JP2009276665A - Method for manufacturing patterned retardation film - Google Patents

Method for manufacturing patterned retardation film Download PDF

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JP2009276665A
JP2009276665A JP2008129472A JP2008129472A JP2009276665A JP 2009276665 A JP2009276665 A JP 2009276665A JP 2008129472 A JP2008129472 A JP 2008129472A JP 2008129472 A JP2008129472 A JP 2008129472A JP 2009276665 A JP2009276665 A JP 2009276665A
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liquid crystal
crystal composition
polymerizable liquid
retardation film
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JP5211845B2 (en
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Hiroshi Hasebe
浩史 長谷部
Osamu Yamazaki
修 山崎
Kiyofumi Takeuchi
清文 竹内
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DIC Corp
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Dainippon Ink and Chemicals Co Ltd
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Abstract

<P>PROBLEM TO BE SOLVED: To provide a method for manufacturing a patterned retardation film having a large sidewall angle. <P>SOLUTION: In the method for manufacturing the patterned retardation film, including a first step of carrying a polymerizable liquid crystal composition on a substrate to form a polymerizable liquid crystal composition layer, a second step of curing an exposure part by irradiating the polymerizable liquid crystal composition layer with an active energy ray via a mask and a third step of removing an uncured part, a value calculated from a distance d (μm) between the mask and the polymerizable liquid crystal composition layer and a parallel degree θ (°) of the active energy ray by using formula (1): d×tan(θ) is 5.3 or below, and a value obtained by dividing a concentration (ppm) of a polymerization inhibitor contained in the polymerizable liquid crystal composition layer by a concentration (mass%) of a polymerization initiator contained in the polymerizable liquid crystal composition layer is in the range of 333 to 3,750. <P>COPYRIGHT: (C)2010,JPO&INPIT

Description

本願発明は、液晶ディスプレイ等の光学補償に使用される重合性液晶組成物を用いたパターン化位相差フィルムの製造方法に関する。   The present invention relates to a method for producing a patterned retardation film using a polymerizable liquid crystal composition used for optical compensation of a liquid crystal display or the like.

半透過型液晶ディスプレイの性能向上に有用な技術として、パターン化位相差フィルムの利用が提案されている(非特許文献1〜3、特許文献1〜2)。これは、一画素を透過領域と反射領域に分け、一方の領域にのみ位相差フィルムを設けるもので、20〜100μm程度の幅で位相差フィルムの有り無しがパターン化された位相差フィルムを使用するものである。   As a technique useful for improving the performance of a transflective liquid crystal display, use of a patterned retardation film has been proposed (Non-Patent Documents 1 to 3, Patent Documents 1 and 2). This is because one pixel is divided into a transmission area and a reflection area, and a retardation film is provided only in one area. A retardation film with a width of about 20 to 100 μm and patterned with or without a retardation film is used. To do.

このようなパターン化位相差フィルムは例えば、図1〜3に示すような手順で作製することができる。
しかし、従来技術の製造方法によって作製されたパターン化位相差フィルムの断面形状は、矩形状ではなく、図4に示すような外形をしている。
図4で示された側壁角が小さいと、透過領域と反射領域の境界部分において位相差が連続的に変化する領域が大きくなってしまうという問題がある。この領域は、図4に示した「幅」に相当する。この部分は表示品位を下げてしまうので、なるべく小さくする必要がある。しかしながら、従来の技術では側壁角は通常17度程度しか実現できておらず、パターン化位相差フィルム応用の障害となっていた。
Such a patterned retardation film can be produced, for example, according to the procedure shown in FIGS.
However, the cross-sectional shape of the patterned retardation film produced by the conventional manufacturing method is not a rectangular shape, but has an outer shape as shown in FIG.
If the side wall angle shown in FIG. 4 is small, there is a problem that the region where the phase difference continuously changes is large at the boundary between the transmission region and the reflection region. This area corresponds to the “width” shown in FIG. Since this portion lowers the display quality, it is necessary to make it as small as possible. However, in the conventional technique, the side wall angle is usually only about 17 degrees, which is an obstacle to the application of the patterned retardation film.

C.Doornkamp, B.M.I. van der Zande, S.J. Roosendaal, L.W.G. Sofmeel, J.J. van Glabbeek, J.T.M. Osenga, J.A.M. Steenbakkers, "Next generation mobile LCDs with in-cell retarders", IDW’03, 685(2003).C.Doornkamp, B.M.I.van der Zande, S.J.Roosendaal, L.W.G.Sofmeel, J.J.van Glabbeek, J.T.M.Osenga, J.A.M.Steenbakkers, "Next generation mobile LCDs with in-cell retarders", IDW’03, 685 (2003). S.J.Roosendaal, B.M.I. van der Zande, A.C.Nieuwkerk, C.A. Renders, J.T.M. Osenga, C. Doornkamp, E.Peeters, J. Bruinink, J.A.M.M. van Haaren and S.Takahashi, "Novel High Performance Transflective LCD with a Patterned Retarder", SID’03, 78(2003).SJRoosendaal, BMI van der Zande, ACNieuwkerk, CA Renders, JTM Osenga, C. Doornkamp, E.Peeters, J. Bruinink, JAMM van Haaren and S. Takahashi, "Novel High Performance Transflective LCD with a Patterned Retarder", SID '03, 78 (2003). C.Doornkamp, S.J.Roosendaal, B.M.I. van der Zande, L.W.G. Stofmeel, J.J. van Glabbeek, J.T.M. Osenga, "Novel Transflective LCD with Ultra-wide Viewing Angle", SID’04, 670(2004).C. Doornkamp, S. J. Roosendaal, B.M.I.van der Zande, L.W.G.Stofmeel, J.J.van Glabbeek, J.T.M.Osenga, "Novel Transflective LCD with Ultra-wide Viewing Angle", SID’04, 670 (2004). 特開2005−338256号公報JP 2005-338256 A 特開2006−98623号公報JP 2006-98623 A

本願発明の目的は、パターン化位相差フィルムの上記で定義した側壁角を大きくする製造方法を提供することにある。   The objective of this invention is providing the manufacturing method which enlarges the side wall angle defined above of a patterned retardation film.

上記目的を達成するために鋭意検討した結果、特定の製造条件を設定することが有効であることを見出し、本願発明の完成に至った。   As a result of intensive studies to achieve the above object, it has been found that setting specific manufacturing conditions is effective, and the present invention has been completed.

本願発明は、基板に重合性液晶組成物を坦持させて重合性液晶組成物層を形成する第一工程、重合性液晶組成物層にマスクを介して活性エネルギー線を照射することにより露光部を硬化させる第二工程、未硬化部を除去する第三工程を含んでなるパターン化位相差フィルムの製造方法において、マスクと重合性液晶組成物層との距離d(μm)と活性エネルギー線の平行度θ(度)が、以下式(1)
d×tan(θ) 式(1)
で計算される値が5.3以下であり、かつ、重合性液晶組成物層が含有する重合禁止剤の濃度(ppm)を、重合性液晶組成物層が含有する重合開始剤の濃度(%)で除した値が333〜3750の範囲であることを特徴とするパターン化位相差フィルムの製造方法を提供する。
The present invention is a first step in which a polymerizable liquid crystal composition is carried on a substrate to form a polymerizable liquid crystal composition layer, and the exposed portion is irradiated with active energy rays through the mask to the polymerizable liquid crystal composition layer. In the method for producing a patterned retardation film comprising the second step of curing the film and the third step of removing the uncured portion, the distance d (μm) between the mask and the polymerizable liquid crystal composition layer and the active energy ray The parallelism θ (degree) is expressed by the following formula (1)
d × tan (θ) Equation (1)
The value calculated in (5) is 5.3 or less, and the concentration (ppm) of the polymerization inhibitor contained in the polymerizable liquid crystal composition layer is the concentration (%) of the polymerization initiator contained in the polymerizable liquid crystal composition layer. Provided is a method for producing a patterned retardation film, wherein the divided value is in the range of 333 to 3750.

本願発明の製造方法を適用してパターン化位相差フィルムを作製すると、側壁角を大きくできる。得られたパターン化位相差フィルムを用いると、ディスプレイの表示品位を向上できる。   When the production method of the present invention is applied to produce a patterned retardation film, the side wall angle can be increased. When the obtained patterned retardation film is used, the display quality of the display can be improved.

以下に本願発明による重合性液晶組成物の最良の形態について説明する。本願発明は式(1)で計算される値(以後、この値をパラメータAと呼ぶ)が5.3以下であることを特徴とするが、3.0以下が好ましく、1.5以下が更に好ましい。   The best mode of the polymerizable liquid crystal composition according to the present invention will be described below. The invention of the present application is characterized in that the value calculated by the equation (1) (hereinafter referred to as parameter A) is 5.3 or less, preferably 3.0 or less, and more preferably 1.5 or less.

マスクと重合性液晶組成物層との距離dは、150μm以下が好ましく、100μm以下が更に好ましく、80μm以下が特に好ましい。50μm以下にすれば更に良い結果が得られるものの、距離dをあまり小さくするとマスクと重合性液晶組成物層が接触してしまうので、実用上は10μm以上にすることが好ましい。平行度θは5度以下が好ましく、4度以下が更に好ましく、3度以下が特に好ましい。   The distance d between the mask and the polymerizable liquid crystal composition layer is preferably 150 μm or less, more preferably 100 μm or less, and particularly preferably 80 μm or less. Although better results are obtained when the thickness is 50 μm or less, the mask and the polymerizable liquid crystal composition layer come into contact if the distance d is too small. The parallelism θ is preferably 5 degrees or less, more preferably 4 degrees or less, and particularly preferably 3 degrees or less.

重合性液晶組成物には3〜5質量%の重合開始剤、1000〜15000ppmの重合性禁止剤を含有させることが好ましい。重合開始剤としては、ベンゾインエーテル類、ベンゾフェノン類、アセトフェノン類、ベンジルケタール類、アシルフォスフィンオキサイド等が挙げられる。具体的には、「Irugarue-819」、「Irugarue-651」、「Irugarue-184D」、「Irugarue-1800」、「Irugarue-907」、「Irugarue-369」(以上、チバスペシャリティケミカルズ社製)、「ルシリンTPO」(BASF社製)が挙げられる。これらの中でも、硬化時の雰囲気を窒素置換をしなくても硬化性を確保できる「Irugarue-907」、「Irugarue-369」が好ましく、硬化性が優れる「Irgacure-907」が最も好ましい。   The polymerizable liquid crystal composition preferably contains 3 to 5% by mass of a polymerization initiator and 1000 to 15000 ppm of a polymerization inhibitor. Examples of the polymerization initiator include benzoin ethers, benzophenones, acetophenones, benzyl ketals, and acylphosphine oxides. Specifically, “Irugarue-819”, “Irugarue-651”, “Irugarue-184D”, “Irugarue-1800”, “Irugarue-907”, “Irugarue-369” (above, manufactured by Ciba Specialty Chemicals) “Lucirin TPO” (manufactured by BASF) may be mentioned. Among these, “Irugarue-907” and “Irugarue-369”, which can ensure curability without replacing the atmosphere during curing with nitrogen, are preferable, and “Irgacure-907” having excellent curability is most preferable.

重合禁止剤としては、例えば、ヒドロキノン、ヒドロキノンモノアルキルエーテル類、第三ブチルカテコール類、ピロガロール類、チオフェノール類、ニトロ化合物類、β−ナフチルアミン類、β−ナフトール類、ニトロソ化合物等が挙げられる。より具体的にはメトキシフェノール、2,6-ジ-tert-ブチルフェノールを挙げることができる。重合開始剤と重合禁止剤の好ましい組み合わせの一例は、重合開始剤として「Irgacure-907」、重合禁止剤として「メトキシフェノール」の組み合わせである。重合禁止剤の添加濃度をB(ppm)、重合開始剤の濃度をC(%)としたとき、B/C(以後、この値をパラメータDと呼ぶ)が333〜3750になるように設定することが好ましく、600〜2500が更に好ましく、800〜2000が特に好ましい。パラメータDが小さいと解像度と側壁角が悪化する傾向があり、パラメータDが大きいと硬化性が悪化する傾向がある。パラメータAが3.0以上5.3以下の場合には、パラメータDを800〜3750に設定するのが好ましく、パラメータAが1.5以上3.0未満の場合には、パラメータDを600〜2500に設定するのが好ましく、パラメータAが1.5未満の場合には、パラメータDを300〜2000に設定するのが好ましい。   Examples of the polymerization inhibitor include hydroquinone, hydroquinone monoalkyl ethers, tert-butylcatechols, pyrogallols, thiophenols, nitro compounds, β-naphthylamines, β-naphthols, nitroso compounds and the like. More specific examples include methoxyphenol and 2,6-di-tert-butylphenol. An example of a preferable combination of a polymerization initiator and a polymerization inhibitor is a combination of “Irgacure-907” as a polymerization initiator and “methoxyphenol” as a polymerization inhibitor. When the addition concentration of the polymerization inhibitor is B (ppm) and the concentration of the polymerization initiator is C (%), B / C (hereinafter, this value is referred to as parameter D) is set to 333 to 3750. Preferably, 600 to 2500 is more preferable, and 800 to 2000 is particularly preferable. When the parameter D is small, the resolution and the side wall angle tend to deteriorate, and when the parameter D is large, the curability tends to deteriorate. When the parameter A is 3.0 or more and 5.3 or less, the parameter D is preferably set to 800 to 3750, and when the parameter A is 1.5 or more and less than 3.0, the parameter D is preferably set to 600 to 2500, When the parameter A is less than 1.5, the parameter D is preferably set to 300 to 2000.

