JP2001027604A - Gloss meter - Google Patents

Gloss meter

Info

Publication number
JP2001027604A
JP2001027604A JP11200680A JP20068099A JP2001027604A JP 2001027604 A JP2001027604 A JP 2001027604A JP 11200680 A JP11200680 A JP 11200680A JP 20068099 A JP20068099 A JP 20068099A JP 2001027604 A JP2001027604 A JP 2001027604A
Authority
JP
Japan
Prior art keywords
light
receiving element
reflection
intensity
light source
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP11200680A
Other languages
Japanese (ja)
Inventor
Makoto Toyoda
田 誠 豊
Kiyokazu Nakajo
條 清 和 中
Hiroyuki Misawa
澤 宏 至 三
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Moritex Corp
Original Assignee
Moritex Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Moritex Corp filed Critical Moritex Corp
Priority to JP11200680A priority Critical patent/JP2001027604A/en
Publication of JP2001027604A publication Critical patent/JP2001027604A/en
Pending legal-status Critical Current

Links

Abstract

PROBLEM TO BE SOLVED: To quantitatively measure the gloss caused by the surface properties of an object to be inspected such as hair, the skin, a fiber or cloth on the basis of the intensity of regularly reflected light and the intensity of irregularly reflected light. SOLUTION: When a regular reflection light source L1 and an irregular reflection light source L2 are successively allowed to light, the difference between the intensities of irradiation lights of the respective light sources L1, L2 is measured by the calibration light receiving element DC arranged at a measuring point P and, next, when an object to be inspected is placed at the measuring point and the light sources L1, L2 are successively allowed to light, the intensity of regularly reflected light and the intensity of irregularly reflected light are measured by the measuring light receiving element Dm arranged on the reflected light axis X3 of the irradiation light of the regular reflection light source L1 and, since the intensities of the respective reflected lights are corrected on the basis of the difference between them, a measuring error is not almost generated.

Description

【発明の詳細な説明】DETAILED DESCRIPTION OF THE INVENTION

【0001】[0001]

【発明の属する技術分野】本発明は、髪,肌,繊維,布
などの被検体の表面性状に起因するつやを定量的に測定
するつや計に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a luster meter for quantitatively measuring luster caused by the surface properties of a subject such as hair, skin, fiber, cloth and the like.

【0002】[0002]

【従来の技術】髪の美しさを保つために様々なシャンプ
ーや、ヘアリンス,ヘアパック,その他の頭髪用化粧品
が髪の質に応じて製造・販売されており、美容院や化粧
品店では、美容師や販売員が顧客の髪を見て、経験に基
づき髪の質を判断し、最適なシャンプーや頭髪用化粧品
を勧めたり、その使用法をアドバイスしたりしている。
2. Description of the Related Art Various shampoos, hair rinses, hair packs, and other hair cosmetics are manufactured and sold according to the quality of hair in order to maintain the beauty of hair. Nurses and salespeople look at customers' hair, judge the quality of their hair based on their experience, recommend the best shampoo and hair cosmetics, and give advice on how to use them.

【0003】髪の質は主としてつやの程度に基づいて判
断されるが、そのつやは表面の粗さに依存し、具体的に
は髪の表面に形成されるキューティクルが剥がれること
なく綺麗に揃っているか否かに依存する。したがって、
つやを定量的に測定することができれば、髪の質を客観
的に知ることができ、顧客に対しても、より適格なアド
バイスをすることができるだけでなく、その頭髪用化粧
品を使用したことによる効果を客観的に確認することも
できる。
[0003] The quality of hair is mainly determined based on the degree of gloss, and the gloss depends on the roughness of the surface. Specifically, is the cuticle formed on the surface of the hair clean and uniform without peeling? It depends on whether or not. Therefore,
If you can measure the gloss quantitatively, you can objectively know the quality of the hair, not only can give more appropriate advice to customers, but also because of the use of the hair cosmetics The effect can also be objectively confirmed.

【0004】光学的には、光の反射が大きいほどつやが
あると言うことができるが、光の反射には、正反射と乱
反射の二種類ある。正反射は、反射面において巨視的に
見て鏡面反射のような反射の法則に従う反射であり、乱
反射は反射面において反射角以外の方向へ散乱する反射
である。そして、本発明者の研究によれば、乱反射光強
度に対する正反射光強度の比と、見た目で感じるつやと
の間に相関関係があり、この点についてはつやと光沢度
が極めて近似していることが判明した。
[0004] Optically, it can be said that the greater the reflection of light, the glossier it is, but there are two types of light reflection: specular reflection and irregular reflection. Specular reflection is reflection that obeys the law of reflection such as specular reflection when viewed macroscopically on a reflection surface, and diffuse reflection is reflection that is scattered in a direction other than the reflection angle on the reflection surface. And, according to the study of the present inventor, there is a correlation between the ratio of the specular reflection light intensity to the irregular reflection light intensity, and the luster felt by appearance, and in this regard, the luster and the glossiness are extremely similar. It has been found.

