JP2014021024A - Device and method for testing continuity of electrical circuit with coil - Google Patents

Abstract

PROBLEM TO BE SOLVED: To solve a problem that a conventional method of testing continuity by applying an electrical load to a circuit is hardly functional enough to maintain quality that stands practical use as continuity may be lost by physical shock that may be applied on a circuit after testing if connection between a coil and wiring is unstable.SOLUTION: A continuity test device for electrical circuits with coils includes: a first application unit which applies a static load by feeding DC current; a first measurement unit which measures a value of DC resistance obtained by the application of the static load; a first assessing unit which assesses continuity on the basis of a result of the measurement made by the first measurement unit; a second application unit which applies a dynamic load by feeding a pulse signal; a second measurement unit which measures a value(s) of current or/and voltage obtained by the application of the dynamic load; and a second assessing unit which assesses continuity on the basis of a result of the measurement made by the second measurement unit.

Description

  The present invention relates to a conduction state inspection device and a conduction state inspection method for an electric circuit including a coil used for a speaker or the like.

  Conventionally, as a method for inspecting the conduction state of an electric circuit including a coil typified by a speaker, an electric signal is applied to the circuit, and the resulting numerical value is recorded, and a result value and a predetermined reference value are recorded. There are known methods relating to techniques for comparing the above. Patent Document 1 discloses a technique related to an apparatus for inspecting a conduction state of a speaker circuit using the above method.

JP2003-274491

  However, the prior art merely inspects the conduction state by simply applying an electrical load to the circuit. Although this technique is effective as a method for determining the presence or absence of a circuit disconnection, it cannot be said that the circuit is disconnected, so to speak, it is not necessarily preferable as a method for determining the presence or absence of a semi-disconnection state. That is, if the conduction state is inspected when the connection between the coil and the wiring is unstable due to soldering or the like, it is determined that the result value does not exceed the reference value and is in a normal conduction state during the inspection. Even in this case, the coil and the wiring may be peeled off due to a physical impact after the inspection. In such a case, it cannot be said that the circuit is in a normal conduction state when the circuit is used, and the effectiveness of the inspection itself may be denied. Accordingly, there has been a demand for a sufficiently effective conduction state inspection method and a device for performing the inspection even in the unstable connection state.

  In order to solve the above-described problems, the present invention provides a first application unit that applies a static load by applying a DC current, and a first unit that measures a value of a DC resistance obtained by applying the static load. A measurement unit, a first determination unit that determines a conduction state from a measurement result obtained by the first measurement unit, a second application unit that applies a dynamic load by applying a pulse signal, and by applying the dynamic load A conduction state of an electric circuit including a coil having a second measurement unit for measuring a current or / and voltage value obtained and a second determination unit for judging a conduction state from a measurement result obtained by the second measurement unit Propose inspection equipment.

  With the present invention mainly configured as described above, it is possible to inspect an effective continuity state not only when the wire is completely disconnected but also when the connection between the coil and the wiring is unstable. become.

The figure which shows an example of the circuit of the continuity state inspection apparatus of the electric circuit containing the coil of Embodiment 1. The figure which shows an example of the functional block of the continuity state inspection apparatus of the electric circuit containing the coil of Embodiment 1. The figure which shows an example of the hardware constitutions of the continuity state inspection apparatus of the electric circuit containing the coil of Embodiment 1. The figure which shows an example of the flow of a process of the continuity state inspection apparatus of the electric circuit containing the coil of Embodiment 1. The figure which shows an example of the functional block of the continuity state inspection apparatus of the electric circuit containing the coil of Embodiment 2. The figure which shows an example of the flow of a process of the continuity state inspection apparatus of the electric circuit containing the coil of Embodiment 2. The figure which shows an example of the functional block of the continuity state inspection apparatus of the electric circuit containing the coil of Embodiment 3. The figure which shows an example of the flow of a process of the continuity state inspection apparatus of the electric circuit containing the coil of Embodiment 3. The figure which shows an example of the functional block of the continuity state inspection apparatus of the electric circuit containing the coil of Embodiment 4. The figure which shows an example of the functional block of the continuity state inspection apparatus of the electric circuit containing the coil of Embodiment 5. The figure which shows an example of the flow of a process of the continuity state inspection apparatus of the electric circuit containing the coil of Embodiment 5. The figure which shows an example of the functional block of the continuity state inspection apparatus of the electric circuit containing the coil of Embodiment 6. The figure which shows an example of the flow of a process of the continuity state inspection apparatus of the electric circuit containing the coil of Embodiment 6. The figure which shows another example of the flow of a process of the continuity state inspection apparatus of the electric circuit containing the coil of Embodiment 6.