また、パラメータDをパラメータAで除した値は190以上に設定することが好ましく、380以上に設定することが更に好ましく、830以上に設定することが特に好ましい。
基板に重合性液晶組成物を坦持させて重合性液晶組成物層を形成する第一工程としては、例えば、重合性液晶組成物を溶媒に溶解させ、これを基板上に塗布し、さらに溶媒を揮発させる方法を挙げることができる。重合性液晶を溶剤に溶解させないで、そのまま、基板上に塗布することも可能である。好適な有機溶媒として例えばトルエン、キシレン、クメンなどのアルキル置換ベンゼンやプロピレングリコールモノメチルエーテルアセテート、酢酸ブチル、シクロヘキサノン、シクロペンンタノン等を挙げることができる。さらにこれらの溶媒にジメチルホルムアミド、γ−ブチロラクトン、N-メチルピロリジノン、メチルエチルケトン、酢酸エチル等を添加しても良い。溶媒を揮発させる方法としては60〜150℃、さらに好ましくは80℃〜120℃での加熱を、15〜120秒、さらに好ましくは30〜90秒の間行う方法を例示することができる。この加熱の他に、減圧乾燥を組み合わせることもできる。塗布の方法としては、スピンコーティング、ダイコーティング、エクストルージョンコーティング、ロールコーティング、ワイヤーバーコーティング、グラビアコーティング、スプレーコーティング、ディッピング、プリント法等を挙げることができる。
The value obtained by dividing parameter D by parameter A is preferably set to 190 or more, more preferably set to 380 or more, and particularly preferably set to 830 or more.
As the first step of forming the polymerizable liquid crystal composition layer by supporting the polymerizable liquid crystal composition on the substrate, for example, the polymerizable liquid crystal composition is dissolved in a solvent, applied onto the substrate, The method of volatilizing can be mentioned. It is also possible to apply the polymerizable liquid crystal directly onto the substrate without dissolving it in the solvent. Suitable organic solvents include, for example, alkyl-substituted benzenes such as toluene, xylene, cumene, propylene glycol monomethyl ether acetate, butyl acetate, cyclohexanone, cyclopentanone and the like. Further, dimethylformamide, γ-butyrolactone, N-methylpyrrolidinone, methyl ethyl ketone, ethyl acetate and the like may be added to these solvents. Examples of the method for volatilizing the solvent include a method in which heating at 60 to 150 ° C., more preferably 80 to 120 ° C. is performed for 15 to 120 seconds, more preferably 30 to 90 seconds. In addition to this heating, vacuum drying can be combined. Examples of the application method include spin coating, die coating, extrusion coating, roll coating, wire bar coating, gravure coating, spray coating, dipping, and printing.

活性エネルギー線としては紫外線を使用することが好ましい。   It is preferable to use ultraviolet rays as the active energy rays.

照射量は50〜900mJ/cm2が好ましく、60〜500mJ/cm2が更に好ましく、80〜300mJ/cm2が特に好ましい。照射量が少ないと、得られる位相差フィルムの機械的特性や耐熱性が悪化する傾向がある。一方、照射量が多いと機械的特性や耐熱性は良くなるものの、解像度が悪くなり、細かいパターンを形成することが困難になる傾向や、側壁角が小さくなってしまう傾向がある。また、紫外線の強度の設定も重要である。紫外線強度は2〜100mW/cm2が好ましく、10〜50mW/cm2が更に好ましい。紫外線強度が弱いとマスク露光に必要な時間が長くなり生産性が悪化する傾向がある。紫外線強度が強いと、解像度や側壁角が小さくなってしまう傾向がある。 Irradiation dose is preferably 50~900mJ / cm 2, more preferably 60~500mJ / cm 2, 80~300mJ / cm 2 is particularly preferred. If the irradiation amount is small, the mechanical properties and heat resistance of the resulting retardation film tend to deteriorate. On the other hand, when the irradiation amount is large, the mechanical properties and heat resistance are improved, but the resolution is deteriorated, and it tends to be difficult to form a fine pattern, and the side wall angle tends to be small. The setting of the intensity of ultraviolet rays is also important. The ultraviolet intensity is preferably 2 to 100 mW / cm 2, more preferably 10 to 50 mW / cm 2 . If the intensity of ultraviolet rays is weak, the time required for mask exposure tends to be long and productivity tends to deteriorate. When the ultraviolet intensity is strong, the resolution and the side wall angle tend to be small.

未硬化部を除去する工程としては、溶剤を用いて溶解洗浄する方法を挙げることができる。溶剤としては、重合性液晶材料組成物を溶解し、かつ硬化した重合性液晶組成物にダメージを与えない有機溶媒を選択することが好ましい。有機溶媒としては、トルエン、キシレン、クメンなどのアルキル置換ベンゼンやプロピレングリコールモノメチルエーテルアセテート、酢酸ブチル、シクロヘキサノン、シクロペンンタノン等を挙げることができる。溶媒に接触させる時間は10秒以上が好ましく、20秒以上が好ましい。溶媒の中に浸漬させて良いし、溶媒をシャワー状に吹きかけても良い。溶媒に接触させる時間が短いと、未硬化部分が残存する傾向があり、5分以上溶媒に接触させると、得られた位相差フィルムが溶媒を含んで膨潤する傾向が強くなる。   Examples of the step of removing the uncured part include a method of dissolving and cleaning using a solvent. As the solvent, it is preferable to select an organic solvent that dissolves the polymerizable liquid crystal material composition and does not damage the cured polymerizable liquid crystal composition. Examples of the organic solvent include alkyl-substituted benzene such as toluene, xylene, cumene, propylene glycol monomethyl ether acetate, butyl acetate, cyclohexanone, cyclopentanone and the like. The time for contacting with the solvent is preferably 10 seconds or longer, and more preferably 20 seconds or longer. It may be immersed in a solvent, or the solvent may be sprayed in a shower shape. When the time of contact with the solvent is short, an uncured portion tends to remain, and when the contact with the solvent for 5 minutes or more, the obtained retardation film tends to swell with the solvent.

マスク露光時のUV照射量が少ないと得られる位相差フィルムの機械的特性や耐熱性が悪化する傾向があると上述した。これを改善するためには、第三工程の後に再度活性エネルギー線を照射することが有効である。照射量は100mJ/cm2〜2000mJ/cm2が好ましく、150〜1500mJ/cm2が更に好ましく、200〜1000mJ/cm2が特に好ましい。
重合性液晶組成物としては、一般式(I)
As described above, the mechanical properties and heat resistance of the obtained retardation film tend to deteriorate when the UV irradiation amount during mask exposure is small. In order to improve this, it is effective to irradiate the active energy ray again after the third step. Irradiation dose is preferably 100mJ / cm 2 ~2000mJ / cm 2 , more preferably 150~1500mJ / cm 2, 200~1000mJ / cm 2 is particularly preferred.
As the polymerizable liquid crystal composition, the general formula (I)

Figure 2009276665
Figure 2009276665

(式中、Pは反応性官能基を表し、Spは炭素原子数1〜20のスペーサー基を表し、mは0又は1を表し、MGはメソゲン基又はメソゲン性支持基を表し、R1は、ハロゲン原子、シアノ基又は炭素原子数1〜25のアルキル基を表すが、該アルキル基は1つ以上のハロゲン原子又はCNにより置換されていても良く、この基中に存在する1つのCH2基又は隣接していない2つ以上のCH2基はそれぞれ相互に独立して、酸素原子が相互に直接結合しない形で、-O-、-S-、-NH-、-N(CH3)-、-CO-、-COO-、-OCO-、-OCOO-、-SCO-、-COS-又は-C≡C-により置き換えられていても良く、あるいはR1は一般式(I-a) (Wherein P represents a reactive functional group, Sp represents a spacer group having 1 to 20 carbon atoms, m represents 0 or 1, MG represents a mesogenic group or a mesogenic support group, and R 1 represents Represents a halogen atom, a cyano group or an alkyl group having 1 to 25 carbon atoms, and the alkyl group may be substituted by one or more halogen atoms or CN, and one CH 2 present in the group. Group or two or more non-adjacent CH 2 groups are each independently of each other such that —O—, —S—, —NH—, —N (CH 3 ) -, -CO-, -COO-, -OCO-, -OCOO-, -SCO-, -COS- or -C≡C- may be substituted, or R 1 may be represented by the general formula (Ia)

Figure 2009276665
(式中、Pは反応性官能基を表し、Spは炭素原子数1〜20のスペーサー基を表し、mは0又は1を表す。)で表される構造を表す。)で表される化合物を含有する請求項1記載のパターン化位相差フィルムの製造方法。
一般式(I)において、Spがアルキレン基を表し(該アルキレン基は1つ以上のハロゲン原子又はCNにより置換されていても良く、この基中に存在する1つのCH2基又は隣接していない2つ以上のCH2基はそれぞれ相互に独立して、酸素原子が相互に直接結合しない形で、-O-、-S-、-NH-、-N(CH3)-、-CO-、-COO-、-OCO-、-OCOO-、-SCO-、-COS-又は-C≡C-により置き換えられていても良い。)、MGが一般式(I-b)
Figure 2009276665
(Wherein P represents a reactive functional group, Sp represents a spacer group having 1 to 20 carbon atoms, and m represents 0 or 1). The manufacturing method of the patterned phase difference film of Claim 1 containing the compound represented by this.
In the general formula (I), Sp represents an alkylene group (the alkylene group may be substituted by one or more halogen atoms or CN, and is not adjacent to one CH 2 group present in the group) Two or more CH 2 groups are independently of each other, in a form in which oxygen atoms are not directly bonded to each other, —O—, —S—, —NH—, —N (CH 3 ) —, —CO—, -COO-, -OCO-, -OCOO-, -SCO-, -COS- or -C≡C- may be substituted.), MG is represented by the general formula (Ib)

Figure 2009276665
(式中、A1、A2及びA3はそれぞれ独立的に、1,4-フェニレン基、1,4-シクロヘキシレン基、1,4-シクロヘキセニル基、テトラヒドロピラン-2,5-ジイル基、1,3-ジオキサン-2,5-ジイル基、テトラヒドロチオピラン-2,5-ジイル基、1,4-ビシクロ(2,2,2)オクチレン基、デカヒドロナフタレン-2,6-ジイル基、ピリジン-2,5-ジイル基、ピリミジン-2,5-ジイル基、ピラジン-2,5-ジイル基、1,2,3,4-テトラヒドロナフタレン-2,6-ジイル基、2,6-ナフチレン基、フェナントレン-2,7-ジイル基、9,10-ジヒドロフェナントレン-2,7-ジイル基、1,2,3,4,4a,9,10a-オクタヒドロフェナントレン2,7-ジイル基又はフルオレン2,7-ジイル基を表し、該1,4-フェニレン基、1,2,3,4-テトラヒドロナフタレン-2,6-ジイル基、2,6-ナフチレン基、フェナントレン-2,7-ジイル基、9,10-ジヒドロフェナントレン-2,7-ジイル基、1,2,3,4,4a,9,10a-オクタヒドロフェナントレン2,7-ジイル基及びフルオレン2,7-ジイル基は置換基として1個以上のF、Cl、CF3、OCF3、シアノ基、炭素原子数1〜8のアルキル基、アルコキシ基、アルカノイル基、アルカノイルオキシ基、炭素原子数2〜8のアルケニル基、アルケニルオキシ基、アルケノイル基又はアルケノイルオキシ基を有していても良く、Z0、Z1、Z2及びZ3はそれぞれ独立して、-COO-、-OCO-、-CH2 CH2-、-OCH2-、-CH2O-、-CH=CH-、-C≡C-、-CH=CHCOO-、-OCOCH=CH-、-CH2CH2COO-、-CH2CH2OCO-、-COO CH2CH2-、-OCOCH2CH2-、-CONH-、-NHCO-又は単結合を表し、nは0、1又は2を表す。)で表される構造を表し、Pが一般式(I-c)、一般式(I-d)及び一般式(I-e)
Figure 2009276665
(In the formula, A1, A2 and A3 are each independently 1,4-phenylene group, 1,4-cyclohexylene group, 1,4-cyclohexenyl group, tetrahydropyran-2,5-diyl group, 1, 3-dioxane-2,5-diyl group, tetrahydrothiopyran-2,5-diyl group, 1,4-bicyclo (2,2,2) octylene group, decahydronaphthalene-2,6-diyl group, pyridine- 2,5-diyl group, pyrimidine-2,5-diyl group, pyrazine-2,5-diyl group, 1,2,3,4-tetrahydronaphthalene-2,6-diyl group, 2,6-naphthylene group, Phenanthrene-2,7-diyl group, 9,10-dihydrophenanthrene-2,7-diyl group, 1,2,3,4,4a, 9,10a-octahydrophenanthrene 2,7-diyl group or fluorene 2, Represents a 7-diyl group, the 1,4-phenylene group, 1,2,3,4-tetrahydronaphthalene-2,6-diyl group, 2,6-naphthylene group, phenanthrene-2,7-diyl group, 9 , 10-Dihydrophenanthrene-2,7-diyl group 1,2,3,4,4a, 9,10a- octahydrophenanthrene 2,7-diyl group and fluorene 2,7-diyl group is 1 or more F as substituents, Cl, CF 3, OCF 3 , cyano Group, an alkyl group having 1 to 8 carbon atoms, an alkoxy group, an alkanoyl group, an alkanoyloxy group, an alkenyl group having 2 to 8 carbon atoms, an alkenyloxy group, an alkenoyl group or an alkenoyloxy group. , Z0, Z1, Z2 and Z3 are each independently -COO-, -OCO-, -CH 2 CH 2- , -OCH 2- , -CH 2 O-, -CH = CH-, -C≡C -, -CH = CHCOO-, -OCOCH = CH-, -CH 2 CH 2 COO-, -CH 2 CH 2 OCO-, -COO CH 2 CH 2- , -OCOCH 2 CH 2- , -CONH-,- NHCO- or a single bond, n represents 0, 1 or 2), and P represents a general formula (Ic), general formula (Id) and general formula (Ie)

