GB8523418D0 - Oven - Google Patents

Oven

Info

Publication number
GB8523418D0
GB8523418D0 GB858523418A GB8523418A GB8523418D0 GB 8523418 D0 GB8523418 D0 GB 8523418D0 GB 858523418 A GB858523418 A GB 858523418A GB 8523418 A GB8523418 A GB 8523418A GB 8523418 D0 GB8523418 D0 GB 8523418D0
Authority
GB
United Kingdom
Prior art keywords
oven
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
GB858523418A
Other versions
GB2181227B (en
GB2181227A (en
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
SHARETREE Ltd
Original Assignee
SHARETREE Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by SHARETREE Ltd filed Critical SHARETREE Ltd
Priority to GB08523418A priority Critical patent/GB2181227B/en
Publication of GB8523418D0 publication Critical patent/GB8523418D0/en
Priority to PCT/GB1986/000570 priority patent/WO1987001813A1/en
Priority to DE8686905874T priority patent/DE3683284D1/en
Priority to EP86905874A priority patent/EP0238598B1/en
Publication of GB2181227A publication Critical patent/GB2181227A/en
Priority to US07/053,107 priority patent/US4881591A/en
Application granted granted Critical
Publication of GB2181227B publication Critical patent/GB2181227B/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
    • G01R31/2862—Chambers or ovens; Tanks
    • F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F27—FURNACES; KILNS; OVENS; RETORTS
    • F27B—FURNACES, KILNS, OVENS, OR RETORTS IN GENERAL; OPEN SINTERING OR LIKE APPARATUS
    • F27B9/00—Furnaces through which the charge is moved mechanically, e.g. of tunnel type; Similar furnaces in which the charge moves by gravity
    • F27B9/30—Details, accessories, or equipment peculiar to furnaces of these types
    • F27B9/3077—Arrangements for treating electronic components, e.g. semiconductors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/2872—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation
    • G01R31/2874—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation related to temperature

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
  • Environmental & Geological Engineering (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Tests Of Electronic Circuits (AREA)
GB08523418A 1985-09-23 1985-09-23 An oven for the burn-in of integrated circuits Expired GB2181227B (en)

Priority Applications (5)

Application Number Priority Date Filing Date Title
GB08523418A GB2181227B (en) 1985-09-23 1985-09-23 An oven for the burn-in of integrated circuits
PCT/GB1986/000570 WO1987001813A1 (en) 1985-09-23 1986-09-23 An oven for the burn-in of integrated circuits
DE8686905874T DE3683284D1 (en) 1985-09-23 1986-09-23 OVEN FOR BURNING IN INTEGRATED CIRCUITS.
EP86905874A EP0238598B1 (en) 1985-09-23 1986-09-23 An oven for the burn-in of integrated circuits
US07/053,107 US4881591A (en) 1985-09-23 1987-05-21 Oven for the burn-in of integrated circuits

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB08523418A GB2181227B (en) 1985-09-23 1985-09-23 An oven for the burn-in of integrated circuits

Publications (3)

Publication Number Publication Date
GB8523418D0 true GB8523418D0 (en) 1985-10-30
GB2181227A GB2181227A (en) 1987-04-15
GB2181227B GB2181227B (en) 1988-11-09

Family

ID=10585580

Family Applications (1)

Application Number Title Priority Date Filing Date
GB08523418A Expired GB2181227B (en) 1985-09-23 1985-09-23 An oven for the burn-in of integrated circuits

Country Status (1)

Country Link
GB (1) GB2181227B (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112798922A (en) * 2019-11-13 2021-05-14 第一检测有限公司 Environment control equipment and chip test system

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112798922A (en) * 2019-11-13 2021-05-14 第一检测有限公司 Environment control equipment and chip test system

Also Published As

Publication number Publication date
GB2181227B (en) 1988-11-09
GB2181227A (en) 1987-04-15

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Legal Events

Date Code Title Description
PCNP Patent ceased through non-payment of renewal fee