JP2006339749A - Quartz vibrator and method of manufacturing the same - Google Patents

Quartz vibrator and method of manufacturing the same Download PDF

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JP2006339749A
JP2006339749A JP2005158824A JP2005158824A JP2006339749A JP 2006339749 A JP2006339749 A JP 2006339749A JP 2005158824 A JP2005158824 A JP 2005158824A JP 2005158824 A JP2005158824 A JP 2005158824A JP 2006339749 A JP2006339749 A JP 2006339749A
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quartz
vibration
thin
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blank plate
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JP4599231B2 (en
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Makoto Sano
誠 佐野
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Kyocera Crystal Device Corp
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Abstract

<P>PROBLEM TO BE SOLVED: To provide a method of manufacturing a quartz vibrator consisting of a vibration section of a thin-piece vibration blank plate and a reinforcing section surrounding it, and to provide the vibrator. <P>SOLUTION: In order to achieve the above purpose, the method of manufacturing the quartz vibrator, in which the vibration section of the quartz thin and blank plate having many pieces of quartz vibrators formed on one wafer and reinforcing section surrounding it are integrally formed, has a process of forming an electrode on a vibration region of the quartz thin and blank plate; a process of masking a vibration portion including the electrode of the thin-piece blank plate; a process of vapor depositing a desired thickness oxide silicon on the vicinity of the masking portion of the thin-piece blank plate; and an a process of peeling the masking portion from the thin-piece blank plate. Photolithography is used to mask the resonating region of the thin-piece blank plate, and the oxide silicon vapor depositing layer for surrounding the vibrator for surrounding the vibrator is deposited and formed on the quartz thin and blank plate having a portion where an electrode to be formed and is used as a vibration portion. Thus, the above problem is solved. <P>COPYRIGHT: (C)2007,JPO&INPIT

Description

本発明は水晶デバイスに属し、主として通信分野の伝送系装置に使用される水晶発振器に用いられる厚み滑り振動をする水晶振動子の製造方法、及びその水晶振動子に関する。   The present invention relates to a quartz crystal device and relates to a method of manufacturing a quartz crystal resonator that performs thickness-shear vibration used in a crystal oscillator mainly used in a transmission system apparatus in the communication field, and the crystal resonator.

昨今の移動体や情報通信機器などに用いられる水晶振動子やフィルタなどの圧電デバイスは機器の小型化、及びデジタル化への展開と相まって、超高周波化・高帯域化といったように基本仕様が高機能化する傾向にある。また先述の機器などの著しい小型化に伴い、これらの機器に用いられる水晶振動子などの搭載される電子部品についても更なる小型化が急速に求められているのが現状である。   Piezoelectric devices such as crystal resonators and filters used in recent mobile objects and information communication equipment have high basic specifications such as ultra-high frequency and high bandwidth, coupled with the development of miniaturization and digitalization of equipment. There is a tendency to become functional. In addition, along with the remarkable miniaturization of the above-described devices, there is a rapid demand for further miniaturization of electronic components mounted on crystal devices and the like used in these devices.

高周波を発振させる為の、従来の技術の一例としては、水晶振動子容器のなかに搭載される水晶素板の主面の一部に、フォトリソグラフィとエッチングにより矩形状で凹状の窪みが形成され、この凹状部分の厚みは所望する周波数の振動が得られる厚さとなるようエッチングされ、厚み滑り振動モードの振動領域部とされている。この振動領域部の周囲には、この振動領域部を支持し補強するより厚みのある補強部が先述の凹状部分と一体となって形成されている。   As an example of conventional technology for oscillating high frequencies, a rectangular concave recess is formed by photolithography and etching on a part of the main surface of a quartz base plate mounted in a quartz resonator container. The thickness of the concave portion is etched so as to obtain a vibration having a desired frequency, thereby forming a vibration region portion in a thickness-shear vibration mode. Around the vibration region portion, a thicker reinforcing portion that supports and reinforces the vibration region portion is formed integrally with the concave portion described above.

