JP2002160397A - Optical axis measuring method for light emitting element head, light emitting element head, and electrophotographic recording device - Google Patents

Abstract

PROBLEM TO BE SOLVED: To prevent inconsistencies in density from occurring on the irradiation surface of a photoconductor by enabling the correction of variations in the inclination of an optical axis of irradiated light in an light emitting element head used for an optical writing device such as a printer, a copying machine or a fax, which uses an electrophotographic recording system. SOLUTION: The position of the intersection of the optical axis of the irradiated light output from a lens array 105 and an X-Y plane is detected on the two X-Y planes, and the inclination of the optical axis of the irradiated light with respect to a Z-axis is detected on the basis of positional information. In addition, an LED head 100 is provided with an optical-axis adjusting device for inclining the lens array 105 around an X-axis.

Description

DETAILED DESCRIPTION OF THE INVENTION

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a structure of a light emitting element head used in an optical writing apparatus such as a printer, a copying machine, a facsimile, etc. using an electrophotographic recording system, and light of irradiation light output from the light emitting element head. It relates to an axis measuring method.

[0002]

2. Description of the Related Art FIG. 8 is a cross-sectional view showing a main structure of an LED head 100 having a conventional structure. In the figure, L is placed on a mounting surface 101a of a base 101 formed in an inverted U shape.
An ED substrate 102 is mounted, and an LED chip 10 arranged at a predetermined position of the LED substrate 102 so as to form a light emitting area including a reference axis A perpendicular to the substrate.
3 and a driver IC 104 for driving this LED chip
Are arranged. It is assumed that the Z axis shown in FIG.

[0003] These LED substrate 102 and base 101
Is provided with an SLA holder 106 that extends in the front-back direction (X-axis direction) of the paper surface of FIG. 8 and covers these, and holds the rectangular parallelepiped lens array 105 while shielding light from the outside. On both sides of the SLA holder 106, a pressing surface 106a that comes into contact with the upper surface 102a of the LED substrate 102, and an inner surface that comes into contact with an end surface 102b of the LED substrate 102 formed substantially flush with the abutting surface 101b of the base 101. 10
6b are formed.

Accordingly, by mounting the SLA holder 106, the LED substrate 102 is positioned on the mounting surface 101a of the base 101, and furthermore, the LED substrate 102 is
By mounting a pair of holder clamps 107 for pressing the A holder 106 through the LED board 102,
These are integrally fixed.

The SLA holder 106 holds the lens array 105 at a position where the reference axis A passes. This lens array 105 also extends in the front-back direction (X-axis direction) on the paper surface of FIG. 8, and has an SLA position regulating surface 106 c formed on the SLA holder 106, and both X and Z axes formed on the SLA holder 106. And the pressing arm 106d slightly urged in the (+) direction of the Y-axis perpendicular to the position, the movement in the Y-axis direction is regulated and positioned. The bottom of the lens array 105 is placed on the upper surface of the protrusion 106e extending in the (-) direction of the Y axis from below the SLA position regulating surface 106c, so that the lens array 105 has a reference axis direction (Z axis direction).
Is determined.

The lens array 105 is set on the photoreceptor 110 disposed thereabove so that the focal position comes at a conjugate length Tc, so that the lens array 105 is linearly arranged on the LED substrate 102 along the X-axis direction. A large number of light-emitting elements can be imaged on the photoreceptor at the same magnification to perform good printing.

In this conventional example, an A4 width is assumed at a printing density of 600 DPI, and a light emitting portion of 192 dots arranged linearly is formed on an LED chip 103 to be used. And 26 LED chips 103 are LE
They are arranged on the D substrate 102 in a straight line along the X-axis direction. Therefore, the total number of dots of the LED light emitting unit is 4992
The dots are (192 × 26), and the LED board 102 is equipped with 26 driver ICs 104 for driving each LED chip and one EEPROM for storing light amount correction data of each dot.

