GB1569664A - Etching of grooves in substrates for use in cups devices - Google Patents

Etching of grooves in substrates for use in cups devices Download PDF

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Publication number
GB1569664A
GB1569664A GB3909877A GB3909877A GB1569664A GB 1569664 A GB1569664 A GB 1569664A GB 3909877 A GB3909877 A GB 3909877A GB 3909877 A GB3909877 A GB 3909877A GB 1569664 A GB1569664 A GB 1569664A
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GB
United Kingdom
Prior art keywords
substrate
mask
etching
titanium
ion etching
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB3909877A
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
General Electric Co
Original Assignee
General Electric Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by General Electric Co filed Critical General Electric Co
Priority to GB3909877A priority Critical patent/GB1569664A/en
Publication of GB1569664A publication Critical patent/GB1569664A/en
Expired legal-status Critical Current

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Classifications

    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03HIMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
    • H03H3/00Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators
    • H03H3/007Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators for the manufacture of electromechanical resonators or networks
    • H03H3/08Apparatus or processes specially adapted for the manufacture of impedance networks, resonating circuits, resonators for the manufacture of electromechanical resonators or networks for the manufacture of resonators or networks using surface acoustic waves

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  • Physics & Mathematics (AREA)
  • Acoustics & Sound (AREA)
  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Drying Of Semiconductors (AREA)

Description

(54) IMPROVEMENTS IN OR RELATING TO THE ETCHING OF GROOVES IN SUBSTRATES FOR USE IN SAW DEVICES (71) We, THE GENERAL ELECTRIC COMPANY LIMITED, of 1 Stanhope Gate, London, WIA 1EH, a British Company, do hereby declare the invention, for which we pray that a patent may be granted to us, and the method by which it is to be performed, to be particularly described in and by the following statement: This invention relates to the etching of grooves in substrates for use in surface acoustic wave devices and more particularly to the etching of grooves by ion bombardment through a mask.
Two ion bombardment techniques which are known for etching a suitably masked substrate with ions are: radio-frequency sputter etching, in which the substrate is bombarded with positively charged ions; and ion beam etching, in which the substrate is bombarded with neutralised ions.
Typically the ions used for bombardment are argon ions.
It is known to use titanium as the masking material in the etching of silicon substrates for use in semiconductor devices.
The present invention provides a method of ion etching a desired groove pattern in a substrate of material suitable for use in a surface acoustic wave device, the method comprising the steps of: forming on the surface of the substrate to be etched a titanium mask exposing the surface in said desired pattern; ion etching the substrate surface exposed by said mask; and removing said mask.
One method according to the invention of ion etching a desired groove pattern in a quartz substrate will now be described, by way of example only, with reference to the accompanying drawings which show the substrate at various stages of the method.
A rectangular quartz substrate 1 has a layer of titanium 2 sputter deposited on its upper surface (Figure 1). The layer 2 of titanium is then photolithographically formed into a mask 3 of a desired pattern (Figure 2).
The quartz substrate 1 and its mask 3 are then subjected to bombardment from above with a flux of positive argon ions.
In this way, both the titanium mask 3 and the surface of the quartz substrate 1 exposed thereby are etched away, thus slightly decreasing the thickness of the titanium mask 3 and imparting the desired groove pattern into the quartz substrate (Figure 3).
Finally the titanium mask 3 is chemically removed, leaving the quartz substrate 1 with the desired groove pattern in its upper surface (Figure 4).
It will be appreciated that any ion etching technique may be used to impart the desired groove pattern into the substrate.
It will also be appreciated that the invention is also applicable to other material suitable for use in surface acoustic wave devices, e.g. lithium niobate, lithium tantalate, etc.
WHAT WE CLAIM IS:- 1. A method of ion etching a desired groove pattern in a substrate of material suitable for use in a surface acoustic wave device, the method comprising the steps of: forming on the surface of the substrate to be etched a titanium mask exposing the surface in said desired pattern; ion etching the substrate surface exposed by said mask; and removing said mask.
2. A method according to Claim 1 wherein the step of forming said titanium mask comprises sputter depositing a layer of titanium on the surface of the substrate to be etched, and photolithographically forming said mask from said layer to expose the surface in said desired pattern; and the step of ion etching the substrate surface comprises ion etching the substrate exposed by said mask with positive argon ions.
3. A method of ion etching a desired groove pattern in a substrate of material suitable for use in a surface acoustic wave device substantially as hereinbefore described with reference to the accompanying drawings.
**WARNING** end of DESC field may overlap start of CLMS **.