Embodiments of the present invention will be described below with reference to the drawings. The mutual relationship between the embodiment and the claims is as follows. First, the first embodiment mainly corresponds to claim 1 and the like. The second embodiment mainly corresponds to claims 2 and 7. The third embodiment mainly corresponds to claims 3 and 8. The fourth embodiment mainly corresponds to claim 4 and the like. The fifth embodiment mainly corresponds to claim 5 and the like. The sixth embodiment mainly corresponds to claim 6 and the like. In addition, this invention is not limited to these embodiments at all, and can be implemented in various modes without departing from the scope of the invention.
<< Embodiment 1 >>
<Overview>

FIG. 1 is a diagram illustrating an example of a circuit of an electrical circuit continuity test apparatus including a coil according to the present embodiment. As shown in this figure, the “continuity state inspection device” 0100 of the present embodiment is connected to a “speaker” 0110 having an electric circuit including a “coil” 0111, and the electric circuit is first switched from a “constant current power source” 0103. Is applied with a direct current to give a static load. Then, the DC resistance obtained by applying the static load is detected by a “current / voltage detector” 0104, and the detected result is passed through an “A / D converter” 0102 in a “control circuit” 0101. Used for judgment. After that, the signal from the control circuit is received through the “D / A converter” 0105, and the pulse signal generated by the “pulse generator” 0106 is applied to the electric circuit including the coil while being amplified by the “power amplifier” 0107. Give load. Then, the current or / and voltage obtained by applying the dynamic load is detected by a current-voltage detector, the value of the detected result is measured, and the conduction state is determined by the control circuit through the A / D converter. Used for. Here, if it is determined that a good conductive state is maintained when a static load is applied, the circuit is determined to be maintained even if a dynamic load is applied. Even if a physical load such as vibration is applied in the process of physical distribution after the inspection, it is considered that it can sufficiently withstand practical use. In other words, by having a configuration in which not only a static load but also a dynamic load is added to inspect the conduction state, a circuit with a poor or unstable conduction state is incorporated into the product and supplied to the market as a defective product. It becomes possible to prevent this in advance.
<Functional configuration>

  FIG. 2 is a diagram illustrating an example of functional blocks of the electrical circuit continuity testing apparatus including the coil according to the present embodiment. As shown in this figure, the “continuity state inspection device” 0200 of the present embodiment includes a “first application unit” 0201, a “first measurement unit” 0202, a “first determination unit” 0203, and a “second determination unit”. It has an “applying unit” 0204, a “second measuring unit” 0205, and a “second determining unit” 0206. By adopting such a configuration, it is possible to apply a dynamic load in addition to a static load, and it is possible to execute a more effective conductive state inspection.

  Note that the functional blocks of the apparatus described below can be realized as hardware, software, or both hardware and software. Specifically, if a computer is used, a CPU, a main memory, a bus, or a secondary storage device (a hard disk, a non-volatile memory, a storage medium such as a CD or a DVD, and a read drive for the medium), Hardware components such as input devices used for information input, printers and display devices, pulse generators, current / voltage detectors, and other external peripherals, and interfaces for external peripherals, communication interfaces, and hardware Driver programs for controlling the wear and other application programs. Then, by the arithmetic processing of the CPU in accordance with the program developed on the main memory, the data input from the input device or other interface etc. and held in the memory or hardware is processed and accumulated, or each of the hardware And commands for controlling the software are generated. Here, the program may be realized as a plurality of modularized programs, or may be realized as a single program by combining two or more programs.

  Further, the present invention can be realized not only as an apparatus but also as a method. Furthermore, a part of such an apparatus can be configured as software. Naturally, a recording medium in which such software is recorded is also included in the technical scope of the present invention (the same applies throughout the present specification, not limited to the present embodiment).

  The “first application unit” has a function of applying a static load by applying a direct current. Here, “giving a static load by applying a DC current” specifically means applying a current from a current power source to a coil that leads to an electric circuit. This is a concept used as a relative expression with “dynamic load” described later.

  In the first place, the purpose of applying a static load is to inspect whether the electric circuit including the coil is disconnected by applying a direct current, so dare to apply a large amount of current, There is no need to change it. Therefore, it is sufficient if the direct current applied here is very small. For example, about 1 mA can be assumed as the direct current to be applied. And the time which gives a static load should just be a grade sufficient to determine a conduction | electrical_connection state.

  The “first measurement unit” has a function of measuring the value of DC resistance obtained by applying the static load. As described above, the time for applying the static load may be short, and in the case of a normal electric circuit, for example, if the load is applied for about 0.1 to 0.2 seconds, the value of the DC resistance can be measured sufficiently. is there.

  The “first determination unit” has a function of determining the conduction state from the measurement result obtained by the first measurement unit. Specifically, a DC resistance value indicating a normal conduction state is held as a reference value in advance, and a difference is calculated by dividing the value measured by the first measurement unit from the reference value. For example, when the difference value is on the negative side, that is, when the measured value exceeds the reference value, it is determined that the normal conduction state is not established, and the difference value is positive, that is, the measured value is lower than the reference value. A configuration may be considered in which is determined to be in a normal conduction state. In addition, an upper and lower limit threshold value that can be allowed as a difference value is provided in advance, and a normal conduction state may be determined if the actually calculated difference value does not exceed the upper and lower limit threshold value. Here, the “upper and lower limit threshold values allowable as the difference value” may be indicated by specific numerical values, or may be indicated by a specific ratio such as “within 20% before or after the reference value”. And, in order to be able to inspect the conduction state of a plurality of electric circuits used in various environments, it is desirable that the value of the reference value can be changed as appropriate (standard used for other processing). The same applies to the value). In this way, by adopting a configuration in which upper and lower thresholds are provided instead of a specific value as a difference value, even if the resistance value is such that it does not hinder practical use by performing an excessively strict inspection, It is possible to avoid making a determination contrary to economic efficiency, such as determining that

  Note that the determination result shown in either the first determination unit or the second determination unit to be described later may be configured to be presented in a state that can be recognized by the user by display on the display device or voice by a speaker. Specifically, for example, in the case of a determination result of a normal conduction state, it may be possible to display contents indicating that the conduction state is normal, such as “OK”, If the result of the determination is “NG” or “ERROR”, it means that the content indicating that the conduction state is abnormal is displayed or a warning sound is generated. By taking this configuration, the user can more easily feel the determination result with the five senses.

