JP2001228210A - Power supply device of ic testing device and control unit of ic testing device - Google Patents

Abstract

PROBLEM TO BE SOLVED: To provide the compact power supply device easy to manufacture of an IC testing device by using a board type power supply device housing a DC/DC converter. SOLUTION: An AC/DC converter 4 converts the AC voltage inputted to the IC testing device to predetermined DC voltage. A plurality of DC/DC converters 7 are mounted on the power supply board 6 connected to the unit 1 in the IC testing device to convert the predetermined DC voltage converted by the AC/DC converter 4 to the DC voltage required in the boards 2 in the unit 1 of the IC testing device. The power supply board 6 supplies the DC voltage converted by the DC/DC converters 7 to the various boards in the IC testing device through a mother board 3.

Description

DETAILED DESCRIPTION OF THE INVENTION

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a power supply device and a control unit of an IC test apparatus, and more particularly, to a board type power supply device mounted in a control unit of an IC test apparatus body or externally connected to the control unit.

[0002]

2. Description of the Related Art A conventional power supply system in an IC test apparatus will be described with reference to the drawings. FIG. 4 is a configuration diagram of a power supply device 30 of a conventional IC test apparatus. In FIG.
The power supply 30 includes an AC / DC converter 4 and a DC / D
The DC / DC converters 5A to 5D and the motherboard 3 in the unit 1
And a DC voltage is supplied from the motherboard 3 to the various boards 2.

In a conventional IC test apparatus, when power is supplied to the unit 1, an input of three-phase 200V AC is applied to an AC / D
The C converter 4 converts the voltage into a high DC voltage. Converted high-voltage DC voltage into multiple box-type DC / D
The DC voltage is converted by the C converter 5 into the DC voltage required by the unit 1. The DC / DC converter 5 and the motherboard 3 in the unit 1 are connected by a wiring material, and DC power is supplied to the unit 1.

[0004]

In the power supply device 30 shown in FIG. 4, the specifications and quantity of the AC / DC converter 4 and the DC / DC converter 5 are determined by the configuration of the board 2 mounted on the unit 1. However, since the AC / DC converter 4 and the DC / DC converter 5 are box-shaped and externally attached to the unit 1, the configuration of the power supply device is I
This is a factor that determines the external dimensions of the entire C test apparatus, and there is a problem that the configuration of the power supply apparatus cannot reduce the size of the IC test apparatus.

In such a power supply system of an IC test apparatus, in order to supply power from the DC / DC converter 5 to each board 2 in the unit 1, each DC / DC converter is used.
The converter 5 and the motherboard 3 are connected using a wiring material. Since a relatively large DC current flows through the entire board 2 in the unit 1, the DC power supply voltage supplied to the unit 1 drops due to the wiring material and the contact resistance between each DC / DC converter 5 and the motherboard 3. There is also a problem. There is also a problem that a thick wiring material must be used so as not to cause a voltage drop.

Further, by using a large amount of the above-mentioned wiring members, the manufacturing process of the power supply device of the IC test apparatus becomes complicated, and the wiring material for connecting the unit 1 and the power supply device is housed in the IC test apparatus. There is also a problem that it becomes difficult.

An object of the present invention is to provide a small-sized and easy-to-manufacture power supply device for an IC test apparatus in which a DC / DC converter is housed in a unit by using a board-type power supply device.

[0008]

In order to solve the above-mentioned problems, the invention according to claim 1 is an AC / DC converter for converting an AC voltage input to an IC test apparatus into a predetermined DC voltage (for example, An AC / DC converter 4) in FIG. 1 and a DC for converting a predetermined DC voltage converted by the AC / DC conversion means into a DC voltage required in an IC test apparatus.
A DC / DC converter (for example, the DC / DC converter 7 in FIG. 1), and a control unit (for example, FIG. 1) for connecting the DC voltage converted by the DC / DC converter to various boards in the IC test apparatus. 1 power supply unit (for example, FIG. 1)
The DC / DC conversion means is mounted on a board (for example, the power supply board 6 in FIG. 1) connected to a control unit in the IC test apparatus.

