JP2007329398A - Metal deposition method - Google Patents

Metal deposition method Download PDF

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JP2007329398A
JP2007329398A JP2006161158A JP2006161158A JP2007329398A JP 2007329398 A JP2007329398 A JP 2007329398A JP 2006161158 A JP2006161158 A JP 2006161158A JP 2006161158 A JP2006161158 A JP 2006161158A JP 2007329398 A JP2007329398 A JP 2007329398A
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metal
deposition method
substrate
metal deposition
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JP4921861B2 (en
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Genichi Otsu
元一 大津
Tadashi Kawazoe
忠 川添
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Abstract

<P>PROBLEM TO BE SOLVED: To provide a metal deposition method capable of depositing a metal on the surface of a substrate in the atmosphere in nano-order precision without employing a chamber. <P>SOLUTION: The metal deposition method deposits a metal in a minute region that suits minute patterns 12 which are drawn on a photo mask 11. In the metal deposition method, a substrate 13 formed with an organic metal salt film on the surface thereof is disposed in the proximity of a patterned surface of the photo mask 11 having previously formed minute patterns 12. Light is irradiated to the photo mask 11, and near-field light is generated in a local region suiting the minute patterns 12 formed on the patterned surface based on the irradiated light. The metal is discomposed by exposing the organic metal salt film, which is disposed in the proximity of the patterned surface, to the generated near-field light. Then, the discomposed metal is deposited on the substrate 13. <P>COPYRIGHT: (C)2008,JPO&INPIT

Description

本発明は、基板表面に対して金属を大気中においてナノオーダの精度で堆積させる際に好適な金属堆積方法に関する。   The present invention relates to a metal deposition method suitable for depositing a metal on the surface of a substrate with a nano-order accuracy in the air.

近年において、集積回路(IC)の出現から、大規模集積回路(LSI)へと集積度の向上が進み、回路パターンにおける設計寸法につき更なる制約が課され、半導体製造プロセスにおける微細加工の研究が盛んに行われている。   In recent years, the degree of integration has progressed from the advent of integrated circuits (ICs) to large-scale integrated circuits (LSIs), further restricting the design dimensions of circuit patterns, and research into microfabrication in semiconductor manufacturing processes It is actively done.

光リソグラフィは、かかる微細加工の一手段であり、シリコン酸化膜等の基板表面にレジスト膜を形成し、集積回路パターンの描かれたマスクを介して露光することにより当該パターンを転写し、さらにこれを現像して得られたレジストパターンに基づき基板にエッチング等の加工を行う。   Optical lithography is a means of such microfabrication. A resist film is formed on the surface of a substrate such as a silicon oxide film, and the pattern is transferred by exposure through a mask on which an integrated circuit pattern is drawn. The substrate is subjected to processing such as etching based on the resist pattern obtained by developing the substrate.

ところで、近年進んでいる光情報通信の大容量化に伴い、半導体デバイスの更なる高集積化、高密度化を図るべく、ナノメータサイズの集積回路パターンを形成する必要がある。   By the way, with the recent increase in capacity of optical information communication, it is necessary to form a nanometer-sized integrated circuit pattern in order to achieve higher integration and higher density of semiconductor devices.

このため、従来において、近接場光によってのみ発現する非断熱近接場光反応(例えば、非特許文献1参照。)を積極的にフォトリソグラフィに応用することで、使用したフォトレジストが殆ど感度を持たない波長光源を用い、波長の1/4〜1/5の微細なパターニング方法が提案されている(例えば、非特許文献2、3参照。)。   For this reason, conventionally, the used photoresist has almost sensitivity by actively applying a non-adiabatic near-field light reaction (for example, see Non-Patent Document 1) that is expressed only by near-field light to photolithography. There has been proposed a fine patterning method having a wavelength of ¼ to 5 of a wavelength using a non-wavelength light source (see, for example, Non-Patent Documents 2 and 3).

