DE602005010215D1 - Elektronische stream-verarbeitungsschaltung mit testzugang - Google Patents

Elektronische stream-verarbeitungsschaltung mit testzugang

Info

Publication number
DE602005010215D1
DE602005010215D1 DE602005010215T DE602005010215T DE602005010215D1 DE 602005010215 D1 DE602005010215 D1 DE 602005010215D1 DE 602005010215 T DE602005010215 T DE 602005010215T DE 602005010215 T DE602005010215 T DE 602005010215T DE 602005010215 D1 DE602005010215 D1 DE 602005010215D1
Authority
DE
Germany
Prior art keywords
circuits
stream
mux
stream processing
processing circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
DE602005010215T
Other languages
English (en)
Inventor
Dalen Edwin J Van
Paulus W Gruijters
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NXP BV
Original Assignee
NXP BV
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NXP BV filed Critical NXP BV
Publication of DE602005010215D1 publication Critical patent/DE602005010215D1/de
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
    • G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
    • G01R31/318541—Scan latches or cell details
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
DE602005010215T 2004-02-19 2005-02-02 Elektronische stream-verarbeitungsschaltung mit testzugang Active DE602005010215D1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
EP04100657 2004-02-19
PCT/IB2005/050438 WO2005083455A1 (en) 2004-02-19 2005-02-02 An electronic stream processing circuit with test access

Publications (1)

Publication Number Publication Date
DE602005010215D1 true DE602005010215D1 (de) 2008-11-20

Family

ID=34896088

Family Applications (1)

Application Number Title Priority Date Filing Date
DE602005010215T Active DE602005010215D1 (de) 2004-02-19 2005-02-02 Elektronische stream-verarbeitungsschaltung mit testzugang

Country Status (8)

Country Link
US (1) US7933207B2 (de)
EP (1) EP1718981B1 (de)
JP (1) JP2007524095A (de)
KR (1) KR20060133581A (de)
CN (1) CN1922502B (de)
AT (1) ATE410701T1 (de)
DE (1) DE602005010215D1 (de)
WO (1) WO2005083455A1 (de)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2013106210A1 (en) 2012-01-10 2013-07-18 Intel Corporation Electronic apparatus having parallel memory banks

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6304987B1 (en) * 1995-06-07 2001-10-16 Texas Instruments Incorporated Integrated test circuit
JP2738297B2 (ja) * 1994-04-28 1998-04-08 日本電気株式会社 半導体集積回路
US5481186A (en) * 1994-10-03 1996-01-02 At&T Corp. Method and apparatus for integrated testing of a system containing digital and radio frequency circuits
AU4071499A (en) 1998-05-08 1999-11-29 C-Port Corporation Digital communications processor
US7100020B1 (en) * 1998-05-08 2006-08-29 Freescale Semiconductor, Inc. Digital communications processor
CN1190076C (zh) 2001-08-06 2005-02-16 松下电器产业株式会社 数据流处理器
ATE355534T1 (de) 2001-09-20 2006-03-15 Koninkl Philips Electronics Nv Elektronisches gerät

Also Published As

Publication number Publication date
JP2007524095A (ja) 2007-08-23
CN1922502B (zh) 2010-06-16
US7933207B2 (en) 2011-04-26
US20070165681A1 (en) 2007-07-19
WO2005083455A1 (en) 2005-09-09
CN1922502A (zh) 2007-02-28
KR20060133581A (ko) 2006-12-26
EP1718981A1 (de) 2006-11-08
EP1718981B1 (de) 2008-10-08
ATE410701T1 (de) 2008-10-15

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition