GB1120428A - Improvements in data processing systems - Google Patents

Improvements in data processing systems

Info

Publication number
GB1120428A
GB1120428A GB46112/65A GB4611265A GB1120428A GB 1120428 A GB1120428 A GB 1120428A GB 46112/65 A GB46112/65 A GB 46112/65A GB 4611265 A GB4611265 A GB 4611265A GB 1120428 A GB1120428 A GB 1120428A
Authority
GB
United Kingdom
Prior art keywords
test
bit
binary
programme
words
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
GB46112/65A
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
International Business Machines Corp
Original Assignee
International Business Machines Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by International Business Machines Corp filed Critical International Business Machines Corp
Publication of GB1120428A publication Critical patent/GB1120428A/en
Expired legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C29/00Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C29/38Response verification devices
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/22Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26Functional testing
    • G06F11/267Reconfiguring circuits for testing, e.g. LSSD, partitioning
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F9/00Arrangements for program control, e.g. control units
    • G06F9/06Arrangements for program control, e.g. control units using stored programs, i.e. using an internal store of processing equipment to receive or retain programs
    • G06F9/22Microcontrol or microprogram arrangements
    • G06F9/226Microinstruction function, e.g. input/output microinstruction; diagnostic microinstruction; microinstruction format

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Software Systems (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
  • Tests Of Electronic Circuits (AREA)

Abstract

1,120,428. Electric digital calculators. INTERNATIONAL BUSINESS MACHINES CORP. 1 Nov., 1965 [23 Dec., 1964], No. 46112/65. Heading G4A. In an electronic digital data processing system having sequences of basic operations defined by a stored micro-programme, in a sequence control unit 3, Fig. 1, the general purpose erasible store is used interchangeably with the unit 3 to control the subset decoder 4 to produce a sequence of scan, compare and address branching micro-operations for effectively testing the system under the control of the main programme which contains test words. The system uses programmed " mask " words whereby parallel groups of signals may be tested one bit at a time under the control of the programme without the use of circuit hardware for selecting the individual bits. The general purpose store 1 comprises a magnetic core matrix (60), Fig. 2 (not shown); address register (61); in/out buffer (62); instruction address register (87) and increment adder (89). The microprogramme sequence control unit 3 comprises a read-only capacitor store matrix (120), Fig. 5 (not shown), having an address selector matrix (129) address register (121) and output buffer register 124. In operation, a supervisory switch 16 is manually or automatically actuated to sequentially control the system according to the permanent sequence mode (PSM) or the supervisory test mode (STM). In (PSM) the micro-order group of decoders 4, is controlled through a group of input lines 13 from the sequence control unit 3, to produce selected signals on exclusive ones of single output lines OP 0-15 of a test subset decoder 10 or on normal groups of control lines OPj, k, l. m, n, p, of the remaining decoders. In (STM) the test subset decoder 10 is controlled by four binary bits on a group of lines 12 from the general purpose erasible store 1 to produce the control outputs on lines OP 0-15 . The test procedure involves the use of programmed binary 36 bit " mask " words each containing a selectively placed zero bit in a field which is otherwise all ones. A programme loading procedure is described whereby such words, which may contain incorrect parity bits, may be written into the erasible store. The 36 bit output from the storage data register (including four binary check bits) is supplied to a test circuit 15 having a pass/ fail output indication 19 which determines whether the system proceeds to the next test programme step or is stopped. The programmed mask words in logic OR combination with a corresponding number (32) of bits extracted in stages from the 90 bit words of the microprogramme sequence control unit 3 produce either an all 1's condition or single 0 in a 36- way AND circuit (200), Fig. 5 (not shown), of the test circuit 15. This circuit includes a binary pass/fail trigger (100) which is thereby conditioned exclusively by the scanned information in the bit position selected at the relevant stage of the programme. In a following cycle a further test word corresponding to the expected condition of the logical OR combination is scanned and the binary trigger (100) is again conditioned. With the system operating correctly the binary trigger 100 will be stopped either not at all or twice, thereby indicating a " 0 " or pass condition. With the system operating incorrectly and the OR combination word and test word not being in parity at the relevant bit the binary trigger 100 will be stepped only once indicating a " 1 " or fail condition.
GB46112/65A 1964-12-23 1965-11-01 Improvements in data processing systems Expired GB1120428A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US420621A US3343141A (en) 1964-12-23 1964-12-23 Bypassing of processor sequence controls for diagnostic tests

Publications (1)

Publication Number Publication Date
GB1120428A true GB1120428A (en) 1968-07-17

Family

ID=23667196

Family Applications (1)

Application Number Title Priority Date Filing Date
GB46112/65A Expired GB1120428A (en) 1964-12-23 1965-11-01 Improvements in data processing systems

Country Status (6)

Country Link
US (1) US3343141A (en)
BE (1) BE673660A (en)
FR (1) FR1464947A (en)
GB (1) GB1120428A (en)
NL (1) NL159210B (en)
SE (1) SE331378B (en)

