FR2919402B1 - Procede de test d'une application logicielle. - Google Patents

Procede de test d'une application logicielle.

Info

Publication number
FR2919402B1
FR2919402B1 FR0756687A FR0756687A FR2919402B1 FR 2919402 B1 FR2919402 B1 FR 2919402B1 FR 0756687 A FR0756687 A FR 0756687A FR 0756687 A FR0756687 A FR 0756687A FR 2919402 B1 FR2919402 B1 FR 2919402B1
Authority
FR
France
Prior art keywords
testing
software application
software
application
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
FR0756687A
Other languages
English (en)
Other versions
FR2919402A1 (fr
Inventor
Nadine Buard
Florent Miller
Antonin Bougerol
Patrick Heins
Thierry Carriere
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Airbus Operations SAS
Airbus Group SAS
Airbus Defence and Space SAS
Original Assignee
European Aeronautic Defence and Space Company EADS France
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority to FR0756687A priority Critical patent/FR2919402B1/fr
Application filed by European Aeronautic Defence and Space Company EADS France filed Critical European Aeronautic Defence and Space Company EADS France
Priority to US12/669,867 priority patent/US9213614B2/en
Priority to EP08806095A priority patent/EP2181390A1/fr
Priority to PCT/FR2008/051166 priority patent/WO2009013419A1/fr
Priority to CN200880104398A priority patent/CN101784991A/zh
Priority to CA2693991A priority patent/CA2693991C/fr
Priority to BRPI0814646-2A2A priority patent/BRPI0814646A2/pt
Priority to JP2010517457A priority patent/JP5721430B2/ja
Publication of FR2919402A1 publication Critical patent/FR2919402A1/fr
Application granted granted Critical
Publication of FR2919402B1 publication Critical patent/FR2919402B1/fr
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/24—Marginal checking or other specified testing methods not covered by G06F11/26, e.g. race tests
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2836—Fault-finding or characterising
    • G01R31/2849—Environmental or reliability testing, e.g. burn-in or validation tests
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/305—Contactless testing using electron beams
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/308—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation
    • G01R31/311—Contactless testing using non-ionising electromagnetic radiation, e.g. optical radiation of integrated circuits

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
FR0756687A 2007-07-23 2007-07-23 Procede de test d'une application logicielle. Expired - Fee Related FR2919402B1 (fr)

Priority Applications (8)

Application Number Priority Date Filing Date Title
FR0756687A FR2919402B1 (fr) 2007-07-23 2007-07-23 Procede de test d'une application logicielle.
EP08806095A EP2181390A1 (fr) 2007-07-23 2008-06-26 Procédé de test d'une application logicielle
PCT/FR2008/051166 WO2009013419A1 (fr) 2007-07-23 2008-06-26 Procédé de test d'une application logicielle
CN200880104398A CN101784991A (zh) 2007-07-23 2008-06-26 软件应用程序的测试方法
US12/669,867 US9213614B2 (en) 2007-07-23 2008-06-26 Method for testing a software application
CA2693991A CA2693991C (fr) 2007-07-23 2008-06-26 Procede de test d'une application logicielle
BRPI0814646-2A2A BRPI0814646A2 (pt) 2007-07-23 2008-06-26 Processo de teste de um aplicativo de software.
JP2010517457A JP5721430B2 (ja) 2007-07-23 2008-06-26 ソフトウェア・アプリケーションの耐故障性をテストする方法および装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR0756687A FR2919402B1 (fr) 2007-07-23 2007-07-23 Procede de test d'une application logicielle.

Publications (2)

Publication Number Publication Date
FR2919402A1 FR2919402A1 (fr) 2009-01-30
FR2919402B1 true FR2919402B1 (fr) 2009-10-30

Family

ID=39156269

Family Applications (1)

Application Number Title Priority Date Filing Date
FR0756687A Expired - Fee Related FR2919402B1 (fr) 2007-07-23 2007-07-23 Procede de test d'une application logicielle.

