JP2005321305A - Electronic component measurement jig - Google Patents

Electronic component measurement jig Download PDF

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JP2005321305A
JP2005321305A JP2004139785A JP2004139785A JP2005321305A JP 2005321305 A JP2005321305 A JP 2005321305A JP 2004139785 A JP2004139785 A JP 2004139785A JP 2004139785 A JP2004139785 A JP 2004139785A JP 2005321305 A JP2005321305 A JP 2005321305A
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electronic component
chip
measurement
jig
measuring
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Hiromichi Kitajima
宏通 北島
Mitsuhide Katou
充英 加藤
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Murata Manufacturing Co Ltd
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Murata Manufacturing Co Ltd
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Abstract

<P>PROBLEM TO BE SOLVED: To allow a chip type electronic component 30 to be held parallel to an electronic component measuring jig 10, for measuring the electric characteristics of the electronic component 30, when the electronic component 30 is pressed against the measuring jig 10, measure the electric characteristics of the electronic component 30 accurately without damaging it, and increase the life of an anisotropic electric conductive sheet 20. <P>SOLUTION: The measuring jig 10 has measuring electrodes 12 to 17 on an electronic component measuring surface 21 at positions corresponding to external electrodes 31 of the electronic component 30. The measuring jig 10 is provided with protrusions 18, 19 on the electronic component measuring surface 21 which restrict tilting of the electronic component 30 owing to a deviation of a pressing position, when the electronic component 30 is pressed through the anisotropic electric conductive sheet 20 to measure the electric characteristics of the electronic component 30. <P>COPYRIGHT: (C)2006,JPO&NCIPI

Description

本発明は、チップ型電子部品の電気的特性を測定するための電子部品測定治具に関する。   The present invention relates to an electronic component measuring jig for measuring electrical characteristics of a chip-type electronic component.

従来、電子部品の製造後に当該電子部品の良品、不良品を判別するために、その電気的特性、例えば静電容量、電気抵抗など各種の測定が行われている。例えば、多端子型のセラミック電子部品の電気的特性を測定する場合、プローブピンなどの測定端子を押し当てて測定するが、チップ型電子部品などの小さいものは電子部品の外部電極パターンに合わせてパターン化された測定電極が形成された電子部品測定治具が用いられる。   Conventionally, in order to discriminate between good and defective electronic parts after the electronic parts are manufactured, various measurements such as their electrical characteristics such as capacitance and electric resistance have been performed. For example, when measuring the electrical characteristics of a multi-terminal type ceramic electronic component, measure it by pressing a measuring terminal such as a probe pin, but small components such as a chip-type electronic component should be matched to the external electrode pattern of the electronic component. An electronic component measurement jig on which a patterned measurement electrode is formed is used.

図７および図８に、電子部品測定治具７０の一例を示す（特許文献１参照）。電子部品測定治具７０は、基材７１の電子部品測定面８１に測定電極７２〜７７を設けた構造をしている。電気的特性の測定に際しては、その測定電極７２〜７７にチップ型電子部品９０の外部電極９１が当接するように、電子部品測定治具７０上にチップ型電子部品９０を載置する。この場合、測定電極７２〜７７の外側端に図示略の測定器が電気的に接続される。上記測定では、チップ型電子部品９０の下面に形成されている外部電極９１の厚みにばらつきが存在する場合、全ての外部電極９１を同時に測定電極７２〜７７に接触させることはできない。そこで、チップ型電子部品９０と電子部品測定治具７０との間に当該チップ型電子部品９０の外部電極９１と電子部品測定治具７０の測定電極７２〜７７との導通をとるための異方性導電シート８０を介在させて押圧するとともに上記厚みのばらつきを吸収するように該異方性導電シート８０を弾性変形させることで、外部電極９１それぞれと測定電極７２〜７７それぞれとの対応した個別導通をとっている。   7 and 8 show an example of the electronic component measuring jig 70 (see Patent Document 1). The electronic component measurement jig 70 has a structure in which measurement electrodes 72 to 77 are provided on an electronic component measurement surface 81 of a base material 71. When measuring the electrical characteristics, the chip-type electronic component 90 is placed on the electronic component measurement jig 70 so that the external electrodes 91 of the chip-type electronic component 90 are in contact with the measurement electrodes 72 to 77. In this case, a measuring instrument (not shown) is electrically connected to the outer ends of the measuring electrodes 72 to 77. In the above measurement, when there is a variation in the thickness of the external electrode 91 formed on the lower surface of the chip-type electronic component 90, all the external electrodes 91 cannot be brought into contact with the measurement electrodes 72 to 77 at the same time. Therefore, an anisotropy for establishing conduction between the external electrode 91 of the chip type electronic component 90 and the measurement electrodes 72 to 77 of the electronic component measurement jig 70 between the chip type electronic component 90 and the electronic component measurement jig 70. The anisotropic conductive sheet 80 is elastically deformed so as to absorb the variation in thickness while being pressed with the conductive conductive sheet 80 interposed therebetween, so that each of the external electrodes 91 and the measurement electrodes 72 to 77 correspond to each other. The continuity is taken.

