CN219162300U - Radio frequency S parameter measuring device - Google Patents

Abstract

The utility model discloses a radio frequency S parameter measuring device which comprises a vector network analyzer, an frequency-lifting device and a channel switching device, wherein the frequency-lifting device is coupled with the vector network analyzer and the channel switching device. The channel switching device transmits a high-frequency vector signal to the object to be detected, the object to be detected reflects the high-frequency vector signal to form a high-frequency reflection vector signal, and the high-frequency vector signal transmits the object to be detected to form a high-frequency transmission vector signal. The frequency up-down device receives the high-frequency vector signal, the high-frequency reflection vector signal and the high-frequency transmission vector signal to generate a low-frequency vector signal, a low-frequency reflection vector signal and a low-frequency transmission vector signal. The vector network analyzer receives and analyzes the low frequency vector signal, the low frequency reflection vector signal and the low frequency transmission vector signal to obtain an S parameter measurement value.

Description

Radio frequency S parameter measuring device

Technical Field

The present utility model relates to a measuring device, and more particularly to a radio frequency S parameter measuring device.

Background

The scattering parameter used in the design of high-frequency circuits, the so-called S-parameter (Scattering Parameters), is designed because absolute opens or shorts are very difficult to define in the high-frequency domain and the total voltage and current are not easily measured in the network. And some active components such as transistors, diodes, etc. cannot operate stably in open or short circuit environments. The high frequency, more easily measured, incident and reflected power must therefore be used to define the parameters of the circuit, the so-called S-parameters.

In general, the S-parameter measurement apparatus is a vector network analyzer (Vector network analyzer, VNA), but in a radio frequency Integrated Circuit (IC) production line, other Radio Frequency (RF) test items, such as a db (decibel compression point) output power (pdb), a spectral mask (spectral mask), an Error Vector Magnitude (EVM), and an Adjacent Channel Power Ratio (ACPR), must be measured, which are portions that cannot be measured by the vector network analyzer. In addition, the vector network analyzer can support the S parameter measurement of millimeter wave frequency band, but has high price. For portions of the vector network analyzer that cannot be measured, measurements can be made with a vector signal generator (Vector signal generator, VSG) and a vector signal analyzer (vector signal analyzer, VSA). However, the vector signal generator and the vector signal analyzer can only support frequencies below 6 gigahertz (GHz), but cannot support S-parameter measurement in the millimeter wave band, i.e., 28 to 39 GHz.

Therefore, the present utility model provides a device for measuring the rf S-parameters to solve the conventional problems.

Disclosure of Invention

The main object of the present utility model is to provide a radio frequency S parameter measuring device, which measures high frequency S parameters, such as millimeter wave band S parameters, at low cost.

In an embodiment of the utility model, a radio frequency S parameter measurement device is coupled to an object to be measured, and the radio frequency S parameter measurement device includes a vector network analyzer, an up-down frequency device and a channel switching device. The vector network analyzer is used for generating a low-frequency vector signal. The frequency-raising device is coupled to the vector network analyzer, wherein the frequency-raising device is used for receiving the low-frequency vector signal and the high-frequency signal and generating a high-frequency vector signal by using the low-frequency vector signal and the high-frequency signal. The channel switching device is provided with a first port and a second port, the object to be detected is coupled between the first port and the second port, and the channel switching device is coupled with the frequency raising and lowering device. The channel switching device is used for transmitting a high-frequency vector signal to the object to be detected, the object to be detected reflects the high-frequency vector signal to form a high-frequency reflection vector signal, and the high-frequency vector signal transmits the object to be detected to form a high-frequency transmission vector signal. The frequency raising and lowering device is used for receiving the high-frequency vector signal, the high-frequency reflection vector signal and the high-frequency transmission vector signal so as to generate a low-frequency vector signal, a low-frequency reflection vector signal and a low-frequency transmission vector signal by utilizing the high-frequency vector signal, the high-frequency reflection vector signal and the high-frequency transmission vector signal. The vector network analyzer is used for receiving and analyzing the low-frequency vector signal, the low-frequency reflection vector signal and the low-frequency transmission vector signal to obtain an S parameter measurement value.

In an embodiment of the utility model, the radio frequency S parameter measurement apparatus further includes a high frequency signal generator and a signal distributor. The high-frequency signal generator is used for generating a high-frequency signal, and the signal distributor is coupled with the high-frequency signal generator and the frequency raising and lowering device. The signal distributor is used for receiving and distributing the high-frequency signal to the frequency raising and lowering device.

