EP2733459A1 - Device and method for determining the relative positions of two coupled shafts to each other - Google Patents
Device and method for determining the relative positions of two coupled shafts to each other Download PDFInfo
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- EP2733459A1 EP2733459A1 EP13188797.8A EP13188797A EP2733459A1 EP 2733459 A1 EP2733459 A1 EP 2733459A1 EP 13188797 A EP13188797 A EP 13188797A EP 2733459 A1 EP2733459 A1 EP 2733459A1
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- 238000000034 method Methods 0.000 title claims description 13
- 238000001514 detection method Methods 0.000 claims abstract description 36
- 230000001133 acceleration Effects 0.000 claims abstract description 18
- 238000005259 measurement Methods 0.000 claims description 58
- 238000011156 evaluation Methods 0.000 claims description 23
- 230000003287 optical effect Effects 0.000 claims description 15
- 238000001303 quality assessment method Methods 0.000 claims description 11
- 238000013441 quality evaluation Methods 0.000 claims description 10
- 230000002093 peripheral effect Effects 0.000 claims description 7
- 239000005337 ground glass Substances 0.000 claims description 6
- 230000008878 coupling Effects 0.000 claims description 5
- 238000010168 coupling process Methods 0.000 claims description 5
- 238000005859 coupling reaction Methods 0.000 claims description 5
- 238000009826 distribution Methods 0.000 claims description 3
- 230000002123 temporal effect Effects 0.000 claims 2
- 230000006978 adaptation Effects 0.000 description 3
- 230000000694 effects Effects 0.000 description 3
- 238000012935 Averaging Methods 0.000 description 1
- 206010034016 Paronychia Diseases 0.000 description 1
- 238000011157 data evaluation Methods 0.000 description 1
- 230000001419 dependent effect Effects 0.000 description 1
- 238000006073 displacement reaction Methods 0.000 description 1
- 230000005484 gravity Effects 0.000 description 1
- 238000007781 pre-processing Methods 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 238000009827 uniform distribution Methods 0.000 description 1
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
- G01B21/16—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring distance of clearance between spaced objects
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/26—Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes
- G01B11/27—Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes for testing the alignment of axes
- G01B11/272—Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes for testing the alignment of axes using photoelectric detection means
Definitions
- the invention relates to an apparatus and a method for determining the position of a first shaft and a second shaft connected by means of a coupling with the first shaft to each other, wherein a first measuring unit attached to a peripheral surface of the first shaft and a second measuring unit on a peripheral surface of the second shaft becomes.
- at least one of the two measuring units has means for generating at least one light beam
- at least one of the two measuring units has detection means to detect data concerning the position of incidence of the light beam on at least one detection surface.
- at least one of the two measuring units is provided with at least one sensor for detecting the angle of rotation of the shaft.
- an evaluation unit can be selected from the in several measurement positions, i. In a plurality of rotational angle positions, determined incident positions of the light beam of the parallel offset and the horizontal or vertical angular displacement of the two waves are determined, which typically takes place by curve fitting.
- a shaft alignment measuring device in which the first measuring unit emits a light beam which falls on two in the axial direction optically successively arranged two-axis optical detectors of the second measuring unit.
- both the first and the second measuring unit each emit a light beam and have a biaxial optical detector, wherein the light beam is respectively directed to the detector of the other measuring unit.
- An operating according to this principle shaft alignment measuring device is also in the US Pat. No. 6,873,931 B1 described, wherein the Both measuring units are each provided with two biaxial acceleration sensors for automatically detecting the angle of rotation of the shaft.
- the first measuring unit emits a fanned out light beam incident on two laterally spaced parallel optical stripe detectors of the second measuring unit, wherein the longitudinal direction of the detectors is arranged perpendicular to the fan plane of the light beam, wherein not only the determination Alignment of the waves to each other but also the determination of the clutch clearance is described.
- each of the two measuring units is provided with a camera arranged in a housing, wherein the housing side facing the other unit is provided with an optical pattern which is picked up by the opposite camera.
- the patterned housing side is in each case provided with an opening through which the opposite pattern is imaged.
- one of the two units is provided with only one camera, but not with a pattern, while the other unit has no camera but is provided with a three-dimensional pattern.
- the first measuring unit is provided with a light source which directs a light beam to the second measuring unit provided with a ground glass; the side facing away from the first measuring unit side of the ground glass is imaged by means of a corresponding optics on an also part of the second measuring unit forming image detector.
- a device is schematically shown, by means of which the alignment of a first shaft 10 with respect to a second shaft 12, which is connected by means of a coupling 14 with the first shaft can be determined.
- the two shafts 10, 12 are arranged in alignment one behind the other.
- the device comprises a first measuring unit 16, which is fixedly attachable to a peripheral surface of the first shaft 10, and a second measuring unit 18 which is fixedly attachable to a peripheral surface of the second shaft 12.
- the first measuring unit 16 has a laser light source 20 for generating a light beam or light beam 22, which is directed to the second measuring unit 18.
- the second measuring unit 18 has two optically offset in the axial direction one behind the other arranged detection surfaces 24 and 26, which are typically each formed by a biaxial optical detector.
- the shafts are rotated together about their axis (usually only one of the two shafts is driven); In this case, the impact positions of the light beam 22 on the two detector surfaces 24 and 26 are detected in a plurality of measurement positions, each of which corresponds to a specific rotational angle position.
- the radial component is denoted by Y or Y 'and the tangential component by X or X'.
- the wide measuring unit 18 has at least one sensor 28 which is suitable for detecting the angle of rotation of the second measuring unit 18, and thus the angle of rotation of the shafts 10 and 12, as well as the angular velocity and angular acceleration.
- This is preferably at least one two-axis accelerometer or at least one gyroscope, wherein in both cases the sensor is preferably designed as a MEMS module.