【0005】光沢度は、図6に示すような光沢度計で測
定される。この光沢度計は、内面が白色に塗装された積
分球51の中心に被検体を位置させる測定ポイント52
が形成され、当該測定ポイント52に向かって所定の入
射角度で光を照射する光源53が配され、当該光源53
から照射された光が測定ポイント52で正反射されたと
きの反射光軸54上に正反射光強度測定用の受光素子5
5が配されると共に、前記測定ポイント52の垂直上方
に乱反射光強度測定用の受光素子56が配されている。
[0005] The glossiness is measured by a glossmeter as shown in FIG. This gloss meter has a measuring point 52 for positioning the subject at the center of an integrating sphere 51 whose inner surface is painted white.
Is formed, and a light source 53 for irradiating light at a predetermined incident angle toward the measurement point 52 is provided.
The light receiving element 5 for measuring the intensity of the regular reflection light is placed on the reflection optical axis 54 when the light emitted from the light source is reflected regularly at the measurement point 52.
5 and a light receiving element 56 for measuring the intensity of diffusely reflected light is disposed vertically above the measurement point 52.

【0006】これによれば、受光素子55により正反射
光強度を測定することができ、受光素子56により乱反
射光強度を測定することができるので、つやの測定に応
用することができる。この場合に、つやは、光沢度のよ
うにJISに則って厳格に測定する必要もないので、例
えば積分球51を省略した簡易な構成としても、十分に
つや計として使用することができる。
According to this, the intensity of specular reflection light can be measured by the light receiving element 55 and the intensity of irregularly reflected light can be measured by the light receiving element 56, so that the present invention can be applied to gloss measurement. In this case, the gloss does not need to be strictly measured in accordance with JIS as in the case of the glossiness. Therefore, for example, a simple configuration in which the integrating sphere 51 is omitted can be used as a gloss meter.

【0007】[0007]

【発明が解決しようとする課題】しかしながら、光源5
3から照射された光の正反射光強度及び乱反射光強度を
二つの受光素子55,56を用いて測定しているので、
各受光素子55,56の感度の違いにより測定誤差を生
じるという問題があった。
However, the light source 5
Since the regular reflection light intensity and the irregular reflection light intensity of the light emitted from 3 are measured using the two light receiving elements 55 and 56,
There is a problem that a measurement error occurs due to a difference in sensitivity between the light receiving elements 55 and 56.

【0008】このため、正反射率と乱反射率を予め測定
した基準反射板を測定ポイント52に配し、光源53か
らの光を基準反射板に照射させ、その反射光強度を各受
光素子55,56で測定し、前記正反射率と乱反射率に
基づいて各受光素子55,56の感度の違いを補正して
いるが、基準反射板が汚損されてしまうと正しく補正す
ることもできない。
For this purpose, a reference reflector whose specular reflectance and diffuse reflectance have been measured in advance is arranged at a measuring point 52, light from a light source 53 is irradiated on the reference reflector, and the reflected light intensity is measured by each of the light receiving elements 55, 55. The measurement is performed at 56, and the difference between the sensitivities of the light receiving elements 55 and 56 is corrected based on the regular reflectance and the irregular reflectance. However, if the reference reflector is soiled, it cannot be corrected correctly.

【0009】そこで本発明は、正反射光強度と乱反射光
強度に基づいて被検体のつやを誤差なく定量的に測定で
きるようにすることを技術的課題としている。
Accordingly, it is a technical object of the present invention to provide a method for quantitatively measuring the gloss of a subject without errors based on the intensity of specular reflected light and the intensity of irregularly reflected light.

【0010】[0010]

【課題を解決するための手段】この課題を解決するため
に、本発明は、被検体を位置させる測定ポイントに対し
て異なる角度で光を照射する正反射用光源及び乱反射用
光源が配され、前記測定ポイントに、各光源からの照射
光を受光してその照射光強度を測定するキャリブレーシ
ョン用受光素子が配されると共に、測定ポイントに被検
体を位置させたときに当該被検体で正反射される前記正
反射用光源の反射光軸上に被検体からの反射光の光強度
を測定する測定用受光素子が配され、前記各光源を順次
点灯させることにより前記キャリブレーション用受光素
子に光を直接照射させて夫々の照射光強度を測定し、被
検体を測定ポイントに位置させた状態で前記各光源を順
次点灯させることにより測定用受光素子で正反射光強度
及び乱反射光強度を測定し、当該正反射光強度と乱反射
光強度を前記各照射光強度で補正して比較することによ
り反射光強度比較値を算出し、予め設定した反射光強度
比較値−つや値変換テーブルを参照して反射光強度比較
値に対応するつや値を読みだし、その値を表示させる制
御装置を備えたことを特徴とする。
According to the present invention, there is provided a light source for regular reflection and a light source for irregular reflection which irradiate light at different angles with respect to a measurement point on which a subject is located, At the measurement point, a light receiving element for calibration for receiving irradiation light from each light source and measuring the irradiation light intensity is arranged, and when the test object is positioned at the measurement point, it is specularly reflected by the test object. A light receiving element for measurement for measuring the light intensity of the reflected light from the subject is arranged on a reflection optical axis of the light source for regular reflection to be performed, and the light receiving element for calibration is emitted by sequentially lighting the light sources. Are directly illuminated to measure the respective irradiating light intensities, and the respective light sources are sequentially turned on in a state where the subject is positioned at the measuring point, whereby the specular reflected light intensity and the irregularly reflected light intensity are measured by the light receiving element for measurement. Measure and calculate the reflected light intensity comparison value by correcting and comparing the specular reflected light intensity and the irregularly reflected light intensity with the respective irradiation light intensities, and refer to a preset reflected light intensity comparison value-gloss value conversion table. And reading out a gloss value corresponding to the reflected light intensity comparison value and displaying the value.