Figure 2009276665
Figure 2009276665

(式中、R21、R22、R23、R31、R32、R33、R41、R42及びR43はそれぞれ独立的に水素原子、ハロゲン原子又は炭素原子数1〜5のアルキル基を表し、nは0又は1を表す。)で表される置換基からなる群より選ばれる置換基を表す、で表される化合物を含有するものが好ましい。
ここで、重合性液晶組成物に含有される化合物として、より具体的には一般式(II)
(In the formula, R 21 , R 22 , R 23 , R 31 , R 32 , R 33 , R 41 , R 42 and R 43 are each independently a hydrogen atom, a halogen atom or an alkyl group having 1 to 5 carbon atoms. And n represents 0 or 1) and preferably contains a compound represented by the formula: wherein the substituent is selected from the group consisting of substituents represented by:
Here, the compound contained in the polymerizable liquid crystal composition is more specifically represented by the general formula (II)

Figure 2009276665
又、一般式(III)
Figure 2009276665
In addition, the general formula (III)

Figure 2009276665
(式中、Z1は水素原子、ハロゲン原子、シアノ基又は炭素原子数1〜20の炭化水素基を表し、Z2は水素原子又はメチル基を表し、tは0又は1を表し、A、B及びCはそれぞれ独立的に、1,4−フェニレン基、隣接しないCH基が窒素で置換された1,4−フェニレン基、1,4−シクロヘキシレン基、1つ又は隣接しない2つのCH2基が酸素又は硫黄原子で置換された1,4−シクロヘキシレン基、1,4−シクロヘキセニレン基を表すが、式中に存在する1,4−フェニレン基は炭素原子数1〜7のアルキル基、アルコキシ基、アルカノイル基、シアノ基又はハロゲン原子で一つ以上置換されていても良く、Y3及びY4はそれぞれ独立的に単結合、-CH2CH2-、-CH2O-、-OCH2-、-COO-、-OCO-、-C≡C-、-CH=CH-、-CF=CF-、-(CH24-、-CH2CH2CH2O-、-OCH2CH2CH2-、-CH=CHCH2CH2-、-CH2CH2CH=CH-、-CH=CHCOO-、-OCOCH=CH-、-CH2CH2COO-、-CH2CH2OCO-、-COO CH2CH2-又は-OCOCH2CH2-を表し、Y5は単結合、-O-、-COO-、-OCO-又は-CH=CHCOO-を表す。)で表されるで表される化合物を用いると、重合性液晶組成物の粘度低減が可能で、また液晶温度範囲を室温もしくは室温付近まで低減できるので好ましい。
又、一般式(IV)
Figure 2009276665
(In the formula, Z 1 represents a hydrogen atom, a halogen atom, a cyano group or a hydrocarbon group having 1 to 20 carbon atoms, Z 2 represents a hydrogen atom or a methyl group, t represents 0 or 1, A, B and C are each independently a 1,4-phenylene group, a 1,4-phenylene group in which a non-adjacent CH group is substituted with nitrogen, a 1,4-cyclohexylene group, one or two non-adjacent CH 2 Represents a 1,4-cyclohexylene group or 1,4-cyclohexenylene group in which the group is substituted with an oxygen or sulfur atom, and the 1,4-phenylene group present in the formula is an alkyl having 1 to 7 carbon atoms Group, an alkoxy group, an alkanoyl group, a cyano group or a halogen atom, and Y 3 and Y 4 are each independently a single bond, —CH 2 CH 2 —, —CH 2 O—, -OCH 2 -, - COO -, - OCO -, - C≡C -, - CH = CH -, - CF = CF -, - (CH 2) 4 -, - CH 2 CH 2 CH 2 O -, - OCH 2 CH 2 CH 2- , -CH = CHCH 2 CH 2- , -CH 2 CH 2 CH = CH -, - CH = CHCOO -, - OCOCH = CH -, - CH 2 CH 2 COO -, - CH 2 CH 2 OCO -, - COO CH 2 CH 2 - or -OCOCH 2 CH 2 - and Y 5 represents a single bond, —O—, —COO—, —OCO— or —CH═CHCOO—), and the viscosity of the polymerizable liquid crystal composition is reduced. In addition, the liquid crystal temperature range can be reduced to or near room temperature, which is preferable.
In addition, general formula (IV)

Figure 2009276665
Figure 2009276665

(式中、Z3は水素原子、ハロゲン原子、シアノ基又は炭素原子数1〜20の炭化水素基を表し、Z4は水素原子又はメチル基を表し、W3は単結合、-O-、-COO-又は-OCO-を表し、vは2〜18の整数を表し、uは0又は1を表し、D、E及びFはそれぞれ独立的に、1,4−フェニレン基、隣接しないCH基が窒素で置換された1,4−フェニレン基、1,4−シクロヘキシレン基、1つ又は隣接しない2つのCH2基が酸素又は硫黄原子で置換された1,4−シクロヘキシレン基、1,4−シクロヘキセニレン基を表すが、式中に存在する1,4−フェニレン基は炭素原子数1〜7のアルキル基、アルコキシ基、アルカノイル基、シアノ基又はハロゲン原子で一つ以上置換されていても良く、Y6及びY7はそれぞれ独立的に単結合、-CH2CH2-、-CH2O-、-OCH2-、-COO-、-OCO-、-C≡C-、-CH=CH-、-CF=CF-、-(CH24-、-CH2CH2CH2O-、-OCH2CH2CH2-、-CH=CHCH2CH2-、-CH2CH2CH=CH-、-CH=CHCOO-、-OCOCH=CH-、-CH2CH2COO-、-CH2CH2OCO-、-COO CH2CH2-又は-OCOCH2CH2-を表し、Y8は単結合、-O-、-COO-、-OCO-又は-CH=CHCOO-を表す。)で表される化合物を用いると、重合性液晶組成物の粘度を大幅に増加させることなく液晶物性を調節できるので好ましい。 (Wherein Z 3 represents a hydrogen atom, a halogen atom, a cyano group or a hydrocarbon group having 1 to 20 carbon atoms, Z 4 represents a hydrogen atom or a methyl group, W 3 represents a single bond, —O—, -COO- or -OCO-, v represents an integer of 2 to 18, u represents 0 or 1, D, E and F are each independently a 1,4-phenylene group or a non-adjacent CH group. 1,4-phenylene group substituted with nitrogen, 1,4-cyclohexylene group, 1,4-cyclohexylene group in which one or two non-adjacent CH 2 groups are substituted with oxygen or sulfur atoms, 1, Represents a 4-cyclohexenylene group, but the 1,4-phenylene group present in the formula is substituted by one or more alkyl groups, alkoxy groups, alkanoyl groups, cyano groups or halogen atoms having 1 to 7 carbon atoms. Y 6 and Y 7 are each independently a single bond, —CH 2 CH 2 —, —CH 2 O—, —OCH 2 —, —COO—, —OCO—, —C≡C—, — CH = CH-, -CF = CF -, - (CH 2) 4 -, - CH 2 CH 2 CH 2 O -, - OCH 2 CH 2 CH 2 -, - CH = CHCH 2 CH 2 -, - CH 2 CH 2 CH = CH -, - CH = CHCOO -, - OCOCH = CH -, - CH 2 CH 2 COO -, - CH 2 CH 2 OCO -, - COO CH 2 CH 2 - or -OCOCH 2 CH 2 - represents, Y 8 represents a single bond, - O-, -COO-, -OCO-, or -CH = CHCOO-) is preferred because the liquid crystal properties can be adjusted without significantly increasing the viscosity of the polymerizable liquid crystal composition. .

一般式(I)で表される化合物の具体例を以下に挙げることができる。   Specific examples of the compound represented by the general formula (I) can be given below.

Figure 2009276665
Figure 2009276665

Figure 2009276665
Figure 2009276665

Figure 2009276665
Figure 2009276665

(式中、j、k、l及びmはそれぞれ独立的に2〜18の整数を表す。)
又、一般式(II)で表される化合物の具体例を以下に挙げることができる。
(Wherein j, k, l and m each independently represent an integer of 2 to 18)
Specific examples of the compound represented by the general formula (II) can be given below.

Figure 2009276665
Figure 2009276665

(式中、j及びkはそれぞれ独立的に2〜18の整数を表す。)
又、一般式(III)で表される化合物の具体的な例として、化合物の構造と相転移温度を以下に挙げることができる。
(Wherein j and k each independently represents an integer of 2 to 18)
Specific examples of the compound represented by the general formula (III) include the structure of the compound and the phase transition temperature.

Figure 2009276665
Figure 2009276665

Figure 2009276665
Figure 2009276665

Figure 2009276665
Figure 2009276665

(式中、シクロヘキサン環はトランスシクロヘキサン環を表し、数字は相転移温度を表し、Cは結晶相、Nはネマチック相、Sはスメクチック相、Iは等方性液体相をそれぞれ表す。)
又、一般式(IV)で表される化合物の具体例を以下に挙げることができる。
(In the formula, a cyclohexane ring represents a transcyclohexane ring, a number represents a phase transition temperature, C represents a crystalline phase, N represents a nematic phase, S represents a smectic phase, and I represents an isotropic liquid phase.)
Specific examples of the compound represented by the general formula (IV) can be given below.

Figure 2009276665
Figure 2009276665

(式中、X1は水素原子又はメチル基を表し、Rは炭素原子数1から20のアルキル基を表す。)
又、円盤状化合物は、ベンゼン誘導体、トリフェニレン誘導体、トルキセン誘導体、フタロシアニン誘導体又はシクロヘキサン誘導体を分子の中心の母核とし、直鎖のアルキル基、直鎖のアルコキシ基又は置換ベンゾイルオキシ基がその側鎖として放射状に置換した構造であることが好ましく、一般式(V)で表される
(In the formula, X 1 represents a hydrogen atom or a methyl group, and R represents an alkyl group having 1 to 20 carbon atoms.)
In addition, the discotic compound has a benzene derivative, triphenylene derivative, truxene derivative, phthalocyanine derivative or cyclohexane derivative as the core of the center of the molecule, and a linear alkyl group, a linear alkoxy group or a substituted benzoyloxy group is a side chain. It is preferable that the structure is a radially substituted structure represented by the general formula (V).

Figure 2009276665
(式中、R5はそれぞれ独立して一般式(V-a)で表される置換基を表す。)
Figure 2009276665
(In the formula, each R 5 independently represents a substituent represented by the general formula (Va).)

Figure 2009276665
Figure 2009276665

(式中、R6及びR7はそれぞれ独立的に水素原子、ハロゲン原子又はメチル基を表し、R8は炭素原子数1〜20アルコキシ基を表すが、該アルコキシ基中の水素原子は一般式(V-b)、一般式(V-c)又は一般式(V-d)で表される置換基によって置換されていても良い。) (In the formula, R 6 and R 7 each independently represent a hydrogen atom, a halogen atom or a methyl group, and R 8 represents an alkoxy group having 1 to 20 carbon atoms, and the hydrogen atom in the alkoxy group represents a general formula. (It may be substituted by a substituent represented by (Vb), general formula (Vc) or general formula (Vd).)

Figure 2009276665
Figure 2009276665

(式中、R81、R82、R83、R84、R85、R86、R87、R88及びR89はそれぞれ独立的に水素原子、ハロゲン原子又は炭素原子数1〜5のアルキル基を表し、nは0又は1を表す。)で表される構造を有することがさらに好ましく、一般式(V)においてR8の内少なくとも一つは一般式(V-b)、一般式(V-c)又は一般式(V-d)で表される置換基によって置換されたアルコキシ基を表すことが好ましく、R8の全てが一般式(V-b)、一般式(V-c)又は一般式(V-d)で表される置換基によって置換されたアルコキシ基を表すことが特に好ましい。
さらに、一般式(V-a)は具体的には一般式(V-e)
Wherein R 81 , R 82 , R 83 , R 84 , R 85 , R 86 , R 87 , R 88 and R 89 are each independently a hydrogen atom, a halogen atom or an alkyl group having 1 to 5 carbon atoms. And n represents 0 or 1.) In general formula (V), at least one of R 8 is represented by general formula (Vb), general formula (Vc) or It preferably represents an alkoxy group substituted by a substituent represented by the general formula (Vd), and all of R 8 are substituted represented by the general formula (Vb), the general formula (Vc) or the general formula (Vd). It is particularly preferred to represent an alkoxy group substituted by a group.
Further, the general formula (Va) specifically represents the general formula (Ve).

Figure 2009276665
(式中nは2〜9の整数を表す)で表される構造を有することが特に好ましい。
重合性液晶組成物層を形成した時に、液晶分子の配向をホモジニアス配向させることを目的として、重合性液晶組成物に一般式(VI)
Figure 2009276665
It is particularly preferable to have a structure represented by the formula (wherein n represents an integer of 2 to 9).
When the polymerizable liquid crystal composition layer is formed, the polymerizable liquid crystal composition has the general formula (VI) for the purpose of homogeneously aligning the liquid crystal molecules.