In an embodiment of the utility model, the frequency raising and lowering device includes a first mixer, a second mixer, a third mixer and a fourth mixer. The first mixer and the second mixer are coupled to the signal distributor and the vector network analyzer. When the first mixer receives the low-frequency vector signal and the high-frequency vector signal and generates the high-frequency vector signal by using the low-frequency vector signal and the high-frequency vector signal, the second mixer receives the high-frequency vector signal and the high-frequency transmission vector signal and generates the low-frequency transmission vector signal by using the high-frequency vector signal and the high-frequency transmission vector signal. When the first mixer receives the high-frequency signal and the high-frequency transmission vector signal and generates the low-frequency transmission vector signal by using the high-frequency signal and the high-frequency transmission vector signal, the second mixer receives the low-frequency vector signal and the high-frequency signal and generates the high-frequency vector signal by using the low-frequency vector signal and the high-frequency signal. The third mixer is coupled to the signal distributor and the vector network analyzer. The third mixer is used for receiving the high-frequency signal and the high-frequency vector signal and generating a low-frequency vector signal by utilizing the high-frequency signal and the high-frequency vector signal. The fourth mixer is coupled to the signal distributor and the vector network analyzer. The fourth mixer is used for receiving the high-frequency signal and the high-frequency reflection vector signal and generating a low-frequency reflection vector signal by utilizing the high-frequency signal and the high-frequency reflection vector signal.

In an embodiment of the utility model, the radio frequency S parameter measurement apparatus further includes a first band-pass filter, a second band-pass filter, a third band-pass filter, a fourth band-pass filter, a fifth band-pass filter and a sixth band-pass filter. The first band-pass filter is coupled between the first mixer and the vector network analyzer, wherein the first band-pass filter is used for filtering spurious signals generated by the first mixer. The second band-pass filter is coupled between the first mixer and the channel switching device, wherein the second band-pass filter is used for filtering spurious signals generated by the first mixer. The third band-pass filter is coupled between the vector network analyzer and the second mixer, wherein the third band-pass filter is used for filtering spurious signals generated by the second mixer. The fourth band-pass filter is coupled between the second mixer and the channel switching device, wherein the fourth band-pass filter is used for filtering spurious signals generated by the second mixer. The fifth band-pass filter is coupled between the third mixer and the vector network analyzer, wherein the fifth band-pass filter is used for filtering spurious signals generated by the third mixer. The sixth band-pass filter is coupled between the fourth mixer and the vector network analyzer, wherein the sixth band-pass filter is used for filtering spurious signals generated by the fourth mixer.

In an embodiment of the utility model, the radio frequency S parameter measurement apparatus further includes a first amplifier, a second amplifier, a third amplifier, a fourth amplifier, a fifth amplifier and a sixth amplifier. The first amplifier is coupled between the fifth band-pass filter and the vector network analyzer, wherein the first amplifier is used for amplifying the power of the low-frequency vector signal. The second amplifier is coupled between the fourth mixer and the vector network analyzer, wherein the second amplifier is used for amplifying the power of the low-frequency reflection vector signal. The third amplifier is coupled between the signal distributor and the first mixer, wherein the third amplifier is used for amplifying the power of the high-frequency signal. The fourth amplifier is coupled between the signal distributor and the second mixer, wherein the fourth amplifier is used for amplifying the power of the high-frequency signal. The fifth amplifier is coupled between the signal distributor and the third mixer, wherein the fifth amplifier is used for amplifying the power of the high-frequency signal. The sixth amplifier is coupled between the signal distributor and the fourth mixer, wherein the sixth amplifier is used for amplifying the power of the high-frequency signal.

In an embodiment of the utility model, the channel switching device further includes a first directional coupler, a second directional coupler, a first channel switch and a second channel switch. The first directional coupler is coupled to the first mixer and the first port, and the second directional coupler is coupled to the second port and the second mixer. The first channel switch is coupled to the third mixer, the first directional coupler and the second directional coupler, and the second channel switch is coupled to the first directional coupler, the second directional coupler and the fourth mixer.

In an embodiment of the present utility model, the first directional coupler is configured to transmit the high frequency vector signal to the object to be tested, and the first directional coupler and the first channel switch are configured to transmit the high frequency vector signal to the third mixer. The first directional coupler and the second channel switch are used for transmitting the high-frequency reflection vector signal to the fourth mixer, and the second directional coupler is used for transmitting the high-frequency transmission vector signal to the second mixer.