ATカット水晶振動子の振動モードは厚み滑り振動であり、その周波数は先述の振動領域部の厚みに反比例するために、高周波化を図るためには振動領域部の厚さを薄くする必要がある。この振動領域部厚みよりも厚い先述の補強部とが一体で形成された図5に示されるような水晶振動子の場合は凹状部分の圧電振動領域部の厚みは約2μm、基本波の厚み滑り振動周波数が約800MHzの水晶振動子が作られている。   The vibration mode of the AT-cut quartz resonator is thickness-shear vibration, and its frequency is inversely proportional to the thickness of the vibration region described above. Therefore, to increase the frequency, it is necessary to reduce the thickness of the vibration region. . In the case of the quartz crystal resonator as shown in FIG. 5 integrally formed with the above-described reinforcing portion thicker than the thickness of the vibration region portion, the thickness of the piezoelectric vibration region portion of the concave portion is about 2 μm, and the thickness slip of the fundamental wave A quartz crystal having a vibration frequency of about 800 MHz is made.

特開2000−031769号公報JP 2000-031769 A 特開2001−168674号公報JP 2001-168673 A 特開2004−040198号公報JP 2004-040198 A 特開2003−309445号公報JP 2003-309445 A

なお、出願人は前記した先行技術文献情報で特定される先行技術文献以外には、本発明に関連する先行技術文献を、本件出願時までに発見するに至らなかった。   The applicant has not found any prior art documents related to the present invention other than the prior art documents specified by the prior art document information described above by the time of filing of the present application.

しかしながら、先述の水晶振動子の振動部の厚みは、補強部の厚みの1/10以下といったように非常に薄いもので、その為に水晶振動子の振動部と一体と成っている周囲部分の僅かな機械的な歪みの影響も受けやすい構造と成っており、先の機械的な歪みは振動部の薄板の厚みを変化させて、その結果、主振動以外の多数の不要なスプリアス振動の発生を招くおそれがあった。   However, the thickness of the vibration part of the crystal unit described above is very thin, such as 1/10 or less of the thickness of the reinforcement part. The structure is easily affected by slight mechanical distortion, and the previous mechanical distortion changes the thickness of the vibration plate, resulting in the generation of many unnecessary spurious vibrations other than the main vibration. There was a risk of inviting.

以上を鑑みて、この様な一体形状をした水晶振動子の振動部は厚い補強部の厚みから、所望の周波数が得られる振動部の厚みとなるまでエッチング加工により形成され、上述したように水晶素板薄板の振動部とその周囲を囲う水晶素板厚板の補強部とから成る形状をした水晶振動子が、多数個一枚のウェハー上にパターンニングされているのが一般的である。   In view of the above, the vibration part of the crystal resonator having such an integrated shape is formed by etching from the thickness of the thick reinforcement part to the thickness of the vibration part at which a desired frequency can be obtained. In general, a large number of crystal resonators each having a shape including a vibrating portion of a base plate thin plate and a reinforcing portion of a quartz base plate thick plate surrounding the substrate are patterned on a single wafer.

しかしながら、振動部の厚みが数μm以下(例えば3μm程度)になるとエッチングむらにより凹状の振動部内での厚みのばらつきが発生し、周波数の振動部内分布が悪くなり安定した周波数を得ることが出来ないおそれがあるといった問題があった。   However, when the thickness of the vibration part becomes several μm or less (for example, about 3 μm), unevenness in etching occurs due to uneven etching, and the distribution of the frequency in the vibration part deteriorates, so that a stable frequency cannot be obtained. There was a problem of fear.

一枚のウェハー上に多数個の水晶振動子が形成される場合、その各々の水晶振動子の振動特性にばらつきが生じて安定した品質が得られず、その結果、生産の歩留まりが悪化するおそれがあるといった問題があった。   When a large number of crystal resonators are formed on a single wafer, the vibration characteristics of each crystal resonator vary and stable quality cannot be obtained, resulting in a decrease in production yield. There was a problem that there was.