Country Status (8)

Country Link
US (1) US9213614B2 (fr)
EP (1) EP2181390A1 (fr)
JP (1) JP5721430B2 (fr)
CN (1) CN101784991A (fr)
BR (1) BRPI0814646A2 (fr)
CA (1) CA2693991C (fr)
FR (1) FR2919402B1 (fr)
WO (1) WO2009013419A1 (fr)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9874870B2 (en) * 2009-08-26 2018-01-23 Fisher-Rosemount Systems, Inc. Methods and apparatus to manage testing of a process control system
EP2428807A3 (fr) * 2010-09-08 2014-10-29 DCG Systems, Inc. Localisation de defauts à l'aide d'absorption de deux photons
US9201096B2 (en) 2010-09-08 2015-12-01 Dcg Systems, Inc. Laser-assisted device alteration using synchronized laser pulses
US10191111B2 (en) 2013-03-24 2019-01-29 Dcg Systems, Inc. Synchronized pulsed LADA for the simultaneous acquisition of timing diagrams and laser-induced upsets
JP6441252B2 (ja) * 2016-03-16 2018-12-19 東芝メモリ株式会社 熱レーザ刺激装置、熱レーザ刺激方法および記録媒体
CN110879623B (zh) * 2019-11-06 2021-04-13 中国空间技术研究院 一种具有校正功能的单粒子试验温度控制装置及温控方法
CN113132521B (zh) * 2021-03-04 2024-04-23 中国电子产品可靠性与环境试验研究所（（工业和信息化部电子第五研究所）（中国赛宝实验室）） 移动终端软故障测试方法和系统

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4786865A (en) * 1986-03-03 1988-11-22 The Boeing Company Method and apparatus for testing integrated circuit susceptibility to cosmic rays
US5270643A (en) * 1990-11-28 1993-12-14 Schlumberger Technologies Pulsed laser photoemission electron-beam probe
JPH05226446A (ja) * 1992-02-17 1993-09-03 Hitachi Ltd 半導体装置のシングルイベント評価装置および方法
US7331043B2 (en) * 2001-06-26 2008-02-12 Sun Microsystems, Inc. Detecting and mitigating soft errors using duplicative instructions
US6967491B2 (en) * 2003-07-11 2005-11-22 Credence Systems Corporation Spatial and temporal selective laser assisted fault localization
US6842021B1 (en) * 2003-11-07 2005-01-11 National Semiconductor Corporation System and method for detecting location of a defective electrical connection within an integrated circuit
GB0406665D0 (en) * 2004-03-25 2004-04-28 Melexis Nv Testing intergrated circuits
US7019311B1 (en) * 2004-03-25 2006-03-28 Sandia Corporation Laser-based irradiation apparatus and methods for monitoring the dose-rate response of semiconductor devices
FR2876188B1 (fr) * 2004-10-01 2007-01-26 Cnes Epic Procede et installation d'analyse d'un circuit integre

Also Published As

Publication number Publication date
EP2181390A1 (fr) 2010-05-05
JP5721430B2 (ja) 2015-05-20
CA2693991A1 (fr) 2009-01-29
FR2919402A1 (fr) 2009-01-30
BRPI0814646A2 (pt) 2015-01-27
US20100280785A1 (en) 2010-11-04
CA2693991C (fr) 2017-07-25
WO2009013419A1 (fr) 2009-01-29
JP2010534331A (ja) 2010-11-04
US9213614B2 (en) 2015-12-15
CN101784991A (zh) 2010-07-21

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Legal Events

Date Code Title Description
TQ Partial transmission of property

Owner name: EUROPEAN AERONAUTIC DEFENCE AND SPACE COMPANY , FR

Effective date: 20140408

Owner name: ASTRIUM SAS, FR

Effective date: 20140408

Owner name: AIRBUS OPERATIONS SAS, FR

Effective date: 20140408

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Effective date: 20240305