- a precise determination of the angle of rotation by means of two two-axis accelerometer sensors is, for example, in US Pat US Pat. No. 6,873,931 B1 described.
- the second measuring unit 18 has an evaluation unit 30, which is supplied with the data of the sensor 28 and the data of the optical sensors 24 and 26 in order to evaluate them and finally to determine the shaft offset.
- FIG Fig. 2 An example of how the optical detection surfaces arranged one behind the other can be realized is shown in FIG Fig. 2 This principle is shown in detail in the DE 38 14 466 A1 is described.
- the second measuring unit 18 is provided with a lens 32, a beam splitter 34 and a mirror 36, wherein the beam 22 through the Lens 32 incident on the beam splitter 34, wherein a portion of the beam 22 is transmitted as a beam 22 'and incident on the first detector 24, while a portion 22 "of the beam 22 from the beam splitter 34 to a mirror 36 and from there to the
- the two detector surfaces 24 and 26 are spatially not axially but radially (or tangentially) offset from each other, while the second detector surface 26 optically (or virtually) due to the effect of the beam splitter 34 and the mirror 36th axially offset behind the detector surface 24 is arranged (ie the points of incidence of the partial beams 22 ', 22 "are as if the two detector surfaces 24 and 26 are arranged axially one behind the other).
- a center of gravity calculation can be performed if the light spot extends over a plurality of detector pixels.
- Such a determination of the impact position can either be implemented already in the detector itself or in the evaluation unit 30.
- FIGS. 3A and 3B Fig. 3 schematically illustrates the effect of a vertical parallel offset of the shafts 10 and 12 with respect to the impact position on the first detector 24 and the second detector 26, respectively, showing wander of the landing positions during one revolution of the shafts 10,12.
- Fig. 4 shows the traveling of the landing positions during a shaft revolution for the general case, ie when there is both a parallel offset and a vertical and a horizontal angular offset. In each case a circle results on both detector surfaces.
- the data relating to the impact positions are usually plotted such that in one direction the radial component of the impact position is plotted on the detector surface 24 closer to the light source (denoted by Y1 in the example), while in the other direction the difference of the radial components of the impact positions on the first sensor surface 24 and the second sensor surface 26 is applied (in the example referred to as "Y1 - Y2").
- the measurement points thus plotted lie on an ellipse which is parameterized with the shaft rotation angle.
- the vertices of the ellipse correspond to zero-clock, six-clock, three-clock, and nine-clock positions, respectively measuring units during one revolution of waves (in the general case these positions do not coincide with ellipse apices).
- the parameters of the desired ellipse are usually determined by means of curve fitting to the measuring points. From the shape of the thus determined ellipse then the parallel offset, the vertical angular offset and the horizontal angular offset of the waves can be determined, as in Fig. 7 is indicated. In this context, let me give you an example DE 39 11 307 A1 directed.
- the measurement points are not exactly on an elliptic curve, since different measurement errors can lead to a corresponding deviation.
- a problem occurring in this context for example, in the principle always present in greater or lesser extent existing game of the clutch 14, which means that the two shafts 10, 12 are not rigidly coupled in the rotation, so that, for example, if the Shaft 10 is driven, the shaft 12 at the beginning of the rotational movement is not at all or slower than the shaft 10 rotates. This then leads to an adjustment of the measuring units 16, 18 in the tangential direction relative to one another, which also influences the radial component of the impact points of the light beam 22 on the detector surfaces 24, 26.
- a strong angular acceleration due to the elasticity or inertia of the measuring units 16, 18 lead to a tangential adjustment between the shaft and associated measuring unit and to a relative rotation between the two waves.
- a non-optimal, i. very rigid, connection between the respective measuring unit and the shaft can lead to deviations of the impact positions.
- Fig. 5 an example of a non-ideal measurement is shown, wherein the individual measuring points deviate in some cases considerably from the ellipse adapted to the measuring points.
- the reliability of the curve fitting can be increased by making a quality assessment of the individual measuring points based on certain criteria and measuring points with poor quality assessment are not considered at all or with only a small weighting in the evaluation, ie during curve fitting.
- the quality evaluation of the individual measuring points may be based on the following criteria: angular velocity and angular acceleration, difference of the tangential component of the impact position or impact positions relative to the tangential component of the impact position or impact positions of the previous measurement position relative to the time interval to previous measuring position; Degree of deviation of the impact position or point from a curve adapted to at least a part of the determined measurement points, vibration intensity during measurement, change in angular acceleration; time interval of the measuring position to a reference time of the rotational movement, wherein it may be at the reference time, for example, the beginning of the rotational movement; for detection of the vibration intensity, the sensor 28 provided for detecting the angle of rotation is preferably designed accordingly; In particular, an accelerometer sensor is particularly well suited. The higher
- a measuring point can also be rated the worse, the closer it is to the beginning of the rotational movement, since when starting the waves 10, 12, the clutch play, for example, plays a particularly important role and thus the measurement results can be affected accordingly.
- a measurement position is rated the worse, the greater the difference between the tangential component of the impact position to the tangential component of the impact position of the previous measurement position, based on the time interval to the previous measurement position, since this is an indication of an angular velocity of the two different at the time of measurement Waves is what greatly affects the measurement result.
- the overall quality assessment can be done by an appropriate averaging of the individual quality assessments.
- a threshold value for the overall quality of the measurement can be determined, in which case depending on whether the determined overall quality has already reached this threshold value or not, a message is issued that the measurement can already be terminated or that the measurement be continued must to achieve sufficient quality. If, for example, only relatively poor measuring positions are present in a measurement above 90 ° (for example because of a large coupling clearance and / or too sudden a rotational movement), the evaluation unit 30 will decide that the measurement must be continued. On the other hand, if there are already many good measuring points, the measurement can be ended.
- the evaluation of the overall quality can also include the distribution of the measuring positions via the angle of rotation and the number of measuring positions. A uniform distribution over the rotation angles as well as a large number of measuring positions leads to a higher quality assessment.
