FR2658933A1 - SYSTEM FOR CONTROLLING THE CONDUCT OF TEST SEQUENCES IN AN INFORMATION PROCESSING APPARATUS. - Google Patents

Abstract

A computer interface is provided for an integrated circuit control system. The interface is used to examine, define and modify particular parameters and criteria for passing or failing bump tests, as well as reviewing, defining and modifying the logical flow of bump tests. Each test is represented graphically by an icon (320, 325, or 365) on a display screen, and the logical flow between bump tests is graphically represented by lines (345) connecting input and output ports ( 330) icons. Logic branching is graphically represented by the existence of separate output ports for pass or fail, for each test icon, the pass port representing the logical path followed if the test passes, and the port of failure representing the logical path followed in the event of a test failure. To modify the logical sequence of the test, you can disconnect and connect the interconnection lines and move the icons using a cursor.

Description

The present invention relates generally to an interface for

  control for an integrated circuit control system More specifically, The preferred embodiment of the present invention relates to a computer interface using graphic symbols, which makes it possible to examine and modify the operating parameters, the success criteria or failure and the logical flow of functional tests to be

  run on an integrated circuit device.

  Conventional integrated circuit control systems have used test parameters and test sequences having an imposed coding Test parameters and the sequence

  tests are previously fixed in the computer code.

  To change the test parameters and the test sequences, you must then output or edit the computer code and be aware of the computer program and the language in which the program was written A known system of this type is the General Control System 550 (Genera L Purpose Test System) manufactured and sold by Digital Test System Group of the company Schlumberger Technologies In this system, all sequences of

  tests are determined by a computer program written in lan-

  Pascal pledge Any modification of the test sequence therefore requires knowledge of the Pascal language and a reprogramming of the

test sequence program.

  While this system is flexible and can be used to control any type of integrated circuit device, its use is limited to programmers with Pascal experience who have been made aware of the details of the test sequence program. It is therefore desirable to develop an interface which makes it possible to examine and generally modify the tests of integrated circuits and the test sequences without

  request knowledge of computer languages and pro-

  grams. In the 5700 series of Board Test Systems, manufactured and distributed by Schlumberger Techno Logies, the test parameters and test sequences are also programmed in computer language, and it

  must rewrite and recompile the program each time a modification

  Fication was made to a test parameter or to the test sequence This system includes a control program flow editor using graphic symbols, which allows a partial definition of the test sequence and the conditions of

  However, this flow editor produces simple-

  source code in response to requests from the user

  Many instructions, such as the instructions

  "If" tructions used for conditional branching, must

  still be defined and inserted by the user himself.

  A newer system, the metering control system

  moires 590 (Memory Test System), manufactured and sold by Memory Test System Group of Schlumberger Technologies, includes a

  interface controlled by a text-type menu, which has a

  cited Limited to modify test parameters and sequences

  tests without requiring programming This system has an inter-

  face controlled by a text-type menu that implements a

  Lement of program in "cascade" of options specially designed for the classification, compared to the speed, of the products of the memories type Typically, a certain number of pass / fail tests

  are performed on an integrated circuit storage device.

  If the device fails one of the tests during the sequence

  primary test, another sequence of tests is then discussed.

  Typically, this other test sequence corresponds to a set

  less demanding requirements and less rapid classification.

  If the piece in question fails one of the tests in the other sequence

  of tests, a series of even less restrictive tests, which

  responds to an even lower speed rating, is addressed

  In this way, each part is checked and classified according to whether it has passed a test in a linear series of tests, or whether it has failed all series. The part can be a When p Laced in a " box "corresponding to The most common test series

  high in speed that it succeeded.

  However, all the test sequences of the 590 system are arranged in a fixed (linear) succession, the logical sequence which goes from a failed sequence to the following sequence is

  limited to a fixed number of entry points, and all modifications

  Sequences must be chosen from a text-type menu system with a Limited outline. This limited interface does not allow general examination and modification of test sequences. Thus, while the 590 system is useful for classifying memory type products according to their speed, it cannot be used for general control

  other types of integrated circuits It is therefore desirable to

  table that is developed an interface which makes it possible to examine and modify in a general way tests of integrated circuits and sequences of tests without requiring the knowledge of Languages of computer or programs In particular, it is desirable

  that an interface be produced which makes it possible to examine and modify

  generally trust the unfolding of a test sequence without

  that computer code should be examined or written.

  According to the invention, a computer interface is proposed.

  Nator for a general type integrated circuit control system, which has an interface and means making it possible to examine, define and modify specific parameters and pass or fail criteria relating to particular categories of tests The interface also offers a specialized programming language using graphic symbols, which makes it possible to examine, define and modify the logical sequence followed between the operational tests Each operational test is graphically represented by a graphic symbol, or icon, on a display terminal and the logical flow, or flow, between the functional tests is represented graphically by lines connecting The icons The

  logical connection between the functional tests is graphi-

  represented by the existence of separate output, success and failure ports starting from each test icon The line connected to the success ports represents The logical path followed if the functional test was successful, and The connected line at the failure port represents The logical path followed if the functional test has been failed A modification of the sequence of

  tests is planned in response to the edition of the gra-

  phique of the test procedure We perform Editing of the representation

  graphical feeling of test progress using a cur-

  graphics processor to move icons and to

  Connect and disconnect The lines connecting the icons Each test of

  operation is also shown, in the con-

  control, by object codes, or data execution codes

  and the sequence of these function tests-

  This is represented by pointers logically connecting the corresponding data execution codes Messages are sent to programs, or routines, belonging to the control system, from the "tools" controlling the user interface. display in order to modify the data execution codes of

  so that they match the test parameters

  ment and to the test sequences defined by the graphical interface.

