EP4130652A4 - Measurement device, measurement method, and program - Google Patents

Measurement device, measurement method, and program Download PDF

Info

Publication number
EP4130652A4
EP4130652A4 EP21778884.3A EP21778884A EP4130652A4 EP 4130652 A4 EP4130652 A4 EP 4130652A4 EP 21778884 A EP21778884 A EP 21778884A EP 4130652 A4 EP4130652 A4 EP 4130652A4
Authority
EP
European Patent Office
Prior art keywords
measurement
program
measurement device
measurement method
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
EP21778884.3A
Other languages
German (de)
French (fr)
Other versions
EP4130652A1 (en
Inventor
Yosuke Muraki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
XTIA Ltd
Original Assignee
XTIA Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by XTIA Ltd filed Critical XTIA Ltd
Publication of EP4130652A1 publication Critical patent/EP4130652A1/en
Publication of EP4130652A4 publication Critical patent/EP4130652A4/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/26—Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
EP21778884.3A 2020-04-03 2021-02-16 Measurement device, measurement method, and program Pending EP4130652A4 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2020067655 2020-04-03
PCT/JP2021/005742 WO2021199744A1 (en) 2020-04-03 2021-02-16 Measurement device, measurement method, and program

Publications (2)

Publication Number Publication Date
EP4130652A1 EP4130652A1 (en) 2023-02-08
EP4130652A4 true EP4130652A4 (en) 2023-10-04

Family

ID=77930258

Family Applications (1)

Application Number Title Priority Date Filing Date
EP21778884.3A Pending EP4130652A4 (en) 2020-04-03 2021-02-16 Measurement device, measurement method, and program

Country Status (5)

Country Link
US (1) US20230107896A1 (en)
EP (1) EP4130652A4 (en)
JP (1) JPWO2021199744A1 (en)
CN (1) CN115335657A (en)
WO (1) WO2021199744A1 (en)

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003202213A (en) * 2001-10-29 2003-07-18 Mitsutoyo Corp Attitude detecting sensor, acceleration sensor and moving path measuring device using the same
US20070081168A1 (en) * 2005-08-23 2007-04-12 University Of Washington - Uw Techtransfer Distance determination in a scanned beam image capture device

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH05231832A (en) 1992-02-24 1993-09-07 I N R Kenkyusho:Kk Method and device for measuring three-dimensional shape
US7023536B2 (en) * 2004-03-08 2006-04-04 Electronic Scripting Products, Inc. Apparatus and method for determining orientation parameters of an elongate object
JP2009186404A (en) * 2008-02-08 2009-08-20 Dainippon Screen Mfg Co Ltd Image information creating device and image information creating method
JP2014126381A (en) * 2012-12-25 2014-07-07 Nikon Corp Shape measurement device, structure fabrication system, shape measurement method, structure fabrication method and shape measurement program

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003202213A (en) * 2001-10-29 2003-07-18 Mitsutoyo Corp Attitude detecting sensor, acceleration sensor and moving path measuring device using the same
US20070081168A1 (en) * 2005-08-23 2007-04-12 University Of Washington - Uw Techtransfer Distance determination in a scanned beam image capture device

Also Published As

Publication number Publication date
WO2021199744A1 (en) 2021-10-07
EP4130652A1 (en) 2023-02-08
CN115335657A (en) 2022-11-11
US20230107896A1 (en) 2023-04-06
JPWO2021199744A1 (en) 2021-10-07

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