  The “second application unit” has a function of applying a dynamic load by applying a pulse signal. Here, “giving a dynamic load by applying a pulse signal” simply means that the coil is mechanically vibrated by applying a predetermined current or / and voltage to the coil. As already explained, the purpose of adding not only a static load but also a dynamic load is to receive a product such as a speaker using a circuit prior to shipment, such as when the coil and wiring are incompletely in contact. This is because it is necessary to inspect that the conductive state can withstand vibration. Therefore, the pulse signal applied by the second application unit needs to give a load sufficient to achieve the object, and at least a load larger than the direct current applied by the first application unit is required. It needs to be enough to give. Specifically, it can be considered that the pulse period is set to about 0.1 mS to 40 mS, and the pulse voltage can be selected from about 0.1 Vp-p to about 40 Vp-p.

  The “second measuring unit” has a function of measuring a current or / and voltage value obtained by applying the dynamic load. As described above, the dynamic load is different from the static load and is intended to apply a physical load to the circuit or wiring. Therefore, the load application time is sufficient to achieve the purpose. It is necessary that the time for which the measurement is continued can be appropriately changed, for example, between about 0.1 seconds and 10 seconds.

  Note that the timing of measuring the current or / and voltage value is closely related to the timing of applying the pulse signal. That is, since the impedance generated by the application of the pulse signal varies greatly during the application, in order to stably measure each of the above values, it is desirable to start the measurement as soon as possible after the application. Therefore, for example, it is desirable to start measurement at about 50 μS after the start of pulse signal application.

  The “second determination unit” has a function of determining the conduction state from the measurement result obtained by the second measurement unit. Specifically, a current or / and voltage value indicating a normal conduction state is previously held as a reference value, and a difference between the reference value and a value measured by the first measurement unit is determined. For example, when the difference value is negative, that is, when the measured value exceeds the reference value, it is determined that the normal conduction state is not established, and the difference value is positive, that is, the measured value is lower than the reference value. In such a case, a configuration in which it is determined that the battery is in a normal conduction state can be considered. In addition, an upper and lower limit threshold value that can be allowed as a difference value is provided in advance, and a normal conduction state may be determined if the actually calculated difference value does not exceed the upper and lower limit threshold value. Here, the “upper and lower limit threshold values allowable as the difference value” may be indicated by specific numerical values, or may be indicated by a specific ratio such as “within 20% before or after the reference value”. In this way, by adopting a configuration in which upper and lower thresholds are provided instead of a specific value as a difference value, even if the resistance value is such that it does not hinder practical use by performing an excessively strict inspection, It is possible to avoid making a determination contrary to economic efficiency in distributing the circuit to the market, for example.

In addition, when it is set as the structure which compares the measured value of an electric current and a voltage, for example, even if it is whichever of the said two measured values, if the difference value with a reference value exceeds the said upper and lower limit threshold value, it will be in a conduction | electrical_connection state. May be configured to be determined to be abnormal, or may be configured to determine that the conduction state is normal as long as the difference value from the reference value indicated by both of the two measured values does not exceed the upper and lower thresholds. It may be taken. By adopting the configuration in which various measurement values can be combined and inspected, it becomes possible to perform inspections corresponding to various levels required by the user.
<Specific configuration>

  FIG. 3 is a schematic diagram illustrating an example of a configuration when each functional configuration of the continuity test apparatus is realized as hardware. Specifically, the configuration in the case where the function of the control circuit is replaced with a computer is shown in the configuration of the electrical circuit continuity test apparatus including the coil described above with reference to FIG. The operation of each hardware component will be described with reference to this figure.

As shown in this figure, the continuity test apparatus includes “CPU” 0301, “storage device (storage medium)” 0302, “main memory” 0303, and “input / output interface” for executing various arithmetic processes. For example, “display device” 0305, “printing device (printer)” 0306, “measuring device” 0307, “pulse generator” 0308, “current voltage detector” 0309, etc. Send and receive information. Various programs are stored in the storage device, and the CPU executes the various programs on the main memory. These components are connected to each other via a data communication path such as “system bus” 0310, and perform transmission / reception and processing of information. Note that the first control program, the second control program, and the third program shown in the figure will not be described in this embodiment, and will be appropriately described in the portions corresponding to the embodiments corresponding to each program. And
(Specific processing of the first application unit)

The CPU executes the first application program and performs a process for applying a current from the current power supply to the electric circuit through the coil.
(Specific processing of the first measurement unit)

The CPU executes the first measurement program, performs a process for acquiring a DC resistance value obtained by executing the first application program, and stores the information at a predetermined address in the main memory.
(Specific processing of the first determination unit)