The lens array 105 has all these L
It has a length to cover the ED light-emitting unit, and is positioned in the longitudinal direction (X-axis direction) by, for example, four pressing arms 106d shown in the cross-sectional view of FIG.

[0009]

As shown in FIG. 9, the LED head 100 constructed as described above has a structure in which the SLA position regulating surface 106c of the SLA holder 106 is inclined with respect to the XZ plane. Alternatively, the lens array 105 is affected by the variation in the thickness of the
When it is mounted in a state where it is not completely pressed against c and is similarly inclined, the optical axis B of the lens array 105 is inclined with respect to the reference axis A. Thereby, the photoconductor 110
The optical axis of the irradiation light applied to the photosensitive member 110 is deviated from a desired optical path on the reference axis A, and density unevenness occurs on the irradiation surface of the photoconductor 110.

An object of the present invention is to provide a method for measuring an inclination angle at which an optical axis of irradiation light irradiated to a photoreceptor is inclined with respect to a desired reference axis direction, and further, based on the measured inclination angle. Another object of the present invention is to provide a light emitting element head capable of adjusting the inclination of the optical axis of the lens array 105 and correcting the optical axis of the irradiation light so as to coincide with a desired reference axis direction.

[0011]

According to a first aspect of the present invention, there is provided a method for measuring an optical axis of a light emitting element head, wherein the light emitting element head outputs an input light as convergent irradiation light with respect to a predetermined reference axis by an optical element. An optical axis measurement method for measuring the inclination of the optical axis of light, assuming a Z axis in the direction of the reference axis,
On a plane including the reference axis and the optical axis, assuming a Y axis in a direction orthogonal to the reference axis and an X axis in a direction orthogonal to the Z axis and the Y axis, XY It has a slit formed on a plane and formed in a direction inclined with respect to the Y-axis direction, provided with light detection means for detecting the amount of the irradiation light through the slit, the detection means in the Z-axis direction and By moving in the X-axis direction, the slit is moved to the first XY
The first of the detecting means which is on a plane and has the maximum light amount
And the second position of the detecting means where the slit is on the second XY plane and the light amount is maximum is detected, and the reference axis is obtained from the first and second position information. Calculating the inclination of the optical axis of the irradiation light with respect to.

A light emitting element head according to a second aspect of the present invention is a light emitting element head for imaging output lights of a plurality of light emitting elements at a predetermined focal position, and includes a substrate on which a plurality of light emitting elements are arranged, and a mounting of the substrate. A base on which the optical element is formed, an optical element that forms an image of the light output of the light emitting element, a support portion that elastically sandwiches a side surface of the optical element, and a mounting that determines the distance from the substrate by mounting the optical element. A mounting surface; and an optical axis adjusting device for tilting the optical element with respect to a direction perpendicular to the substrate.

According to a third aspect of the present invention, there is provided the optical element head according to the second aspect, wherein the optical axis adjusting device extends so as to form a groove at a longitudinal end of the optical element. And a shaft portion having an eccentric cam in the groove portion has an optical axis adjustment bar supported rotatably in the vertical direction of the substrate, and by rotation of the shaft portion,
The eccentric cam presses the protrusion to tilt the optical element.

According to a fourth aspect of the present invention, in the optical element head according to the third aspect, the shaft is movable to a plurality of positions set in the vertical direction in a stepwise manner. Wherein the light-emitting element is mounted on the mounting surface.

According to a fifth aspect of the present invention, there is provided an electrophotographic recording apparatus.
The optical element head according to any one of (1) to (4), and a photosensitive member having a photosensitive surface located at an image forming position of the optical element head.

[0016]

DESCRIPTION OF THE PREFERRED EMBODIMENTS The X, Y, and Z axes shown in FIGS. 8 and 9 also show the same coordinate axes, and are related to each other.