しかしながら、このような異方性導電シート８０を介在させる測定においては、チップ型電子部品９０を押圧する際に、チップ型電子部品９０の重心付近を押圧できれば、外部電極９１と測定電極７２〜７７との間にある異方性導電シート８０の各部に均等に力をかけることができる。しかし、実際には、チップ型電子部品９０の押圧面の形状等により、重心付近を押圧するのは困難であり、図８に示すように、重心から偏った位置が押圧されてチップ型電子部品９０が傾いて導通されることになる。例えば、チップ型電子部品９０にＳＡＷフィルタのように大型の部品が搭載されている場合、この大型の部品を押圧して測定することになるが、大型の部品が必ずしもチップ型電子部品９０の重心に搭載されているとは限らず、押圧位置がチップ型電子部品９０の重心から偏った位置になることがある。   However, in such measurement with the anisotropic conductive sheet 80 interposed, the external electrode 91 and the measurement electrodes 72 to 77 can be used if the vicinity of the center of gravity of the chip type electronic component 90 can be pressed when the chip type electronic component 90 is pressed. A force can be applied evenly to each part of the anisotropic conductive sheet 80 between the two. However, in practice, it is difficult to press the vicinity of the center of gravity due to the shape of the pressing surface of the chip type electronic component 90, etc., and the position offset from the center of gravity is pressed as shown in FIG. 90 is inclined to conduct. For example, when a large-sized component such as a SAW filter is mounted on the chip-type electronic component 90, measurement is performed by pressing the large-sized component. The pressing position may be a position deviated from the center of gravity of the chip-type electronic component 90.

その結果、異方性導電シート８０の所定箇所のみが特に押圧されることになり、これを繰り返すうちに当該押圧部分が塑性変形して元の形状に復帰しなくなる。これにより、電気的特性を正確に測定することができなくなり、異方性導電シート８０の寿命が短くなるという課題があった。また、チップ型電子部品９０が傾いて押圧されることにより、チップ型電子部品９０が破損するという課題もあった。
特開２０００−３５６６５０号公報 As a result, only a predetermined portion of the anisotropic conductive sheet 80 is particularly pressed, and the pressed portion is plastically deformed and does not return to the original shape while repeating this. As a result, the electrical characteristics cannot be measured accurately, and there is a problem that the life of the anisotropic conductive sheet 80 is shortened. Further, there is a problem that the chip-type electronic component 90 is damaged when the chip-type electronic component 90 is inclined and pressed.
JP 2000-356650 A

したがって、本発明により解決すべき課題は、チップ型電子部品を電子部品測定治具に押圧した際に、チップ型電子部品を電子部品測定治具に対して平行に保持可能としてチップ型電子部品を破損することなくその電気的特性の正確な測定と異方性導電シートの長寿命化の達成とを可能にすることである。   Therefore, the problem to be solved by the present invention is that when the chip-type electronic component is pressed against the electronic component measurement jig, the chip-type electronic component can be held parallel to the electronic component measurement jig. It is possible to accurately measure the electrical characteristics of the anisotropic conductive sheet and achieve a long life of the anisotropic conductive sheet without breakage.