  The control system then performs the function tests

  in the order of execution, or sequence, defined by the execution codes

cution of data.

  The following description, intended as an illustration of

  the invention aims to give a better understanding of its characteristics and advantages; it is based on the appended drawings, among which: FIG. 1 is an illustration of a work station connected so as to control an integrated circuit control system; Figure 2 is an illustration of the terminal screen

  showing the graphical interfaces of the pro-

  gram "Select" and the control program "Control Tool"; Figure 3 is an illustration of the terminal screen

  showing the interface of the "Flow Tool" program

  ment), which shows in graphical form test icons and logical interconnections defining the selected test program "3901"; FIG. 4 is an illustration of the terminal screen showing the interface of the "Flow Tool" program, which illustrates in graphical form test icons and logical interconnections defining the composite icon of the chosen "Leakage" test ; FIG. 5 is an illustration of the terminal screen showing the interface of the "DC Test Tool" program, which graphically shows specific parameters and success or failure criteria d 'a DC test; FIG. 6 is an illustration of the terminal screen corresponding to the "Functional Test Tool" interface, which shows in graphical form specific parameters and criteria for the success or failure of a function test; FIG. 7 shows the "Timing Tool" interface resulting from the opening of the "Timing Tool" program; FIG. 8 shows the "Levels Tool" interface resulting from the opening of the "Levels Tool" program;

  FIG. 9 is a "Flow Tool" display which illustrates gra-

  phically an existing test sequence and a new test segment, which has not yet been logically linked to the existing test sequence; FIG. 10 is an illustration of the display screen corresponding to the main menu and to the segment menus; FIG. 11 is a "Flow Tool" display which graphically illustrates an existing test sequence and a new test segment, where a port of the new test segment is logically integrated into the existing test sequence; FIG. 12 is a "Flow Tool" display which graphically illustrates a new test segment completely integrated into the existing test sequence; Figure 13 is a block diagram of the architecture of a control system according to the preferred embodiment of the invention; and FIG. 14 is a block diagram illustrating the relationships which exist between the blocks of segments, the definitions

  of segments and data blocks.

  In FIG. 1, the environment of the preferred embodiment of the present invention is represented. In particular, FIG. 1 shows a work station 100 coupled to a keyboard 10 and to a "mouse" with three buttons 120 The work station is further coupled to a computer 130 constituting a control system for

  integrated circuits, which includes programs and data

  finalizing a certain number of functional tests to be executed on an integrated circuit device 140 The integrated circuit control system 130 also includes control equipment 135, intended for carrying out the tests, consisting for example of comparators and of excitation, which equipment is coupled to the integrated circuit device 140 in order to apply signals to it and to receive others in

  response to programs and data Workstation 100 com-

  also carries specific interface tools or aids which cooperate with the programs and data of the computer 130 constituting the integrated circuit control system and which make it possible to examine and modify the operating tests and the sequences. functional test logic, as described in

detailed below.

  In the preferred embodiment, the workstation is a display of graphic symbols having a resolution of approximately one million pixels (or pixels). The preferred embodiment uses a workstation distributed by Sun Microsystems, of Mountain View, California,

  E.U A This workstation and the computer 130 constituting the system

  integrated circuit control systems operate on a Unix operating system and a window graphics processing server

  X Computer programs for the 130 computer

  killing the integrated control system operate under the Unix operating system and the graphics processing system with X windows, which are software belonging to the public domain, originating from MI T. According to the preferred embodiment of the present invention, a menu of software tools is provided, from which the system user can select an item from the menu called "Control Tool" by appropriate manipulation of the mouse 120 or the keyboard 110 The menu item "Control Tool" represents a control program for the control system 130, and

  is described in more detail below.

  SELECTION OF A CONTROL PROGRAM FOR THE EXAMINATION AND

THE EDITION.

  Figure 2 is an illustration of a terminal screen

  showing, in the form of graphic symbols, interfaces of the pro-

  "Select" gram and "Control Tool" command program The "Control Tool" 200 window appears at the bottom of the screen in Figure 2 When the

  right mouse button 120 while cursor 205 is posi-

  tioned on the name 208 "program" (what we can call "actuation of the right button on the name 208", or "selection of the name 208"), we obtain the display of a screen image of the "Select Tool" program and an interface, as shown in window 215 The screen image and the interface

  "Select Tool" allows you to select a specific test program

  specific, as discussed in detail below.

  Reference is made to window 215 Line 220 of window 215 indicates that the source of the listed test programs

  as a list is the system disk The indication "*" pre-

  sente on the line "filter" 225 indicates that all the pro-

  grams of tests are listed (No filter is in use) The line "path" 230 indicates the Unix directory being accessed. The display area 235 illustrates a list of test program files which is of the type which can be scrolled. In the example shown, the test program "3901" appearing on line 240 was previously selected.

  selection of a test program from the file list illus-

  entered in window 235 causes the name of the selected test program to be entered in program area 210 of the

  "Control Tool" window 200 More specifically, in the example shown

  The test program "3901" has been selected and appears in program area 210 The interface now allows the examination and editing of the test program "3901", as discussed below.

  OPENING AND EXAMINATION OF THE TEST PROCEDURE.

