DE7505830U - DEVICE FOR HIGH-VOLTAGE-PROOF AND GOOD THERMAL CONDUCTING INSTALLATION OF SEMICONDUCTOR COMPONENTS - Google Patents

DEVICE FOR HIGH-VOLTAGE-PROOF AND GOOD THERMAL CONDUCTING INSTALLATION OF SEMICONDUCTOR COMPONENTS

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Publication number
DE7505830U
DE7505830U DE19757505830 DE7505830U DE7505830U DE 7505830 U DE7505830 U DE 7505830U DE 19757505830 DE19757505830 DE 19757505830 DE 7505830 U DE7505830 U DE 7505830U DE 7505830 U DE7505830 U DE 7505830U
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DE
Germany
Prior art keywords
voltage
semiconductor components
good thermal
proof
thermal conducting
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
DE19757505830
Other languages
German (de)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Siemens AG
Original Assignee
Siemens AG
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Siemens AG filed Critical Siemens AG
Priority to DE19757505830 priority Critical patent/DE7505830U/en
Publication of DE7505830U publication Critical patent/DE7505830U/en
Expired legal-status Critical Current

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Description

1010

1515th

2020th

2525th

8 München 2,8 Munich 2,

Vorrichtung zum hochspannungsfesten und gut wärmeleitenden Einbau von Halbleiter-BauelementenDevice for high-voltage-resistant and highly thermally conductive installation of semiconductor components

Die Neuerung betrifft eine Vorrichtung zum hochspannungsfesten und gut wärmeleitenden Einbau von Halbleiterbauelementen, insbesondere mit Flanschgehäuse, in elektrische Baugruppen.The innovation relates to a device for high-voltage-resistant and highly thermally conductive installation of semiconductor components, in particular with flange housing, in electrical assemblies.

Beim Einbau von Halbleiterbauelementen stellt sich immer wieder das Problem, die im Bauelement anfallende Verlustwär&e abzuleiten, um damit eine überhöhte Temperatur im Bauteileraum zu verhindern. Die hohen Temperaturen insbesondere von aktiven Bauelementen hoher Leistungsabgabe können zum einen eine Zerstörung des betreffenden Bauelements selbst bewirken sowie auc_ eine V/äi^mebeeinflussung benachbarter Bauelemente und damit eine Funktionsstörung der gesamten Baugruppe. Zum Zweck der Wärmeableitung sind daher beispielsweise wärmeableitende Mittel vorgesehen, die mit dem Halbleiterbauelement in guter thermischer Verbindung stehen oder bei Halbleiterbauelementen mit Flanschgehäusen ist das Flanschgehäuse mit einer wärmeableitenden Wandung des Gehäuses gut wärmeleitend verbunden. Bei derartigen Halbleiterbauelementen steht also eine gute Ableitung der im Bauelement anfallenden Verlustwärme im Vordergrund. Soll der Einbau der Bauelemente zudem auch mit hoher Spannungsfestigkeit erfolgen, also auch eine hohe elektrische Isolation zur Montagefläche gegeben sein, so führt dies nach der herkömmlichen Technik zu recht aufwendigen konstruktiven Lösungen zum Erhalt der notwendigen Isolationsstrecken. When installing semiconductor components, the problem arises again and again of dissipating the heat loss that occurs in the component, in order to prevent an excessive temperature in the component area. The high temperatures of active components in particular high power output can on the one hand cause destruction of the relevant component itself and also a Influence of neighboring components and thus a malfunction the entire assembly. For the purpose of heat dissipation, heat dissipating means are therefore provided, for example, which are in good thermal contact with the semiconductor component or, in the case of semiconductor components, with flange housings the flange housing is connected to a heat-dissipating wall of the housing with good thermal conductivity. With such semiconductor components a good dissipation of the heat loss occurring in the component is therefore in the foreground. Should the installation of the components also take place with high dielectric strength, so there is also a high electrical insulation to the mounting surface according to the conventional technology, this leads to very complex constructive solutions for maintaining the necessary isolation distances.

