GB1120428A - Improvements in data processing systems - Google Patents
Improvements in data processing systemsInfo
- Publication number
- GB1120428A GB1120428A GB46112/65A GB4611265A GB1120428A GB 1120428 A GB1120428 A GB 1120428A GB 46112/65 A GB46112/65 A GB 46112/65A GB 4611265 A GB4611265 A GB 4611265A GB 1120428 A GB1120428 A GB 1120428A
- Authority
- GB
- United Kingdom
- Prior art keywords
- test
- bit
- binary
- programme
- words
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
- G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
- G11C29/38—Response verification devices
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/26—Functional testing
- G06F11/267—Reconfiguring circuits for testing, e.g. LSSD, partitioning
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F9/00—Arrangements for program control, e.g. control units
- G06F9/06—Arrangements for program control, e.g. control units using stored programs, i.e. using an internal store of processing equipment to receive or retain programs
- G06F9/22—Microcontrol or microprogram arrangements
- G06F9/226—Microinstruction function, e.g. input/output microinstruction; diagnostic microinstruction; microinstruction format
Landscapes
- Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Software Systems (AREA)
- Computer Hardware Design (AREA)
- Quality & Reliability (AREA)
- Test And Diagnosis Of Digital Computers (AREA)
- Techniques For Improving Reliability Of Storages (AREA)
- Tests Of Electronic Circuits (AREA)
Abstract
1,120,428. Electric digital calculators. INTERNATIONAL BUSINESS MACHINES CORP. 1 Nov., 1965 [23 Dec., 1964], No. 46112/65. Heading G4A. In an electronic digital data processing system having sequences of basic operations defined by a stored micro-programme, in a sequence control unit 3, Fig. 1, the general purpose erasible store is used interchangeably with the unit 3 to control the subset decoder 4 to produce a sequence of scan, compare and address branching micro-operations for effectively testing the system under the control of the main programme which contains test words. The system uses programmed " mask " words whereby parallel groups of signals may be tested one bit at a time under the control of the programme without the use of circuit hardware for selecting the individual bits. The general purpose store 1 comprises a magnetic core matrix (60), Fig. 2 (not shown); address register (61); in/out buffer (62); instruction address register (87) and increment adder (89). The microprogramme sequence control unit 3 comprises a read-only capacitor store matrix (120), Fig. 5 (not shown), having an address selector matrix (129) address register (121) and output buffer register 124. In operation, a supervisory switch 16 is manually or automatically actuated to sequentially control the system according to the permanent sequence mode (PSM) or the supervisory test mode (STM). In (PSM) the micro-order group of decoders 4, is controlled through a group of input lines 13 from the sequence control unit 3, to produce selected signals on exclusive ones of single output lines OP 0-15 of a test subset decoder 10 or on normal groups of control lines OPj, k, l. m, n, p, of the remaining decoders. In (STM) the test subset decoder 10 is controlled by four binary bits on a group of lines 12 from the general purpose erasible store 1 to produce the control outputs on lines OP 0-15 . The test procedure involves the use of programmed binary 36 bit " mask " words each containing a selectively placed zero bit in a field which is otherwise all ones. A programme loading procedure is described whereby such words, which may contain incorrect parity bits, may be written into the erasible store. The 36 bit output from the storage data register (including four binary check bits) is supplied to a test circuit 15 having a pass/ fail output indication 19 which determines whether the system proceeds to the next test programme step or is stopped. The programmed mask words in logic OR combination with a corresponding number (32) of bits extracted in stages from the 90 bit words of the microprogramme sequence control unit 3 produce either an all 1's condition or single 0 in a 36- way AND circuit (200), Fig. 5 (not shown), of the test circuit 15. This circuit includes a binary pass/fail trigger (100) which is thereby conditioned exclusively by the scanned information in the bit position selected at the relevant stage of the programme. In a following cycle a further test word corresponding to the expected condition of the logical OR combination is scanned and the binary trigger (100) is again conditioned. With the system operating correctly the binary trigger 100 will be stopped either not at all or twice, thereby indicating a " 0 " or pass condition. With the system operating incorrectly and the OR combination word and test word not being in parity at the relevant bit the binary trigger 100 will be stepped only once indicating a " 1 " or fail condition.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US420621A US3343141A (en) | 1964-12-23 | 1964-12-23 | Bypassing of processor sequence controls for diagnostic tests |
Publications (1)
Publication Number | Publication Date |
---|---|
GB1120428A true GB1120428A (en) | 1968-07-17 |
Family
ID=23667196
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GB46112/65A Expired GB1120428A (en) | 1964-12-23 | 1965-11-01 | Improvements in data processing systems |
Country Status (6)
Country | Link |
---|---|