  By selecting the focus button 250, you

  obtains the display of a "Flow Tool" screen image

  ment) and an interface, as illustrated in figure 3, which allows

  initiates the review and editing of the test program

  selected, as discussed below.

  Figure 3 is an illustration of the terminal screen

  showing the "Flow Tool" interface, which represents in gra-

  phique of symbols, or icons, of test and logical interconnections defining a selected test program As we

  can see it in figure 3, the test icons and the interconnected

  logical nextions defining the test program "3901" are

  displayed in window 305 The image-screen and inter-

  "Flow Tool" side is used to establish and modify the flow of a

  test program More specifically, the running of a

  gram of tests is defined by a number of segments cons-

  constituting functional tests, represented on the screen by icons, and by logical sequences of the test segments, represented on the screen by success or failure ports, and

lines connecting the icons.

  The starting point for a control program, or pro-

  gram of tests, is defined by a non-operational icon, that is to say not corresponding to an operation, illustrated by the "Begin" icon 310 The "Begin" icon 310 has a

  same aspect for all control programs so as to facilitate

  ter identification of the starting point The first functional test segment of the control program is identified by its

  connection to the "Begin" icon 310 via the interconnection line 315.

  More specifically, a "Continuity" icon 320 is connected to the "Begin" icon 310 via the line

interconnection 315.

  The whole screen and interface corresponding to the

  the control program is further defined by certain

  some interface and display conventions If we refer to the "Begin" icon 310, the "Continuity" icon 320 and the interconnection line 315 in more detail, we observe that the "Begin" icon 310 has, on its right side, a single square called port This port indicates normal traffic from the icon

  "Begin" 310, and the execution or execution of the con-

  trôle is carried out as indicated, via the connection line (green in The preferred embodiment) to a port located on the left side of the icon "Continuity" 320, which indicates the starting point of the icon "Continuity" 320 In the embodiment

  preferred, The ports located to the right and left of the icons represent

  both test segments are blue, green or red The input ports are blue and are usually on the left side The output ports are usually on The right side of the test segments There are two types of output ports One port green output indicates that, if the test segment associated with this icon has been satisfied, program execution will continue to the test segment represented by the icon which is connected to this port of

  output Red output ports, usually appearing above

  below the success output port, or on the lower part of the icon, indicate that, if the test associated with this icon has failed, program execution will continue towards the segment of

  test represented by the icon which is connected to this output port.

  In addition, multiple output ports can be defined in the-

  which the sequence following a functional test can logically connect as a result of the measurement of a

output value.

  The "Continuity" icon 320 represents a continuity test segment which has particular pass or failure criteria. If the continuity test segment is satisfied, the program runs from port 322 located on the right side from the "Continuity" icon to a test segment represented by an icon connected to port 322 P Read especially, if the continuity test segment has been satisfied, the program switches to a test segment represented by the test icon "Leakage"

  325 If the continuity test segment is not successful, the pro-

  gram passes from port 330 of the "Continuity" icon 320 to the "Stop" icon 340 The "Stop" icon 340 is connected to port 330 of the "Continuity" icon 320 by the interconnection line 345 The "Stop" icon 340, like the "Begin" icon 310, has an identical appearance for all control programs in order to facilitate

  identifying the end point of all programs.

  Typically, control programs often contain

  wind more test segments than the one

  can easily represent at one time on a large display

  phique In order to be able to give an overview of the progress of a control program, the present invention uses the concept of composite segments and composite icons. A composite icon is an icon which represents a certain number of logically interconnected test segments. The "Leakage" 325 test icon is an example of a composite icon, which represents a number of logically interconnected test segments,

  as discussed more fully below.

  The screen and interface set "Flow Tool" allows to open a composite icon, to examine it and to modify it. Selecting the composite icon of the leak test 325 allows

  examine and modify test segments and interconnect

  nions represented by the 325 icon of the leak test Plus

  cialement, by selecting the composite icon "Leakage" 325, one obtains a screen image such as that represented on The

figure 4.

  Figure 4 is an illustration of a terminal screen

  showing the program interface "Flow Tool" which illustrates graphi-

  only test icons and interconnections defining the composite icon 325 of the selected leakage test As can be seen in FIG. 4, the graphical display appearing in the

  window 405 shows that the "Leakage" 325 composite icon is

  killed by two interconnected test segments More specifically, the ports 350, 355 and 360 of the composite icon "Leakage" 325, represented in FIG. 3, correspond respectively to

  references 410, 415 and 420 in FIG. 4.

  The composite test icon 325 includes two segments, The test segment 425 and The test segment 430 In the case o The two test segments corresponding to the test icons 425 and 430 were successful, The program continues to run at from Reference 410, enters port 435 of test icon 425, satisfies the test segment corresponding to test icon 425, exits from test icon 425 through port 440, enters test icon 430 via port 445, satisfies the test segment represented by the test icon 430, and leaves the test icon 430 by port 450 which is coupled to the reference 420 if any of these test segments is not passed, program progress

  leads from the icon representing The failed test segment to the ref-

rence 415.

  The screen and interface assembly "F Low Too L" i L Gloss in FIG. 4 also includes a certain number of other options, which are glossed in the viewing area 455 For example, the selection of the button " pop display "

  upward direction) 460 gives rise to the display of the pre-screen image

  In this example, this would be the display of the pro-

  gram of tests "3901", as shown in FIG. 3.

  The preferred embodiment also provides a mechanism for

  interface interface, referred to as "icons"

  In general, composite segments provide an interface mechanism allowing the user to condense, from a logical point of view, the graphic representation of several

  icons representing a sequence of tests when desired.