Embodiment 1 FIG. 1 is a schematic configuration diagram showing a main part of an optical axis measurement system according to Embodiment 1 for carrying out the optical axis measurement method for an LED head of the present invention. In the figure,
The LED head 108 is common to many parts of the LED head shown in FIG. 8 described above. Therefore, common parts are denoted by the same reference numerals, and description of the configuration of those parts is omitted.

The LED head 108 is arranged in an optical axis measuring device (not shown). The light receiving surface of the optical sensor 1 and the 45-degree slit plate 2 abutting on the light receiving surface are integrally formed to form a light detecting unit 3 serving as light detecting means. It is located near the conjugate length Tc, and is held by an optical axis measuring device (not shown) so as to be movable integrally in the Z-axis direction and the X-axis direction.

FIG. 2 shows an output from the lens array 105 when the optical axis B of the lens array 105 is inclined in the Y-axis direction with respect to the reference axis A (Z-axis direction) as shown in FIG. It is a schematic diagram for explaining the method of detecting the inclination of the optical axis of irradiation light. FIG. 7A shows an optical axis Mi which is the center of the optical path of the inclined irradiation light, and a focal position Z of the irradiation light.
0 is a layout view of the relationship with the virtual line D parallel to the Z axis as viewed from the (+) side of the X axis, and FIG. 2B shows irradiation at each position (Z0, Z1, Z2) of the virtual line D. FIG. 4 is a distribution diagram of the state of light distribution as viewed from the (+) side of the Z axis.

As shown in FIG. 2B, in the vicinity of the focal position Z0, the light emitting portions of the LED chips 103 (FIG. 8) linearly arranged on the LED substrate 102 along the X axis as described above. A plurality of light regions are distributed corresponding to each light emitting dot. Now, assuming that the light distribution area at the focal position Z0 of the light emitting dot Di is Ei0 (FIG. 2B), this light distribution area E
When the optical axis Mi of the irradiation light is inclined in the Y-axis direction in the direction shown in FIG. 2A, i0 is higher than that in FIG. 2B as the detection position moves in the (+) direction of the Z-axis. At Y
Move in the (-) direction along the axis.

The light distribution area Ei1 shown in FIG. 2B shows the distribution area of the light emitting dots Di at the detection position Z1 50 μm above the focal position Z0, and the light distribution area Ei2 is
The distribution area of the light emitting dots Di at a detection position Z2 50 μm below the focal position Z0 is shown. On the other hand, as shown in FIG. 2 (b), the light detecting unit 3 composed of the optical sensor 1 and the 45-degree slit plate 2 movably held in both the X and Z axis directions moves in the X axis direction. By catching the light distribution area in the slit 2a and checking the position where the light amount becomes maximum, the relative distance of the center of each distribution area can be detected.

For example, in FIG. 2B, when the position where the light distribution region Ei1 is captured is X1 and the position where the light distribution region Ei2 is captured is X2, the distance dXi between the two points is expressed as dXi = (X2- X1). Further, since the slit 2a is inclined at 45 degrees with respect to each of the X and Y axes, the distance dXi is equal to the light distribution area Ei.
1 and the distance on the Y-axis between the light distribution region Ei2 and −dYi.

Therefore, the inclination angle θi of the optical path center (optical axis) Mi of the irradiation light of the light emitting dots Di with respect to the Z axis is shown in FIG.
As shown in (a), it can be obtained by θi = tan ⁻¹ (dYi / dZ). However, dZ = (Z2-Z
1). Note that the position (Z1, X1 or Y1) corresponds to the first position of the light detection unit 3, and the position (Z2, X2 or Y1).
2) corresponds to the second position of the light detection unit 3.

Next, steps up to obtaining the inclination angle θi of the light emitting dot Di will be described with reference to the flow chart of FIG.

As described above, the LED head 100 (FIG. 8) is set such that the lens array 105 has a focal position with a conjugate length Tc on the photoreceptor 110. Let this focal position be Z0,
First, in order to position the slit 2a at the focal position Z0, the height position of the light detection unit 3 (FIG. 1) in the Z-axis direction is adjusted (step 1).