The CPU reads DC resistance value information previously held as a reference value and DC resistance measurement value information obtained by executing the first measurement program, executes a first determination program, and executes the first determination program. A process of comparing the value and determining the conduction state is performed, and the result is stored in a predetermined address of the main memory.
(Specific processing of the second application unit)

The CPU executes the second application program and performs processing for applying the pulse signal amplified from the pulse generator through the power amplifier to the electric circuit through the coil.
(Specific processing of the second measuring unit)

The CPU executes the second measurement program, acquires the current value and / or voltage value obtained by executing the second application program, and stores each information at a predetermined address in the main memory.
(Specific processing of the second determination unit)

The CPU reads the current value and / or voltage value information held in advance as a reference and the current or / and voltage measurement value information obtained by executing the second measurement program, and executes the second determination program. Then, the process of comparing each measured value and the reference value to determine the conduction state is performed, and the result is stored in a predetermined address of the main memory.
<Process flow>

  FIG. 4 is a diagram illustrating an example of a processing flow of the conduction state inspection apparatus according to the present embodiment. The flow of processing in the figure consists of the following steps. First, in step S0401, a static load is applied to the electric circuit including the coil. Next, in step S0402, the DC resistance value obtained by applying the static load is measured. Next, in step S0403, the DC resistance value obtained by the measurement is compared with a reference value held in advance to determine the conduction state of the electric circuit including the coil. In step S0411, a dynamic load is applied to the electric circuit including the coil. Next, in step S0412, the current value and / or voltage value obtained by applying the dynamic load is measured. In step S0413, each value obtained by the measurement is compared with each reference value held in advance to determine the conduction state of the electric circuit including the coil.

Here, the processing from step S0401 to step S0403 and the processing from step S0411 to step S0413 are each independent as one processing block. The processing of step S0401 is first performed, and after the processing of step S0403 Alternatively, the process may proceed to step S0411, or the process of step S0411 may be performed first, and the process of step S0401 may be performed after the process of step S0413. Further, when the process is started from step S0401, the process of step S0403 may be performed before and after step S0413, and when the process is started from step S0411, the process of step S0413 may be performed before and after step S0403.
<Effect>

With the conduction state inspecting apparatus having the above-described configuration, it is possible to prevent in advance that an electric circuit whose conduction state is unstable is commercialized and is not on the market as a defective product.
<< Embodiment 2 >>

The conduction state inspecting apparatus according to the present embodiment is basically the same as the conduction state inspecting apparatus according to the first embodiment, except that the order of applying the loads is first so that the static load is given first and then the dynamic load is given. The application unit and the second application unit are controlled. By adopting this configuration, which is characterized by controlling the order in which loads are applied, it is possible to determine whether or not it is in a conductive state at a level required for distribution in the market based on the actual situation.
<Functional configuration>

  FIG. 5 is a diagram illustrating an example of functional blocks of the conduction state inspection apparatus according to the present embodiment. As shown in this figure, the “continuity state inspection device” 0500 of the present embodiment includes a “first application unit” 0501, a “first measurement unit” 0502, a “first determination unit” 0503, and a “second determination unit”. It has an “applying unit” 0504, a “second measuring unit” 0505, a “second determining unit” 0506, a “first control unit” 0507, and a “first control unit” 0508. Since the basic configuration is the same as that of the conduction state inspection apparatus described with reference to FIG. 2 of the first embodiment, the first control unit, which is a difference, will be described below.

  The “first control unit” has a function of controlling the first application unit and the second application unit so that the load is applied in the order of the static load and then the dynamic load. The reason for adopting this configuration is due to the difference between the purpose of giving a static load and the purpose of giving a dynamic load as described later. In other words, the purpose of applying a dynamic load is to check whether the circuit can withstand vibrations and shocks applied during transportation. That is, as long as vibration and impact during transportation are a problem, it is assumed that a case where a dynamic load is applied is in a conductive state that is worthy of being transported as a product in the first place. For this reason, it is desirable that the timing for applying the dynamic load be in a state where it can be understood that the conduction state is the minimum level that is already worth transporting by applying the static load.

  The first control unit may control only the order in which the loads are applied. That is, based on the above meaning, the timing of measuring the value of DC resistance, the current or / and the voltage obtained by the action of each application unit, and the timing of determining the conduction state based on each measured value are also included. There is no particular meaning to control, and these timings can be set as appropriate.

In addition, in the 2nd determination part, it may take the structure which determines, after limiting the value of the said reference value using the measurement result in a 1st measurement part, for example. Specifically, the current or / and voltage values that can be determined to be in a suitable conduction state according to the magnitude of the measurement value in the first measurement unit are stored in advance as a table, and actually in the first measurement unit A configuration is possible in which the current or / and voltage values to be used in the table are set as reference values in accordance with the measured values. By adopting this configuration, it is possible to determine the conduction state based on a more specific and detailed analysis.
<Specific configuration>

The hardware configuration of the continuity state inspection apparatus of this embodiment is basically the same as the hardware configuration of the continuity state inspection apparatus of Embodiment 1 described with reference to FIG. Therefore, specific processing of the first control unit that has not been described so far will be described below.
(Specific processing of the second control unit)

The CPU executes a first control program and performs a process of controlling each application program so as to execute the second application program after executing the first application program.
<Process flow>

