GB1234894A - Process for polishing the surface of semiconductor materials - Google Patents

Process for polishing the surface of semiconductor materials

Info

Publication number
GB1234894A
GB1234894A GB08372/69A GB1837269A GB1234894A GB 1234894 A GB1234894 A GB 1234894A GB 08372/69 A GB08372/69 A GB 08372/69A GB 1837269 A GB1837269 A GB 1837269A GB 1234894 A GB1234894 A GB 1234894A
Authority
GB
United Kingdom
Prior art keywords
polishing
solution
suspension
sio
discs
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB08372/69A
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Wacker Chemie AG
Original Assignee
Wacker Chemie AG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Wacker Chemie AG filed Critical Wacker Chemie AG
Publication of GB1234894A publication Critical patent/GB1234894A/en
Expired legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02002Preparing wafers
    • H01L21/02005Preparing bulk and homogeneous wafers
    • H01L21/02008Multistep processes
    • H01L21/0201Specific process step
    • H01L21/02024Mirror polishing

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Mechanical Treatment Of Semiconductor (AREA)
  • Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)

Abstract

1,234,894. Surface polishing of semi-conductor materials. WACKER-CHEMIE G.m.b.H. 10 April, 1969 [11 April, 1968], No. 18372/69. Heading B3D. [Also in Divisions C4-C5] A suspension of a precipitated metal silicate and/or a metal silicofluoride is used as a mechanically acting agent for polishing semi-conductor surfaces. The silicate may be precipitated by adding a silicate-forming metal salt or solution thereof to a solution of silicic acid or of a salt or derivative thereof. Suitable metal salts are those of the metals of the 2nd and 3rd groups of the Periodic Table, e.g. soluble salts of magnesium, calcium, strontium, barium, zinc or aluminium; salts of heavy metals, e.g. zirconium, iron, lead, nickel and cobalt may be used. The solutions of silicic acids or of their salts or derivatives are usually aqueous solutions, but organic solvents, e.g. alcohols, ketones or esters may be used. As derivatives of silicic acid there may be used silicic acid esters which may be partially or wholly hydrolyzed, e.g. partially hydrolyzed silicic acid-tetra-n-butyl ester. The silicofluoride may be precipitated by adding a silicofluoride-forming metal compound or solution thereof to a solution of fluorosilicic acid or of a salt or derivative thereof. Suitable metal compounds are oxides or hydroxides of the metals of Groups I-III of the Periodic Table, especially of sodium, potassium, magnesium, calcium barium, aluminium or zinc. The polishing suspension may be neutral or alkaline. Example 1. Silicon discs, 32 mm. diameter and 300 Á thick, obtained by sawing up a monocrystalline rod of silicon, are lapped with carborundum powder (particle size 5 Á) whereby on each side 50 Á are removed. Twelve discs are attached by beeswax to a round plane carrier plate of stainless steel, 180 mm. diameter, which is placed on the rotary table (450 mm.) of a polishing machine and is covered with a polishing cloth, the whole being loaded with 1À5 kg. pressure. The table is rotated at 90 r.p.m. Polishing suspension is dropped on to the table at 1 to 2 drops per minute, and polishing performed for 20 mins. The polishing suspension was obtained by taking 120 ml. of waterglass solution (33% SiO 2 ), diluting with 1800 ml. of deionized water and slowly adding a solution of 25 g. AlCl 3 .6H 2 O in 100 ml. of water. The precipitate has a grain size of about 20 mÁ. Example 2. Silicon discs, pretreated as in Example 1, are polished with a suspension prepared as follows: 120 ml. of sodium waterglass solution (33% SiO 2 ) are diluted with 1800 ml. of deionized water and heated to 80‹ C. A solution of 150 g of CaCl 2 .6H 2 O in 200 ml. of water is stirred in very slowly; the suspension is cooled before use. The precipitate has an approximate formula CaO.2SiO 2 , and a grain size of about 60 mÁ. Polishing time is 15 mins. Example 3. Discs about 300 Á thick are sawn off a rod of gallium arsenide and lapped with carborundum powder of 2-3 Á particle size removing about 30 Á on each side. Polishing is carried out as in Example 1, using an aqueous suspension of barium hexafluorosilicate prepared as follows: 560 ml. of aqueous hydrofluoric acid (38% HF) are diluted with 500 ml. of deionized water and 120 g. SiO 2 added. The SiO 2 dissolves and hexafluorosilicic acid forms. A saturated aqueous solution of 75 g. BaCl 2 .2H 2 O is slowly added, and a precipitate of BaSiF 6 settles. The strongly acidic polishing suspension is then neutralized. Polishing time is 15 mins.
GB08372/69A 1968-04-11 1969-04-10 Process for polishing the surface of semiconductor materials Expired GB1234894A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE19681752163 DE1752163A1 (en) 1968-04-11 1968-04-11 Process for polishing semiconductor surfaces

Publications (1)

Publication Number Publication Date
GB1234894A true GB1234894A (en) 1971-06-09

Family

ID=5692658

Family Applications (1)

