JP2003309304A - Method for manufacturing actuator and ink jet head - Google Patents

Method for manufacturing actuator and ink jet head

Info

Publication number
JP2003309304A
JP2003309304A JP2002116052A JP2002116052A JP2003309304A JP 2003309304 A JP2003309304 A JP 2003309304A JP 2002116052 A JP2002116052 A JP 2002116052A JP 2002116052 A JP2002116052 A JP 2002116052A JP 2003309304 A JP2003309304 A JP 2003309304A
Authority
JP
Japan
Prior art keywords
substrate
single crystal
manufacturing
crystal substrate
actuator
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2002116052A
Other languages
Japanese (ja)
Other versions
JP4086535B2 (en
Inventor
Tetsuro Fukui
哲朗 福井
Toshihiro Ifuku
俊博 伊福
Katayoshi Matsuda
堅義 松田
Akio Ikesue
明生 池末
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Canon Inc
Original Assignee
Canon Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Canon Inc filed Critical Canon Inc
Priority to JP2002116052A priority Critical patent/JP4086535B2/en
Priority to US10/412,395 priority patent/US6927084B2/en
Publication of JP2003309304A publication Critical patent/JP2003309304A/en
Application granted granted Critical
Publication of JP4086535B2 publication Critical patent/JP4086535B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • BPERFORMING OPERATIONS; TRANSPORTING
    • B41PRINTING; LINING MACHINES; TYPEWRITERS; STAMPS
    • B41JTYPEWRITERS; SELECTIVE PRINTING MECHANISMS, i.e. MECHANISMS PRINTING OTHERWISE THAN FROM A FORME; CORRECTION OF TYPOGRAPHICAL ERRORS
    • B41J2/00Typewriters or selective printing mechanisms characterised by the printing or marking process for which they are designed
    • B41J2/005Typewriters or selective printing mechanisms characterised by the printing or marking process for which they are designed characterised by bringing liquid or particles selectively into contact with a printing material
    • B41J2/01Ink jet
    • B41J2/135Nozzles
    • B41J2/16Production of nozzles
    • B41J2/1607Production of print heads with piezoelectric elements
    • B41J2/161Production of print heads with piezoelectric elements of film type, deformed by bending and disposed on a diaphragm
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B41PRINTING; LINING MACHINES; TYPEWRITERS; STAMPS
    • B41JTYPEWRITERS; SELECTIVE PRINTING MECHANISMS, i.e. MECHANISMS PRINTING OTHERWISE THAN FROM A FORME; CORRECTION OF TYPOGRAPHICAL ERRORS
    • B41J2/00Typewriters or selective printing mechanisms characterised by the printing or marking process for which they are designed
    • B41J2/005Typewriters or selective printing mechanisms characterised by the printing or marking process for which they are designed characterised by bringing liquid or particles selectively into contact with a printing material
    • B41J2/01Ink jet
    • B41J2/135Nozzles
    • B41J2/16Production of nozzles
    • B41J2/1621Manufacturing processes
    • B41J2/1623Manufacturing processes bonding and adhesion
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B41PRINTING; LINING MACHINES; TYPEWRITERS; STAMPS
    • B41JTYPEWRITERS; SELECTIVE PRINTING MECHANISMS, i.e. MECHANISMS PRINTING OTHERWISE THAN FROM A FORME; CORRECTION OF TYPOGRAPHICAL ERRORS
    • B41J2/00Typewriters or selective printing mechanisms characterised by the printing or marking process for which they are designed
    • B41J2/005Typewriters or selective printing mechanisms characterised by the printing or marking process for which they are designed characterised by bringing liquid or particles selectively into contact with a printing material
    • B41J2/01Ink jet
    • B41J2/135Nozzles
    • B41J2/16Production of nozzles
    • B41J2/1621Manufacturing processes
    • B41J2/1626Manufacturing processes etching
    • B41J2/1628Manufacturing processes etching dry etching
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B41PRINTING; LINING MACHINES; TYPEWRITERS; STAMPS
    • B41JTYPEWRITERS; SELECTIVE PRINTING MECHANISMS, i.e. MECHANISMS PRINTING OTHERWISE THAN FROM A FORME; CORRECTION OF TYPOGRAPHICAL ERRORS
    • B41J2/00Typewriters or selective printing mechanisms characterised by the printing or marking process for which they are designed
    • B41J2/005Typewriters or selective printing mechanisms characterised by the printing or marking process for which they are designed characterised by bringing liquid or particles selectively into contact with a printing material
    • B41J2/01Ink jet
    • B41J2/135Nozzles
    • B41J2/16Production of nozzles
    • B41J2/1621Manufacturing processes
    • B41J2/1626Manufacturing processes etching
    • B41J2/1629Manufacturing processes etching wet etching
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B41PRINTING; LINING MACHINES; TYPEWRITERS; STAMPS
    • B41JTYPEWRITERS; SELECTIVE PRINTING MECHANISMS, i.e. MECHANISMS PRINTING OTHERWISE THAN FROM A FORME; CORRECTION OF TYPOGRAPHICAL ERRORS
    • B41J2/00Typewriters or selective printing mechanisms characterised by the printing or marking process for which they are designed
    • B41J2/005Typewriters or selective printing mechanisms characterised by the printing or marking process for which they are designed characterised by bringing liquid or particles selectively into contact with a printing material
    • B41J2/01Ink jet
    • B41J2/135Nozzles
    • B41J2/16Production of nozzles
    • B41J2/1621Manufacturing processes
    • B41J2/1632Manufacturing processes machining
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B41PRINTING; LINING MACHINES; TYPEWRITERS; STAMPS
    • B41JTYPEWRITERS; SELECTIVE PRINTING MECHANISMS, i.e. MECHANISMS PRINTING OTHERWISE THAN FROM A FORME; CORRECTION OF TYPOGRAPHICAL ERRORS
    • B41J2/00Typewriters or selective printing mechanisms characterised by the printing or marking process for which they are designed
    • B41J2/005Typewriters or selective printing mechanisms characterised by the printing or marking process for which they are designed characterised by bringing liquid or particles selectively into contact with a printing material
    • B41J2/01Ink jet
    • B41J2/135Nozzles
    • B41J2/16Production of nozzles
    • B41J2/1621Manufacturing processes
    • B41J2/1632Manufacturing processes machining
    • B41J2/1634Manufacturing processes machining laser machining
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B41PRINTING; LINING MACHINES; TYPEWRITERS; STAMPS
    • B41JTYPEWRITERS; SELECTIVE PRINTING MECHANISMS, i.e. MECHANISMS PRINTING OTHERWISE THAN FROM A FORME; CORRECTION OF TYPOGRAPHICAL ERRORS
    • B41J2/00Typewriters or selective printing mechanisms characterised by the printing or marking process for which they are designed
    • B41J2/005Typewriters or selective printing mechanisms characterised by the printing or marking process for which they are designed characterised by bringing liquid or particles selectively into contact with a printing material
    • B41J2/01Ink jet
    • B41J2/135Nozzles
    • B41J2/16Production of nozzles
    • B41J2/1621Manufacturing processes
    • B41J2/164Manufacturing processes thin film formation
    • B41J2/1642Manufacturing processes thin film formation thin film formation by CVD [chemical vapor deposition]
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10NELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N30/00Piezoelectric or electrostrictive devices
    • H10N30/01Manufacture or treatment
    • H10N30/07Forming of piezoelectric or electrostrictive parts or bodies on an electrical element or another base
    • H10N30/072Forming of piezoelectric or electrostrictive parts or bodies on an electrical element or another base by laminating or bonding of piezoelectric or electrostrictive bodies
    • H10N30/073Forming of piezoelectric or electrostrictive parts or bodies on an electrical element or another base by laminating or bonding of piezoelectric or electrostrictive bodies by fusion of metals or by adhesives
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10NELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N30/00Piezoelectric or electrostrictive devices
    • H10N30/01Manufacture or treatment
    • H10N30/07Forming of piezoelectric or electrostrictive parts or bodies on an electrical element or another base
    • H10N30/074Forming of piezoelectric or electrostrictive parts or bodies on an electrical element or another base by depositing piezoelectric or electrostrictive layers, e.g. aerosol or screen printing
    • H10N30/076Forming of piezoelectric or electrostrictive parts or bodies on an electrical element or another base by depositing piezoelectric or electrostrictive layers, e.g. aerosol or screen printing by vapour phase deposition
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10NELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N30/00Piezoelectric or electrostrictive devices
    • H10N30/01Manufacture or treatment
    • H10N30/08Shaping or machining of piezoelectric or electrostrictive bodies
    • H10N30/082Shaping or machining of piezoelectric or electrostrictive bodies by etching, e.g. lithography
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10NELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N30/00Piezoelectric or electrostrictive devices
    • H10N30/20Piezoelectric or electrostrictive devices with electrical input and mechanical output, e.g. functioning as actuators or vibrators
    • H10N30/204Piezoelectric or electrostrictive devices with electrical input and mechanical output, e.g. functioning as actuators or vibrators using bending displacement, e.g. unimorph, bimorph or multimorph cantilever or membrane benders
    • H10N30/2047Membrane type

