GB2352517A - Method and system of on-line elemental analysis by temporal gated imaging of atomic emissions induced by laser plasma - Google Patents

Method and system of on-line elemental analysis by temporal gated imaging of atomic emissions induced by laser plasma

Info

Publication number
GB2352517A
GB2352517A GB0026822A GB0026822A GB2352517A GB 2352517 A GB2352517 A GB 2352517A GB 0026822 A GB0026822 A GB 0026822A GB 0026822 A GB0026822 A GB 0026822A GB 2352517 A GB2352517 A GB 2352517A
Authority
GB
United Kingdom
Prior art keywords
region
atomic
imaging
images
atomic emissions
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
GB0026822A
Other versions
GB2352517B (en
GB0026822D0 (en
Inventor
Israel Schechter
Danny Moshe
Nadav Horesh
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
GreenVision Systems Ltd
Original Assignee
GreenVision Systems Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by GreenVision Systems Ltd filed Critical GreenVision Systems Ltd
Publication of GB0026822D0 publication Critical patent/GB0026822D0/en
Publication of GB2352517A publication Critical patent/GB2352517A/en
Application granted granted Critical
Publication of GB2352517B publication Critical patent/GB2352517B/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/71—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited
    • G01N21/718—Laser microanalysis, i.e. with formation of sample plasma

Abstract

A method and system of real time, on-line elemental analysis by temporal gated imaging of atomic emissions induced by laser plasma. In the method, three-dimensional spectral images are generated from two-dimensional images of non-thermal atomic emissions of a spatially extended sample. Two-dimensional images are acquired by using multiple fields of view of an imaging spectroscopic system. For spectral images acquired using a scanning interferometer, one plasma plume is produced in each region for each position of the scanning element of the interferometer, with a different subregion of the region being excited to produce each plume. The spectral images are compared to a database of atomic emission spectra to determine elemental content in each region. In the absence of a database of atomic emission spectra, the spectral images of the various regions are compared to each other to estimate elemental content of each region. The system features a synchronized elemental analysi spectroscopic imaging system, including means (18, 20) for setting at separate fields of view within each region of the sample, a gated excitation energy source (26) for inducing atomic emissions of the sample, a gated CCD (32), an optical system (28). control/data links (38), a control system, and data processing equipment (40) featuring algorithms for performing quantitation, classification, and scanalysis of the spectral data.
GB0026822A 1998-04-10 1999-04-11 Method and system of on-line elemental analysis by temporal gated imaging of atomic emissions induced by laser plasma Expired - Fee Related GB2352517B (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US8144198P 1998-04-10 1998-04-10
PCT/IL1999/000196 WO1999053298A1 (en) 1998-04-10 1999-04-11 Method and system of on-line elemental analysis by temporal gated imaging of atomic emissions induced by laser plasma

Publications (3)

Publication Number Publication Date
GB0026822D0 GB0026822D0 (en) 2000-12-20
GB2352517A true GB2352517A (en) 2001-01-31
GB2352517B GB2352517B (en) 2002-11-13

Family

ID=22164181

Family Applications (1)

Application Number Title Priority Date Filing Date
GB0026822A Expired - Fee Related GB2352517B (en) 1998-04-10 1999-04-11 Method and system of on-line elemental analysis by temporal gated imaging of atomic emissions induced by laser plasma

Country Status (4)

Country Link
AU (1) AU3342799A (en)
DE (1) DE19983118T1 (en)
GB (1) GB2352517B (en)
WO (1) WO1999053298A1 (en)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
AU5063301A (en) * 2000-04-20 2001-11-12 Greenvision Systems Ltd. Method for generating intra-particle morphological concentration / density maps and histograms of a chemically pure particulate substance
WO2011027315A1 (en) 2009-09-04 2011-03-10 Moshe Danny S Grading of agricultural products via hyper spectral imaging and analysis
CN102636479B (en) * 2012-04-23 2013-12-11 北京大学 Atmospheric heavy metal on-line detection system
CN102661935A (en) * 2012-05-15 2012-09-12 广东电网公司电力科学研究院 LIBS (Laser-induced Breakdown Spectroscopy) belt type powdery material detector
CN105938097A (en) * 2016-04-15 2016-09-14 成都以太航空保障工程技术有限责任公司 Multi-element oil liquid analysis system based on CCD polychromator
JP2018006860A (en) * 2016-06-28 2018-01-11 ソニーセミコンダクタソリューションズ株式会社 Receiver, reception method, transmitter, transmission method, and communication system
CN110196247A (en) * 2018-02-26 2019-09-03 成都艾立本科技有限公司 A kind of fine coal classification method based on laser induced breakdown spectroscopy

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5446538A (en) * 1991-06-06 1995-08-29 Fraunhofer-Gesellschaft Zur Forderung Der Angewandten Forschung E.V. Process and device for emission spectorscopy
US5751416A (en) * 1996-08-29 1998-05-12 Mississippi State University Analytical method using laser-induced breakdown spectroscopy

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5446538A (en) * 1991-06-06 1995-08-29 Fraunhofer-Gesellschaft Zur Forderung Der Angewandten Forschung E.V. Process and device for emission spectorscopy
US5751416A (en) * 1996-08-29 1998-05-12 Mississippi State University Analytical method using laser-induced breakdown spectroscopy

Also Published As

Publication number Publication date
AU3342799A (en) 1999-11-01
WO1999053298A1 (en) 1999-10-21
GB2352517B (en) 2002-11-13
DE19983118T1 (en) 2001-05-17
GB0026822D0 (en) 2000-12-20

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Legal Events

Date Code Title Description
PCNP Patent ceased through non-payment of renewal fee

Effective date: 20150411