ところで、上述したパターニングを実行しつつ基板上に金属を堆積させるためには、チャンバ内に基板を載置するとともに、近接場光プローブ等を利用して非断熱光化学反応を起こさせる必要がある。即ち、金属を基板上に堆積させる度に、チャンバ内に気体を注入し、その内部気圧や温度を制御し、所定時間に亘り反応を進めていかなければならないため、作業効率が悪化し、また薄膜作製に要する時間も長期化してしまうという問題点もあった。
T.Kawazoe, Y.Yamamoto, and M.Ohtsu, Appl.Phys.Lett., 79, pp.1184 (2001). 羽賀僚一、川添忠、大津元一他、2004春応用物理学会29p-G-2 川添忠、米満広樹、吉田健次、大津元一、2004秋応用物理学会2p-R-18
By the way, in order to deposit metal on the substrate while performing the above-described patterning, it is necessary to place the substrate in the chamber and cause a non-adiabatic photochemical reaction using a near-field optical probe or the like. That is, every time metal is deposited on the substrate, gas must be injected into the chamber, the internal pressure and temperature of the chamber must be controlled, and the reaction must proceed for a predetermined time. There is also a problem that the time required for the thin film preparation is prolonged.
T. Kawazoe, Y. Yamamoto, and M. Ohtsu, Appl. Phys. Lett., 79, pp. 1184 (2001). Ryuichi Haga, Tadashi Kawazoe, Motoichi Otsu et al., 2004 Spring Applied Physics Society 29p-G-2 Tadashi Kawazoe, Hiroki Yonemitsu, Kenji Yoshida, Motoichi Otsu, 2004 Autumn Society of Applied Physics 2p-R-18

このため、本発明は、上述した問題点に鑑みて案出されたものであり、チャンバを利用することなく、基板表面に対して金属を大気中においてナノオーダの精度で堆積させることが可能な金属堆積方法を提供することを目的とする。   For this reason, the present invention has been devised in view of the above-described problems, and a metal capable of depositing metal with a nano-order accuracy in the atmosphere on the substrate surface without using a chamber. An object is to provide a deposition method.

本発明に係る金属堆積方法は、フォトマスクに描かれた微細パターンに応じた微小領域に金属を堆積させる金属堆積方法において、フォトマスクにおける微細パターンが予め形成されたパターニング面に対して、表面に有機金属塩の膜が形成された基板を近接配置し、光を上記フォトマスクへ照射し、上記照射された光に基づき上記パターニング面に形成された微細パターンに応じた局所領域に近接場光を発生させ、その発生させた近接場光により当該パターニング面に近接された有機金属塩の膜を感光させることにより当該金属を分解し、その分解した金属を上記基板上に堆積させることを特徴とする。   The metal deposition method according to the present invention is a metal deposition method in which metal is deposited on a minute region corresponding to a fine pattern drawn on a photomask. A substrate on which an organic metal salt film is formed is placed in close proximity, light is irradiated onto the photomask, and near-field light is applied to a local region corresponding to a fine pattern formed on the patterning surface based on the irradiated light. Generating an organic metal salt film exposed to the patterning surface by the generated near-field light to decompose the metal, and depositing the decomposed metal on the substrate. .

このとき、上記有機金属塩を、Zn−アセチルアセナートで構成するようにしてもよい。   At this time, you may make it comprise the said organometallic salt with Zn-acetylacetonate.

上述した構成からなる本発明においては、チャンバを利用することなく、大気中において上記メカニズムに基づいて金属を堆積させることが可能となることから、作業効率を向上させ、また薄膜作製に要する時間も短期化させることが可能となる。また、基板表面に対して金属を大気中においてナノオーダの精度で堆積させることも可能となる。   In the present invention having the above-described configuration, it is possible to deposit a metal in the atmosphere based on the above mechanism without using a chamber, so that the working efficiency is improved and the time required for thin film production is also increased. It is possible to shorten the time. It is also possible to deposit metal on the surface of the substrate with a nano-order accuracy in the air.

以下、本発明を実施するための最良の形態として、金属を大気中においてナノオーダの精度で堆積させることが可能な金属堆積方法について、図面を参照しながら詳細に説明する。   Hereinafter, as a best mode for carrying out the present invention, a metal deposition method capable of depositing metal in the air with nano-order accuracy will be described in detail with reference to the drawings.

図1は、本発明を適用した金属堆積方法を実施するための装置1の構成を示している。この装置1は、ガラス状のフォトマスク11に予め形成された微細パターン12に応じた基板13上の微小領域に金属を選択的に堆積させるものである。   FIG. 1 shows the configuration of an apparatus 1 for carrying out a metal deposition method to which the present invention is applied. This apparatus 1 selectively deposits metal on a minute region on a substrate 13 corresponding to a minute pattern 12 previously formed on a glass-like photomask 11.