Next, as shown in FIG. 2A, the light detecting unit 3 is moved upward so that the slit 2a is displaced to a detection position Z1 (Z1 = Z0 + 50 μm) moved by 50 μm in the (+) direction of the Z axis. (Step 2). At this time, the distribution area of the light emitting dots Di is the light distribution area Ei0 (FIG. 2).
From (b)) to the light distribution area Ei1 along the Y axis (−)
Move in the direction. Next, the light detection unit 3 is moved along the X-axis direction while keeping the detection position Z1, and the position X1 where the slit 2a captures the light distribution region Ei1 and the light amount becomes maximum is confirmed and stored (step 3). ).

Next, as shown in FIG. 2 (a), the slit 2a moves the detection position Z2 (Z1 = Z0−) by 100 μm in the (−) direction of the Z axis from the detection position Z1 on the Z axis.
The light detector 3 is moved downward so as to be displaced by 50 μm (step 4). At this time, the distribution area of the light emitting dots Di is changed from the light distribution area Ei1 (FIG. 2B) to the light distribution area Ei1.
It moves in the (+) direction along the Y axis to i2. Next, the light detection unit 3 is moved along the X-axis direction while maintaining the detection position Z2 on the Z-axis, and the slit 2 captures the light distribution area Ei2 to confirm and store the position X2 where the amount of light is maximum. (Step 5).

Next, the distance dXi is given by dXi = (X2-X1)
And the distance dZ is obtained by dZ = (Z2-Z1), and since dXi = −dYi, the inclination angle θi of the light emitting dot Di is calculated by θi = tan ⁻¹ (dYi / dZ) (step 6). ).

In the above measurement of the inclination angle θi of the light emitting dot Di, the light emitting dot D adjacent to the light emitting dot Di is measured.
In the case where (i-1) or the irradiation light of the light emitting dot D (i + 1) affects, for example, when the slit 2 in FIG. 2B specifies the position of the light distribution area Ei1 or the light distribution area Ei2, If there is a risk of being mistakenly recognized due to the influence of the light distribution area, the emission of the adjacent light emitting dots D (i-1) and D (i + 1) is stopped or only the light emitting dots Di to be measured are turned on. It is desired to do. Further, the above measurement was performed in the vicinity of the focal position Z0 because the shape of the light distribution area detected at each detection position is substantially uniform, so that the measurement error of the distance dXi due to the detection of the maximum light amount is small. This is because it is unlikely to occur.

As described above, Embodiment 1 according to the present invention
According to the light emitting axis measuring method, since the inclination angle of the irradiation light formed from each light emitting dot with respect to the Z axis can be measured, the inclination degree of the lens array 105 with respect to the reference plane of the LED head 108 can be indirectly known. .

Embodiment 2 FIG. 4 is a partial cross-sectional view illustrating a configuration of a second embodiment of the optical axis adjusting device for an LED head according to the present invention. The LED head 108 shown in FIG. 1 includes a plurality of LED chips 10 arranged in the X-axis direction as described above.
3, a lens array 105 extending in the same direction so as to face a light emitting portion of each LED chip 103 linearly arranged along the X axis, and holding the lens array 105. It has an SLA holder 106.

FIG. 4 shows the LED head 10 shown in FIG.
In the vicinity of one end (an end corresponding to the back side of the paper surface in FIG. 1) of the LED chip 8 viewed from the (+) direction of the Y axis, the light emitting unit includes a light emitting axis line in which the light emitting units of the plurality of LED chips 103 are linearly arranged. FIG. 4 is a partial cross-sectional view of the cross section as viewed from the same direction, and shows a configuration of a support unit that supports one end of the lens array 105.
5A and 5B show a configuration of an end portion of the lens array 105. FIG. 5A is a configuration diagram of this portion viewed from the (+) direction of the Z axis, and FIGS. ) Are configuration diagrams viewed from the (−) direction of the X axis.