本発明は、チップ型電子部品の外部電極に対応する位置において、電子部品測定面に測定電極を有した電子部品測定治具であって、異方性導電シートを介してチップ型電子部品が圧接され、当該チップ型電子部品の電気的特性を測定する際に、押圧位置の偏りに起因して当該チップ型電子部品が傾斜するのを規制する突起を上記電子部品測定面に設けたものである。   The present invention provides an electronic component measurement jig having a measurement electrode on an electronic component measurement surface at a position corresponding to an external electrode of a chip electronic component, wherein the chip electronic component is press-contacted via an anisotropic conductive sheet. In addition, when measuring the electrical characteristics of the chip-type electronic component, the electronic component measurement surface is provided with a protrusion that restricts the chip-type electronic component from being inclined due to the bias of the pressing position. .

上記突起は、押圧位置が偏っている側において、１箇所でもよく、また複数設けられていてもよい。複数設ける例として、例えば矩形の電子部品測定面の押圧位置の偏っている側における端縁の両端や四隅に設ける。   One protrusion may be sufficient as the said protrusion on the side where the press position is biased, and multiple may be provided. As an example of providing a plurality, for example, it is provided at both ends and four corners of the edge on the side where the pressing position of the rectangular electronic component measurement surface is biased.

本発明の電子部品測定治具によると、チップ型電子部品を異方性導電シートを介して電子部品測定治具に押圧した際に、チップ型電子部品が突起に当接して電子部品測定治具に対して平行に保持され、チップ型電子部品が均一に異方性導電シートに押圧される。その結果、測定時にチップ型電子部品ががたつくことなく電気的特性を正確に測定でき、かつ、チップ型電子部品を破損することなく、異方性導電シートの長寿命化も図れる。   According to the electronic component measuring jig of the present invention, when the chip type electronic component is pressed against the electronic component measuring jig through the anisotropic conductive sheet, the chip type electronic component comes into contact with the protrusion and the electronic component measuring jig The chip-type electronic component is uniformly pressed against the anisotropic conductive sheet. As a result, the electrical characteristics can be accurately measured without the chip-type electronic component being swayed during measurement, and the life of the anisotropic conductive sheet can be extended without damaging the chip-type electronic component.

また、電子部品測定面に複数の突起を設けることで、チップ型電子部品の保持が安定し、より正確に電気的特性の測定が行える。   Also, by providing a plurality of protrusions on the electronic component measurement surface, the chip-type electronic component can be held stably, and the electrical characteristics can be measured more accurately.

本発明の電子部品測定治具によると、チップ型電子部品を電子部品測定治具に押圧した際に、チップ型電子部品が電子部品測定治具に対して平行に保持され、チップ型電子部品を破損することなく電気的特性を正確に測定でき、異方性導電シートの長寿命化も図れる。   According to the electronic component measuring jig of the present invention, when the chip type electronic component is pressed against the electronic component measuring jig, the chip type electronic component is held in parallel to the electronic component measuring jig, and the chip type electronic component is Electrical characteristics can be measured accurately without breakage, and the life of the anisotropic conductive sheet can be extended.

本発明の最良の実施形態を図１ないし図３に基づいて説明する。   The best mode for carrying out the present invention will be described with reference to FIGS.

図１は電子部品測定治具による測定工程の分解斜視図、図２は電子部品測定治具の平面図、図３は電子部品測定治具による測定工程の正面図である。   1 is an exploded perspective view of a measurement process using an electronic component measurement jig, FIG. 2 is a plan view of the electronic component measurement jig, and FIG. 3 is a front view of the measurement process using an electronic component measurement jig.

電子部品測定治具１０は、基材１１と、基材１１の電子部品測定面２１に設けられた測定電極１２〜１７ならびに突起１８，１９とから構成されている。なお、電子部品測定治具１０の電子部品測定面２１は、チップ型電子部品３０の下面より外形が大きく形成されており、チップ型電子部品３０を電子部品測定治具１０に載置した際に、測定電極１２〜１７がチップ型電子部品３０の外周よりはみ出すように構成されている。   The electronic component measurement jig 10 includes a base material 11, measurement electrodes 12 to 17 and protrusions 18 and 19 provided on the electronic component measurement surface 21 of the base material 11. The electronic component measurement surface 21 of the electronic component measurement jig 10 has an outer shape larger than the lower surface of the chip type electronic component 30, and when the chip type electronic component 30 is placed on the electronic component measurement jig 10. The measurement electrodes 12 to 17 are configured to protrude from the outer periphery of the chip-type electronic component 30.