【0011】本発明によれば、被検体を位置させる測定
ポイントに対して異なる角度から光を照射する正反射用
光源及び乱反射用光源を順次点灯させると、測定ポイン
トに配されたキャリブレーション用受光素子により各光
源の照射光強度の違いが測定され、次に被検体を測定ポ
イントにおいて各光源を順次点灯させると、正反射用光
源の照射光の反射光軸上に配された測定用受光素子によ
り、正反射光強度と乱反射光強度が測定される。
According to the present invention, when the regular reflection light source and the irregular reflection light source for irradiating light from different angles with respect to the measurement point where the subject is located are sequentially turned on, the calibration light reception arranged at the measurement point can be obtained. The element measures the difference in the irradiation light intensity of each light source, and then turns on each light source at the measurement point of the subject, and the light receiving element for measurement arranged on the reflection optical axis of the irradiation light of the light source for regular reflection Thus, the intensity of the regular reflection light and the intensity of the irregular reflection light are measured.

【0012】そして、測定用受光素子で測定された各反
射光強度を、キャリブレーション用受光素子で測定され
た各照射光強度で補正して比較することにより反射光強
度比較値が算出され、予め設定した反射光強度比較値−
つや値変換テーブルを参照して反射光強度比較値に対応
するつや値を求め、その値を表示させる。
A reflected light intensity comparison value is calculated by correcting each reflected light intensity measured by the measuring light receiving element with each irradiation light intensity measured by the calibration light receiving element and comparing the corrected values. Set reflected light intensity comparison value-
A gloss value corresponding to the reflected light intensity comparison value is obtained with reference to the gloss value conversion table, and the value is displayed.

【0013】このとき、正反射光強度と乱反射光強度を
一つの測定用受光素子で測定しているので、受光素子の
感度の違いによる測定誤差を生ずることはない。また、
正反射用光源と乱反射用光源の照射光強度の違いを測定
ポイントに配された一つのキャリブレーション用受光素
子で測定し、その測定結果に基づいて各反射光強度を補
正するので、二つの光源を使用したことによる測定誤差
を生ずることもない。
At this time, since the intensity of the specular reflected light and the intensity of the irregularly reflected light are measured by one measuring light receiving element, no measurement error is caused by a difference in sensitivity of the light receiving elements. Also,
The difference in irradiation light intensity between the regular reflection light source and the irregular reflection light source is measured by one calibration light receiving element arranged at the measurement point, and each reflected light intensity is corrected based on the measurement result. There is no measurement error caused by the use of.

【0014】[0014]

【発明の実施の形態】以下、本発明の実施の形態を図面
に基づいて具体的に説明する。図1は本発明に係るつや
計の概略構成を示すブロック図、図2はつや計の外観斜
視図、図3はその処理手順を示すフローシート、図4及
び図5は他の実施形態を示す斜視図である。
Embodiments of the present invention will be specifically described below with reference to the drawings. 1 is a block diagram showing a schematic configuration of a gloss meter according to the present invention, FIG. 2 is an external perspective view of the gloss meter, FIG. 3 is a flow sheet showing a processing procedure thereof, and FIGS. 4 and 5 show another embodiment. It is a perspective view.

【0015】図1及び図2に示すつや計1は細長いステ
ィック状のグリップ2の先端側に髪等の被検体の正反射
光強度及び乱反射光強度を測定する光学系3が形成され
ている。
In the gloss meter 1 shown in FIGS. 1 and 2, an optical system 3 for measuring the regular reflection light intensity and the irregular reflection light intensity of a subject such as hair is formed on the tip side of an elongated stick-like grip 2.

【0016】この光学系3は、青色LEDなどの正反射
用光源L1 及び乱反射用光源L2 と測定用受光素子Dm
を配したヘッド部4と、キャリブレーション用受光素子
Dcを配したステージ5からなり、ヘッド部4とステー
ジ5の間には、被検体を挿し入れる幅1〜2mmのガイ
ド溝6となるギャップが形成されている。
The optical system 3 includes a light source L 1 for regular reflection and a light source L 2 for irregular reflection such as a blue LED and a light receiving element Dm for measurement.
And a stage 5 on which a calibration light receiving element Dc is disposed. Between the head unit 4 and the stage 5, there is a gap serving as a guide groove 6 having a width of 1 to 2 mm for inserting a subject. Is formed.