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Particle Formation And Scattering Control In Inkjet Printers (AREA)

Abstract

<P>PROBLEM TO BE SOLVED: To provide a method for manufacturing an elongated actuator having a large area utilizing a monocrystal piezoelectric film or a single-orientation polycrystal film, and to provide a method for manufacturing an ink jet head. <P>SOLUTION: The monocrystal piezoelectric film is formed on a bonded monocrystal substrate (preferably, a ZrO<SB>2</SB>substrate that is doped with MgO, STO, BaTiO<SB>3</SB>, and Y or rare earth), after it is bonded to a diaphragm structure member, a crystal substrate is removed, and the actuator or the ink jet head is manufactured. When the superior device can be manufactured by using the object, having surface roughness Ra of 15 nm or less as measured via a bonding part of the bonded substrate is utilized for manufacturing the ink jet head, the head with high-density and a large area having proper characteristics can be obtained. <P>COPYRIGHT: (C)2004,JPO

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【発明の属する技術分野】本発明は、アクチュエータ及
びインクジェットヘッドの製造方法において、単結晶基
板上の圧電膜を振動板構造体に接合し、単結晶基板を除
去するアクチュエータ及びインクジェットヘッドの製造
方法に関する。特に、大面積のアクチュエータおよびイ
ンクジェットヘッドを作成する場合に有効な製造方法に
関する。また、大面積・高密度のアクチュエータ及びイ
ンクジェットヘッドを作製出来る製造方法である。例え
ば、圧電/電歪膜型素子、中でも主にインクジェットプ
リントヘッド、マイクロホン、発音体(スピーカーな
ど)、各種振動子や発振子、更にはセンサー等に用いら
れるユニモルフ型やバイモルフ型等の屈曲変位を発生さ
せるタイプの圧電/電歪膜型素子等の製造方法に好適に
用いることが出来る。なお、ここで呼称される素子と
は、電気エネルギーを機械エネルギーに変換、即ち機械
的な変位または応力または振動に変換する素子の他、そ
の逆の変換を行う素子をも意味するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method of manufacturing an actuator and an inkjet head, in which a piezoelectric film on a single crystal substrate is bonded to a vibrating plate structure and the single crystal substrate is removed. . In particular, the present invention relates to a manufacturing method that is effective when manufacturing a large-area actuator and an inkjet head. Further, it is a manufacturing method capable of manufacturing an actuator and an inkjet head having a large area and high density. For example, piezoelectric / electrostrictive film type devices, especially inkjet print heads, microphones, sounding bodies (speakers, etc.), various vibrators and oscillators, and bending displacement of unimorph type and bimorph type used for sensors, etc. It can be preferably used in a method of manufacturing a piezoelectric / electrostrictive film type element of the type to be generated. The element referred to herein means an element that converts electrical energy into mechanical energy, that is, mechanical displacement or stress or vibration, and an element that performs the opposite conversion.

【0002】[0002]

【従来の技術】近年、光学や精密加工等の分野におい
て、サブミクロンのオーダーで光路長や位置を調整する
変位素子や微小変位を電気的変化として検知する検出素
子が所望されるようになってきており、これに応えるも
のとして、強誘電体の圧電/電歪材料に電界を加えた時
に起こる逆圧電効果や電歪効果に基づくところの変位あ
るいはその逆の現象を利用した素子である、アクチュエ
ータやセンサーの如き圧電/電歪素子の開発が進められ
ている。
2. Description of the Related Art In recent years, in the fields of optics and precision processing, a displacement element for adjusting the optical path length and position on the order of submicrons and a detection element for detecting a minute displacement as an electrical change have been desired. In response to this, an actuator that uses an inverse piezoelectric effect or a displacement based on the electrostrictive effect that occurs when an electric field is applied to a ferroelectric piezoelectric / electrostrictive material, or an opposite phenomenon, Piezoelectric / electrostrictive elements such as sensors and sensors are being developed.

【0003】ところで、インクジェットプリントヘッド
等においては、そのような圧電/電歪素子構造として、
従来から知られているユニモルフ型やバイモルフ型が、
好適に採用されている。そして、そこでは、そのような
素子を用いたプリンターの印字品質・印字速度等の向上
が要求されており、それに応えるべく、かかる圧電/電
歪膜型素子の小型高密度化、低電圧駆動化、高速応答性
化、長尺多ノズル化を図るための開発が進められてい
る。
By the way, in an ink jet print head or the like, such a piezoelectric / electrostrictive element structure is
The conventionally known unimorph type and bimorph type are
It is preferably used. Then, there is a demand for improvement in printing quality, printing speed, etc. of printers using such elements, and in order to meet such demand, miniaturization, high density and low voltage driving of such piezoelectric / electrostrictive film type elements are required. Development is underway to achieve high-speed response and long nozzles.

【0004】また、それらユニモルフ型やバイモルフ型
の圧電/電歪素子においては、大きな屈曲変位や発生力
或いは発生電位を得るために、振動板となる基板の厚さ
を薄くすることが重要とされるが、かかる基板の厚さを
減少させると、強度が低下したり、平滑性が低下すると
いう問題があった。しかも、従来のユニモルフ型やバイ
モルフ型の圧電/電歪素子においては、接着剤を用いる
ために信頼性を損ねるという問題点もあった。
In these unimorph type and bimorph type piezoelectric / electrostrictive elements, it is important to reduce the thickness of the substrate to be the vibrating plate in order to obtain a large bending displacement, a generated force or a generated potential. However, if the thickness of the substrate is reduced, there is a problem that the strength is lowered and the smoothness is lowered. In addition, in the conventional unimorph type or bimorph type piezoelectric / electrostrictive element, there is a problem that reliability is impaired because an adhesive is used.

【0005】それらの克服のために、特開昭62-213399
号公報には、圧電スピーカーとして、圧電セラミックス
とセラミックス振動板を同時に焼結することで強固な接
合強度をもたらす技術が開示されている。しかしなが
ら、この方法は高温で異種の材料を焼結することから、
振動板の選択が制限され最適な設計が出来ないこと、振
動板及び圧電セラミックスそのものが収縮するため、大
面積でミクロンオーダーの寸応精度を合わせることが困
難であるという問題があった。そのため信頼性の高い大
面積の圧電/電歪素子(アクチュエータ)やインクジェ
ットヘッドを得ることが困難であった。また、より高密
度のヘッドを得るために単結晶系圧電膜を作製し、イン
クジェットヘッドを得る方法として、特開平11-348285
号公報には、単結晶PbTiO3上に成膜された単結晶Pb(Zr,
Ti)O3をインクジェットヘッドに利用する方法が記載さ
れているが、圧電膜上に作製する振動板の緻密性に劣
り、耐久性の良いヘッドを得ることが出来なかった。ま
た、特開2001-113712号公報には、複数枚の単結晶MgO基
板を用いて長尺のインクジェットヘッドを製造する方法
が記載されている。しかし、この方法では、基板を配置
した場合に起こる基板間の間隙の関係から、高密度なヘ
ッドを作製することは不可能であった。また、大面積の
単結晶MgO基板は安定的に製造出来ないことから、単結
晶基板上に作製した単結晶または単一配向結晶の圧電膜
を大面積のアクチュエーター及びインクジェットヘッド
に利用することは不可能であった。
In order to overcome them, Japanese Patent Laid-Open No. 62-213399
Japanese Patent Laid-Open Publication No. 2003-242242 discloses a technology for a piezoelectric speaker, in which a piezoelectric ceramic and a ceramic diaphragm are simultaneously sintered to provide strong bonding strength. However, since this method sinters dissimilar materials at high temperatures,
There are problems that it is difficult to optimize the design because the selection of the diaphragm is limited and that the diaphragm and the piezoelectric ceramics themselves contract, so that it is difficult to match the dimension accuracy of the micron order in a large area. Therefore, it is difficult to obtain a highly reliable large-area piezoelectric / electrostrictive element (actuator) or an inkjet head. Further, as a method for producing an inkjet head by producing a single crystal piezoelectric film in order to obtain a higher density head, there is disclosed in Japanese Patent Laid-Open No. 11-348285.
No. In Japanese, a single crystal PbTiO 3 deposited on the single crystal Pb (Zr,
Although a method of using Ti) O 3 for an inkjet head is described, the denseness of the vibration plate formed on the piezoelectric film is poor, and a head with good durability cannot be obtained. Further, Japanese Patent Laid-Open No. 2001-113712 describes a method of manufacturing a long inkjet head using a plurality of single crystal MgO substrates. However, with this method, it was impossible to fabricate a high-density head because of the gap between the substrates that occurs when the substrates are arranged. In addition, since a large-area single crystal MgO substrate cannot be stably manufactured, it is not possible to use a single-crystal or single-oriented crystal piezoelectric film formed on a single-crystal substrate for a large-area actuator and inkjet head. It was possible.