本発明は、以上のような技術的背景のもとで成されたものであり、従がってその目的は、薄片振動素板の振動部とその周囲を囲う補強部から成る水晶振動子の製造方法、及びその水晶振動子を提供することである。   The present invention has been made under the technical background as described above. Accordingly, the object of the present invention is to provide a quartz resonator including a vibrating portion of a thin-plate vibrating element plate and a reinforcing portion surrounding the periphery thereof. It is to provide a manufacturing method and a crystal resonator thereof.

上記の目的を達成するために、本発明の水晶振動子の製造方法は、一枚のウェハー上に多数個の水晶振動子が形成された、水晶薄片素板の振動部と該振動部の周囲を囲う補強部が一体と成った厚み滑り振動をする水晶振動子の製造方法において、水晶薄片素板の振動領域とする部分に電極部を形成する工程(S101)と、水晶薄片素板の電極を含む振動部分にマスキングを施す工程(S102)と、水晶薄片素板のマスキングされた部分の周辺に所望の厚さの酸化シリコンを蒸着する工程(S103)と、マスキングされた部分を該水晶薄片素板から剥離する工程(S104)を有することを特徴とする。   In order to achieve the above object, a method for manufacturing a quartz crystal resonator according to the present invention includes a vibrating portion of a quartz thin piece base plate in which a large number of quartz crystal resonators are formed on a single wafer, and a periphery of the vibrating portion. A step of forming an electrode portion in a portion to be a vibration region of the quartz thin plate element (S101), and a method of manufacturing the quartz thin plate element electrode, (S102) for masking the vibrating portion including the step of depositing silicon oxide with a desired thickness on the periphery of the masked portion of the quartz thin plate (S103); It has the process (S104) which peels from a base plate, It is characterized by the above-mentioned.

また、フォトリソグラフィを用いて水晶薄片素板の振動領域とする部分にマスキングを施すことを特徴とする。   Further, the present invention is characterized in that masking is performed on a portion to be a vibration region of the quartz thin plate element using photolithography.

また、電極が形成され振動部となる部分を有する水晶薄片素板上に、振動部の周囲を囲むように酸化シリコンの蒸着層が堆積して形成されたことを特徴とする。   Further, the present invention is characterized in that a vapor deposition layer of silicon oxide is formed on a quartz thin plate having a portion where an electrode is formed to be a vibrating portion so as to surround the vibrating portion.

本発明の水晶振動子の製造方法によれば、厚みばらつきが非常に小さな水晶薄片素板を用いる為に、周波数の振動部内分布が著しく良い安定した品質の水晶振動子を得ることが出来る。   According to the method for manufacturing a crystal resonator of the present invention, since a quartz thin plate element having a very small thickness variation is used, it is possible to obtain a stable quality crystal resonator having a remarkably good frequency distribution in the vibration part.

また、水晶振動子の振動面の形成をエッチングによらないために生産歩留まりを高めることが出来る。   Further, since the formation of the vibration surface of the crystal resonator is not based on etching, the production yield can be increased.

また、エッチングによらず、蒸着により振動部の周囲を囲う酸化シリコンの補強部が形成されるために、水晶薄片素板の厚みを始めから目的の周波数が得られる厚みとすることが出来る。   In addition, since the silicon oxide reinforcing portion surrounding the vibrating portion is formed by vapor deposition without using etching, the thickness of the quartz thin plate element can be set to a thickness at which a target frequency can be obtained from the beginning.

以下に図面を参照しながら本発明の実施の一形態について説明する。なお、各図においての同一の符号は同じ対象を示すものとする。   Hereinafter, an embodiment of the present invention will be described with reference to the drawings. In addition, the same code | symbol in each figure shall show the same object.