【0017】前記正反射用光源L1 及び乱反射用光源L
2 は、被検体を位置させる測定ポイントPに対して異な
る角度から光を照射するように、夫々の照射光軸X1
2 が測定ポイントPで交差するように配され、測定用
受光素子Dmは測定ポイントPに置かれた被検体表面で
正反射される前記正反射用光源L1 の反射光軸X3 上に
配されている。
The regular reflection light source L 1 and the irregular reflection light source L
2 illuminates each of the illuminating optical axes X 1 , X 1 ,
X 2 is arranged so as to intersect at the measurement point P, on the measuring light receiving element Dm reflection optical axis X 3 of the specular reflection light source L 1 which is regularly reflected by the surface of the object placed in the measuring point P Are arranged.

【0018】なお本例では、正反射用光源L1 及び乱反
射用光源L2 がグリップ2の長手方向に対して直行する
方向に沿って配されると共に、正反射用光源L1が測定
ポイントPに向かって45°に光を照射する位置に、ま
た、乱反射用光源L2 が測定ポイントPに向かってその
真上から光を照射する位置に配設されている。
In this embodiment, the light source for regular reflection L 1 and the light source for irregular reflection L 2 are arranged along a direction perpendicular to the longitudinal direction of the grip 2, and the light source for regular reflection L 1 is connected to the measuring point P. a position irradiated with light at 45 ° towards the, also is disposed at a position to be irradiated with light from directly above the irregular reflection light source L 2 toward the measuring point P.

【0019】また、ステージ5には、測定ポイントPの
位置に、各光源L1 ,L 2 からの照射光を拡散して透過
させる拡散板7が配設され、その下方に、前記キャリブ
レーション用受光素子Dcが配されている。
The stage 5 has a measurement point P
Position, each light source L1, L TwoDiffuses and transmits the light from
A diffusion plate 7 for disposing the calib is provided below the diffusion plate 7.
A light receiving element for translation Dc is provided.

【0020】グリップ2の後端側には、前記光学系3を
コントロールすると共に各受光素子Dc,Dmの測定結
果に基づいてつや値を求める制御装置8が配設されてい
る。この制御装置8は、メインスイッチ9a及び測定用
スイッチ9bからスイッチ信号が出力されたときに前記
各光源L1 ,L2 を順次点灯させる駆動回路10と、メ
インスイッチ9aからスイッチ信号が出力されたときに
キャリブレーション用受光素子Dcを作動させ、測定用
スイッチ9bからスイッチ信号が出力されたときに測定
用受光素子Dmを作動させる受光素子切換回路11と、
各受光素子Dc,Dmで測定された光強度に基づいて所
定の手順に従いつや値を求める演算処理装置12と、反
射光強度比較値に対応するつや値を予め設定した反射光
強度比較値−つや値変換テーブルや各受光素子Dc,D
mの測定結果など必要なデータを記憶する記憶装置13
と、前記演算処理装置12で求められたつや値を表示す
るディスプレイ14からなる。
At the rear end side of the grip 2, there is provided a control device 8 for controlling the optical system 3 and obtaining a gloss value based on the measurement results of the light receiving elements Dc and Dm. The control device 8 includes a drive circuit 10 that sequentially turns on the light sources L 1 and L 2 when a switch signal is output from the main switch 9 a and the measurement switch 9 b, and a switch signal is output from the main switch 9 a. A light-receiving element switching circuit 11 that activates the light-receiving element Dc for calibration at the time and activates the light-receiving element Dm for measurement when a switch signal is output from the switch 9b for measurement;
An arithmetic processing unit 12 for obtaining a gloss value according to a predetermined procedure based on the light intensity measured by each of the light receiving elements Dc and Dm, and a reflected light intensity comparison value-gloss preset with a gloss value corresponding to the reflected light intensity comparison value. Value conversion table and light receiving elements Dc, D
Storage device 13 for storing necessary data such as the measurement result of m
And a display 14 for displaying the gloss value obtained by the arithmetic processing unit 12.

【0021】制御装置8における処理手順は、図3に示
すように、ステップ STP1でメインスイッチ9aが押さ
れたか否かを判断し、メインスイッチ9aが押されると
処理が開始され、ステップ STP2でキャリブレーション
用受光素子Dcが作動され、ステップ STP3で正反射用
光源L1 及び乱反射用光源L2 が順次点灯されて、キャ
リブレーション用受光素子Dcで測定された夫々の照射
光強度S1,S2 をステップ STP4で記憶装置13の所
定の記憶領域に記憶する。
As shown in FIG. 3, the processing procedure in the control device 8 determines whether or not the main switch 9a is pressed in step STP1, and when the main switch 9a is pressed, the processing is started, and the calibration is performed in step STP2. Deployment photodetector Dc is actuated, regular reflection light source L 1 and is lit irregular reflection light source L 2 successively at step STP3, the irradiation light intensity S 1 of people each measured in the calibration light receiving element Dc, S 2 Is stored in a predetermined storage area of the storage device 13 in step STP4.

【0022】ステップ STP5では測定用スイッチ9bが
押されたか否かを判断し、ステップ STP6ではメインス
イッチ9aがオフされたか否かを判断する。そして、メ
インスイッチ9aがオフされたときには処理を中止し、
オフされていないときにはステップ STP5に戻る。
In step STP5, it is determined whether or not the measurement switch 9b has been pressed, and in step STP6, it is determined whether or not the main switch 9a has been turned off. When the main switch 9a is turned off, the processing is stopped,
If not turned off, the process returns to step STP5.

【0023】次いで、例えば髪のつやを測定する場合
は、髪を切ることなく所要本数引き出し、軽く張った状
態でガイド溝6に入れて、測定用スイッチ9bをオンす
ると、ステップ STP5からステップ STP7に移行して測
定用受光素子Dmが作動され、ステップ STP8で正反射
用光源L1 及び乱反射用光源L2 が順次点灯されて髪か
らの正反射光と乱反射光が順次測定用受光素子Dmに入
射され、測定用受光素子Dmで測定された正反射光強度
1 及び乱反射光強度R2 をステップSTP9で記憶装置
13の所定の記憶領域に記憶する。
Next, for example, when measuring the gloss of the hair, the required number of hairs are pulled out without cutting the hair, the hair is put into the guide groove 6 in a lightly stretched state, and the measuring switch 9b is turned on. migrated measured photodetector Dm to actuation, incident on the specular reflection light source L 1 and diffused light source L 2 are sequentially lit specular reflection light and diffuse reflection light from the hair sequentially measuring light receiving element Dm in step STP8 is, stores the measured light receiving element specular reflected light intensity measured by the Dm R 1 and diffused light intensity R 2 in a predetermined storage area of the storage device 13 at step STP9.

【0024】次いで、ステップ STP10に移行し、つや
値を算出してその結果を表示させた後、ステップ STP5
に戻る。このステップ STP10では、ステップ STP9で
記憶した正反射光強度R1 及び乱反射光強度R2 を、ス
テップ STP5で記憶した夫々の照射光強度S1 ,S2
補正して比較することにより、例えば、反射光強度比較
値Hを、 H=(S2 /S1 )・(R1 /R2 ) で求める。
Then, the process proceeds to step STP10, calculates the gloss value and displays the result.
Return to In step STP10, the specular reflected light intensity R 1 and diffused light intensity R 2 stored in step STP9, by correcting and compared with the irradiation light intensity of each S 1, S 2 stored in step STP5, for example, The reflected light intensity comparison value H is determined by the following equation: H = (S 2 / S 1 ) · (R 1 / R 2 ).

【0025】これによれば、各光源L1 ,L2 から照射
される光の強度の違いがS2 /S1 により補正され、同
一の光強度の光が照射さたときの正反射光強度と乱反射
光強度の比と等しくなる。
According to this, the difference in the intensity of the light emitted from each of the light sources L 1 and L 2 is corrected by S 2 / S 1 , and the intensity of the regular reflection light when the light of the same intensity is emitted And the irregular reflection light intensity ratio.

【0026】次いで、つや値Tを反射光強度比較値Hと
正比例させて、式 T=αH(αは比例定数) を反射光強度比較値−つや値変換テーブルに記憶させ、
T=00〜99までの値をとるようにαの値を設定して
おけば、つや値Tをディスプレイ装置14に100段階
表示することができる。
Next, the gloss value T is directly proportional to the reflected light intensity comparison value H, and the equation T = αH (α is a proportionality constant) is stored in a reflected light intensity comparison value-shine value conversion table.
If the value of α is set so as to take a value from T = 00 to 99, the gloss value T can be displayed on the display device 14 in 100 levels.

【0027】このように、本例によれば、正反射用光源
1 の照射光軸X1 の入射角とその反射光軸X3 の反射
角が等しいので、正反射用光源L1 から照射された光で
正反射光強度を測定することができ、乱反射用光源L2
の照射光軸X2 の入射角と前記反射光軸X3 の反射角は
等しくないので、乱反射用光源L2 から照射された光で
乱反射光強度を測定することができる。
[0027] Thus, according to this embodiment, since the reflection angle of the incident angle of the irradiation optical axis X 1 of the regular reflection light source L 1 and the reflected optical axis X 3 are equal, the irradiation from the regular reflection light source L 1 The intensity of the specular reflection light can be measured with the generated light, and the light source L 2 for irregular reflection can be measured.
Since the reflection angle of the reflection optical axis X 3 and the incident angle of the irradiation optical axis X 2 of the unequal, it is possible to measure the diffuse reflection light intensity in the light emitted from the diffuse light source L 2.

