JP2002270396A - Plasma processing equipment - Google Patents

Plasma processing equipment

Info

Publication number
JP2002270396A
JP2002270396A JP2001072200A JP2001072200A JP2002270396A JP 2002270396 A JP2002270396 A JP 2002270396A JP 2001072200 A JP2001072200 A JP 2001072200A JP 2001072200 A JP2001072200 A JP 2001072200A JP 2002270396 A JP2002270396 A JP 2002270396A
Authority
JP
Japan
Prior art keywords
gas
processing chamber
vacuum processing
plasma processing
processing apparatus
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2001072200A
Other languages
Japanese (ja)
Inventor
Takuya Matsui
卓也 松井
Shogo Uchiumi
省吾 内海
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP2001072200A priority Critical patent/JP2002270396A/en
Publication of JP2002270396A publication Critical patent/JP2002270396A/en
Pending legal-status Critical Current

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  • Physical Or Chemical Processes And Apparatus (AREA)
  • Chemical Vapour Deposition (AREA)
  • Drying Of Semiconductors (AREA)
  • Plasma Technology (AREA)

Abstract

PROBLEM TO BE SOLVED: To provide a means for attaining optimization of material selection of a reinforcement rib used for break prevention of dielectric top board and its long-life. SOLUTION: By connecting a gas introduction parts 4 and a gas diffusion parts 6 to the reinforcement rib 3 prepared for breakage prevention of the dielectric top board 2, a structure is constituted that gas is made to distribute uniformly on a substrate 9 in a vacuum processing room 8 from a gas blow-off hole 7 arranged in the gas diffusion parts 6. By this, the function for gas blowing-off can be separated from the reinforcement rib 3, and optimization of material selection and long-life can be made to attain.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】この発明は、液晶等の電子デ
バイスの製造に利用されるドライエッチング等のプラズ
マ処理装置に関し、特に電磁波を用いて処理室内のガス
を励起して発生させたプラズマを利用するプラズマ処理
装置に関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a plasma processing apparatus such as a dry etching apparatus used for manufacturing an electronic device such as a liquid crystal device, and more particularly to a plasma generated by exciting a gas in a processing chamber using electromagnetic waves. And a plasma processing apparatus.

【0002】[0002]

【従来の技術】処理室内のガスを電磁波を用いて励起
し、発生したプラズマを利用して基板を処理するプラズ
マ処理装置においては、誘電体天板の真空側に接する補
強リブから基板面に向けてシャワー状に均一にガスを吹
き出すように構成されている。
2. Description of the Related Art In a plasma processing apparatus which excites a gas in a processing chamber by using an electromagnetic wave and processes a substrate by using generated plasma, a gas is supplied from a reinforcing rib in contact with a vacuum side of a dielectric top plate toward a substrate surface. The gas is blown out like a shower.

【0003】この種のプラズマ処理装置の従来構成を、
図5および図6に示す。図5、図6において、補強リブ
3に設けたガス導入口を通してガスを導入し、さらに、
補強リブ3に設けたガスの主経路5およびガス吹き出し
穴7を通して、真空処理室8内に均等な状態でガスが吹
き出し、排気経路により排気されるように構成されてい
る。真空処理室8内のガスは、誘電体天板2上に設けら
れたコイル1に高周波電力を印加することによって発せ
られた電磁波により励起され、生じたプラズマによって
処理室内の基板ステージ10上に載置された基板9が処
理される。
The conventional configuration of this type of plasma processing apparatus is as follows:
This is shown in FIGS. 5 and 6, a gas is introduced through a gas inlet provided in the reinforcing rib 3, and further,
The gas is blown out uniformly into the vacuum processing chamber 8 through the gas main passage 5 and the gas blowout hole 7 provided in the reinforcing rib 3, and is exhausted by the exhaust passage. The gas in the vacuum processing chamber 8 is excited by an electromagnetic wave generated by applying high-frequency power to the coil 1 provided on the dielectric top plate 2, and is mounted on a substrate stage 10 in the processing chamber by generated plasma. The placed substrate 9 is processed.

