CN2465197Y - Test platform for scanning tunnel mivroscope - Google Patents

Test platform for scanning tunnel mivroscope Download PDF

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Publication number
CN2465197Y
CN2465197Y CN 01201380 CN01201380U CN2465197Y CN 2465197 Y CN2465197 Y CN 2465197Y CN 01201380 CN01201380 CN 01201380 CN 01201380 U CN01201380 U CN 01201380U CN 2465197 Y CN2465197 Y CN 2465197Y
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CN
China
Prior art keywords
test board
scanning tunnel
needle point
pedestal
tunnel microscope
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Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CN 01201380
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Chinese (zh)
Inventor
徐延安
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Individual
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Individual
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Priority to CN 01201380 priority Critical patent/CN2465197Y/en
Application granted granted Critical
Publication of CN2465197Y publication Critical patent/CN2465197Y/en
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Expired - Fee Related legal-status Critical Current

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Abstract

The utility model discloses a test table for scanning tunnel microscopes (STM), which is used for analyzing and studying material nanon characteristics. The utility model is characterized in that the utility model can observe and analyze samples on the side without a reflector in a light path, can coarsely adjust the longitudinal position of a sample table, has a vibration damping device and a shielding cover and can evidently enhance the accuracy and efficiency of analysis and test.

Description

The scanning tunnel microscope test board
The utility model relates to the material analysis instrument, particularly is used for the scanning tunnel microscope test board of nano ZnO test.
Scanning tunnel microscope (STM) has the atom visualization capabilities, is mainly used in the geometry and the physicochemical property relevant with electronic behavior of the atom and the molecule of research material surface.STM also is the important tool in the nanosecond science and technology.Because STM can reach the accurate location of atom level on the surface, its probe also can exert an influence to very limited zone, surface, thereby for a small laboratory is provided on the nanoscale, STM can become the instrument that the surface is carried out modification on nanoscale, for having opened up wide application prospect in nanometer manufacturing field.
Research of nanometer technology at present and application develop rapidly, when nano material is carried out analytical test, need to use scanning tunnel microscope, the sample that is observed is placed on the special test board, special probe and lasing light emitter and laser pickoff are arranged thereon, also have and regulate the regulating device that is observed sample position and optical receiver position.Existing scanning tunnel microscope test board has following deficiency:
1, laser instrument and receiver horizontal positioned, and be contained in respectively on the three peacekeeping two-dimensional adjustment framves, above the light path of laser, be provided with two reflective mirrors, influence operator's observing samples, and structure is also complicated; Because optical path length, light is easily dispersed, and hot spot is big, and sensitivity is reduced, and because of governing loop makes complicated operation more, also brings some labile factors.
2, test board is all covered by a sleeve, change in location situation that from the side can not observation sample when adjusting in the position of carrying out sample, and operation easier increases, the fragile needle point of maloperation, sample and piezoelectric ceramic tube.
3, because sample size differs, and specimen holder and needle point have tens millimeters spacings, instrument adopts stepper motor to drive lifting at present, motor 7.5 nanometers of whenever running on foot, general lifting is all wanted 15-20 minute, for the position adjustment needs of the sample of large volume for a long time, very inconvenient, lose time.
4, small on every side vibration is constantly, does not have vibration absorber, and the test of nano material is had the influence of can not ignore.
5, the unshielded device of whole test board when STM works, the precision of electromagnetic field on every side, air-flow, dust and influence of light test.
The purpose of this utility model is exactly to overcome above-mentioned deficiency, and a kind of reflective mirror that do not need is provided, can be at the several side observation sample, can coarse adjustment sample stage lengthwise position, and a kind of scanning tunnel microscope test board of vibration absorber and radome is arranged.
The technical solution of the utility model is: it comprises laser instrument, the laser pickoff that sets gradually from top to bottom, and two fine setting platforms, be positioned at the probe pinpoint below the laser instrument and the needle point frame of connection thereof, specimen platform and following piezoelectric ceramic tube, and x, y, z are to regulator, this regulating device places in the overcoat, it is characterized in that: the light beam direct irradiation that described laser instrument sends is also directly reflexing on the laser pickoff on the probe pinpoint; The 10mm eye split is arranged below sample stage, can observe from the side; The lifting regulator of described sample stage is provided with the coarse adjustment device; One vibration absorber is arranged at the bottom of described test board; Be with a radome in whole test board outside.