先ず、図1に示すようにサファイヤ等の材質で構成される基板13上に光学不活性な有機金属塩の膜14を塗布する。この膜14を塗布する際には、例えば溶剤(水、アルコール等)に溶かして基板13上に塗布させた後、乾燥させるようにしてもよい。次に、フォトマスク11における微細パターン12面を、この膜14に近接させる。次に、図示しないHgランプからフォトマスク11に対して光を照射する。   First, as shown in FIG. 1, an optically inactive organic metal salt film 14 is applied on a substrate 13 made of a material such as sapphire. When this film 14 is applied, for example, it may be dissolved in a solvent (water, alcohol, etc.) and applied onto the substrate 13 and then dried. Next, the fine pattern 12 surface of the photomask 11 is brought close to the film 14. Next, the photomask 11 is irradiated with light from an unillustrated Hg lamp.

その結果、かかる照射された光に基づき、その表面に形成された微細パターン12におけるエッジ部分から近接場光が滲出することになる。このエッジ部分から滲出した近接場光により膜14を感光させることができる。膜14はHgランプから照射された光に対しては光学不活性であるためこれに特段反応することはなく、あくまで滲出した近接場光のみに対して反応することになる。その結果、微細パターン12におけるエッジ部分に対応した局所領域において選択的に膜14を感光させることができる。   As a result, near-field light exudes from the edge portion of the fine pattern 12 formed on the surface based on the irradiated light. The film 14 can be exposed by the near-field light that has exuded from the edge portion. Since the film 14 is optically inactive with respect to the light irradiated from the Hg lamp, it does not react particularly to this, and it reacts only with the near-field light that has exuded. As a result, the film 14 can be selectively exposed in the local region corresponding to the edge portion in the fine pattern 12.

この膜14において感光した局所領域においては、分解が進行し、有機金属塩中における金属が現れてくることになる。結果として、金属15が、上記近接場光が滲出したナノメータサイズの局所領域に堆積されることになる(図2)。   In the local region exposed in this film 14, decomposition proceeds and metal in the organometallic salt appears. As a result, the metal 15 is deposited on a nanometer-sized local region from which the near-field light has exuded (FIG. 2).

なお、本発明においては、膜14としての有機金属塩について、Zn−アセチルアセナートを適用するようにしてもよい。これにより金属15としてのZnを局所領域に堆積させることが可能となる。2価の金属に対しては2基のアセチルアセナートが結合することになるが、大気中において安定な有機金属膜であれば該当特許の手法を適用することが可能となる。   In the present invention, Zn-acetylacetonate may be applied to the organometallic salt as the film 14. This makes it possible to deposit Zn as the metal 15 in the local region. Two groups of acetylacetonate are bonded to a divalent metal, but the method of the corresponding patent can be applied to an organic metal film that is stable in the atmosphere.

なお、上述した例では、Znを堆積させる場合を例に挙げて説明をしたが、かかる場合に限定されるものではなく、他のいかなる金属についても同様に基板上に堆積することができる。このとき、滲出させた近接場光により金属を分解させる場合のみならず、化合生成等のメカニズムを利用するようにしてもよい。   In the example described above, the case of depositing Zn has been described as an example. However, the present invention is not limited to such a case, and any other metal can be deposited on the substrate in the same manner. At this time, not only the metal is decomposed by the leached near-field light but also a mechanism such as compound generation may be used.

また、滲出された近接場光により、基板13自身の分解生成が期待できる場合には、表面に膜14等を始めとした可反応物を塗布するのを省略するようにしてもよい。   Further, in the case where decomposition and generation of the substrate 13 itself can be expected by the exuded near-field light, it may be omitted to apply a reactive material such as the film 14 on the surface.

特に、本発明においては、チャンバを利用することなく、大気中において上記メカニズムに基づいて金属を堆積させることが可能となることから、作業効率を向上させ、また薄膜作製に要する時間も短期化させることが可能となる。また、基板表面に対して金属を大気中においてナノオーダの精度で堆積させることも可能となる。   In particular, in the present invention, it is possible to deposit metal in the atmosphere based on the above mechanism without using a chamber, so that the working efficiency is improved and the time required for thin film production is shortened. It becomes possible. It is also possible to deposit metal on the surface of the substrate with a nano-order accuracy in the air.

なお、本発明に係る金属堆積方法は、微小電極の作製方法として、或いはナノ構造作製方法として応用することも可能となる。また、本発明に係る金属堆積方法は、有機ELや有機伝導体等で注目されている金属錯体への微小電極作製方法としても応用することができる。   Note that the metal deposition method according to the present invention can also be applied as a method for producing a microelectrode or a method for producing a nanostructure. The metal deposition method according to the present invention can also be applied as a method for producing a microelectrode on a metal complex that is attracting attention in organic EL, organic conductors, and the like.