As shown in these figures, the lens array 1
A step 10 is formed at the end of 05, and a pair of protrusions 11 further extend from this cut to form a groove 12. The optical axis adjusting bar 13 formed in an L-shape has an eccentric cam 13c disposed at a predetermined position on a shaft portion 13a, and the shaft portion 13a is located in the groove 12 of the lens array 105 and the peripheral surface of the eccentric cam 13 Are disposed so as to contact the inner wall surface 11a of the protruding portion 11.

On the extension of the light emitting axis of the LED substrate 102, a support that is located below the groove 12 of the lens array 105 and that rotatably supports the distal end of the shaft 13a of the optical axis adjusting bar 13 is fitted. A hole 14 and a positioning hole 18 for receiving and positioning the positioning pin 15 formed in the SLA holder 106 are formed.

The SLA holder 106 includes the lens array 1
The lens array 105 contacts the pair of protrusions 11 of the lens array 105.
A contact surface 16 for positioning the lens in the X-axis direction is formed, and a holding portion 17 is formed above the pair of protrusions 11 and further projects from the contact surface 16 toward the lens array 105. . Upper surface 17a of this holding part 17
A handle 13b bent at a right angle to the shaft 13a of the optical axis adjustment bar 13 is placed on the top of the optical axis adjustment bar 13, and an arc-shaped support recess 17b (FIG. 5 (a)) is formed at the tip thereof. The upper part of the shaft part 13a of the optical axis adjustment bar 13 is supported.

The optical axis adjusting bar 13 has a shaft portion 13a having a tip end supported by a support hole 14 and an upper portion having a support recess 17b.
, The vertical state with respect to the LED substrate 102 is maintained.

With the above configuration, the lens array 1
One end of the lens array 105 is held by the SLA holder 106, but the other end of the lens array 105 (the end corresponding to the near side in FIG. 1) is also held by the SLA holder 106 with exactly the same configuration. Therefore, the description of the configuration of the other end is omitted.

The LED head 10 configured as described above
An optical axis adjusting method of the lens array 105 for correcting the direction of the optical axis Mi (FIG. 2), which is the center of the optical path of irradiation light, in the optical axis adjusting device 8 will be described.

To correct the shift of the optical axis Mi of the irradiation light in the Y-axis direction, the lens array 105 (FIG. 1) can be corrected by rotating the lens array 105 (FIG. 1) in the direction of arrow G or H around the X-axis.
For this reason, as shown in each drawing of FIG.
Of the shaft 13 by turning the handle 13b of
When a is rotated in the same direction, the eccentric cam 13c presses the protrusion 11 of the lens array 105 in the (+) direction of the Y axis below the protrusion 11 as shown in FIG. 5C. Thereby, the lens array 105 is inclined in the direction of arrow G.

As described above, the lens array 105
When the shaft portion 13a of the optical axis adjustment bar 13 rotates in the arrow E or F direction within a predetermined rotation range, it tilts in the arrow H or G direction substantially in proportion to the amount of rotation. This adjustment is performed at both ends of the lens array 105. If the adjustment amounts are different, the lens array 105 is in a twisted state within an allowable range of its elastic property.

Next, an example of a procedure for adjusting the optical axis will be described. (1) First, the inclination angle θi of the optical axis of the irradiation light for each light emitting dot Di is measured in accordance with the flow of FIG. (2) Next, all the light emitting dots of the LED head 108 are divided into right and left, and average inclination angles θ _L and θ _R of each light emitting dot are obtained. (3) Next, in the optical axis adjusting devices at both ends of the lens array 105, the optical axis adjusting bars at the corresponding ends are rotated by using the average tilt angles θ _L and θ _R as correction amounts, and the lens array is rotated. The optical axis is adjusted by tilting 105. (4) When these adjustments are completed, the optical axis adjustment device and the lens array 105 are fixed to the SLA holder 106 with a silicone filler or the like.

