FR2693288B1 - Memory including an internal addressing circuit for aging tests. - Google Patents

Memory including an internal addressing circuit for aging tests.

Info

Publication number
FR2693288B1
FR2693288B1 FR9208331A FR9208331A FR2693288B1 FR 2693288 B1 FR2693288 B1 FR 2693288B1 FR 9208331 A FR9208331 A FR 9208331A FR 9208331 A FR9208331 A FR 9208331A FR 2693288 B1 FR2693288 B1 FR 2693288B1
Authority
FR
France
Prior art keywords
memory including
addressing circuit
aging tests
internal addressing
internal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
FR9208331A
Other languages
French (fr)
Other versions
FR2693288A1 (en
Inventor
Patrick Pignon
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
STMicroelectronics SA
Original Assignee
SGS Thomson Microelectronics SA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by SGS Thomson Microelectronics SA filed Critical SGS Thomson Microelectronics SA
Priority to FR9208331A priority Critical patent/FR2693288B1/en
Publication of FR2693288A1 publication Critical patent/FR2693288A1/en
Application granted granted Critical
Publication of FR2693288B1 publication Critical patent/FR2693288B1/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C8/00—Arrangements for selecting an address in a digital store
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C29/18—Address generation devices; Devices for accessing memories, e.g. details of addressing circuits
    • G11C29/20—Address generation devices; Devices for accessing memories, e.g. details of addressing circuits using counters or linear-feedback shift registers [LFSR]
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/50—Marginal testing, e.g. race, voltage or current testing
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C8/00—Arrangements for selecting an address in a digital store
    • G11C8/04—Arrangements for selecting an address in a digital store using a sequential addressing device, e.g. shift register, counter

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Tests Of Electronic Circuits (AREA)
FR9208331A 1992-07-06 1992-07-06 Memory including an internal addressing circuit for aging tests. Expired - Fee Related FR2693288B1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
FR9208331A FR2693288B1 (en) 1992-07-06 1992-07-06 Memory including an internal addressing circuit for aging tests.

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR9208331A FR2693288B1 (en) 1992-07-06 1992-07-06 Memory including an internal addressing circuit for aging tests.

Publications (2)

Publication Number Publication Date
FR2693288A1 FR2693288A1 (en) 1994-01-07
FR2693288B1 true FR2693288B1 (en) 1994-08-26

Family

ID=9431598

Family Applications (1)

Application Number Title Priority Date Filing Date
FR9208331A Expired - Fee Related FR2693288B1 (en) 1992-07-06 1992-07-06 Memory including an internal addressing circuit for aging tests.

Country Status (1)

Country Link
FR (1) FR2693288B1 (en)

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1982000917A1 (en) * 1980-09-08 1982-03-18 Proebsting R Tape burn-in circuit

Also Published As

Publication number Publication date
FR2693288A1 (en) 1994-01-07

Similar Documents

Publication Publication Date Title
FR2704131B1 (en) Sensor device for electrocardiogram.
DE69202948T2 (en) Memory card grounding device.
DE69124791D1 (en) SENSOR ENABLE CIRCUIT FOR DIRECT ACCESS MEMORY
FR2773985B1 (en) DEVICE FOR RECORDING AN ELECTROCARDIOGRAM
DE69019697D1 (en) Repairable memory circuit.
DE3851794D1 (en) Image reading device.
DE69018253T2 (en) IC memory card.
FR2701120B1 (en) Memory test device.
GB9116513D0 (en) Semiconductor memory device having test mode
DE59009559D1 (en) LEVEL MEASURING DEVICE COMPOSIBLE FROM COMPONENTS.
DE69515951T2 (en) Memory card
DE69018563T2 (en) Memory self test.
DE69007628D1 (en) Recording device.
DE69112433D1 (en) MEMORY CARD.
DE69120301T2 (en) Memory tester
DE3852131D1 (en) Memory card.
DE69020764T2 (en) Memory addressing.
DE69513892D1 (en) Memory card
FR2674629B1 (en) LIQUID SAMPLES HEAD.
DE3382017D1 (en) COMPACT FIXED MEMORY WITH REDUCED ACCESS TIME.
DE69022443T2 (en) Image reading device.
DE69022198T2 (en) Memory access method and device.
FR2693288B1 (en) Memory including an internal addressing circuit for aging tests.
FR2708775B1 (en) Test object for cardiology.
DE59002117D1 (en) IMAGE RECORDING DEVICE.

Legal Events

Date Code Title Description
ST Notification of lapse

Effective date: 20060331