Figure 2009276665
Figure 2009276665

(式中、R1、R2、R3及びR4はそれぞれ独立的に水素原子、ハロゲン原子又は炭素原子数1〜20の炭化水素基を表し、該炭化水素基中の水素原子は1つ以上のハロゲン原子で置換されていても良い。)で表される繰り返し単位を有する重量平均分子量が100以上である化合物を含有させることが好ましい。 (Wherein R 1 , R 2 , R 3 and R 4 each independently represents a hydrogen atom, a halogen atom or a hydrocarbon group having 1 to 20 carbon atoms, and one hydrocarbon atom in the hydrocarbon group) It may be substituted with the above halogen atom.) It is preferable to contain a compound having a repeating unit represented by the following formula and having a weight average molecular weight of 100 or more.

一般式(VI)で表される化合物は、例えばポリエチレン、ポリプロピレン、ポリイソブチレン、パラフィン、流動パラフィン、塩素化ポリプロピレン、塩素化パラフィン、又は塩素化流動パラフィンが挙げられる。これ以外にも、フッ素原子が導入された化合物はムラ抑制の観点からも有効である。 一般式(VI)で表される繰り返し単位を有する化合物のうち、好適な構造として、式(VI-a)〜式(VI-f)   Examples of the compound represented by the general formula (VI) include polyethylene, polypropylene, polyisobutylene, paraffin, liquid paraffin, chlorinated polypropylene, chlorinated paraffin, and chlorinated liquid paraffin. In addition to this, a compound in which a fluorine atom is introduced is also effective from the viewpoint of suppressing unevenness. Among the compounds having a repeating unit represented by the general formula (VI), as a preferred structure, the formula (VI-a) to the formula (VI-f)

Figure 2009276665
Figure 2009276665

で表される繰り返し単位を有する化合物が挙げられる。中でも、式(VI-a)〜式(VI-e)で表される構造がより好ましく、式(VI-a)及び式(VI-c)で表される構造が特に好ましい。又、式(VI-a)〜式(VI-f)で表される繰り返し単位を有する化合物を2種以上共重合させた共重合体も好ましい。この場合、式(VI-a)及び式(VI-b)を有する共重合体、式(VI-a)及び式(VI-c)を有する共重合体、式(VI-a)及び式(VI-f)を有する共重合体、及び、式(VI-a)、(VI-b)及び式(VI-f)を有する共重合体がより好ましく、式(VI-a)及び式(VI-b)を有する共重合体、及び、式(VI-a)、(VI-b)及び式(VI-f)を有する共重合体が特に好ましい。 The compound which has a repeating unit represented by these is mentioned. Among these, structures represented by formulas (VI-a) to (VI-e) are more preferable, and structures represented by formulas (VI-a) and (VI-c) are particularly preferable. A copolymer obtained by copolymerizing two or more compounds having a repeating unit represented by formula (VI-a) to formula (VI-f) is also preferable. In this case, a copolymer having the formula (VI-a) and the formula (VI-b), a copolymer having the formula (VI-a) and the formula (VI-c), the formula (VI-a) and the formula ( More preferred are copolymers having VI-f) and copolymers having formulas (VI-a), (VI-b) and formula (VI-f), wherein formula (VI-a) and formula (VI Particularly preferred are copolymers having -b) and copolymers having the formulas (VI-a), (VI-b) and (VI-f).

該化合物の重量平均分子量は、小さすぎるとチルト角を減じる効果が乏しくなり、大きすぎると配向が長時間安定しないため最適な範囲が存在する。具体的には、200〜1000000であることが好ましく、300〜100000であることがさらに好ましく、400〜80000であることが特に好ましい。   If the weight average molecular weight of the compound is too small, the effect of reducing the tilt angle is poor. If the weight average molecular weight is too large, the orientation is not stable for a long time, so there is an optimum range. Specifically, it is preferably 200 to 1000000, more preferably 300 to 100000, and particularly preferably 400 to 80000.

又、該化合物を、重合性液晶組成物中に0.01〜5質量%含有することが好ましく、0.05〜2質量%含有することがより好ましく、0.1〜1質量%含有することが特に好ましい。
重合性液晶組成物層の形成した時に表面の平滑性を確保するために、界面活性剤を添加することが好ましい。界面活性剤は、イオン性界面活性剤、非イオン性界面活性剤の区別はない。含有することができる界面活性剤としては、アルキルカルボン酸塩、アルキルリン酸塩、アルキルスルホン酸塩、フルオロアルキルカルボン酸塩、フルオロアルキルリン酸塩、フルオロアルキルスルホン酸塩、ポリオキシエチレン誘導体、フルオロアルキルエチレンオキシド誘導体、ポリエチレングリコール誘導体、アルキルアンモニウム塩、フルオロアルキルアンモニウム塩類、シリコーン誘導体等をあげることができ、特に含フッ素界面活性剤、シリコーン誘導体が好ましい。
Moreover, it is preferable to contain 0.01-5 mass% of this compound in a polymeric liquid crystal composition, It is more preferable to contain 0.05-2 mass%, Containing 0.1-1 mass% Is particularly preferred.
In order to ensure smoothness of the surface when the polymerizable liquid crystal composition layer is formed, it is preferable to add a surfactant. As the surfactant, there is no distinction between an ionic surfactant and a nonionic surfactant. Surfactants that can be included include alkyl carboxylates, alkyl phosphates, alkyl sulfonates, fluoroalkyl carboxylates, fluoroalkyl phosphates, fluoroalkyl sulfonates, polyoxyethylene derivatives, fluoro Examples thereof include alkylethylene oxide derivatives, polyethylene glycol derivatives, alkylammonium salts, fluoroalkylammonium salts, silicone derivatives and the like, and fluorine-containing surfactants and silicone derivatives are particularly preferable.

更に具体的には「MEGAFAC F−110」、「MEGAFACF−113」、「MEGAFAC F−120」、「MEGAFAC F−812」、「MEGAFAC F−142D」、「MEGAFAC F−144D」、「MEGAFAC F−150」、「MEGAFAC F−171」、「MEGAFACF−173」、「MEGAFAC F−177」、「MEGAFAC F−183」、「MEGAFAC F−195」、「MEGAFAC F−824」、「MEGAFAC F−833」、「MEGAFAC F−114」、「MEGAFAC F−410」、「MEGAFAC F−493」、「MEGAFAC F−494」、「MEGAFAC F−443」、「MEGAFAC F−444」、「MEGAFAC F−445」、「MEGAFAC F−446」、「MEGAFAC F−470」、「MEGAFAC F−471」、「MEGAFAC F−474」、「MEGAFAC F−475」、「MEGAFAC F−477」、「MEGAFAC F−478」、「MEGAFAC F−479」、「MEGAFAC F−480SF」、「MEGAFAC F−482」、「MEGAFAC F−483」、「MEGAFAC F−484」、「MEGAFAC F−486」、「MEGAFAC F−487」、「MEGAFAC F−489」、「MEGAFAC F−172D」、「MEGAFAC F−178K」、「MEGAFAC F−178RM」、「MEGAFAC R−08」、「MEGAFAC R−30」、「MEGAFAC F−472SF」、「MEGAFAC BL−20」、「MEGAFAC R−61」、「MEGAFAC R−90」、「MEGAFAC ESM−1」、「MEGAFAC MCF−350SF」(以上、DIC株式会社製)、「フタージェント100」、「フタージェント100C」、「フタージェント110」、「フタージェント150」、「フタージェント150CH」、「フタージェントA」、「フタージェント100A-K」、「フタージェント501」、「フタージェント300」、「フタージェント310」、「フタージェント320」、「フタージェント400SW」、「FTX-400P」、「フタージェント251」、「フタージェント215M」、「フタージェント212MH」、「フタージェント250」、「フタージェント222F」、「フタージェント212D」、「FTX-218」、「FTX-209F」、「FTX-213F」、「FTX-233F」、「フタージェント245F」、「FTX-208G」、「FTX-240G」、「FTX-206D」、「FTX-220D」、「FTX-230D」、「FTX-240D」、「FTX-207S」、「FTX-211S」、「FTX-220S」、「FTX-230S」、「FTX-750FM」、「FTX-730FM」、「FTX-730FL」、「FTX-710FS」、「FTX-710FM」、「FTX-710FL」、「FTX-750LL」、「FTX-730LS」、「FTX-730LM」、「FTX-730LL」、「FTX-710LL」(以上、ネオス社製)、「BYK−300」、「BYK−302」、「BYK−306」、「BYK−307」、「BYK−310」、「BYK−315」、「BYK−320」、「BYK−322」、「BYK−323」、「BYK−325」、「BYK−330」、「BYK−331」、「BYK−333」、「BYK−337」、「BYK−340」、「BYK−344」、「BYK−370」、「BYK−375」、「BYK−377」、「BYK−350」、「BYK−352」、「BYK−354」、「BYK−355」、「BYK−356」、「BYK−358N」、「BYK−361N」、「BYK−357」、「BYK−390」、「BYK−392」、「BYK−UV3500」、「BYK−UV3510」、「BYK−UV3570」、「BYK−Silclean3700」(以上、ビックケミー・ジャパン社製)、「TEGO Rad2100」、「TEGO Rad2200N」、「TEGO Rad2250」、「TEGO Rad2300」、「TEGO Rad2500」、「TEGO Rad2600」、「TEGO Rad2700」(以上、テゴ社製)等の例をあげることができる。 More specifically, “MEGAFAC F-110”, “MEGAFACCF-113”, “MEGAFAC F-120”, “MEGAFAC F-812”, “MEGAFAC F-142D”, “MEGAFAC F-144D”, “MEGAFAC F-” 150 "," MEGAFAC F-171 "," MEGAFACCF-173 "," MEGAFAC F-177 "," MEGAFAC F-183 "," MEGAFAC F-195 "," MEGAFAC F-824 "," MEGAFAC F-833 " , “MEGAFAC F-114”, “MEGAFAC F-410”, “MEGAFAC F-493”, “MEGAFAC F-494”, “MEGAFAC F-443”, “MEGAFAC F-444”, “MEGAFAC F-445”, "ME GAFAC F-446, MEGAFAC F-470, MEGAFAC F-471, MEGAFAC F-474, MEGAFAC F-475, MEGAFAC F-477, MEGAFAC F-478, MEGAFAC F-479, MEGAFAC F-480SF, MEGAFAC F-482, MEGAFAC F-483, MEGAFAC F-484, MEGAFAC F-486, MEGAFAC F-487, MEGAFAC F -489 "," MEGAFAC F-172D "," MEGAFAC F-178K "," MEGAFAC F-178RM "," MEGAFAC R-08 "," MEGAFAC R-30 "," MEGAFAC F-472SF "," MEGAFAC " “BL-20”, “MEGAFAC R-61”, “MEGAFAC R-90”, “MEGAFAC ESM-1”, “MEGAFAC MCF-350SF” (manufactured by DIC Corporation), “Factent 100”, “Factent” 100C "," Factent 110 "," Factent 150 "," Factent 150CH "," Factent A "," Factent 100A-K "," Factent 501, "" Factent 300 "," Factent " 310 "," Factent 320 "," Factent 400SW "," FTX-400P "," Factent 251 "," Factent 215M "," Factent 212MH "," Factent 250 "," Factent 222F " , “Fargent 212 ”,“ FTX-218 ”,“ FTX-209F ”,“ FTX-213F ”,“ FTX-233F ”,“ Factent 245F ”,“ FTX-208G ”,“ FTX-240G ”,“ FTX-206D ”, "FTX-220D", "FTX-230D", "FTX-240D", "FTX-207S", "FTX-211S", "FTX-220S", "FTX-230S", "FTX-750FM", "FTX -730FM, FTX-730FL, FTX-710FS, FTX-710FM, FTX-710FL, FTX-750LL, FTX-730LS, FTX-730LM, FTX-730LL ”,“ FTX-710LL ”(from Neos),“ BYK-300 ”,“ BYK-302 ”,“ BYK-306 ”,“ BYK-307 ” , “BYK-310”, “BYK-315”, “BYK-320”, “BYK-322”, “BYK-323”, “BYK-325”, “BYK-330”, “BYK-331”, “ "BYK-333", "BYK-337", "BYK-340", "BYK-344", "BYK-370", "BYK-375", "BYK-377", "BYK-350", "BYK-" 352 "," BYK-354 "," BYK-355 "," BYK-356 "," BYK-358N "," BYK-361N "," BYK-357 "," BYK-390 "," BYK-392 " , “BYK-UV3500”, “BYK-UV3510”, “BYK-UV3570”, “BYK-Silklean 3700” (above, manufactured by Big Chemie Japan), “TE O Rad2100 "," TEGO Rad2200N "," TEGO Rad2250 "," TEGO Rad2300 "," TEGO Rad2500 "," TEGO Rad2600 "," TEGO Rad2700 "(or more, Tego Co., Ltd.) can be mentioned an example of such.

