GB0031456D0 - Measuring device - Google Patents
Measuring deviceInfo
- Publication number
- GB0031456D0 GB0031456D0 GB0031456A GB0031456A GB0031456D0 GB 0031456 D0 GB0031456 D0 GB 0031456D0 GB 0031456 A GB0031456 A GB 0031456A GB 0031456 A GB0031456 A GB 0031456A GB 0031456 D0 GB0031456 D0 GB 0031456D0
- Authority
- GB
- United Kingdom
- Prior art keywords
- measuring device
- measuring
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
- G01L1/00—Measuring force or stress, in general
- G01L1/20—Measuring force or stress, in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress
- G01L1/22—Measuring force or stress, in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress using resistance strain gauges
- G01L1/2268—Arrangements for correcting or for compensating unwanted effects
- G01L1/2281—Arrangements for correcting or for compensating unwanted effects for temperature variations
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
- G01D3/00—Indicating or recording apparatus with provision for the special purposes referred to in the subgroups
- G01D3/028—Indicating or recording apparatus with provision for the special purposes referred to in the subgroups mitigating undesired influences, e.g. temperature, pressure
- G01D3/036—Indicating or recording apparatus with provision for the special purposes referred to in the subgroups mitigating undesired influences, e.g. temperature, pressure on measuring arrangements themselves
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
- G01D3/00—Indicating or recording apparatus with provision for the special purposes referred to in the subgroups
- G01D3/028—Indicating or recording apparatus with provision for the special purposes referred to in the subgroups mitigating undesired influences, e.g. temperature, pressure
- G01D3/036—Indicating or recording apparatus with provision for the special purposes referred to in the subgroups mitigating undesired influences, e.g. temperature, pressure on measuring arrangements themselves
- G01D3/0365—Indicating or recording apparatus with provision for the special purposes referred to in the subgroups mitigating undesired influences, e.g. temperature, pressure on measuring arrangements themselves the undesired influence being measured using a separate sensor, which produces an influence related signal
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB0031456A GB2370358A (en) | 2000-12-22 | 2000-12-22 | Measuring device comprising a temperature sensitive potential divider for temperature compensation |
PCT/GB2001/005798 WO2002052228A1 (en) | 2000-12-22 | 2001-12-21 | Temperature-compensated sensor |
GB0314677A GB2386196B (en) | 2000-12-22 | 2001-12-21 | Temperature-compensated sensor |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB0031456A GB2370358A (en) | 2000-12-22 | 2000-12-22 | Measuring device comprising a temperature sensitive potential divider for temperature compensation |
Publications (2)
Publication Number | Publication Date |
---|---|
GB0031456D0 true GB0031456D0 (en) | 2001-02-07 |
GB2370358A GB2370358A (en) | 2002-06-26 |
Family
ID=9905742
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GB0031456A Withdrawn GB2370358A (en) | 2000-12-22 | 2000-12-22 | Measuring device comprising a temperature sensitive potential divider for temperature compensation |
GB0314677A Expired - Lifetime GB2386196B (en) | 2000-12-22 | 2001-12-21 | Temperature-compensated sensor |
Family Applications After (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
GB0314677A Expired - Lifetime GB2386196B (en) | 2000-12-22 | 2001-12-21 | Temperature-compensated sensor |
Country Status (2)
Country | Link |
---|---|
GB (2) | GB2370358A (en) |
WO (1) | WO2002052228A1 (en) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
RU2003133241A (en) * | 2003-11-17 | 2005-04-20 | Александр Владимирович Лопатин (RU) | DEVICE FOR DETERMINING VALUE OF VARIABLE TIME OF A MEASURED VALUE |
CN114878033B (en) * | 2022-03-29 | 2023-12-22 | 深圳国微感知技术有限公司 | Matrix type pressure distribution measurement system and method |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4462018A (en) * | 1982-11-05 | 1984-07-24 | Gulton Industries, Inc. | Semiconductor strain gauge with integral compensation resistors |
DE3418751C1 (en) * | 1984-05-19 | 1985-03-14 | Hottinger Baldwin Messtechnik Gmbh, 6100 Darmstadt | Measurement-bridge circuit for inductive sensors |
JPH0664080B2 (en) * | 1989-03-10 | 1994-08-22 | 山武ハネウエル株式会社 | Temperature compensation circuit for flow sensor |
US5184520A (en) * | 1989-10-18 | 1993-02-09 | Ishida Scales Mfg. Co., Ltd. | Load sensor |
US5534773A (en) * | 1994-06-23 | 1996-07-09 | Mitsubishi Denki Kabushiki Kaisha | Method for compensating an offset voltage temperature drift in a semiconductor strain gage sensor |
-
2000
- 2000-12-22 GB GB0031456A patent/GB2370358A/en not_active Withdrawn
-
2001
- 2001-12-21 WO PCT/GB2001/005798 patent/WO2002052228A1/en not_active Application Discontinuation
- 2001-12-21 GB GB0314677A patent/GB2386196B/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
GB0314677D0 (en) | 2003-07-30 |
GB2370358A (en) | 2002-06-26 |
WO2002052228A1 (en) | 2002-07-04 |
GB2386196A (en) | 2003-09-10 |
GB2386196B (en) | 2004-07-28 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
WAP | Application withdrawn, taken to be withdrawn or refused ** after publication under section 16(1) |