According to the first aspect of the present invention, AC / DC
The converter converts an AC voltage input to the IC tester into a predetermined DC voltage. The DC / DC conversion means is mounted on a board connected to a control unit in the IC test apparatus, and a predetermined D / D converted by the AC / DC conversion means.
Convert the C voltage to the required DC voltage in the IC tester. The board connected to the control unit in the IC test apparatus converts the DC voltage converted by the DC / DC
It supplies to the control unit to which various boards in the C test equipment are connected.

Therefore, according to the first aspect of the present invention, since the DC / DC converter is mounted on the board connected to the control unit, a wiring member is provided between the power supply for supplying power to the IC test apparatus and the control unit. Without using
The voltage drop due to the wiring material and the voltage drop due to the contact resistance therebetween can be reduced. Further, the outer dimensions of the entire IC test apparatus can be made compact.

According to a second aspect of the present invention, in the power supply device for an IC test apparatus according to the first aspect,
The board connected to the control unit in the test apparatus may be mounted in the control unit.

According to the second aspect of the present invention, since the DC / DC conversion means is accommodated in the control unit, the outer dimensions of the entire IC test apparatus can be made more compact.

According to a third aspect of the present invention, in the power supply device for an IC test apparatus according to the first aspect,
The board connected to the control unit in the test apparatus may be externally connected to one predetermined surface of the control unit.

According to the third aspect of the present invention, the shape and quantity of the boards connected to the control unit are less restricted than when mounted in the control unit. In addition, the power supply capacity of the DC voltage supplied to the control unit can be adjusted in multiple stages, and a more efficient power supply system can be constructed.

Further, in the power supply device for an IC test apparatus according to the second or third aspect, the board connected to the control unit in the IC test apparatus may be a power supply board (for example, FIG. 1 power supply board 6).

According to the fourth aspect of the present invention, the manufacturing process of the power supply device for supplying power to the IC test device is not complicated, the wiring material can be easily stored, and the assembly of the IC test device and various parts can be performed. Maintenance, such as replacement of the device, is also facilitated.

According to a fifth aspect of the present invention, there is provided a motherboard (for example, a connector 9 or the like shown in FIG. 3) to which various boards for IC testing (for example, the board 2 in FIG. 1) are connected. In a control unit (for example, unit 1 of FIG. 1) of an IC test apparatus including the motherboard 3 of FIG. 1, a power supply board (for example, the power supply board 6 of FIG. 1) on which a plurality of DC / DC converters are mounted is mounted on the motherboard. The power supply board supplies necessary DC voltages to various boards via the motherboard.

According to a fifth aspect of the present invention, in the control unit of the IC test apparatus including the motherboard having a plurality of connectors mounted on one surface for connecting various IC test boards, the power supply board includes a plurality of power supply boards. Is mounted and connected to the connector on the motherboard. The DC voltage required for the various boards in the control unit is supplied to the various boards via the motherboard.

Therefore, according to the fifth aspect of the present invention, the external dimensions of the entire IC test apparatus can be made compact, and no wiring member is used between the control unit and the power supply device of the IC test apparatus. The voltage drop due to the wiring material and the voltage drop due to the contact resistance therebetween can be reduced.

According to a sixth aspect of the present invention, in the control unit of the IC testing apparatus according to the fifth aspect, the power supply board converts an AC voltage into a predetermined DC voltage.
It may be configured to include a connector (for example, connector 8 in FIG. 1) for connecting to a C / DC converter.

According to the present invention, the AC voltage can be converted into the predetermined DC voltage by the AC / DC converter directly connected by the connector, and then converted into the DC voltage required in the control unit. For,
By simply changing the power supply board, the specifications of the power supply can be easily changed, and the versatility of the control unit can be increased.

[0022]

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS An embodiment of a power supply unit for an IC test apparatus according to the present invention will be described below in detail with reference to FIGS.