界面活性剤の好ましい添加量は、重合性液晶組成物中に含有される界面活性剤以外の成分や、使用温度等によって異なるが、重合性液晶組成物中に0.01〜1質量%含有することが好ましく、0.02〜0.5質量%含有することがさらに好ましく、0.03〜0.1質量%含有することが特に好ましい。含有量が0.01質量%より低いときは膜厚ムラ低減効果が得にくい。一般式(VI)で表される繰り返し単位を有する重量平均分子量が100以上である化合物の含有量と界面活性剤の含有量の合計が0.02〜0.5質量%であることが好ましく、0.05〜0.4質量%含有することがさらに好ましく、0.1〜0.2質量%含有することが特に好ましい。 The preferred addition amount of the surfactant varies depending on components other than the surfactant contained in the polymerizable liquid crystal composition, the use temperature, etc., but is contained in the polymerizable liquid crystal composition in an amount of 0.01 to 1% by mass. The content is preferably 0.02 to 0.5 mass%, more preferably 0.03 to 0.1 mass%. When the content is lower than 0.01% by mass, it is difficult to obtain the effect of reducing film thickness unevenness. The total content of the surfactant and the content of the compound having a weight average molecular weight of 100 or more having the repeating unit represented by the general formula (VI) is preferably 0.02 to 0.5% by mass, It is more preferable to contain 0.05-0.4 mass%, and it is especially preferable to contain 0.1-0.2 mass%.

以下、実施例を挙げて本願発明を更に詳述するが、本願発明はこれらの実施例に限定されるものではない。実施例の述べるパターン化位相差フィルムの解像度、幅、側壁角はレーザー顕微鏡(キーエンス社製VK-9510)によって測定した。重量平均分子量は、TSKgel GMHXLを2本と、TSKgel G2000HXL、TSKgel G1000HXL(何れも東ソー製)のカラムを使用したGPC分析装置(東ソー社製HLC-8220GPC)により、溶媒テトラヒドロフラン、示差屈折計検出により検出し、ポリスチレン換算で求めた。
(参考例1)
式(a)の化合物40質量%
EXAMPLES Hereinafter, although an Example is given and this invention is further explained in full detail, this invention is not limited to these Examples. The resolution, width, and sidewall angle of the patterned retardation film described in the examples were measured with a laser microscope (VK-9510 manufactured by Keyence Corporation). The weight average molecular weight is detected by solvent tetrahydrofuran and differential refractometer detection using a GPC analyzer (HLC-8220GPC manufactured by Tosoh Corporation) using two TSKgel GMHXL and TSKgel G2000HXL and TSKgel G1000HXL columns (both manufactured by Tosoh Corporation). And calculated in terms of polystyrene.
(Reference Example 1)
40% by mass of the compound of the formula (a)

Figure 2009276665
式(b)の化合物20質量%
Figure 2009276665
20% by mass of the compound of the formula (b)

Figure 2009276665
式(c)の化合物25質量%
Figure 2009276665
25% by mass of the compound of the formula (c)

Figure 2009276665
式(d)の化合物5質量%
Figure 2009276665
5% by mass of the compound of the formula (d)

Figure 2009276665
式(e)の化合物10質量%
Figure 2009276665
10% by mass of the compound of formula (e)

Figure 2009276665
からなる重合性液晶組成物(A)を調整した。重合性液晶組成物(A)質量93.35%に、光重合開始剤Irgacure-907(チバスペシャリティケミカルズ社製)5.0質量%、重量平均分子量600の流動パラフィン(関東化学社製)を0.1質量%、FTX−730LS(ネオス社製)0.05質量%、重合禁止剤4-メトキシフェノールを15000ppm添加した重合性液晶組成物(A1)を調製した。
Figure 2009276665
A polymerizable liquid crystal composition (A) comprising: Polymerizable liquid crystal composition (A) mass 93.35%, photopolymerization initiator Irgacure-907 (manufactured by Ciba Specialty Chemicals) 5.0 mass%, liquid paraffin (weight average molecular weight 600) 0.1 mass%, FTX A polymerizable liquid crystal composition (A1) was prepared by adding 0.05% by mass of -730LS (manufactured by Neos) and 15000 ppm of a polymerization inhibitor 4-methoxyphenol.

(参考例2)
重合性液晶組成物(A)質量94.35%に、光重合開始剤Irgacure-907(チバスペシャリティケミカルズ社製)5.0質量%、重量平均分子量600の流動パラフィン(関東化学社製)を0.1質量%、FTX−730LS(ネオス社製)0.05質量%、重合禁止剤4-メトキシフェノールを5000ppm添加した重合性液晶組成物(A2)を調製した。
(Reference Example 2)
Polymerizable liquid crystal composition (A) mass 94.35%, photopolymerization initiator Irgacure-907 (manufactured by Ciba Specialty Chemicals) 5.0 mass%, liquid paraffin (weight-average molecular weight 600) 0.1 mass%, FTX A polymerizable liquid crystal composition (A2) prepared by adding 0.05% by mass of -730LS (manufactured by Neos) and 5000 ppm of a polymerization inhibitor 4-methoxyphenol was prepared.

(参考例3)
重合性液晶組成物(A)質量94.75%に、光重合開始剤Irgacure-907(チバスペシャリティケミカルズ社製)5.0質量%、重量平均分子量600の流動パラフィン(関東化学社製)を0.1質量%、FTX−730LS(ネオス社製)0.05質量%、重合禁止剤4-メトキシフェノールを1000ppm添加した重合性液晶組成物(A3)を調製した。
(Reference Example 3)
Polymerizable liquid crystal composition (A) mass 94.75%, photopolymerization initiator Irgacure-907 (manufactured by Ciba Specialty Chemicals) 5.0 mass%, liquid paraffin (weight average molecular weight 600) 0.1 mass%, FTX A polymerizable liquid crystal composition (A3) to which 0.05 mass% of -730LS (manufactured by Neos) and 1000 ppm of a polymerization inhibitor 4-methoxyphenol was added was prepared.

(実施例1)
重合性液晶組成物(A2)を25%質量含有するプロピレングリコールモノメチルエーテルアセテート溶液を調製した。これをラビング処理を施したポリイミド配向膜付きのガラス基板にスピンコート(570回転/分、15秒)した。スピンコートした基板を70℃で2分間乾燥した。このようにして形成した重合性液晶組成物層に、100μmの間隔をもってマスク(エドモンド社製 1951USAFテストターゲット)設置し、その上から平行度3度のUV光源を照射してマスク露光を行った。UV光源の強度は20mW/cm2に設定し、3秒間照射することにより60mJ/cm2のエネルギー量を照射した。次に基板をプロピレングリコールモノメチルエーテルアセテートに30秒浸漬することにより、未硬化部を除去した。この処理を行った基板に付着している溶剤をエアブローで揮発させることにより、パターン化位相差フィルムを得た。このようにして得られたパターン化位相差フィルムの解像度は15.6μm、幅は5.7μm、側壁角は18.3度、厚みは1.9μmであった。
位相差フィルムの位相差は342nmであった。また、得られた位相差フィルムを240℃で1時間加熱したところ、位相差は加熱前位相差の83.0%の大きさとなった。
Example 1
A propylene glycol monomethyl ether acetate solution containing 25% by mass of the polymerizable liquid crystal composition (A2) was prepared. This was spin-coated (570 rpm / 15 seconds) on a glass substrate with a polyimide alignment film that had been rubbed. The spin-coated substrate was dried at 70 ° C. for 2 minutes. A mask (1951 USAF test target manufactured by Edmond Co., Ltd.) was placed on the polymerizable liquid crystal composition layer thus formed at an interval of 100 μm, and a mask was exposed by irradiating a UV light source with a parallelism of 3 degrees from above. The intensity of the UV light source was set to 20 mW / cm 2, and an energy amount of 60 mJ / cm 2 was irradiated by irradiating for 3 seconds. Next, the uncured portion was removed by immersing the substrate in propylene glycol monomethyl ether acetate for 30 seconds. The solvent adhering to the substrate subjected to this treatment was volatilized by air blow to obtain a patterned retardation film. The resolution of the patterned retardation film thus obtained was 15.6 μm, the width was 5.7 μm, the side wall angle was 18.3 degrees, and the thickness was 1.9 μm.
The retardation of the retardation film was 342 nm. Further, when the obtained retardation film was heated at 240 ° C. for 1 hour, the retardation became 83.0% of the pre-heating retardation.

(実施例2)
距離を50μmに変更した以外は、実施例1と同様にしてパターン化位相差フィルムを得た。得られたパターン化位相差フィルムの解像度は6.2μm、幅は1.9μm、側壁角は44.9度であった。
(実施例3)
距離を23μmに変更した以外は、実施例1と同様にしてパターン化位相差フィルムを得た。得られたパターン化位相差フィルムの解像度は11.0μm、幅は2.8μm、側壁角は34.6度であった。
(Example 2)
A patterned retardation film was obtained in the same manner as in Example 1 except that the distance was changed to 50 μm. The resolution of the obtained patterned retardation film was 6.2 μm, the width was 1.9 μm, and the side wall angle was 44.9 degrees.
(Example 3)
A patterned retardation film was obtained in the same manner as in Example 1 except that the distance was changed to 23 μm. The resolution of the obtained patterned retardation film was 11.0 μm, the width was 2.8 μm, and the side wall angle was 34.6 degrees.

(実施例4)
距離を12μmに変更した以外は、実施例1と同様にしてパターン化位相差フィルムを得た。得られたパターン化位相差フィルムの解像度は8.8μm、幅は2.9μm、側壁角は33.5度であった。
(実施例5)
照射時間を5秒間にしてUV照射量を100mJ/cm2にした以外は、実施例1と同様にしてパターン化位相差フィルムを得た。得られたパターン化位相差フィルムの解像度は31.3μm、幅は5.5μm、側壁角は19.2度であった。
(Example 4)
A patterned retardation film was obtained in the same manner as in Example 1 except that the distance was changed to 12 μm. The resolution of the obtained patterned retardation film was 8.8 μm, the width was 2.9 μm, and the side wall angle was 33.5 degrees.
(Example 5)
A patterned retardation film was obtained in the same manner as in Example 1 except that the irradiation time was 5 seconds and the UV irradiation amount was 100 mJ / cm 2 . The resolution of the obtained patterned retardation film was 31.3 μm, the width was 5.5 μm, and the side wall angle was 19.2 degrees.

(実施例6)
照射時間を5秒間にしてUV照射量を100mJ/cm2にし、かつ距離を50μmに変更した以外は、実施例1と同様にしてパターン化位相差フィルムを得た。得られたパターン化位相差フィルムの解像度は15.6μm、幅は2.9μm、側壁角は33.7度であった。
(実施例7)
照射時間を5秒間にしてUV照射量を100mJ/cm2にし、かつ距離を23μmに変更した以外は、実施例1と同様にしてパターン化位相差フィルムを得た。得られたパターン化位相差フィルムの解像度は13.9μm、幅は1.9μm、側壁角は44.7度であった。
(Example 6)
A patterned retardation film was obtained in the same manner as in Example 1 except that the irradiation time was 5 seconds, the UV irradiation amount was 100 mJ / cm 2 , and the distance was changed to 50 μm. The resolution of the obtained patterned retardation film was 15.6 μm, the width was 2.9 μm, and the side wall angle was 33.7 degrees.
(Example 7)
A patterned retardation film was obtained in the same manner as in Example 1 except that the irradiation time was 5 seconds, the UV irradiation amount was 100 mJ / cm 2 , and the distance was changed to 23 μm. The resolution of the obtained patterned retardation film was 13.9 μm, the width was 1.9 μm, and the side wall angle was 44.7 degrees.

(実施例8)
照射時間を5秒間にしてUV照射量を100mJ/cm2にし、かつ距離を23μmに変更した以外は、実施例1と同様にしてパターン化位相差フィルムを得た。得られたパターン化位相差フィルムの解像度は13.9μm、幅は1.9μm、側壁角は44.7度であった。
(実施例9)
照射時間を5秒間にしてUV照射量を140mJ/cm2にした以外は、実施例1と同様にしてパターン化位相差フィルムを得た。得られたパターン化位相差フィルムの解像度は78.7μm、幅は4.9μm、側壁角は21.2度であった。
(Example 8)
A patterned retardation film was obtained in the same manner as in Example 1 except that the irradiation time was 5 seconds, the UV irradiation amount was 100 mJ / cm 2 , and the distance was changed to 23 μm. The resolution of the obtained patterned retardation film was 13.9 μm, the width was 1.9 μm, and the side wall angle was 44.7 degrees.
(Example 9)
A patterned retardation film was obtained in the same manner as in Example 1 except that the irradiation time was 5 seconds and the UV irradiation amount was 140 mJ / cm 2 . The resolution of the obtained patterned retardation film was 78.7 μm, the width was 4.9 μm, and the side wall angle was 21.2 degrees.

(実施例10)
照射時間を7秒間にしてUV照射量を140mJ/cm2にし、かつ距離を50μmに変更した以外は、実施例1と同様にしてパターン化位相差フィルムを得た。得られたパターン化位相差フィルムの解像度は22.1μm、幅は2.0μm、側壁角は43.0度であった。
(実施例11)
照射時間を5秒間にしてUV照射量を140mJ/cm2にし、かつ距離を23μmに変更した以外は、実施例1と同様にしてパターン化位相差フィルムを得た。得られたパターン化位相差フィルムの解像度は19.7μm、幅は2.0μm、側壁角は43.7度であった。
(Example 10)
A patterned retardation film was obtained in the same manner as in Example 1 except that the irradiation time was 7 seconds, the UV irradiation amount was 140 mJ / cm 2 , and the distance was changed to 50 μm. The resolution of the obtained patterned retardation film was 22.1 μm, the width was 2.0 μm, and the side wall angle was 43.0 degrees.
(Example 11)
A patterned retardation film was obtained in the same manner as in Example 1 except that the irradiation time was 5 seconds, the UV irradiation amount was 140 mJ / cm 2 , and the distance was changed to 23 μm. The resolution of the obtained patterned retardation film was 19.7 μm, the width was 2.0 μm, and the side wall angle was 43.7 degrees.

(実施例12)
照射時間を5秒間にしてUV照射量を140mJ/cm2にし、かつ距離を12μmに変更した以外は、実施例1と同様にしてパターン化位相差フィルムを得た。得られたパターン化位相差フィルムの解像度は19.7μm、幅は1.9μm、側壁角は45.0度であった。
(実施例13)
UV光源の強度は8mW/cm2に設定し、12.5秒間照射することにより100mJ/cm2のエネルギー量は照射した以外は、実施例1と同様にしてパターン化位相差フィルムを得た。得られたパターン化位相差フィルムの解像度は55.7μm、幅は5.6μm、側壁角は18.7度であった。
(Example 12)
A patterned retardation film was obtained in the same manner as in Example 1 except that the irradiation time was 5 seconds, the UV irradiation amount was 140 mJ / cm 2 , and the distance was changed to 12 μm. The resolution of the obtained patterned retardation film was 19.7 μm, the width was 1.9 μm, and the side wall angle was 45.0 degrees.
(Example 13)
The intensity of the UV light source was set to 8 mW / cm 2 , and a patterned retardation film was obtained in the same manner as in Example 1 except that the energy amount of 100 mJ / cm 2 was irradiated by irradiation for 12.5 seconds. The resolution of the obtained patterned retardation film was 55.7 μm, the width was 5.6 μm, and the side wall angle was 18.7 degrees.

(実施例14)
UV光源の強度は8mW/cm2に設定し、12.5秒間照射することにより100mJ/cm2のエネルギー量は照射し、かつ距離を50μmに変更した以外は、実施例1と同様にしてパターン化位相差フィルムを得た。得られたパターン化位相差フィルムの解像度は17.5μm、幅は1.9μm、側壁角は45.0度であった。
(実施例15)
UV光源の強度は8mW/cm2に設定し、12.5秒間照射することにより100mJ/cm2のエネルギー量は照射し、かつ距離を23μmに変更した以外は、実施例1と同様にしてパターン化位相差フィルムを得た。得られたパターン化位相差フィルムの解像度は12.4μm、幅は1.9μm、側壁角は44.7度であった。
(Example 14)
Patterning position is the same as in Example 1 except that the intensity of the UV light source is set to 8 mW / cm 2 , and the amount of energy of 100 mJ / cm 2 is irradiated by irradiation for 12.5 seconds and the distance is changed to 50 μm. A phase difference film was obtained. The resolution of the obtained patterned retardation film was 17.5 μm, the width was 1.9 μm, and the side wall angle was 45.0 degrees.
(Example 15)
Patterning position is the same as in Example 1 except that the intensity of the UV light source is set to 8 mW / cm 2 , and the amount of energy of 100 mJ / cm 2 is irradiated by irradiation for 12.5 seconds and the distance is changed to 23 μm. A phase difference film was obtained. The resolution of the obtained patterned retardation film was 12.4 μm, the width was 1.9 μm, and the side wall angle was 44.7 degrees.

(実施例16)
UV光源の強度は8mW/cm2に設定し、12.5秒間照射することにより100mJ/cm2のエネルギー量は照射し、かつ距離を12μmに変更した以外は、実施例1と同様にしてパターン化位相差フィルムを得た。得られたパターン化位相差フィルムの解像度は9.8μm、幅は1.8μm、側壁角は46.5度であった。
(実施例17)
重合性液晶組成物(A2)を、重合性液晶組成物(A1)に変更した以外は実施例1と同様にしてパターン化位相差フィルムを得た。得られたパターン化位相差フィルムの解像度は8.8μm、幅は5.5μm、側壁角は19.1度であった。
(Example 16)
Patterning position is the same as in Example 1 except that the intensity of the UV light source is set to 8 mW / cm 2 , and the energy amount of 100 mJ / cm 2 is irradiated by irradiation for 12.5 seconds and the distance is changed to 12 μm. A phase difference film was obtained. The resulting patterned retardation film had a resolution of 9.8 μm, a width of 1.8 μm, and a side wall angle of 46.5 degrees.
(Example 17)
A patterned retardation film was obtained in the same manner as in Example 1 except that the polymerizable liquid crystal composition (A2) was changed to the polymerizable liquid crystal composition (A1). The resolution of the obtained patterned retardation film was 8.8 μm, the width was 5.5 μm, and the side wall angle was 19.1 degrees.

(実施例18)
重合性液晶組成物(A2)を、重合性液晶組成物(A1)に変更し、かつ距離を50μmに変更した以外は実施例1と同様にしてパターン化位相差フィルムを得た。得られたパターン化位相差フィルムの解像度は8.8μm、幅は2.7μm、側壁角は34.8度であった。
(実施例19)
重合性液晶組成物(A2)を、重合性液晶組成物(A1)に変更し、照射時間を5秒間にしてUV照射量を100mJ/cm2にした以外は、実施例1と同様にしてパターン化位相差フィルムを得た。得られたパターン化位相差フィルムの解像度は12.4μm、幅は4.1μm、側壁角は24.9度であった。
(Example 18)
A patterned retardation film was obtained in the same manner as in Example 1 except that the polymerizable liquid crystal composition (A2) was changed to the polymerizable liquid crystal composition (A1) and the distance was changed to 50 μm. The resolution of the obtained patterned retardation film was 8.8 μm, the width was 2.7 μm, and the side wall angle was 34.8 degrees.
(Example 19)
The pattern was the same as in Example 1, except that the polymerizable liquid crystal composition (A2) was changed to the polymerizable liquid crystal composition (A1), the irradiation time was 5 seconds, and the UV irradiation amount was 100 mJ / cm 2. A retardation film was obtained. The resolution of the obtained patterned retardation film was 12.4 μm, the width was 4.1 μm, and the side wall angle was 24.9 degrees.

(実施例20)
重合性液晶組成物(A2)を、重合性液晶組成物(A1)に変更し、照射時間を7秒間にしてUV照射量を140mJ/cm2にした以外は、実施例1と同様にしてパターン化位相差フィルムを得た。得られたパターン化位相差フィルムの解像度は17.5μm、幅は3.6μm、側壁角は28.2度であった。
(Example 20)
The pattern was the same as in Example 1 except that the polymerizable liquid crystal composition (A2) was changed to the polymerizable liquid crystal composition (A1), the irradiation time was 7 seconds, and the UV irradiation amount was 140 mJ / cm 2. A retardation film was obtained. The resolution of the obtained patterned retardation film was 17.5 μm, the width was 3.6 μm, and the sidewall angle was 28.2 degrees.

(比較例1)
重合性液晶組成物(A2)を、重合性液晶組成物(A3)に変更した以外は、実施例1と同様にしてパターン化位相差フィルムを得た。得られたパターン化位相差フィルムの解像度は125.0μm、幅は13.4μm、側壁角は8.1度であった。
(比較例2)
重合性液晶組成物(A2)を、重合性液晶組成物(A3)に変更し、かつ距離を50μmに変更した以外は、実施例1と同様にしてパターン化位相差フィルムを得た。得られたパターン化位相差フィルムの解像度は99.2μm、幅は8.2μm、側壁角は13.1度であった。
(Comparative Example 1)
A patterned retardation film was obtained in the same manner as in Example 1 except that the polymerizable liquid crystal composition (A2) was changed to the polymerizable liquid crystal composition (A3). The resolution of the obtained patterned retardation film was 125.0 μm, the width was 13.4 μm, and the side wall angle was 8.1 degrees.
(Comparative Example 2)
A patterned retardation film was obtained in the same manner as in Example 1 except that the polymerizable liquid crystal composition (A2) was changed to the polymerizable liquid crystal composition (A3) and the distance was changed to 50 μm. The resolution of the obtained patterned retardation film was 99.2 μm, the width was 8.2 μm, and the side wall angle was 13.1 degrees.

(比較例3)
重合性液晶組成物(A2)を、重合性液晶組成物(A3)に変更し、かつ距離を23μmに変更した以外は、実施例1と同様にしてパターン化位相差フィルムを得た。得られたパターン化位相差フィルムの解像度は62.5μm、幅は6.8μm、側壁角は15.6度であった。(比較例4)
重合性液晶組成物(A2)を、重合性液晶組成物(A3)に変更し、かつ距離を12μmに変更した以外は、実施例1と同様にしてパターン化位相差フィルムを得た。得られたパターン化位相差フィルムの解像度は31.3μm、幅は6.3μm、側壁角は16.8度であった。
(Comparative Example 3)
A patterned retardation film was obtained in the same manner as in Example 1 except that the polymerizable liquid crystal composition (A2) was changed to the polymerizable liquid crystal composition (A3) and the distance was changed to 23 μm. The resolution of the obtained patterned retardation film was 62.5 μm, the width was 6.8 μm, and the side wall angle was 15.6 degrees. (Comparative Example 4)
A patterned retardation film was obtained in the same manner as in Example 1 except that the polymerizable liquid crystal composition (A2) was changed to the polymerizable liquid crystal composition (A3) and the distance was changed to 12 μm. The resolution of the obtained patterned retardation film was 31.3 μm, the width was 6.3 μm, and the side wall angle was 16.8 degrees.

(比較例5)
重合性液晶組成物(A2)を、重合性液晶組成物(A3)に変更し、照射時間を5秒間にしてUV照射量を100mJ/cm2にした以外は、実施例1と同様にしてパターン化位相差フィルムを得た。得られたパターン化位相差フィルムの解像度は140.4μmより悪く、幅は19.7μm、側壁角は5.5度であった。
(比較例6)
重合性液晶組成物(A2)を、重合性液晶組成物(A3)に変更し、照射時間を5秒間にしてUV照射量を100mJ/cm2にした以外は、実施例1と同様にしてパターン化位相差フィルムを得た。得られたパターン化位相差フィルムの解像度は111.4μm、幅は7.4μm、側壁角は14.5度であった。
(Comparative Example 5)
The pattern was the same as in Example 1 except that the polymerizable liquid crystal composition (A2) was changed to the polymerizable liquid crystal composition (A3), the irradiation time was 5 seconds, and the UV irradiation amount was 100 mJ / cm 2. A retardation film was obtained. The resolution of the resulting patterned retardation film was worse than 140.4 μm, the width was 19.7 μm, and the sidewall angle was 5.5 degrees.
(Comparative Example 6)
The pattern was the same as in Example 1 except that the polymerizable liquid crystal composition (A2) was changed to the polymerizable liquid crystal composition (A3), the irradiation time was 5 seconds, and the UV irradiation amount was 100 mJ / cm 2. A retardation film was obtained. The resolution of the obtained patterned retardation film was 111.4 μm, the width was 7.4 μm, and the side wall angle was 14.5 degrees.

(比較例7)
重合性液晶組成物(A2)を、重合性液晶組成物(A3)に変更し、照射時間を5秒間にしてUV照射量を100mJ/cm2に変更し、かつ距離を23μmに変更した以外は、実施例1と同様にしてパターン化位相差フィルムを得た。得られたパターン化位相差フィルムの解像度は88.3μm、幅は7.1μm、側壁角は15.0度であった。
(比較例8)
重合性液晶組成物(A2)を、重合性液晶組成物(A3)に変更し、照射時間を5秒間にしてUV照射量を100mJ/cm2に変更し、かつ距離を12μmに変更した以外は、実施例1と同様にしてパターン化位相差フィルムを得た。得られたパターン化位相差フィルムの解像度は62.5μm、幅は6.1μm、側壁角は17.3度であった。
(Comparative Example 7)
Except for changing the polymerizable liquid crystal composition (A2) to the polymerizable liquid crystal composition (A3), changing the irradiation time to 5 seconds, changing the UV irradiation amount to 100 mJ / cm 2, and changing the distance to 23 μm. In the same manner as in Example 1, a patterned retardation film was obtained. The resolution of the obtained patterned retardation film was 88.3 μm, the width was 7.1 μm, and the side wall angle was 15.0 degrees.
(Comparative Example 8)
Except for changing the polymerizable liquid crystal composition (A2) to the polymerizable liquid crystal composition (A3), changing the irradiation time to 5 seconds, changing the UV irradiation amount to 100 mJ / cm 2, and changing the distance to 12 μm. In the same manner as in Example 1, a patterned retardation film was obtained. The resolution of the obtained patterned retardation film was 62.5 μm, the width was 6.1 μm, and the side wall angle was 17.3 degrees.

(比較例9)
重合性液晶組成物(A2)を、重合性液晶組成物(A3)に変更し、照射時間を7秒間にしてUV照射量を140mJ/cm2にした以外は、実施例1と同様にしてパターン化位相差フィルムを得た。得られたパターン化位相差フィルムの解像度は140.4μmより悪く、幅は20.7μm、側壁角は5.2度であった。
(比較例10)
重合性液晶組成物(A2)を、重合性液晶組成物(A3)に変更し、照射時間を7秒間にしてUV照射量を140mJ/cm2にした以外は、実施例1と同様にしてパターン化位相差フィルムを得た。得られたパターン化位相差フィルムの解像度は140.4μmより悪く、幅は11.7μm、側壁角は9.2度であった。
(Comparative Example 9)
The pattern was the same as in Example 1 except that the polymerizable liquid crystal composition (A2) was changed to the polymerizable liquid crystal composition (A3), the irradiation time was 7 seconds, and the UV irradiation amount was 140 mJ / cm 2. A retardation film was obtained. The resolution of the resulting patterned retardation film was worse than 140.4 μm, the width was 20.7 μm, and the sidewall angle was 5.2 degrees.
(Comparative Example 10)
The pattern was the same as in Example 1 except that the polymerizable liquid crystal composition (A2) was changed to the polymerizable liquid crystal composition (A3), the irradiation time was 7 seconds, and the UV irradiation amount was 140 mJ / cm 2. A retardation film was obtained. The resolution of the resulting patterned retardation film was worse than 140.4 μm, the width was 11.7 μm, and the sidewall angle was 9.2 degrees.

(比較例11)
重合性液晶組成物(A2)を、重合性液晶組成物(A3)に変更し、照射時間を7秒間にしてUV照射量を140mJ/cm2に変更し、かつ距離を23μmに変更した以外は、実施例1と同様にしてパターン化位相差フィルムを得た。得られたパターン化位相差フィルムの解像度は125.0μm、幅は9.6μm、側壁角は11.3度であった。
(Comparative Example 11)
The polymerizable liquid crystal composition (A2) was changed to the polymerizable liquid crystal composition (A3), the irradiation time was changed to 7 seconds, the UV irradiation amount was changed to 140 mJ / cm 2 , and the distance was changed to 23 μm. In the same manner as in Example 1, a patterned retardation film was obtained. The resolution of the obtained patterned retardation film was 125.0 μm, the width was 9.6 μm, and the side wall angle was 11.3 degrees.

(比較例12)
重合性液晶組成物(A2)を、重合性液晶組成物(A3)に変更し、照射時間を7秒間にしてUV照射量を140mJ/cm2に変更し、かつ距離を12μmに変更した以外は、実施例1と同様にしてパターン化位相差フィルムを得た。得られたパターン化位相差フィルムの解像度は99.2μm、幅は7.6μm、側壁角は14.0度であった。
表1に結果をまとめた。
(Comparative Example 12)
The polymerizable liquid crystal composition (A2) was changed to the polymerizable liquid crystal composition (A3), the irradiation time was changed to 7 seconds, the UV irradiation amount was changed to 140 mJ / cm 2 , and the distance was changed to 12 μm. In the same manner as in Example 1, a patterned retardation film was obtained. The resolution of the obtained patterned retardation film was 99.2 μm, the width was 7.6 μm, and the side wall angle was 14.0 degrees.
Table 1 summarizes the results.

Figure 2009276665
Figure 2009276665

(実施例21)
プロピレングリコールモノメチルエーテルアセテートに浸漬する時間を60秒に変更した以外は実施例1と同様にしてパターン化位相差フィルムを得た。得られたパターン化位相差フィルムの解像度は13.9μm、幅は5.5μm、側壁角は19.1度であった。
また、得られた位相差フィルムを240℃で1時間加熱したところ、位相差は加熱前位相差の84.0%の大きさとなった。
(Example 21)
A patterned retardation film was obtained in the same manner as in Example 1 except that the time of immersion in propylene glycol monomethyl ether acetate was changed to 60 seconds. The resolution of the obtained patterned retardation film was 13.9 μm, the width was 5.5 μm, and the side wall angle was 19.1 degrees.
Further, when the obtained retardation film was heated at 240 ° C. for 1 hour, the retardation became 84.0% of the pre-heating retardation.

(実施例22)
プロピレングリコールモノメチルエーテルアセテートに浸漬する時間を90秒に変更した以外は実施例1と同様にしてパターン化位相差フィルムを得た。得られたパターン化位相差フィルムの解像度は13.9μm、幅は5.5μm、側壁角は19.1度であった。
また、得られた位相差フィルムを240℃で1時間加熱したところ、位相差は加熱前位相差の84.2%の大きさとなった。
(Example 22)
A patterned retardation film was obtained in the same manner as in Example 1 except that the time of immersion in propylene glycol monomethyl ether acetate was changed to 90 seconds. The resolution of the obtained patterned retardation film was 13.9 μm, the width was 5.5 μm, and the side wall angle was 19.1 degrees.
Further, when the obtained retardation film was heated at 240 ° C. for 1 hour, the retardation became 84.2% of the retardation before heating.

(比較例13)
プロピレングリコールモノメチルエーテルアセテートに浸漬する時間を15秒に変更した以外は実施例1と同様にしてパターン化位相差フィルムを得た。得られたパターン化位相差フィルムの解像度は17.5μm、幅は6.1μm、側壁角は17.3度であった。
また、得られた位相差フィルムを240℃で1時間加熱したところ、位相差は加熱前位相差の81.5%の大きさとなった。
(Comparative Example 13)
A patterned retardation film was obtained in the same manner as in Example 1 except that the immersion time in propylene glycol monomethyl ether acetate was changed to 15 seconds. The resolution of the obtained patterned retardation film was 17.5 μm, the width was 6.1 μm, and the side wall angle was 17.3 degrees.
Further, when the obtained retardation film was heated at 240 ° C. for 1 hour, the retardation became 81.5% of the retardation before heating.

(実施例23)
実施例1と全く同様にしてパターン化位相差フィルムを製造した後、得られた位相差フィルムにUV光源の強度は20mW/cm2に設定し、マスクを介さずに全面にわたって10秒間照射することにより200mJ/cm2のエネルギー量を照射した。このように追加のUV露光をした位相差フィルムを240℃で1時間加熱したところ、位相差は加熱前位相差の86.5%の大きさとなった。
(Example 23)
After producing a patterned retardation film in exactly the same way as in Example 1, the intensity of the UV light source is set to 20 mW / cm 2 on the obtained retardation film, and the whole surface is irradiated for 10 seconds without using a mask. Was irradiated with an energy amount of 200 mJ / cm 2 . When the retardation film subjected to additional UV exposure was heated at 240 ° C. for 1 hour, the retardation became 86.5% of the retardation before heating.

重合性液晶組成物の層の形成をした断面図である。It is sectional drawing which formed the layer of the polymeric liquid crystal composition. マスク露光の断面図である。It is sectional drawing of mask exposure. 未硬化部を除去した断面図である。It is sectional drawing which removed the uncured part. パターン化位相差フィルムの断面形状図である。It is a cross-sectional shape figure of a patterned retardation film.

符号の説明Explanation of symbols

1 重合性液晶分子
2 重合性液晶組成物の層
3 配向膜
4 基板
5 UV(紫外線)
6 マスク
1 Polymerizable liquid crystal molecule 2 Polymerizable liquid crystal composition layer 3 Alignment film 4 Substrate 5 UV (ultraviolet)
6 Mask

Claims (11)

