FR2863712B1 - Procede et appareil pour mesurer le sautillement - Google Patents

Procede et appareil pour mesurer le sautillement

Info

Publication number
FR2863712B1
FR2863712B1 FR0413117A FR0413117A FR2863712B1 FR 2863712 B1 FR2863712 B1 FR 2863712B1 FR 0413117 A FR0413117 A FR 0413117A FR 0413117 A FR0413117 A FR 0413117A FR 2863712 B1 FR2863712 B1 FR 2863712B1
Authority
FR
France
Prior art keywords
jumping
measuring
measuring jumping
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
FR0413117A
Other languages
English (en)
Other versions
FR2863712A1 (fr
Inventor
Perry M Wyatt
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hewlett Packard Development Co LP
Original Assignee
Hewlett Packard Development Co LP
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hewlett Packard Development Co LP filed Critical Hewlett Packard Development Co LP
Publication of FR2863712A1 publication Critical patent/FR2863712A1/fr
Application granted granted Critical
Publication of FR2863712B1 publication Critical patent/FR2863712B1/fr
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/3193—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault free response
    • G01R31/31937—Timing aspects, e.g. measuring propagation delay
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/26—Measuring noise figure; Measuring signal-to-noise ratio
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31708—Analysis of signal quality
    • G01R31/31709—Jitter measurements; Jitter generators
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31725—Timing aspects, e.g. clock distribution, skew, propagation delay

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Nonlinear Science (AREA)
  • Manipulation Of Pulses (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Stabilization Of Oscillater, Synchronisation, Frequency Synthesizers (AREA)
FR0413117A 2003-12-10 2004-12-09 Procede et appareil pour mesurer le sautillement Expired - Fee Related FR2863712B1 (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US10/732,035 US7002358B2 (en) 2003-12-10 2003-12-10 Method and apparatus for measuring jitter

Publications (2)

Publication Number Publication Date
FR2863712A1 FR2863712A1 (fr) 2005-06-17
FR2863712B1 true FR2863712B1 (fr) 2006-09-01

Family

ID=34620607

Family Applications (1)

Application Number Title Priority Date Filing Date
FR0413117A Expired - Fee Related FR2863712B1 (fr) 2003-12-10 2004-12-09 Procede et appareil pour mesurer le sautillement

Country Status (2)

Country Link
US (1) US7002358B2 (fr)
FR (1) FR2863712B1 (fr)