図1は本発明の水晶振動子2の製造方法の工程図である。即ち、一枚のウェハー1上に多数個の水晶振動子2が形成された、水晶薄片素板3の振動部4と振動部の周囲を囲う酸化シリコン(SiO)の蒸着層5が一体と成った厚み滑り振動をする水晶振動子2の製造方法であり、最初に水晶薄片素板3の振動領域とする部分に電極7を形成し(S101)、次に水晶薄片素板3の電極7の振動部分にマスキングを施し(S102)、それから先述の水晶薄片素板3のマスキングされた部分の周辺に所望の厚さ8の酸化シリコンを蒸着し(S103)、最後にマスキングされた部分を水晶薄片素板3から剥離する工程(S104)を有するものである。本発明の水晶振動子2の製造方法によれば、厚みばらつきが非常に小さな、始めから、所望の周波数を得ることが出来る厚みの水晶薄片素板3を用いる為に、周波数の振動部内分布が著しく良い安定した品質の水晶振動子2を得ることが出来る。なお、水晶薄片素板の振動領域とする部分に電極部を形成する工程(S101)は、必ずしも水晶薄片素板の電極を含む振動部分にマスキングを施す工程(S102)の前に実施されなくとも構わず、マスキングされた部分を水晶薄片素板から剥離する工程(S104)の後に行っても全く構わず、この場合においても本発明の技術的範囲に含まれることは言うまでもない。なお、マスキングされた部分を水晶薄片素板から剥離するには、液剤を用いた化学的な方法が繊細な構造をもつ振動領域に損傷を与えるおそれ無く用いることが出来る。 FIG. 1 is a process diagram of a method for manufacturing a crystal resonator 2 according to the present invention. That is, the vibrating portion 4 of the quartz thin piece base plate 3 in which a large number of crystal resonators 2 are formed on a single wafer 1 and the vapor deposition layer 5 of silicon oxide (SiO 2 ) surrounding the vibrating portion are integrated. In this method of manufacturing the quartz crystal resonator 2 that undergoes thickness shear vibration, an electrode 7 is first formed in a portion to be a vibration region of the crystal thin plate 3 (S101), and then the electrode 7 of the crystal thin plate 3 is formed. Is masked (S102), and silicon oxide having a desired thickness of 8 is deposited around the masked portion of the quartz thin plate 3 (S103). Finally, the masked portion is crystallized. It has the process (S104) which peels from the thin piece base plate 3. FIG. According to the method for manufacturing the quartz crystal resonator 2 of the present invention, since the thickness variation is very small, the quartz thin plate 3 having a thickness capable of obtaining a desired frequency from the beginning is used. It is possible to obtain a crystal unit 2 having a remarkably good and stable quality. It should be noted that the step (S101) of forming the electrode portion in the portion to be the vibration region of the quartz thin plate element plate is not necessarily performed before the step (S102) of masking the vibrating portion including the electrode of the quartz thin plate element plate. Needless to say, it may be performed after the step (S104) of peeling the masked portion from the quartz thin plate, and it goes without saying that this case is also included in the technical scope of the present invention. In order to peel the masked portion from the quartz thin plate, a chemical method using a liquid agent can be used without fear of damaging the vibration region having a delicate structure.

図2は本発明の水晶振動子2を側面方向からみた概略の側面模式図である。図2は概略の側面図であり示されてはいないが、次の図3にあるように、水晶振動子2の中央部は凹んだ凹形状をしている。本発明の水晶振動子2の製造方法によれば、この凹形状の形成にはエッチングによらず、蒸着により振動部4の周囲を囲う酸化シリコンの補強部が形成されるために、水晶薄片素板3の厚みを始めから目的の周波数が得られる厚みとすることが出来、生産効率を著しく高めることが出来る。   FIG. 2 is a schematic side view of the crystal resonator 2 of the present invention as viewed from the side. Although FIG. 2 is a schematic side view and is not shown, the center portion of the crystal unit 2 has a concave shape as shown in FIG. According to the method for manufacturing the quartz crystal resonator 2 of the present invention, the formation of the concave shape is not performed by etching, but the silicon oxide reinforcing portion surrounding the vibrating portion 4 is formed by vapor deposition. The thickness of the plate 3 can be made from the beginning to obtain a desired frequency, and the production efficiency can be remarkably increased.