In an embodiment of the present utility model, the second directional coupler is configured to transmit the high frequency vector signal to the object to be tested, and the second directional coupler and the first channel switch are configured to transmit the high frequency vector signal to the third mixer. The second directional coupler and the second channel switch are used for transmitting the high-frequency reflection vector signal to the fourth mixer, and the first directional coupler is used for transmitting the high-frequency transmission vector signal to the first mixer.

In an embodiment of the present utility model, the frequency of the low frequency vector signal belongs to the microwave (microwave) band, and the frequency of the high frequency signal belongs to the microwave band or the millimeter wave (mm wave) band.

In one embodiment of the present utility model, the S-parameter measurements include a forward reflection parameter measurement, a forward feed parameter measurement, a reverse reflection parameter measurement, and a reverse feed parameter measurement.

Based on the above, the radio frequency S parameter measuring device adopts the frequency up-conversion and frequency down-conversion technology to measure the S parameter of high frequency, such as the S parameter of millimeter wave frequency band, with low cost.

Drawings

Fig. 1 is a schematic circuit diagram of an rf S parameter measurement apparatus according to an embodiment of the utility model.

Fig. 2 is a schematic circuit diagram of a radio frequency S parameter measurement device for measuring a forward reflection parameter measurement value and a forward feeding parameter measurement value according to an embodiment of the utility model.

Fig. 3 is a schematic circuit diagram of an rf S-parameter measurement device for measuring a retroreflective parameter measurement and a retroreflective parameter measurement according to an embodiment of the utility model.

Fig. 4 is a graph of amplitude versus frequency of the measured values of the forward reflection parameters of the rf S-parameter measuring device of the present utility model and the prior art high frequency vector network analyzer.

Fig. 5 is a graph of amplitude versus frequency of the forward transmission parameter measurements of the rf S-parameter measurement device of the present utility model and a prior art high frequency vector network analyzer.

FIG. 6 is a graph of amplitude versus frequency of the reverse transmission parameter measurements of the RF S-parameter measurement device of the present utility model and a prior art high frequency vector network analyzer.

FIG. 7 is a graph of amplitude versus frequency of a measured value of a retroreflection parameter of the RF S-parameter measurement device of the present utility model and a prior art high frequency vector network analyzer.

FIG. 8 is a graph of amplitude error versus frequency for a forward reflection parameter measurement of a RF S-parameter measurement device of the present utility model.

FIG. 9 is a graph of amplitude error versus frequency for a forward transmission parameter measurement of a RF S-parameter measurement device according to the present utility model.

FIG. 10 is a graph of amplitude error versus frequency for a reverse transmission parameter measurement of a RF S-parameter measurement device of the present utility model.

FIG. 11 is a graph of amplitude error versus frequency for a retroreflective parameter measurement of an RF S-parameter measuring device of the present utility model.

FIG. 12 is a graph of phase error versus frequency for the forward reflection parameter measurements of the RF S-parameter measurement device of the present utility model.

FIG. 13 is a graph of phase error versus frequency for a forward transmission parameter measurement of a RF S-parameter measurement device according to the present utility model.

FIG. 14 is a graph of phase error versus frequency for reverse transmission parameter measurements of a RF S-parameter measurement device of the present utility model.

FIG. 15 is a graph of phase error versus frequency for a retroreflective parameter measurement of an RF S-parameter measurement device of the present utility model.

[ symbolic description ]

1 radio frequency S parameter measuring device

10 vector network analyzer

11 up-down frequency device

110 first mixer

111 second mixer

112 third mixer

113 fourth mixer

12-channel switching device

120 first port

121 second port

122 first directional coupler

123. Second directional coupler

124. First channel change-over switch

125. Second channel change-over switch

13 high frequency signal generator

14 signal distributor

B1 first band-pass filter

B2 second band-pass filter

B3 third bandpass filter

B4 fourth bandpass filter

B5 fifth bandpass filter

B6 sixth band-pass filter

A1 first amplifier

A2 second amplifier

A3 third amplifier

A4 fourth amplifier

A5 fifth amplifier

A6 sixth amplifier

2 object to be measured

LV low frequency vector signals

H high frequency signal

HV high frequency vector signal

HR high frequency reflection vector signal

HT high frequency transmission vector signal

LR low frequency reflection vector signal

LT low frequency transmission vector signal

A. B, F transceiver port

Detailed Description

Embodiments of the present utility model will be further illustrated by the following description in conjunction with the associated drawings. Wherever possible, the same reference numbers will be used throughout the drawings and the description to refer to the same or like parts. In the drawings, the shape and thickness may be exaggerated for simplicity and convenience. It is to be understood that components not specifically shown in the drawings or described in the specification are in a form known to those of ordinary skill in the art. Many variations and modifications may be made by one of ordinary skill in the art in light of the disclosure herein.