Described coarse adjustment device comprise be arranged on described regulating device jacket bottom center longitudinally screw hole and and the adjusting handle of its supporting screw rod and lower end thereof: be slidingly matched between regulating device and the overcoat, can be along the longitudinal movement with the rotation of screw rod.
Described vibration absorber comprises pedestal and is arranged on 3-8 shock-absorbing spring of this pedestal periphery, the lower end of this spring places on the pedestal, its upper end be enclosed within one with sleeve that test board is connected in, there is a circular hole at the upper base center of this sleeve, at the center of this spring the one longitudinal register post that is fixed on the pedestal is arranged, the circular hole of above-mentioned sleeve upper base is passed in the upper end of this reference column.
Described radome is bell, can shield electromagnetic, light and air-flow, a transparent view window is arranged on its top.
The utility model has the advantages that:
1, laser instrument is directly aimed at probe pinpoint, and directly reflex on the laser pickoff, removed in the prior art at the incident of laser and two catoptrons in the reflection way, not only simplify the structure, also eliminated the influence of catoptron to operator's sight line, because light path shortens, and sensitivity and stability are improved.
2, prior art middle probe point and sample stage all place in the sleeve of a sealing, can not observe needle point and sample two sides, make the position of before test bad adjusting needle point and sample, often transfer not in place or needle point is knocked state sample and piezoelectric ceramic tube causes damage.The utility model leaves the gap and can detect by an unaided eye when the position of preliminary adjusting sample and needle point in the side of needle point and sample stage, avoided the generation of above-mentioned situation.
3, the rack and rinion adjustment of the present utility model lifting of quick adjustment sample stage easily can reduce to half a minute from 15-20 minute.
4, vibration absorber has significantly reduced the influence of small vibration to test, makes test result more accurate.
5, radome has shielded the influence of test site electromagnetic field, air-flow and light on every side to test, has improved measuring accuracy.
The utility model is described in further detail below in conjunction with drawings and Examples.
Fig. 1 be in the prior art laser beam through the light path synoptic diagram of two mirror reflects;
Fig. 2 is a general structure cross-sectional schematic of the present utility model.
Laser beam is through the situation of two mirror reflects in the test board of prior art shown in Figure 1.The light beam that laser instrument 1 sends is got on the needle point seat 10 after catoptron 14 reflections, arrives on the receiver 2 through catoptron 15 reflections again.Two catoptrons 14 and 15 have influence on from top observation sample and light beam regulation above sample stage as can be seen.
Fig. 2 is a general illustration of the present utility model, it comprises laser instrument 1, the laser pickoff 2 that sets gradually from top to bottom, two fine setting platforms 3 and 4, be positioned at test needle point and connected needle point seat 10 below the laser instrument, it below the specimen holder 5 piezoelectric ceramic tube 6, they place x, y, z in adjustment seat 9, and this regulating device places in the overcoat 16.The light beam direct irradiation that described laser instrument 1 sends and directly reflexes on the laser pickoff 2 on needle point.There is eye split the side between specimen holder 5 and needle point; The adjustment seat 9 of described specimen holder 5 is provided with coarse adjustment device 7.One vibration absorber 8 is arranged at the bottom of described test board: be with a radome 13 in whole test board outside.
Described coarse adjustment device 7 comprises and is arranged on the described regulating device overcoat 16 bottom centre adjusting handle 73 of screw hole 71 and screw rod supporting with it 72 and lower end thereof longitudinally; Be slidingly matched between described adjustment seat 9 and the overcoat 16, can be along the longitudinal movement with the rotation of described screw rod 72.
Described vibration absorber 8 comprises pedestal 81 and is arranged on 3-8 shock-absorbing spring 82 of this pedestal periphery, the lower end of this spring places on the pedestal 81, its upper end is enclosed within the sleeve that is connected with test board 83, there is a circular hole at the upper base center of this sleeve, at the center of this spring the one longitudinal register post 84 that is fixed on the pedestal is arranged, the upper end of this reference column is passed in the above-mentioned sleeve circular hole.
Described radome 13 is bell, can shield electromagnetic, light and air-flow, a transparent view window is arranged on its top.