(First Embodiment) FIGS. 1 and 2 are views showing a power supply device 10 of an IC test apparatus according to a first embodiment to which the present invention is applied. First, the configuration will be described.

FIG. 1 is a configuration diagram of a power supply device 10 of an IC test apparatus according to a first embodiment to which the present invention is applied. In FIG. 1, the same components as those of the power supply device 30 of the conventional IC test apparatus shown in FIG. 3 are denoted by the same reference numerals, and description thereof will be omitted.

In FIG. 1, a power supply unit 1 of an IC test apparatus is shown.
0 is an AC / DC converter 4 and two power supply boards 6
Is constituted by a plurality of DC / DC converters 7 attached to the. The power supply board 6 is connected to a connector mounted on the motherboard 3 like the other boards 2.

The unit 1 mounts a motherboard 3, which is a main circuit board. A plurality of connectors 8 for connecting the various boards 2 and the power supply board 6 are mounted on the motherboard 3.

The power supply board 6 has a plurality of D
A C / DC converter 7 is mounted. When a DC voltage is input from the AC / DC converter 4 to the power supply board 6 via the connector 8, the DC voltage on the substrate of the power supply board 6
The DC / DC converter 7 converts the DC voltage to the DC voltage required by the unit 1 and supplies the DC voltage to each board 2 via the motherboard 3.
Supply voltage.

The power supply capacity of the power supply board 6 is determined according to the power consumption of the unit 1. In the first embodiment, two power supply boards 6 are connected in the unit 1. The power supply board 6 can convert the input DC voltage into various output DC voltages, and can supply a DC voltage required for each of the various boards 2 in the unit 1.

FIG. 2 shows a unit 1 of the IC test apparatus shown in FIG.
FIG. 2, a plurality of various boards 2 are arranged on a motherboard 3 constituting one surface of the unit 1, and two power supply boards 6 are arranged on the right side of the front view of FIG.

As shown in FIG. 2, the power supply board 6 has a plurality of DC / DC converters 7 and 1 on its substrate.
Connectors 8 are mounted.

Next, the operation of the first embodiment will be described. Three-phase AC2 to supply power to IC test equipment
When the input voltage of 00V is input to the AC / DC converter 4, the AC / DC converter 4
200V is a high DC voltage (for example, 300V DC)
And outputs it to the power supply board 6 via the connector 8.

When the high-voltage DC voltage is input to the power supply board 6, the power supply board 6 inputs the input high-voltage DC voltage to the DC / DC converter 7, and the DC / DC converter 7 controls the inside of the unit 1. The DC voltage is converted to a DC voltage required by each board 2 connected thereto, and the DC voltage is supplied to each board 2 via the motherboard 3.

As described above, in the power supply device 10 of the IC test apparatus according to the first embodiment, the DC / DC converters 5A to 5A in the power supply device 30 of the conventional IC test apparatus are used.
A DC / DC converter 7 is mounted on a substrate of a power supply board 6 connected to the motherboard 3 in the unit 1 without being externally attached to the unit 1 in a box shape as in 5D. The power supply board 6 converts the DC voltage into a DC voltage required by each board 2 connected to the unit 1 and supplies the power supply voltage to each board 2 via the motherboard 3 and a connector on the motherboard 3. are doing.

Therefore, the power supply device 10 of the IC test apparatus according to the first embodiment does not require a plurality of DC / DC converters 5 to be mounted externally on the unit 1 as in the prior art. Since the power supply device can be configured, the outer dimensions of the entire IC test device can be made compact, and the manufacturing process of the power supply device of the IC test device is not complicated, and the storage of the wiring material is easy. At the same time, maintenance such as assembling of the IC test apparatus and replacement of each part becomes easy.

The power supply device 10 of the IC test apparatus according to the first embodiment uses a plurality of Ds as in the prior art.
Wiring members from the C / DC converter 5 to the motherboard 3 are not required, and voltage drop and DC / DC
Voltage drop due to contact resistance between DC converter 5 and motherboard 3 can be reduced.

(Second Embodiment) First, the configuration will be described.