- the average deviation of the individual measurement points from the adjusted curve ie the standard deviation of the adaptation, can also be taken into account when determining the overall quality.
- FIGs. 8A and 8B A further example of a measured value evaluation with faulty measuring points is shown, with the solid ellipse for the curve fitting only taking into account measured values whose deviation from an ellipse adapted to all measuring points was a maximum of 5% (black circles), while the measured values with a higher deviation (open circles) were not taken into account in the fitting (the ellipse resulting from fitting to all measuring points is in Fig. 8A shown in dashed lines).
- the angle of rotation sensor 28 may be an at least two-axis accelerometer sensor. In order to increase the accuracy of the angle detection, however, two such accelerometer sensors may also be provided.
- both measuring units can each be provided with at least one rotational angle sensor (in Fig. 1 such an additional rotation angle sensor of the first measuring unit 16 is indicated at 38).
- a data connection between the first and second measuring unit 16, 18 must be provided, so that the evaluation unit 30 can take into account data of all existing rotation angle sensors.
- the difference between the rotational angle position determined by means of the first measuring unit 16 and the rotational angular position determined with the data of the second measuring unit 18 is then determined in order to determine the coupling play and to take this into account in the quality evaluation of the individual measuring positions and / or in the overall quality evaluation.
- the determination of the impact positions of the light beam 22 can be carried out in each case by means of a biaxial optical detector.
- the detection surface ie the surface on which the light beam impinges
- the detection surface is then imaged by a camera which, in the case of a scattering surface, faces toward the direction of incidence of the light beam the scattering surface is directed and in the case of a ground glass on the direction of incidence of the light beam facing away from the screen is directed.
- the determination of the impact position then takes place by means of image processing.
- the proposed type of measured data preprocessing by means of quality evaluation of the individual measuring positions is also applicable to other optical shaft alignment measuring methods.
- Fig. 10 1 shows an example of a method in which the first measuring unit 18 has both the light source 20 and a biaxial optical detector 25, while the second measuring unit 18 has a reflector arrangement 40 for applying the light beam 22 emitted by the first measuring unit 20 to the detector surface 25 to reflect.
- the radial component Y and the tangential component X of the impact position of the reflected light beam 22 'on the detector surface 25 are used for the curve fitting, which in turn results in an ellipse.
- the reflector assembly 40 has two reflective surfaces 42 and 44 disposed at a right angle to each other which sequentially reflect the incident beam 22 to redirect it to the detector surface 25; the two surfaces 42, 44 are arranged at an angle of approximately 45 ° to the vertical and extend in the tangential direction.
- the reflector assembly 40 can, as in Fig. 10 may be formed in the manner of a mirror, or it may be formed as a prism, in particular as a Porro prism or as a triple prism. Such a system is for example in the DE 39 11 307 A1 described.
- FIG. 11 Another alternative measuring method is in Fig. 11 shown where each of the two measuring units 16, 18 are each provided with a light source 20 and a biaxial optical detector 25.
- the light source 20 of the first measuring unit 16 is directed to the detector 25 of the second measuring unit 18, and the light source 20 of the second measuring unit 18 is directed to the detector 25 of the first measuring unit 16.
- the evaluation of the measuring points is carried out in a similar manner as in the measuring principle according to the FIGS. 1 to 7 ie the radial component of the point of impact is plotted on one of the two detectors above the difference of the radial components of the points of impact on both detectors; the points thus applied are then fitted with an ellipse.
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Abstract
Description
Die Erfindung betrifft eine Vorrichtung und ein Verfahren zum Ermitteln der Lage einer ersten Welle und einer mittels einer Kupplung mit der ersten Welle verbundenen zweiten Welle zueinander, wobei eine erste Messeinheit an einer Umfangsfläche der ersten Welle und eine zweite Messeinheit an einer Umfangsfläche der zweiten Welle angesetzt wird. Dabei weist mindestens eine der beiden Messeinheiten Mittel zum Erzeugen mindestens eines Lichtstrahlbündels auf, und mindestens eine der beiden Messeinheiten weist Detektionsmittel auf, um Daten betreffend die Auftreffposition des Lichtstrahlbündels auf mindestens einer Detektionsfläche zu erfassen. Ferner ist mindestens eine der beiden Messeinheiten mit mindestens einem Sensor zum Erfassen des Drehwinkels der Welle versehen. Mittels einer Auswerteeinheit kann aus den in mehreren Messpositionen, d.h. in mehreren Drehwinkelpositionen, ermittelten Auftreffpositionen des Lichtstrahlbündels der Parallelversatz sowie der horizontale bzw. vertikale Winkelversatz der beiden Wellen ermittelt werden, wobei dies typischerweise durch Kurvenanpassung erfolgt.The invention relates to an apparatus and a method for determining the position of a first shaft and a second shaft connected by means of a coupling with the first shaft to each other, wherein a first measuring unit attached to a peripheral surface of the first shaft and a second measuring unit on a peripheral surface of the second shaft becomes. In this case, at least one of the two measuring units has means for generating at least one light beam, and at least one of the two measuring units has detection means to detect data concerning the position of incidence of the light beam on at least one detection surface. Furthermore, at least one of the two measuring units is provided with at least one sensor for detecting the angle of rotation of the shaft. By means of an evaluation unit can be selected from the in several measurement positions, i. In a plurality of rotational angle positions, determined incident positions of the light beam of the parallel offset and the horizontal or vertical angular displacement of the two waves are determined, which typically takes place by curve fitting.
Eine Übersicht über solche Wellenausrichtungsmessvorrichtungen ist beispielsweise in der
In der
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Es ist Aufgabe der vorliegenden Erfindung, eine Wellenausrichtungsmessvorrichtung und ein Wellenausrichtungsmessverfahren zu schaffen, wodurch eine besonders einfache und zuverlässige Messung ermöglicht wird.It is an object of the present invention to provide a shaft alignment measuring device and a shaft alignment measuring method, thereby enabling a particularly simple and reliable measurement.