  More specifically, two or more interconnected icons can

  be combined by application of an appropriate user message

  to be displayed graphically as a composite icon The resulting "F Low Too L" screen image will not represent

  while the interconnection lines existing between the icon com-

  posite and Icons not belonging to the composite icon and will not represent the lines interconnecting The icons contained

  in the composite icon The icons and their lines of interconnection

  nexion which constitute a composite icon can be displayed by "selection" of the composite icon In addition, the elements of a composite segment can themselves be composite segments,

  that is, composite segments can be "nested".

  This provides a lot of flexibility by allowing the user to

  produce multiple views of the test sequence at different levels

  o The use of composite segments allows the representation

  graphic feeling of remaining concise and adapted to the goals of the user

reader at the time of the examination.

  MODIFICATION OF TEST SEGMENT DATA

  Typically, the goal that should be achieved first in a monitoring program is that it is ensured that the monitoring system

  control is in good electrical contact with the device

  therefore, a direct current test of the conti-

  nuity is often the first test carried out in a control program. We again refer to FIG. 3, where we see that the test icon 320 represents the particular case of a DC test segment. The relationships between this current test

  continuous and the other operational tests of the con-

  "3901" test are defined by the screen images appearing in FIGS. 3 and 4 The particular parameters and the criteria for success or failure of any DC test are established by a program interface "DC Test Tool "(test tool

  direct current) shown in Figure 5 More particular-

  ment, the parameters displayed on FIG. 5 correspond in a particular way to a certain DC test segment,

  namely the one that corresponds to the current test icon

tinu 320.

  The screen image in FIG. 5 is obtained by selecting the test icon 320 in FIG. 3 The line 505 indicates that it is the display of the "dctool" (direct current tool), which produces the "DC Test Tool" program interface The name of the particular DC test segment that is displayed, ie "Continuity", is indicated in the "DC" (DC) area appearing on the line 510 This name also appears on the corresponding icon 320 in Figure 3 (It appears in truncated form due to the size chosen for the characters) The parameters "TIME" (time) and "DATE" (date) appearing at the line 510 indicate when this particular test was modified

  for the last time The "Block Status" area appears

  falling on line 515 indicates all the variations of the current values of the test compared to those stored on the disk.

  Immediately below are a number of areas that offer classic test options: "Test Method", "Measure Device", "Delay", "Voltage Connect "(voltage connection)," Clamp Hi, Lo "

  (lock up, down), "Mask", and "Result".

  These zones allow the selection of the operating parameters of a certain number of conventional options associated with the tests of

direct current.

  In the display area 520 in FIG. 5, columns appear entitled "Pinset" (group of pins), "Start" (start), "Stop" (stop) and "Ifail" (fault current) L ' display area 520 is used to specify which groups of predefined pins

  of the integrated circuit must be checked in this test segment.

  In the present example, a group of pins comprising all the pins ("al pins") has been selected Consequently, this test sequence will sequentially check all the pins of the integrated circuit under test, based on the parameters

following.

  Display area 530 includes an interface device known as a vertically sliding element, which is used to display and modify the value of an imposition function (imposed load) to be applied to the circuit device integrated which is the subject of the test This can be a voltage or a current, depending on the selection made using an appropriate user input message The amplitude of the applied load is defined at each spindle by pressing the button

  middle of the mouse while the cursor is on the sliding element

  sant 535, by moving the sliding element vertically

  by holding down the mouse button, and releasing

  sing the mouse button when the sliding element is at the level of the desired amplitude The vertically sliding element

  also displays the exact amplitude on its surface.

  Three additional vertically sliding elements are grouped together They include the element "High Limit" (upper limit) 540, the element "Sense" (detection) 550 and the element "Low Limit" (lower limit) 560 The parameters set by the upper limit element 540 and the lower limit element 560 establish the success or failure criterion for this DC test. More specifically, as shown, no upper limit is imposed. This gives what is called a "single terminal" test A lower limit voltage of less

  a volt (1 V) is defined by the lower limit element 560.

  Thus, if the voltage on any spindle is greater than minus one volt, the test is successful The detection element 550 illustrates in green the success band (1 to OV), and in red the failure band (less than - 1 V and above OV) In addition, actual test results, as shown at a breakpoint, may

  be displayed in the vertically sliding "Sense" 550.

  The display area "Measure" 570 is a list

  which can be scrolled to select particular pins

  The actual test values for selected pins

  are displayed in display area 550.

  Display area 575, which appears in the upper corner

  right laughter of figure 5, displays particular tools and

  particular data that can define preconditions

  required to fully define a DC test The preconditioning parameters define the input signals applied to the integrated circuit tested before

its execution.

  After examining and changing the test segment

  have been completed, the selection of the nomi-

  nale 505 causes the display of a descent menu which allows the selection of a closing option The closing option allows the closing of the "DC Test Tool" program interface The closing

  DC test tool L brings interface to image-

  "F Low Too L" screen, an example of which has been illustrated in FIG. 3.

  Another test segment is represented by the

  "Gross Function" test 365 of Figure 3 Opening

  ture of the test icon 365 product The display of the "Functiona L Test" tool which is represented in FIG. 6 The operational tests as defined by the "Functional Test" tool are generally primary tasks performed by high speed integrated circuit control equipment The display area 605, located at the top of the panel,

  The "Functional Test" tool allows you to modify the name of the function test.

  "grossfun OO 6" displayed in the "Ftest" area on Line 610.

