DE2842346C2 - - Google Patents

Info

Publication number
DE2842346C2
DE2842346C2 DE2842346A DE2842346A DE2842346C2 DE 2842346 C2 DE2842346 C2 DE 2842346C2 DE 2842346 A DE2842346 A DE 2842346A DE 2842346 A DE2842346 A DE 2842346A DE 2842346 C2 DE2842346 C2 DE 2842346C2
Authority
DE
Germany
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
DE2842346A
Other languages
German (de)
Other versions
DE2842346A1 (en
Inventor
Shigeyuki Ochi
Takeo Machida Tokio/Tokyo Jp Hashimoto
Yoshiaki Yokohama Kanagawa Jp Hagiwara
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sony Corp
Original Assignee
Sony Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sony Corp filed Critical Sony Corp
Publication of DE2842346A1 publication Critical patent/DE2842346A1/en
Application granted granted Critical
Publication of DE2842346C2 publication Critical patent/DE2842346C2/de
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J29/00—Details of cathode-ray tubes or of electron-beam tubes of the types covered by group H01J31/00
    • H01J29/02—Electrodes; Screens; Mounting, supporting, spacing or insulating thereof
    • H01J29/10—Screens on or from which an image or pattern is formed, picked up, converted or stored
    • H01J29/36—Photoelectric screens; Charge-storage screens
    • H01J29/39—Charge-storage screens
    • H01J29/45—Charge-storage screens exhibiting internal electric effects caused by electromagnetic radiation, e.g. photoconductive screen, photodielectric screen, photovoltaic screen
    • H01J29/451—Charge-storage screens exhibiting internal electric effects caused by electromagnetic radiation, e.g. photoconductive screen, photodielectric screen, photovoltaic screen with photosensitive junctions
    • H01J29/453—Charge-storage screens exhibiting internal electric effects caused by electromagnetic radiation, e.g. photoconductive screen, photodielectric screen, photovoltaic screen with photosensitive junctions provided with diode arrays
    • H01J29/455—Charge-storage screens exhibiting internal electric effects caused by electromagnetic radiation, e.g. photoconductive screen, photodielectric screen, photovoltaic screen with photosensitive junctions provided with diode arrays formed on a silicon substrate
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144—Devices controlled by radiation
    • H01L27/146—Imager structures
    • H01L27/148—Charge coupled imagers
    • H01L27/14831—Area CCD imagers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144—Devices controlled by radiation
    • H01L27/146—Imager structures
    • H01L27/148—Charge coupled imagers
    • H01L27/14887—Blooming suppression
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/50—Control of the SSIS exposure
    • H04N25/57—Control of the dynamic range
    • H04N25/571—Control of the dynamic range involving a non-linear response
    • H04N25/575—Control of the dynamic range involving a non-linear response with a response composed of multiple slopes
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/71—Charge-coupled device [CCD] sensors; Charge-transfer registers specially adapted for CCD sensors
    • H04N25/73—Charge-coupled device [CCD] sensors; Charge-transfer registers specially adapted for CCD sensors using interline transfer [IT]

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Power Engineering (AREA)
  • Electromagnetism (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Signal Processing (AREA)
  • General Physics & Mathematics (AREA)
  • Multimedia (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Nonlinear Science (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
  • Solid State Image Pick-Up Elements (AREA)
  • Picture Signal Circuits (AREA)
DE19782842346 1977-09-29 1978-09-28 IMAGE SCANTER IN SOLID TECHNOLOGY Granted DE2842346A1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP12688577A JPS5451318A (en) 1977-09-29 1977-09-29 Solid pickup unit

Publications (2)

Publication Number Publication Date
DE2842346A1 DE2842346A1 (en) 1979-04-12
DE2842346C2 true DE2842346C2 (en) 1987-05-14

Family

ID=14946246

Family Applications (1)

Application Number Title Priority Date Filing Date
DE19782842346 Granted DE2842346A1 (en) 1977-09-29 1978-09-28 IMAGE SCANTER IN SOLID TECHNOLOGY

Country Status (6)

Country Link
JP (1) JPS5451318A (en)
CA (1) CA1125421A (en)
DE (1) DE2842346A1 (en)
FR (1) FR2409646A1 (en)
GB (1) GB2007937B (en)
NL (1) NL7809866A (en)