FIG. 6 is a diagram illustrating an example of a processing flow of the conduction state inspection apparatus according to the present embodiment. The flow of processing in the figure includes the following steps. First, in step S0601, a static load is applied to an electric circuit including a coil. Next, in step S0602, the DC resistance value obtained by applying the static load is measured. In step S0603, the DC resistance value obtained by the measurement is compared with a reference value held in advance to determine the conduction state of the electric circuit including the coil. Thereafter, in step S0604, a dynamic load is applied to the electric circuit including the coil, and in step S0605, a current or / and voltage value obtained by applying the dynamic load is measured. In step S0606, each value of the current or / and voltage obtained by the measurement is compared with each reference value held in advance to determine the conduction state of the electric circuit including the coil.
<Effect>

By using the conduction state inspection device of the present embodiment, in addition to the effects of the first embodiment, it is possible to determine whether or not it is a conduction state at a level required when distributing to the market in accordance with the actual situation. become.
<< Embodiment 3 >>

The conduction state inspecting apparatus according to the present embodiment is basically the same as the conduction state inspecting apparatus according to the second embodiment. However, the load is applied in the order of static load first, then dynamic load, and finally again. The first application unit and the second application unit are controlled so as to apply a static load. By having this configuration as a feature, after applying a dynamic load, the connection state of the electric circuit including the coil can be confirmed anew, and an effective conduction state inspection in accordance with the actual use of the electric circuit including the coil can be performed. It becomes possible.
<Functional configuration>

  FIG. 7 is a diagram illustrating an example of functional blocks of the conduction state inspection apparatus according to the present embodiment. As shown in this figure, the “continuity state inspection device” 0700 of this embodiment includes a “first application unit” 0701, a “first measurement unit” 0702, a “first determination unit” 0703, and a “second determination unit”. It has an “applying unit” 0704, a “second measuring unit” 0705, a “second determining unit” 0706, and a “second control unit” 0707. Since the basic configuration is the same as that of the conduction state inspection apparatus described with reference to FIG. 5 of the second embodiment, the second control unit, which is a difference, will be described below.

  The “second control unit” controls the first application unit and the second application unit so that the load is applied to the static load first, then the dynamic load is applied, and then the static load is applied. It has a function. As described above, the significance of controlling the load application order as described above is to reproduce the load received when the electric circuit including the coil actually circulates. All that is required is the order in which the loads are applied. That is, based on the above meaning, the timing of measuring the value of DC resistance, the current or / and the voltage obtained by the action of each application unit, and the timing of determining the conduction state based on each measured value are also included. There is no particular meaning to control, and these timings can be set as appropriate.

In the present embodiment, as a method for determining the conduction state, three determination results, that is, a determination result in the first determination unit for the first time, a determination result in the second determination unit, and a determination result in the first determination unit for the second time are used. Will be used. In this case, the final conduction state may be determined by comparing with the reference values having the above three determination results, respectively, and the determination result in the first determination unit for the first time and the first determination unit for the second time. The determination results may be compared with each other, and if the error of the value is within a predetermined range, it may be determined that the device is in the conductive state.
<Specific configuration>

The hardware configuration of the continuity state inspection apparatus of this embodiment is basically the same as the hardware configuration of the continuity state inspection apparatus of Embodiment 1 described with reference to FIG. Therefore, specific processing of the second control unit that has not been described so far will be described below.
(Specific processing of the second control unit)

The CPU executes the second control program, executes the second application program after the execution of the first application program, and then performs processing for controlling the execution order of each program so as to execute the first application program again.
<Process flow>

  FIG. 8 is a diagram illustrating an example of a process flow of the conduction state inspection apparatus according to the present embodiment. The flow of processing in the figure consists of the following steps. First, in step S0801, a static load is applied to the electric circuit including the coil. Next, in step S0802, the DC resistance value obtained by applying the static load is measured. In step S0803, the DC resistance value obtained by the measurement is compared with a reference value held in advance to determine the conduction state of the electric circuit including the coil. Thereafter, in step S0804, a dynamic load is applied to the electric circuit including the coil, and in step S0805, the value of the current or / and voltage obtained by the application of the dynamic load is measured. In step S0806, each value of the current or / and voltage obtained by the measurement is compared with each reference value held in advance to determine the conduction state of the electric circuit including the coil. Thereafter, in step S0807, a static load is applied again, and in step S0808, the direct current resistance value obtained by applying the static load is measured. In step S0809, the measured value is compared with the reference value to determine the coil. The conduction state of the electric circuit including it is determined.

Here, as described above, in the present embodiment, the timing of the static load and the dynamic load, that is, steps S0801, S0804, and S0807 are processed in this order. The order of other steps is not controlled. Therefore, for example, the process of step S0804 is the second, the process of step S0807 is the third, and the fourth and subsequent processes are steps of measuring each value obtained as a result of the application, step S0802, step S0805, and step S0808. After that, step S0803, step S0806, and step S0809, which are determination steps, may be performed.
<Effect>

With the conduction state inspection device of this embodiment, after applying a dynamic load, the connection state of the electric circuit including the coil can be confirmed again, and the effective conduction state inspection in accordance with the actual use situation of the electric circuit including the coil Is possible.
<< Embodiment 4 >>