【0004】[0004]

【発明が解決しようとする課題】一般に、プラズマ処理
を行う場合、処理室内の目的の場所に均一にプラズマを
生じさせることで、基板上の薄膜を均一に加工すること
ができる。均一なプラズマを生成させる手段として、一
般にプロセスガスを基板面に均一になるように供給する
ことが有効とされている。
In general, when performing plasma processing, a thin film on a substrate can be uniformly processed by generating plasma uniformly at a target location in a processing chamber. As means for generating uniform plasma, it is generally effective to supply a process gas uniformly to the substrate surface.

【0005】しかし、従来のガス吹き方法では、プロセ
スガスを基板面上に均一に供給することを目的として補
強リブに複雑なガス導入経路および細かなガス吹き出し
穴を設けていたために、補強リブにプロセスガスに対し
て耐食性を持たせるための表面処理を、全体にかつ均一
に実施することが困難であった。そのため、補強リブ自
体を、プロセスガスに対する耐食性を持つ素材の選定が
必須となり、プラズマ処理装置に要求される電気的特性
やメンテナンス性向上のために求められる軽量化、ある
いは部品の低コスト化等を狙いとした材料選定が難しい
という問題を引き起こしていた。
However, in the conventional gas blowing method, a complicated gas introduction path and fine gas blowing holes are provided in the reinforcing rib for the purpose of uniformly supplying the process gas onto the substrate surface. It has been difficult to uniformly and uniformly perform a surface treatment for imparting corrosion resistance to a process gas. For this reason, it is necessary to select a material having corrosion resistance to the process gas for the reinforcing rib itself, and to reduce the weight required for improving the electrical characteristics and maintainability required for the plasma processing apparatus or to reduce the cost of parts. This caused a problem that it was difficult to select the target material.

【0006】また、プロセスガスに対して耐食性の高い
素材による補強リブを使用してプラズマ処理を行って
も、使用頻度が増すにつれてガス導入経路およびガス吹
き出し穴が劣化するために、劣化がひどくなればリブと
しての機能を十分持ち合わせているにもかかわらず、補
強リブ自体を新品と交換しなければならないという問題
を生じていた。
Further, even when plasma processing is performed using a reinforcing rib made of a material having high corrosion resistance to a process gas, the gas introduction path and the gas blowing hole deteriorate as the frequency of use increases. For example, there is a problem that the reinforcing ribs themselves must be replaced with new ones, even though the ribs have a sufficient function as the ribs.

【0007】本発明は、上記従来の問題点を解決し、補
強リブの最適な素材選定ができ、また、メンテナンス容
易なプラズマ処理装置を提供することを目的としてい
る。
SUMMARY OF THE INVENTION It is an object of the present invention to provide a plasma processing apparatus which can solve the above-mentioned conventional problems, can select an optimum material for a reinforcing rib, and can easily maintain the same.

【0008】[0008]

【課題を解決するための手段】この目的を達成するため
に本発明は、真空処理室内にガスを供給するためのガス
供給装置と、真空処理室内を排気するための排気装置
と、真空処理室の誘電体からなる天板上にコイル状に形
成された電極から構成され、電磁波を放射することで真
空処理室内にプラズマを発生させ、真空処理室内の基板
ステージ上に載置された基板を処理するプラズマ処理装
置において、真空側に前記誘電体天板と接してこの天板
を補強する補強リブと、この補強リブに設けた前記ガス
を前記真空処理室内に導入するガス導入用の部品と、こ
のガス導入用の部品に接続し、前記真空処理室内に均等
にガスを拡散させるガス拡散のための部品とを設けたも
のである。
To achieve this object, the present invention provides a gas supply device for supplying gas into a vacuum processing chamber, an exhaust device for exhausting the vacuum processing chamber, and a vacuum processing chamber. Processes a substrate placed on a substrate stage in a vacuum processing chamber by radiating electromagnetic waves to generate plasma in a vacuum processing chamber. In the plasma processing apparatus, a reinforcing rib for contacting the dielectric top plate on the vacuum side to reinforce the top plate, and a gas introduction component for introducing the gas provided in the reinforcing rib into the vacuum processing chamber, A gas diffusion component connected to the gas introduction component for uniformly diffusing the gas into the vacuum processing chamber is provided.