  Display areas 615 and 625, located at the bottom of the panel

  level of the image-screen assembly and interface of the "Functional-" tool

  Test ", provide other areas defining a function test-

  More specifically, this test definition is presented in a highly modularized form and combines definitions and parameters from data included in the data blocks.

  defined by various zones For example, synchronization parameters

  nisation used for the application of input stimuli into the device and used to measure the output signals of the device

  the subject of the test are defined in the b Loc of identical data

  in the area called "Timing" on line 620 The "Timing" area, the "Levels" area (levels), The "Code" area (code) and the "Open Pins" areas (open circuit pins) ) are active and you can "open" them to produce the graphic display of a particular tool which will allow you to view and modify the data block defining this particular aspect of the test. Similarly, a list of configurations can be specified. using the "Vector" area on line 635 Start and stop points can be defined if the whole configuration does not

  must not be executed, and a mask can be defined if certain

  some values should not be sampled.

  tions, which are binary sequences relating to each input and output pin, are defined by a special tool

  provided for this function, the "Vector" tool.

* Figure 7 shows the "Timing Tool" interface which results from opening the "Timing Tool" program. As indicated, the data correspond to the data execution code "grossfunc TIM 006" indicated in the "Timing" zone on line 620 of FIG. 6 The upper panel 710 contains a "Timing" zone on line 715, which defines The data execution code corresponding to this display Line 716 comprises a "PINDEF TABLE" zone (pin definition table), which lists the data execution codes defining the device pins selected for testing. The display area 720 generally illustrates a diagram of the oscilloscope type defining various waveforms of signals. With this tool, the synchronization of the level transitions can be modified by "dragging" the sides of the waveforms. one position to another More specifically, the transitions, by

  example the transition from a low level to a high level 725, corresponds to

  lay in an active area containing the display of the transition.

  By pressing the middle mouse button while the cursor is

  in this active area, you can "drag" the tran-

  position to a new position corresponding to a new instant, and reposition it at this new instant by releasing the

mouse button.

  On the right side of display area 730, there are two push buttons 735 and 740. Selecting the "TEST" push button 735 immediately loads the current conditions defined by the "Timing Tool" interface into the equipment. hardware running the test, have the test run and bring back a

  success or failure result This allows you to quickly

  a device using new test parameters By selecting the "CHECK" 740 push button, we check

  the existence of violation of constraints of the test equipment.

  The left column 745 of display area 720, entitled

  "PINDEF" (definition of pins), contains pins available

  tinctures or groups of pins (called "pinsets") of the device

  with integrated circuit under test For example, the

  miers articles "a" and "b" in column 745 each represent four-bit buses defined by the "Pin Def" interface (definition

some pins).

  Column 750 is called "SEQUENCE NAME"

  quence) Column 750 of the sequence names contains the names assigned by the user to define the associated waveform displayed horizontally on the right in the display area "WAVEFORM

  DESCRIPTION "(description of waveforms) 755.

  Precise synchronization and presentation elements

  Seeds in the "Timing Tool" interface therefore define, when combined with sequences of "1" and "O" and levels defined by other tools, the waveforms to be applied or subjected to the test The fact that these definitions are separate makes it possible to vary them independently This makes it possible to use a group of synchronization parameters on several different groups of levels, or to use a group of levels with

  several different synchronization groups.

  Regarding the article of "PINDEF" entitled "y" in column 745, we note that two different waveforms

  are associated The waveform of line 760 illustrates a sample

  tillon 765 A sample corresponds to the time of a test carried out on pin "y" when the output signal of the device is sampled and compared according to a particular criterion of success or failure In the preferred embodiment, the sample 765 is visualized as a small region with green at the top and bottom and red at the bottom

  mean to indicate that it represents a particular combination

  link of "1" and "O" forming an output signal on pin "y" More specifically, the success criterion is high or low, and

  not between the two defined amplitudes.

  In the "Timing Tool" screen, synchronization is entirely defined in the form of "O" and "1" configurations.

  defined by a configuration tool The particular synchronization

  lier of each transition "O" or "1" is defined with respect to

  "TO" "TO" is the start of a test vector So the "TO" follows

  vant is the end of the first test vector and the start of the next test vector Generally, by applying a group of 1-0 to a pin and checking, at a certain later moment, the signal of this pin, or of a other pin, we define a "test vector". We open the "Levels Tool" program in the same way as the "Timing Tool" program. More specifically, activating the left button while the cursor is on the "Levels =" area (levels =), at the line 130 of figure 6, opens the program

  "Levels Tool" Figure 8 illustrates the image-screen and inter-

  face "Levels Tool", which is obtained by opening the program

"Levels Tool".

  As can be seen in Figure 8, a "Level Block" area appearing on line 105 indicates the particular code of data execution that must be examined. A display area 820, which is can scroll, displays the

  groups of spindles that have defined levels Selecting

  operating a group of pins on display area 820 causes

  the graphical display of the level parameters in the display area

  chage 830 A group of vertically sliding elements 840, 850, 860, 870 and 880 makes it possible to define the amplitudes taken for HIV

  (high input voltage), VIL (low input voltage), VOH (ten-

  high output sion), VOL (low output voltage), and Vref (reference voltage) The column headings are "Pinsets"

  (groups of pins), then HIV, VIL, VOH, VOL and Vref.

  The display area 890 consists of two elements

  vertically sliding which define the programmable load.

  IOH (high output current) and IOL (low output current) are

the current parameters.