基板に重合性液晶組成物を坦持させて重合性液晶組成物層を形成する第一工程、重合性液晶組成物層にマスクを介して活性エネルギー線を照射することにより露光部を硬化させる第二工程、未硬化部を除去する第三工程を含んでなるパターン化位相差フィルムの製造方法において、マスクと重合性液晶組成物層との距離d(μm)と活性エネルギー線の平行度θ(度)が、以下式(1)
d×tan(θ) 式(1)
で計算される値が5.3以下であり、かつ、重合性液晶組成物層が含有する重合禁止剤の濃度(ppm)を、重合性液晶組成物層が含有する重合開始剤の濃度(質量%)で除した値が333〜3750の範囲であることを特徴とするパターン化位相差フィルムの製造方法。
A first step of forming a polymerizable liquid crystal composition layer by supporting the polymerizable liquid crystal composition on a substrate, and a step of curing an exposed portion by irradiating the polymerizable liquid crystal composition layer with an active energy ray through a mask. In the method for producing a patterned retardation film comprising a second step and a third step of removing the uncured portion, the distance d (μm) between the mask and the polymerizable liquid crystal composition layer and the parallelism θ ( Degree) is expressed by the following formula (1)
d × tan (θ) Equation (1)
The value calculated by the above is 5.3 or less, and the concentration (ppm) of the polymerization inhibitor contained in the polymerizable liquid crystal composition layer is the concentration (mass%) of the polymerization initiator contained in the polymerizable liquid crystal composition layer. A method for producing a patterned retardation film, wherein the value divided by is in the range of 333 to 3750.
活性エネルギー線が紫外線であり、かつ照射量が80〜300mJ/cm2である請求項1記載のパターン化位相差フィルムの製造方法。 The method for producing a patterned retardation film according to claim 1, wherein the active energy ray is ultraviolet light and the irradiation amount is 80 to 300 mJ / cm 2 . 未硬化部を除去する工程が、未硬化部を有機溶媒を用いて溶解洗浄する手段を含んでなり、かつ洗浄処理時間が20秒以上である請求項1記載のパターン化位相差フィルムの製造方法。 2. The method for producing a patterned retardation film according to claim 1, wherein the step of removing the uncured portion comprises a means for dissolving and washing the uncured portion using an organic solvent, and the washing treatment time is 20 seconds or longer. . 第三工程の後に、再度活性エネルギー線を照射する工程を有する請求項1記載のパターン化位相差フィルムの製造方法。 The manufacturing method of the patterned retardation film of Claim 1 which has the process of irradiating an active energy ray again after a 3rd process. 重合性液晶組成物が一般式(I)
Figure 2009276665
(式中、Pは反応性官能基を表し、Spは炭素原子数1〜20のスペーサー基を表し、mは0又は1を表し、MGはメソゲン基又はメソゲン性支持基を表し、R1は、ハロゲン原子、シアノ基又は炭素原子数1〜25のアルキル基を表すが、該アルキル基は1つ以上のハロゲン原子又はCNにより置換されていても良く、この基中に存在する1つのCH2基又は隣接していない2つ以上のCH2基はそれぞれ相互に独立して、酸素原子が相互に直接結合しない形で、-O-、-S-、-NH-、-N(CH3)-、-CO-、-COO-、-OCO-、-OCOO-、-SCO-、-COS-又は-C≡C-により置き換えられていても良く、あるいはR1は一般式(I-a)
Figure 2009276665
(式中、Pは反応性官能基を表し、Spは炭素原子数1〜20のスペーサー基を表し、mは0又は1を表す。)で表される構造を表す。)で表される化合物を含有する請求項1記載のパターン化位相差フィルムの製造方法。
The polymerizable liquid crystal composition has the general formula (I)
Figure 2009276665
(Wherein P represents a reactive functional group, Sp represents a spacer group having 1 to 20 carbon atoms, m represents 0 or 1, MG represents a mesogenic group or a mesogenic support group, and R 1 represents Represents a halogen atom, a cyano group or an alkyl group having 1 to 25 carbon atoms, and the alkyl group may be substituted by one or more halogen atoms or CN, and one CH 2 present in the group. Group or two or more non-adjacent CH 2 groups are each independently of each other such that —O—, —S—, —NH—, —N (CH 3 ) -, -CO-, -COO-, -OCO-, -OCOO-, -SCO-, -COS- or -C≡C- may be substituted, or R 1 may be represented by the general formula (Ia)
Figure 2009276665
(Wherein P represents a reactive functional group, Sp represents a spacer group having 1 to 20 carbon atoms, and m represents 0 or 1). The manufacturing method of the patterned phase difference film of Claim 1 containing the compound represented by this.
一般式(I)において、Spがアルキレン基を表し(該アルキレン基は1つ以上のハロゲン原子又はCNにより置換されていても良く、この基中に存在する1つのCH2基又は隣接していない2つ以上のCH2基はそれぞれ相互に独立して、酸素原子が相互に直接結合しない形で、-O-、-S-、-NH-、-N(CH3)-、-CO-、-COO-、-OCO-、-OCOO-、-SCO-、-COS-又は-C≡C-により置き換えられていても良い。)、MGが一般式(I-b)
Figure 2009276665
(式中、A1、A2及びA3はそれぞれ独立的に、1,4-フェニレン基、1,4-シクロヘキシレン基、1,4-シクロヘキセニル基、テトラヒドロピラン-2,5-ジイル基、1,3-ジオキサン-2,5-ジイル基、テトラヒドロチオピラン-2,5-ジイル基、1,4-ビシクロ(2,2,2)オクチレン基、デカヒドロナフタレン-2,6-ジイル基、ピリジン-2,5-ジイル基、ピリミジン-2,5-ジイル基、ピラジン-2,5-ジイル基、1,2,3,4-テトラヒドロナフタレン-2,6-ジイル基、2,6-ナフチレン基、フェナントレン-2,7-ジイル基、9,10-ジヒドロフェナントレン-2,7-ジイル基、1,2,3,4,4a,9,10a-オクタヒドロフェナントレン2,7-ジイル基又はフルオレン2,7-ジイル基を表し、該1,4-フェニレン基、1,2,3,4-テトラヒドロナフタレン-2,6-ジイル基、2,6-ナフチレン基、フェナントレン-2,7-ジイル基、9,10-ジヒドロフェナントレン-2,7-ジイル基、1,2,3,4,4a,9,10a-オクタヒドロフェナントレン2,7-ジイル基及びフルオレン2,7-ジイル基は置換基として1個以上のF、Cl、CF3、OCF3、シアノ基、炭素原子数1〜8のアルキル基、アルコキシ基、アルカノイル基、アルカノイルオキシ基、炭素原子数2〜8のアルケニル基、アルケニルオキシ基、アルケノイル基又はアルケノイルオキシ基を有していても良く、Z0、Z1、Z2及びZ3はそれぞれ独立して、-COO-、-OCO-、-CH2 CH2-、-OCH2-、-CH2O-、-CH=CH-、-C≡C-、-CH=CHCOO-、-OCOCH=CH-、-CH2CH2COO-、-CH2CH2OCO-、-COO CH2CH2-、-OCOCH2CH2-、-CONH-、-NHCO-又は単結合を表し、nは0、1又は2を表す。)で表される構造を表し、Pが一般式(I-c)、一般式(I-d)及び一般式(I-e)
Figure 2009276665
(式中、R21、R22、R23、R31、R32、R33、R41、R42及びR43はそれぞれ独立的に水素原子、ハロゲン原子又は炭素原子数1〜5のアルキル基を表し、nは0又は1を表す。)で表される置換基からなる群より選ばれる置換基を表す、で表される化合物を含有する請求項5記載のパターン化位相差フィルムの製造方法。
In the general formula (I), Sp represents an alkylene group (the alkylene group may be substituted by one or more halogen atoms or CN, and is not adjacent to one CH 2 group present in the group) Two or more CH 2 groups are independently of each other, in a form in which oxygen atoms are not directly bonded to each other, —O—, —S—, —NH—, —N (CH 3 ) —, —CO—, -COO-, -OCO-, -OCOO-, -SCO-, -COS- or -C≡C- may be substituted.), MG is represented by the general formula (Ib)
Figure 2009276665
(In the formula, A1, A2 and A3 are each independently 1,4-phenylene group, 1,4-cyclohexylene group, 1,4-cyclohexenyl group, tetrahydropyran-2,5-diyl group, 1, 3-dioxane-2,5-diyl group, tetrahydrothiopyran-2,5-diyl group, 1,4-bicyclo (2,2,2) octylene group, decahydronaphthalene-2,6-diyl group, pyridine- 2,5-diyl group, pyrimidine-2,5-diyl group, pyrazine-2,5-diyl group, 1,2,3,4-tetrahydronaphthalene-2,6-diyl group, 2,6-naphthylene group, Phenanthrene-2,7-diyl group, 9,10-dihydrophenanthrene-2,7-diyl group, 1,2,3,4,4a, 9,10a-octahydrophenanthrene 2,7-diyl group or fluorene 2, Represents a 7-diyl group, the 1,4-phenylene group, 1,2,3,4-tetrahydronaphthalene-2,6-diyl group, 2,6-naphthylene group, phenanthrene-2,7-diyl group, 9 , 10-Dihydrophenanthrene-2,7-diyl group 1,2,3,4,4a, 9,10a- octahydrophenanthrene 2,7-diyl group and fluorene 2,7-diyl group is 1 or more F as substituents, Cl, CF 3, OCF 3 , cyano Group, an alkyl group having 1 to 8 carbon atoms, an alkoxy group, an alkanoyl group, an alkanoyloxy group, an alkenyl group having 2 to 8 carbon atoms, an alkenyloxy group, an alkenoyl group or an alkenoyloxy group. , Z0, Z1, Z2 and Z3 are each independently -COO-, -OCO-, -CH 2 CH 2- , -OCH 2- , -CH 2 O-, -CH = CH-, -C≡C -, -CH = CHCOO-, -OCOCH = CH-, -CH 2 CH 2 COO-, -CH 2 CH 2 OCO-, -COO CH 2 CH 2- , -OCOCH 2 CH 2- , -CONH-,- NHCO- or a single bond, n represents 0, 1 or 2), and P represents a general formula (Ic), general formula (Id) and general formula (Ie)
Figure 2009276665
(In the formula, R 21 , R 22 , R 23 , R 31 , R 32 , R 33 , R 41 , R 42 and R 43 are each independently a hydrogen atom, a halogen atom or an alkyl group having 1 to 5 carbon atoms. And n represents 0 or 1). The method for producing a patterned retardation film according to claim 5, comprising a compound represented by: a substituent selected from the group consisting of substituents represented by: .
重合性液晶組成物が一般式(II)
Figure 2009276665
(式中、mは0又は1を表し、W1及びW2はそれぞれ独立的に単結合、-O-、-COO-又は-OCO-を表し、Y1及びY2はそれぞれ独立的に-COO-又は-OCO-を表し、r及びsはそれぞれ独立的に2〜18の整数を表すが、式中に存在する1,4−フェニレン基は炭素原子数1〜7のアルキル基、アルコキシ基、アルカノイル基、シアノ基、又はハロゲン原子で一つ以上置換されていても良い。)で表される化合物を含有する請求項6記載のパターン化位相差フィルムの製造方法。
The polymerizable liquid crystal composition has the general formula (II)
Figure 2009276665
Wherein m represents 0 or 1, W 1 and W 2 each independently represent a single bond, —O—, —COO— or —OCO—, and Y 1 and Y 2 each independently represent — COO- or -OCO- is represented, and r and s each independently represent an integer of 2 to 18, the 1,4-phenylene group present in the formula is an alkyl group or alkoxy group having 1 to 7 carbon atoms , An alkanoyl group, a cyano group, or a halogen atom, which may be substituted one or more.) The method for producing a patterned retardation film according to claim 6.
重合性液晶組成物が一般式(III)
Figure 2009276665
(式中、Z1は水素原子、ハロゲン原子、シアノ基又は炭素原子数1〜20の炭化水素基を表し、Z2は水素原子又はメチル基を表し、tは0又は1を表し、A、B及びCはそれぞれ独立的に、1,4−フェニレン基、隣接しないCH基が窒素で置換された1,4−フェニレン基、1,4−シクロヘキシレン基、1つ又は隣接しない2つのCH2基が酸素又は硫黄原子で置換された1,4−シクロヘキシレン基、1,4−シクロヘキセニレン基を表すが、式中に存在する1,4−フェニレン基は炭素原子数1〜7のアルキル基、アルコキシ基、アルカノイル基、シアノ基又はハロゲン原子で一つ以上置換されていても良く、Y3及びY4はそれぞれ独立的に単結合、-CH2CH2-、-CH2O-、-OCH2-、-COO-、-OCO-、-C≡C-、-CH=CH-、-CF=CF-、-(CH24-、-CH2CH2CH2O-、-OCH2CH2CH2-、-CH=CHCH2CH2-、-CH2CH2CH=CH-、-CH=CHCOO-、-OCOCH=CH-、-CH2CH2COO-、-CH2CH2OCO-、-COO CH2CH2-又は-OCOCH2CH2-を表し、Y5は単結合、-O-、-COO-、-OCO-又は-CH=CHCOO-を表す。)で表される化合物を含有する請求項6記載のパターン化位相差フィルムの製造方法。
The polymerizable liquid crystal composition has the general formula (III)
Figure 2009276665
(In the formula, Z 1 represents a hydrogen atom, a halogen atom, a cyano group or a hydrocarbon group having 1 to 20 carbon atoms, Z 2 represents a hydrogen atom or a methyl group, t represents 0 or 1, A, B and C are each independently a 1,4-phenylene group, a 1,4-phenylene group in which a non-adjacent CH group is substituted with nitrogen, a 1,4-cyclohexylene group, one or two non-adjacent CH 2 Represents a 1,4-cyclohexylene group or 1,4-cyclohexenylene group in which the group is substituted with an oxygen or sulfur atom, and the 1,4-phenylene group present in the formula is an alkyl having 1 to 7 carbon atoms Group, an alkoxy group, an alkanoyl group, a cyano group or a halogen atom, and Y 3 and Y 4 are each independently a single bond, —CH 2 CH 2 —, —CH 2 O—, -OCH 2 -, - COO -, - OCO -, - C≡C -, - CH = CH -, - CF = CF -, - (CH 2) 4 -, - CH 2 CH 2 CH 2 O -, - OCH 2 CH 2 CH 2- , -CH = CHCH 2 CH 2- , -CH 2 CH 2 CH = CH -, - CH = CHCOO -, - OCOCH = CH -, - CH 2 CH 2 COO -, - CH 2 CH 2 OCO -, - COO CH 2 CH 2 - or -OCOCH 2 CH 2 - and And Y 5 represents a single bond, —O—, —COO—, —OCO—, or —CH═CHCOO—.) The method for producing a patterned retardation film according to claim 6 .
重合性液晶組成物が一般式(IV)
Figure 2009276665
(式中、Z3は水素原子、ハロゲン原子、シアノ基又は炭素原子数1〜20の炭化水素基を表し、Z4は水素原子又はメチル基を表し、W3は単結合、-O-、-COO-又は-OCO-を表し、vは2〜18の整数を表し、uは0又は1を表し、D、E及びFはそれぞれ独立的に、1,4−フェニレン基、隣接しないCH基が窒素で置換された1,4−フェニレン基、1,4−シクロヘキシレン基、1つ又は隣接しない2つのCH2基が酸素又は硫黄原子で置換された1,4−シクロヘキシレン基、1,4−シクロヘキセニレン基を表すが、式中に存在する1,4−フェニレン基は炭素原子数1〜7のアルキル基、アルコキシ基、アルカノイル基、シアノ基又はハロゲン原子で一つ以上置換されていても良く、Y6及びY7はそれぞれ独立的に単結合、-CH2CH2-、-CH2O-、-OCH2-、-COO-、-OCO-、-C≡C-、-CH=CH-、-CF=CF-、-(CH24-、-CH2CH2CH2O-、-OCH2CH2CH2-、-CH=CHCH2CH2-、-CH2CH2CH=CH-、-CH=CHCOO-、-OCOCH=CH-、-CH2CH2COO-、-CH2CH2OCO-、-COO CH2CH2-又は-OCOCH2CH2-を表し、Y8は単結合、-O-、-COO-、-OCO-又は-CH=CHCOO-を表す。)で表される化合物を含有する請求項6記載のパターン化位相差フィルムの製造方法。
The polymerizable liquid crystal composition has the general formula (IV)
Figure 2009276665
(Wherein Z 3 represents a hydrogen atom, a halogen atom, a cyano group or a hydrocarbon group having 1 to 20 carbon atoms, Z 4 represents a hydrogen atom or a methyl group, W 3 represents a single bond, —O—, -COO- or -OCO-, v represents an integer of 2 to 18, u represents 0 or 1, D, E and F are each independently a 1,4-phenylene group or a non-adjacent CH group. 1,4-phenylene group substituted with nitrogen, 1,4-cyclohexylene group, 1,4-cyclohexylene group in which one or two non-adjacent CH 2 groups are substituted with oxygen or sulfur atoms, 1, Represents a 4-cyclohexenylene group, but the 1,4-phenylene group present in the formula is substituted by one or more alkyl groups, alkoxy groups, alkanoyl groups, cyano groups or halogen atoms having 1 to 7 carbon atoms. Y 6 and Y 7 are each independently a single bond, —CH 2 CH 2 —, —CH 2 O—, —OCH 2 —, —COO—, —OCO—, —C≡C—, — CH = CH-, -CF = CF -, - (CH 2) 4 -, - CH 2 CH 2 CH 2 O -, - OCH 2 CH 2 CH 2 -, - CH = CHCH 2 CH 2 -, - CH 2 CH 2 CH = CH -, - CH = CHCOO -, - OCOCH = CH -, - CH 2 CH 2 COO -, - CH 2 CH 2 OCO -, - COO CH 2 CH 2 - or -OCOCH 2 CH 2 - represents, Y 8 represents a single bond, - The method for producing a patterned retardation film according to claim 6, comprising a compound represented by the formula: O—, —COO—, —OCO— or —CH═CHCOO—.
重合性液晶組成物がベンゼン誘導体、トリフェニレン誘導体、トルキセン誘導体、フタロシアニン誘導体又はシクロヘキサン誘導体を分子の中心の母核とし、直鎖のアルキル基、直鎖のアルコキシ基又は置換ベンゾイルオキシ基がその側鎖として放射状に置換した構造である円盤状液晶化合物を含有する請求項1記載のパターン化位相差フィルムの製造方法。 The polymerizable liquid crystal composition has a benzene derivative, a triphenylene derivative, a truxene derivative, a phthalocyanine derivative or a cyclohexane derivative as a mother nucleus at the center of the molecule, and a linear alkyl group, a linear alkoxy group, or a substituted benzoyloxy group as its side chain. The manufacturing method of the patterned phase difference film of Claim 1 containing the disk shaped liquid crystal compound which is the structure substituted radially. 円盤状液晶化合物が一般式(V)で表される重合性液晶組成物を含有する請求項10記載のパターン化位相差フィルムの製造方法。
Figure 2009276665
(式中、R5はそれぞれ独立して一般式(V-a)で表される置換基を表す。)
Figure 2009276665
(式中、R6及びR7はそれぞれ独立的に水素原子、ハロゲン原子又はメチル基を表し、R8は炭素原子数1〜20アルコキシ基を表すが、該アルコキシ基中の水素原子は一般式(V-b)、一般式(V-c)又は一般式(V-d)で表される置換基によって置換されていても良い。)
Figure 2009276665
(式中、R81、R82、R83、R84、R85、R86、R87、R88及びR89はそれぞれ独立的に水素原子、ハロゲン原子又は炭素原子数1〜5のアルキル基を表し、nは0又は1を表す。)
The manufacturing method of the patterned phase difference film of Claim 10 in which a disk shaped liquid crystal compound contains the polymeric liquid crystal composition represented by general formula (V).
Figure 2009276665
(In the formula, each R 5 independently represents a substituent represented by the general formula (Va).)
Figure 2009276665
(In the formula, R 6 and R 7 each independently represent a hydrogen atom, a halogen atom or a methyl group, and R 8 represents an alkoxy group having 1 to 20 carbon atoms, and the hydrogen atom in the alkoxy group represents a general formula. (It may be substituted by a substituent represented by (Vb), general formula (Vc) or general formula (Vd).)
Figure 2009276665
Wherein R 81 , R 82 , R 83 , R 84 , R 85 , R 86 , R 87 , R 88 and R 89 are each independently a hydrogen atom, a halogen atom or an alkyl group having 1 to 5 carbon atoms. And n represents 0 or 1.)
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