When an element is referred to as being "on …," it can be broadly interpreted as referring to the elements as being directly on the other element or intervening elements may be present. Conversely, when one component is referred to as being "directly on" another component, it can be without other components in between. As used herein, the term "and/or" includes any combination of one or more of the listed associated items.

The following description of "one embodiment" or "an embodiment" refers to a particular component, structure, or feature associated with at least one embodiment. Thus, the appearances of the phrase "one embodiment" or "an embodiment" in various places in the following are not necessarily all referring to the same embodiment. Furthermore, the particular features, structures, and characteristics of the embodiments may be combined in any suitable manner.

The disclosure is described with particular reference to the following examples, which are intended to be illustrative only, since various changes and modifications may be made therein by those skilled in the art without departing from the spirit and scope of the disclosure, the scope of which is defined by the appended claims. Throughout the specification and claims, the meaning of "a" and "the" include that such recitation includes "one or at least one" of the stated components or elements unless the context clearly dictates otherwise. Furthermore, as used in this disclosure, the singular articles also include a recitation of a plurality of elements or components unless it is apparent from the specific context to the exclusion of a plurality. Moreover, when used in this description and throughout the claims that follow, the meaning of "in" may include "in" and "on" unless the context clearly dictates otherwise. The use of the words (terms) throughout the specification and claims is to be taken in a generic and descriptive sense only and not for purposes of limitation, the term having the ordinary meaning as used in the art and in the context of the disclosure herein. Certain terms used to describe the present disclosure are discussed below, or elsewhere in this specification, to provide additional guidance to the practitioner (practioner) in the description regarding the present disclosure. The use of examples anywhere throughout this specification including any examples of words discussed herein is illustrative only, and certainly not limiting of the scope and meaning of this disclosure or any exemplary words. Likewise, the disclosure is not limited to the various embodiments set forth in this specification.

It will be appreciated that the words "comprising", "including", "having", "containing", "including" and the like as used herein are open-ended, i.e., are meant to include, but not be limited to. Furthermore, no single embodiment or claim of the utility model is intended to achieve all of the objects, advantages or features disclosed herein. Furthermore, the abstract sections and headings are for use only in assisting patent document searching and are not intended to limit the scope of the claims.

Furthermore, the term "electrically coupled" or "electrically connected" when used herein includes any direct or indirect electrical connection. For example, if a first device is electrically coupled to a second device, that connection may be made directly to the second device or indirectly to the second device through other devices or connection means. In addition, if the transmission and provision of electrical signals are described, those skilled in the art will recognize that attenuation or other non-ideal changes may be associated with the transmission of electrical signals, but the source and receiving end of the transmission or provision of electrical signals should be considered to be substantially the same signal unless specifically described. For example, if an electrical signal S is transmitted (or provided) from terminal a of the electronic circuit to terminal B of the electronic circuit, wherein a voltage drop may occur through the source of a transistor switch and/or possibly stray capacitance, the purpose of the design is to achieve certain specific technical effects if attenuation or other non-ideal variations in transmission (or provision) are not intended, the electrical signal S should be considered to be substantially the same signal at terminal a and terminal B of the electronic circuit.

Unless specifically stated otherwise, some terms or words, such as "can", "possible", "perhaps (mid d)", "perhaps (mid) or" can ", are generally intended to express that the present embodiments have, but may also be interpreted as features, components, or steps that may not be required. In other embodiments, these features, components, or steps may not be required.

In the following, a radio frequency S parameter measurement device according to the present utility model is provided, which uses an up-conversion and down-conversion technique to measure a high frequency S parameter, such as a millimeter wave S parameter, at a low cost.

Fig. 1 is a schematic circuit diagram of an rf S parameter measurement apparatus according to an embodiment of the utility model. Referring to fig. 1, the radio frequency S parameter measurement apparatus 1 includes a vector network analyzer 10, an up-down device 11 and a channel switching device 12, wherein the up-down device 11 is coupled to the vector network analyzer 10 and the channel switching device 12. The channel switching device 12 has a first port 120 and a second port 121, and an object 2 to be tested is coupled between the first port 120 and the second port 121.