  Returning to the “Timing Tool” screen image, represented in FIG. 7, it is noted that the various elements of “PINDEF” are defined in terms of “O” and “1”. The quantitative values of these voltages are not specified by the "Timing Tool" program On the contrary, the actual voltage levels of these input pins are defined by the "Levels Tool" program At any time, each input pin can be excited at a high level or low So,

  each defined input pin will receive a function data bit-

  on the part of the test vector An excitation device, in the material sense, of the control device excites each input pin to the value HIV or VIL defined for this pin on the

basis of this data.

  VOH and VOL are the comparison levels of the output pins A level "1" corresponds to a value higher than VOH A level "O" corresponds to a level lower than VOL The levels of

  output are determined by comparators arranged in the team-

  ment and coupled respectively to the defined output pins.

  MODIFICATION OF THE SEQUENCE (PROCEDURE) OF THE TEST SEGMENTS.

  In addition to being able to examine and modify the parameters of an existing test segment, we can also modify the succession

  test segment logic An example is given by the introduction

  tion of a new test segment in an existing sequence of a control program Figure 9 is a screen image "Flow Tool", which graphically illustrates an existing test sequence and a new test segment 910, which has not yet been logically linked to the existing test sequence The new test segment 910 is created and connected in the sequence

test as described below.

  Activating the right mouse button while

  the cursor is in the background area 920 constituting the useless part

  of the screen image has the effect of bringing up the display of a main menu, as shown in FIG. 10 The first article

  from the main menu is "segments" (selecting)

  The segment option produces a 1010 segment menu. The 1010 segment menu displays a group of choices for the different types of test segments. The first choice, at line 1020, is "Functional Test" By selecting "Functional Test", we provoke

  the display of a new "Functional Test" 910 icon in the image-

  screen of the unwinding tool represented in FIG. 9 At this time, the icon has no interconnection with the control program, nor associated data defining the test segment. The relative success or failure criterion can be introduced. to this new test segment by selecting the test icon 910, which leads to the screen and interface set of the tool "Functional Test" which has been described above in relation to FIG. 6 The tool "Functional Test "product The interface used to define the function test associated with the icon newly

created 910.

  We refer to Figure 9 The integration of the "Functional Test" icon 910 in the test sequence is carried out as follows Port 330 of the continuity test icon 320

  is, at this moment, connected to the stop icon 340.

  cer The left button on port 310 cuts this connection, causing the left end of the 345 connection line to move with the cursor. This effectively allows the user to "capture and keep" the end of the line. connection 345 which was previously connected to port 330 Releasing The left button causes connection line 345 to "retract" into the stop icon 340 in a way that visually reminds the

  retraction of the power supply cord of a vacuum cleaner.

  Pressing the button on port 330 of the continuity test icon 320 means that a new Connection Line is

  extracted from port 330 One end of this new line of con-

  nexion is attached to port 330 and the other end is attached to the cursor You can move the end of the connection line attached to the cursor so as to bring it in the immediate vicinity of another port, for example port 330 of the test icon 910, after which we release it When we release the end of the connection line in the immediate vicinity of a port, it connects automatically, which defines a new sequence of test sequences More specially, if the parameters for success or failure of the continuity test 320 are not satisfied, then, instead of the test sequence stopping, the functional test

  corresponding to the test icon 910 is executed.

  The new Connection Line 1110 is illustrated on the

figure 11.

  Similarly, another Connection Line 1120 can be drawn, using the cursor, from port 1130 of the test icon 910 to port 1140 of the icon "power" 1150, by releasing the end, controlled by the cursor, of the Connection line 1120 in the immediate vicinity of port 1140 of the "Power" icon 1150 Finally, The connection of port 1160 of the test segment 910 can be established with the port of the "Stop" icon

(stop) 340.

  Figure 12 shows the new 910 test icon

  fully connected, which includes a new line of con-

  nexion 1210 between port 1160 of the test icon 910 and port 1220 of the stop icon 340 In this new sequence, if the

  continuity test which is represented by Icon 320 is satisfied

  done, the test sequence goes to the leak test segment shown

  felt by the "Leakage" icon 325 In the event that the conti-

  night is not satisfied, the test sequence goes to the test segment represented by the icon 910 In the case o The test segment represented by the test icon 910 is satisfied, the sequence of

  tests switches to a power supply test segment shown

  felt by the "Power" icon 1150 and "jumps" The leak test shown

  sensed by the "Leakage" icon 325 In the case where the test segment represented by the test icon 910 is not satisfied, the test sequence goes to the "Stop" icon 340 and stops From this way, you can create a new test segment and introduce it into an existing test program sequence.

  possible to modify The sequence of an existing test sequence

  aunt, or create a new test sequence.

  OTHER TOOLS AND CONVENTIONS RELATING TO THE MOUSE.

  In the different tools, the pins found on the device under test are designated by logical names, and not by pin numbers. For example, logical names, called "Pindefs", are used by the interface " DC Too L "which is illustrated in Window 520 of Figure 5 A" Pindef "program

  (pin definition) provides a graphical interface (not illus-

  ) to define pin names in a specific relationship

  with the pin numbers.

  The three-button mouse that is used to control the cursor is the device for pointing, capturing, dragging and selecting. The right mouse button is used to bring up menus according to the context. Thus, a menu that is specific to the object pointed by the cursor will appear when the right button is pressed Many tools have a "main menu tool" which appears when the right button is pressed on any unused area of the background The middle button

  used to shoot, move or pan On accom-

  fold this by placing the cursor on the object to be moved, pressing the middle button, moving the cursor to the desired position and releasing the middle button The left button is used to

  make a capture, a selection, a choice or to activate.