Diese Aufgabe wird erfindungsgemäß gelöst durch eine Vorrichtung gemäß Anspruch 1 bzw. ein Verfahren gemäß Anspruch 28.This object is achieved by a device according to
Bei der erfindungsgemäßen Lösung ist vorteilhaft, dass dadurch, dass für jede einzelne Messposition eine Qualitätsbewertung der zugehörigen Daten anhand der Winkelgeschwindigkeit und Winkelbeschleunigung, Differenz der tangentialen Komponente der Auftreffposition zur Auftreffposition der vorhergehenden Messposition, bezogen auf den zeitlichen Abstand zur vorhergehenden Messposition, und dem Grad der Abweichung der Auftreffposition von einer an mindestens einem Teil der ermittelten Auftreffposition angepassten Kurve vorgenommen wird und die Daten einer Messposition von der Berücksichtigung bei der Ermittlung des Wellenversatzes ausgeschlossen werden, falls die Qualitätsbewertung dieser Daten unterhalb eines Schwellwerts liegt, zuverlässige Messdaten auf einfache Weise ermittelt und gegebenenfalls eliminiert werden können, um die Zuverlässigkeit des ermittelten Wellenversatzes zu erhöhen.In the solution according to the invention, it is advantageous that, for each individual measuring position, a quality evaluation of the associated data based on the angular velocity and angular acceleration, difference of the tangential component of the impact position to the impact position of the preceding measurement position, based on the time interval to the previous measurement position, and the degree the deviation of the impact position from a curve adapted to at least a part of the determined impact position is excluded and the data of a measurement position are excluded from taking into account the determination of the shaft offset, if the quality assessment of said data is below a threshold, reliable measurement data are easily determined and optionally can be eliminated to increase the reliability of the detected shaft offset.
Bevorzugte Ausgestaltungen der Erfindung ergeben sich aus den abhängigen Ansprüchen.Preferred embodiments of the invention will become apparent from the dependent claims.
Im Folgenden werden Beispiele der Erfindung anhand der beigefügten Zeichnungen näher erläutert, wobei:
- Fig. 1
- eine schematische seitliche Ansicht einer erfindungsgemäßen Wellenausrichtungsvorrichtung gemäß einem ersten Beispiel;
- Fig. 2
- eine perspektivische schematische Ansicht eines Beispiels einer Messeinheit mit zwei optischen Detektoren, die bei der Vorrichtung gemäß
Fig. 1 verwendet werden können; - Fig. 3A und 3B
- eine schematische Veranschaulichung der Auftreffpositionen des Lichtstrahls bei einer Vorrichtung gemäß
Fig. 1 bei Parallelversatz bzw. vertikalem Winkelversatz der beiden Wellen; - Fig. 4
- eine Veranschaulichung der Auftreffpositionen des Lichtstrahls der Vorrichtung von
Fig. 1 bei einem vollen Umlauf der Wellen während der Messung bei einer relativ zuverlässigen Messung; - Fig. 5
- eine Ansicht wie
Fig. 4 , wobei eine weniger zuverlässige Messung dargestellt ist; - Fig. 6
- eine Ansicht wie
Fig. 4 , wobei die Messung nur über einen Teil einer vollen Umdrehung der Wellen ausgeführt wird; - Fig. 7
- eine Veranschaulichung der Auswertung der bei einer Messung gemäß
Fig. 4 bis 6 ermittelten Kurve; - Fig. 8A und 8B
- ein praktisches Beispiel von Messpunkten in der Art von
Fig. 4 bis 7 , wobei die Messpunkte mit angepasster Kurve gezeigt sind (Fig. 8A ); inFig. 8B ist die prozentuale Abweichung jedes Messpunkts von der angepassten Kurve inFig. 8A als Funktion des Drehwinkels gezeigt; - Fig. 9A und 9B
- eine Ansicht wie
Fig. 8A bzw. 8B, wobei ein anderes Beispiel dargestellt ist; - Fig. 10
- eine Ansicht wie
Fig. 1 , wobei ein alternatives Messverfahren schematisch veranschaulicht ist; und - Fig. 11
- eine Ansicht wie
Fig. 1 , wobei ein weiteres alternatives Messverfahren schematisch veranschaulicht ist.
- Fig. 1
- a schematic side view of a shaft alignment device according to the invention according to a first example;
- Fig. 2
- a perspective schematic view of an example of a measuring unit with two optical detectors, which in the apparatus according to
Fig. 1 can be used; - FIGS. 3A and 3B
- a schematic illustration of the impact positions of the light beam in a device according to
Fig. 1 with parallel offset or vertical angular offset of the two shafts; - Fig. 4
- an illustration of the impact positions of the light beam of the device of
Fig. 1 with one complete revolution of the waves during the measurement with a relatively reliable measurement; - Fig. 5
- a view like
Fig. 4 showing a less reliable measurement; - Fig. 6
- a view like
Fig. 4 wherein the measurement is performed only over a part of a full revolution of the waves; - Fig. 7
- an illustration of the evaluation of in a measurement according to
4 to 6 determined curve; - Figs. 8A and 8B
- a practical example of measuring points in the manner of
Fig. 4 to 7 , where the measuring points are shown with an adapted curve (Fig. 8A ); inFig. 8B is the percentage deviation of each measurement point from the fitted curve inFig. 8A shown as a function of the angle of rotation; - Figs. 9A and 9B
- a view like
Fig. 8A and Fig. 8B showing another example; - Fig. 10
- a view like
Fig. 1 wherein an alternative measuring method is schematically illustrated; and - Fig. 11
- a view like
Fig. 1 , wherein a further alternative measuring method is schematically illustrated.