基材１１を構成する材料については、絶縁性を示す限り、特に限定されず、例えば絶縁性樹脂などを用いて構成することができる。なお、基材１１としては、板状のものに限定されず、ブロック状のものであってもよい。   The material constituting the base material 11 is not particularly limited as long as it exhibits insulating properties, and can be configured using, for example, an insulating resin. In addition, as the base material 11, it is not limited to a plate-shaped thing, A block-shaped thing may be sufficient.

測定電極１２〜１７は、基材１１の電子部品測定面２１に金属板を貼り合わせることにより、電子部品測定面２１の対向する両端縁１１ａ，１１ｂに沿ってそれぞれ３個ずつ設けられている。   Three measurement electrodes 12 to 17 are provided along both opposite edges 11 a and 11 b of the electronic component measurement surface 21 by bonding a metal plate to the electronic component measurement surface 21 of the substrate 11.

突起１８，１９は、電子部品測定面２１の残りの対向する両端縁１１ｃ，１１ｄの略中央において接着等にて電子部品測定面２１に固定されている。突起１８，１９は角柱状であり、その高さ寸法は測定電極１２〜１７の厚みより大きく測定電極１２〜１７と後述する異方性導電シート２０の厚みの和以下に設定されている。なお、突起１８，１９の形状は角柱状に限らず、円柱状等であってもよい。突起１８，１９の材質は、測定時の磨耗を軽減するため、ベリリウム、銅、真鋳等の硬い金属が好ましい。   The protrusions 18 and 19 are fixed to the electronic component measurement surface 21 by bonding or the like at substantially the center of the remaining opposite end edges 11c and 11d of the electronic component measurement surface 21. The protrusions 18 and 19 have a prismatic shape, and the height dimension thereof is set to be larger than the thickness of the measurement electrodes 12 to 17 or less than the sum of the thicknesses of the measurement electrodes 12 to 17 and the anisotropic conductive sheet 20 described later. In addition, the shape of the protrusions 18 and 19 is not limited to a prismatic shape, and may be a cylindrical shape or the like. The material of the protrusions 18 and 19 is preferably a hard metal such as beryllium, copper, or true casting in order to reduce wear during measurement.

異方性導電シート２０は、シートの厚み方向に沿って金属線を多数有し、厚み方向のみに導電性を有するものである。   The anisotropic conductive sheet 20 has a number of metal wires along the thickness direction of the sheet, and has conductivity only in the thickness direction.

次に、電子部品測定治具１０を用いたチップ型電子部品３０の電気的特性の測定方法について説明する。測定に際しては、電子部品測定治具１０の測定電極１２〜１７の外側端を測定装置（図示せず）に電気的に接続する。   Next, a method for measuring the electrical characteristics of the chip-type electronic component 30 using the electronic component measuring jig 10 will be described. In measurement, the outer ends of the measurement electrodes 12 to 17 of the electronic component measurement jig 10 are electrically connected to a measurement apparatus (not shown).

基材１１の電子部品測定面２１の突起１８，１９間において、各測定電極１２〜１７上に異方性導電シート２０を載置する。さらに、異方性導電シート２０上に、チップ型電子部品３０を吸引装置のノズル４０の先端にて吸引保持しながら載置し、さらに電子部品測定治具１０方向に押圧して異方性導電シート２０に圧接させる。なお、チップ型電子部品３０の下面には、測定電極１２〜１７に対向する位置に外部電極３１が設けられており、突起１８，１９に対向する部位の下面は略平らに形成されている。チップ型電子部品３０を異方性導電シート２０に押圧することで、外部電極３１と測定電極１２〜１７が異方性導電シート２０を介して電気的に接続される。この際、チップ型電子部品３０の下面の両端が突起１８，１９の上端に当接し、チップ型電子部品３０が電子部品測定治具１０に対して水平に保持される。   An anisotropic conductive sheet 20 is placed on each of the measurement electrodes 12 to 17 between the protrusions 18 and 19 of the electronic component measurement surface 21 of the substrate 11. Further, the chip-type electronic component 30 is placed on the anisotropic conductive sheet 20 while being sucked and held at the tip of the nozzle 40 of the suction device, and further pressed toward the electronic component measuring jig 10 to be anisotropically conductive. Press contact with the sheet 20. An external electrode 31 is provided on the lower surface of the chip-type electronic component 30 at a position facing the measurement electrodes 12 to 17, and the lower surface of the portion facing the protrusions 18 and 19 is formed substantially flat. By pressing the chip-type electronic component 30 against the anisotropic conductive sheet 20, the external electrode 31 and the measurement electrodes 12 to 17 are electrically connected via the anisotropic conductive sheet 20. At this time, both ends of the lower surface of the chip-type electronic component 30 abut on the upper ends of the protrusions 18 and 19, and the chip-type electronic component 30 is held horizontally with respect to the electronic component measuring jig 10.

このように構成された電子部品測定治具１０によると、チップ型電子部品３０を異方性導電シート２０を介して電子部品測定治具１０に押圧した際に、チップ型電子部品３０の両端が突起１８，１９に当接して電子部品測定治具１０に対して平行に保持される。その結果、測定時にチップ型電子部品３０ががたつくことなく電気的特性を正確に測定でき、かつ、チップ型電子部品３０を破損することなく、異方性導電シート２０の長寿命化も図れる。   According to the electronic component measuring jig 10 configured as described above, when the chip electronic component 30 is pressed against the electronic component measuring jig 10 via the anisotropic conductive sheet 20, both ends of the chip electronic component 30 are The projections 18 and 19 are held in parallel with the electronic component measuring jig 10 while being in contact with the projections 18 and 19. As a result, the electrical characteristics can be accurately measured without the chip-type electronic component 30 rattling during measurement, and the life of the anisotropic conductive sheet 20 can be extended without damaging the chip-type electronic component 30.

また、チップ型電子部品３０と接触する突起１８，１９の先端部の面積が大きい方が、チップ型電子部品３０の安定性、耐摩耗性が向上して好ましい。   In addition, it is preferable that the tip portions of the protrusions 18 and 19 that come into contact with the chip-type electronic component 30 have a large area because the stability and wear resistance of the chip-type electronic component 30 are improved.

さらに、電子部品測定面２１に複数の突起１８，１９を設けることで、チップ型電子部品３０の保持が安定し、より正確に電気的特性の測定が行える。   Furthermore, by providing the plurality of protrusions 18 and 19 on the electronic component measurement surface 21, the holding of the chip-type electronic component 30 is stabilized, and the electrical characteristics can be measured more accurately.

図４ないし図６に、電子部品測定治具１０の変形例を示す。なお、図１ないし図３に示した例と同一部分には同一符号を付してその説明を省略する。   4 to 6 show modified examples of the electronic component measuring jig 10. In addition, the same code | symbol is attached | subjected to the same part as the example shown in FIGS. 1-3, and the description is abbreviate | omitted.

図４の電子部品測定治具１０は、基材１１の上面の対角線上に対向する一対の隅部に突起５１，５２を設けたものである。   The electronic component measuring jig 10 shown in FIG. 4 is provided with protrusions 51 and 52 at a pair of corners facing the diagonal line on the upper surface of the substrate 11.

図５の電子部品測定治具１０は、基材１１の電子部品測定面２１の一方の端縁１１ａの両端に突起６１，６２を設けたものである。このように、突起１８，１９を押圧位置の偏っている側における電子部品測定面２１の端縁の両端に設けることにより、より安定した状態でチップ型電子部品３０を保持できる。   The electronic component measuring jig 10 of FIG. 5 is provided with protrusions 61 and 62 on both ends of one end 11 a of the electronic component measuring surface 21 of the base 11. Thus, by providing the protrusions 18 and 19 at both ends of the edge of the electronic component measurement surface 21 on the side where the pressing position is biased, the chip-type electronic component 30 can be held in a more stable state.

