FR2690596B1 - Test interface device for electronic card. - Google Patents

Test interface device for electronic card.

Info

Publication number
FR2690596B1
FR2690596B1 FR9205339A FR9205339A FR2690596B1 FR 2690596 B1 FR2690596 B1 FR 2690596B1 FR 9205339 A FR9205339 A FR 9205339A FR 9205339 A FR9205339 A FR 9205339A FR 2690596 B1 FR2690596 B1 FR 2690596B1
Authority
FR
France
Prior art keywords
interface device
electronic card
test interface
test
card
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
FR9205339A
Other languages
French (fr)
Other versions
FR2690596A1 (en
Inventor
Christian Godier
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Individual
Original Assignee
Individual
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Individual filed Critical Individual
Priority to FR9205339A priority Critical patent/FR2690596B1/en
Publication of FR2690596A1 publication Critical patent/FR2690596A1/en
Application granted granted Critical
Publication of FR2690596B1 publication Critical patent/FR2690596B1/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
    • G01R1/07328—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support for testing printed circuit boards

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
FR9205339A 1992-04-24 1992-04-24 Test interface device for electronic card. Expired - Fee Related FR2690596B1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
FR9205339A FR2690596B1 (en) 1992-04-24 1992-04-24 Test interface device for electronic card.

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR9205339A FR2690596B1 (en) 1992-04-24 1992-04-24 Test interface device for electronic card.

Publications (2)

Publication Number Publication Date
FR2690596A1 FR2690596A1 (en) 1993-10-29
FR2690596B1 true FR2690596B1 (en) 1995-04-14

Family

ID=9429410

Family Applications (1)

Application Number Title Priority Date Filing Date
FR9205339A Expired - Fee Related FR2690596B1 (en) 1992-04-24 1992-04-24 Test interface device for electronic card.

Country Status (1)

Country Link
FR (1) FR2690596B1 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2884616B1 (en) * 2005-04-19 2007-08-03 Gestamatic Sarl DEVICE FOR SIMPLIFYING THE TEST INTERFACES FOR AN ELECTRONIC CARD

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2486758A1 (en) * 1980-07-11 1982-01-15 Philips Ind Cale Sa Circuit board component lead test probe matrix - uses tape program to produce two probe supports in which telescopic probes are inserted with intermediate air-seal layer
FR2518358A1 (en) * 1981-12-10 1983-06-17 Everett Charles Inc Vacuum actuated test head having programming plate - has contact probes mounted in base with corresp. plate aligner
FR2570194B1 (en) * 1984-09-13 1986-12-05 Cit Alcatel TEST HEAD FOR EQUIPPED PRINTED CIRCUIT BOARDS
GB8622878D0 (en) * 1986-09-23 1986-10-29 Marconi Instruments Ltd Electrical interface arrangement

Also Published As

Publication number Publication date
FR2690596A1 (en) 1993-10-29

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Legal Events

Date Code Title Description
ST Notification of lapse
DS Decision of the director general to state about an appeal
R1 Appeal
ST Notification of lapse