GB0608999D0 - Surface measurement probe - Google Patents

Surface measurement probe

Info

Publication number
GB0608999D0
GB0608999D0 GBGB0608999.9A GB0608999A GB0608999D0 GB 0608999 D0 GB0608999 D0 GB 0608999D0 GB 0608999 A GB0608999 A GB 0608999A GB 0608999 D0 GB0608999 D0 GB 0608999D0
Authority
GB
United Kingdom
Prior art keywords
measurement probe
surface measurement
probe
measurement
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
GBGB0608999.9A
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Renishaw PLC
Original Assignee
Renishaw PLC
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Renishaw PLC filed Critical Renishaw PLC
Priority to GBGB0608999.9A priority Critical patent/GB0608999D0/en
Publication of GB0608999D0 publication Critical patent/GB0608999D0/en
Priority to US12/226,731 priority patent/US20090320553A1/en
Priority to JP2009508473A priority patent/JP2009536335A/en
Priority to CNA2007800165252A priority patent/CN101438130A/en
Priority to PCT/GB2007/001667 priority patent/WO2007129075A2/en
Priority to EP07732696A priority patent/EP2027436A2/en
Ceased legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
    • G01B7/004—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring coordinates of points
    • G01B7/008—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring coordinates of points using coordinate measuring machines
    • G01B7/012—Contact-making feeler heads therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • G01B21/02—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
    • G01B21/04—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness by measuring coordinates of points
    • G01B21/045—Correction of measurements
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B5/00—Measuring arrangements characterised by the use of mechanical techniques
    • G01B5/0011—Arrangements for eliminating or compensation of measuring errors due to temperature or weight
    • G01B5/0014—Arrangements for eliminating or compensation of measuring errors due to temperature or weight due to temperature
GBGB0608999.9A 2006-05-08 2006-05-08 Surface measurement probe Ceased GB0608999D0 (en)

Priority Applications (6)

Application Number Priority Date Filing Date Title
GBGB0608999.9A GB0608999D0 (en) 2006-05-08 2006-05-08 Surface measurement probe
US12/226,731 US20090320553A1 (en) 2006-05-08 2007-05-08 Surface Measurement Probe
JP2009508473A JP2009536335A (en) 2006-05-08 2007-05-08 Surface measurement probe
CNA2007800165252A CN101438130A (en) 2006-05-08 2007-05-08 Surface measurement probe
PCT/GB2007/001667 WO2007129075A2 (en) 2006-05-08 2007-05-08 Surface measurement probe
EP07732696A EP2027436A2 (en) 2006-05-08 2007-05-08 Surface measurement probe

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
GBGB0608999.9A GB0608999D0 (en) 2006-05-08 2006-05-08 Surface measurement probe

Publications (1)

Publication Number Publication Date
GB0608999D0 true GB0608999D0 (en) 2006-06-14

Family

ID=36604074

Family Applications (1)

Application Number Title Priority Date Filing Date
GBGB0608999.9A Ceased GB0608999D0 (en) 2006-05-08 2006-05-08 Surface measurement probe

Country Status (6)

Country Link
US (1) US20090320553A1 (en)
EP (1) EP2027436A2 (en)
JP (1) JP2009536335A (en)
CN (1) CN101438130A (en)
GB (1) GB0608999D0 (en)
WO (1) WO2007129075A2 (en)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2142878B1 (en) * 2007-04-30 2018-09-26 Renishaw PLC Analogue probe with temperature control and method of operation
EP3128287A1 (en) 2015-08-06 2017-02-08 Renishaw plc Method of measurement of a slot
WO2017112774A1 (en) * 2015-12-22 2017-06-29 Mitutoyo Corporation Sensor signal offset compensation system for a cmm touch probe
FR3052559B1 (en) * 2016-06-10 2020-06-12 Onera (Office National D'etudes Et De Recherches Aerospatiales) SYSTEM AND METHOD FOR PROVIDING THE AMPLITUDE AND PHASE DELAY OF A SINUSOIDAL SIGNAL
EP3460384A1 (en) * 2017-09-26 2019-03-27 Renishaw PLC Measurement probe
JP6898966B2 (en) 2019-06-07 2021-07-07 株式会社ミツトヨ Defect judgment unit
CN112179298B (en) * 2020-08-21 2021-11-26 成都现代万通锚固技术有限公司 Method for detecting length of anchor rod through natural frequency

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6147502A (en) * 1984-08-13 1986-03-08 Mitsutoyo Mfg Co Ltd Touch signal detection circuit
US5247751A (en) * 1990-09-29 1993-09-28 Nikon Corporation Touch probe
JPH07167638A (en) * 1993-12-15 1995-07-04 Nikon Corp Touch probe
JP2889196B2 (en) * 1996-10-08 1999-05-10 株式会社ミツトヨ DC level change detection circuit for sensor signal
US6708420B1 (en) 1999-01-06 2004-03-23 Patrick M. Flanagan Piezoelectric touch probe
US7532202B2 (en) * 2002-05-08 2009-05-12 3M Innovative Properties Company Baselining techniques in force-based touch panel systems
US7041963B2 (en) * 2003-11-26 2006-05-09 Massachusetts Institute Of Technology Height calibration of scanning probe microscope actuators

Also Published As

Publication number Publication date
CN101438130A (en) 2009-05-20
JP2009536335A (en) 2009-10-08
WO2007129075A8 (en) 2008-04-17
US20090320553A1 (en) 2009-12-31
WO2007129075A2 (en) 2007-11-15
WO2007129075A3 (en) 2008-03-06
EP2027436A2 (en) 2009-02-25

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Legal Events

Date Code Title Description
AT Applications terminated before publication under section 16(1)