【0028】そして、正反射光強度と乱反射光強度を一
つの測定用受光素子Dmで測定しているので、受光素子
の感度の違いによる測定誤差を生ずることはない。な
お、各光源L1 ,L2 の照射光強度を一つのキャリブレ
ーション用受光素子Dcで測定し、その測定結果に基づ
いて、各反射光強度を補正することとしているので、二
つの光源L1 ,L2 を使用したことによる測定誤差を生
ずることもない。
Since the intensity of the specular reflected light and the intensity of the irregularly reflected light are measured by one measuring light receiving element Dm, no measurement error occurs due to the difference in the sensitivity of the light receiving elements. In addition, since the irradiation light intensity of each light source L 1 and L 2 is measured by one light receiving element for calibration Dc, and each reflected light intensity is corrected based on the measurement result, two light sources L 1 and L 2 are used. , nor causing a measurement error due to the use of L 2.

【0029】なお、正反射用光源L1 ,乱反射用光源L
2 ,測定用受光素子Dmは、正反射用光源L1 の照射光
軸X1 と乱反射用光源L2 の照射光軸X2 が測定ポイン
トPで交差し、前記照射光軸X1 と、測定用受光素子D
mの光軸である反射光軸X3 が測定ポイントPに対して
入射角・反射角の関係にあれば、その位置関係は任意で
ある。
The regular reflection light source L 1 and the irregular reflection light source L
2, the measurement light receiving element Dm, the irradiation optical axis X 2 of the irradiation optical axis X 1 of the regular reflection light source L 1 and irregular reflection light source L 2 intersect at the measurement point P, a the irradiation optical axis X 1, measured Light receiving element D
If the reflective optical axis X 3 is the optical axis of the m is the relationship between the incident angle and reflection angle with respect to the measurement points P, the positional relationship is arbitrary.

【0030】また、反射光強度比較値を算出する式は、
上述の式に限るものではなく、乱反射光強度と正反射光
強度の大小を比較し得る任意の式を採用することがで
き、また、数式により算出するものに限らず、反射光強
度比較値とつや値を数表として記憶したものであっても
よい。さらに、つや値は、ディスプレイ14に数字を用
いてデジタル的に表示する場合に限らず、アナログ的に
表示する場合であってもよい。
The equation for calculating the reflected light intensity comparison value is:
The expression is not limited to the above expression, and any expression that can compare the magnitude of the irregular reflection light intensity and the regular reflection light intensity can be adopted. The gloss value may be stored as a numerical table. Further, the gloss value is not limited to the case where it is digitally displayed using numbers on the display 14 but may be the case where it is displayed in an analog manner.

【0031】上述の説明では、各光源L1 ,L2 及び測
定用受光素子Dmを配したヘッド部4と、キャリブレー
ション用受光素子Dcを配したステージ5をグリップ2
の先端に固定して設けた場合について説明したが、本発
明はこれに限らず、例えば、図4に示すように、ヘッド
部4に対してステージ5を開閉可能にしたクリップ型に
形成し、ヘッド部4とステージ5で被検体を挟持できる
ようにしてもよく、この場合、ステージ5を開閉するこ
とによりキャリブレーション用受光素子Dcが測定ポイ
ントPに対して進退されるように形成されている。
In the above description, the head unit 4 on which the light sources L 1 and L 2 and the light receiving element Dm for measurement are disposed, and the stage 5 on which the light receiving element Dc for calibration is disposed are gripped by the grip 2.
However, the present invention is not limited to this. For example, as shown in FIG. 4, the stage 5 is formed in a clip type that can be opened and closed with respect to the head unit 4. The subject may be held between the head unit 4 and the stage 5. In this case, the calibration light receiving element Dc is formed so as to advance and retreat with respect to the measurement point P by opening and closing the stage 5. .

【0032】また、図5に示すように、前記ステージ5
をヘッド部4に対して着脱可能に形成すれば、ガイド溝
6に挿入し得る薄い被検体についてはステージ5を装着
した状態で測定し、ガイド溝6に挿入することができな
い被検体についてはステージ5を外しヘッド部4を直接
被検体に押し当てて測定できる。この場合において、ス
テージ5をヘッド部4に装着したときに、ヘッド部4側
に形成した電極(図示せず)とステージ5に形成した電
極21を接触させるようにすれば、ステージ5を着脱可
能としても、当該ステージ5に配されたキャリブレーシ
ョン用受光素子Dcと制御装置8とを接続するコード類
が不要となる。
Further, as shown in FIG.
Is formed so as to be detachable from the head unit 4, measurement is performed with the stage 5 mounted on a thin subject that can be inserted into the guide groove 6, and a stage is mounted on the subject that cannot be inserted into the guide groove 6. 5, the head 4 can be directly pressed against the subject to measure. In this case, if the electrode (not shown) formed on the head part 4 and the electrode 21 formed on the stage 5 are brought into contact with each other when the stage 5 is mounted on the head part 4, the stage 5 can be detached. In this case, a code for connecting the calibration light receiving element Dc disposed on the stage 5 and the control device 8 is not required.