【0009】[0009]

【発明の実施の形態】以下、本発明の実施の形態に係る
プラズマ処理装置について、図を参照して説明する。
DESCRIPTION OF THE PREFERRED EMBODIMENTS Hereinafter, a plasma processing apparatus according to an embodiment of the present invention will be described with reference to the drawings.

【0010】図1および図2は、本発明の第1の実施の
形態に係るプラズマ処理装置を示し、真空処理室8内の
基板ステージ10上に基板9を載置し、排気経路11か
ら真空処理室8を真空排気する。真空排気後、プロセス
ガスは誘電体天板2の破損防止のために設けた補強リブ
3に接続されたガス導入用部品4に設けたガスの主経路
5を経て、ガス拡散のための部品6に設けたガス吹き出
し穴7に到達し、真空処理室8内の基板9上に均一に分
布される。なお、この際ガスの主経路5の断面形状は円
形であっても多角形であっても良く、その断面積は3m
2から30mm2程度とすれば良い。ガス吹き出し穴7
は、例えば直径0.5mmから2mm程度とすれば良
い。また、ガス拡散のための部品6は、パイプ状であっ
てもあるいはブロック状の部品にガス経路を設けたもの
であっても良い。これにより、補強リブ3にはガス導入
のための経路およびガス吹き出し穴を設ける必要がなく
なるため、プロセスガスに対する耐食性を持たせるため
の表面処理を補強リブ3全体にかつ均一に施すことが可
能となる。したがって、補強リブ3は、電気的特性やメ
ンテナンス性向上の為の軽量化を重視した材料選定が実
施できることになる。
FIGS. 1 and 2 show a plasma processing apparatus according to a first embodiment of the present invention, in which a substrate 9 is placed on a substrate stage 10 in a vacuum processing chamber 8, and a vacuum is supplied from an exhaust path 11. The processing chamber 8 is evacuated. After evacuation, the process gas passes through a gas main path 5 provided in a gas introduction part 4 connected to a reinforcing rib 3 provided to prevent damage to the dielectric top plate 2, and a gas diffusion part 6. And is uniformly distributed on the substrate 9 in the vacuum processing chamber 8. In this case, the cross-sectional shape of the main gas path 5 may be circular or polygonal, and its cross-sectional area is 3 m.
from m 2 may be set to 30 mm 2 approximately. Gas blowout hole 7
May be, for example, about 0.5 mm to 2 mm in diameter. The gas diffusion component 6 may be a pipe-shaped component or a block-shaped component provided with a gas path. Accordingly, it is not necessary to provide a gas introduction path and a gas blowout hole in the reinforcing ribs 3, so that a surface treatment for imparting corrosion resistance to a process gas can be uniformly applied to the entire reinforcing ribs 3. Become. Therefore, for the reinforcing ribs 3, it is possible to select a material that emphasizes weight reduction for improving electrical characteristics and maintainability.

【0011】さらに、使用頻度の増加によりガス導入経
路5およびガス吹き出し穴7が劣化しても、ガス導入用
部品4と補強リブ3とを分離したので、補強リブ3の長
寿命化が図れることになる。
Further, even if the gas introduction path 5 and the gas blowout hole 7 are deteriorated due to an increase in the frequency of use, the life of the reinforcement rib 3 can be extended because the gas introduction component 4 and the reinforcement rib 3 are separated. become.

【0012】また、図3および図4は、本発明の第2の
実施の形態に係るプラズマ処理装置を示し、補強リブ3
の中心部まで設けた穴にパイプ状のガス導入用部品4を
挿入し、ガス拡散のための部品6を通して真空処理室8
にプロセスガスを導入するような構造とすることによ
り、真空処理室8の上部の中央あたりから基板9面へ向
かって均一にプロセスガスを供給することが可能とな
る。
FIGS. 3 and 4 show a plasma processing apparatus according to a second embodiment of the present invention.
A gas-introducing component 4 is inserted into a hole provided up to the center of the vacuum processing chamber 8 through a gas diffusing component 6.
With such a structure, the process gas can be uniformly supplied from around the center of the upper part of the vacuum processing chamber 8 toward the surface of the substrate 9.

