IT202200006344A1 - OBJECT INSPECTION SYSTEM - Google Patents

OBJECT INSPECTION SYSTEM Download PDF

Info

Publication number
IT202200006344A1
IT202200006344A1 IT102022000006344A IT202200006344A IT202200006344A1 IT 202200006344 A1 IT202200006344 A1 IT 202200006344A1 IT 102022000006344 A IT102022000006344 A IT 102022000006344A IT 202200006344 A IT202200006344 A IT 202200006344A IT 202200006344 A1 IT202200006344 A1 IT 202200006344A1
Authority
IT
Italy
Prior art keywords
inspection system
object inspection
inspection
Prior art date
Application number
IT102022000006344A
Other languages
Italian (it)
Inventor
Massimo Bonardi
Emidio Zorzella
Original Assignee
Antares Vision S P A
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Antares Vision S P A filed Critical Antares Vision S P A
Priority to IT102022000006344A priority Critical patent/IT202200006344A1/en
Priority to PCT/IB2023/053241 priority patent/WO2023187733A1/en
Publication of IT202200006344A1 publication Critical patent/IT202200006344A1/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G01N2021/8812—Diffuse illumination, e.g. "sky"
    • G01N2021/8816—Diffuse illumination, e.g. "sky" by using multiple sources, e.g. LEDs
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8887—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Signal Processing (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
IT102022000006344A 2022-03-31 2022-03-31 OBJECT INSPECTION SYSTEM IT202200006344A1 (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
IT102022000006344A IT202200006344A1 (en) 2022-03-31 2022-03-31 OBJECT INSPECTION SYSTEM
PCT/IB2023/053241 WO2023187733A1 (en) 2022-03-31 2023-03-31 Inspection system for objects

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
IT102022000006344A IT202200006344A1 (en) 2022-03-31 2022-03-31 OBJECT INSPECTION SYSTEM

Publications (1)

Publication Number Publication Date
IT202200006344A1 true IT202200006344A1 (en) 2023-10-01

Family

ID=82308199

Family Applications (1)

Application Number Title Priority Date Filing Date
IT102022000006344A IT202200006344A1 (en) 2022-03-31 2022-03-31 OBJECT INSPECTION SYSTEM

Country Status (2)

Country Link
IT (1) IT202200006344A1 (en)
WO (1) WO2023187733A1 (en)

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5519496A (en) 1994-01-07 1996-05-21 Applied Intelligent Systems, Inc. Illumination system and method for generating an image of an object
WO2011055397A1 (en) 2009-11-04 2011-05-12 Sacmi Cooperativa Meccanici Imola- Societa' Cooperativa Apparatus, system and method for detecting defects of metallic lids
WO2016166668A1 (en) 2015-04-14 2016-10-20 Sacmi Cooperativa Meccanici Imola Societa' Cooperativa Apparatus and method for optical inspection of objects, in particular metal lids

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6403445B2 (en) * 2014-06-09 2018-10-10 株式会社キーエンス Inspection device, inspection method, and program
KR102117675B1 (en) * 2018-07-05 2020-06-01 주식회사 디딤센서 Illumination system and control method of the illumination system
KR102090006B1 (en) * 2018-08-06 2020-03-17 주식회사 디딤센서 Illumination system
BR112022015599A2 (en) * 2020-02-06 2022-10-11 Inspekto A M V Ltd SYSTEM AND METHOD FOR IMAGE FORMATION OF REFLECTOR OBJECTS

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5519496A (en) 1994-01-07 1996-05-21 Applied Intelligent Systems, Inc. Illumination system and method for generating an image of an object
WO2011055397A1 (en) 2009-11-04 2011-05-12 Sacmi Cooperativa Meccanici Imola- Societa' Cooperativa Apparatus, system and method for detecting defects of metallic lids
WO2016166668A1 (en) 2015-04-14 2016-10-20 Sacmi Cooperativa Meccanici Imola Societa' Cooperativa Apparatus and method for optical inspection of objects, in particular metal lids

Also Published As

Publication number Publication date
WO2023187733A1 (en) 2023-10-05

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