In
Ferner weist die weite Messeinheit 18 mindestens einen Sensor 28 auf, der geeignet ist, den Drehwinkel der zweiten Messeinheit 18 - und damit den Drehwinkel der Wellen 10 und 12 - sowie die Winkelgeschwindigkeit und Winkelbeschleunigung zu erfassen. Dabei handelt es sich vorzugsweise um mindestens ein zweiachsiges Akzelerometer oder mindestens ein Gyroskop, wobei in beiden Fällen der Sensor vorzugsweise als MEMS-Baustein ausgebildet ist. Eine genaue Drehwinkelermittlung mittels zweier zweiachsiger Akzelerometersensoren ist beispielsweise in der
Ein Beispiel dafür, wie mittels welchem die hintereinander angeordneten optischen Detektionsflächen realisiert werden kann, ist in
Um die Auftreffposition des Lichtstrahls 22 auf der ersten Detektorfläche 24 bzw. der zweiten Detektorfläche 26 zu ermitteln, kann beispielsweise eine Schwerpunktberechnung vorgenommen werden, falls sich der Lichtfleck über mehrere Detektorpixel erstreckt. Eine solche Ermittlung der Auftreffposition kann entweder bereits im Detektor selbst oder in der Auswerteeinheit 30 implementiert sein.In order to determine the impact position of the
In den
In
In der Praxis liegen die Messpunkte jedoch nicht genau auf einer Ellipsenkurve, da verschiedene Messfehler zu einer entsprechenden Abweichung führen können. Ein in diesem Zusammenhang auftretendes Problem liegt beispielsweise in dem grundsätzlich immer in mehr oder weniger großem Umfang vorhandenen Spiel der Kupplung 14 begründet, was dazu führt, dass die beiden Wellen 10, 12 bei der Rotation nicht starr gekoppelt sind, so dass beispielsweise, wenn die Welle 10 angetrieben wird, die Welle 12 zu Beginn der Drehbewegung sich noch gar nicht bzw. langsamer als die Welle 10 dreht. Dies führt dann zu einer Verstellung der Messeinheiten 16, 18 in tangentialer Richtung relativ zueinander, was auch die radiale Komponente der Auftreffpunkte des Lichtstrahls 22 auf den Detektorflächen 24, 26 beeinflusst. Auch kann beispielsweise eine starke Winkelbeschleunigung aufgrund der Elastizität bzw. Trägheit der Messeinheiten 16, 18 zu einer tangentialen Verstellung zwischen Welle und zugehöriger Messeinheit sowie zu einer relativen Verdrehung zwischen den beiden Wellen führen. Auch eine nicht optimale, d.h. ganz starre, Verbindung zwischen der jeweiligen Messeinheit und der Welle kann zu Abweichungen der Auftreffpositionen führen.In practice, however, the measurement points are not exactly on an elliptic curve, since different measurement errors can lead to a corresponding deviation. A problem occurring in this context, for example, in the principle always present in greater or lesser extent existing game of the clutch 14, which means that the two
In
In der Regel wird das Ergebnis der Kurvenanpassung - und damit die Ermittlung des Wellenversatzes - um so unzuverlässiger sein, je größer die Standardabweichung der Messpunkte von der angepassten Ellipse ist.In general, the larger the standard deviation of the measurement points from the adjusted ellipse, the more uncertain the result of the curve fit, and thus the determination of the shaft offset.
Die Zuverlässigkeit der Kurvenanpassung kann erhöht werden, indem eine Qualitätsbewertung der einzelnen Messpunkte anhand bestimmter Kriterien vorgenommen wird und Messpunkte mit schlechter Qualitätsbewertung gar nicht oder mit nur geringer Gewichtung bei der Auswertung, d.h. bei der Kurvenanpassung, berücksichtigt werden. Bei der Qualitätsbewertung der einzelnen Messpunkte (die jeweils einer bestimmten Messposition entsprechen) können folgende Kriterien herangezogen werden: Winkelgeschwindigkeit und Winkelbeschleunigung, Differenz der tangentialen Komponente der Auftreffposition bzw. Auftreffpositionen zur tangentialen Komponente der Auftreffposition bzw. Auftreffpositionen der vorhergehenden Messposition, bezogen auf den zeitlichen Abstand zur vorhergehenden Messposition; Grad der Abweichung der Auftreffposition bzw. des Messpunkts von einer an mindestens einem Teil der ermittelten Messpunkte angepassten Kurve, Schwingungsintensität während der Messung, Änderung der Winkelbeschleunigung; zeitlicher Abstand der Messposition zu einem Referenzzeitpunkt der Drehbewegung, wobei es sich bei dem Referenzzeitpunkt beispielsweise um den Beginn der Drehbewegung handeln kann; zu einer Erfassung der Schwingungsintensität ist vorzugsweise der zur Drehwinkelerfassung vorgesehene Sensor 28 entsprechend ausgebildet; insbesondere ein Akzelerometersensor ist dabei besonders gut geeignet. Je höher die Schwingungsintensität eines Messpunkts ist, desto schlechter wird dieser bewertet.The reliability of the curve fitting can be increased by making a quality assessment of the individual measuring points based on certain criteria and measuring points with poor quality assessment are not considered at all or with only a small weighting in the evaluation, ie during curve fitting. at The quality evaluation of the individual measuring points (each corresponding to a specific measuring position) may be based on the following criteria: angular velocity and angular acceleration, difference of the tangential component of the impact position or impact positions relative to the tangential component of the impact position or impact positions of the previous measurement position relative to the time interval to previous measuring position; Degree of deviation of the impact position or point from a curve adapted to at least a part of the determined measurement points, vibration intensity during measurement, change in angular acceleration; time interval of the measuring position to a reference time of the rotational movement, wherein it may be at the reference time, for example, the beginning of the rotational movement; for detection of the vibration intensity, the
Ein Messpunkt kann ferner um so schlechter bewertet werden, je näher er am Beginn der Drehbewegung liegt, da beim Anfahren der Wellen 10, 12 das Kupplungsspiel beispielsweise eine besonders große Rolle spielt und dadurch die Messergebnisse entsprechend beeinträchtigt werden können.A measuring point can also be rated the worse, the closer it is to the beginning of the rotational movement, since when starting the
Je höher die Winkelbeschleunigung bzw. die Änderung der Winkelbeschleunigung ist, desto schlechter wird ein Messpunkt bewertet, da bei einer hohen Beschleunigung bzw. einer starken Änderung der Beschleunigung aufgrund von Trägheitseffekten eine besonders große Gefahr der Messwertverfälschung besteht.The higher the angular acceleration or the change of the angular acceleration, the worse a measuring point is evaluated, since with a high acceleration or a strong change of the acceleration due to inertia effects there is a particularly high risk of the measured value corruption.