【0006】[0006]

【発明が解決しようとする課題】本発明の目的は、上記
問題点を解決した圧電/電歪膜型素子、特に、アクチュ
エーター及びインクジェットヘッドに好適な新規製造方
法を提供することにある。特に、単結晶圧電膜あるいは
単一配向の多結晶膜を利用した大面積・長尺のアクチュ
エーター及びインクジェットヘッドの製造方法を提供す
ることにある。大面積・長尺のアクチュエータ及びイン
クジェットヘッドを作製する方法として、振動板構造体
に直接圧電膜を成膜した後、加工・成型しデバイスを作
製する方法が一般的であるが、振動板構造体の格子定
数、熱膨張係数の関係で望む特性の圧電膜を成膜出来な
い場合がある。本発明は上記問題も解決した製造方法で
あり、所望の特性を有する圧電膜を大面積・長尺のデバ
イスに応用することが出来る。本発明の目的は、上記課
題を解決するものであり、その製造方法により大面積で
特性のばらつきの少ないアクチュエータ及びインクジェ
ットヘッドを提供することにある。これらは、インクジ
ェットヘッド以外にマイクロホン、発音体(スピーカー
等)、各種振動子・発振子、更には加速度センサー、圧
力センサー、振動センサー、角速度センサー等に好適に
用いられる。
SUMMARY OF THE INVENTION An object of the present invention is to provide a novel manufacturing method suitable for a piezoelectric / electrostrictive film type element, particularly an actuator and an ink jet head, which solves the above problems. In particular, it is an object of the present invention to provide a large-area and long-sized actuator and a method for manufacturing an inkjet head using a single-crystal piezoelectric film or a single-orientation polycrystalline film. As a method for manufacturing a large-area / long actuator and an inkjet head, a method is generally used in which a piezoelectric film is directly formed on a diaphragm structure and then processed / molded to manufacture a device. In some cases, the piezoelectric film having desired characteristics cannot be formed due to the lattice constant and the coefficient of thermal expansion. The present invention is a manufacturing method that solves the above problems, and can apply a piezoelectric film having desired characteristics to a large-area and long-sized device. An object of the present invention is to solve the above problems, and to provide an actuator and an inkjet head having a large area and less variation in characteristics by a manufacturing method thereof. These are suitably used for microphones, sounding bodies (speakers, etc.), various vibrators / oscillators, and further acceleration sensors, pressure sensors, vibration sensors, angular velocity sensors, etc., in addition to inkjet heads.

【0007】[0007]

【課題を解決するための手段】本発明のアクチュエータ
の製造方法は、単結晶基板上に形成された圧電膜を振動
板構造部材に接合した後、単結晶基板を除去しアクチュ
エータを製造するアクチュエータの製造方法であって、
単結晶基板が複数枚の単結晶基板を互いに接合した接合
部を有する基板である。また、接合部の幅が3μm以下
である前記単結晶基板を用いてもよい。また、接合部を
介して測定した単結晶基板の表面粗度Raが15nm以下
であってもよい。また、XRD(X線回折)測定での、ロッ
キングカーブ測定による二本のピーク位置が0.05°から
0.3°離れている単結晶基板が好ましい。また、単結晶
基板がMgO基板、STO基板、BaTiO3基板、Yまたは希土類
がドープされていても良いZrO2基板のうちいずれかであ
ってもよい。また、単結晶基板の厚みが0.05mmから
2.5mmであってもよい。本発明のインクジェットヘッ
ドの製造方法は、単結晶基板上に形成された圧電膜を振
動板構造部材に接合した後、単結晶基板を除去しインク
ジェットヘッドを製造する製造方法であって、単結晶基
板が複数枚の単結晶基板を互いに接合した接合部を有す
る基板である。従って、本発明の製造方法は、高密度で
長尺で特性の良い圧電アクチュエーターおよびインクジ
ェットヘッドを製造できる。また、本発明の製造方法
は、単結晶基板を用いて圧電特性の良い圧電膜を選択で
き、かつ、デバイスサイズが大きくなっても適応でき
る。
A method of manufacturing an actuator according to the present invention is an actuator for manufacturing an actuator by bonding a piezoelectric film formed on a single crystal substrate to a diaphragm structural member and then removing the single crystal substrate. A manufacturing method,
The single crystal substrate is a substrate having a bonding portion in which a plurality of single crystal substrates are bonded to each other. Further, the single crystal substrate in which the width of the bonding portion is 3 μm or less may be used. Further, the surface roughness Ra of the single crystal substrate measured through the bonding portion may be 15 nm or less. In addition, the two peak positions by rocking curve measurement in XRD (X-ray diffraction) are from 0.05 °
Single crystal substrates separated by 0.3 ° are preferred. Further, the single crystal substrate may be any one of a MgO substrate, an STO substrate, a BaTiO 3 substrate, a Y or a ZrO 2 substrate which may be doped with a rare earth element. Further, the thickness of the single crystal substrate may be 0.05 mm to 2.5 mm. A method for manufacturing an inkjet head according to the present invention is a method for manufacturing an inkjet head by removing a single crystal substrate after bonding a piezoelectric film formed on a single crystal substrate to a diaphragm structural member. Is a substrate having a bonded portion in which a plurality of single crystal substrates are bonded to each other. Therefore, according to the manufacturing method of the present invention, it is possible to manufacture a piezoelectric actuator and an inkjet head having high density, long length, and good characteristics. Further, the manufacturing method of the present invention can select a piezoelectric film having good piezoelectric characteristics using a single crystal substrate, and can be applied even if the device size increases.

【0008】[0008]

【発明の実施の形態】本発明の製造方法は、複数枚の接
合された単結晶基板上の圧電膜を振動板構造体に接合す
る工程、単結晶基板を除去する工程を含む製造方法であ
る。本発明の製造方法は、単結晶基板上に圧電膜を成膜
する工程、圧電膜を振動板構造部材に接合する工程、基
板を除去する工程を有する。図1は本発明の工程を図示
したものである。図1の(a)は基板上に圧電膜を成
膜した状態を示す。(b)は、デバイスの必要性に応じて
圧電膜をパターニングした状態を示す。この工程は必須
ではないが、インクジェットヘッドのデバイス化には好
ましい態様である。(c)は、パターニングされた圧電
膜を振動板構造部材に接合した状態を示す。は接合
に使用した接合層で主に金属材料でできている。(d)
は、接合後に基板を除去した状態である。
BEST MODE FOR CARRYING OUT THE INVENTION The manufacturing method of the present invention includes a step of bonding a plurality of bonded piezoelectric films on a single crystal substrate to a diaphragm structure and a step of removing the single crystal substrate. . The manufacturing method of the present invention includes a step of forming a piezoelectric film on a single crystal substrate, a step of bonding the piezoelectric film to a diaphragm structural member, and a step of removing the substrate. FIG. 1 illustrates the process of the present invention. FIG. 1A shows a state in which a piezoelectric film is formed on a substrate. (b) shows a state in which the piezoelectric film is patterned according to the need of the device. This step is not essential, but it is a preferred mode for making an inkjet head into a device. (C) shows a state in which the patterned piezoelectric film is bonded to the diaphragm structural member. Is a joining layer used for joining and is mainly made of a metal material. (D)
Is a state in which the substrate is removed after bonding.