As described above, the second embodiment according to the present invention
According to the optical axis adjusting device described above, since the inclination deviation of the optical axis of the irradiation light of the LED head can be corrected, it is possible to prevent the print density unevenness defect caused by the deviation.

Embodiment 3 FIG. 6 (a) shows L of the present invention.
FIG. 5 is a partial cross-sectional view illustrating a configuration of an optical axis adjusting device of an ED head according to a third embodiment, illustrating a cross-section at the same place as the cross-sectional view of FIG.

This optical axis adjusting device is mainly different from the optical axis adjusting device of the second embodiment shown in FIG. 5 in that the SLA mounting plate 21 is disposed on the optical axis SLA holder 10 on which handle portion 20b of shaft adjustment bar 20 is placed
A point that a plurality of step surfaces are formed in the holding portion 22 of No. 6;
The point is that a plurality of support holes are provided in the ED substrate 102. Other configurations are the same as those of the optical axis adjustment device according to the second embodiment, and therefore, the same reference numerals are given and the description thereof is omitted, and different points will be mainly described.

As shown in FIG. 6A, the LED substrate 10
In the extension of the light-emitting axis 2, the support holes 23 are located at distances L1 to L5 from the positioning holes 18 formed on the extension.
To 27 are formed. On the other hand, the holding portion 22 of the SLA holder 106 has the same distance L1 from the positioning pin 15.
Step surfaces 28 to 32 having steps L5 to L5 are formed in steps.

FIG. 6B shows the holding section 22 and the handle section 20.
It is the figure which looked at the engagement relationship of b from the (+) direction of a Z-axis. As shown in the figure, the optical axis adjustment bar 20 is formed so as to be movable in the X-axis direction along a long hole 22a formed in the center of the holding part 22, and the handle part 20b is provided on each step surface 28. ~
Each fan 32 has a fan shape so as to be rotatable while placed on the fan 32.

FIG. 7 shows the structure of the end of the lens array 105. FIG. 7 (a) is a view of this part viewed from the (+) direction of the Z axis, and FIGS. ) Is a diagram viewed from the (−) direction of the X axis. As shown in these figures, an SLA mounting plate 21 is disposed below the eccentric cam 20c formed on the shaft portion 20a of the optical axis adjustment bar 20, and the lens array 105 is mounted on the SLA mounting plate 21. Projection 1
1 is mounted.

FIG. 6 shows a shaft portion 20a of the optical axis adjusting bar 20.
Is inserted into the support hole 25, and the handle 20b of the optical axis adjustment bar 20 is placed on the step surface 30 so that the LED substrate 10
The state of maintaining the state perpendicular to 2 is drawn by a solid line. At this time, the position (height) of the one end of the lens array 105 in the Z-axis direction is the handle portion 20 of the optical axis adjustment bar 20.
b is determined by the height of the stepped surface 30 on which it is placed.

Accordingly, the position where the optical axis adjusting bar 20 is mounted, that is, one of the step surfaces 28 to 32 formed at five different heights is selected, and the handle portion 20b is placed thereon, and the LED substrate 1
The height of one end of the lens array 105 can be adjusted in five steps by fitting the tip of the shaft portion 20a into the positioning holes 23 to 27 that are perpendicular to the lens 02.

Further, as in the case of the second embodiment, the handle portion 20b of the optical axis adjustment bar 20 is turned to rotate the eccentric cam 20c.
Presses the protruding portion 11 of the lens array 105 at a lower portion thereof, whereby the lens array 105 can be inclined with respect to the Z axis as shown in FIG. 7C.