Claims (4)

**WARNING** start of CLMS field may overlap end of DESC **. (54) IMPROVEMENTS IN OR RELATING TO THE ETCHING OF GROOVES IN SUBSTRATES FOR USE IN SAW DEVICES (71) We, THE GENERAL ELECTRIC COMPANY LIMITED, of 1 Stanhope Gate, London, WIA 1EH, a British Company, do hereby declare the invention, for which we pray that a patent may be granted to us, and the method by which it is to be performed, to be particularly described in and by the following statement: This invention relates to the etching of grooves in substrates for use in surface acoustic wave devices and more particularly to the etching of grooves by ion bombardment through a mask. Two ion bombardment techniques which are known for etching a suitably masked substrate with ions are: radio-frequency sputter etching, in which the substrate is bombarded with positively charged ions; and ion beam etching, in which the substrate is bombarded with neutralised ions. Typically the ions used for bombardment are argon ions. It is known to use titanium as the masking material in the etching of silicon substrates for use in semiconductor devices. The present invention provides a method of ion etching a desired groove pattern in a substrate of material suitable for use in a surface acoustic wave device, the method comprising the steps of: forming on the surface of the substrate to be etched a titanium mask exposing the surface in said desired pattern; ion etching the substrate surface exposed by said mask; and removing said mask. One method according to the invention of ion etching a desired groove pattern in a quartz substrate will now be described, by way of example only, with reference to the accompanying drawings which show the substrate at various stages of the method. A rectangular quartz substrate 1 has a layer of titanium 2 sputter deposited on its upper surface (Figure 1). The layer 2 of titanium is then photolithographically formed into a mask 3 of a desired pattern (Figure 2). The quartz substrate 1 and its mask 3 are then subjected to bombardment from above with a flux of positive argon ions. In this way, both the titanium mask 3 and the surface of the quartz substrate 1 exposed thereby are etched away, thus slightly decreasing the thickness of the titanium mask 3 and imparting the desired groove pattern into the quartz substrate (Figure 3). Finally the titanium mask 3 is chemically removed, leaving the quartz substrate 1 with the desired groove pattern in its upper surface (Figure 4). It will be appreciated that any ion etching technique may be used to impart the desired groove pattern into the substrate. It will also be appreciated that the invention is also applicable to other material suitable for use in surface acoustic wave devices, e.g. lithium niobate, lithium tantalate, etc. WHAT WE CLAIM IS:-
1. A method of ion etching a desired groove pattern in a substrate of material suitable for use in a surface acoustic wave device, the method comprising the steps of: forming on the surface of the substrate to be etched a titanium mask exposing the surface in said desired pattern; ion etching the substrate surface exposed by said mask; and removing said mask.
2. A method according to Claim 1 wherein the step of forming said titanium mask comprises sputter depositing a layer of titanium on the surface of the substrate to be etched, and photolithographically forming said mask from said layer to expose the surface in said desired pattern; and the step of ion etching the substrate surface comprises ion etching the substrate exposed by said mask with positive argon ions.
3. A method of ion etching a desired groove pattern in a substrate of material suitable for use in a surface acoustic wave device substantially as hereinbefore described with reference to the accompanying drawings.
4. A surface acoustic wave device in orporating a substrate having therein a groove pattern etched by a method according to Claims 1, 2 or 3.
GB3909877A 1978-05-25 1978-05-25 Etching of grooves in substrates for use in cups devices Expired GB1569664A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
GB3909877A GB1569664A (en) 1978-05-25 1978-05-25 Etching of grooves in substrates for use in cups devices

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GB3909877A GB1569664A (en) 1978-05-25 1978-05-25 Etching of grooves in substrates for use in cups devices

Publications (1)

Publication Number Publication Date
GB1569664A true GB1569664A (en) 1980-06-18

Family

ID=10407624

Family Applications (1)

Application Number Title Priority Date Filing Date
GB3909877A Expired GB1569664A (en) 1978-05-25 1978-05-25 Etching of grooves in substrates for use in cups devices

Country Status (1)

Country Link
GB (1) GB1569664A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3138761A1 (en) * 1981-09-29 1983-04-14 Siemens AG, 1000 Berlin und 8000 München Method for producing overlap-weighted interdigital structures
GB2148769A (en) * 1983-10-22 1985-06-05 Standard Telephones Cables Ltd Topographic feature formation by ion beam milling of a substrate
US11142411B2 (en) 2015-03-04 2021-10-12 Shibakai Co., Ltd. Cargo handling method

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3138761A1 (en) * 1981-09-29 1983-04-14 Siemens AG, 1000 Berlin und 8000 München Method for producing overlap-weighted interdigital structures
GB2148769A (en) * 1983-10-22 1985-06-05 Standard Telephones Cables Ltd Topographic feature formation by ion beam milling of a substrate
US11142411B2 (en) 2015-03-04 2021-10-12 Shibakai Co., Ltd. Cargo handling method

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