本発明を適用した金属堆積方法を実施するための装置の構成を示す図である。It is a figure which shows the structure of the apparatus for enforcing the metal deposition method to which this invention is applied. 本発明を適用した金属堆積方法の作用効果について説明するための図である。It is a figure for demonstrating the effect of the metal deposition method to which this invention is applied.

符号の説明Explanation of symbols

1 装置
11 フォトマスク
12 微細パターン
13 基板
14 膜
1 Device 11 Photomask 12 Fine Pattern 13 Substrate 14 Film

Claims (3)

フォトマスクに描かれた微細パターンに応じた微小領域に金属を堆積させる金属堆積方法において、
フォトマスクにおける微細パターンが予め形成されたパターニング面に対して、表面に有機金属塩の膜が形成された基板を近接配置し、
光を上記フォトマスクへ照射し、
上記照射された光に基づき上記パターニング面に形成された微細パターンに応じた局所領域に近接場光を発生させ、
その発生させた近接場光により当該パターニング面に近接された有機金属塩の膜を感光させることにより当該金属を分解し、
その分解した金属を上記基板上に堆積させること
を特徴とする金属堆積方法。
In a metal deposition method of depositing metal on a minute region corresponding to a fine pattern drawn on a photomask,
A substrate having an organic metal salt film formed on the surface is disposed close to a patterning surface on which a fine pattern in a photomask is previously formed,
Irradiate the photomask with light,
Generate near-field light in a local region corresponding to a fine pattern formed on the patterning surface based on the irradiated light,
The metal is decomposed by exposing the organometallic salt film close to the patterning surface by the generated near-field light,
A metal deposition method comprising depositing the decomposed metal on the substrate.
上記金属の堆積を大気中で実行すること
を特徴とする請求項1記載の金属堆積方法。
The metal deposition method according to claim 1, wherein the metal deposition is performed in the atmosphere.
上記有機金属塩は、Zn−アセチルアセナートであること
を特徴とする請求項1又は2記載の金属堆積方法。
The metal deposition method according to claim 1, wherein the organometallic salt is Zn-acetylacetonate.
JP2006161158A 2006-06-09 2006-06-09 Metal deposition method Expired - Fee Related JP4921861B2 (en)

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Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003218118A (en) * 2002-01-03 2003-07-31 Samsung Electronics Co Ltd Manufacturing method for metal or metal oxide fine pattern
JP2004235574A (en) * 2003-01-31 2004-08-19 Japan Science & Technology Agency Method of forming resist pattern and method of fabricating device
JP2005257923A (en) * 2004-03-10 2005-09-22 National Institute Of Advanced Industrial & Technology Lithography mask and method for making fine pattern
JP2005530348A (en) * 2002-06-12 2005-10-06 サムスン エレクトロニクス カンパニー リミテッド Method for forming metal pattern and method for manufacturing thin film transistor substrate using the same
JP2006071913A (en) * 2004-09-01 2006-03-16 Chiba Univ Resist pattern forming method
JP2006080467A (en) * 2004-09-13 2006-03-23 Toshiba Corp Exposure method
JP2006128691A (en) * 2004-10-27 2006-05-18 Samsung Electronics Co Ltd Manufacturing method for tft, and display device

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003218118A (en) * 2002-01-03 2003-07-31 Samsung Electronics Co Ltd Manufacturing method for metal or metal oxide fine pattern
JP2005530348A (en) * 2002-06-12 2005-10-06 サムスン エレクトロニクス カンパニー リミテッド Method for forming metal pattern and method for manufacturing thin film transistor substrate using the same
JP2004235574A (en) * 2003-01-31 2004-08-19 Japan Science & Technology Agency Method of forming resist pattern and method of fabricating device
JP2005257923A (en) * 2004-03-10 2005-09-22 National Institute Of Advanced Industrial & Technology Lithography mask and method for making fine pattern
JP2006071913A (en) * 2004-09-01 2006-03-16 Chiba Univ Resist pattern forming method
JP2006080467A (en) * 2004-09-13 2006-03-23 Toshiba Corp Exposure method
JP2006128691A (en) * 2004-10-27 2006-05-18 Samsung Electronics Co Ltd Manufacturing method for tft, and display device

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