With the above configuration, the lens array 1
One end of the lens array 105 is held by the SLA holder 106, but the other end of the lens array 105 (the end corresponding to the near side in FIG. 1) is also held by the SLA holder 106 with exactly the same configuration. Therefore, the description of the configuration of the other end is omitted. In the LED head having the optical axis adjusting device according to the third embodiment, the lens array 105
Is mounted on the SLA mounting plate 21 formed on the optical axis adjustment bar 20, so that the protrusion 106e shown in FIG.

As described above, the third embodiment according to the present invention
According to the optical axis adjusting device of the present invention, in addition to being able to correct the inclination shift of the optical axis of the irradiation light of the LED head, the lens array 10
5 can be adjusted.

Embodiment 4 Using the LED head disclosed in the second or third embodiment, the electrophotographic recording apparatus is configured such that the photosensitive surface of the photoconductor 110 is located at the focal position of the LED head as shown in FIG.

According to this electrophotographic recording apparatus, since the optical axis shift and the focus shift of the LED head can be adjusted, it is possible to always set these to an optimum state.

In the third embodiment, the step surfaces 28 to 32 on which the handle portion 20b of the optical axis adjustment bar 20 is placed are formed by five steps.
Although the height of the lens array 105 can be adjusted by forming the lens array 105 at different heights, the depth of the positioning holes 23 to 27 for receiving the tip of the shaft portion 20a of the optical axis adjustment bar 20 is changed stepwise. In this case, the same effect can be obtained.

In the above description of the embodiment, the terms "up", "down", "front", and "back" are used, but these are only for convenience, and the state in which the light emitting element head is arranged is shown. It is not intended to limit the absolute positional relationship in.

[0057]

According to the first aspect of the present invention, since the inclination angle of the irradiation light with respect to the Z axis can be measured, the inclination degree of the optical system with respect to the reference plane of the light emitting element head can be indirectly measured. The defect of the light emitting element head can be determined without performing a printing test. Further, it is possible to correct the inclination of the optical system by obtaining the measurement result.

According to the light emitting element head of the present invention, since the inclination shift of the optical axis of the irradiation light of the light emitting element head can be corrected, it is possible to prevent the printing density unevenness defect caused by the deviation and to stabilize. Light-emitting element head capable of performing high-quality printing.

According to the light emitting element head of the third aspect, in addition to the effect of the second aspect, the inclination shift of the optical axis of the irradiation light of the light emitting element head can be easily corrected by rotating the optical axis adjusting bar. be able to.

According to the light emitting element head of the fourth aspect, in addition to the effect of the third aspect, the height of the optical system can be adjusted, and the resolution when this light emitting element head is installed in an exposure apparatus such as a printer can be reduced. It can be set to the best condition.

According to the electrophotographic recording apparatus of the present invention, since the optical axis shift and the focus shift of the optical element head can be adjusted, it is possible to always set these to an optimum state.

[Brief description of the drawings]

FIG. 1 is a schematic configuration diagram showing a main part of an optical axis measurement system according to a first embodiment for carrying out a light emitting axis measurement method for an LED head according to the present invention.

FIG. 2A shows an optical axis Mi of an inclined irradiation light and a virtual line D parallel to the Z axis at a focal position Z0 of the irradiation light.
FIG. 5 is a layout view of the relationship with the X axis viewed from the (+) side,
(B) is a distribution diagram of the state of distribution of irradiation light at each position (Z0, Z1, Z2) of the virtual line D as viewed from the (+) side of the Z axis.

FIG. 3 is a flowchart showing steps up to obtaining an inclination angle θi of a light emitting dot Di.

FIG. 4 is a partial cross-sectional view showing a configuration of a second embodiment of an optical axis adjusting device for an LED head according to the present invention.

FIG. 5 shows a configuration of an end of a lens array 105;
(A) is a configuration diagram when this portion is viewed from the (+) direction of the Z axis, and (b) and (c) are configuration diagrams when viewed from the (−) direction of the X axis.