図3は本発明の水晶振動子2を斜め上面方向からみた概略の上面斜視図である。なお、水晶薄片素板3は従来の研削加工によって形成されたものや、CVDなどの成膜方法によって形成されたものを使用することが出来る。また、補強部を形成する物質は、補強の効果を持ち、厚みのある層を成して、かつ振動部4の振動特性を抑制するものでなければ酸化シリコン(SiO)に限られるものでは無く、その形成方法も蒸着法に限らず、EB(電子ビーム)、スパッタリング、CVDといった方法でも全く構わず、これらの場合においても本発明の技術的範囲に含まれることは言うまでもない。 FIG. 3 is a schematic top perspective view of the crystal unit 2 of the present invention as seen from the oblique top direction. In addition, the quartz thin piece base plate 3 can use what was formed by the conventional grinding process, and what was formed by film-forming methods, such as CVD. The material forming the reinforcing portion is not limited to silicon oxide (SiO 2 ) unless it has a reinforcing effect, forms a thick layer, and does not suppress the vibration characteristics of the vibrating portion 4. In addition, the formation method is not limited to the vapor deposition method, and any method such as EB (electron beam), sputtering, or CVD may be used. It goes without saying that these cases are also included in the technical scope of the present invention.

図4は本発明の水晶振動子2が多数個一枚のウェハー1上に形成された様子を示す、ウェハー1の上面方向からみた概略の上面模式図である。この様に本発明の水晶振動子2では一枚のウェハー1上に多数の水晶振動子2を形成することにより、一括的に各々の水晶振動子2の製造工程を行うことが出来るために、著しく生産効率良く水晶振動子2を製造することが出来るといった効果を奏する。   FIG. 4 is a schematic top view as seen from the upper surface direction of the wafer 1, showing a state in which a large number of crystal resonators 2 of the present invention are formed on a single wafer 1. Thus, in the crystal resonator 2 of the present invention, by forming a large number of crystal resonators 2 on a single wafer 1, the manufacturing process of each crystal resonator 2 can be performed collectively. The crystal resonator 2 can be manufactured with extremely high production efficiency.

図5は従来の水晶振動子2を斜め上面からみた概略の上面斜視図である。従来の水晶振動子2では、エッチングの工程を必要とするために薄い振動部4の厚みが数μm以下になるとエッチングむらにより凹状の振動部4内での厚みのばらつきが発生し、周波数の振動部内分布が悪くなり安定した周波数を得ることが出来ないおそれがあるといった問題があった。   FIG. 5 is a schematic top perspective view of the conventional crystal resonator 2 as seen from an oblique top surface. In the conventional crystal unit 2, since an etching process is required, if the thickness of the thin vibrating part 4 becomes several μm or less, the unevenness in the thickness of the concave vibrating part 4 occurs due to uneven etching, and the vibration of the frequency There is a problem that the internal distribution is deteriorated and a stable frequency may not be obtained.

本発明の水晶振動子の製造方法の工程図である。It is process drawing of the manufacturing method of the crystal oscillator of this invention. 本発明の水晶振動子を側面方向からみた概略の側面模式図である。It is the schematic side surface figure which looked at the crystal oscillator of this invention from the side surface direction. 本発明の水晶振動子を斜め上面方向からみた概略の上面斜視図である。1 is a schematic top perspective view of a crystal resonator according to an embodiment of the present invention when viewed from an oblique top surface direction. 本発明の水晶振動子が、多数個一枚のウェハー上に形成された様子を示す、ウェハーの上面方向からみた概略の上面模式図である。FIG. 3 is a schematic top plan view seen from the top surface of the wafer, showing a state in which a large number of crystal resonators of the present invention are formed on a single wafer. 従来の水晶振動子を斜め上面からみた概略の上面斜視図である。It is the outline top perspective view which looked at the conventional crystal oscillator from the slanting upper surface.