Auch eine höhere Winkelgeschwindigkeit führt zu einer schlechteren Bewertung der Messposition.Even a higher angular velocity leads to a worse evaluation of the measuring position.
Vorzugsweise wird eine Messposition um so schlechter bewertet, je größer die Differenz der tangentialen Komponente der Auftreffposition zur tangentialen Komponente der Auftreffposition der vorhergehenden Messposition, bezogen auf den zeitlichen Abstand zur vorhergehenden Messposition, ist, da dies ein Hinweis auf eine zum Messzeitpunkt unterschiedliche Winkelgeschwindigkeit der beiden Wellen ist, was das Messergebnis dann stark beeinträchtigt.Preferably, a measurement position is rated the worse, the greater the difference between the tangential component of the impact position to the tangential component of the impact position of the previous measurement position, based on the time interval to the previous measurement position, since this is an indication of an angular velocity of the two different at the time of measurement Waves is what greatly affects the measurement result.
Obschon dies in der Regel die Zuverlässigkeit der Wellenversatzermittlung erhöhen wird, ist es nicht grundsätzlich erforderlich, dass die Messpositionen einen vollen Umlauf der Wellen 10, 12 durchlaufen. Stattdessen kann es auch ausreichend sein, Messungen nur über einen Teilumlauf der Wellen 10, 12 vorzunehmen, da mittels der Kurvenanpassung sozusagen über den restlichen Drehwinkelbereich extrapoliert werden kann. Ein Beispiel dafür ist in der
Dabei kann auch nach Durchlaufen einer bestimmten Anzahl von Messpositionen, d.h. nach Durchlaufen eines bestimmten Winkelbereichs, eine Gesamtqualitätsbewertung der Daten der bis dahin durchlaufenen Messpositionen anhand der einzelnen Messpositionen durchgeführt werden. Hierbei kann auch eine Kurvenanpassung basierend auf den bis dahin durchlaufenen Messpositionen vorgenommen werden, und es kann eine Meldung bezüglich der ermittelten Gesamtqualität ausgegeben werden.In this case, even after passing through a certain number of measuring positions, i. After passing through a certain angle range, an overall quality evaluation of the data of the previously traversed measuring positions is carried out on the basis of the individual measuring positions. In this case, it is also possible to make a curve adaptation based on the measuring positions that have been passed through until then, and a message regarding the determined overall quality can be output.
Beispielsweise kann die Gesamtqualitätsbewertung durch eine geeignete Mittelung der Einzelqualitätsbewertungen erfolgen. Dabei kann auch ein Schwellwert für die Gesamtqualität der Messung festgelegt werden, wobei dann je nachdem, ob die ermittelte Gesamtqualität diesen Schwellenwert bereits erreicht hat oder nicht, eine Meldung dahingehend ausgegeben werden, dass die Messung bereits beendet werden kann oder dass die Messung noch weitergeführt werden muss, um eine ausreichende Qualität zu erzielen. Wenn also beispielsweise bei einer Messung über 90° nur relativ schlechte Messpositionen vorliegen (z.B. aufgrund eines großen Kopplungsspiels und/oder einer zu ruckartigen Drehbewegung), wird die Auswerteeinheit 30 entscheiden, dass die Messung noch weitergeführt werden muss. Liegen dagegen bereits viele gute Messpunkte vor, so kann die Messung beendet werden.For example, the overall quality assessment can be done by an appropriate averaging of the individual quality assessments. In this case, a threshold value for the overall quality of the measurement can be determined, in which case depending on whether the determined overall quality has already reached this threshold value or not, a message is issued that the measurement can already be terminated or that the measurement be continued must to achieve sufficient quality. If, for example, only relatively poor measuring positions are present in a measurement above 90 ° (for example because of a large coupling clearance and / or too sudden a rotational movement), the evaluation unit 30 will decide that the measurement must be continued. On the other hand, if there are already many good measuring points, the measurement can be ended.
Zusätzlich zu der Qualitätsbewertung der einzelnen Messpositionen kann in die Bewertung der Gesamtqualität auch die Verteilung der Messpositionen über den Drehwinkel und die Anzahl der Messpositionen eingehen. Dabei führt eine gleichmäßige Verteilung über die Drehwinkel sowie eine große Anzahl von Messpositionen zu einer höheren Qualitätsbewertung.In addition to the quality evaluation of the individual measuring positions, the evaluation of the overall quality can also include the distribution of the measuring positions via the angle of rotation and the number of measuring positions. A uniform distribution over the rotation angles as well as a large number of measuring positions leads to a higher quality assessment.
Auch die durchschnittliche Abweichung der einzelnen Messpunkte von der angepassten Kurve, d.h. Standardabweichung der Anpassung, kann bei der Ermittlung der Gesamtqualität berücksichtigt werden.The average deviation of the individual measurement points from the adjusted curve, ie the standard deviation of the adaptation, can also be taken into account when determining the overall quality.