The vector network analyzer 10 generates a low frequency vector signal LV. The up-down device 11 receives the low frequency vector signal LV and the high frequency signal H, and generates a high frequency vector signal HV by using the low frequency vector signal LV and the high frequency signal H. For the S parameter of the millimeter wave band, the frequency of the low frequency vector signal may be set to belong to the microwave (mi crowave) band, and the frequency of the high frequency signal may be set to belong to the microwave band or the millimeter wave (mm wave) band. The channel switching device 12 transmits the high-frequency vector signal HV to the object 2, and the object 2 reflects the high-frequency vector signal HV to form the high-frequency reflection vector signal HR, and the high-frequency vector signal HV transmits the object 2 to form the high-frequency transmission vector signal HT. The up-down device 11 receives the high-frequency vector signal HV, the high-frequency reflection vector signal HR and the high-frequency transmission vector signal HT to generate the low-frequency vector signal LV, the low-frequency reflection vector signal LR and the low-frequency transmission vector signal LT by using the high-frequency vector signal HV, the high-frequency reflection vector signal HR and the high-frequency transmission vector signal HT. The vector network analyzer 10 receives and analyzes the low frequency vector signal LV, the low frequency reflection vector signal LR, and the low frequency transmission vector signal LT to obtain S-parameter measurement values. The S-parameter measurements include a forward reflection parameter measurement, a forward feed parameter measurement, a reverse reflection parameter measurement, and a reverse feed parameter measurement. By measuring short circuit, open circuit, load, and passing (Short Open Load and Through, SOLT) standard calibration kit, S parameter calibration error value is established, and S parameter actual value can be calculated by using S parameter calibration error value and S parameter measurement value.

In some embodiments of the present utility model, the rf S-parameter measuring apparatus 1 may further include a high-frequency signal generator 13 and a signal distributor 14. The signal distributor 14 is coupled to the high frequency signal generator 13 and the frequency up-down device 11. The high-frequency signal generator 13 generates a high-frequency signal H, and the signal distributor 14 receives and distributes the high-frequency signal H to the frequency up-down device 11. The up-down device 11 may include a first mixer 110, a second mixer 111, a third mixer 112 and a fourth mixer 113. The first mixer 110, the second mixer 111, the third mixer 112 and the fourth mixer 113 are coupled to the signal splitter 14 and the vector network analyzer 10. When the first mixer 110 receives the low frequency vector signal LV and the high frequency signal H and generates the high frequency vector signal HV using the low frequency vector signal LV and the high frequency signal H, the second mixer 111 receives the high frequency signal H and the high frequency transmission vector signal HT and generates the low frequency transmission vector signal LT using the high frequency signal H and the high frequency transmission vector signal HT. When the first mixer 110 receives the high frequency signal H and the high frequency transmission vector signal HT and generates the low frequency transmission vector signal LT using the high frequency signal H and the high frequency transmission vector signal HT, the second mixer 111 receives the low frequency vector signal LV and the high frequency signal H and generates the high frequency vector signal HV using the low frequency vector signal LV and the high frequency signal H. The third mixer 112 receives the high frequency signal H and the high frequency vector signal HV, and generates the low frequency vector signal LV using the high frequency signal H and the high frequency vector signal HV. The fourth mixer 113 receives the high frequency signal H and the high frequency reflection vector signal HR, and generates the low frequency reflection vector signal LR using the high frequency signal H and the high frequency reflection vector signal HR.

In order to improve the measurement accuracy of the S-parameters, the radio frequency S-parameter measurement device 1 may further include a first band-pass filter B1, a second band-pass filter B2, a third band-pass filter B3, a fourth band-pass filter B4, a fifth band-pass filter B5, a sixth band-pass filter B6, a first amplifier A1, a second amplifier A2, a third amplifier A3, a fourth amplifier A4, a fifth amplifier A5, and a sixth amplifier A6. The first band-pass filter B1 is coupled between the first mixer 110 and the vector network analyzer 10, the second band-pass filter B2 is coupled between the first mixer 110 and the channel switching device 12, the third band-pass filter B3 is coupled between the vector network analyzer 10 and the second mixer 111, the fourth band-pass filter B4 is coupled between the second mixer 111 and the channel switching device 12, the fifth band-pass filter B5 is coupled between the third mixer 112 and the vector network analyzer 10, and the sixth band-pass filter B6 is coupled between the fourth mixer 113 and the vector network analyzer 10. The first amplifier A1 is coupled between the fifth band-pass filter B5 and the vector network analyzer 10, the second amplifier A2 is coupled between the fourth mixer 113 and the vector network analyzer 10, the third amplifier A3 is coupled between the signal splitter 14 and the first mixer 110, and the fourth amplifier A4 is coupled between the signal splitter 14 and the second mixer 111.