Application Number Title Priority Date Filing Date
GB08372/69A Expired GB1234894A (en) 1968-04-11 1969-04-10 Process for polishing the surface of semiconductor materials

Country Status (6)

Country Link
US (1) US3877183A (en)
BE (1) BE731353A (en)
CH (1) CH505466A (en)
DE (1) DE1752163A1 (en)
FR (1) FR2006054A1 (en)
GB (1) GB1234894A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2008080096A2 (en) * 2006-12-21 2008-07-03 Advanced Technology Materials, Inc. Compositions and methods for the selective removal of silicon nitride

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2531431C3 (en) * 1975-07-14 1979-03-01 Wacker-Chemitronic Gesellschaft Fuer Elektronik-Grundstoffe Mbh, 8263 Burghausen Polishing agents for producing haze-free semiconductor surfaces
DE2538855A1 (en) * 1975-09-01 1977-03-10 Wacker Chemitronic PROCESS FOR THE PRODUCTION OF VEIL-FREE SEMICONDUCTOR SURFACES, IN PARTICULAR VEIL-FREE SURFACES OF (111) -ORIENTED GALLIUM ARSENIDE
FR2327036A1 (en) * 1975-10-08 1977-05-06 Du Pont Modified silica sol for polishing silicon and germanium - remaining stable without depolymerisation at high pH for rapid polishing
JPS55113700A (en) * 1979-02-19 1980-09-02 Fujimi Kenmazai Kogyo Kk Polishing method for gadolinium gallium garnet single crystal
JPS5935429A (en) * 1982-08-12 1984-02-27 インタ−ナシヨナル ビジネス マシ−ンズ コ−ポレ−シヨン Method of producing semiconductor wafer
DE3237235C2 (en) * 1982-10-07 1986-07-10 Wacker-Chemitronic Gesellschaft für Elektronik-Grundstoffe mbH, 8263 Burghausen Process for polishing III-V semiconductor surfaces
US4588421A (en) * 1984-10-15 1986-05-13 Nalco Chemical Company Aqueous silica compositions for polishing silicon wafers
US5993685A (en) * 1997-04-02 1999-11-30 Advanced Technology Materials Planarization composition for removing metal films
US6319095B1 (en) * 2000-03-09 2001-11-20 Agere Systems Guardian Corp. Colloidal suspension of abrasive particles containing magnesium as CMP slurry
KR20140102696A (en) * 2011-12-27 2014-08-22 코니카 미놀타 가부시키가이샤 Method for separating polishing material and regenerated polishing material
CN111253910B (en) * 2020-03-18 2021-07-16 昆山捷纳电子材料有限公司 Preparation method of inorganic polyelectrolyte-silicon oxide composite polishing abrasive particles

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2275049A (en) * 1942-03-03 Polish
US2375825A (en) * 1941-10-16 1945-05-15 Interchem Corp Polishing compositions
US2375823A (en) * 1941-10-16 1945-05-15 Interchem Corp Polishing composition
US2399237A (en) * 1942-12-15 1946-04-30 William T Maloney Polishing material and process of preparing same
US2955030A (en) * 1959-02-25 1960-10-04 Nat Lead Co Polishing compositions
US3170273A (en) * 1963-01-10 1965-02-23 Monsanto Co Process for polishing semiconductor materials
US3527028A (en) * 1967-09-26 1970-09-08 Bell Telephone Labor Inc Preparation of semiconductor surfaces
US3647381A (en) * 1968-04-08 1972-03-07 Gabriel Reiter Dental-prophylaxis composition
US3541017A (en) * 1969-02-04 1970-11-17 Indiana University Foundation Denture cleanser preparations comprising zirconium silicate and zirconium dioxide
US3754941A (en) * 1971-01-04 1973-08-28 Colgate Palmolive Co Removal of metallic stains from porcelain surfaces

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2008080096A2 (en) * 2006-12-21 2008-07-03 Advanced Technology Materials, Inc. Compositions and methods for the selective removal of silicon nitride
WO2008080096A3 (en) * 2006-12-21 2008-11-06 Advanced Tech Materials Compositions and methods for the selective removal of silicon nitride
US8778210B2 (en) 2006-12-21 2014-07-15 Advanced Technology Materials, Inc. Compositions and methods for the selective removal of silicon nitride
US9158203B2 (en) 2006-12-21 2015-10-13 Advanced Technology Materials, Inc. Compositions and methods for the selective removal of silicon nitride
TWI509690B (en) * 2006-12-21 2015-11-21 Entegris Inc Compositions and methods for the selective removal of silicon nitride
US9691629B2 (en) 2006-12-21 2017-06-27 Entegris, Inc. Compositions and methods for the selective removal of silicon nitride

Also Published As

Publication number Publication date
FR2006054A1 (en) 1969-12-19
BE731353A (en) 1969-10-10
CH505466A (en) 1971-03-31
US3877183A (en) 1975-04-15
DE1752163B2 (en) 1974-07-25
DE1752163A1 (en) 1971-05-13
DE1752163C3 (en) 1975-03-20

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