THE CONTROL SYSTEM.

  Workstation 100 interface tools and computer programs and data from the workstation system

  130 constitute a control program of the "result-

  as "non-specialized Each functional test is represented graphically on the workstation 100 by an icon The order of succession of these functional tests is indicated by the

  graphic interconnections of icons Each function test

  ment is also represented by corresponding data execution codes of the control system, and the succession of these functional tests is represented by pointers logically connecting the corresponding data execution codes, such as

  described more fully below.

  The architecture of the computer of the control system 130 is illustrated in FIG. 13 The work station 100 is coupled to a keyboard 110 and to a mouse 120 and comprises interface tools 1305 which control the display device 1310 and respond to operations applied to the keyboard 110 and the mouse 120 Messages are sent from the interface tools 1305 to tool interface programs 1315 included in the computer 130 of the control system in order to modify the codes execution

  control system data to match the

  meters of the functional tests and the test sequences

  defined by the interfaces appearing on the screen 1310 Measurements

  wise men are also sent to initiate actions by

  particular, for example to a message asking to "execute" a test, and data and test results can be sent to the workstation 100 by the computer 130 of the control system

to be displayed there.

  In the preferred embodiment, the inter-

  face 1305 include a standardized hardware and software package of

  graphic processing with X windows and specific interface tools

  such as the Flow Tool program and other programs

  mes described above 1305 interface tools define icons and icon sequences in the form of icon names

  can be defined by the user, such as "Conti-

  nuity "So when a message is sent to inter-

  tool face 1315 of computer 130 of the control system in response to the creation, modification or reconnection of a

  icon, the message is given in terms of icon name.

  Also according to the preferred embodiment of the invention, the tool interface programs 1315 interpret the messages relating to the icons by means of a binary table 1320 used to translate the names of icons into addresses of the blocks of segments. correspondents contained in the memory of the control system computer Tool interface programs 1315 then examine or modify the data execution codes

  correspondents in response to messages So when the user

  move a line interconnecting icons using the pro-

  "Flow Tool" gram, the names of the icons considered are sought in the binary table 1320 so that the addresses of the corresponding segment blocks are determined. The tool interface programs 1315 then modify the appropriate pointers so that they correspond to the new sequence defined by the new position of the interconnection line These data execution codes and their relationships with the icons of the interface and

  other data execution codes are discussed more fully-

below.

  1315 tool interface programs interpret and

  also implement instructions such as "execute-

  tion "For example, tool interface programs 1315 call-

  slow an execution program placed in the control execution programs 1325 in response to an "execution" instruction coming from the interface tools 1305, for example by selecting the "Execute" button of the area 505 of the "Functional Test" interface shown in FIG. 6 In addition, the tool interface programs 1315 transmit data messages to the workstation 100 with a view to their display in graphical form.

  example, in the preferred embodiment, the lines of intersection

  connection turn white when it is a question of representing the actual test sequence during the execution of the tests In addition, the edges of the icons corresponding to the tests executed change from

  color to indicate whether the tests have been passed or not related

  the criteria imposed for the respective tests.

  Each functional test is mainly defined by three distinct types of data execution codes. First, one or more blocks of test parameter data, for example data block 1330, define operational parameters for each test. The data blocks do not contain any code or sequence information

  executable, but are specifically intended for defined data-

  the parameters of a specific test Typically, these para-

  operating meters are defined, examined and modified according to elements introduced in the corresponding tools For example, modifications of a DC test would be obtained by applying messages to the "DC Test Tool" program (described above in in relation to FIG. 5), modifications to a functional test would be obtained by applying messages to the "Functional Test" tool (described above in relation to FIG. 6), and modifications to the synchronization of a

  defined test would be obtained by applying messages to the pro-

  gram "Timing Tool" (described above in relation to the

figure 7).

  Data blocks can be modified in two ways First, you can select a different block For example, the block "grossfunc TIM 006" of the line "Timing" (figure 7) can be replaced by a different block by selection of a data block in the image-screen and "Select Tool" interface illustrated in FIG. 1 More specifically, by pressing the right button while the cursor is on a zone designation, for example the "Timing" designation 618 on line 620, we produce a menu allowing to select a different data block to define the synchronization Otherwise, we can modify parameters

  specific within a selected data block

  tiated using the tool of the image-screen assembly and appropriate interface More specifically, by activating the left button while the cursor is on the area of the data block, we "open"

  the tool corresponding to the selected attribute.

  A second type of data execution code is a segment block. An example is illustrated in FIG. 13 under the

  form of segment block 1335 The third type of execution code

  Data tion is a segment definition, an example of which is represented by the segment definition 1340 in Figure 13 The segment blocks and segment definitions define together

  the logical sequences of the functional tests which are available

available at run time.

  The segment blocks and the segment definitions can be explained more fully in relation to FIG. 14 As illustrated, the segment block 1335 is a code

  execution of data having a certain number of positions.

  For example, the position "name" contains the name of the corresponding icon.

  of the image screen 1310 The "type" position identifies the

  type of the object, namely "segment", which constitutes the block of seg-

  ment The position "other type" identifies which type of test is pointed, namely "the DC test" Other positions

  indicate how other sequences are made available (the-

  which correspond to the number of output ports present on the graphic display) and the specific address of the segment definition 1340 which contains the addresses of other segment blocks 1410 and 1420 which define The other functional tests available after the execution of the DC test defined by the segment block 1325 at the time of execution In this example, the segment blocks 1325, 1410 and 1420 correspond to the icons 320, 425 and 340 of FIGS. 3 and 4 (The composite icons are primarily an interface mechanism of workstation interface tools 1305 100, although they are represented in computer 130 of the control system by runtime codes

corresponding data).