Families Citing this family (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS55151592U (en) * 1979-04-19 1980-10-31
JPS55163882A (en) * 1979-06-06 1980-12-20 Nec Corp System for driving charge transfer element
JPS55163956A (en) * 1979-06-08 1980-12-20 Nec Corp Shift register and its driving method
JPS55163953A (en) * 1979-06-08 1980-12-20 Nec Corp Ccd shift register
DE2939403A1 (en) * 1979-09-28 1981-04-16 Siemens AG, 1000 Berlin und 8000 München MONOLITHICALLY INTEGRATED CIRCUIT FOR LINE SCREENING
JPS5665578A (en) * 1979-10-31 1981-06-03 Fujitsu Ltd Two dimensional solidstate image sensor
JPS5685981A (en) * 1979-12-15 1981-07-13 Sharp Corp Solid image pickup apparatus
JPS56104582A (en) * 1980-01-25 1981-08-20 Toshiba Corp Solid image pickup device
JPS56136086A (en) * 1980-03-27 1981-10-23 Fujitsu Ltd Two-dimensional image pickup device
JPS56160081A (en) * 1980-05-14 1981-12-09 Matsushita Electronics Corp Solid state image pickup apparatus
EP0065599B1 (en) * 1981-05-19 1986-01-29 Texas Instruments Incorporated Infrared imaging system with infrared detector matrix, and method of imaging infrared energy
DE3121494A1 (en) * 1981-05-29 1983-01-05 Siemens AG, 1000 Berlin und 8000 München ARRANGEMENT FOR THE CONTACTLESS MEASUREMENT OF ELECTRICAL CHARGE IMAGES IN ELECTRORADIOGRAPHIC RECORDING METHODS
DE3172696D1 (en) * 1981-06-03 1985-11-28 Texas Instruments Inc Infrared energy detector system utilizing a charge transfer device sensor
JPS586682A (en) * 1981-07-06 1983-01-14 Sony Corp Solid-state image pickup device
JPS5847378A (en) * 1981-09-17 1983-03-19 Canon Inc Image pickup element
JPS58142570A (en) * 1982-02-19 1983-08-24 Sony Corp Solid-state image pickup device
JPS60254770A (en) * 1984-05-31 1985-12-16 Fujitsu Ltd Charge transfer device
JPS61144874A (en) * 1984-12-19 1986-07-02 Toshiba Corp Charge transfer device
NL8503243A (en) * 1985-11-25 1987-06-16 Optische Ind De Oude Delft Nv IMAGE RECORDING DEVICE FOR DIGITAL RADIOGRAPHY.
JPH07107928B2 (en) * 1986-03-25 1995-11-15 ソニー株式会社 Solid-state imaging device
JPH02113678A (en) * 1988-10-21 1990-04-25 Nec Corp Solid state image pickup device
US5055667A (en) * 1990-06-21 1991-10-08 Loral Fairchild Corporation Non-linear photosite response in CCD imagers
US5276520A (en) * 1991-06-07 1994-01-04 Eastman Kodak Company Enhancing exposure latitude of image sensors
FR2687265A1 (en) * 1993-01-08 1993-08-13 Scanera Sc Electronic image acquisition device with very high dynamic range, and method of acquiring images of very highly contrasted scenes

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5654115B2 (en) * 1974-03-29 1981-12-23
US3931465A (en) * 1975-01-13 1976-01-06 Rca Corporation Blooming control for charge coupled imager
JPS5937629B2 (en) * 1975-01-30 1984-09-11 ソニー株式会社 solid-state imaging body
US3953733A (en) * 1975-05-21 1976-04-27 Rca Corporation Method of operating imagers
JPS5846905B2 (en) * 1975-11-10 1983-10-19 ソニー株式会社 Kotai Satsuzou Sochi
JPS52109825A (en) * 1976-03-11 1977-09-14 Sony Corp Solid state pick up unit

Also Published As

Publication number Publication date
DE2842346A1 (en) 1979-04-12
FR2409646B1 (en) 1983-11-18
JPS5451318A (en) 1979-04-23
GB2007937A (en) 1979-05-23
FR2409646A1 (en) 1979-06-15
CA1125421A (en) 1982-06-08
NL7809866A (en) 1979-04-02
GB2007937B (en) 1982-03-03

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Legal Events

Date Code Title Description
8110 Request for examination paragraph 44
D2 Grant after examination
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee