GB579665A - Improvements in and relating to impedance matching transformers - Google Patents
Improvements in and relating to impedance matching transformersInfo
- Publication number
- GB579665A GB579665A GB1785543A GB1785543A GB579665A GB 579665 A GB579665 A GB 579665A GB 1785543 A GB1785543 A GB 1785543A GB 1785543 A GB1785543 A GB 1785543A GB 579665 A GB579665 A GB 579665A
- Authority
- GB
- United Kingdom
- Prior art keywords
- adjustable
- portions
- impedance
- central
- impedance matching
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01P—WAVEGUIDES; RESONATORS, LINES, OR OTHER DEVICES OF THE WAVEGUIDE TYPE
- H01P5/00—Coupling devices of the waveguide type
- H01P5/04—Coupling devices of the waveguide type with variable factor of coupling
Abstract
579,665. Impedance matching devices. BRITISH THOMSON-HOUSTON CO., Ltd. (General Electric Co.). Oct. 28, 1943, No. 17855. [Class 40 (iii)] An impedance-matching device comprises two portions of coaxial line of different characteristic impedances connected by a section of which the characteristic impedance is adjustable by giving more or less eccentricity to the central or outer conductor. When the central conductor is adjustable, it may be connected to the portions on either side by flexible portions and may be supported on adjustable insulating rods 23 or may be mounted on the central conductors of the adjoining sections by stiff eccentric pivots, Fig. 3 (not shown). Where the outer conductor is adjustable, it is connected to the adjoining section by a bellows-like construction 50. Reference has been directed by the Comptroller to Specification 581,972.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB1785543A GB579665A (en) | 1943-10-28 | 1943-10-28 | Improvements in and relating to impedance matching transformers |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB1785543A GB579665A (en) | 1943-10-28 | 1943-10-28 | Improvements in and relating to impedance matching transformers |
Publications (1)
Publication Number | Publication Date |
---|---|
GB579665A true GB579665A (en) | 1946-08-12 |
Family
ID=10102391
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GB1785543A Expired GB579665A (en) | 1943-10-28 | 1943-10-28 | Improvements in and relating to impedance matching transformers |
Country Status (1)
Country | Link |
---|---|
GB (1) | GB579665A (en) |
Cited By (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE947988C (en) * | 1952-06-18 | 1956-08-23 | Patelhold Patentverwertung | Decoupling transformer for magnetron transmitter |
DE1083362B (en) * | 1959-06-22 | 1960-06-15 | Siemens Ag | Transformation line with changeable distance between inner and outer conductor |
DE1125018B (en) * | 1959-12-04 | 1962-03-08 | Siemens Ag | Transformation line with wave resistance that can be changed continuously within a certain range |
EP0349203A2 (en) * | 1988-06-27 | 1990-01-03 | CASCADE MICROTECH, INC. (an Oregon corporation) | Coaxial transmission line to microstrip transmission line launcher |
US7420381B2 (en) | 2004-09-13 | 2008-09-02 | Cascade Microtech, Inc. | Double sided probing structures |
US7656172B2 (en) | 2005-01-31 | 2010-02-02 | Cascade Microtech, Inc. | System for testing semiconductors |
US7688097B2 (en) | 2000-12-04 | 2010-03-30 | Cascade Microtech, Inc. | Wafer probe |
US7723999B2 (en) | 2006-06-12 | 2010-05-25 | Cascade Microtech, Inc. | Calibration structures for differential signal probing |
US7750652B2 (en) | 2006-06-12 | 2010-07-06 | Cascade Microtech, Inc. | Test structure and probe for differential signals |
US7759953B2 (en) | 2003-12-24 | 2010-07-20 | Cascade Microtech, Inc. | Active wafer probe |
US7764072B2 (en) | 2006-06-12 | 2010-07-27 | Cascade Microtech, Inc. | Differential signal probing system |
US7876114B2 (en) | 2007-08-08 | 2011-01-25 | Cascade Microtech, Inc. | Differential waveguide probe |
US7898281B2 (en) | 2005-01-31 | 2011-03-01 | Cascade Mircotech, Inc. | Interface for testing semiconductors |
US7898273B2 (en) | 2003-05-23 | 2011-03-01 | Cascade Microtech, Inc. | Probe for testing a device under test |
-
1943
- 1943-10-28 GB GB1785543A patent/GB579665A/en not_active Expired
Cited By (18)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE947988C (en) * | 1952-06-18 | 1956-08-23 | Patelhold Patentverwertung | Decoupling transformer for magnetron transmitter |
DE1083362B (en) * | 1959-06-22 | 1960-06-15 | Siemens Ag | Transformation line with changeable distance between inner and outer conductor |
DE1125018B (en) * | 1959-12-04 | 1962-03-08 | Siemens Ag | Transformation line with wave resistance that can be changed continuously within a certain range |
EP0349203A2 (en) * | 1988-06-27 | 1990-01-03 | CASCADE MICROTECH, INC. (an Oregon corporation) | Coaxial transmission line to microstrip transmission line launcher |
EP0349203A3 (en) * | 1988-06-27 | 1990-11-07 | CASCADE MICROTECH, INC. (an Oregon corporation) | Coaxial transmission line to microstrip transmission line launcher |
US7761983B2 (en) | 2000-12-04 | 2010-07-27 | Cascade Microtech, Inc. | Method of assembling a wafer probe |
US7688097B2 (en) | 2000-12-04 | 2010-03-30 | Cascade Microtech, Inc. | Wafer probe |
US7898273B2 (en) | 2003-05-23 | 2011-03-01 | Cascade Microtech, Inc. | Probe for testing a device under test |
US7759953B2 (en) | 2003-12-24 | 2010-07-20 | Cascade Microtech, Inc. | Active wafer probe |
US7420381B2 (en) | 2004-09-13 | 2008-09-02 | Cascade Microtech, Inc. | Double sided probing structures |
US8013623B2 (en) | 2004-09-13 | 2011-09-06 | Cascade Microtech, Inc. | Double sided probing structures |
US7656172B2 (en) | 2005-01-31 | 2010-02-02 | Cascade Microtech, Inc. | System for testing semiconductors |
US7898281B2 (en) | 2005-01-31 | 2011-03-01 | Cascade Mircotech, Inc. | Interface for testing semiconductors |
US7940069B2 (en) | 2005-01-31 | 2011-05-10 | Cascade Microtech, Inc. | System for testing semiconductors |
US7723999B2 (en) | 2006-06-12 | 2010-05-25 | Cascade Microtech, Inc. | Calibration structures for differential signal probing |
US7750652B2 (en) | 2006-06-12 | 2010-07-06 | Cascade Microtech, Inc. | Test structure and probe for differential signals |
US7764072B2 (en) | 2006-06-12 | 2010-07-27 | Cascade Microtech, Inc. | Differential signal probing system |
US7876114B2 (en) | 2007-08-08 | 2011-01-25 | Cascade Microtech, Inc. | Differential waveguide probe |
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