【0009】本発明で用いられる基板としては、単結
晶基板であり、例えば、MgO, STO(SrTiO3), BaTiO3
Yあるいは希土類でドープされていても良いZrO2基板等
が用いられる。希土類としてはPr,Nd,Eu,Tb,Dy,Ho,Yb,,
Sm,Gd,Er,Laなどである。好ましい結晶面は(10
0)、(111)あるいは(101)である。好ましい
基板は、MgO基板、STO基板またはドープされたZrO2基板
である。また、本発明で用いられる基板は、複数枚の基
板が接合されたものである。そのため、XRD測定でロッ
キングカーブ測定した場合、主ピークから数度異なる一
本以上のピークが測定される。特に本発明で使用される
単結晶基板のロッキングカーブ測定では、主ピークと他
のピークの位置が0.05°から0.3°異なるもので
ある。これに対して、単板の単結晶基板では一本のピー
クしか観測されない(単結晶性の不良な基板では主ピー
クから10°以上離れた位置にピークが出る場合があ
る。)が、本発明の基板は接合面での若干の方位のずれ
が生じるため、このようなXRDピークが観測される。接
合される単板単結晶基板のロッキングカーブ測定では、
ピークの位置のずれは0.3°以下が好ましく、このよう
な数度の方位ずれがあるにもかかわらず、その上に成膜
される圧電膜は十分特性が良いばかりか、この方位のず
れにより大面積成膜をした場合も膜中の応力が適度に分
散され均一な圧電膜が成膜されている可能性がある。本
発明で用いられる基板の膜厚は、0.05mmから2.5mm、
好ましくは、0.1mmから1.2mmである。基板の膜厚
が0.05mm未満の場合は基板面積が大きくなった場合
(例えば、500mm2以上等)に平面性が保持されにくいこ
と、強度に劣ることより好ましくない。平面性が保持さ
れない場合には、単結晶基板上へ圧電膜を成膜する場合
に良好な圧電膜を成膜できにくくなる。また、膜厚が2.
5mmを超えるとアクチュエーターあるいはインクジェッ
トヘッドを作製する工程で基板を除去する際に作業性に
劣ることより好ましくない。
The substrate used in the present invention is a single crystal substrate, such as MgO, STO (SrTiO 3 ), BaTiO 3 ,
A ZrO 2 substrate or the like which may be doped with Y or a rare earth is used. As rare earths, Pr, Nd, Eu, Tb, Dy, Ho, Yb ,,
Sm, Gd, Er, La etc. The preferred crystal plane is (10
0), (111) or (101). Preferred substrates are MgO substrates, STO substrates or doped ZrO 2 substrates. Further, the substrate used in the present invention is one in which a plurality of substrates are joined. Therefore, when the rocking curve is measured by the XRD measurement, one or more peaks different from the main peak by several degrees are measured. Particularly, in the rocking curve measurement of the single crystal substrate used in the present invention, the positions of the main peak and other peaks differ from each other by 0.05 ° to 0.3 °. On the other hand, only one peak is observed in a single plate single crystal substrate (a peak may appear at a position separated by 10 ° or more from the main peak in a substrate with poor single crystallinity), but the present invention. Such an XRD peak is observed because the substrate has a slight misorientation at the bonding surface. In the rocking curve measurement of the single plate single crystal substrate to be joined,
The deviation of the position of the peak is preferably 0.3 ° or less. Even though there is such an azimuth deviation of several degrees, the piezoelectric film formed thereon has not only good characteristics but also this azimuth deviation. Therefore, even when a large area film is formed, the stress in the film may be appropriately dispersed and a uniform piezoelectric film may be formed. The film thickness of the substrate used in the present invention is 0.05 mm to 2.5 mm,
Preferably, it is 0.1 mm to 1.2 mm. When the film thickness of the substrate is less than 0.05 mm, it is not preferable because the flatness is difficult to be maintained and the strength is poor when the substrate area is large (for example, 500 mm 2 or more). If the flatness is not maintained, it becomes difficult to form a good piezoelectric film when forming the piezoelectric film on the single crystal substrate. Also, the film thickness is 2.
If it exceeds 5 mm, it is not preferable because the workability is poor when removing the substrate in the process of manufacturing the actuator or the inkjet head.

【0010】本発明で用いられる基板の作成方法につ
いて例示する。図2は、基板の作成工程を図示したもの
である。図2(a)は、単結晶バルク体を4部重ねたも
のであり、各接触面(イ)での単結晶体の表面は研摩さ
れている。これを加圧下で、高温処理することにより、
(b)の接合体になる。(ロ)は、接合部である。この
接合部(ロ)は、光学的に認識することが出来る。こう
して接合された単結晶体を切断することにより本発明で
使用される接合部を有する大面積の単結晶基板(ハ)を
得ることが出来る。
An example of the method for producing the substrate used in the present invention will be described. FIG. 2 illustrates a process of making a substrate. FIG. 2 (a) is a stack of four single crystal bulk bodies, and the surface of the single crystal body at each contact surface (a) is polished. By subjecting this to high temperature under pressure,
It becomes the joined body of (b). (B) is a joint. This joint portion (b) can be optically recognized. By cutting the single crystal body thus bonded, a large-area single crystal substrate (c) having a bonding portion used in the present invention can be obtained.

【0011】次工程のデバイス化で均一な圧電特性の良
好なデバイスを得るために接合部(ロ)の幅は3μm以
下の物を用いることが好ましい。より好ましくは、2.2
μm以下である。接合部の幅の測定は、SEM観察により
測定することが出来る。単結晶基板の接合部は屈折率の
違いからか、あるいは格子ミスマッチングからか目視あ
るいは光学顕微鏡で接合部の有無の確認は出来る。この
接合部を横断するように表面粗度を測定した時に、本発
明で用いられる好ましい基板のRaは、15nm以下であ
り、より好ましくは10nm以下である。測定方法は、例
えば、ケーエルエー・テンコール社(KLA Tencor)のテン
コールP-10で、探針圧5mg、スキャン速度5μm/
秒、データー取得周波数500Hzで接合部を挟んで300μm
長を測定することによりされる。接合部の幅が3μmを
超える場合や、Raが15nmを超えると基板内での圧電膜
の結晶性が不良となり、デバイスにした場合に均一性の
良いデバイスが得られにくくなる。
In order to obtain a device having good uniform piezoelectric characteristics in the device fabrication in the next step, it is preferable to use a bonding part (b) having a width of 3 μm or less. More preferably 2.2
μm or less. The width of the joint can be measured by SEM observation. The presence or absence of the bonded portion can be confirmed visually or by an optical microscope from the difference in the refractive index of the bonded portion of the single crystal substrate or from the lattice mismatch. When the surface roughness is measured so as to traverse this junction, the Ra of the preferred substrate used in the present invention is 15 nm or less, more preferably 10 nm or less. The measuring method is, for example, Tencor P-10 manufactured by KLA Tencor, with a probe pressure of 5 mg and a scanning speed of 5 μm /
Second, 300 μm across the junction at a data acquisition frequency of 500 Hz
By measuring the length. If the width of the junction exceeds 3 μm or if Ra exceeds 15 nm, the crystallinity of the piezoelectric film in the substrate becomes poor, and it becomes difficult to obtain a device with good uniformity when used as a device.

【0012】次工程で、接合された単結晶基板面上に圧
電膜を成膜する。本発明で用いられる圧電膜は単結晶
膜、あるいは単一配向した多結晶膜である。単一配向し
た多結晶膜とは、XRD法(X線回折法)で測定した時に、
圧電膜の特定ピーク強度膜が90%以上ある膜であり、
好ましくは、95%以上である。圧電膜の結晶構造は、
正方晶、菱面体晶、斜方晶のいずれかである。好ましい
結晶方位は<001>、<111>である。
In the next step, a piezoelectric film is formed on the surfaces of the bonded single crystal substrates. The piezoelectric film used in the present invention is a single crystal film or a single oriented polycrystalline film. A single-oriented polycrystalline film means that when measured by the XRD method (X-ray diffraction method),
The piezoelectric film has a specific peak intensity film of 90% or more,
It is preferably at least 95%. The crystal structure of the piezoelectric film is
It is a tetragonal crystal, a rhombohedral crystal, or an orthorhombic crystal. Preferred crystal orientations are <001> and <111>.

【0013】これらの圧電膜を作製する方法としては、
焼結法、スパッタリング法、MBE(分子線ビームエピタ
キシー)法、MOCVD法、ゾルゲル法、ガスデポ法、水熱
法等があるが、好適には、スパッタ法、MBE法、MOCVD
法、ゾルゲル法、水熱法である。基板上に成膜される圧
電膜の膜厚としては、0.8μmから50μm、好ましく
は、1.0μmから10μmである。0.8μm未満では、ア
クチュエーターとしての変位力に劣り、基板2を変位さ
せる十分な力を出せない。また、50μmを超えると、圧
電膜自身の剛性が大きくなり変位量を大きく出来なくな
る事や駆動電圧が大きくなる事等のため好ましくない。
As a method for producing these piezoelectric films,
The sintering method, the sputtering method, the MBE (molecular beam epitaxy) method, the MOCVD method, the sol-gel method, the gas deposition method, the hydrothermal method, and the like are preferable, but the sputtering method, the MBE method, and the MOCVD are preferable.
Method, sol-gel method, hydrothermal method. The thickness of the piezoelectric film formed on the substrate is 0.8 μm to 50 μm, preferably 1.0 μm to 10 μm. If it is less than 0.8 μm, the displacement force as an actuator is poor and a sufficient force for displacing the substrate 2 cannot be produced. On the other hand, if the thickness exceeds 50 μm, the rigidity of the piezoelectric film itself increases, the displacement cannot be increased, and the driving voltage increases, which is not preferable.

【0014】用いられる圧電膜としては、チタン酸ジル
コン酸鉛(PZT)、チタン酸ジルコン酸ランタン鉛(PLZ
T)、マグネシウムニオブ酸鉛、マグネシウムニオブチ
タン酸鉛、亜鉛ニオブ酸鉛、亜鉛ニオブチタン酸鉛等で
ある。これらの材料に微量のドーパントを添加させても
良い。
The piezoelectric film used is lead zirconate titanate (PZT), lead lanthanum zirconate titanate (PLZ).
T), lead magnesium niobate, lead magnesium niobium titanate, lead zinc niobate, lead zinc niobate titanate and the like. A small amount of dopant may be added to these materials.