In
Ein ähnliches Beispiel ist in
Wie bereits erwähnt, kann es sich bei dem Sensor 28 für den Drehwinkel um einen mindestens zweiachsigen Akzelerometersensor handeln. Um die Genauigkeit der Winkelerfassung zu erhöhen, können jedoch auch zwei solche Akzelerometersensoren vorgesehen sein.As already mentioned, the angle of
Während bei dem bisher beschriebenen Ausführungsbeispiel nur die zweite Messeinheit mit einem Sensor zur Drehwinkelbestimmung versehen ist, können gemäß einer alternativen Ausführungsform auch beide Messeinheiten jeweils mit mindestens einem Drehwinkelsensor versehen sein (in
Wie bereits erwähnt, kann die Ermittlung der Auftreffpositionen des Lichtstrahlbündels 22 jeweils mittels eines zweiachsigen optischen Detektors erfolgen. Alternativ ist es jedoch auch grundsätzlich möglich, die Detektionsfläche, d.h. die Fläche, auf welcher das Lichtstrahlbündel auftrifft, als Streufläche oder Mattscheibe auszubilden, wobei die Detektionsfläche dann von einer Kamera abgebildet wird, die im Falle einer Streufläche auf die der Einfallsrichtung des Lichtstrahlbündels zugewandten Seite der Streufläche gerichtet ist und im Falle einer Mattscheibe auf die von der Einfallsrichtung des Lichtstrahlbündels abgewandte Seite der Mattscheibe gerichtet ist. Die Ermittlung der Auftreffposition erfolgt dann mittels Bildverarbeitung.As already mentioned, the determination of the impact positions of the
Grundsätzlich ist die vorgeschlagene Art der Messdatenvorverarbeitung mittels Qualitätsbewertung der einzelnen Messpositionen auch auf andere optische Wellenausrichtungsmessverfahren anwendbar.Basically, the proposed type of measured data preprocessing by means of quality evaluation of the individual measuring positions is also applicable to other optical shaft alignment measuring methods.
So ist beispielsweise in
Typischerweise weist die Reflektoranordnung 40 zwei unter einem rechten Winkel zueinander angeordnete reflektierende Flächen 42 und 44 auf, welche den einfallenden Strahl 22 jeweils nacheinander reflektieren, um ihn auf die Detektorfläche 25 zurückzulenken; die beiden Flächen 42, 44 sind dabei unter einem Winkel von etwa 45° zur Vertikalen angeordnet und verlaufen in tangentialer Richtung. Die Reflektoranordnung 40 kann dabei, wie in
Ein weiteres alternatives Messverfahren ist in
Claims (29)
wobei mindestens eine der beiden Messeinheiten Mittel (20) zum Erzeugen mindestens eines Lichtstrahlbündels (22) aufweist und mindestens eine der beiden Messeinheiten Detektionsmittel (24, 25, 26) aufweist, um Daten betreffend die Auftreffposition des Lichtstrahlbündels auf mindestens einer Detektionsfläche (24, 25, 26) zu erfassen,
wobei mindestens eine der beiden Messeinheiten mit mindestens einem Sensor (28) zum Erfassen des Drehwinkels der Wellen versehen ist, bei dem es sich um ein mindestens zweiachsiges Akzelerometer oder um ein Gyroskop handelt,
wobei die Auswerteeinheit ausgebildet ist, um in mehreren Messpositionen aus den Sensor-Daten die jeweilige Drehwinkelposition, Winkelgeschwindigkeit und Winkelbeschleunigung der Wellen und aus den von den Detektionsmitteln gelieferten Daten die jeweilige Auftreffposition des Lichtstrahlbündels auf der mindestens einen Detektionsfläche zu ermitteln und um aus mindestens einem Teil der ermittelten Auftreffpositionen durch Kurvenanpassung den Versatz der Wellen zu ermitteln,
und wobei die Auswerteeinheit ferner ausgebildet ist, um für jede einzelene Messposition eine Qualitätsbewertung der zugehörigen Daten anhand mindestens der folgenden Kriterien vorzunehmen:
wherein at least one of the two measuring units has means (20) for generating at least one light beam (22) and at least one of the two measuring units detection means (24, 25, 26) to data concerning the position of incidence of the light beam on at least one detection surface (24, 25 , 26) to detect
wherein at least one of the two measuring units is provided with at least one sensor (28) for detecting the angle of rotation of the shafts, which is an at least biaxial accelerometer or a gyroscope,
wherein the evaluation unit is designed to determine, in a plurality of measurement positions from the sensor data, the respective rotational angle position, angular velocity and angular acceleration of the waves and from the data supplied by the detection means the respective impact position of the light beam on the at least one detection surface and at least a part Determine the offset of the waves by fitting curves to the determined impact positions.