【0033】さらに、表面性状に起因するつやを定量的
に測定する被検体としては髪に限らず、肌,繊維,布な
ど任意のものを測定することができる。
Further, the subject for quantitatively measuring the gloss caused by the surface properties is not limited to the hair, but can be any object such as skin, fiber or cloth.

【0034】[0034]

【発明の効果】以上述べたように、本発明によれば、正
反射用光源と乱反射用光源から照射される夫々の光の正
反射光強度と乱反射光強度を測定する際に、各反射光強
度を一つの測定用受光素子で測定しているので、受光素
子の感度の違いによる測定誤差を生ずることがなく、ま
た、各光源の照射光強度を一つのキャリブレーション用
受光素子で測定し、その測定結果に基づき各反射光強度
を補正するので、二つの光源を使用したことによる測定
誤差を生ずることがなく、これら各測定値に基づいて被
検体のつやを誤差なく定量的に測定することができると
いう大変優れた効果を奏する。
As described above, according to the present invention, when measuring the regular reflection light intensity and the irregular reflection light intensity of the respective lights emitted from the regular reflection light source and the irregular reflection light source, each reflected light is measured. Since the intensity is measured by one measuring light receiving element, there is no measurement error due to the difference in sensitivity of the light receiving elements, and the irradiation light intensity of each light source is measured by one calibration light receiving element. Since each reflected light intensity is corrected based on the measurement result, there is no measurement error caused by using two light sources, and the gloss of the subject is quantitatively measured without error based on each of these measured values. It has an excellent effect that it can be done.

【図面の簡単な説明】[Brief description of the drawings]

【図1】本発明に係るつや計の概略構成を示すブロック
図。
FIG. 1 is a block diagram showing a schematic configuration of a gloss meter according to the present invention.

【図2】つや計の外観斜視図。FIG. 2 is an external perspective view of a gloss meter.

【図3】その処理手順を示すフローシート。FIG. 3 is a flow sheet showing the processing procedure.

【図4】他の実施形態を示す斜視図。FIG. 4 is a perspective view showing another embodiment.

【図5】他の実施形態を示す斜視図。FIG. 5 is a perspective view showing another embodiment.

【図6】光沢度計を示す説明図。FIG. 6 is an explanatory diagram showing a gloss meter.

【符号の説明】[Explanation of symbols]

1・・・つや計 3・・・光学系 4・・・ヘッド部 5・・・ステージ P・・・測定ポイント 6・・・ガイド溝 L1 ・・正反射用光源 L2 ・・乱反射用光源 X1 ,X2 ・・照射光軸 X3 ・・・・・反射光軸 Dm・・測定用受光素子 Dc・・キャリブレーショ
ン用受光素子 8・・・制御装置
1 ... gloss meter 3 ... optical system 4 ... head unit 5 ... stage P ... measurement points 6 ... guide groove L 1 · · regular reflection light source L 2 · · irregular reflection light source X 1 , X 2 ··· Irradiation optical axis X 3 ····· Reflection optical axis Dm ··· Measurement light receiving element Dc ··· Calibration light receiving element 8 ··· Controller

───────────────────────────────────────────────────── フロントページの続き (72)発明者 三 澤 宏 至 埼玉県浦和市白幡四丁目19番1号 第2春 日ビル 株式会社モリテックス浦和事業所 内 Fターム(参考) 2G059 AA02 EE02 FF08 GG03 MM10 MM12 PP04  ────────────────────────────────────────────────── ─── Continuing on the front page (72) Inventor Hiroshi Misawa 4-9-1-1, Shirahata, Urawa-shi, Saitama 2nd Kasuga Building F-term (reference) 2G059 AA02 EE02 FF08 GG03 MM10 MM12 PP04

Claims (4)