Claims (4)

1, a kind of scanning tunnel microscope test board, comprise the laser instrument, the laser pickoff that set gradually from top to bottom, two fine setting platforms, be positioned at needle point and connected needle point seat below the laser instrument, specimen seat and x thereof, y, z are to adjustment seat, this regulating device places in the overcoat, it is characterized in that: the light beam direct irradiation that described laser instrument sends is at the test needle point and directly reflex on the laser pickoff; There is eye split the side around between sample stage and needle point; The adjustment seat of described sample stage is provided with the coarse adjustment device; One vibration absorber is arranged at the bottom of described test board; Be with a radome in whole test board outside.
2, scanning tunnel microscope test board according to claim 1 is characterized in that: described coarse adjustment device comprises and is arranged on the described adjustment seat jacket bottom center adjusting handle of screw hole and screw rod supporting with it and lower end thereof longitudinally; Be slidingly matched between described adjustment seat and the overcoat, can be along the longitudinal movement with the rotation of described screw rod.
3, scanning tunnel microscope test board according to claim 1, it is characterized in that: described vibration absorber comprises pedestal and is arranged on 3-8 shock-absorbing spring of this pedestal periphery, the lower end of this spring places on the pedestal, its upper end be enclosed within one with sleeve that test board is connected in, there is a circular hole at the upper base center of this sleeve, at the center of this spring the one longitudinal register post that is fixed on the pedestal is arranged, the circular hole of above-mentioned sleeve upper base is passed in the upper end of this orientation post.
4, scanning tunnel microscope test board according to claim 1 is characterized in that: described radome is bell, can shield electromagnetic, air-flow and light, a transparent view window is arranged on its top.
CN 01201380 2001-02-13 2001-02-13 Test platform for scanning tunnel mivroscope Expired - Fee Related CN2465197Y (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN 01201380 CN2465197Y (en) 2001-02-13 2001-02-13 Test platform for scanning tunnel mivroscope

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN 01201380 CN2465197Y (en) 2001-02-13 2001-02-13 Test platform for scanning tunnel mivroscope

Publications (1)

Publication Number Publication Date
CN2465197Y true CN2465197Y (en) 2001-12-12

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Application Number Title Priority Date Filing Date
CN 01201380 Expired - Fee Related CN2465197Y (en) 2001-02-13 2001-02-13 Test platform for scanning tunnel mivroscope

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CN (1) CN2465197Y (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105849616A (en) * 2013-10-25 2016-08-10 Isis创新有限公司 Compact microscope
CN109696403A (en) * 2017-10-23 2019-04-30 中国科学院重庆绿色智能技术研究院 A kind of sample room for immersion micro-imaging
CN111549339A (en) * 2020-05-22 2020-08-18 蚌埠学院 Method for enhancing bonding fastness of graphene and base material
US10962755B2 (en) 2015-04-24 2021-03-30 Oxford University Innovation Limited Compact microscope

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105849616A (en) * 2013-10-25 2016-08-10 Isis创新有限公司 Compact microscope
CN105849616B (en) * 2013-10-25 2019-06-07 牛津大学科技创新有限公司 Compact microscope
US10962755B2 (en) 2015-04-24 2021-03-30 Oxford University Innovation Limited Compact microscope
US11703673B2 (en) 2015-04-24 2023-07-18 Oxford University Innovation Limited Compact microscope
CN109696403A (en) * 2017-10-23 2019-04-30 中国科学院重庆绿色智能技术研究院 A kind of sample room for immersion micro-imaging
CN109696403B (en) * 2017-10-23 2021-08-13 中国科学院重庆绿色智能技术研究院 Sample chamber for immersed microscopic imaging
CN111549339A (en) * 2020-05-22 2020-08-18 蚌埠学院 Method for enhancing bonding fastness of graphene and base material

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GR01 Patent grant
C19 Lapse of patent right due to non-payment of the annual fee
CF01 Termination of patent right due to non-payment of annual fee