FIG. 3 is a configuration diagram of a power supply device 20 of an IC test apparatus according to a second embodiment to which the present invention is applied. In FIG. 3, the power supply device 30 of the conventional IC test apparatus shown in FIG.
The same components as those of the power supply device 10 of the C test apparatus are denoted by the same reference numerals, and description thereof will be omitted.

In FIG. 3, the power supply 2 of the IC test apparatus
0 is an AC / DC converter 4 and a plurality of power supply boards 6
Is constituted by a plurality of DC / DC converters 7 attached to the. The power supply board 6 is circumscribed to the unit 1 and is connected to a plurality of connectors 9 mounted on one surface of the motherboard 3.

The power supply board 6 has a plurality of D
A C / DC converter 7 is mounted. When a DC voltage is input from the AC / DC converter 4 to the power supply board 6 via the connector 8, the DC voltage on the substrate of the power supply board 6
The DC / DC converter 7 converts the DC voltage to the DC voltage required by the unit 1 and supplies the DC voltage to each board 2 via the motherboard 3.
Supply voltage.

The power supply capacity of the power supply board 6 is determined according to the power consumption of the unit 1. In the second embodiment, four power supply boards 6 are connected to the unit 1 so as to be circumscribed. Since the number of power supply boards 6 is larger than in the case of the power supply device 10 of the IC test apparatus according to the first embodiment, the power supply capacity of the DC voltage can be adjusted in multiple stages. Then, the power supply board 6 receives the input D
C voltage can be converted to various output DC voltages.
DC voltage required for each of the various boards 2 can be supplied.

Next, the operation of the second embodiment will be described. Three-phase AC2 to supply power to IC test equipment
When the input voltage of 00V is input to the AC / DC converter 4, the AC / DC converter 4
200V is a high DC voltage (for example, 300V DC)
And outputs it to the power supply board 6 via the connector 8.

When the high-voltage DC voltage is input to the power supply board 6, the power supply board 6 inputs the input high-voltage DC voltage to the DC / DC converter 7, and the DC / DC converter 7 controls the inside of the unit 1. Is converted into a DC voltage required by each board 2 connected thereto, and the DC voltage is supplied to each board 2 via the connector 9 and the motherboard 3.

As described above, in the power supply device 20 of the IC test device according to the second embodiment, the DC / DC converters 5A to 5A in the power supply device 30 of the conventional IC test device are used.
5D, the connector 9 is connected to the motherboard 3 inside the unit 1 without being externally attached to the unit 1 in a box shape.
DC / DC on the substrate of the power supply board 6 circumscribed through
The converter 7 is mounted. The power supply board 6
After converting the DC voltage into a DC voltage required by each board 2 connected to the unit 1, the power supply voltage is supplied to each board 2 via the motherboard 3 and the connector 9. Further, the number of the power supply boards 6 is twice that of the power supply device 10 of the IC test apparatus according to the first embodiment.

Therefore, the power supply device 20 of the IC test apparatus according to the second embodiment does not require a plurality of DC / DC converters 5 to be mounted externally on the unit 1 as in the prior art. Since the power supply device can be configured, the external dimensions of the entire IC test device can be made compact. In addition, the wiring members can be easily stored without complicating the manufacturing process of the power supply device of the IC test apparatus, and the maintenance such as the assembly of the IC test apparatus and the replacement of each part is also facilitated.

The power supply device 20 of the IC test apparatus according to the second embodiment allows a plurality of Ds as in the prior art.
Wiring members from the C / DC converter 5 to the motherboard 3 are not required, and voltage drop and DC / DC
Voltage drop due to contact resistance between DC converter 5 and motherboard 3 can be reduced.

Further, the IC according to the second embodiment
The power supply board 6 is externally attached by the power supply device 20 of the test apparatus, and the shape and quantity of the power supply board 6 are not restricted by the unit 1. Therefore, the conventional power supply apparatus 30 of the IC test apparatus or the first embodiment is used. The power supply capacity of the DC voltage can be adjusted in multiple stages as compared with the power supply device 10 of the IC test apparatus in the above, and an efficient power supply system can be constructed.