Der Neuerung liegt die Aufgabe zugrunde, eine Vorrichtung einfachen Aufbau*· zu schaffen, mit der das Bauelement guten thermischen Kontakt und hohe elektrische Isolation zur Montagefläche aufweist i ί The object of the innovation is to create a device with a simple structure, with which the component has good thermal contact and high electrical insulation to the mounting surface i ί

Diese Aufgabe wird gemäß der Neuerung mit einer Vorrichtung gelöst, bei der das Halbleiterbauelement von einer VergußmasseAccording to the innovation, this object is achieved with a device in which the semiconductor component is covered by a potting compound

VPA 9/641/5005 Klu/AthVPA 9/641/5005 Klu / Ath

7505SL30 02.09.767505SL30 09/02/76

aus einem gut wärmeleitenden und hochisolierenden Gießhf.rz ein- ] ■ geschlossen ist und bodenseitig an der Montageseite, unter ausreichendem Isolationsabstand zum Halbleiterbauelement angeordnet, eine Hontageplatte eingegossen ist. ;from a highly insulating Gießhf.rz a] ■ is closed and arranged on the bottom side on the assembly side, with sufficient isolation distance to the semiconductor component, a honing plate is cast. ;

ίί

"Weitere Einzelheiten der Neuerung werden nachstehend anhand eines f"Further details of the innovation are given below using an f

in der Figur dargestellten Ausführungsbeispiels näher erläutert. |Explained in more detail in the embodiment shown in the figure. |

Das Halbleiterbauelement besteht im dargestellten Ausführungs- tThe semiconductor component consists in the illustrated embodiment

beispiel aus einem Transistor 2 mit Flanschgehäuse. Dieses Bauele- [example from a transistor 2 with flange housing. This component [

ment ist samt seinem Flanschgehäuse in einem gut wärmeleitenden f.ment is together with its flange housing in a highly thermally conductive f.

und hoch isolierenden Gießharz 1 eingegossen, wobei lediglich die ^jand highly insulating cast resin 1, with only the ^ j

Transistoranschlüsse aus dem Vergußteil 1 herausragen. An der jTransistor connections protrude from the potting part 1. At the j

den Transistoranschlüssen gegenüberliegenden Seite des Verguß- f»the side of the potting on the opposite side of the transistor connections »

teiles 1 ist bodenseitig eine mit Gewindebohrungen versehene f"part 1 is on the bottom side provided with threaded holes f "

Montageplatte J5 eingegossen. Die Montageplatte 3> über die das !■ Vergußteil 1 auf der Montagefläche 4 des Gerätes mittels derCast in mounting plate J5. The mounting plate 3> About the! ■ Potting 1 on the mounting surface 4 of the device by means of the

Schrauben 5 aufgeschraubt ist, bringt den gewünschten Wärmekon- Ij Screws 5 is screwed on, brings the desired Wärmekon- Ij

takt zur Montagefläche. Mit diesem zugleich sehr raumsparenden V Verguß wird die Verlustwärme des Halbleiterbauelementes gut abgeleitet und ein hochspannungsfester Aufbau (mindestens 6 kVcycle to the assembly area. With this very space-saving V The heat loss of the semiconductor component is well dissipated and a high-voltage-resistant structure (at least 6 kV

gegen Masse) erreicht. : against ground). :

1 Schutzanspruch
1 Figur
1 right to protection
1 figure

VPA 9/641/5005VPA 9/641/5005

75058^30 02.09.7675058 ^ 30 02.09.76

Claims (1)