【0015】図1(b)のパターニングは必須の工程で
はないが、長尺のインクジェットヘッドを作製する場合
には、好ましい態様であり、圧電膜と振動板構造部材の
熱膨張係数が異なる材料でも安定してデバイス化するこ
とが出来る。パターニング方法としては、ウェットエッ
チング、ドライエッチング、レジストリフトオフ、メタ
ルマスクによる方法等が用いられる。
Although the patterning of FIG. 1B is not an essential step, it is a preferable mode when a long ink jet head is manufactured, and a material having different coefficients of thermal expansion between the piezoelectric film and the diaphragm structural member is used. It can be stably made into a device. As the patterning method, wet etching, dry etching, resist lift-off, a method using a metal mask, or the like is used.

【0016】圧電膜と振動板構造部材との接合方法
としては、直接接合、拡散接合、活性金属法、圧接など
の接合方法を採ることが出来る。好ましくは、活性金属
法であり、用いる金属としてはIn,Pd,Au,Cr,Ni,Cu,Sn,M
o,Ti,Zr,Ag,Pb等の金属を用いることが出来る。接合時
の温度は80℃から500℃で、より好ましくは、100℃から
300℃である。また加圧は、0.5kg/mm2から20kg/mm2
あり、好ましくは0.8kg/mm2から5kg/mm2である。活性
金属法で接合層に利用した層を電極として利用しても良
い。また、直接接合法としては、例えば「信学技報US95
-24,EMD95-20,CPM95-32」記載の方法等がある。
As a method for joining the piezoelectric film and the diaphragm structural member, a joining method such as direct joining, diffusion joining, an active metal method, or pressure welding can be adopted. Preferably, the active metal method, as the metal used, In, Pd, Au, Cr, Ni, Cu, Sn, M
Metals such as o, Ti, Zr, Ag and Pb can be used. The temperature at the time of joining is from 80 ° C to 500 ° C, more preferably from 100 ° C
It is 300 ° C. The pressure applied is 0.5 kg / mm 2 to 20 kg / mm 2 , preferably 0.8 kg / mm 2 to 5 kg / mm 2 . The layer used for the bonding layer by the active metal method may be used as the electrode. Further, as the direct joining method, for example, "Science Technical Report US95"
-24, EMD95-20, CPM95-32 ”.

【0017】本発明の振動板構造部材とは、加工可能性
の基板(積層体も含む)であるか、既に加工された振動
板が作成された物である。振動板構造部材としては、好
ましくは前者である。振動板構造部材に用いられる材
料としては、Si, SUS, Ni、Tiなどの金属材料、ジル
コニア、アルミナ、ガラスなどのセラミックス材料であ
る。好ましくは、金属材料であり、より好ましくは、Si
材料である。特にSi基板の結晶方位が{110}の基板が
好ましい。Si基板としては、SOI基板、SOS基板などを用
いても良い。
The diaphragm structural member of the present invention is a workable substrate (including a laminated body) or an already processed diaphragm prepared. The diaphragm structural member is preferably the former. Materials used for the diaphragm structural member are metallic materials such as Si, SUS, Ni and Ti, and ceramic materials such as zirconia, alumina and glass. Preferably, it is a metallic material, more preferably Si.
It is a material. In particular, a Si substrate having a crystal orientation of {110} is preferable. As the Si substrate, an SOI substrate, an SOS substrate or the like may be used.

【0018】基板の除去方法としては、ウェットエッ
チング法あるいは剥離法がある。ウェットエッチング法
は基板が溶解する液媒体を用いて基板を溶解除去す
る方法である。好ましくは基板が再利用出来る剥離法で
ある。剥離法としては、レーザー光剥離、ウォータージ
ェット法、機械的剥離があるが、好ましくは、レーザー
光剥離、機械的剥離である。レーザー光剥離とは圧電膜
界面にレーザー光を照射し、急激な温度上昇による熱分
解あるいは基板間の熱膨張率の差を利用して単結晶基板
から圧電膜を剥がす方法である。使用するレーザーとし
ては、エキシマーレーザー、YAGレーザー、He-Neレーザ
ー、ガスレーザー、半導体レーザー等である。機械的剥
離とは物理的機械力を利用して剥離する方法であり、基
板と圧電膜との間に機械的応力を作用させ基板を
剥離する方法である。
As a method of removing the substrate, there are a wet etching method and a peeling method. The wet etching method is a method of dissolving and removing the substrate using a liquid medium in which the substrate dissolves. The peeling method is preferable because the substrate can be reused. Examples of the peeling method include laser light peeling, water jet method, and mechanical peeling. Among them, laser light peeling and mechanical peeling are preferable. Laser peeling is a method of peeling a piezoelectric film from a single crystal substrate by irradiating the piezoelectric film interface with laser light and utilizing thermal decomposition due to a rapid temperature rise or a difference in coefficient of thermal expansion between the substrates. The laser used is an excimer laser, a YAG laser, a He-Ne laser, a gas laser, a semiconductor laser or the like. The mechanical peeling is a method of peeling by utilizing a physical mechanical force, and is a method of peeling the substrate by applying a mechanical stress between the substrate and the piezoelectric film.

【0019】本発明のインクジェットヘッドの製造方法
は、上記方法と同様の方法で得られたアクチュエーター
に圧力室と、圧力室と連通したインク供給路及びインク
吐出口となるノズル部を形成する製造方法である。図3
にはインクジェットヘッド作成の工程を図示した。図3
(a)は、図1(d)で説明したアクチュエーターであり、
これにインク室を作製する(図3(b))。はイン
ク室隔壁である。インク室の作成方法としては、Si基板
をエッチングしてインク室を作成する方法、あるいはイ
ンク室を形成した基板と接合する方法、あるいはインク
室隔壁部を成膜し作製する方法があり、いずれの方法
を採っても良い。はインクジェットヘッドの振動板お
よび不図示の下部電極であり、厚みは0.5〜15μm、好
ましくは、1〜5μmである。このような薄膜をウェット
エッチングによって均一に残すためには、振動板構造部
材としては、SOI基板を用いることが好ましい。ま
た、ドライエッチングでインク室を作成しても良い。図
3(c)では、上部電極とインク室を形成したアクチ
ュエーター部にノズル部が形成された部材を接合した
インクジェットヘッドが図示されている。ノズル部を構
成する部材は単層基板であっても多層基板であっても良
い。
In the method of manufacturing an ink jet head of the present invention, a pressure chamber, an ink supply path communicating with the pressure chamber, and a nozzle portion to be an ink discharge port are formed in an actuator obtained by the same method as the above method. Is. Figure 3
The process of making an inkjet head is illustrated in FIG. Figure 3
(a) is the actuator described in FIG. 1 (d),
An ink chamber is created in this (FIG. 3B). Is an ink chamber partition wall. As a method for forming the ink chamber, there are a method of forming an ink chamber by etching a Si substrate, a method of joining with a substrate on which an ink chamber is formed, or a method of forming an ink chamber partition wall by film formation. You may take the method. Is a diaphragm of the inkjet head and a lower electrode (not shown), and has a thickness of 0.5 to 15 μm, preferably 1 to 5 μm. In order to uniformly leave such a thin film by wet etching, it is preferable to use an SOI substrate as the diaphragm structural member. Also, the ink chamber may be created by dry etching. FIG. 3C shows an inkjet head in which a member having a nozzle portion is joined to an actuator portion having an upper electrode and an ink chamber. The member forming the nozzle portion may be a single-layer substrate or a multi-layer substrate.

【0020】また、本発明の製造方法は、圧電膜上にC
r,Niなどの金属膜を成膜し、これらを電極および振動板
として利用する製造方法であっても良い。この場合の金
属振動板の厚みは、圧電膜に対して0.5倍から2.0倍の厚
みが好ましい。このような方法を採る場合は、振動板構
造部材としては、振動板にあたる部分がない部材を用い
る事が出来る。
Further, the manufacturing method of the present invention uses C on the piezoelectric film.
A manufacturing method in which a metal film such as r or Ni is formed and these are used as an electrode and a diaphragm may be used. In this case, the thickness of the metal diaphragm is preferably 0.5 times to 2.0 times the thickness of the piezoelectric film. When such a method is adopted, as the diaphragm structural member, a member having no portion corresponding to the diaphragm can be used.

【0021】本発明で得られるインクジェットヘッド
は、ユニモルフタイプのベンダー型ヘッドを容易に安定
して得ることが出来るが、振動板構造部材をシムとし
て利用し振動板構造部材の両側に圧電膜を接合してバイ
モルフタイプのインクジェットヘッドを作成しても良
い。
The ink jet head obtained by the present invention can easily and stably obtain a unimorph type bender type head, but the diaphragm structural member is used as a shim and the piezoelectric film is bonded to both sides of the diaphragm structural member. Then, a bimorph type inkjet head may be created.