Families Citing this family (34)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1131085A (en) * 1966-03-25 1968-10-23 Secr Defence Improvements in or relating to the testing and repair of electronic digital computers
US3478322A (en) * 1967-05-23 1969-11-11 Ibm Data processor employing electronically changeable control storage
US3525082A (en) * 1967-10-23 1970-08-18 Hermann Borge Funck Jensen Conditional alternative program branching in automated working machines
US3576541A (en) * 1968-01-02 1971-04-27 Burroughs Corp Method and apparatus for detecting and diagnosing computer error conditions
US3539996A (en) * 1968-01-15 1970-11-10 Ibm Data processing machine function indicator
US3618042A (en) * 1968-11-01 1971-11-02 Hitachi Ltd Error detection and instruction reexecution device in a data-processing apparatus
US3599161A (en) * 1969-04-03 1971-08-10 Computer Test Corp Computer controlled test system and method
US3573751A (en) * 1969-04-22 1971-04-06 Sylvania Electric Prod Fault isolation system for modularized electronic equipment
DE1927549A1 (en) * 1969-05-30 1970-12-03 Ibm Deutschland Error checking device in electronic data processing systems
US3593297A (en) * 1970-02-12 1971-07-13 Ibm Diagnostic system for trapping circuitry
US3707725A (en) * 1970-06-19 1972-12-26 Ibm Program execution tracing system improvements
US3696340A (en) * 1970-11-09 1972-10-03 Tokyo Shibaura Electric Co Microprogram execution control for fault diagnosis
US3688263A (en) * 1971-04-19 1972-08-29 Burroughs Corp Method and apparatus for diagnosing operation of a digital processor
US3806878A (en) * 1971-08-05 1974-04-23 Ibm Concurrent subsystem diagnostics and i/o controller
US3728690A (en) * 1971-08-26 1973-04-17 Honeywell Inf Systems Branch facility diagnostics
US3798613A (en) * 1971-10-27 1974-03-19 Ibm Controlling peripheral subsystems
US3763474A (en) * 1971-12-09 1973-10-02 Bell Telephone Labor Inc Program activated computer diagnostic system
US3868649A (en) * 1972-06-28 1975-02-25 Fujitsu Ltd Microprogram control system
US3825901A (en) * 1972-11-09 1974-07-23 Ibm Integrated diagnostic tool
US3814922A (en) * 1972-12-01 1974-06-04 Honeywell Inf Systems Availability and diagnostic apparatus for memory modules
US3831148A (en) * 1973-01-02 1974-08-20 Honeywell Inf Systems Nonexecute test apparatus
US3838260A (en) * 1973-01-22 1974-09-24 Xerox Corp Microprogrammable control memory diagnostic system
US3898621A (en) * 1973-04-06 1975-08-05 Gte Automatic Electric Lab Inc Data processor system diagnostic arrangement
US3940744A (en) * 1973-12-17 1976-02-24 Xerox Corporation Self contained program loading apparatus
US4315311A (en) * 1975-10-28 1982-02-09 Compagnie Internationale Pour L'informatique Cii-Honeywell Bull (Societe Anonyme) Diagnostic system for a data processing system
US4127768A (en) * 1977-01-03 1978-11-28 Honeywell Information Systems Inc. Data processing system self-test enabling technique
US4280285A (en) * 1977-05-09 1981-07-28 The Singer Company Simulator complex data transmission system having self-testing capabilities
US4241416A (en) * 1977-07-01 1980-12-23 Systron-Donner Corporation Monitoring apparatus for processor controlled equipment
DE2747304C3 (en) * 1977-10-21 1981-03-26 IBM Deutschland GmbH, 70569 Stuttgart Micro-command control device
EP0018736A1 (en) * 1979-05-01 1980-11-12 Motorola, Inc. Self-testing microcomputer and method of testing
US4463418A (en) * 1981-06-30 1984-07-31 International Business Machines Corporation Error correction from remote data processor by communication and reconstruction of processor status storage disk
US4926445A (en) * 1987-07-01 1990-05-15 The United States Of America As Represented By The Secretary Of The Air Force External asynchronous input tester for bit slice machines
GB9417297D0 (en) * 1994-08-26 1994-10-19 Inmos Ltd Method and apparatus for testing an integrated circuit device
CN104729536B (en) * 2015-03-18 2017-11-10 广东好帮手电子科技股份有限公司 A kind of debugging acid and adjustment method based on vehicle mounted guidance product

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2923921A (en) * 1954-06-23 1960-02-02 Shapin
US3248708A (en) * 1962-01-22 1966-04-26 Ibm Memory organization for fast read storage

Also Published As

Publication number Publication date
DE1499226A1 (en) 1970-07-09
FR1464947A (en) 1967-01-06
BE673660A (en) 1966-04-01
SE331378B (en) 1970-12-21
DE1499226B2 (en) 1975-10-30
NL6516619A (en) 1966-06-24
US3343141A (en) 1967-09-19
NL159210B (en) 1979-01-15

Similar Documents

Publication Publication Date Title
GB1120428A (en) Improvements in data processing systems
US3576541A (en) Method and apparatus for detecting and diagnosing computer error conditions
US3427443A (en) Instruction execution marker for testing computer programs
US3037697A (en) Information handling apparatus
US3688263A (en) Method and apparatus for diagnosing operation of a digital processor
EP0042422B1 (en) Diagnostic circuitry in a data processor
USRE43248E1 (en) Interoperability with multiple instruction sets
CA1083725A (en) Word, byte and bit indexed addressing in a data processing system
US3470542A (en) Modular system design
EP0079133A2 (en) Virtual memory protected system
US3679875A (en) Medical test data entry terminal
GB931126A (en) Improvements in digital data storage systems
US4141268A (en) Keyboard apparatus for an electronic musical instrument
GB1166057A (en) Fault Localization in a Computer System
US4144564A (en) Associative memory
GB853551A (en) Improvements in data transmission systems
US4084262A (en) Digital monitor having memory readout by the monitored system
US4149262A (en) Associative memory device with variable recognition criteria
EP0048825A2 (en) Microprocessor controlled machine
CA1219376A (en) Test and maintenance method and apparatus for a data processing system
US4462102A (en) Method and apparatus for checking the parity of disassociated bit groups
US4257110A (en) Recognition memory with multiwrite and masking
US3745316A (en) Computer checking system
Clark The Lincoln TX-2 computer development
US3566093A (en) Diagnostic method and implementation for data processors