GB9610471D0 - Optical measurement - Google Patents
Optical measurementInfo
- Publication number
- GB9610471D0 GB9610471D0 GBGB9610471.6A GB9610471A GB9610471D0 GB 9610471 D0 GB9610471 D0 GB 9610471D0 GB 9610471 A GB9610471 A GB 9610471A GB 9610471 D0 GB9610471 D0 GB 9610471D0
- Authority
- GB
- United Kingdom
- Prior art keywords
- optical measurement
- measurement
- optical
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Priority Applications (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GBGB9610471.6A GB9610471D0 (en) | 1996-05-18 | 1996-05-18 | Optical measurement |
CN 97196506 CN1225720A (en) | 1996-05-18 | 1997-05-16 | Optical measurement |
JP09541783A JP2000510951A (en) | 1996-05-18 | 1997-05-16 | Optical measurement |
EP97923185A EP0900356A1 (en) | 1996-05-18 | 1997-05-16 | Optical measurement |
PCT/GB1997/001353 WO1997044633A1 (en) | 1996-05-18 | 1997-05-16 | Optical measurement |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GBGB9610471.6A GB9610471D0 (en) | 1996-05-18 | 1996-05-18 | Optical measurement |
Publications (1)
Publication Number | Publication Date |
---|---|
GB9610471D0 true GB9610471D0 (en) | 1996-07-24 |
Family
ID=10793969
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GBGB9610471.6A Pending GB9610471D0 (en) | 1996-05-18 | 1996-05-18 | Optical measurement |
Country Status (5)
Country | Link |
---|---|
EP (1) | EP0900356A1 (en) |
JP (1) | JP2000510951A (en) |
CN (1) | CN1225720A (en) |
GB (1) | GB9610471D0 (en) |
WO (1) | WO1997044633A1 (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN114295075A (en) * | 2022-03-09 | 2022-04-08 | 中国工程物理研究院激光聚变研究中心 | Device and method for measuring integral three-dimensional contour of inner surface of concave workpiece |
Families Citing this family (20)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE19856400B4 (en) * | 1998-12-07 | 2009-04-09 | Steinbichler Optotechnik Gmbh | Method and device for the direct phase measurement of radiation |
US6804009B2 (en) | 2000-05-03 | 2004-10-12 | The Regents Of The University Of California | Wollaston prism phase-stepping point diffraction interferometer and method |
FR2818376B1 (en) | 2000-12-18 | 2003-03-28 | Centre Nat Rech Scient | DEVICE FOR BIDIMENSIONAL ELLIPSOMETRIC VISUALIZATION OF A SAMPLE, VISUALIZATION PROCESS AND ELLIPSOMETRIC MEASUREMENT PROCESS WITH SPATIAL RESOLUTION |
US7139081B2 (en) | 2002-09-09 | 2006-11-21 | Zygo Corporation | Interferometry method for ellipsometry, reflectometry, and scatterometry measurements, including characterization of thin film structures |
US7106454B2 (en) | 2003-03-06 | 2006-09-12 | Zygo Corporation | Profiling complex surface structures using scanning interferometry |
US7324214B2 (en) | 2003-03-06 | 2008-01-29 | Zygo Corporation | Interferometer and method for measuring characteristics of optically unresolved surface features |
US7271918B2 (en) | 2003-03-06 | 2007-09-18 | Zygo Corporation | Profiling complex surface structures using scanning interferometry |
US7289225B2 (en) | 2003-09-15 | 2007-10-30 | Zygo Corporation | Surface profiling using an interference pattern matching template |
TWI335417B (en) | 2003-10-27 | 2011-01-01 | Zygo Corp | Method and apparatus for thin film measurement |
KR101159380B1 (en) | 2004-03-11 | 2012-06-27 | 이코스비젼 시스팀스 엔.브이. | Methods and apparatus for wavefront manipulations and improved 3-d measurements |
JP4768754B2 (en) * | 2005-01-20 | 2011-09-07 | ザイゴ コーポレーション | Interferometer for determining object surface characteristics |
TWI394930B (en) | 2005-05-19 | 2013-05-01 | Zygo Corp | Method and apparatus for analyzing low-coherence interferometry signals for obtaining information about thin film structures |
US7889355B2 (en) | 2007-01-31 | 2011-02-15 | Zygo Corporation | Interferometry for lateral metrology |
US8120781B2 (en) | 2008-11-26 | 2012-02-21 | Zygo Corporation | Interferometric systems and methods featuring spectral analysis of unevenly sampled data |
CN101520413B (en) * | 2009-02-18 | 2011-09-21 | 深圳大学 | A heterodyne interference elliptic-deviation measurement nonlinear error compensation method |
WO2017041843A1 (en) * | 2015-09-09 | 2017-03-16 | Siemens Healthcare Gmbh | A technique for illuminating a sample to be inspected by interferometric microscopy |
JP6782470B2 (en) | 2018-09-05 | 2020-11-11 | パナソニックIpマネジメント株式会社 | Measuring device and measuring method |
US10705026B2 (en) * | 2018-10-26 | 2020-07-07 | Kla Corporation | Scanning differential interference contrast in an imaging system design |
CN109916279B (en) * | 2019-03-04 | 2020-09-22 | Oppo广东移动通信有限公司 | Flatness detection method and device for terminal cover plate, test machine table and storage medium |
CN113155040B (en) * | 2021-03-04 | 2023-02-28 | 上海精测半导体技术有限公司 | Device and method for detecting angle change of reflected light beam and film thickness measuring device |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS567006A (en) * | 1979-06-22 | 1981-01-24 | Ibm | Method of extending measurement range of interference |
JPH061178B2 (en) * | 1985-01-16 | 1994-01-05 | 株式会社日立製作所 | Defect inspection method and apparatus |
US4905311A (en) * | 1988-02-10 | 1990-02-27 | Brother Kogyo Kabushiki Kaisha | Optical surface roughness measuring apparatus with polarization detection |
US5602643A (en) * | 1996-02-07 | 1997-02-11 | Wyko Corporation | Method and apparatus for correcting surface profiles determined by phase-shifting interferometry according to optical parameters of test surface |
-
1996
- 1996-05-18 GB GBGB9610471.6A patent/GB9610471D0/en active Pending
-
1997
- 1997-05-16 EP EP97923185A patent/EP0900356A1/en not_active Withdrawn
- 1997-05-16 CN CN 97196506 patent/CN1225720A/en active Pending
- 1997-05-16 JP JP09541783A patent/JP2000510951A/en active Pending
- 1997-05-16 WO PCT/GB1997/001353 patent/WO1997044633A1/en not_active Application Discontinuation
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN114295075A (en) * | 2022-03-09 | 2022-04-08 | 中国工程物理研究院激光聚变研究中心 | Device and method for measuring integral three-dimensional contour of inner surface of concave workpiece |
Also Published As
Publication number | Publication date |
---|---|
CN1225720A (en) | 1999-08-11 |
WO1997044633A1 (en) | 1997-11-27 |
JP2000510951A (en) | 2000-08-22 |
EP0900356A1 (en) | 1999-03-10 |
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