【0022】以下に本発明を実施例を挙げて説明する。 (実施例1)一辺が10mmの立方体SrTiO3(100)単結晶
バルク体10体を接合・切断し、作製された10mm×100
mmのSTO(SrTiO3)基板(厚み0.15mm・接合部の幅
1.2μm・接合部を介しての表面粗度Ra=5nm)上にス
パッタ法でPZT(001)膜を2.5μm成膜した。PZT膜は[00
1]方位に配向されたの単結晶膜であった。この接合され
たSTO基板のXRD測定でのロッキングカーブ測定では主ピ
ークと0.13°から0.16°ずれた位置にピークが確認され
た。STO基板上のPZT膜上にTi層(20nm厚)を成膜したの
ちAu層(200nm厚)を成膜し接合層を作製した。これ
らをウェットで180dpiの密度になるようエッチングし
た。エッチング後のPZTの一素子の大きさは、幅88μ
m、長さ2.8mmであり、STO基板上にこのPZT素子を680
本並べられている。振動板構造部材としてBがドーピン
グされたSi層が3μm、SiO2層が0.5μmのSi(110)層の
厚みが約400μmのSOI基板(Ra=0.02μm、)上に接合
層としてCr(30nm)、Au(200nm)を成膜した。PZT
上のAu層とSOI基板上のAu層を重ね、10-3Paの減圧下
及び0.3kgf/mm2の加圧下、150℃で1時間加熱して接合し
た。SOI基板上のAu層上にPZT膜が密着性良く接合され
た。これにエキシマーレーザー光(KrF)をSTO基板側か
ら約350mJ/cm2の照射量で照射したところ、STO基板とP
ZTが剥離し、SOI基板上にPZTパターニング体を転写する
ことが出来た。上部電極をAuペーストで作成して、接合
後の圧電膜のPrを測定したところ、約40μC/cm2と良好
な特性であった。Si基板の圧電膜の反対面側からSiO2層
をエッチストップ層としてウェットエッチングにより、
各圧電膜の下部に幅100μm、長さ2mmのインク室を
形成し本発明によるアクチュエーターを得た。これに25
μmΦのノズルを開けたSi基板とインク流路を形成した
2枚のSUS基板を重ね、ノズル部がインク室の端部にく
るよう張り合わせインクジェットヘッドを得た。これか
ら5kHzで液体を吐出させると、約20plの液滴を15m/s
の速度で吐出させる事が出来た。
The present invention will be described below with reference to examples. (Example 1) 10 mm × 100 prepared by joining and cutting 10 cubic SrTiO 3 (100) single crystal bulk bodies each having a side of 10 mm
mm STO (SrTiO 3 ) substrate (thickness 0.15 mm, joint width
A PZT (001) film was formed to a thickness of 2.5 μm by sputtering on the surface roughness Ra of 5 μm (1.2 μm). PZT film is [00
It was a single crystal film oriented in the 1] direction. In the rocking curve measurement of this bonded STO substrate by XRD measurement, a peak was confirmed at a position deviated from 0.13 ° to 0.16 ° from the main peak. After forming a Ti layer (20 nm thick) on the PZT film on the STO substrate, an Au layer (200 nm thick) was formed to form a bonding layer. These were wet-etched to a density of 180 dpi. The size of one element of PZT after etching is 88μ in width.
This PZT element is 680 m long and 2.8 mm long on an STO substrate.
Books are lined up. Cr (30 nm) as a bonding layer on a SOI substrate (Ra = 0.02 μm,) with a Si (110) layer of 3 μm B-doped Si layer and 0.5 μm SiO 2 layer and a thickness of about 400 μm as a diaphragm structural member , Au (200 nm) was deposited. PZT
The upper Au layer and the Au layer on the SOI substrate were superposed and bonded by heating at 150 ° C. for 1 hour under a reduced pressure of 10 −3 Pa and a pressure of 0.3 kgf / mm 2 . The PZT film was bonded to the Au layer on the SOI substrate with good adhesion. When this was irradiated with excimer laser light (KrF) from the STO substrate side at a dose of about 350 mJ / cm 2 , the STO substrate and P
The ZT was peeled off, and the PZT patterning body could be transferred onto the SOI substrate. When the upper electrode was made of Au paste and the Pr of the piezoelectric film after bonding was measured, it was a good characteristic of about 40 μC / cm 2 . By wet etching using the SiO2 layer as an etch stop layer from the side opposite to the piezoelectric film of the Si substrate,
An ink chamber having a width of 100 μm and a length of 2 mm was formed under each piezoelectric film to obtain an actuator according to the present invention. 25 to this
A Si substrate with a nozzle of μmΦ opened and two SUS substrates with ink channels formed on top of each other were laminated to obtain an ink jet head with the nozzle portion at the end of the ink chamber. When the liquid is ejected at 5 kHz from now on, a droplet of about 20 pl will be discharged at 15 m / s
It was possible to discharge at the speed of.

【0023】(実施例2)圧電膜の厚みを4μmとした
以外は、実施例1と同様にして圧電膜のパターニング体
を作成し、厚み20μmのTi基板の両側から圧電膜を同時
に接合した。その後、STO基板を剥離し、バイモルフタ
イプのアクチュエーターを得た。Ti基板を電極として利
用し、両側の圧電膜には同じ電位を負荷させ、実施例1
と同様の方法で変位量をレーザー変位計で測定したとこ
ろ、1kHzで1.25μm、10kHzでは0.45μmの変位量
を測定した。また、各素子間のばらつきが少なく良好な
特性を示した。
Example 2 A piezoelectric film patterning body was prepared in the same manner as in Example 1 except that the thickness of the piezoelectric film was 4 μm, and the piezoelectric film was simultaneously bonded from both sides of a Ti substrate having a thickness of 20 μm. Then, the STO substrate was peeled off to obtain a bimorph type actuator. Example 1 using a Ti substrate as an electrode and applying the same potential to the piezoelectric films on both sides
When the amount of displacement was measured by a laser displacement meter in the same manner as in, a displacement of 1.25 μm at 1 kHz and 0.45 μm at 10 kHz was measured. In addition, there was little variation between the elements and good characteristics were shown.

【0024】(実施例3)接合されたMgO基板(厚み0.5
mm、接合部の幅400nm以下)上へPbTiO3を成膜後、P
ZTの単結晶膜を成膜した。この場合のMgO基板の方位ず
れはロッキングカーブ測定で(400)のピークが0.13°異
なる二本のピークの観測により確認した(図4参照)。
この基板上のPZTの膜質はXRD測定(θ―2θ測定)によ
りピーク強度比から98%以上の単一配向膜であった。
続いて、PbTiO3層をエッチング除去した以外は実施例1
と同様の方法でアクチュエーターを作製したところ、同
様に特性の良いアクチュエーターを得た。また、ロッキ
ングカーブ測定で0.31°の方位ずれのある基板でも同様
に圧電膜の成膜を行ったところ、PZTの膜質は90%の
単一配向膜であったが、作製したアクチュエーターの特
性は若干の変位量は劣るものの、実用性のある変位であ
った。 (実施例4)STO基板でRaが16nm以上の基板を用いて
実施例1と同様にインクジェットヘッドを作成した。実
施例1と同様の評価の結果、ノズル間の吐出ばらつきは
若干大きいものであったが、優れた液体吐出能力が確認
された。
Example 3 Bonded MgO substrates (thickness 0.5
mm, the width of the junction is 400 nm or less), PbTiO3 is deposited on
A single crystal film of ZT was formed. The misorientation of the MgO substrate in this case was confirmed by observing two peaks different from each other by 0.13 ° in the rocking curve measurement (see FIG. 4).
The film quality of PZT on this substrate was a single alignment film having a peak intensity ratio of 98% or more as determined by XRD measurement (θ-2θ measurement).
Then, Example 1 was performed except that the PbTiO3 layer was removed by etching.
When an actuator was produced by the same method as in (1), an actuator with similarly good characteristics was obtained. Moreover, when the piezoelectric film was formed on a substrate having a misorientation of 0.31 ° in the rocking curve measurement, the film quality of PZT was 90% of a single alignment film, but the characteristics of the manufactured actuator were slightly Although the displacement amount of was inferior, it was a practical displacement. (Example 4) An inkjet head was prepared in the same manner as in Example 1 using a STO substrate having Ra of 16 nm or more. As a result of the same evaluation as in Example 1, the ejection variation among the nozzles was slightly large, but excellent liquid ejection ability was confirmed.