Families Citing this family (27)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8650470B2 (en) 2003-03-20 2014-02-11 Arm Limited Error recovery within integrated circuit
US8185812B2 (en) * 2003-03-20 2012-05-22 Arm Limited Single event upset error detection within an integrated circuit
JP2005204068A (ja) * 2004-01-15 2005-07-28 Toshiba Corp 半導体装置
US7257756B2 (en) * 2004-03-31 2007-08-14 Intel Corporation Digital frequency synthesis clocked circuits
JP5300174B2 (ja) * 2005-02-14 2013-09-25 株式会社アドバンテスト ジッタ測定装置、ジッタ測定方法、試験装置、及び電子デバイス
JP4528659B2 (ja) * 2005-03-30 2010-08-18 パナソニック株式会社 クロックジッタ算出装置、クロックジッタ算出方法、およびクロックジッタ算出プログラム
US7587640B2 (en) * 2005-09-27 2009-09-08 Agere Systems Inc. Method and apparatus for monitoring and compensating for skew on a high speed parallel bus
US7363178B2 (en) * 2006-05-01 2008-04-22 International Business Machines Corporation Method and apparatus for measuring the relative duty cycle of a clock signal
US7646177B2 (en) * 2006-05-01 2010-01-12 International Business Machines Corporation Design structure for a duty cycle measurement apparatus that operates in a calibration mode and a test mode
US7333905B2 (en) * 2006-05-01 2008-02-19 International Business Machines Corporation Method and apparatus for measuring the duty cycle of a digital signal
US7595675B2 (en) * 2006-05-01 2009-09-29 International Business Machines Corporation Duty cycle measurement method and apparatus that operates in a calibration mode and a test mode
US7420400B2 (en) * 2006-05-01 2008-09-02 International Business Machines Corporation Method and apparatus for on-chip duty cycle measurement
US7330061B2 (en) * 2006-05-01 2008-02-12 International Business Machines Corporation Method and apparatus for correcting the duty cycle of a digital signal
JP4703535B2 (ja) * 2006-10-20 2011-06-15 株式会社東芝 半導体集積回路
KR100837278B1 (ko) * 2007-02-27 2008-06-11 삼성전자주식회사 클럭 스큐 컨트롤러 및 그것을 포함하는 집적 회로
US7881608B2 (en) * 2007-05-10 2011-02-01 Avago Technologies Fiber Ip (Singapore) Pte. Ltd Methods and apparatuses for measuring jitter in a transceiver module
US7991046B2 (en) * 2007-05-18 2011-08-02 Teradyne, Inc. Calibrating jitter
US7904264B2 (en) 2007-11-12 2011-03-08 International Business Machines Corporation Absolute duty cycle measurement
US8032850B2 (en) * 2007-11-12 2011-10-04 International Business Machines Corporation Structure for an absolute duty cycle measurement circuit
US7917318B2 (en) * 2007-11-20 2011-03-29 International Business Machines Corporation Structure for a duty cycle measurement circuit
US7895005B2 (en) * 2007-11-20 2011-02-22 International Business Machines Corporation Duty cycle measurement for various signals throughout an integrated circuit device
US8171386B2 (en) * 2008-03-27 2012-05-01 Arm Limited Single event upset error detection within sequential storage circuitry of an integrated circuit
US8161367B2 (en) * 2008-10-07 2012-04-17 Arm Limited Correction of single event upset error within sequential storage circuitry of an integrated circuit
US8493120B2 (en) 2011-03-10 2013-07-23 Arm Limited Storage circuitry and method with increased resilience to single event upsets
US9255967B2 (en) * 2013-04-11 2016-02-09 Nvidia Corporation System and method for measuring an integrated circuit age
US10248520B2 (en) * 2015-09-25 2019-04-02 Oracle International Corporation High speed functional test vectors in low power test conditions of a digital integrated circuit
US11092648B2 (en) * 2019-04-15 2021-08-17 Grammatech, Inc. Systems and/or methods for anomaly detection and characterization in integrated circuits

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4975634A (en) * 1989-04-07 1990-12-04 General Signal Corporation Jitter measurement device
WO2004077079A1 (fr) * 1993-08-25 2004-09-10 Hitoshi Ujiie Analyseur de gigue
US6092027A (en) * 1995-03-27 2000-07-18 Hitachi Electronics Services Co. Apparatus for detecting and recording a conduction noise, a radiation electromagnetic field noise and a discharge noise
US5719783A (en) * 1996-02-07 1998-02-17 Unisys Corporation Method and apparatus for performing timing analysis on a circuit design
US6075832A (en) * 1997-10-07 2000-06-13 Intel Corporation Method and apparatus for deskewing clock signals
US6400129B1 (en) * 1999-02-16 2002-06-04 Advantest Corporation Apparatus for and method of detecting a delay fault in a phase-locked loop circuit
JP2002071735A (ja) 2000-08-30 2002-03-12 Matsushita Electric Ind Co Ltd 信号検査回路
US6441602B1 (en) * 2000-09-26 2002-08-27 International Business Machines Corporation Method and apparatus for determining phase locked loop jitter
US6850051B2 (en) 2001-03-26 2005-02-01 Mcgill University Timing measurement device using a component-invariant vernier delay line
TW577992B (en) * 2002-05-20 2004-03-01 Mediatek Inc Jitter measuring method and apparatus
GB2393794B (en) * 2002-10-01 2004-11-24 Motorola Inc Module, system and method for testing a phase locked loop
US6822588B1 (en) * 2004-04-15 2004-11-23 Agilent Technologies, Inc. Pulse width modulation systems and methods

Also Published As

Publication number Publication date
US20050127894A1 (en) 2005-06-16
US7002358B2 (en) 2006-02-21
FR2863712A1 (fr) 2005-06-17

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Legal Events

Date Code Title Description
ST Notification of lapse

Effective date: 20081020