed on the display unit 12.

Further, the inspection image is not limited to the inspection image _Pα (FIG. 4) according to the first embodiment. For example, an inspection image described in Patent Document 1 in which the entire display area of the display unit is a bright area may be used, or an inspection image including two or more types of striped patterns having different periods may be used.

In the above-described embodiment and modification, an example in which the CPU 15 performs operations related to various functions, control of various hardware units, and the like by software has been described. However, those operations and controls may be performed by hardware, for example, by a dedicated logic circuit.

Although the present disclosure has been described above with reference to the embodiments and variations thereof, the present disclosure is not limited thereto. It will be obvious to those skilled in the art that various changes, improvements, combinations, etc. are possible.

1 Surface inspection device 11 Housing 111 Attachment 12 Display unit 121 Display element 122 External monitor 13 Imaging unit 131 Image sensor 132 Optical system 133 Inertia sensor 134 Movement mechanism 141 Operation button 141p Power button 141s Shutter button 142 Microphone 143 Speaker 15 CPU (calculation) Department)
151 Difference image generation means 152 First processed image generation means 153 Second processed image generation means 154 Binary image generation means 155 Image stabilization image generation means 16 RAM
17 ROM
171 Program 18 Communication unit 181 Communication module 182 Antenna 19 Storage battery

Claims (12)

A portable surface inspection device
A display unit that displays inspection images and
An imaging unit that acquires a plurality of captured images by photographing the surface of the object to be inspected on which the inspection image is projected, and a photographing unit.
A calculation unit that generates a processed image that clarifies defects existing on the surface of the object to be inspected based on the plurality of captured images.
A surface inspection device equipped with. The display unit includes a single display element for displaying the inspection image and the processed image.
The surface inspection apparatus according to claim 1. Further comprising a single housing for accommodating the display unit, the photographing unit and the arithmetic unit.
The surface inspection apparatus according to claim 1 or 2. Further provided with an attachment attached to the housing and fixing the relative position of the housing with respect to the object to be inspected.
The surface inspection apparatus according to claim 3. A storage battery for supplying electric power to the display unit, the photographing unit, and the arithmetic unit is further provided.
The surface inspection apparatus according to any one of claims 1 to 4. Further equipped with means for wireless communication with external devices,
The surface inspection apparatus according to any one of claims 1 to 5. The photographing unit
Image sensor and
An optical system that forms an optical image of a subject on the image sensor,
An inertial sensor that measures the vibration of the image sensor and the optical system,
A moving mechanism that moves the image sensor or the optical system based on the information about vibration measured by the inertial sensor.
The surface inspection apparatus according to any one of claims 1 to 6, comprising the above. The calculation unit generates the processed image based on an image obtained by subjecting each of the plurality of captured images to image stabilization.
The surface inspection apparatus according to any one of claims 1 to 7. The inspection image is a moving image in which the pattern moves in one direction.
The surface inspection apparatus according to any one of claims 1 to 8. The pattern is a striped pattern consisting of a light region and a dark region.
The surface inspection apparatus according to claim 9. A display element that displays inspection images and
An image sensor that acquires a plurality of captured images by photographing the surface of the object to be inspected on which the inspection image is projected, and
An image generation means for generating a processed image in which defects that may exist on the surface of the inspected object are clarified based on the plurality of captured images.
Equipped with
A mobile terminal in which the processed image is displayed on the display element. For computers of mobile terminals equipped with display elements and image sensors
The first display process for displaying the inspection image on the display element, and
An imaging process for acquiring a plurality of captured images by photographing the surface of the object to be inspected on which the inspection image is projected by the image sensor.
An image generation process for generating a processed image in which defects that may exist on the surface of the inspected object are clarified based on the plurality of captured images, and an image generation process.
A second display process for displaying the processed image on the display element, and
A program to execute.

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