符号の説明Explanation of symbols

1 ウェハー
2 水晶振動子
3 水晶薄片素板
4 振動部
5 酸化シリコンの蒸着層
6 振動領域とする部分
7 電極部
8 (酸化シリコン)厚さ
DESCRIPTION OF SYMBOLS 1 Wafer 2 Crystal oscillator 3 Crystal thin piece base plate 4 Vibrating part 5 Silicon oxide vapor deposition layer 6 Vibrating area part 7 Electrode part 8 (silicon oxide) thickness

Claims (3)

一枚のウェハー上に多数個の水晶振動子が形成された、水晶薄片素板の振動部と該振動部の周囲を囲う補強部が一体と成った厚み滑り振動をする水晶振動子の製造方法において、
水晶薄片素板の振動領域とする部分に電極を形成する工程と
該水晶薄片素板の電極を含む振動部分にマスキングを施す工程と、
該水晶薄片素板のマスキングされた部分の周辺に所望の厚さの酸化シリコンを蒸着する工程と、
該マスキングを該水晶薄片素板から剥離する工程と、
を有する水晶振動子の製造方法。
A method of manufacturing a quartz crystal resonator having a thickness sliding vibration in which a plurality of crystal resonators are formed on a single wafer, and a vibrating portion of a quartz thin plate and a reinforcing portion surrounding the vibrating portion are integrated. In
A step of forming an electrode in a portion to be a vibration region of the quartz thin plate, a step of masking a vibrating portion including the electrode of the quartz thin plate,
Depositing a desired thickness of silicon oxide around the masked portion of the quartz flake plate;
Peeling the masking from the quartz flake base plate;
A method of manufacturing a crystal resonator having
フォトリソグラフィを用いて該水晶薄片素板の振動領域とする部分にマスキングを施す請求項1に記載の水晶振動子の製造方法。 The method for manufacturing a crystal resonator according to claim 1, wherein masking is applied to a portion to be a vibration region of the quartz thin plate element using photolithography. 電極が形成され振動部となる部分を有する水晶薄片素板上に、該振動部の周囲を囲むように酸化シリコンの蒸着層が堆積して形成されたことを特徴とする厚み滑り振動をする水晶振動子。 A quartz crystal that vibrates in a thickness-shear manner, characterized in that an evaporated layer of silicon oxide is deposited on a quartz thin plate having a portion that becomes an oscillating portion and that serves as a oscillating portion, surrounding the oscillating portion. Vibrator.
JP2005158824A 2005-05-31 2005-05-31 Quartz crystal manufacturing method and crystal resonator Expired - Fee Related JP4599231B2 (en)

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100856293B1 (en) 2007-05-04 2008-09-03 삼성전기주식회사 A crystal device fabrication method
KR100878410B1 (en) 2007-07-11 2009-01-13 삼성전기주식회사 A crystal device fabrication method
WO2010143475A1 (en) * 2009-06-09 2010-12-16 株式会社村田製作所 Method of producing piezoelectric device

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JPH08213871A (en) * 1995-02-03 1996-08-20 Sumitomo Electric Ind Ltd Crystal vibrator and its manufacture
JP2003289236A (en) * 2002-03-28 2003-10-10 Humo Laboratory Ltd Quartz oscillator and manufacturing method therefor
JP2005295042A (en) * 2004-03-31 2005-10-20 Kyocera Kinseki Corp Method of manufacturing high-frequency crystal vibration plate

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JPH08213871A (en) * 1995-02-03 1996-08-20 Sumitomo Electric Ind Ltd Crystal vibrator and its manufacture
JP2003289236A (en) * 2002-03-28 2003-10-10 Humo Laboratory Ltd Quartz oscillator and manufacturing method therefor
JP2005295042A (en) * 2004-03-31 2005-10-20 Kyocera Kinseki Corp Method of manufacturing high-frequency crystal vibration plate

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100856293B1 (en) 2007-05-04 2008-09-03 삼성전기주식회사 A crystal device fabrication method
KR100878410B1 (en) 2007-07-11 2009-01-13 삼성전기주식회사 A crystal device fabrication method
WO2010143475A1 (en) * 2009-06-09 2010-12-16 株式会社村田製作所 Method of producing piezoelectric device
JP5152410B2 (en) * 2009-06-09 2013-02-27 株式会社村田製作所 Method for manufacturing piezoelectric device
US9197184B2 (en) 2009-06-09 2015-11-24 Murata Manufacturing Co., Ltd. Method for manufacturing piezoelectric device

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