and wherein the evaluation unit is further configured to perform a quality assessment of the associated data for each individual measurement position based on at least the following criteria:
eine erste Messeinheit (16) an eine Umfangsfläche der ersten Welle und eine zweite Messeinheit (18) an eine Umfangsfläche der zweiten Welle angesetzt wird,
mittels mindestens einer der beiden Messeinheiten mindestens ein Lichtstrahlbündel (22) erzeugt wird und auf mindestens eine Detektionsfläche (24, 25, 26) an mindestens einer der beiden Messeinheiten gerichtet wird,
um in mehreren Messpositionen Daten betreffend die Auftreffposition des Lichtstrahlbündels auf der mindestens einen Detektionsfläche erfasst werden und mittels mindestens einem Sensor (28), bei dem es sich um ein mindestens zweiachsiges Akzelerometer oder um ein Gyroskop handelt, an mindestens einer der beiden Messeinheiten Daten bzgl. des Drehwinkels der Wellen erfasst werden,
wobei aus den Sensor-Daten die jeweilige Drehwinkelposition, Winkelgeschwindigkeit und Winkelbeschleunigung der Wellen und aus den Auftreffpositions-Daten die jeweilige Auftreffposition des Lichtstrahlbündels auf der mindestens einen Detektionsfläche ermitteln werden und aus mindestens einem Teil der ermittelten Auftreffpositionen durch Kurvenanpassung der Versatz der Wellen ermittelt wird,
wobei für jede einzelene Messposition eine Qualitätsbewertung der zugehörigen Daten anhand mindestens der folgenden Kriterien vorgenommen wird:
a first measuring unit (16) is attached to a peripheral surface of the first shaft and a second measuring unit (18) is attached to a circumferential surface of the second shaft,
at least one light beam (22) is generated by means of at least one of the two measuring units and is directed to at least one detection surface (24, 25, 26) on at least one of the two measuring units,
at at least one sensor (28), which is an at least biaxial accelerometer or a gyroscope, at at least one of the two measuring units data regarding the impact position of the light beam on the at least one detection surface are detected in several measurement positions. the angle of rotation of the waves are detected,
wherein the respective rotational angle position, angular velocity and angular acceleration of the waves and from the impact position data determine the respective impact position of the light beam on the at least one detection surface and the deviation of the waves from at least a part of the determined impact positions is determined by curve fitting,
wherein, for each individual measuring position, a quality assessment of the associated data is carried out on the basis of at least the following criteria:
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DE3320163A1 (en) | 1983-06-03 | 1984-12-13 | Prüftechnik Dieter Busch + Partner GmbH & Co, 8045 Ismaning | DEVICE FOR DETECTING ALIGNMENT FAULTS OF SHAFTS ARRANGED IN ADJUSTMENT |
DE3814466A1 (en) | 1988-04-28 | 1989-11-09 | Busch Dieter & Co Prueftech | METHOD AND DEVICE FOR DETERMINING THE RELATIVE POSITION OF A REFERENCE AXIS OF AN OBJECT WITH REGARD TO A REFERENCE BEAM, ESPECIALLY A LASER BEAM |
DE3911307A1 (en) | 1989-04-07 | 1990-10-18 | Busch Dieter & Co Prueftech | METHOD FOR DETERMINING WHETHER TWO SHAFTS ARRANGED IN ORDER ARE ALIGNED OR STABILIZED WITH REGARD TO THEIR AXIS |
US5263261A (en) | 1992-06-03 | 1993-11-23 | Computational Systems, Incorporated | Shaft alignment data acquisition |
US5980094A (en) | 1997-03-28 | 1999-11-09 | Csi Technology, Inc. | Analysis of alignment data |
EP0896203A2 (en) * | 1997-08-05 | 1999-02-10 | Prüftechnik Dieter Busch Ag | Device and method for mutually aligning bodies |
US6981333B2 (en) | 1999-12-08 | 2006-01-03 | Pruftechnik Dieter Busch Ag | Ergonomic, interference signal-reducing position measurement probe for mutual alignment of bodies |
US6434849B1 (en) | 2000-01-24 | 2002-08-20 | Pruftechnik Dieter Busch Ag | Method for determining a lateral and/or angular offset between two rotatable parts |
US6873931B1 (en) | 2000-10-10 | 2005-03-29 | Csi Technology, Inc. | Accelerometer based angular position sensor |
EP1211480A2 (en) | 2000-11-30 | 2002-06-05 | Prüftechnik Dieter Busch Ag | Electro-optical measuring device to determine the relative position of workpieces or their surfaces |
EP2093537A1 (en) | 2008-02-25 | 2009-08-26 | PRÜFTECHNIK Dieter Busch AG | Process and device for the determination of the alignment of two rotatable machine parts, of the alignment of two hollow cylindrical machine parts, or for the examination of a component for straightness |
WO2010042039A1 (en) | 2008-10-10 | 2010-04-15 | Elos Fixturlaser Ab | Device and method for measuring and aligning a first component and a second component in relation to each other |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
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EP2920547A1 (en) * | 2012-11-13 | 2015-09-23 | Acoem AB | System and method for measuring the relative positions of a rotary components |
EP2920547A4 (en) * | 2012-11-13 | 2016-08-03 | Acoem Ab | System and method for measuring the relative positions of a rotary components |
EP2963382A1 (en) * | 2014-07-02 | 2016-01-06 | Prüftechnik Dieter Busch AG | Method for determining the orientation of a laser beam in respect to a rotational axis of a device which can be rotated around this axis, and laser light detecting device |
IT201900020562A1 (en) * | 2019-11-07 | 2021-05-07 | Univ Degli Studi Milano | Device and method and for the measurement of the inclination and angular stability of electromagnetic radiation beams, and for the measurement of a spatial deviation of a focused electromagnetic radiation beam |
WO2021090230A1 (en) * | 2019-11-07 | 2021-05-14 | Università Degli Studi Di Milano | Device and method for the measurement of inclination and angular stability of electromagnetic radiation beams, and for the measurement of a spatial shift of a focused electromagnetic radiation beam |
Also Published As
Publication number | Publication date |
---|---|
CN103822595A (en) | 2014-05-28 |
CN103822595B (en) | 2017-04-05 |
UA110377C2 (en) | 2015-12-25 |
RU2590533C2 (en) | 2016-07-10 |
CA2833383A1 (en) | 2014-05-19 |
DE102012022487A1 (en) | 2014-05-22 |
US9146101B2 (en) | 2015-09-29 |
JP2014102251A (en) | 2014-06-05 |
EP2733459B1 (en) | 2019-07-10 |
BR102013029828A2 (en) | 2014-09-23 |
CA2833383C (en) | 2016-01-26 |
RU2013151306A (en) | 2015-05-27 |
MX2013013471A (en) | 2014-05-22 |
JP6220243B2 (en) | 2017-10-25 |
US20140139823A1 (en) | 2014-05-22 |
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