The continuity state inspection apparatus of this embodiment is basically the same as the continuity state inspection apparatus of Embodiment 1, but is characterized in that a dynamic load is applied by a signal composed of a plurality of signals having different duty ratios. . By having this feature, it is possible to obtain a test result of the conduction state in accordance with the actual usage of the electric circuit having the coil.
<Functional configuration>

  FIG. 9 is a diagram illustrating an example of functional blocks of the conduction state inspection apparatus according to the present embodiment. As shown in this figure, the “continuity state inspection device” 0900 of the present embodiment includes a “first application unit” 0901, a “first measurement unit” 0902, a “first determination unit” 0903, and a “second determination unit”. It has an “applying unit” 0904, a “second measuring unit” 0905, and a “second determining unit” 0906, and the second applying unit further has an “indefinite application unit” 0907. Since the basic configuration is the same as that of the continuity state inspection apparatus described with reference to FIG. 2 of the first embodiment, the indefinite application means which is a difference will be described below.

  The “indefinite application means” has a function of applying a dynamic load by a signal composed of a plurality of signals having different duty ratios. Here, “a signal composed of a plurality of signals having different duty ratios” specifically includes a combination of a plurality of signals having different pulse widths for a pulse signal applied to an electric circuit including a coil. It means that. Applying pulse signals with different pulse widths at a fixed period means that a dynamic load is applied to an electric circuit including a coil to which the pulse signal is applied while the pulse signals repeat On / Off states at an indefinite period. Means. As explained above, the fundamental purpose of applying a dynamic load to an electric circuit including a coil is to withstand vibrations and shocks that are received when a product including the circuit is shipped and transported after inspection. The point is to check whether or not sufficient connection is made between the wiring and the coil. The content of the dynamic load required for such purposes is preferably as similar as possible to the above-mentioned shipping / transportation, that is, to reflect actual vibration and impact at these times. . And, it is difficult to think of the impact at the time of product shipping / transportation that can be usually considered at almost a constant timing, and usually it occurs at various different timings. Therefore, like the indefinite application means of this embodiment, By adopting a configuration in which a dynamic load is applied at different timings, it is possible to inspect a conduction state that reflects a more normal state of product shipment / transport.

Note that the method of combining signals having different duty ratios may be arbitrarily set. For example, it is conceivable that the duty ratio is set to about 1: 3 and 3: 1.
<Specific configuration>

The hardware configuration of the continuity state inspection apparatus of this embodiment is basically the same as the hardware configuration of the continuity state inspection apparatus of Embodiment 1 described with reference to FIG. Therefore, in the following, a specific process of the indeterminate application unit that has not been described so far will be described.
(Specific processing of indefinite application means)

The CPU executes an indefinite application program, performs a process of generating a signal composed of a plurality of signals having different duty ratios, and performs a process of outputting the generated signal.
<Process flow>

The processing flow of the continuity test apparatus according to the present embodiment is the same as the processing flow described above with reference to FIGS. 4, 6, and 8.
<Effect>

In addition to the effects of the first embodiment, the conduction state inspection device according to the present embodiment can obtain the inspection result of the conduction state in accordance with the actual usage of the electric circuit having the coil.
<< Embodiment 5 >>

The continuity state inspection apparatus of this embodiment is basically the same as the continuity state inspection apparatus of Embodiment 1, but indicates that the determination result by the first determination unit or the second determination unit is semi-conductive or non-conductive. In such a case, control is performed such that subsequent measurement processing and determination processing are not performed. By having this feature, it is possible not only to improve the efficiency of the inspection, but also to promptly provide the user with a determination result indicating that it is semi-conductive or non-conductive.
<Functional configuration>

  FIG. 10 is a diagram illustrating an example of functional blocks of the conduction state inspection apparatus according to the present embodiment. As shown in this figure, the “continuity state inspection apparatus” 1000 of the present embodiment includes a “first application unit” 1001, a “first measurement unit” 1002, a “first determination unit” 1003, and a “second determination unit”. It has an “applying unit” 1004, a “second measuring unit” 1005, a “second determining unit” 1006, and a “third control unit” 1007. Since the basic configuration is the same as that of the conduction state inspection apparatus described with reference to FIG. 2 of the first embodiment, the third control unit, which is a difference, will be described below.

“Third control unit” has a function of performing control so that subsequent measurement processing and determination processing are not performed when the determination result by the first determination unit or the second determination unit indicates semi-conduction or non-conduction. Have. As explained so far, both the first control unit and the second control unit have performed the function of controlling the function of the application unit, but in the case of the third control unit, not only the application process but also the measurement. There is a function of performing control so that neither processing nor determination processing is performed. Therefore, when the conduction state inspection device having the functional configuration including the first control unit and the second control unit further includes the third control unit, the third control unit has priority over the first control unit or the second control unit. Thus, the above control is performed. That is, for example, in the case of the second embodiment, when the determination result that the non-conducting state is derived in the first determination unit, the first control unit does not perform the control, and in the case of the third embodiment, the first control unit does not perform the control. When the determination result that the two determination units are in the non-conduction state is derived, the second control unit does not perform control. Once the determination of semi-conduction or non-conduction is made, it is possible to determine that the electric circuit including the coil subjected to such determination at that time is a so-called defective product, and therefore, it is not necessary to perform subsequent processing. By adopting a configuration having the third control unit, it is possible to omit such a needless process and promptly notify the user of the determination result.
<Specific configuration>