US (1) | US3343141A (en) |
BE (1) | BE673660A (en) |
FR (1) | FR1464947A (en) |
GB (1) | GB1120428A (en) |
NL (1) | NL159210B (en) |
SE (1) | SE331378B (en) |
Families Citing this family (34)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
GB1131085A (en) * | 1966-03-25 | 1968-10-23 | Secr Defence | Improvements in or relating to the testing and repair of electronic digital computers |
US3478322A (en) * | 1967-05-23 | 1969-11-11 | Ibm | Data processor employing electronically changeable control storage |
US3525082A (en) * | 1967-10-23 | 1970-08-18 | Hermann Borge Funck Jensen | Conditional alternative program branching in automated working machines |
US3576541A (en) * | 1968-01-02 | 1971-04-27 | Burroughs Corp | Method and apparatus for detecting and diagnosing computer error conditions |
US3539996A (en) * | 1968-01-15 | 1970-11-10 | Ibm | Data processing machine function indicator |
US3618042A (en) * | 1968-11-01 | 1971-11-02 | Hitachi Ltd | Error detection and instruction reexecution device in a data-processing apparatus |
US3599161A (en) * | 1969-04-03 | 1971-08-10 | Computer Test Corp | Computer controlled test system and method |
US3573751A (en) * | 1969-04-22 | 1971-04-06 | Sylvania Electric Prod | Fault isolation system for modularized electronic equipment |
DE1927549A1 (en) * | 1969-05-30 | 1970-12-03 | Ibm Deutschland | Error checking device in electronic data processing systems |
US3593297A (en) * | 1970-02-12 | 1971-07-13 | Ibm | Diagnostic system for trapping circuitry |
US3707725A (en) * | 1970-06-19 | 1972-12-26 | Ibm | Program execution tracing system improvements |
US3696340A (en) * | 1970-11-09 | 1972-10-03 | Tokyo Shibaura Electric Co | Microprogram execution control for fault diagnosis |
US3688263A (en) * | 1971-04-19 | 1972-08-29 | Burroughs Corp | Method and apparatus for diagnosing operation of a digital processor |
US3806878A (en) * | 1971-08-05 | 1974-04-23 | Ibm | Concurrent subsystem diagnostics and i/o controller |
US3728690A (en) * | 1971-08-26 | 1973-04-17 | Honeywell Inf Systems | Branch facility diagnostics |
US3798613A (en) * | 1971-10-27 | 1974-03-19 | Ibm | Controlling peripheral subsystems |
US3763474A (en) * | 1971-12-09 | 1973-10-02 | Bell Telephone Labor Inc | Program activated computer diagnostic system |
US3868649A (en) * | 1972-06-28 | 1975-02-25 | Fujitsu Ltd | Microprogram control system |
US3825901A (en) * | 1972-11-09 | 1974-07-23 | Ibm | Integrated diagnostic tool |
US3814922A (en) * | 1972-12-01 | 1974-06-04 | Honeywell Inf Systems | Availability and diagnostic apparatus for memory modules |
US3831148A (en) * | 1973-01-02 | 1974-08-20 | Honeywell Inf Systems | Nonexecute test apparatus |
US3838260A (en) * | 1973-01-22 | 1974-09-24 | Xerox Corp | Microprogrammable control memory diagnostic system |
US3898621A (en) * | 1973-04-06 | 1975-08-05 | Gte Automatic Electric Lab Inc | Data processor system diagnostic arrangement |
US3940744A (en) * | 1973-12-17 | 1976-02-24 | Xerox Corporation | Self contained program loading apparatus |
US4315311A (en) * | 1975-10-28 | 1982-02-09 | Compagnie Internationale Pour L'informatique Cii-Honeywell Bull (Societe Anonyme) | Diagnostic system for a data processing system |
US4127768A (en) * | 1977-01-03 | 1978-11-28 | Honeywell Information Systems Inc. | Data processing system self-test enabling technique |
US4280285A (en) * | 1977-05-09 | 1981-07-28 | The Singer Company | Simulator complex data transmission system having self-testing capabilities |
US4241416A (en) * | 1977-07-01 | 1980-12-23 | Systron-Donner Corporation | Monitoring apparatus for processor controlled equipment |
DE2747304C3 (en) * | 1977-10-21 | 1981-03-26 | IBM Deutschland GmbH, 70569 Stuttgart | Micro-command control device |
EP0018736A1 (en) * | 1979-05-01 | 1980-11-12 | Motorola, Inc. | Self-testing microcomputer and method of testing |
US4463418A (en) * | 1981-06-30 | 1984-07-31 | International Business Machines Corporation | Error correction from remote data processor by communication and reconstruction of processor status storage disk |
US4926445A (en) * | 1987-07-01 | 1990-05-15 | The United States Of America As Represented By The Secretary Of The Air Force | External asynchronous input tester for bit slice machines |
GB9417297D0 (en) * | 1994-08-26 | 1994-10-19 | Inmos Ltd | Method and apparatus for testing an integrated circuit device |
CN104729536B (en) * | 2015-03-18 | 2017-11-10 | 广东好帮手电子科技股份有限公司 | A kind of debugging acid and adjustment method based on vehicle mounted guidance product |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US2923921A (en) * | 1954-06-23 | 1960-02-02 | Shapin | |
US3248708A (en) * | 1962-01-22 | 1966-04-26 | Ibm | Memory organization for fast read storage |
-
1964
- 1964-12-23 US US420621A patent/US3343141A/en not_active Expired - Lifetime
-
1965
- 1965-11-01 GB GB46112/65A patent/GB1120428A/en not_active Expired
- 1965-12-10 FR FR41665A patent/FR1464947A/en not_active Expired
- 1965-12-13 BE BE673660D patent/BE673660A/xx unknown
- 1965-12-21 NL NL6516619.A patent/NL159210B/en unknown
- 1965-12-23 SE SE16749/65A patent/SE331378B/xx unknown
Also Published As
Publication number | Publication date |
---|---|
DE1499226A1 (en) | 1970-07-09 |
FR1464947A (en) | 1967-01-06 |
BE673660A (en) | 1966-04-01 |
SE331378B (en) | 1970-12-21 |
DE1499226B2 (en) | 1975-10-30 |
NL6516619A (en) | 1966-06-24 |
US3343141A (en) | 1967-09-19 |
NL159210B (en) | 1979-01-15 |
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