The first band-pass filter B1 filters spurious (spilius) signals generated by the first mixer 110, such as spurious signals of the low frequency vector signal LV or the low frequency transmission vector signal LT. The second band-pass filter B2 filters spurious signals generated by the first mixer 110, such as spurious signals of the high frequency vector signal HV or the high frequency transmission vector signal HT. The third band-pass filter B3 filters spurious signals generated by the second mixer 111, such as spurious signals of the low frequency vector signal LV or the low frequency transmission vector signal LT. The fourth band-pass filter B4 filters spurious signals generated by the second mixer 111, such as spurious signals of the high frequency vector signal HV or the high frequency transmission vector signal HT. The fifth band-pass filter B5 filters spurious signals generated by the third mixer 112, such as spurious signals of the low frequency vector signal LV. The sixth band-pass filter B6 filters spurious signals generated by the fourth mixer 113, such as spurious signals of the low frequency reflection vector signal LR. The first amplifier A1 amplifies the power of the low frequency vector signal LV, the second amplifier A2 amplifies the power of the low frequency reflection vector signal LR, and the third amplifier A3, the fourth amplifier A4, the fifth amplifier A5 and the sixth amplifier A6 all amplify the power of the high frequency signal H.

In some embodiments of the present utility model, the channel switching device 12 may further include a first directional coupler 122, a second directional coupler 123, a first channel switch 124 and a second channel switch 125. The first directional coupler 122 may be coupled to the first mixer 110 through the second band-pass filter B2 and coupled to the first port 120. The second directional coupler 123 may be coupled to the second port 121 and coupled to the second mixer 111 through the fourth band pass filter B4. The first channel switch 124 is coupled to the third mixer 112, the first directional coupler 122 and the second directional coupler 123. The second channel switch 125 is coupled to the first directional coupler 122, the second directional coupler 123 and the fourth mixer 113.

Fig. 2 is a schematic circuit diagram of a radio frequency S parameter measurement device for measuring a forward reflection parameter measurement value and a forward feeding parameter measurement value according to an embodiment of the utility model. As shown in fig. 2, the first directional coupler 122 transmits the high-frequency vector signal HV to the object 2 to be tested, and the first directional coupler 122 and the transceiver port A, F of the first channel switch 124 transmit the high-frequency vector signal HV to the third mixer 112. The first directional coupler 122 and the transceiver port A, F of the second channel switch 125 transmit the high-frequency reflection vector signal HR to the fourth mixer 113, and the second directional coupler 123 transmits the high-frequency transmission vector signal HT to the second mixer 111. In this embodiment, the low frequency vector signal LV and the low frequency reflection vector signal LR are used to calculate the forward reflection parameter measurement value, and the low frequency vector signal LV and the low frequency transmission vector signal LT are used to calculate the forward transmission parameter measurement value.

Fig. 3 is a schematic circuit diagram of an rf S-parameter measurement device for measuring a retroreflective parameter measurement and a retroreflective parameter measurement according to an embodiment of the utility model. As shown in fig. 3, the second directional coupler 123 transmits the high-frequency vector signal HV to the object 2 to be tested, and the second directional coupler 123 and the transceiver port B, F of the first channel switch 124 transmit the high-frequency vector signal HV to the third mixer 112. The second directional coupler 123 and the transceiver port B, F of the second channel switch 125 transmit the high-frequency reflection vector signal HR to the fourth mixer 113, and the first directional coupler 122 transmits the high-frequency transmission vector signal HT to the first mixer 110. In this embodiment, the low frequency vector signal LV and the low frequency reflection vector signal LR are used to calculate the measurement value of the retroreflective parameter, and the low frequency vector signal LV and the low frequency transmission vector signal LT are used to calculate the measurement value of the retroreflective parameter.