図６の電子部品測定治具１０は、基材１１の電子部品測定面２１の四隅に突起４１〜４４を設けたものである。この結果、チップ型電子部品３０の四隅を保持することができ、押圧位置の偏りによってチップ型電子部品３０がいずれの方向に傾いても水平に保持できる。   The electronic component measurement jig 10 of FIG. 6 is provided with protrusions 41 to 44 at the four corners of the electronic component measurement surface 21 of the substrate 11. As a result, the four corners of the chip-type electronic component 30 can be held, and the chip-type electronic component 30 can be held horizontally even if the chip-type electronic component 30 is inclined in any direction due to the bias of the pressing position.

本発明は、チップ型の高周波電子部品等の電気的特性を測定するための電子部品測定治具として有用である。   The present invention is useful as an electronic component measuring jig for measuring electrical characteristics of a chip-type high-frequency electronic component or the like.

本発明の実施形態における電子部品測定治具による測定工程の分解斜視図The disassembled perspective view of the measurement process by the electronic component measuring jig in embodiment of this invention 本発明の実施形態における電子部品測定治具の平面図The top view of the electronic component measuring jig in embodiment of this invention 本発明の実施形態における電子部品測定治具による測定工程の正面図The front view of the measurement process by the electronic component measuring jig in the embodiment of the present invention 本発明の実施形態における変形例の電子部品測定治具の平面図The top view of the electronic component measuring jig of the modification in embodiment of this invention 本発明の実施形態におけるその他の変形例の電子部品測定治具の平面図The top view of the electronic component measuring jig of the other modification in embodiment of this invention 本発明の実施形態におけるその他の変形例の電子部品測定治具の平面図The top view of the electronic component measuring jig of the other modification in embodiment of this invention 従来例における電子部品測定治具による測定工程の分解斜視図Disassembled perspective view of measurement process using electronic component measurement jig in conventional example 従来例における電子部品測定治具による測定工程の正面図Front view of the measurement process using the electronic component measurement jig in the conventional example

符号の説明Explanation of symbols

１０ 電子部品測定治具
１１ 基材
１２〜１７ 測定電極
１８，１９ 突起
２０ 異方性導電シート
２１ 電子部品測定面
３０ チップ型電子部品
３１ 外部電極 DESCRIPTION OF SYMBOLS 10 Electronic component measurement jig | tool 11 Base material 12-17 Measurement electrodes 18, 19 Protrusion 20 Anisotropic conductive sheet 21 Electronic component measurement surface 30 Chip-type electronic component 31 External electrode

Claims (4)

チップ型電子部品の外部電極に対応する位置において、電子部品測定面に測定電極を有した電子部品測定治具であって、
異方性導電シートを介してチップ型電子部品が圧接され、当該チップ型電子部品の電気的特性を測定する際に、押圧位置の偏りに起因して当該チップ型電子部品が傾斜するのを規制する突起を上記電子部品測定面に設けた電子部品測定治具。 An electronic component measurement jig having a measurement electrode on the electronic component measurement surface at a position corresponding to the external electrode of the chip-type electronic component,
When a chip-type electronic component is pressure-contacted via an anisotropic conductive sheet and the electrical characteristics of the chip-type electronic component are measured, the chip-type electronic component is restricted from tilting due to a bias in the pressing position. An electronic component measuring jig provided with a protrusion to be formed on the electronic component measuring surface. 上記突起が複数設けられていることを特徴とする請求項１に記載の電子部品測定治具。   The electronic component measuring jig according to claim 1, wherein a plurality of the protrusions are provided. 上記電子部品測定面が矩形であり、上記突起が押圧位置の偏っている側における上記電子部品測定面の端縁の両端に設けられていることを特徴とする請求項２に記載の電子部品測定治具。   3. The electronic component measurement according to claim 2, wherein the electronic component measurement surface is rectangular, and the protrusions are provided at both ends of the edge of the electronic component measurement surface on the side where the pressing position is biased. jig. 上記電子部品測定面が矩形であり、上記突起が上記電子部品測定面の四隅に設けられていることを特徴とする請求項２に記載の電子部品測定治具。   The electronic component measuring jig according to claim 2, wherein the electronic component measuring surface is rectangular, and the protrusions are provided at four corners of the electronic component measuring surface.
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