SchutzanspruchClaim to protection Vorrichtung zum hochspannungsfesten und gut wärmeleitenden Einbau von Halbleiterbauelementen, insbesondere mit Flanschgehäuse, in elektrischen Baugruppen, gekennzeichnet durch eine das Halbleiterbauelement (2) einschließende Vergußmasse (1) aus einem gut wärmeleitenden und hochisolierenden Gießharz und eine bodenseitig an der Montageseite eingegossene, unter ausreichendem Isolationsabstand zum Halbleiterbauelement (2) angeordnete Montageplatte (3).Device for high-voltage-resistant and good heat-conducting installation of semiconductor components, in particular with flange housings, in electrical assemblies, characterized by a potting compound (1) that encloses the semiconductor component (2) and is made of a highly thermally conductive and highly insulating cast resin and one that is cast in at the bottom on the mounting side and is arranged at a sufficient isolation distance from the semiconductor component (2) Mounting plate (3). VPA 9/641/5005VPA 9/641/5005 7505430 02.09.767505430 02.09.76
DE19757505830 1975-02-25 1975-02-25 DEVICE FOR HIGH-VOLTAGE-PROOF AND GOOD THERMAL CONDUCTING INSTALLATION OF SEMICONDUCTOR COMPONENTS Expired DE7505830U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
DE19757505830 DE7505830U (en) 1975-02-25 1975-02-25 DEVICE FOR HIGH-VOLTAGE-PROOF AND GOOD THERMAL CONDUCTING INSTALLATION OF SEMICONDUCTOR COMPONENTS

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE19757505830 DE7505830U (en) 1975-02-25 1975-02-25 DEVICE FOR HIGH-VOLTAGE-PROOF AND GOOD THERMAL CONDUCTING INSTALLATION OF SEMICONDUCTOR COMPONENTS

Publications (1)

Publication Number Publication Date
DE7505830U true DE7505830U (en) 1976-09-02

Family

ID=31958831

Family Applications (1)

Application Number Title Priority Date Filing Date
DE19757505830 Expired DE7505830U (en) 1975-02-25 1975-02-25 DEVICE FOR HIGH-VOLTAGE-PROOF AND GOOD THERMAL CONDUCTING INSTALLATION OF SEMICONDUCTOR COMPONENTS

Country Status (1)

Country Link
DE (1) DE7505830U (en)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3611658A1 (en) * 1985-04-05 1986-10-16 Omron Tateisi Electronics Co., Kyoto ELECTRONIC COMPONENT ASSEMBLY
DE3715137A1 (en) * 1987-05-07 1988-11-24 Franz Schauer MOUNTING CARRIER WITH ELECTRICAL MONITORING CIRCUIT FOR HEATING CIRCUITS
DE4224720A1 (en) * 1992-07-27 1994-02-03 Duerrwaechter E Dr Doduco Circuit housing for motor vehicle ignition circuitry - has water-tight lid, moulded electrical connector and heat sink for power semiconductor devices moulded into wall of housing
DE4327335A1 (en) * 1993-08-15 1995-02-16 Kathrein Werke Kg Mounting construction for a cooling device
DE9413550U1 (en) * 1994-08-23 1996-01-11 Dylec Ltd Semiconductor arrangement with at least one semiconductor component
DE19904279A1 (en) * 1999-02-03 2000-08-17 Sew Eurodrive Gmbh & Co Semiconductor component, especially for an electric motor frequency converter, has an electrically non-conductive housing directly surrounding cooling bodies of a non-insulated power semiconductor housing

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3611658A1 (en) * 1985-04-05 1986-10-16 Omron Tateisi Electronics Co., Kyoto ELECTRONIC COMPONENT ASSEMBLY
DE3715137A1 (en) * 1987-05-07 1988-11-24 Franz Schauer MOUNTING CARRIER WITH ELECTRICAL MONITORING CIRCUIT FOR HEATING CIRCUITS
DE4224720A1 (en) * 1992-07-27 1994-02-03 Duerrwaechter E Dr Doduco Circuit housing for motor vehicle ignition circuitry - has water-tight lid, moulded electrical connector and heat sink for power semiconductor devices moulded into wall of housing
DE4327335A1 (en) * 1993-08-15 1995-02-16 Kathrein Werke Kg Mounting construction for a cooling device
DE9413550U1 (en) * 1994-08-23 1996-01-11 Dylec Ltd Semiconductor arrangement with at least one semiconductor component
DE19904279A1 (en) * 1999-02-03 2000-08-17 Sew Eurodrive Gmbh & Co Semiconductor component, especially for an electric motor frequency converter, has an electrically non-conductive housing directly surrounding cooling bodies of a non-insulated power semiconductor housing
DE19904279B4 (en) * 1999-02-03 2005-09-01 Sew-Eurodrive Gmbh & Co. Kg Semiconductor device

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