[0047]

According to the first aspect of the present invention, DC / D
Since the C conversion means is mounted on the board connected to the control unit, it is not necessary to use a wiring member between the power supply device for supplying power to the IC test apparatus and the control unit, and the voltage drop due to this wiring member and the The voltage drop due to the contact resistance between them can be reduced. Further, the outer dimensions of the entire IC test apparatus can be made compact.

According to the second aspect of the present invention, since the DC / DC conversion means is accommodated in the control unit, the outer dimensions of the entire IC test apparatus can be made more compact.

According to the third aspect of the present invention, the shape and quantity of boards connected to the control unit are less restricted than when mounted in the control unit. In addition, the power supply capacity of the DC voltage supplied to the control unit can be adjusted in multiple stages, and a more efficient power supply system can be constructed.

According to the fourth aspect of the present invention, the manufacturing process of the power supply device for supplying power to the IC test device is not complicated, the storage of the wiring material is easy, and the assembly of the IC test device, Maintenance, such as replacement of the device, is also facilitated.

According to the fifth aspect of the present invention, the outer dimensions of the entire IC test apparatus can be made compact, and no wiring member is used between the control unit and the power supply of the IC test apparatus. The voltage drop due to the wiring material and the voltage drop due to the contact resistance therebetween can be reduced.

According to the invention, the AC voltage can be converted into a predetermined DC voltage by the AC / DC converter directly connected by the connector, and then converted into the DC voltage required in the control unit. For,
By simply changing the power supply board, the specifications of the power supply can be easily changed, and the versatility of the control unit can be increased.

[Brief description of the drawings]

FIG. 1 shows a first embodiment of the present invention.
FIG. 2 is a configuration diagram of a power supply device 10 of the C test apparatus.

FIG. 2 is a front view of a unit 1 of the IC test apparatus of FIG.

FIG. 3 is a diagram showing a second embodiment according to the present invention;
FIG. 2 is a configuration diagram of a power supply device 20 of the C test apparatus.

FIG. 4 is a configuration diagram of a power supply device 30 of a conventional IC test apparatus.

[Explanation of symbols]

 DESCRIPTION OF SYMBOLS 1 Unit 2 Board 3 Motherboard 4 AC / DC converter 5 DC / DC converter 6 Power supply board 7 DC / DC converter 8 Connector 9 Connector 10 Power supply of IC test equipment of the present invention 20 Power supply of conventional IC test equipment

Claims (6)

[Claims] An AC / DC converter for converting an AC voltage input to an IC tester into a predetermined DC voltage, and a predetermined DC voltage converted by the AC / DC converter are required in the IC tester. DC / DC conversion means for converting the DC voltage into a DC voltage, wherein the DC voltage converted by the DC / DC conversion means is
In a power supply unit of an IC test apparatus for supplying a control unit to which various boards in a C test apparatus are connected, the DC / DC conversion unit is mounted on a board connected to a control unit in the IC test apparatus. I
Power supply for C test equipment. 2. The power supply device for an IC test apparatus according to claim 1, wherein a board connected to a control unit in the IC test apparatus is mounted in the control unit. 3. A power supply apparatus for an IC test apparatus according to claim 1, wherein a board connected to a control unit in said IC test apparatus is externally connected to a predetermined surface of said control unit. . 4. The power supply device for an IC test device according to claim 2, wherein the board connected to the control unit in the IC test device is a power supply board. 5. A control unit of an IC test apparatus having a motherboard on which various connectors for connecting various IC test boards are mounted, wherein a power supply board on which a plurality of DC / DC converters are mounted is connected to the connector on the motherboard. Connected, and the DC required for various boards from the power supply board via the motherboard
A control unit for an IC test apparatus, which supplies a voltage. 6. The power supply board according to claim 1, wherein the AC voltage is a predetermined DC voltage.
6. The IC according to claim 5, further comprising a connector for connecting to an AC / DC converter for converting a voltage.
Test unit control unit.