【0013】なおこの際、ガス導入用部品4およびガス
拡散のための部品6は、プロセスガスに対して耐食性の
ある部品とすることにより、各部品の長寿命化が図れ
る。
At this time, the parts 4 for introducing gas and the parts 6 for diffusing gas are made to have corrosion resistance to the process gas, so that the life of each part can be extended.

【0014】また、以上述べた本発明の実施形態以外に
も、ガス拡散のための部品6自体にガスを導入する経路
を設けて、いったんガスを基板上の中央部まで導入し、
その後、ガスを拡散するための経路および、ガス拡散の
ための経路に設けたガス吹き出し穴を通して、ガスを真
空処理室8内へ導入することより、基板9面上への均一
なガス供給が可能となる。
In addition to the above-described embodiment of the present invention, a path for introducing a gas into the component 6 itself for gas diffusion is provided, and the gas is once introduced to the central portion on the substrate.
After that, the gas is introduced into the vacuum processing chamber 8 through the gas diffusion path and the gas blowing holes provided in the gas diffusion path, so that the gas can be uniformly supplied onto the surface of the substrate 9. Becomes

【0015】[0015]

【発明の効果】本発明のプラズマ処理装置によれば、以
上のように誘電体天板の破損防止のために設けた補強リ
ブに、ガス導入用の部品およびガス拡散のための部品を
接続することにより、補強リブにはガス導入のための経
路およびガス吹き出し穴を設ける必要がなくなるため、
プロセスガスに対する耐食性を持たせるための表面処理
を補強リブ全体にかつ均一に施すことが可能となり、電
気的特性やメンテナンス性向上の為の軽量化を重視した
材料選定が実施できることになる。また、使用頻度の増
加によりガス導入経路およびガス吹き出し穴が劣化して
も、ガス導入用の部品と補強リブとを分離したので、補
強リブの長寿命化が図れるという効果を有する。
According to the plasma processing apparatus of the present invention, components for gas introduction and components for gas diffusion are connected to the reinforcing ribs provided for preventing the dielectric top plate from being damaged as described above. This eliminates the need to provide a gas introduction path and gas blowout holes in the reinforcing ribs,
A surface treatment for imparting corrosion resistance to a process gas can be uniformly applied to the entire reinforcing rib, and a material can be selected with an emphasis on weight reduction for improving electrical characteristics and maintainability. Further, even if the gas introduction path and the gas blowout hole are deteriorated due to an increase in the frequency of use, the gas introduction component and the reinforcing rib are separated, so that the service life of the reinforcing rib can be extended.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明の第1の実施の形態に係るプラズマ処理
装置の概略構成図
FIG. 1 is a schematic configuration diagram of a plasma processing apparatus according to a first embodiment of the present invention.

【図2】本発明の第1の実施の形態に係るプラズマ処理
装置の概略立体図
FIG. 2 is a schematic three-dimensional view of the plasma processing apparatus according to the first embodiment of the present invention.

【図3】本発明の第2の実施の形態に係るプラズマ処理
装置の概略構成図
FIG. 3 is a schematic configuration diagram of a plasma processing apparatus according to a second embodiment of the present invention.

【図4】本発明の第2の実施の形態に係るプラズマ処理
装置の概略立体図
FIG. 4 is a schematic perspective view of a plasma processing apparatus according to a second embodiment of the present invention.

【図5】従来例のプラズマ処理装置の概略構成図FIG. 5 is a schematic configuration diagram of a conventional plasma processing apparatus.

【図6】従来例のプラズマ処理装置の概略立体図FIG. 6 is a schematic perspective view of a conventional plasma processing apparatus.

【符号の説明】[Explanation of symbols]

2 誘電体天板 3 補強リブ 4 ガス導入用部品 6 ガス拡散のための部品 7 ガス吹き出し穴 2 Dielectric top plate 3 Reinforcement rib 4 Gas introduction component 6 Gas diffusion component 7 Gas blowout hole

───────────────────────────────────────────────────── フロントページの続き Fターム(参考) 4G075 AA24 AA30 BC06 CA24 CA47 DA02 EB01 EC21 FC09 FC15 4K030 EA03 FA01 5F004 AA16 BA20 BB32 BC03  ──────────────────────────────────────────────────続 き Continued on the front page F term (reference) 4G075 AA24 AA30 BC06 CA24 CA47 DA02 EB01 EC21 FC09 FC15 4K030 EA03 FA01 5F004 AA16 BA20 BB32 BC03