The hardware configuration of the continuity state inspection apparatus of this embodiment is basically the same as the hardware configuration of the continuity state inspection apparatus of Embodiment 1 described with reference to FIG. Therefore, specific processing of the third control unit that has not been described so far will be described below.
(Specific processing of the third control unit)

The CPU executes the third control program, and when the information obtained by executing the first determination program or the second determination program is a content indicating that the conduction state is semi-conduction or non-conduction, A process of controlling not to perform the application process, the measurement process, and the determination process is performed.
<Process flow>

FIG. 11 is a diagram illustrating another example of the processing flow of the conduction state inspection apparatus according to the present embodiment. The flow of processing in the figure consists of the following steps. First, in step S1101, a static load is applied to an electric circuit including a coil. In step S1102, the resistance value obtained by applying the static load is measured. In step S1103, the DC resistance value obtained by the measurement is compared with a reference value held in advance to determine the conduction state of the electric circuit including the coil. In step S1104, it is determined whether or not the determination content is a content indicating semi-conduction or non-conduction. If the determination content indicates the information, the process is terminated as it is. If the determination content is not the determination content, step S1105 is determined. Migrate to In step S1105, a dynamic load is applied to the electric circuit including the coil, and the process proceeds to step S1106. In step S1106, the current value and / or voltage value obtained by applying the dynamic load is measured. Next, in step S1107, the DC resistance value obtained by the measurement is compared with a reference value held in advance to determine the conduction state of the electric circuit including the coil. In step S1108, it is determined whether or not the determination content is a content indicating semi-conduction or non-conduction. If the determination content indicates the information, the process is terminated. If the determination content is not the determination content, step S1109 is performed. Migrate to In steps S1109 to S1111, the same processing as in steps S1101 to S1103 is executed.
<Effect>

By using the conduction state inspection apparatus of the present embodiment, in addition to the effects of the first embodiment, it is possible not only to improve the efficiency of the inspection, but also to determine the determination result that the device is semi-conductive or non-conductive. Can be provided quickly.
<< Embodiment 6 >>

The continuity state inspection apparatus of this embodiment is basically the same as the continuity state inspection apparatus of Embodiment 1, but the first determination unit and the second determination unit are load responses and measurement results of an electric circuit including a normal coil. To determine the continuity state. By using the inspection method having this feature, it is possible to distribute only an electric circuit in a conductive state at a level that the electric circuit including the coil should originally have.
<Functional configuration>

  FIG. 12 is a diagram illustrating an example of functional blocks of the conduction state inspection apparatus according to the present embodiment. As shown in this figure, the “continuity state inspection device” 1200 according to the present embodiment includes a “first application unit” 1201, a “first measurement unit” 1202, a “first determination unit” 1203, and a “second determination unit”. It has an “applying unit” 1204, a “second measuring unit” 1205, and a “second determining unit” 1206, and both the first determining unit and the second determining unit have a “comparison determining unit” 1207. Since the basic configuration is the same as that of the conduction state inspection apparatus described with reference to FIG.

  The “comparison / determination unit” has a function of determining a conduction state by comparing a load response of an electric circuit including a normal coil with a measurement result. The “electric circuit including a normal coil” refers to an electric circuit including a coil that is in a conductive state sufficient to operate normally. Specifically, “load response of an electric circuit including a normal coil” specifically refers to each value obtained by a static load and a dynamic load applied to the electric circuit including a coil that is in a conductive state sufficient to operate normally. It means the measurement result of the conduction state represented by. The comparison / determination means holds the result of the load response in advance for use as a comparison target at the time of inspection. By using the load response in the electric circuit in which the conduction state is guaranteed as a comparison target of the measurement result, it is possible to ensure the appropriateness of the conduction state inspection result.

“Compare load response with measurement result” specifically means that the load response result is held as a reference value, and then the reference value is compared with each value as the measurement result. Yes. As described above, as described above, when it is determined that the measured value exceeds the reference value, it may be determined to be in a non-conductive state, but the reference value is slightly exceeded or the reference value is slightly less than the reference value. It is rather economical efficiency to determine a circuit that is only semi-conductive or non-conductive, and it can be said that it is inappropriate as a test used for product inspection before shipment. It is desirable to adopt a method of adopting a configuration in which a certain range before and after the reference value is set as a threshold value, and the measured value is a value within the range of the upper and lower limit threshold values, the state is determined to be conductive.
<Specific configuration>

The hardware configuration of the continuity state inspection apparatus of this embodiment is basically the same as the hardware configuration of the continuity state inspection apparatus of Embodiment 1 described with reference to FIG. Therefore, in the following, specific processing of the comparison determination means that has not been described so far will be described.
(Specific processing of the comparison judgment means)

The CPU executes the comparison determination program, reads information on the value resulting from the load response of the electric circuit including the normal coil held in advance, and executes the information and the first measurement program or / and the second measurement program. The information of the obtained value is compared, a process for determining the conduction state is performed, and the result is stored in a predetermined address of the main memory.
<Process flow>