FIG. 6A is a partial cross-sectional view illustrating a configuration of a third embodiment of an optical axis adjusting device for an LED head according to the present invention;
(B) shows the engagement relationship between the holding portion 22 and the handle portion 20b as Z.
It is the figure seen from the (+) direction of the axis.

FIG. 7 shows a configuration of an end of the lens array 105;
(A) is a configuration diagram when this portion is viewed from the (+) direction of the Z axis, and (b) and (c) are configuration diagrams when viewed from the (−) direction of the X axis.

FIG. 8 is a cross-sectional view showing a main part configuration of an LED head 100 having a conventional configuration.

FIG. 9 is a diagram for explaining a state in which the lens array is inclined.

[Explanation of symbols]

DESCRIPTION OF SYMBOLS 1 Optical sensor, 2 45 degree slit board, 2a slit, 3 light detection part, 10 step part, 11 projecting part, 12 groove part, 13 optical axis adjustment bar, 13a
Shaft, 13b Handle, 13c Eccentric cam, 1
4 support holes, 15 positioning pins, 16 contact surfaces,
17 holding part, 17a upper surface, 18 positioning hole,
20 optical axis adjustment bar, 20b handle, 21
SLA mounting plate, 22 holder, 22a long hole, 2
3 to 27 support holes, 28 to 32 steps, 100, 1
08 LED head, 101 base, 101a mounting surface, 101b side surface, 102 LED substrate, 1
02a upper surface, 102b end surface, 103 LED chip, 104 driver IC, 105 lens array, 106 SLA holder, 106a pressing surface, 1
06b inner surface, 106c SLA position regulating surface, 10
6d press arm, 106e protrusion, 107 holder clamp.

Claims (5)

[Claims] 1. An optical axis measuring method for measuring, by an optical element, a tilt of an optical axis of the irradiation light with respect to a predetermined reference axis of a light emitting element head that outputs input light as converging irradiation light, Assuming the Z axis in the direction of the reference axis, the Y axis is located in a plane including the reference axis and the optical axis and perpendicular to the reference axis.
Assuming an axis, when assuming an X axis in a direction orthogonal to the Z axis and the Y axis, the slit has a slit formed on the XY plane and inclined in the Y axis direction, Light detecting means for detecting the light amount of the irradiation light through a slit, and moving the detecting means in the Z-axis direction and the X-axis direction, so that the slit is in the first XY plane and the light amount Detecting the first position of the detecting means at which the light amount is maximum, detecting the second position of the detecting means at which the slit is on the second XY plane and the light amount is maximum, And calculating a tilt of an optical axis of the irradiation light with respect to the reference axis from the second position information and the second position information. 2. A light emitting element head for imaging output light of a plurality of light emitting elements at a predetermined focal position, a substrate on which the plurality of light emitting elements are arranged, a base on which the substrate is mounted, and the light emission An optical element that forms an image of the optical output of the element, a support portion that elastically sandwiches the side surface of the optical element, a mounting surface that mounts the optical element and determines a distance from the substrate, and the optical element. A light axis adjusting device for tilting the substrate with respect to the vertical direction of the substrate. 3. The optical axis adjusting device according to claim 1, wherein a pair of projections extending to form a groove at a longitudinal end of the optical element, and a shaft having an eccentric cam in the groove. An optical axis adjustment bar rotatably supported in the vertical direction of the substrate, wherein the rotation of the shaft portion causes the eccentric cam to press the protrusion and tilt the optical element. 3. The optical element head according to claim 2, wherein: 4. The mounting portion, wherein the shaft portion is movable to a plurality of positions set in the vertical direction in a stepwise manner, and has a mounting surface perpendicular to the axial direction of the shaft portion. The optical element head according to claim 3, wherein the light emitting element is mounted on a surface. 5. An electrophotographic recording apparatus comprising: the optical element head according to claim 2; and a photoreceptor having a photosensitive surface at an image forming position of the optical element head.