Claims (3)

【特許請求の範囲】[Claims] 【請求項1】 真空処理室内にガスを供給するためのガ
ス供給装置と、真空処理室内を排気するための排気装置
と、真空処理室の誘電体からなる天板上にコイル状に形
成された電極から構成され、電磁波を放射することで真
空処理室内にプラズマを発生させ、真空処理室内の基板
ステージ上に載置された基板を処理するプラズマ処理装
置において、真空側に前記誘電体天板と接してこの天板
を補強する補強リブと、この補強リブに設けた前記ガス
を前記真空処理室内に導入するガス導入用の部品と、こ
のガス導入用の部品に接続し、前記真空処理室内に均等
にガスを拡散させるガス拡散のための部品とを設けたこ
とを特徴とするプラズマ処理装置。
1. A gas supply device for supplying a gas into a vacuum processing chamber, an exhaust device for exhausting the vacuum processing chamber, and a coil formed on a top plate made of a dielectric material of the vacuum processing chamber. In the plasma processing apparatus configured of electrodes and generating plasma in the vacuum processing chamber by radiating electromagnetic waves, and processing a substrate mounted on a substrate stage in the vacuum processing chamber, the dielectric top plate on the vacuum side A reinforcing rib that contacts and reinforces the top plate, a gas introduction component that introduces the gas provided in the reinforcement rib into the vacuum processing chamber, and a gas introduction component that is connected to the gas introduction component. A plasma processing apparatus comprising a gas diffusion component for uniformly diffusing a gas.
【請求項2】 真空処理室内にガスを導入するためのガ
ス導入用部品は、パイプ状で、補強リブに設けた穴に挿
入可能であることを特徴とする請求項1記載のプラズマ
処理装置。
2. The plasma processing apparatus according to claim 1, wherein the gas introduction component for introducing a gas into the vacuum processing chamber has a pipe shape and can be inserted into a hole provided in a reinforcing rib.
【請求項3】 真空処理室内にガスを導入するためのガ
ス導入用部品は、真空処理中に用いるプロセスガスに対
して耐食性を持つ素材であることを特徴とする請求項
1、2のいずれかに記載のプラズマ処理装置。
3. The gas introduction component for introducing a gas into a vacuum processing chamber is made of a material having corrosion resistance to a process gas used during vacuum processing. 3. The plasma processing apparatus according to 1.
JP2001072200A 2001-03-14 2001-03-14 Plasma processing equipment Pending JP2002270396A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2001072200A JP2002270396A (en) 2001-03-14 2001-03-14 Plasma processing equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2001072200A JP2002270396A (en) 2001-03-14 2001-03-14 Plasma processing equipment

Publications (1)

Publication Number Publication Date
JP2002270396A true JP2002270396A (en) 2002-09-20

Family

ID=18929810

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2001072200A Pending JP2002270396A (en) 2001-03-14 2001-03-14 Plasma processing equipment

Country Status (1)

Country Link
JP (1) JP2002270396A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010183092A (en) * 2005-11-15 2010-08-19 Panasonic Corp Plasma treatment apparatus
JP2012222063A (en) * 2011-04-06 2012-11-12 Ulvac Japan Ltd Plasma processing apparatus
JP2013115275A (en) * 2011-11-29 2013-06-10 Hitachi Kokusai Electric Inc Substrate processing apparatus
CN108203815A (en) * 2016-12-19 2018-06-26 北京北方华创微电子装备有限公司 Processing chamber and semiconductor processing equipment

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010183092A (en) * 2005-11-15 2010-08-19 Panasonic Corp Plasma treatment apparatus
JP2012222063A (en) * 2011-04-06 2012-11-12 Ulvac Japan Ltd Plasma processing apparatus
JP2013115275A (en) * 2011-11-29 2013-06-10 Hitachi Kokusai Electric Inc Substrate processing apparatus
CN108203815A (en) * 2016-12-19 2018-06-26 北京北方华创微电子装备有限公司 Processing chamber and semiconductor processing equipment

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