  Returning to FIG. 13 The computer 130 of the control system preferably contains test execution programs 1325 written in the programming language C The test execution programs 1325 constitute a support library

  execution of predefined processes that execute the blocks of seg-

  The segment definitions and the data blocks which constitute an interface vis-à-vis the control equipment 135 for the execution of the control sequence corresponding to the graphic representation present on the screen image in response to messages received from the 1315 tool interface programs For example, in response to a message requesting execution of a test, 1315 tool interface programs identify the test to be executed at the using a specific address and call the test execution programs 1325 The execution programs of

  test then constitute the interface with the appropriate segment blocks

  requests, segment definitions, data blocks, and control equipment 135 For example, in response to a message asking to run a DC test, the test execution programs read from the addressed segment block perform

  an execution program suitable for running a test of

  continuous, read The parameters of the data block defining the DC test, excite the control equipment 135 as a function of these test parameters, compare the test results received from the control equipment 135 with the success or failure parameters contained in the data block, and continue the logical sequence until the next segment block

  of the test sequence in response to the Logic content of the definition

corresponding segment tion.

  The control equipment 135 includes devices

  which are coupled to the device under test and used

  wind to apply defined input signals to the integrated circuit under test, as well as comparators used to compare the output signals of the device under test with programmable levels When a test is running, The data received The share of control equipment is compared with

  the parameters for success and failure, and The results are emma-

  stored in an area of raw data These data can be accessed using 1315 tool interface programs, and these are sent as a message to the workstation

  100 to be displayed on screen 1310.

  Of course, the skilled person will be able to imagine,

  from the system whose description has just been given as

  merely illustrative and non-limiting. various variants

  and modifications outside the scope of the invention.

Claims (8)

  1 Control system for submitting a provision   sitive to a logical sequence of functional tests, where the   sequence is defined by a graphical interface, the system com-   carrying display means, means for applying signals to the device; means for receiving signals from the device; means for processing the signals received from the device, and means for defining the parameters of the function tests, which include signals to be applied   to the device and the signals to be received from the device   positive, the system being characterized in that it further comprises: means (305) for graphically representing on the display means (1310) a sequence of functional tests; a data structure (1330) defining a sequence of functional tests; means (1305) for manipulating the data structure (1330) to match the displayed sequence; and means (130) for controlling the system to perform the function tests contained in the   sequence defined by the data structure.   2 control system according to claim 1, charac-   characterized in that it further comprises means (1315) for modifying the sequence graphically represented on the display means (1310), in that said manipulation means modifies the data structure (1330) to establish the correspondence with the displayed sequence, and in that said control means does   the control equipment is executing the modified sequence.   3 control system according to claim 1, charac-   terized in that the data structure includes a number of independent data execution codes (1330) which can be arbitrarily interconnected to define a sequence functional tests.   4 Control system according to claim 3, charac-   terized in that the sequence information which is relative to   each function test is represented by an execution code separate data tion.   Control system for subjecting a device to a logical sequence of functional tests, where the   sequence is defined by a graphical interface, the system com-   carrying means for applying signals to the device, means for receiving signals from the device, means for processing signals received from the device,   a means for defining parameters of the functional tests   which comprise the signals to be applied to the device and the signals to be received from the device, and means for examining and modifying the parameters, the system further comprising a graphical interface for examining and modifying the logical sequence of the tests of operation, characterized in that the interface comprises:   graphic display means (1310) having a cur-   sor (205) and an input device (110, 120) for controlling the position of the cursor on the graphic display means; means (305) for producing a graphical representation of each functional test on the graphical display means (1310); a separate data execution code corresponding to   each function test, the data execution code includes   bearing pointers intended to point to execution codes   tion of data corresponding to other sequential functional tests; means for graphically representing the address of each functional test in association with the corresponding graphical icon; means serving to graphically interconnect, using lines (1110, 1120, 1210), icons (310, 320, 325, 910) being on the display means, the lines corresponding to the possible paths of the sequence test;   a data means that responds to the means used to connect   graphically ter icons (310, 320, 325, 910) present on the display means (1310) by defining the corresponding pointers in the data execution codes so that the other possible sequential functional tests defined by the codes data execution correspond to the possible paths of the graphically displayed test sequence; and control means (135) coupled to the device (140) and serving to execute the logical sequence of functional tests from the possible test sequences, in response to signals received from the device (140) and to data execution codes.   6 System according to claim 5, characterized in that said means (120) for graphically interconnecting icons further comprises means for modifying the interconnections between icons and in that said data means modifies the data execution codes of way they   correspond to the graphic representation.   7 System according to claim 6, characterized in that it further comprises an input means (120) used to disconnect the lines between icons and to draw new lines between icons, these two operations being carried out under cursor control.   8 System according to claim 7, characterized in that it further comprises a certain number of predefined function test types, each type of function test being represented graphically on the display means (1310) by a common icon ( 325), each type of functional test also being represented by a corresponding class of data execution codes, and each specific functional test   being represented by an element of this class.   9 System according to claim 5, characterized in that said means (305) for producing a graphical representation further comprises means for representing groups of functional tests in the form of an icon single (325).