Fig. 4 is a graph of the amplitude and the frequency of the forward reflection parameter measurement values of the radio frequency S-parameter measurement device and the high frequency vector network analyzer of the prior art, fig. 5 is a graph of the amplitude and the frequency of the forward transmission parameter measurement values of the radio frequency S-parameter measurement device and the high frequency vector network analyzer of the prior art, fig. 6 is a graph of the amplitude and the frequency of the reverse transmission parameter measurement values of the radio frequency S-parameter measurement device and the high frequency vector network analyzer of the prior art, and fig. 7 is a graph of the amplitude and the frequency of the reverse reflection parameter measurement values of the radio frequency S-parameter measurement device and the high frequency vector network analyzer of the prior art. In fig. 4, 5, 6 and 7, the sample is exemplified by a Low Noise Amplifier (LNA), wherein the solid line represents the rf S parameter measuring device of the present utility model, and the dotted line represents the prior art high frequency vector network analyzer. As can be seen from the figure, the RF S-parameter measuring device of the present utility model is almost identical to the prior art high frequency vector network analyzer in terms of data, so that the RF S-parameter measuring device of the present utility model can measure accurate S-parameters at low cost.

Fig. 8 is a graph of amplitude error versus frequency of a forward reflection parameter measurement of an inventive rf S-parameter measurement device, fig. 9 is a graph of amplitude error versus frequency of a forward transmission parameter measurement of an inventive rf S-parameter measurement device, fig. 10 is a graph of amplitude error versus frequency of a reverse transmission parameter measurement of an inventive rf S-parameter measurement device, and fig. 11 is a graph of amplitude error versus frequency of a reverse reflection parameter measurement of an inventive rf S-parameter measurement device. Fig. 12 is a graph of phase error versus frequency of a forward reflection parameter measurement of the inventive rf S-parameter measurement device, fig. 13 is a graph of phase error versus frequency of a forward transmission parameter measurement of the inventive rf S-parameter measurement device, fig. 14 is a graph of phase error versus frequency of a reverse transmission parameter measurement of the inventive rf S-parameter measurement device, and fig. 15 is a graph of phase error versus frequency of a reverse reflection parameter measurement of the inventive rf S-parameter measurement device. Fig. 8, 9, 12 and 13 correspond to the data of table one. As can be seen from fig. 8 to 15 and table one, compared with the high frequency vector network analyzer in the prior art, the radio frequency S parameter measuring device of the present utility model has smaller error in measuring S parameter, so it is more accurate.

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List one

According to the above embodiment, the radio frequency S parameter measuring apparatus uses the frequency up-conversion and frequency down-conversion technology to measure the S parameter of high frequency, such as the S parameter of millimeter wave band, at low cost.

The foregoing description of the preferred embodiment of the present utility model is not intended to limit the scope of the present utility model, but rather to cover all equivalent variations and modifications in shape, construction, characteristics and spirit according to the scope of the present utility model as set forth in the following claims.

Claims (10)

1. A radio frequency S parameter measuring apparatus coupled to an object to be measured, wherein the radio frequency S parameter measuring apparatus comprises:

a vector network analyzer for generating a low frequency vector signal;

the frequency-raising and lowering device is coupled with the vector network analyzer, and is used for receiving the low-frequency vector signal and the high-frequency signal and generating a high-frequency vector signal by utilizing the low-frequency vector signal and the high-frequency signal; and

the channel switching device is coupled between the first port and the second port, and is coupled to the frequency raising and lowering device, wherein the channel switching device is used for transmitting the high-frequency vector signal to the object to be detected, the object to be detected reflects the high-frequency vector signal to form a high-frequency reflection vector signal, the high-frequency vector signal transmits the object to be detected to form a high-frequency transmission vector signal, and the frequency raising and lowering device is used for receiving the high-frequency vector signal, the high-frequency reflection vector signal and the high-frequency transmission vector signal to generate the low-frequency vector signal, the low-frequency reflection vector signal and the low-frequency transmission vector signal by using the high-frequency vector signal, the high-frequency reflection vector signal and the high-frequency transmission vector signal, and the vector network analyzer is used for receiving and analyzing the low-frequency vector signal, the low-frequency reflection vector signal and the low-frequency transmission vector signal to obtain an S parameter measurement value.

2. The radio frequency S parameter measurement device of claim 1, wherein the radio frequency S parameter measurement device further comprises:

a high frequency signal generator for generating the high frequency signal; and

and the signal distributor is coupled with the high-frequency signal generator and the frequency lifting device, and is used for receiving and distributing the high-frequency signal to the frequency lifting device.