【0025】(比較例1)実施例1と同じスペックのイ
ンクジェットヘッドを一辺が10mmのSTO基板を10枚
用いて行った。各基板上にスパッタ法でPZT(001)単結晶
膜を2.5μm厚で成膜し、デバイス化したところ、基板
間のつなぎの部分でのヘッドを作成することが出来ず、
180dpiで一連にノズルが連続で配列されたヘッドにはな
らなかった。また、各基板毎での圧電膜の膜厚も若干異
なったため、基板位置ごとでインク吐出能力が変わり、
液適量、液滴吐出速度の異なる制御の困難なデバイスと
なった。
(Comparative Example 1) An ink jet head having the same specifications as in Example 1 was used by using 10 STO substrates each having a side of 10 mm. A PZT (001) single crystal film was formed on each substrate by sputtering to a thickness of 2.5 μm and made into a device. As a result, a head could not be created at the joint between the substrates,
The head did not have a continuous array of nozzles at 180 dpi. Moreover, since the film thickness of the piezoelectric film is slightly different for each substrate, the ink ejection capacity is different for each substrate position,
It became a device that was difficult to control with different liquid volumes and droplet discharge rates.

【0026】[0026]

【発明の効果】以上、説明したように本発明には、以下
の効果がある。本発明の製造方法は、高密度で長尺で特
性の良い圧電アクチュエーターおよびインクジェットヘ
ッドを製造できるという効果がある。また、本発明の製
造方法は、単結晶基板を用いて圧電特性の良い圧電膜を
選択でき、かつ、デバイスサイズが大きくなっても適応
できるという効果がある。
As described above, the present invention has the following effects. The manufacturing method of the present invention has an effect that a piezoelectric actuator and an inkjet head having high density, long length, and good characteristics can be manufactured. Further, the manufacturing method of the present invention has an effect that a piezoelectric film having good piezoelectric characteristics can be selected by using a single crystal substrate and can be applied even if the device size becomes large.

【0025】[0025]

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の製造方法の工程を示す図である。FIG. 1 is a diagram showing steps of a manufacturing method of the present invention.

【図2】本発明の基板の作成工程を示す図である。FIG. 2 is a diagram showing a manufacturing process of a substrate of the present invention.

【図3】本発明のインクジェットヘッドの作成工程を示
す図である。
FIG. 3 is a diagram showing a manufacturing process of the inkjet head of the present invention.

【図4】MgO基板の方位ずれがロッキングカーブ測定で
(400)のピークが0.13°異なる二本のピークの観測によ
り確認されたことを示す図である。
[Fig. 4] Orientation shift of MgO substrate is measured by rocking curve.
It is a figure which shows that the peak of (400) was confirmed by observation of two peaks which differ from each other by 0.13 °.

【符号の説明】[Explanation of symbols]

1 基板 2 圧電膜 3 振動板構造部材 4 接合層 5 インク室 6 インク室隔壁 7 インクジェットヘッドの振動板 8 ノズル部 9 上部電極 イ 接触面 ロ 接合部 ハ 単結晶基板 1 substrate 2 Piezoelectric film 3 Vibration plate structural members 4 Bonding layer 5 ink chamber 6 ink chamber partition 7 Inkjet head diaphragm 8 nozzle 9 Upper electrode B contact surface B joint Ha single crystal substrate

───────────────────────────────────────────────────── フロントページの続き (72)発明者 松田 堅義 東京都大田区下丸子3丁目30番2号 キヤ ノン株式会社内 (72)発明者 池末 明生 愛知県名古屋市熱田区六野二丁目6番27− 107 Fターム(参考) 2C057 AF93 AG82 AP14 AP23 AP24 AP33 AQ10    ─────────────────────────────────────────────────── ─── Continued front page    (72) Inventor Ken Matsuda             3-30-2 Shimomaruko, Ota-ku, Tokyo             Non non corporation (72) Inventor Akio Ikematsu             2-6-2 Rokuno, Atsuta-ku, Nagoya-shi, Aichi             107 F term (reference) 2C057 AF93 AG82 AP14 AP23 AP24                       AP33 AQ10

Claims (7)

【特許請求の範囲】[Claims] 【請求項1】 単結晶基板上に形成された圧電膜を振動
板構造部材に接合した後、前記単結晶基板を除去しアク
チュエータを製造するアクチュエータの製造方法であっ
て、 前記単結晶基板が複数枚の単結晶基板を互いに接合した
接合部を有する基板であることを特徴とするアクチュエ
ータの製造方法。
1. A method of manufacturing an actuator, wherein a piezoelectric film formed on a single crystal substrate is bonded to a diaphragm structural member, and then the single crystal substrate is removed to manufacture an actuator. A method for manufacturing an actuator, which is a substrate having a bonded portion in which a single crystal substrate is bonded to each other.
【請求項2】 前記接合部の幅が3μm以下である前記
単結晶基板を用いることを特徴とする請求項1に記載の
アクチュエータの製造方法
2. The method of manufacturing an actuator according to claim 1, wherein the single crystal substrate having a width of the bonding portion of 3 μm or less is used.
【請求項3】 前記接合部を介して測定した前記単結晶
基板の表面粗度Raが15nm以下であることを特徴とす
る請求項1または請求項2に記載のアクチュエータの製
造方法。
3. The method for manufacturing an actuator according to claim 1, wherein a surface roughness Ra of the single crystal substrate measured through the bonding portion is 15 nm or less.
【請求項4】 XRD(X線回折)測定での、ロッキングカ
ーブ測定による二本のピーク位置が0.05°から0.3°離
れている前記単結晶基板であることを特徴とする請求項
1から請求項3のいずれか1項に記載のアクチュエータ
の製造方法。
4. The single crystal substrate according to claim 1, wherein the two peak positions measured by a rocking curve in XRD (X-ray diffraction) measurement are separated from each other by 0.05 ° to 0.3 °. 4. The method for manufacturing the actuator according to any one of 3 above.
【請求項5】 前記単結晶基板がMgO基板、STO基板、Ba
TiO3基板、Yまたは希土類がドープされていても良いZrO
2基板のうちいずれかであることを特徴とする請求項1
から請求項4のいずれか1項に記載のアクチュエータの
製造方法。
5. The single crystal substrate is MgO substrate, STO substrate, Ba
TiO 3 substrate, Y or ZrO optionally doped with rare earths
2. The substrate according to claim 1, which is one of two substrates.
To the method for manufacturing the actuator according to claim 4.
【請求項6】 前記単結晶基板の厚みが0.05mmから
2.5mmであることを特徴とする請求項1から請求項5
のいずれか1項に記載のアクチュエータの製造方法。
6. The single crystal substrate according to claim 1, wherein the thickness of the single crystal substrate is 0.05 mm to 2.5 mm.
A method for manufacturing the actuator according to any one of 1.
【請求項7】 単結晶基板上に形成された圧電膜を振動
板構造部材に接合した後、前記単結晶基板を除去しイン
クジェットヘッドを製造する製造方法であって、 前記単結晶基板が複数枚の単結晶基板を互いに接合した
接合部を有する基板であることを特徴とするインクジェ
ットヘッドの製造方法。
7. A method for manufacturing an inkjet head by bonding a piezoelectric film formed on a single crystal substrate to a diaphragm structure member, and then removing the single crystal substrate to manufacture an ink jet head. 2. A method for manufacturing an inkjet head, wherein the single crystal substrate is a substrate having a bonded portion bonded to each other.
JP2002116052A 2002-04-18 2002-04-18 Actuator and inkjet head manufacturing method Expired - Fee Related JP4086535B2 (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2002116052A JP4086535B2 (en) 2002-04-18 2002-04-18 Actuator and inkjet head manufacturing method
US10/412,395 US6927084B2 (en) 2002-04-18 2003-04-14 Method of manufacturing actuator and ink jet head

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2002116052A JP4086535B2 (en) 2002-04-18 2002-04-18 Actuator and inkjet head manufacturing method

Publications (2)

Publication Number Publication Date
JP2003309304A true JP2003309304A (en) 2003-10-31
JP4086535B2 JP4086535B2 (en) 2008-05-14

Family

ID=29207733

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2002116052A Expired - Fee Related JP4086535B2 (en) 2002-04-18 2002-04-18 Actuator and inkjet head manufacturing method

Country Status (2)

Country Link
US (1) US6927084B2 (en)
JP (1) JP4086535B2 (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005169804A (en) * 2003-12-10 2005-06-30 Fuji Xerox Co Ltd Image recorder
JP2009054994A (en) * 2007-07-27 2009-03-12 Fujifilm Corp Piezoelectric element, and liquid discharge device
KR101068261B1 (en) * 2009-03-02 2011-09-28 삼성전기주식회사 Ink-Jet Head and Method for Manufacturing the same
JP2016162820A (en) * 2015-02-27 2016-09-05 コニカミノルタ株式会社 Piezoelectric device, method of manufacturing piezoelectric device, ink jet head, method of manufacturing ink jet head and ink jet printer
US10424718B2 (en) 2015-09-25 2019-09-24 Ricoh Company, Ltd. Piezoelectric film, piezoelectric device, and method for making piezoelectric film