  FIG. 13 is a diagram illustrating an example of a processing flow of the conduction state inspection apparatus according to the present embodiment. The flow of processing in the figure consists of the following steps. First, in step S1301, a static load is applied to an electric circuit including a coil. In step S1302, the resistance value obtained by applying the static load is measured. In step S1303, it is determined whether the difference between the resistance value obtained by the measurement and the reference value held in advance is within the upper and lower threshold values. If it is a determination result that it is within, the process proceeds to step S1304, and if it is not, the process proceeds to step S1311. In step S1304, a dynamic load is applied to the electric circuit including the coil, and the process proceeds to step S1305. In step S1305, the current value and / or voltage value obtained by applying the dynamic load is measured. Next, in step S1306, it is determined whether the difference between the value obtained by the measurement and the reference value held in advance is within the upper and lower threshold values. If it is a determination result that it is within, the process proceeds to step S1307, and if it is not, the process proceeds to step S1308. In step S1307, it is determined that the circuit is in a conducting state, and in step S1308, it is determined that the circuit is in a non-conducting state, and the processing ends.

In addition, FIG. 14 is a figure which shows another example of the flow of a process of the conduction | electrical_connection state inspection apparatus of this embodiment. The flow of processing in the figure consists of the following steps. First, in step S1401, a static load is applied to an electric circuit including a coil. In step S1402, a resistance value obtained by applying the static load is measured. In step S1403, it is determined whether the difference between the resistance value obtained by the measurement and the reference value held in advance is within the upper and lower threshold values. If it is a determination result that it is within, the process proceeds to step S1404, and if it is not, the process proceeds to step S1411. In step S1404, a dynamic load is applied to the electric circuit including the coil, and the process proceeds to step S1405. In step S1405, the current value and / or voltage value obtained by applying the dynamic load is measured. In step S1406, it is determined whether the difference between the value obtained by the measurement and the reference value held in advance is within the range of the upper and lower threshold values. If it is a determination result that it is within, the process proceeds to step S1407, and if it is not, the process proceeds to step S1411. In steps S1407 to S1409, processing similar to that in steps S1401 to S1403 is performed, and it is determined that the difference between the resistance value and the reference value held in advance is within the upper and lower threshold values. Advances to step S1410, and if not, the process advances to step S1411. In step S1410, it is determined that the circuit is in a conductive state, and in step S1411, it is determined that the circuit is in a nonconductive state, and the process ends.
<Effect>

  By using the conduction state inspecting apparatus of the present embodiment, in addition to the effects of the first embodiment, it is possible to distribute only an electric circuit that is in a conduction state of a level that the electric circuit including the coil should have in the market. .

DESCRIPTION OF SYMBOLS 0100 ... Conduction state inspection apparatus 0101 ... Control circuit 0102 ... A / D converter 0103 ... Current power supply 0104 ... Current voltage detector 0105 ... D / A converter 0106 ... Pulse generator 0107 ... Power amplifier 0110 ... Speaker 0111 ... Coil

Claims (8)

An electrical circuit continuity testing device including a coil,
A first application unit for applying a static load by applying a direct current;
A first measuring unit for measuring a value of DC resistance obtained by applying the static load;
A first determination unit for determining a conduction state from a measurement result obtained by the first measurement unit;
A second application unit for applying a dynamic load by applying a pulse signal;
A second measuring unit for measuring a current or / and voltage value obtained by applying the dynamic load;
A second determination unit for determining a conduction state from a measurement result obtained by the second measurement unit;
An electrical circuit continuity testing apparatus including a coil having a coil. 2. The electric circuit including a coil according to claim 1, further comprising a first control unit that controls the first application unit and the second application unit so that the load is applied in a static load first and then a dynamic load. Continuity test equipment.   The order in which the loads are applied is such that the first control unit controls the first application unit and the second application unit so that the static load is applied first, then the dynamic load is applied, and finally the static load is applied again. The continuity state inspection device for an electric circuit including a coil according to claim 2, instead of the control unit or with the first control unit. The second application unit is
The continuity state inspection device for an electric circuit including a coil according to any one of claims 1 to 3, further comprising indefinite application means for applying a dynamic load by a signal composed of a plurality of signals having different duty ratios.   When the determination result by the first determination unit or the second determination unit indicates that it is semi-conductive or non-conductive, it has a third control unit that controls not to perform the subsequent measurement process and determination process. An electrical circuit continuity test apparatus including the coil according to any one of 4.   The coil according to any one of claims 1 to 5, wherein the first determination unit and the second determination unit determine a conduction state by comparing a load response of an electric circuit including a normal coil and a measurement result. Including electrical circuit continuity testing device. A first application step of applying a static load by applying a direct current to an electric circuit including a coil;
A first measurement step of measuring a value of DC resistance obtained by applying the static load;
A first determination step for determining a conduction state from a measurement result obtained in the first measurement step;
A second application step of applying a dynamic load by applying a pulse signal to the electric circuit including the coil after the first application step;
A second measuring step of measuring a current or / and voltage value obtained by applying the dynamic load;
A second determination step of determining the conduction state from the measurement result obtained in the second measurement step;
A method for inspecting the continuity of an electric circuit including a coil comprising A third application step for applying a static load by applying a direct current to the electric circuit including the coil after the second application step;
A third measuring step for measuring a direct current resistance value obtained by applying a static load in the third applying step;
A third determination step for determining the conduction state from the measurement result obtained in the third measurement step;
The continuity state inspection method for an electric circuit including the coil according to claim 7.

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