【特許請求の範囲】[Claims] 【請求項1】 被検体を位置させる測定ポイント(P)
に対して異なる角度で光を照射する正反射用光源
(L1 )及び乱反射用光源(L2 )が配され、 前記測定ポイント(P)に、各光源(L1 ,L2 )から
の照射光を受光してその照射光強度を測定するキャリブ
レーション用受光素子(Dc)が配されると共に、測定
ポイント(P)に被検体を位置させたときに当該被検体
で正反射される前記正反射用光源(L1 )の反射光軸
(X3 )上に被検体からの反射光の光強度を測定する測
定用受光素子(Dm)が配され、 前記各光源(L1 ,L2 )を順次点灯させることにより
前記キャリブレーション用受光素子(Dc)に光を直接
照射させて夫々の照射光強度を測定し、被検体を測定ポ
イント(P)に位置させた状態で前記各光源(L1 ,L
2 )を順次点灯させることにより測定用受光素子(D
m)で正反射光強度及び乱反射光強度を測定し、当該正
反射光強度と乱反射光強度を前記各照射光強度で補正し
て比較することにより反射光強度比較値を算出し、予め
設定した反射光強度比較値−つや値変換テーブルを参照
して反射光強度比較値に対応するつや値を読みだし、そ
の値を表示させる制御装置(8)を備えたことを特徴と
するつや計。
1. A measuring point (P) for positioning a subject
A light source for regular reflection (L 1 ) and a light source for irregular reflection (L 2 ) for irradiating light at different angles with respect to the light source are provided, and the measurement point (P) is irradiated from each light source (L 1 , L 2 ) A calibration light-receiving element (Dc) for receiving light and measuring the intensity of the irradiated light is provided, and when the subject is positioned at the measurement point (P), the light is regularly reflected by the subject. A measuring light receiving element (Dm) for measuring the light intensity of the reflected light from the subject is arranged on a reflection optical axis (X 3 ) of the reflection light source (L 1 ), and each of the light sources (L 1 , L 2 ) Are sequentially turned on to directly irradiate the calibration light receiving element (Dc) with light to measure the respective irradiation light intensities. With the subject positioned at the measurement point (P), each of the light sources (L 1 , L
2 ) The light receiving element for measurement (D
m), the regular reflection light intensity and the irregular reflection light intensity are measured, and the regular reflection light intensity and the irregular reflection light intensity are corrected by the respective irradiation light intensities and compared to calculate a reflection light intensity comparison value, which is set in advance. A gloss meter comprising a controller (8) for reading a gloss value corresponding to a reflected light intensity comparison value with reference to a reflected light intensity comparison value-gloss value conversion table and displaying the value.
【請求項2】 前記測定ポイント(P)へ被検体を案内
するガイド溝(6)が形成されてなる請求項1記載のつ
や計。
2. The gloss meter according to claim 1, wherein a guide groove (6) for guiding the subject to the measurement point (P) is formed.
【請求項3】 前記キャリブレーション用受光素子(D
c)を配したステージ(5)が、正反射用光源
(L1 ),乱反射用光源(L2 )及び測定用受光素子
(Dm)を配したヘッド部(4)の測定ポイント(P)
に対して進退可能に配されてなる請求項1記載のつや
計。
3. The light receiving element for calibration (D)
The stage (5) on which c) is arranged is a measurement point (P) of the head section (4) on which the light source for regular reflection (L 1 ), the light source for irregular reflection (L 2 ) and the light receiving element for measurement (Dm) are arranged.
2. The gloss meter according to claim 1, wherein the gloss meter is arranged so as to be capable of moving forward and backward.
【請求項4】 前記測定ポイント(P)に位置決めされ
るキャリブレーション用受光素子(Dc)が、正反射用
光源(L1 ),乱反射用光源(L2 )及び測定用受光素
子(Dm)を配したヘッド部(4)に対して着脱可能に
配されてなる請求項1記載のつや計。
4. A light receiving element for calibration (Dc) positioned at the measurement point (P) includes a light source for regular reflection (L 1 ), a light source for irregular reflection (L 2 ), and a light receiving element for measurement (Dm). 2. The gloss meter according to claim 1, wherein the gloss meter is detachably mounted on the disposed head part (4).
JP11200680A 1999-07-14 1999-07-14 Gloss meter Pending JP2001027604A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP11200680A JP2001027604A (en) 1999-07-14 1999-07-14 Gloss meter

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11200680A JP2001027604A (en) 1999-07-14 1999-07-14 Gloss meter

Publications (1)

Publication Number Publication Date
JP2001027604A true JP2001027604A (en) 2001-01-30

Family

ID=16428470

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11200680A Pending JP2001027604A (en) 1999-07-14 1999-07-14 Gloss meter

Country Status (1)

Country Link
JP (1) JP2001027604A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007163241A (en) * 2005-12-13 2007-06-28 Nippon Telegr & Teleph Corp <Ntt> Optical coherence tomography device and variable-wavelength light generation device used therefor
US7461912B2 (en) 2002-10-24 2008-12-09 Seiko Epson Corporation Device manufacturing apparatus, device manufacturing method, and electronic equipment
JP2012002601A (en) * 2010-06-15 2012-01-05 Ricoh Co Ltd Picture checking device, picture checking method and picture formation apparatus
JP2019207114A (en) * 2018-05-28 2019-12-05 日本製鉄株式会社 Acceptance/rejection determination method and acceptance/rejection determination device for dull-finished material surface

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7461912B2 (en) 2002-10-24 2008-12-09 Seiko Epson Corporation Device manufacturing apparatus, device manufacturing method, and electronic equipment
JP2007163241A (en) * 2005-12-13 2007-06-28 Nippon Telegr & Teleph Corp <Ntt> Optical coherence tomography device and variable-wavelength light generation device used therefor
JP4677636B2 (en) * 2005-12-13 2011-04-27 日本電信電話株式会社 Optical coherence tomography apparatus and variable wavelength light generator used therefor
JP2012002601A (en) * 2010-06-15 2012-01-05 Ricoh Co Ltd Picture checking device, picture checking method and picture formation apparatus
JP2019207114A (en) * 2018-05-28 2019-12-05 日本製鉄株式会社 Acceptance/rejection determination method and acceptance/rejection determination device for dull-finished material surface

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