Families Citing this family (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100672883B1 (en) * 2003-01-31 2007-01-24 캐논 가부시끼가이샤 Piezoelectric element
US7059711B2 (en) * 2003-02-07 2006-06-13 Canon Kabushiki Kaisha Dielectric film structure, piezoelectric actuator using dielectric element film structure and ink jet head
US7215067B2 (en) * 2003-02-07 2007-05-08 Canon Kabushiki Kaisha Ferroelectric thin film element, piezoelectric actuator and liquid discharge head
JP4717344B2 (en) * 2003-12-10 2011-07-06 キヤノン株式会社 Dielectric thin film element, piezoelectric actuator, and liquid discharge head
US7262544B2 (en) * 2004-01-09 2007-08-28 Canon Kabushiki Kaisha Dielectric element, piezoelectric element, ink jet head and method for producing the same head
US7453188B2 (en) * 2004-02-27 2008-11-18 Canon Kabushiki Kaisha Dielectric element, piezoelectric element, ink jet head and ink jet recording apparatus and manufacturing method of same
JP2005244133A (en) * 2004-02-27 2005-09-08 Canon Inc Dielectric element, piezoelectric element, inkjet head, inkjet recording apparatus, and method of manufacturing the same
US7235917B2 (en) * 2004-08-10 2007-06-26 Canon Kabushiki Kaisha Piezoelectric member element and liquid discharge head comprising element thereof
JP2006069152A (en) * 2004-09-06 2006-03-16 Canon Inc Inkjet head and its manufacturing process
US7998362B2 (en) * 2005-08-23 2011-08-16 Canon Kabushiki Kaisha Piezoelectric substance, piezoelectric element, liquid discharge head using piezoelectric element, liquid discharge apparatus, and production method of piezoelectric element
US7528530B2 (en) * 2005-08-23 2009-05-05 Canon Kabushiki Kaisha Piezoelectric substance, piezoelectric substance element, liquid discharge head, liquid discharge device and method for producing piezoelectric substance
US20070046153A1 (en) * 2005-08-23 2007-03-01 Canon Kabushiki Kaisha Piezoelectric substrate, piezoelectric element, liquid discharge head and liquid discharge apparatus
US7528532B2 (en) * 2005-08-23 2009-05-05 Canon Kabushiki Kaisha Piezoelectric substance and manufacturing method thereof, piezoelectric element and liquid discharge head using such piezoelectric element and liquid discharge apparatus
US7591543B2 (en) * 2005-08-23 2009-09-22 Canon Kabushiki Kaisha Piezoelectric member, piezoelectric member element, liquid discharge head in use thereof, liquid discharge apparatus and method of manufacturing piezoelectric member
US7521845B2 (en) * 2005-08-23 2009-04-21 Canon Kabushiki Kaisha Piezoelectric substance, piezoelectric element, liquid discharge head using piezoelectric element, and liquid discharge apparatus
US8142678B2 (en) * 2005-08-23 2012-03-27 Canon Kabushiki Kaisha Perovskite type oxide material, piezoelectric element, liquid discharge head and liquid discharge apparatus using the same, and method of producing perovskite type oxide material
US7984977B2 (en) * 2006-07-14 2011-07-26 Canon Kabushiki Kaisha Piezoelectric element, manufacturing method for piezoelectric body, and liquid jet head
CN106162454B (en) * 2016-08-31 2021-10-08 歌尔股份有限公司 Loudspeaker diaphragm, loudspeaker monomer and electronic equipment
FR3083004B1 (en) 2018-06-22 2021-01-15 Commissariat Energie Atomique PIEZOELECTRIC TRANSDUCER DEVICE AND METHOD OF EMBODIMENT OF SUCH A DEVICE

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62213399A (en) 1986-03-12 1987-09-19 Omron Tateisi Electronics Co Piezoelectric ceramic unit
JPH11348285A (en) 1998-06-10 1999-12-21 Matsushita Electric Ind Co Ltd Ink jet recorder and manufacture thereof
JP2001113712A (en) 1999-08-06 2001-04-24 Matsushita Electric Ind Co Ltd Manufacturing method of ink jet head, and ink jet recorder
JP3796394B2 (en) * 2000-06-21 2006-07-12 キヤノン株式会社 Method for manufacturing piezoelectric element and method for manufacturing liquid jet recording head
JP3512379B2 (en) * 2000-09-20 2004-03-29 日本碍子株式会社 Piezoelectric element and method of manufacturing the same
JP3754897B2 (en) * 2001-02-09 2006-03-15 キヤノン株式会社 Semiconductor device substrate and method for manufacturing SOI substrate
JP3833070B2 (en) * 2001-02-09 2006-10-11 キヤノン株式会社 Liquid ejecting head and manufacturing method

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005169804A (en) * 2003-12-10 2005-06-30 Fuji Xerox Co Ltd Image recorder
JP4539090B2 (en) * 2003-12-10 2010-09-08 富士ゼロックス株式会社 Image recording device
JP2009054994A (en) * 2007-07-27 2009-03-12 Fujifilm Corp Piezoelectric element, and liquid discharge device
KR101068261B1 (en) * 2009-03-02 2011-09-28 삼성전기주식회사 Ink-Jet Head and Method for Manufacturing the same
JP2016162820A (en) * 2015-02-27 2016-09-05 コニカミノルタ株式会社 Piezoelectric device, method of manufacturing piezoelectric device, ink jet head, method of manufacturing ink jet head and ink jet printer
US10424718B2 (en) 2015-09-25 2019-09-24 Ricoh Company, Ltd. Piezoelectric film, piezoelectric device, and method for making piezoelectric film

Also Published As

Publication number Publication date
US6927084B2 (en) 2005-08-09
JP4086535B2 (en) 2008-05-14
US20030196745A1 (en) 2003-10-23

Similar Documents

Publication Publication Date Title
JP4086535B2 (en) Actuator and inkjet head manufacturing method
KR100581257B1 (en) Piezoelectric element, ink jet head, angular velocity sensor, manufacturing method thereof, and ink-jet type recording apparatus
JP3833070B2 (en) Liquid ejecting head and manufacturing method
US6911107B2 (en) Piezoelectric film type actuator, liquid discharge head, and method of manufacturing the same
JP3796394B2 (en) Method for manufacturing piezoelectric element and method for manufacturing liquid jet recording head
JP5041765B2 (en) Epitaxial oxide film, piezoelectric film, piezoelectric film element, liquid discharge head and liquid discharge apparatus using piezoelectric film element
TWI264839B (en) Dielectric element, piezoelectric element, ink jet head and method for producing the same head
US6854832B2 (en) Laminate having mono-crystal oxide conductive member on silicon substrate, actuator using such laminate, ink jet head and method for manufacturing such head
KR100672883B1 (en) Piezoelectric element
JP2005175099A (en) Dielectric thin film element, piezoelectric actuator, liquid discharge head and its manufacturing method
JPH11348285A (en) Ink jet recorder and manufacture thereof
JP2003309303A (en) Method for manufacturing piezoelectric film type actuator, and method for manufacturing liquid injection head
JP2004186646A (en) Piezoelectric element, ink jet head, method of manufacturing them, and ink jet-type recording device
JP3907628B2 (en) Piezoelectric actuator, manufacturing method thereof, and liquid discharge head
JP2005119166A (en) Piezoelectric element, inkjet head, method of manufacturing the same, and inkjet recorder
JPH07235708A (en) Method of fabrication of piezoelectric/electrostrictive film device
JP2003188433A (en) Piezo-electric device, ink jet head and method for manufacturing them and ink jet recording device
JP2007088441A (en) Piezoelectric, piezoelectric element, liquid ejection head, liquid ejector and process for producing piezoelectric
JP2003309302A (en) Piezoelectric film type element structure, liquid injection head, and their manufacturing method
JP2006205572A (en) Manufacturing method for three-dimensional hollow structure, and manufacturing method for liquid ejection head
JP4689482B2 (en) Piezoelectric actuator, method for manufacturing piezoelectric actuator, and liquid discharge head
JP3903056B2 (en) Method for manufacturing piezoelectric element and method for manufacturing liquid jet recording head
JP2003188431A (en) Piezo-electric device, ink jet head and method for manufacturing them and ink jet recording device
JP2006303519A (en) Liquid injection recording head and its manufacturing method
JP2004237676A (en) Ink jet head

Legal Events

Date Code Title Description
A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20050415

RD03 Notification of appointment of power of attorney

Free format text: JAPANESE INTERMEDIATE CODE: A7423

Effective date: 20050415

A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20070727

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20070822

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20071017

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20071114

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20080111

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20080206

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20080219

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20110228

Year of fee payment: 3

R150 Certificate of patent or registration of utility model

Free format text: JAPANESE INTERMEDIATE CODE: R150

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20120229

Year of fee payment: 4

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20130228

Year of fee payment: 5

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20140228

Year of fee payment: 6

LAPS Cancellation because of no payment of annual fees