3. The radio frequency S parameter measurement device according to claim 2, wherein the up-down frequency device comprises:

a first mixer and a second mixer coupled to the signal distributor and the vector network analyzer, wherein when the first mixer receives the low frequency vector signal and the high frequency vector signal and generates the high frequency vector signal using the low frequency vector signal and the high frequency vector signal, the second mixer receives the high frequency vector signal and the high frequency transmission vector signal and generates the low frequency transmission vector signal using the high frequency signal and the high frequency transmission vector signal, and when the first mixer receives the high frequency vector signal and the high frequency transmission vector signal and generates the low frequency transmission vector signal using the high frequency vector signal and the high frequency transmission vector signal, the second mixer receives the low frequency vector signal and the high frequency vector signal and generates the high frequency vector signal;

a third mixer coupled to the signal distributor and the vector network analyzer, wherein the third mixer is configured to receive the high frequency signal and the high frequency vector signal and generate the low frequency vector signal using the high frequency signal and the high frequency vector signal; and

the fourth mixer is coupled to the signal distributor and the vector network analyzer, and is configured to receive the high-frequency signal and the high-frequency reflection vector signal and generate the low-frequency reflection vector signal by using the high-frequency signal and the high-frequency reflection vector signal.

4. The radio frequency S parameter measurement device of claim 3, wherein the radio frequency S parameter measurement device further comprises:

a first band-pass filter coupled between the first mixer and the vector network analyzer, wherein the first band-pass filter is used for filtering spurious signals generated by the first mixer;

a second band-pass filter coupled between the first mixer and the channel switching device, wherein the second band-pass filter is used for filtering spurious signals generated by the first mixer;

a third band-pass filter coupled between the vector network analyzer and the second mixer, wherein the third band-pass filter is used for filtering spurious signals generated by the second mixer;

a fourth band-pass filter coupled between the second mixer and the channel switching device, wherein the fourth band-pass filter is used for filtering spurious signals generated by the second mixer;

a fifth band-pass filter coupled between the third mixer and the vector network analyzer, wherein the fifth band-pass filter is used for filtering spurious signals generated by the third mixer; and

and the sixth band-pass filter is coupled between the fourth mixer and the vector network analyzer, wherein the sixth band-pass filter is used for filtering spurious signals generated by the fourth mixer.

5. The radio frequency S parameter measurement device of claim 4, wherein the radio frequency S parameter measurement device further comprises:

a first amplifier coupled between the fifth bandpass filter and the vector network analyzer, wherein the first amplifier is configured to amplify the power of the low frequency vector signal;

a second amplifier coupled between the fourth mixer and the vector network analyzer, wherein the second amplifier is configured to amplify the power of the low frequency reflection vector signal;

a third amplifier coupled between the signal distributor and the first mixer, wherein the third amplifier is used for amplifying the power of the high-frequency signal;

a fourth amplifier coupled between the signal distributor and the second mixer, wherein the fourth amplifier is used for amplifying the power of the high-frequency signal;

a fifth amplifier coupled between the signal distributor and the third mixer, wherein the fifth amplifier is used for amplifying the power of the high-frequency signal; and

and a sixth amplifier coupled between the signal distributor and the fourth mixer, wherein the sixth amplifier is used for amplifying the power of the high-frequency signal.

6. The radio frequency S parameter measurement device according to claim 5, wherein the channel switching device further comprises:

a first directional coupler coupled to the first mixer and the first port;

a second directional coupler coupled to the second port and the second mixer;

a first channel switch coupled to the third mixer, the first directional coupler and the second directional coupler; and

and a second channel switch coupled to the first directional coupler, the second directional coupler and the fourth mixer.

7. The apparatus of claim 6, wherein the first directional coupler is configured to transmit the high frequency vector signal to the object, the first directional coupler and the first channel switch are configured to transmit the high frequency vector signal to the third mixer, the first directional coupler and the second channel switch are configured to transmit the high frequency reflection vector signal to the fourth mixer, and the second directional coupler is configured to transmit the high frequency transmission vector signal to the second mixer.

8. The apparatus of claim 6, wherein the second directional coupler is configured to transmit the high frequency vector signal to the object, the second directional coupler and the first channel switch are configured to transmit the high frequency vector signal to the third mixer, the second directional coupler and the second channel switch are configured to transmit the high frequency reflection vector signal to the fourth mixer, and the first directional coupler is configured to transmit the high frequency transmission vector signal to the first mixer.

9. The radio frequency S parameter measurement device according to claim 1, wherein the frequency of the low frequency vector signal belongs to a microwave band and the frequency of the high frequency signal belongs to a microwave band or a millimeter wave band.

10. The apparatus of claim 1 wherein the S-parameter measurements include a forward reflection parameter measurement, a forward feed parameter measurement, a reverse reflection parameter measurement, and a reverse feed parameter measurement.

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